The performance of an adaptive microelectronic circuit is at least partly configurable by selecting a value of an operating parameter. On processing paths, data inputs of register units are coupled to outputs of respective logic units for temporarily storing output values of said logic units. A plurality of timing event monitors respond to a digital value at a data input of a monitored register unit changing later than an allowable time limit by generating a timing event observation signal. The plurality of timing event monitors form a plurality of monitor groups, each monitor group being coupled to a branch of a triggering signal tree for coupling a monitor-group-specific triggering signal to the monitor group independently of other monitor groups. A control unit selectively allows or disables the propagation of the respective triggering signals into said branches of the triggering signal tree.
A microelectronic circuit may comprise at least one timing event detector circuit configured to generate a timing event observation signal as a response to a change in a digital value at an input of an associated register circuit during a timing event monitoring window. The microelectronic circuit may further comprise a control input for adjusting at least a duration of the timing event monitoring window.
G06F 11/07 - Réaction à l'apparition d'un défaut, p. ex. tolérance de certains défauts
H03K 5/135 - Dispositions ayant une sortie unique et transformant les signaux d'entrée en impulsions délivrées à des intervalles de temps désirés par l'utilisation de signaux de référence de temps, p. ex. des signaux d'horloge
G06F 11/34 - Enregistrement ou évaluation statistique de l'activité du calculateur, p. ex. des interruptions ou des opérations d'entrée–sortie
G01R 31/319 - Matériel de test, c.-à-d. circuits de traitement de signaux de sortie
The performance of an adaptive microelectronic circuit is at least partly configurable by selecting a value of an operating parameter. On processing paths, data inputs of register units (401-406) are coupled to outputs of respective logic units for temporarily storing output values of said logic units. A plurality of timing event monitors (411-412, 414-416) respond to a digital value at a data input of a monitored register unit (401-402, 404-406) changing later than an allowable time limit by generating a timing event observation signal. The plurality of timing event monitors (411-412, 414-416) form a plurality of monitor groups (421-423), each monitor group being coupled to a branch of a triggering signal tree (501-503) for coupling a monitor-group-specific triggering signal to the monitor group (421-423) independently of other monitor groups. A control unit selectively allows or disables the propagation of the respective triggering signals into said branches of the triggering signal tree (501- 503).
The excitation of processing paths in a microelectronic circuit is organized by providing one or more pieces of input information to a decision-making software, and executing the decision-making software to decide, whether one or more of said processing paths of the microelectronic circuit are to be excited with test signals. Deciding that said processing paths are to be excited with said test signals results in proceeding to excite said one or more of said processing paths with said test signals and monitoring whether timing events occur on such one or more excited processing paths. A timing event is a change in a digital value at an input of a respective register circuit on an excited processing path, which change took place later than an allowable time limit defined by a triggering signal to said respective register circuit.
G06F 11/22 - Détection ou localisation du matériel d'ordinateur défectueux en effectuant des tests pendant les opérations d'attente ou pendant les temps morts, p. ex. essais de mise en route
G01R 31/30 - Tests marginaux, p. ex. en faisant varier la tension d'alimentation
A controllable voltage source (902) is coupled to a microelectronic circuit (901) for providing an operating voltage. Said microelectronic circuit (901) is adaptive, so its performance is at least partly configurable by value of said operating voltage. The operating voltage is regulated into conformity with a target value. Reregulating said operating voltage into conformity with a new target value involves a time constant. On a processing path a first register circuit (502) comprises a data input coupled to an output of a preceding first logic unit (501). The microelectronic circuit (901) responds to a digital value at said data input changing later than an allowable time limit by generating a timing event observation (TEO) signal. The allowable time limit is defined by at least one triggering edge of at least one triggering signal coupled to the first register circuit (502). The system uses said TEO signal to trigger an increase in said operating voltage faster than said time constant.
A monitor circuit (301) for monitoring changes in an input digital value of a register circuit comprises a data input (302) configured to receive a copy of the input digital value of said register circuit, and one or more triggering signal inputs (303) configured to receive one or more triggering signals. One or more triggering edges thereof define an allowable time limit before which a digital value must appear at a data input of said register circuit to become properly stored in said register circuit. The monitor circuit comprises a data event (DE) output (305), so that said monitor circuit is configured to produce a DE signal at said DE output (305) in response to a digital value at said data input (302) changing within a time window defined by said one or more triggering signals.
Microelectronic circuit com-prises a plurality of logic units and register circuits, arranged into a plu-rality of processing paths, and a plu-rality of monitoring units associated with respective ones of said processing paths. Each of said monitoring units is configured to produce an observation signal as a response to anomalous opera-tion of the respective processing path. Each of said plurality of logic units belongs to one of a plurality of delay classes according to an amount of delay that it is likely to generate. Said de-lay classes comprise first, second, and third classes, of which the first class covers logic units that are likely to generate longest delays, the second class covers logic units that are likely to generate shorter delays than said first class, and the third class covers logic units that are likely to generate shorter delays than said second class. At least some of said plurality of pro-cessing paths comprise logic units be-longing to said second class but are without monitoring units. At least some of said plurality of processing paths comprise logic units belonging to said third class but have monitoring units associated with them.
H03K 5/13 - Dispositions ayant une sortie unique et transformant les signaux d'entrée en impulsions délivrées à des intervalles de temps désirés
H03K 5/19 - Contrôle de la configuration de trains d'impulsions
G06F 119/12 - Analyse temporelle ou optimisation temporelle
H03K 19/20 - Circuits logiques, c.-à-d. ayant au moins deux entrées agissant sur une sortieCircuits d'inversion caractérisés par la fonction logique, p. ex. circuits ET, OU, NI, NON
8.
Microelectronic circuit capable of selectively activating processing paths, and a method for activating processing paths in a microelectronic circuit
A microelectronic circuit comprises a plurality of logic units and register circuits arranged into a plurality of processing paths. At least one monitor circuit (404) is associated with a first register circuit (301), said monitor circuit (404) being configured to produce a timing event observation signal as a response to a change in a digital value at an input (D) of the first register circuit (301) that took place later than an allowable time limit defined by a triggering signal (CP) to said first register circuit (301). A first processing path goes through a first logic unit (501) to said first register circuit (301) and is a delay critical processing path due to an amount of delay that it is likely to generate. The microelectronic circuit comprises a controllable data event injection point (503) for controllably generating a change of a digital value propagating to said first logic unit (501) irrespective of what other data is processed on said first processing path. Said microelectronic circuit is configured to freeze a first digital value stored in said first register circuit (301) for a time during which the change generated through said controllable data event injection point (503) propagates to said first register circuit.
H03K 19/17736 - Détails structurels des ressources de routage
H03K 5/15 - Dispositions dans lesquelles des impulsions sont délivrées à plusieurs sorties à des instants différents, c.-à-d. distributeurs d'impulsions
H03K 17/28 - Modifications pour introduire un retard avant commutation
9.
Applications of adaptive microelectronic circuits that are designed for testability
The performance of a microelectronic circuit can be configured by making an operating parameter assume an operating parameter value. An operating method comprises selectively setting the microelectronic circuit into a test mode that differs from a normal operating mode of the microelectronic circuit, and utilizing said test mode to input test input signals consisting of test input values into one or more adaptive processing paths within the microelectronic circuit. An adaptive processing path comprises processing logic and register circuits configured to produce output values from input values input to them. The performance of such an adaptive processing path can be configured by making an operating parameter assume an operating parameter value. The method comprises making said one or more adaptive processing paths form test output values on the basis of the respective test input values input to them, and forming a set of test output signals by collecting said test output values given by said one or more adaptive processing paths. The method comprises examining said set of test output signals, and forming a test result on the basis of said examining, and using said test result to select and set an operating parameter value for said operating parameter.
In a microelectronic circuit, a digital value (D) is temporarily stored in a register circuit (101). In relation to an allowable time limit defined by a triggering signal (CKP), there is stored a corresponding momentary value of said digital value (D) in differential form that comprises said momentary value (A) and its complement value (B). During a timing event detection window, any of said stored momentary value (A) or its stored complement value (B) may be toggled, however so that the stored momentary value (A) is only toggled in response to observing the digital value (D) change in one direction and the stored complement value (B) is only toggled in response to observing the digital value (D) change in the opposite direction. The stored momentary value (A) is compared to its stored complement value (B), and a timing event observation signal (TEO) is output (105) in response to said comparing showing that said stored momentary value (A) and its stored complement value (B) have become equal.
The excitation of processing paths in a microelectronic circuit is organized by providing one or more pieces of input information (101, 102, 103) to a decision-making software (104), and executing the decision-making software (104) to decide, whether one or more of said processing paths of the microelectronic circuit are to be excited with test signals (112). Deciding that said processing paths are to be excited with said test signals results in proceeding to excite said one or more of said processing paths with said test signals and monitoring whether timing events occur on such one or more excited processing paths. A timing event is a change in a digital value at an input of a respective register circuit on an excited processing path, which change took place later than an allowable time limit defined by a triggering signal to said respective register circuit.
A digital value obtained from a preceding circuit element is temporarily stored and made available for a subsequent circuit element at a controlled moment of time. The digital value is received through a data input. A triggering signal is also received, a triggering edge of which defines an allowable time limit before which a digital value must be available at said data input to become available for said subsequent circuit element. Between first and second pulse-enabled subregister stages, an internal digital value from the first pulse-enabled subregister stage and information of the changing moment of said digital value at the data input in relation to said allowable time limit are used to ensure passing a valid internal digital value to the second pulse-enabled subregister stage. Said second pulse-enabled subregister stage makes said valid internal digital value available for said subsequent circuit element. A timing event observation signal is output as an indicator of said digital value at said data input having changed within a time window that begins at said allowable time limit and is shorter than one cycle of said triggering signal.
H03K 5/153 - Dispositions dans lesquelles une impulsion est délivrée à l'instant où une caractéristique prédéterminée d'un seuil d'entrée est présente, ou après un intervalle de temps fixé suivant cet instant
H03K 5/1534 - Détecteurs de transition ou de front
H03K 19/21 - Circuits OU EXCLUSIF, c.-à-d. donnant un signal de sortie si un signal n'existe qu'à une seule entréeCircuits à COÏNCIDENCES, c.-à-d. ne donnant un signal de sortie que si tous les signaux d'entrée sont identiques
13.
Method and arrangement for protecting a digital circuit against time errors
Digital values obtained from an output of a preceding circuit element are temporarily stored and made available for a subsequent circuit element at a controlled moment of time. A digital value is received for temporary storage, as well as a triggering signal, a triggering edge of which defines an allowable time limit before which a digital value must appear at said data input to become available for said subsequent circuit element. A sequence of first and second pulse-enabled subregister stages is used to temporarily store said digital value. Said triggering signal is provided to said first pulse-enabled subregister stage delayed with respect to the triggering signal received by said second pulse-enabled subregister stage. The length of the delay is a fraction of a cycle of the triggering signal. A timing event observation signal is output as an indicator of said digital value at said data input having changed within a time window that begins at said allowable time limit and is shorter than one cycle of said triggering signal.
A controllable voltage source (902) is coupled to a microelectronic circuit (901) for providing an operating voltage. Said microelectronic circuit (901) is adaptive, so its performance is at least partly configurable by value of said operating voltage. The operating voltage is regulated into conformity with a target value. Reregulating said operating voltage into conformity with a new target value involves a time constant. On a processing path a first register circuit (502) comprises a data input coupled to an output of a preceding first logic unit (501). The microelectronic circuit (901) responds to a digital value at said data input changing later than an allowable time limit by generating a timing event observation (TEO) signal. The allowable time limit is defined by at least one triggering edge of at least one triggering signal coupled to the first register circuit (502). The system uses said TEO signal to trigger an increase in said operating voltage faster than said time constant.
A microelectronic circuit comprises a plurality of logic units and register circuits arranged into a plurality of processing paths. At least one monitor circuit (404) is associated with a first register circuit (301), said monitor circuit (404) being configured to produce a timing event observation signal as a response to a change in a digital value at an input (D) of the first register circuit (301) that took place later than an allowable time limit defined by a triggering signal (CP) to said first register circuit (301). A first processing path goes through a first logic unit (501) to said first register circuit (301) and is a delay critical processing path due to an amount of de lay that it is likely to generate. The microelectronic circuit comprises a controllable data event injection point (503) for controllably generating a change of a digital value propagating to said first logic unit (501) irrespective of what other data is processed on said first processing path. Said microelectronic circuit is configured to freeze a first digital value stored in said first register circuit (301) for a time during which the change generated through said controllable data event injection point (503) propagates to said first register circuit.
A monitor circuit (301) for monitoring changes in an input digital value of a register circuit comprises a data input (302) configured to receive a copy of the input digital value of said register circuit, and one or more triggering signal inputs (303) configured to receive one or more triggering signals. One or more triggering edges thereof define an allowable time limit before which a digital value must appear at a data input of said register circuit to become properly stored in said register circuit. The monitor circuit comprises a data event (DE) output(305), so that said monitor circuit is configured to produce a DE signal at said DE output (305) in response to a digital value at said data input (302) changing within a time window defined by said one or more triggering signals.
Microelectronic circuit com- prisesaplurality of logic units and register circuits, arranged into a plu- rality of processing paths, and a plu- rality of monitoring units associated with respective ones of said processing paths. Each of said monitoring units is configured to produce an observation signal as a response to anomalous opera- tion of the respective processing path. Each of said plurality of logic units belongs to one of a plurality of delay classes according to an amount of delay that it is likely to generate. Said de- lay classes comprise first, second, and third classes, of which the first class covers logic units that are likely to generate longest delays, the second class covers logic units that are likely to generate shorter delays than said first class, and the third class covers logic units that are likely to generate shorter delays than said second class. At least some of said plurality of pro- cessing paths comprise logic units be- longing to said second class but are without monitoring units. At least some of said plurality of processing paths comprise logic units belonging to said third class but have monitoring units associated with them.
The performance of a microelectronic circuit can be configured by making an operating parameter assume an operating parameter value. An operating method comprises selectively setting the microelectronic circuit into a test mode that differs from a normal operating mode of the microelectronic circuit, and utilizing said test mode to input test input signals consisting of test input values into one or more adaptive processing paths within the microelectronic circuit. An adaptive processing path comprises processing logic and register circuits configured to produce output values from input values input to them. The performance of such an adaptive processing path can be configured by making an operating parameter assume an operating parameter value. The method comprises making said one or more adaptive processing paths form test output values on the basis of the respective test input values input to them, and forming a set of test output signals by collecting said test output values given by said one or more adaptive processing paths. The method comprises examining said set of test output signals, and forming a test result on the basis of said examining, and using said test result to select and set an operating parameter value for said operating parameter.
G01R 31/30 - Tests marginaux, p. ex. en faisant varier la tension d'alimentation
G06F 11/22 - Détection ou localisation du matériel d'ordinateur défectueux en effectuant des tests pendant les opérations d'attente ou pendant les temps morts, p. ex. essais de mise en route
G01R 31/3185 - Reconfiguration pour les essais, p. ex. LSSD, découpage
19.
Sequential circuit with timing event detection and a method of detecting timing events
A sequential circuit with timing event detection is disclosed. The sequential circuit has an input that is asserted to the output during the second clock phase of a two phase clock signal. A timing event detector is coupled to the sequential element input to assert a timing event signal if a transition occurs at the sequential element input during the second clock phase but not to assert during the first clock phase.
A digital value obtained from a preceding circuit element is temporarily stored and made available for a subsequent circuit element at a controlled moment of time. The digital value is received through a data input. A triggering signal is also received, a trigger- ing edge of which defines an allowable time limit before which a digital value must be available at said data input to become available for said subsequent circuit element. Between first (204) and second (205) pulse-enabled subregister stages, an internal digital value from the first pulse-enabled subregister stage (204) and information of the changing moment of said digital value at the data input (201) in relation to said allowable time limit are used to ensure passing a valid internal digital value to the second pulse-enabled subregister stage. Said second pulse-enabled subregister stage makes said valid internal digital value available for said subsequent circuit element. A timing event observation signal is output as an indicator of said digital value at said data input having changed within a time window that begins at said allowable time limit and is shorter than one cycle of said triggering signal.
Digital values obtained from an output of a preceding circuit element are temporarily stored and made available for a subsequent circuit element at a controlled moment of time. A digital value is received for temporary storage, as well as a triggering signal, a triggering edge of which defines an allowable time limit before which a digital value must appear at said data input to become available for said subsequent circuit element. A sequence of first and second pulse-enabled subregister stages is used to temporarily store said digital value. Said triggering signal is provided to said first pulse-enabled subregister stage delayed with respect to the triggering signal received by said second pulse-enabled subregister stage. The length of the delay is a fraction of a cycle of the triggering signal. A timing event observation signal is output as an indicator of said digital value at said data input having changed within a time window that begins at said allowable time limit and is shorter than one cycle of said triggering signal.
It is an objective to provide timing event detection. According to a first aspect, a device, comprises: a clocked conditional buffer configured to set an output of the clocked conditional buffer to a first state during a non-detection period; the clocked conditional buffer further configured to toggle the output from the first state to the second state during a detection period, wherein the toggling being enabled by either one of the two states; and the clocked conditional buffer further configured to guarantee that the output is toggling only to one direction during the detection period. This may prevent false event detections. Furthermore, with respect to a timing point of view, one is able to operate without pulses, where pulse width may be difficult to manage in low voltages.
A sequential circuit with timing event detection is disclosed. The sequential circuit has an input that is asserted to the output during the second clock phase of a two phase clock signal. A timing event detector is coupled to the sequential element input to assert a timing event signal if a transition occurs at the sequential element input during the second clock phase but not to assert during the first clock phase.
A level shifter comprises a first control switch (207) for connecting an output terminal to a first supply voltage (VDDH) to set an output signal to be high, and a second control switch (208) for connecting the output terminal to a signal ground (GND) to set the output signal to be low. The level shifter comprises a pre-charging switch (210) for connecting the output terminal to the first supply voltage, and an input gate circuit (211) for controlling an ability of an input signal to control the second control switch. The level shifter comprises a keeper circuit (212) for controlling the first control switch based on the output signal. The first control switch is controlled with the first supply voltage when the output signal is low, and with a second supply voltage that is between the first supply voltage and the signal ground when the output signal is high.
A control system (100) for controlling operating voltage of an electronic device is presented. The electronic device is provided with a timing event detector responsive to timing events, such as errors, related to the operation of the electronic device. The control system comprises a controller (101) for decreasing the operating voltage when the rate of timing events is below a target level and for increasing the operating voltage when the rate of timing events exceeds the target level so as to search for a threshold voltage that is the smallest operating voltage at which the rate of timing events is substantially at the target level. The control system comprises a controllable clock signal generator (102) for producing a clock signal for operating the electronic device so that the clock frequency is according to an increasing function of the operating voltage. Thus, it is possible to find a voltage-frequency operating point where the energy consumption is minimized.
A control system for controlling an operating voltage of an electronic device is presented. The electronic device includes a timing event detector responsive to timing events, such as errors, related to operation of the electronic device. The control system includes a controller for decreasing the operating voltage when the rate of timing events is below a target level and for increasing the operating voltage when the rate of timing events exceeds the target level to search for a threshold voltage that is the smallest operating voltage at which the rate of timing events is substantially at the target level. The control system further includes a controllable clock signal generator for producing a clock signal for operating the electronic device so that the clock frequency is according to an increasing function of the operating voltage. Thus, it is possible to find a voltage-frequency operating point where the energy consumption is minimized.
An apparatus, comprising a clock adapted to provide a clock signal alternating with a cycle between a first level and a second level if a timing violation is not detected; a first latch adapted to be clocked such that it passes a first signal when the clock signal is at the first level; a second combinational logic adapted to output a second signal based on the first signal passed through the first latch; a second latch adapted to be clocked such that it passes the second signal when the clock signal is at the second level; a detecting means adapted to detect the timing violation of at least one of the first signal and of the second signal; a time stretching means adapted to stretch, if the timing violation is detected, the clock such that the clock alternates between the first level and the second level with a delay.
H03L 7/00 - Commande automatique de fréquence ou de phaseSynchronisation
H03K 3/00 - Circuits pour produire des impulsions électriquesCircuits monostables, bistables ou multistables
H03K 19/003 - Modifications pour accroître la fiabilité
G06F 1/04 - Génération ou distribution de signaux d'horloge ou de signaux dérivés directement de ceux-ci
H03K 5/19 - Contrôle de la configuration de trains d'impulsions
H03K 5/06 - Mise en forme d'impulsions par augmentation de duréeMise en forme d'impulsions par diminution de durée par l'utilisation de lignes à retard ou d'autres éléments à retard analogues
There is provided an apparatus comprising thresholding means adapted to check if an average frequency of occurrence of timing violations is outside a range; and controlling means adapted to control at least one of a clock frequency, a processing, a heat generation, a bias voltage, a current, and a temperature in a direction to bring the average frequency of occurrence of timing violations into the range if the average frequency of occurrence of timing violations is outside the range.
A field effect transistor current mode differential logic circuit comprising load transistors for converting the current output of each differential leg current to voltage output, and means for configuring the bulk of each differential leg's load transistor to be connected to the drain of the load transistor for use the logic circuit in Subthreshold Source Coupled Logic (STSCL) mode, and means for configuring the bulk of each leg load transistor to be connected to a voltage or to source of the same transistor for use in MOS current more logic (MCML) operation.
H03K 19/094 - Circuits logiques, c.-à-d. ayant au moins deux entrées agissant sur une sortieCircuits d'inversion utilisant des éléments spécifiés utilisant des dispositifs à semi-conducteurs utilisant des transistors à effet de champ
H03K 19/017 - Modifications pour accélérer la commutation dans les circuits à transistor à effet de champ
30.
Sequential circuit with current mode error detection
A sequential circuit with transition error detector including a sequential element with an input that is asserted to the output during the second clock phase of a two phase clock signal, a transition error detector coupled to the sequential element input to assert an error signal if a transition occurs at the sequential element input during the second clock phase but not to assert during the first clock phase, wherein a transition error detection circuit comprises a current mode circuit as a detection circuit for transition timing error detection from signals derived from the sequential element clock signal and input signals.
brevets
