Carl Zeiss SMT GmbH

Germany

 
Total IP 2,964
Total IP incl. subs 3,209 (+ 245 for subs)
Total IP Rank # 412
IP Activity Score 3.9/5.0    1,726
IP Activity Rank # 412
Parent Entity Carl Zeiss AG
Dominant Nice Class Scientific and electric apparatu...

Patents

Trademarks

1,506 11
0 1
1,427 13
6
 
Last Patent 2025 - Mirror device, projection object...
First Patent 1999 - Illumination system particularly...
Last Trademark 2025 - DUNE
First Trademark 1997 - STARLITH

Subsidiaries

3 subsidiaries with IP (245 patents, 0 trademarks)

1 subsidiaries without IP

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Industry (Nice Classification)

Latest Inventions, Goods, Services

2025 G/S Instruments and applications for the correction of wafer forms; laser system to correct distorsio...
G/S instruments and applications for the correction of wafer forms; laser system to correct distorsio...
G/S 3D X-ray inspection and metrology tool in the field of semiconductor measurement and control solu...
Invention Mirror device, projection objective and method for measuring the temperature of a mirror. A mirr...
Invention Mirror device, for example for a microlithographic projection exposure system, and method for mea...
Invention Computer implemented method for defect detection in an imaging dataset of a wafer, corresponding ...
Invention Optical element for a projection exposure system, optical system comprising same and projection e...
Invention Method for operating a projection exposure system. In a method for operating a microlithographic...
Invention Facet mirror, illumination optical unit, arrangement of a facet mirror, projection exposure appar...
Invention Computer implemented method for defect recognition in an imaging dataset of a wafer, correspondin...
Invention Apparatus for stress-reduced mounting of mems-based micromirrors. An apparatus for stress-reduce...
Invention Assembly of an optical system. An assembly of an optical system, comprising at least one mirror ...
Invention Holding device for an optical component having an optical surface with a polygonal border and hav...
Invention Arrangement, method and computer program product for calibrating facet mirrors. The techniques d...
Invention Bipod, optical system and projection exposure apparatus. A bipod for adjusting an optical elemen...
Invention Method to adjust an illumination beam path within an illumination optics and illumination optics ...
Invention Microelectromechanical device. Microelectromechanical device with a carrier substrate having a s...
Invention Method for operating an optical component, and optical component. A method of operating an optic...
Invention Illumination system, radiation source apparatus, method for illuminating a reticle, and lithograp...
Invention Individual mirror of a pupil facet mirror and pupil facet mirror for an illumination optical unit...
Invention Intermediate product for producing an optical element for a projection exposure apparatus, optica...
Invention Micro-optical element. An actuator device for a tiltable micro-optical element comprises a plura...
Invention Drive device, optical system and lithography apparatus. A drive device for driving at least one ...
Invention Method of characterizing a fault in a scanning electron microscope. A method of characterizing a...
Invention Method and device for correcting image errors when scanning a charged particle beam over a sample...
Invention Method for distortion measurement and parameter setting for charged particle beam imaging devices...
Invention Residual gas analyser, projection exposure apparatus comprising a residual gas analyser and metho...
Invention Method, lithography mask, use of a lithography mask, and processing arrangement. A method for ch...
Invention Lens element for a microlithographic projection exposure apparatus designed for operation in the ...
Invention Apparatus and method for providing sensor data of an optical system, optical system and lithograp...
2024 Invention Optical system for a metrology system and metrology system with such an optical system. An optic...
Invention Magnifying imaging optical unit for a metrology system for examining objects. A magnifying imagi...
Invention Laser light source, in particular for use in a microlithography projection exposure system. The i...
Invention Device for sampling for determining a corrosion state of a module for semiconductor lithography, ...
Invention Method for crosstalk modelling in a multi-mirror array having movable individual mirrors. The inv...
Invention Computer implemented method for generating an aerial image of a photolithography mask using a mac...
Invention Connecting a holding element to an optical element by means of a connecting material. The inventi...
Invention Method for adjusting at least one sensor for a projection exposure apparatus and projection expos...
Invention Apparatus for measuring a telecentricity of an optical imaging system. A measuring apparatus (10)...
Invention Method for protecting an adhesive layer from stray radiation, optical component and semiconductor...
Invention Euv mirror system, method for operating an euv mirror system, projection lens for a microlit...
Invention Method and device for producing an element, element, in particular optical element, and lithograp...
Invention Test system for a camera, mask inspections system and method for testing a camera. A test system...
Invention Method and computing device for compensating for liquid-transmitted acoustic disturbance excitati...
Invention Imaging optical unit for imaging an object field into an image field, and projection exposure app...
Invention Method for placing and securing at least one micromirror matrix. The invention relates to a metho...
Invention Method for manufacturing an euv mirror component, and intermediate product of an euv mirror compo...
Invention Method for smoothing a surface of a substrate. The invention relates to a method for smoothing a ...
Invention Heating head, heating device, and optical system, in particular euv lithography system. The inven...
G/S Applications and instruments in the field of semiconductor measurement and inspection solutions ...
G/S Applications and instruments in the field of semiconductor measurement and inspection solutions.
Invention Lithography system comprising a coupling for separating line portions, and method for leak testin...
G/S applications and instruments in the field of semiconductor measurement and inspection solutions.
G/S Electro-optical instruments for use in inspection and measurement of industrial components, namel...
G/S Downloadable computer application software for use in semiconductor measurement and semiconductor...
2023 Invention Method for producing a cooling element, cooling element for optical arrangements and optical arra...
Invention Methods, systems, computer programs and computer-readable media for automatically designing a wor...
2022 G/S Recorded data; web applications and server software; utility, security and cryptographic softwar...
2020 G/S Focused ion beam workstations, comprising of scanning ion and electron microscopes, computer soft...
G/S Focused ion beam systems/instruments for scientific purposes; software for focused ion beam syst...
G/S Focused ion beam apparatus comprised of computer hardware and recorded computer software to perfo...
G/S Software platform for the visualization and analysis of semiconductor image data.
G/S Apparatus and instruments for aerial photogrammetry of lithography photomasks in the field of se...
2019 G/S Apparatus and instruments for aerial photogrammetry of lithography photomasks in the field of sem...
2018 G/S Microscopes and parts thereof; x-ray microscopes and parts thereof; downloadable software used fo...
2014 G/S Maintenance, repairing, installation and replacement of hardware for semiconductor equipment. Ma...
G/S Installation, maintenance and repair of semiconductor equipment for others; replacement of worn o...
G/S Server for linking instruments used in the semiconductor field and for analyzing and evaluating d...
G/S Computer server for linking instruments used in the semiconductor field and for analyzing and ev...
2011 G/S Laser apparatus for correcting the precision in the position of photomask structures.
2009 G/S Optical inspection apparatus, namely, semiconductor mask inspection apparatus and parts thereof
G/S Mask inspection systems.
2008 G/S measuring instruments to measure positions of structures on photomasks; computer software for use...
2005 G/S Apparatus for repair of masks used for manufacturing semi-conductor structures and their parts (...
G/S mask repair tools used in the semiconductor industry
2002 G/S Optical apparatus and instruments, lenses for the semiconductor industry, apparatus and instrumen...
1998 G/S Optical apparatus and instruments; objectives. Lighting devices.
1997 G/S lens objectives for use with wafersteppers and illuminators