|
2023
|
Invention
|
System and method for automatic wafer map classification.
A method of testing semiconductor wafe... |
|
|
Invention
|
Method and system for real time outlier detection and product re-binning. A method for analyzing ... |
|
|
Invention
|
Methods and systems for detecting defects on an electronic assembly. A method of identifying defe... |
|
2022
|
Invention
|
Augmented reliability models for design and manufacturing. A method for generating a reliability ... |
|
2021
|
Invention
|
System and method for binning at final test. A method of sorting an electronic device includes re... |
|
|
Invention
|
Methods of smart pairing. Methods and systems include receiving a product attribute that identifi... |
|
2020
|
Invention
|
Augmented reliability models for design and manufacturing. A method for generating an augmented r... |
|
2019
|
Invention
|
Method and system for real time outlier detection and product re-binning. A method for identifyin... |
|
|
Invention
|
Methods and systems for relating features with labels in electronics. A method comprising, by a p... |
|
2018
|
Invention
|
System and method for binning at final test. Systems and methods for sorting an electronic device... |
|
|
Invention
|
Methods and systems for testing a tester. iQA,2 is met if data representative of passing first bi... |
|
|
Invention
|
Method and system for data collection and analysis for semiconductor manufacturing. A method incl... |
|
|
Invention
|
Method and system for data collection and analysis for semiconductor manufacturing.
A method inc... |
|
2017
|
Invention
|
Methods of smart pairing. Embodiments describe a method of manufacture including receiving a prod... |
|
|
Invention
|
Augmenting reliability models for manufactured products. A method of augmenting a reliability mod... |
|
2016
|
Invention
|
A dynamic process for adaptive tests. A method for modifying the execution sequence of tests for ... |
|
|
Invention
|
Correlation between manufacturing segment and end- user device performance. Disclosed are methods... |
|
|
Invention
|
Detection of counterfeit electronic items. Disclosed are methods, systems and computer program pr... |
|
2015
|
Invention
|
Dynamic process for adaptive tests. A method for modifying the execution sequence of tests for te... |
|
|
Invention
|
Correlation between manufacturing segment and end- user device performance.
Disclosed are method... |
|
2014
|
Invention
|
Systems and methods for test time outlier detection and correction in integrated circuit testing.... |
|
2011
|
Invention
|
Methods and systems for semiconductor testing using a testing scenario language.
Methods and sys... |
|
|
Invention
|
System and methods for parametric testing. Methods, systems, computer-program products and progra... |
|
2010
|
Invention
|
Misalignment indication decision system and method. Systems and methods for deciding whether or n... |
|
2009
|
Invention
|
Methods and systems for semiconductor testing using a testing scenario language. Methods and syst... |
|
2008
|
Invention
|
Methods and systems for semiconductor testing using reference dice. Methods and systems of semico... |
|
|
Invention
|
System and methods for parametric test time reduction. A parametric test time reduction method fo... |
|
2006
|
Invention
|
Methods for slow test time detection of an integrated circuit during parallel testing. Methods an... |
|
|
Invention
|
Augmenting semiconductor's devices quality and reliability. A method for augmenting quality or re... |
|
2005
|
Invention
|
Optimize parallel testing. Parallel dies testing, mostly implemented on memory ICs—Integrated Cir... |
