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2024
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Invention
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Methods and apparatus for identifying the presence of shunts in monolithically integrated multi-j... |
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P/S
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Apparatus for inspecting semiconductor materials including wafers; apparatus for inspecting photo... |
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P/S
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Apparatus for inspecting semiconductor materials including
wafers; apparatus for inspecting phot... |
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2019
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Invention
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Methods for inspecting semiconductor wafers. Methods and systems are presented for analysing semi... |
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2017
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Invention
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Methods for inspecting semiconductor wafers. Methods and systems are presented for analyzing semi... |
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2016
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Invention
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Determining the condition of photovoltaic modules. Apparatus and methods are presented for determ... |
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Invention
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Determining the condition of photovoltaic modules.
Some examples include determining the conditi... |
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Invention
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Method and system for testing indirect bandgap semiconductor devices using luminescence imaging. ... |
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Invention
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Method and system for inspecting indirect bandgap semiconductor structure. Methods (600) and syst... |
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2015
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Invention
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Separation of doping density and minority carrier lifetime in photoluminescence measurements on s... |
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Invention
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Wafer imaging and processing method and apparatus. A method is disclosed whereby luminescence ima... |
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Invention
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In-line photoluminescence imaging of semiconductor devices.
Methods and systems are presented fo... |
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2014
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Invention
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Persistent feature detection.
Methods are presented for improved detection of persistent or syst... |
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2012
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Invention
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Wafer grading and sorting for photovoltaic cell manufacture. Methods and systems are presented fo... |
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Invention
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Photoluminescence imaging of doping variations in semiconductor wafers.
Photoluminescence-based ... |
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Invention
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Photoluminescence imaging of doping variations in semiconductor wafers. Photoluminescence-based m... |
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Invention
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Quantitative series resistance imaging of photovoltaic cells.
Luminescence-based methods are dis... |
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Invention
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Quantitative series resistance imaging of photovoltaic cells. Luminescence-based methods are disc... |
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2011
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Invention
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Method and system for inspecting indirect bandgap semiconductor stucture. Methods (600) and syste... |
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Invention
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Systems and methods for detecting crystal defects in monocrystalline semiconductors. Methods and ... |
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Invention
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Persistent feature detection. Methods are presented for improved detection of persistent or syste... |
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Invention
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Control of laser processing steps in solar cell manufacture. Photoluminescence-based methods and ... |
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Invention
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Illumination systems and methods for photoluminescence imaging of photovoltaic cells and wafers. ... |
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Invention
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In-line photoluminescence imaging of semiconductor devices. Methods and systems are presented for... |
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Invention
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Improved illumination systems and methods for photoluminescence imaging of photovoltaic cells and... |
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2010
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Invention
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Photoluminescence imaging systems for silicon photovoltaic cell manufacturing. A method of photol... |
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Invention
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Photoluminescence imaging of surface textured wafers. A method for analysing a multicrystalline s... |
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Invention
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Detection of discontinuities in semiconductor materials. Methods and systems are disclosed whereb... |
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Invention
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Material or device characterisation with non-homogeneous photoexcitation. A method and apparatus ... |
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2009
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Invention
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Method and apparatus for defect detection. Methods are presented for determining an indicator of ... |
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Invention
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Thin film imaging method and apparatus.
Methods and apparatus are presented for monitoring the d... |
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Invention
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Thin film imaging method and apparatus. Methods and apparatus are presented for monitoring the de... |
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Invention
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Device characterisation utilising spatially resolved luminescence imaging. A method for measuring... |
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Invention
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Wafer imaging and processing method and apparatus. A method (1) is disclosed whereby luminescence... |
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2008
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Invention
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Photovoltaic cell manufacturing. Disclosed is a method (300) of manufacturing at least one semico... |
