Hitachi High-Tech Corporation

Nouveaux brevets et marques déposées la semaine dernière

Dernière mise à jour : 2026-07-26

Viewing 1 - 21 of 21

#	ID	Title
1	19143009	Processing Method and Charged Particle Beam Device
2	19144093	MASS SPECTROMETER AND METHOD FOR DISASSEMBLING MASS SPECTROMETER
3	19158221	ABNORMALITY SENSING METHOD AND ABNORMALITY SENSING DEVICE
4	19159119	Learning Model Matching Region Detection Device, Learning Model Matching Region Detection Method, and Learning Model Operation Method
5	19145423	CHARGED PARTICLE BEAM DEVICE, IMAGE PROCESSING METHOD, AND IMAGE PROCESSING PROGRAM
6	19143450	Charged Particle Beam Device
7	19147463	DEFECT INSPECTION DEVICE, PROCESSING DEVICE, AND DEFECT INSPECTION METHOD
8	19137289	AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
9	19159047	AUTOMATIC ANALYZER AND CONTROL METHOD THEREOF
10	19159036	AUTOMATIC ANALYZER AND MEASURING METHOD USING THE SAME
11	19159041	AUTOMATIC ANALYZER
12	19142655	NUCLEIC ACID QUANTIFICATION METHOD AND REAGENT FOR QUANTIFYING NUCLEIC ACID
13	19141385	PLACEMENT TABLE AND SAMPLE PROCESSING SYSTEM
14	19145742	Storage Device, Automatic Analyzer, and Storage Method
15	19146644	Conveying Method, Conveyance Device, and Analysis System
16	JP2025001972	WAFER PROCESSING DEVICE AND WAFER PROCESSING METHOD
17	JP2025001937	MEASUREMENT SYSTEM
18	JP2025030296	ANALYSIS DEVICE AND ANALYSIS METHOD
19	JP2025002290	ETCHING SHAPE EVALUATION SYSTEM AND METHOD
20	JP2025002072	INSPECTION SYSTEM
21	G12691451	Temperature control device