- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensions; measuring angles; measuring areas; measuring irregularities of surfaces or contours
- G01B 9/021 - Interferometers using holographic techniques
Patent holdings for IPC class G01B 9/021
Total number of patents in this class: 149
10-year publication summary
|
12
|
11
|
14
|
10
|
16
|
6
|
11
|
6
|
7
|
0
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Carl Zeiss SMT GmbH | 2815 |
7 |
| Phase Holographic Imaging PHI AB | 19 |
6 |
| University of South Florida | 1827 |
5 |
| The Regents of the University of California | 19517 |
4 |
| FUJIFILM Corporation | 28805 |
4 |
| Ecole Polytechnique Federale de Lausanne (epfl) | 1503 |
4 |
| Universite Libre de Bruxelles | 315 |
4 |
| RD Synergy Ltd. | 5 |
4 |
| Commissariat à l'énergie atomique et aux energies alternatives | 10692 |
3 |
| Harris Corporation | 1511 |
3 |
| National University Corporation Kyoto Institute of Technology | 191 |
3 |
| New York University | 1686 |
3 |
| Ovizio Imaging Systems N.V. | 4 |
3 |
| Ramot at Tel-Aviv University Ltd. | 1444 |
3 |
| Canon Inc. | 38148 |
2 |
| Hamamatsu Photonics K.K. | 4304 |
2 |
| Carl Zeiss SMT AG | 249 |
2 |
| Accelerate Diagnostics, Inc. | 59 |
2 |
| Korea Photonics Technology Institute | 152 |
2 |
| National Taiwan Normal University | 126 |
2 |
| Other owners | 81 |