- All sections
- G - Physics
- G01D - Measuring not specially adapted for a specific variablearrangements for measuring two or more variables not covered by a single other subclasstariff metering apparatustransferring or transducing arrangements not specially adapted for a specific variablemeasuring or testing not otherwise provided for
- G01D 5/38 - Forming the light into pulses by diffraction gratings
Patent holdings for IPC class G01D 5/38
Total number of patents in this class: 222
10-year publication summary
|
19
|
21
|
19
|
13
|
13
|
15
|
3
|
1
|
12
|
5
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Nikon Corporation | 7271 |
33 |
| Dr. Johannes Heidenhain GmbH | 407 |
33 |
| Mitutoyo Corporation | 1252 |
19 |
| Renishaw plc | 768 |
16 |
| Zygo Corporation | 178 |
9 |
| Canon Inc. | 40509 |
8 |
| ASML Netherlands B.V. | 7482 |
5 |
| DMG MORI Seiki Co., Ltd. | 65 |
5 |
| Sendai Nikon Corp. | 7 |
5 |
| DMG MORI Co., Ltd. | 876 |
4 |
| Tsinghua University | 5966 |
3 |
| CSEM Centre Suisse d'Electronique et de Microtechnique SA - Recherche et Developpement | 229 |
3 |
| FARO Technologies, Inc. | 801 |
3 |
| Namiki Seimitsu Houseki Kabushiki Kaisha | 145 |
3 |
| PGS Geophysical AS | 537 |
3 |
| Taiyo Yuden Co., Ltd. | 1977 |
3 |
| TT Electronics plc | 25 |
3 |
| Adamant Kabushiki Kaisha | 4 |
3 |
| Illinois Tool Works Inc. | 11520 |
2 |
| Siemens AG | 24352 |
2 |
| Other owners | 57 |