- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensionsmeasuring anglesmeasuring areasmeasuring irregularities of surfaces or contours
- G01B 21/08 - Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness
Patent holdings for IPC class G01B 21/08
Total number of patents in this class: 435
10-year publication summary
|
33
|
39
|
27
|
50
|
36
|
29
|
40
|
28
|
33
|
20
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| LG Energy Solution, Ltd. | 15055 |
10 |
| Rolls-Royce North American Technologies, Inc. | 1169 |
8 |
| Micro-Epsilon Messtechnik GmbH & Co. KG | 116 |
7 |
| Siemens AG | 24477 |
6 |
| MOBA Mobile Automation AG | 65 |
6 |
| Yokogawa Electric Corporation | 1745 |
6 |
| Panasonic Intellectual Property Management Co., Ltd. | 31475 |
5 |
| Halliburton Energy Services, Inc. | 20901 |
4 |
| LG Chem, Ltd. | 17638 |
4 |
| Tokyo Electron Limited | 12733 |
4 |
| Boe Technology Group Co., Ltd. | 41217 |
4 |
| Ecolab USA Inc. | 5491 |
4 |
| Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | 6109 |
4 |
| General Electric Company | 13793 |
3 |
| International Business Machines Corporation | 61257 |
3 |
| Honeywell International Inc. | 13553 |
3 |
| FUJIFILM Corporation | 29399 |
3 |
| Applied Materials, Inc. | 18658 |
3 |
| Nikon Corporation | 7170 |
3 |
| Shenzhen China Star Optoelectronics Technology Co., Ltd. | 8478 |
3 |
| Other owners | 342 |