|
2023
|
Invention
|
Positioner for analytic instruments within vacuum chamber.
A positioner for analytical instrumen... |
|
|
Invention
|
Positioner for analytic instruments within vacuum chamber. A positioner for analytical instrument... |
|
2021
|
P/S
|
atom probe microscope for scientific purposes |
|
2018
|
Invention
|
Energy beam input to atom probe specimens from multiple angles. An atom probe directs two or more... |
|
2017
|
Invention
|
Atom probe with vacuum differential. −1 Pa, very little gas diffusion takes place through the ape... |
|
2015
|
Invention
|
Wide field-of-view atom probe. In an atom probe having a specimen mount spaced from a detector, a... |
|
2011
|
Invention
|
Methods and devices for improving atom probe detector performance. An atom probe includes a detec... |
|
2010
|
Invention
|
Laser atom probe methods. A laser atom probe situates a counter electrode between a specimen moun... |
|
2009
|
Invention
|
3d atomic scale imaging methods. The present invention is directed generally toward atom probe an... |
|
|
Invention
|
Reflectron. A reflectron (1) for deflecting an ion from a specimen in a time-of-flight mass spect... |
|
2008
|
Invention
|
Methods and apparatuses to align energy beam to atom probe specimen.
A method for aligning an en... |
|
2007
|
Invention
|
Atom probe data processes and associated systems.
The present invention relates to atom probe da... |
|
|
Invention
|
Atom probe data and associated systems and methods.
The present invention relates to atom probe ... |
|
2006
|
Invention
|
Atom probe pulse energy.
The present invention relates to atom probe pulse energy. One aspect of... |
|
|
Invention
|
Atom probes, atom probe specimens, and associated methods. The present invention relates generall... |
|
|
Invention
|
Specimens for microanalysis processes.
The present invention relates to specimens for use in mic... |
|
|
Invention
|
Atom probe evaporation processes.
The present invention relates to atom probe evaporation proces... |
|
|
Invention
|
Atom probe. Aspects of the present invention are directed generally toward atom probe and three-d... |
|
|
Invention
|
Atom probe component treatments.
The present invention relates to treatments for atom probe comp... |
|
2005
|
Invention
|
Atom probe electrode treatments.
A method for treating an atom probe electrode (120), which comp... |
|
|
Invention
|
Methods and devices for atom probe mass resolution enhancement. In an atom probe or other mass sp... |
|
2004
|
Invention
|
Laser atom probe. A laser atom probe (100) situates a counter electrode between a specimen mount ... |
|
|
Invention
|
Laser atom probe methods. A laser atom probe (100) situates a counter electrode between a specime... |
|
|
Invention
|
High resolution atom probe. A three dimensional atom probe comprising a sharp specimen (10) coupl... |
|
2003
|
Invention
|
Methods of sampling specimens for microanalysis. Methods of sampling specimens for microanalysis,... |
|
|
Invention
|
Vacuum chamber with recessed viewing tube and imaging device situated therein. A vacuum chamber i... |
|
2001
|
Invention
|
Delay line anodes. In detectors for imaging and other applications, delay line anodes are arrayed... |
|
|
P/S
|
SCIENTIFIC IMAGING AND MEASUREMENT DEVICES FOR MATTER ANALYSIS, NAMELY - ATOM PROBE MICROSCOPES; ... |
|
|
Invention
|
Device and method for two-dimensional detection of particles or electromagnetic radiation. The in... |
|
2000
|
P/S
|
SCIENTIFIC IMAGING AND ANALYSIS INSTRUMENT, NAMELY, A THREE-DIMENSIONAL ATOM PROBE MICROSCOPE |
|
|
P/S
|
Analytical instruments for industrial and scientific research use; namely, microscopes for atomic... |
