- All sections
- G - Physics
- G01N - Investigating or analysing materials by determining their chemical or physical properties
- G01N 23/20 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using diffraction of the radiation by the materials, e.g. for investigating crystal structureInvestigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materialsInvestigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials
Patent holdings for IPC class G01N 23/20
Total number of patents in this class: 1160
10-year publication summary
|
105
|
120
|
88
|
58
|
58
|
71
|
48
|
44
|
41
|
20
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Rigaku Corporation | 495 |
49 |
| Koninklijke Philips N.V. | 25832 |
19 |
| Commissariat à l'énergie atomique et aux energies alternatives | 11127 |
19 |
| Bruker AXS, Inc. | 35 |
19 |
| KLA Corporation | 1844 |
18 |
| Shimadzu Corporation | 6337 |
15 |
| Konica Minolta, Inc. | 9116 |
14 |
| Rapiscan Systems, Inc. | 283 |
12 |
| Saudi Arabian Oil Company | 14207 |
12 |
| Canon Inc. | 43768 |
11 |
| Centre National de La Recherche Scientifique | 11016 |
11 |
| KLA-Tencor Corporation | 2518 |
11 |
| Sigray, Inc. | 87 |
11 |
| Malvern PANalytical B.V. | 133 |
11 |
| Smiths Detection Germany GmbH | 69 |
11 |
| Halliburton Energy Services, Inc. | 21320 |
10 |
| FEI Company | 1052 |
10 |
| Paul Scherrer Institut | 275 |
10 |
| Vib VZW | 902 |
10 |
| Shin-Etsu Chemical Co., Ltd. | 6083 |
9 |
| Other owners | 868 |