2025
|
G/S
|
Instruments and applications for the correction of wafer forms; laser system to correct distorsio... |
|
G/S
|
instruments and applications for the correction of wafer forms; laser system to correct distorsio... |
|
G/S
|
3D X-ray inspection and metrology tool in the field of semiconductor measurement and control solu... |
|
Invention
|
Mirror device, projection objective and method for measuring the temperature of a mirror.
A mirr... |
|
Invention
|
Mirror device, for example for a microlithographic projection exposure system, and method for mea... |
|
Invention
|
Computer implemented method for defect detection in an imaging dataset of a wafer, corresponding ... |
|
Invention
|
Optical element for a projection exposure system, optical system comprising same and projection e... |
|
Invention
|
Method for operating a projection exposure system.
In a method for operating a microlithographic... |
|
Invention
|
Facet mirror, illumination optical unit, arrangement of a facet mirror, projection exposure appar... |
|
Invention
|
Computer implemented method for defect recognition in an imaging dataset of a wafer, correspondin... |
|
Invention
|
Apparatus for stress-reduced mounting of mems-based micromirrors.
An apparatus for stress-reduce... |
|
Invention
|
Assembly of an optical system.
An assembly of an optical system, comprising at least one mirror ... |
|
Invention
|
Holding device for an optical component having an optical surface with a polygonal border and hav... |
|
Invention
|
Arrangement, method and computer program product for calibrating facet mirrors.
The techniques d... |
|
Invention
|
Bipod, optical system and projection exposure apparatus.
A bipod for adjusting an optical elemen... |
|
Invention
|
Method to adjust an illumination beam path within an illumination optics and illumination optics ... |
|
Invention
|
Microelectromechanical device.
Microelectromechanical device with a carrier substrate having a s... |
|
Invention
|
Method for operating an optical component, and optical component.
A method of operating an optic... |
|
Invention
|
Illumination system, radiation source apparatus, method for illuminating a reticle, and lithograp... |
|
Invention
|
Individual mirror of a pupil facet mirror and pupil facet mirror for an illumination optical unit... |
|
Invention
|
Intermediate product for producing an optical element for a projection exposure apparatus, optica... |
|
Invention
|
Micro-optical element.
An actuator device for a tiltable micro-optical element comprises a plura... |
|
Invention
|
Drive device, optical system and lithography apparatus.
A drive device for driving at least one ... |
|
Invention
|
Method of characterizing a fault in a scanning electron microscope.
A method of characterizing a... |
|
Invention
|
Method and device for correcting image errors when scanning a charged particle beam over a sample... |
|
Invention
|
Method for distortion measurement and parameter setting for charged particle beam imaging devices... |
|
Invention
|
Residual gas analyser, projection exposure apparatus comprising a residual gas analyser and metho... |
|
Invention
|
Method, lithography mask, use of a lithography mask, and processing arrangement.
A method for ch... |
|
Invention
|
Lens element for a microlithographic projection exposure apparatus designed for operation in the ... |
|
Invention
|
Apparatus and method for providing sensor data of an optical system, optical system and lithograp... |
2024
|
Invention
|
Optical system for a metrology system and metrology system with such an optical system.
An optic... |
|
Invention
|
Magnifying imaging optical unit for a metrology system for examining objects.
A magnifying imagi... |
|
Invention
|
Laser light source, in particular for use in a microlithography projection exposure system. The i... |
|
Invention
|
Device for sampling for determining a corrosion state of a module for semiconductor lithography, ... |
|
Invention
|
Method for crosstalk modelling in a multi-mirror array having movable individual mirrors. The inv... |
|
Invention
|
Computer implemented method for generating an aerial image of a photolithography mask using a mac... |
|
Invention
|
Connecting a holding element to an optical element by means of a connecting material. The inventi... |
|
Invention
|
Method for adjusting at least one sensor for a projection exposure apparatus and projection expos... |
|
Invention
|
Apparatus for measuring a telecentricity of an optical imaging system. A measuring apparatus (10)... |
|
Invention
|
Method for protecting an adhesive layer from stray radiation, optical component and semiconductor... |
|
Invention
|
Euv mirror system, method for operating an euv mirror system, projection lens for a microlit... |
|
Invention
|
Method and device for producing an element, element, in particular optical element, and lithograp... |
|
Invention
|
Test system for a camera, mask inspections system and method for testing a camera.
A test system... |
|
Invention
|
Method and computing device for compensating for liquid-transmitted acoustic disturbance excitati... |
|
Invention
|
Imaging optical unit for imaging an object field into an image field, and projection exposure app... |
|
Invention
|
Method for placing and securing at least one micromirror matrix. The invention relates to a metho... |
|
Invention
|
Method for manufacturing an euv mirror component, and intermediate product of an euv mirror compo... |
|
Invention
|
Method for smoothing a surface of a substrate. The invention relates to a method for smoothing a ... |
|
Invention
|
Heating head, heating device, and optical system, in particular euv lithography system. The inven... |
|
G/S
|
Applications and instruments in the field of semiconductor
measurement and inspection solutions ... |
|
G/S
|
Applications and instruments in the field of semiconductor
measurement and inspection solutions. |
|
Invention
|
Lithography system comprising a coupling for separating line portions, and method for leak testin... |
|
G/S
|
applications and instruments in the field of semiconductor measurement and inspection solutions. |
|
G/S
|
Electro-optical instruments for use in inspection and measurement of industrial components, namel... |
|
G/S
|
Downloadable computer application software for use in semiconductor measurement and semiconductor... |
2023
|
Invention
|
Method for producing a cooling element, cooling element for optical arrangements and optical arra... |
|
Invention
|
Methods, systems, computer programs and computer-readable media for automatically designing a wor... |
2022
|
G/S
|
Recorded data; web applications and server software;
utility, security and cryptographic softwar... |
2020
|
G/S
|
Focused ion beam workstations, comprising of scanning ion and electron microscopes, computer soft... |
|
G/S
|
Focused ion beam systems/instruments for scientific
purposes; software for focused ion beam syst... |
|
G/S
|
Focused ion beam apparatus comprised of computer hardware and recorded computer software to perfo... |
|
G/S
|
Software platform for the visualization and analysis of
semiconductor image data. |
|
G/S
|
Apparatus and instruments for aerial photogrammetry of
lithography photomasks in the field of se... |
2019
|
G/S
|
Apparatus and instruments for aerial photogrammetry of lithography photomasks in the field of sem... |
2018
|
G/S
|
Microscopes and parts thereof; x-ray microscopes and parts thereof; downloadable software used fo... |
2014
|
G/S
|
Maintenance, repairing, installation and replacement of
hardware for semiconductor equipment. Ma... |
|
G/S
|
Installation, maintenance and repair of semiconductor equipment for others; replacement of worn o... |
|
G/S
|
Server for linking instruments used in the semiconductor field and for analyzing and evaluating d... |
|
G/S
|
Computer server for linking instruments used in the
semiconductor field and for analyzing and ev... |
2011
|
G/S
|
Laser apparatus for correcting the precision in the position
of photomask structures. |
2009
|
G/S
|
Optical inspection apparatus, namely, semiconductor mask inspection apparatus and parts thereof |
|
G/S
|
Mask inspection systems. |
2008
|
G/S
|
measuring instruments to measure positions of structures on photomasks; computer software for use... |
2005
|
G/S
|
Apparatus for repair of masks used for manufacturing
semi-conductor structures and their parts (... |
|
G/S
|
mask repair tools used in the semiconductor industry |
2002
|
G/S
|
Optical apparatus and instruments, lenses for the semiconductor industry, apparatus and instrumen... |
1998
|
G/S
|
Optical apparatus and instruments; objectives. Lighting devices. |
1997
|
G/S
|
lens objectives for use with wafersteppers and illuminators |