Axcelis Technologies, Inc.

États‑Unis d’Amérique


Commandez votre montre hebdomadaire Axcelis Technologies, Inc.
Quantité totale PI 427
Rang # Quantité totale PI 3 095
Note d'activité PI 3/5.0    155
Rang # Activité PI 4 315
Symbole boursier
ISIN US0545402085
Capitalisation 2,500M  (USD)
Industrie Semiconductor Equipment & Materials
Secteur Technology
Classe Nice dominante Appareils et instruments scienti...

Brevets

Marques

225 2
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198 0
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Dernier brevet 2025 - Dual force lift and ground pins ...
Premier brevet 1980 - Friction drive
Dernière marque 2000 - axcelis
Première marque 2000 - AXCELIS

Filiales

9 subsidiaries without IP

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Industrie (Classification de Nice)

Derniers inventions, produits et services

2025 Invention Dual force lift and ground pins for electrostatic chuck and method for use thereof. The disclosur...
Invention Improved energy accuracy for an rf linear accelerator ion implantation system. An ion implantatio...
Invention Energy accuracy for an rf linear accelerator ion implantation system. An ion implantation system...
Invention High aspect ratio beam dump or faraday cup with neutron radiation shielding. A neutron shielding ...
Invention Semiconductor radioactive wafer decay safety and operation system. A radiation safety apparatus ...
Invention Granular sputter source target with repeller cup and method for use thereof. The disclosure is ge...
Invention Substrate including a pre-epitaxial stacking fault expansion-stop layer, devices including the sa...
Invention Semiconductor electrical insulator with reduced arcing. The system includes an insulative assemb...
Invention Dopant delivery system to ion source using induction heating. An ion source has an arc chamber d...
Invention Method and apparatus for ion beam directional deposition. A deposition system has an ion depositi...
Invention Method and apparatus for ion beam directional deposition. A deposition system has an ion deposit...
Invention Liner with raised ribs for particle transport reduction. A liner for an ion implanter includes a...
Invention Apparatus and method for angle control of radicals, neutral atoms, and molecules. Apparatuses an...
Invention Method, system and apparatus for teaching and verifying end station. The disclosure generally rel...
Invention Variable vent pressure and flow for flushing loadlock chamber. A workpiece processing system has ...
Invention Variable vent pressure and flow for flushing loadlock chamber. A workpiece processing system has...
Invention Low-temperature vaporizer for ion implanter with in-vacuum controlled flow. An ion source for an...
Invention Method, system and apparatus for teaching and verifying end station. The disclosure generally re...
Invention Ion stripping apparatus and ion implantation system with selectable stripping gas source. An ion...
Invention System and method for managing solid phase precursors for an ion implantation system. A filter is...
Invention Ion implantation system and method of operation. An ion implantation system includes an ion sour...
Invention High temperature ion source. An arc chamber for an ion source provides a source of thermal radiat...
Invention In-situ, pre-implant wafer characterization system and method. An ion implantation system include...
Invention Automatic beam uniformity correction through generative ai modeling. In one embodiment, the disc...
2024 Invention In-situ, pre-implant wafer characterization system and method. An ion implantation system includ...
Invention Liquid metal alloy feed materials for ion implantation. Liquid metal alloy precursor composition...
Invention Liquid metal alloy feed materials for ion implantation. Liquid metal alloy precursor compositions...
Invention System and method for dynamic loadlock pressure control. A workpiece processing system has a proc...
Invention System and method for managing solid phase precursors for an ion implantation system. A filter i...
Invention Wafer alignment, cleanliness, and surface quality verification using laser light scattering. A s...
Invention System and method for dynamic loadlock pressure control. A workpiece processing system has a pro...
Invention High-efficiency target for an ion source. 233 and may be fabricated using additive manufacturing.
Invention Multifaceted target for an ion source. A target body includes a plurality of wave-shaped layers s...
Invention Multifaceted target for an ion source. A target body includes a plurality of wave-shaped layers ...
Invention System and method of verifying workpiece alignment. A workpiece processing system and method are ...
Invention High-efficiency target for an ion source. A target body can define a central bore along a centra...
Invention System and method of verifying workpiece alignment. A workpiece processing system and method are...
Invention Electrostatic chuck with controllable temperature, ion implantation system using the same as well...
Invention Large range heated electrostatic chuck. A clamping system has a workpiece clamp having a platen ...
Invention High bandwidth variable dose ion implantation system and method. An ion implantation system 100 i...
Invention Backside implant for wafer curvature control. A method for controlling workpiece deformation pre...
Invention Fixed position filament. A cathode filament device for an indirectly heated cathode has a first ...
Invention Deposition monitor for semiconductor manufacturing system. An ion implantation system includes a ...
Invention High bandwidth variable dose ion implantation system and method. An ion implantation system incl...
Invention Apparatus and method for two-dimensional ion beam profiling. cdd. A rotary input apparatus (240) ...
Invention Apparatus and method for two-dimensional ion beam profiling. A profiling apparatus has a hollow ...
Invention Deposition monitor for semiconductor manufacturing system. An ion implantation system includes a...
Invention Actively heated target to generate an ion beam. An arc chamber for an ion source defines a chambe...
Invention Actively heated target to generate an ion beam. An arc chamber for an ion source defines a chamb...
Invention Twist and tilt verification using diffraction patterns. A light source directs an incident beam ...
2000 P/S Electrical equipment, in particular thermal processors, photoresist processors, ashers, photostab...
P/S electrical equipment, namely, thermal processors, photoresist processors, ashers, photostabilizer...
P/S Semiconductor manufacturing equipment including thermal processing equipment, photresist processi...
P/S electrical equipment, namely, thermal processors, photoresist processors, ashers, photostablizers...