Scienta Omicron AB

Suède

 
Quantité totale PI 20
Rang # Quantité totale PI 75 217
Note d'activité PI 2/5.0    15
Rang # Activité PI 57 468

Brevets

Marques

9 0
0 0
11 0
0
 
Dernier brevet 2024 - Charged particle spectrometer
Premier brevet 2012 - Analyser arrangement for particl...

Derniers inventions, produits et services

2022 Invention Charged particle spectrometer. A charged particle spectrometer is described, which comprises an ...
Invention Charged particle spectrometer. A charged particle spectrometer (100) is described, which comprise...
Invention Charged particle spectrometer and method for calibration. A charged particle spectrometer (100) a...
Invention An illumination control device for a charged particle analyser. Described are illumination contr...
Invention An illumination control device for a charged particle analyser. An illumination control device (7...
Invention Angle-resolving photoelectron spectrometer and method. Described is an angle-resolving photoelec...
Invention Angle-resolving photoelectron spectrometer and method. An angle-resolving photoelectron spectrome...
2021 Invention Computer-implemented method for generating event-averaged and time-resolved spectra. A computer-...
Invention Computer-implemented method for generating event-averaged and time-resolved spectra. A computer-i...
2020 Invention Electrostatic lens for controlling beam of electrons. An arrangement (100) is described which com...
Invention Holding device for a sample and a system for heating a sample using such a holding device. A hold...
2019 Invention Aperture device and analyzer arrangement. An aperture device (31) is described, which is attachab...
Invention Aperture device and analyser arrangement. An aperture device (31) is described, which is attachab...
Invention Aperture device and analyser arrangement. An aperture device (31) is described which is attachabl...
Invention Method and arrangement for distance control between a sample and an aperture. A method is provide...
Invention Method for determining a pressure at a sample surface. A method is described for monitoring a sam...
Invention Hard x-ray photoelectron spectroscopy arrangement and system. The present invention relates to a ...
Invention Hard x-ray photoelectron spectroscopy system. The present invention relates to a hard X-ray photo...
2018 Invention Analyser arrangement for particle spectrometer. The present invention relates to a method for de...
2016 Invention Analyser arrangement for particle spectrometer. The present invention relates to a method for det...