Mochii, Inc.

États‑Unis d’Amérique

 
Quantité totale PI 17
Rang # Quantité totale PI 88 093
Note d'activité PI 1,7/5.0    9
Rang # Activité PI 101 645

Brevets

Marques

16 0
0 0
1 0
0
 
Dernier brevet 2024 - Scanning charged-particle-beam m...
Premier brevet 2011 - Aberration-correcting dark-field...

Derniers inventions, produits et services

2022 Invention Sample delivery, data acquisition, and analysis, and automation thereof, in charged-particle-beam...
2020 Invention Microscopy. A charged-particle beam microscope is provided for imaging a sample. The microscope h...
2019 Invention Coating of samples for microscopy. A coater is provided for depositing a coating onto a sequence ...
Invention Scanning charged-particle-beam microscopy with energy-dispersive x-ray spectroscopy. A compact ch...
Invention Positioning samples for microscopy, inspection, or analysis. An apparatus is provided for microsc...
2017 Invention Charged-particle beam microscope with an evaporator. A charged-particle beam microscope is provid...
2016 Invention Transmission electron microscopy. A transmission electron microscope is provided for imaging a s...
2015 Invention Hybrid charged-particle beam and light beam microscopy. A charged-particle beam microscope is pro...
Invention Charged-particle beam microscopy. A charged-particle beam microscope includes a charged-particle ...
2014 Invention Incoherent transmission electron microscopy. A transmission electron microscope includes an elect...
2013 Invention Scanning transmission electron microscopy for imaging extended areas. A scanning transmission ele...
2012 Invention Aberration-correcting dark-field electron microscopy. A transmission electron microscope includes...
2011 Invention Scanning transmission electron microscopy. A scanning transmission electron microscope includes a...