• All sections
  • G - Physics
  • G01N - Investigating or analysing materials by determining their chemical or physical properties
  • G01N 23/20 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using diffraction of the radiation by the materials, e.g. for investigating crystal structureInvestigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materialsInvestigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials

Patent holdings for IPC class G01N 23/20

Total number of patents in this class: 1159

10-year publication summary

105
120
88
58
58
71
48
46
41
24
2017 2018 2019 2020 2021 2022 2023 2024 2025 2026

Principal owners for this class

Owner
All patents
This class
Rigaku Corporation
505
49
Koninklijke Philips N.V.
26073
19
Commissariat à l'énergie atomique et aux energies alternatives
11136
19
Bruker AXS, Inc.
35
19
KLA Corporation
1885
18
Shimadzu Corporation
6376
15
Konica Minolta, Inc.
9194
14
Rapiscan Systems, Inc.
284
12
Saudi Arabian Oil Company
14390
12
Centre National de La Recherche Scientifique
11122
11
KLA-Tencor Corporation
2517
11
Sigray, Inc.
89
11
Malvern PANalytical B.V.
135
11
Smiths Detection Germany GmbH
69
11
Halliburton Energy Services, Inc.
21299
10
Canon Inc.
44414
10
FEI Company
1063
10
Paul Scherrer Institut
274
10
Vib VZW
912
10
Shin-Etsu Chemical Co., Ltd.
6148
9
Other owners 868