- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensionsmeasuring anglesmeasuring areasmeasuring irregularities of surfaces or contours
- G01B 11/26 - Measuring arrangements characterised by the use of optical techniques for measuring angles or tapersMeasuring arrangements characterised by the use of optical techniques for testing the alignment of axes
Patent holdings for IPC class G01B 11/26
Total number of patents in this class: 1621
10-year publication summary
|
116
|
153
|
169
|
126
|
119
|
112
|
93
|
106
|
81
|
53
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Enplas Corporation | 886 |
23 |
| The Boeing Company | 20168 |
21 |
| Sony Corporation | 30139 |
20 |
| ASML Netherlands B.V. | 7954 |
20 |
| Robert Bosch GmbH | 44209 |
19 |
| Nikon Corporation | 7232 |
17 |
| Canon Kabushiki Kaisha | 7351 |
17 |
| Canon Inc. | 43941 |
16 |
| KLA Corporation | 1862 |
16 |
| Leica Geosystems AG | 599 |
15 |
| NEC Corporation | 37064 |
14 |
| National Institute of Advanced Industrial Science and Technology | 3793 |
13 |
| Denso Corporation | 25607 |
12 |
| Olympus Corporation | 12932 |
12 |
| Kabushiki Kaisha Topcon | 554 |
12 |
| Ford Global Technologies, LLC | 21532 |
11 |
| Mitsubishi Electric Corporation | 48097 |
11 |
| Omron Corporation | 7380 |
11 |
| Lumus Ltd. | 508 |
11 |
| Panasonic Intellectual Property Management Co., Ltd. | 34080 |
10 |
| Other owners | 1320 |