- All sections
- G - Physics
- G01N - Investigating or analysing materials by determining their chemical or physical properties
- G01N 23/044 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material using laminography or tomosynthesis
Patent holdings for IPC class G01N 23/044
Total number of patents in this class: 84
10-year publication summary
|
0
|
2
|
5
|
12
|
16
|
18
|
20
|
11
|
5
|
0
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| KUB Technologies, Inc., DBA Kubtec | 46 |
9 |
| AIX Scan, Inc. | 10 |
8 |
| Adaptix Limited | 72 |
7 |
| Saki Corporation | 24 |
5 |
| Massachusetts Institute of Technology | 9930 |
3 |
| Hologic, Inc. | 1095 |
3 |
| FUJIFILM Corporation | 28841 |
2 |
| Koninklijke Philips N.V. | 24106 |
2 |
| Omron Corporation | 7169 |
2 |
| Toray Industries, Inc. | 6859 |
2 |
| Shimadzu Corporation | 6036 |
2 |
| Asahi Roentgen Ind. Co., Ltd. | 5 |
2 |
| Job Corporation | 30 |
2 |
| The Research Foundation for The State University of New York | 1559 |
2 |
| Safran Aircraft Engines | 6078 |
2 |
| AlxSCAN, Inc. | 3 |
2 |
| General Electric Company | 17800 |
1 |
| Hitachi High-Tech Science Corporation | 323 |
1 |
| Nikon Corporation | 7118 |
1 |
| Commissariat à l'énergie atomique et aux energies alternatives | 10700 |
1 |
| Other owners | 25 |