Kabushiki Kaisha Nihon Micronics

Japon


 
Quantité totale PI 383
Rang # Quantité totale PI 3 362
Note d'activité PI 3/5.0    151
Rang # Activité PI 4 545
Classe Nice dominante Appareils et instruments scienti...

Brevets

Marques

184 9
15 1
163 10
1
 
Dernier brevet 2025 - Electrical connection device
Premier brevet 1997 - Probe unit and inspection head
Dernière marque 2022 - MICRONICS JAPAN
Première marque 2006 - MJC

Industrie (Classification de Nice)

Derniers inventions, produits et services

2024 Invention Probe. This probe comprises: a tip member having a support part; an elastic base material which i...
Invention Probe. A probe according to the present invention comprises: a tip member which has a support par...
Invention Electrical connection device. This electrical connection device comprises a probe, a flexible wir...
Invention Electrical connection apparatus. An electrical connection apparatus includes probes, a wiring bo...
Invention Space transformer support structure and an electrical connection device. A space transformer sup...
Invention Gripping mechanism and transport device. [Problem] To strongly grip an object while preventing in...
Invention Relay circuit and electrical connection apparatus. An electrical connection apparatus includes t...
Invention Probe for electrical connection device. This probe for an electrical connection device includes: ...
Invention Probe. The present invention comprises: a foot part having a long shape; a flat plate-shaped supp...
Invention Electrical contact and method for manufacturing electrical contact. [Problem] To provide a method...
Invention Probe and electrical connection device. This probe comprises: a tip member having a contact secti...
Invention Manufacturing jig for electrical connection device and manufacturing method for electrical connec...
Invention Probe and method for manufacturing electrical connection device. This probe comprises: an arm par...
2023 Invention Electrical connection device. [Problem] To provide an electrical connection device that suppresse...
Invention Probe. This probe has a columnar shape including a structure in which a contact part, a bending p...
Invention Probe and electrical connecting device. This probe comprises: a columnar base material which has ...
Invention Contact pin, and electrical connection device. The contact pin (10) according to the present inve...
Invention Electrical connection device. [Problem] In order to improve the electrical contact of a probe wit...
Invention Probe and electrical connection device. According to the present invention, probes are inserted i...
Invention Probe device. This probe device comprises: a case having a first surface and a second surface; an...
Invention Probe device. This probe device is equipped with: a housing which has a first surface and a secon...
Invention Electric contact. [Problem] To provide an electric contact in which a configuration comprising el...
Invention Electrical connection device. This electrical connection device comprises probes and a probe head...
Invention Probe, probe-holding device, and method for manufacturing probe. This probe has a distal-end part...
2022 Invention Probe. This probe comprises a main body portion and a spring portion having a larger electrical r...
Invention Probe card and test system. This probe card comprises: a probe guide that holds a probe; and a pr...
Invention Probe storage jig, probe storage system, and probe storage method. This probe storage jig stores ...
P/S Probe cards for testing integrated circuits and semiconductor devices; probe cards for use in con...
P/S measuring or testing machines and instruments; Parts and accessories for measuring or testing mac...
Invention Inspection apparatus having a contactor for inspecting electrical characteristics of an object, a...
Invention Probe. This probe is equipped with first and second tip end sections, and a body section for conn...
Invention Probe unit with a free length cantilever contactor and pedestal. It is possible to make the free ...
Invention Electric contact
Invention Probe and probe card. A probe is inserted into a through-hole in a guide plate and used for insp...
Invention Probe and probe card. This probe is for use in testing a test subject by being inserted into a th...
Invention Connecting apparatus and light condensing substrate. [Problem] To allow to condense and guide the...
2021 Invention Electrical connecting device and method for manufacturing electrical connecting device. An elect...
Invention Electrical connection device, and method for manufacturing electrical connection device. This ele...
Invention Measurement system. A measurement system includes a drive device configured to drive the plurali...
Invention Measurement system and measurement method. A measurement method of receiving an emission light ou...
2020 Invention Optical probe, probe card, measuring system, and measuring method. An optical probe includes a c...
Invention Connecting device for inspection. A connecting device for inspection includes a probe head config...
Invention Blood vessel specifying device and blood vessel specifying method. A blood vessel specifying dev...
Invention Blood vessel position display device and blood vessel position display method. A blood vessel pos...
Invention Electrical connecting device. An electrical connecting device includes probes, and a probe head i...
Invention Secondary battery. A technique of improving the performance of a secondary battery is provided. ...
P/S probe cards in the nature of semiconductor testing apparatus; apparatus for testing the electrica...
P/S Probe cards for semiconductor testers; inspection equipment of electrical characteristic of semi...
2019 Invention Electrical connecting device. An electrical connecting device includes an insulating probe includ...
Invention Electrical connecting apparatus. An electrical connecting apparatus according to the present disc...
P/S (Based on 44(e)) (Based on Use in Commerce) Electric contacts; Measuring apparatus, namely, elect...
P/S Electric contacts; measuring apparatus, namely, electric and magnetic measuring machines; probes...
Invention Probe substrate and electrical connecting apparatus. An object is to enhance the durability of su...
Invention Electrical contactor and electrical connecting apparatus. In order to improve conductivity, the n...
Invention Inspection method and inspection system. An inspection method includes a step S20 of electrically...
2018 P/S Electrical sockets in the nature of integrated circuit sockets; electrical connectors; electrical...
P/S Integrated circuit sockets; electric connectors; electric plugs; probes for semiconductor testers...
2017 P/S Instruments for use in electrical testing machines for testing semiconductors; electrical testing...
P/S Measuring or testing machines and instruments; electrical testing machines for semiconductors ; ...
2016 P/S Accumulators, electric; batteries; electrical cells and batteries.
2014 P/S Probe cards for use in inspection of semiconductors; semiconductor inspection equipment; accumul...
P/S [ machines for manufacturing solar batteries ] [ Probe cards for use in inspection of liquid crys...
P/S Machines and apparatus for repairing or fixing; apparatus for manufacturing solar batteries. Ele...
P/S Machines and apparatus for repairing or fixing, included in this class; apparatus for manufactur...
2011 P/S Repair and maintenance of probe cards for use in inspection of semi-conductors
2010 P/S Apparatuses for inspection of electrical characteristics of semi-conductors; apparatuses for ins...
P/S Electric connections; [ Electric couplings; ] Electric contacts; Detectors, namely, electric and ...
2006 P/S Probe cards for use in connection with inspection of semiconductors and liquid crystal display pa...
P/S Probe cards for use in inspection of semi-conductors; probe cards for use in inspection of liqui...