• All sections
  • G - Physics
  • G01N - Investigating or analysing materials by determining their chemical or physical properties
  • G01N 23/20 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using diffraction of the radiation by the materials, e.g. for investigating crystal structureInvestigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materialsInvestigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials

Patent holdings for IPC class G01N 23/20

Total number of patents in this class: 1160

10-year publication summary

105
120
88
58
58
71
48
44
41
20
2017 2018 2019 2020 2021 2022 2023 2024 2025 2026

Principal owners for this class

Owner
All patents
This class
Rigaku Corporation
495
49
Koninklijke Philips N.V.
25832
19
Commissariat à l'énergie atomique et aux energies alternatives
11127
19
Bruker AXS, Inc.
35
19
KLA Corporation
1844
18
Shimadzu Corporation
6337
15
Konica Minolta, Inc.
9116
14
Rapiscan Systems, Inc.
283
12
Saudi Arabian Oil Company
14207
12
Canon Inc.
43768
11
Centre National de La Recherche Scientifique
11016
11
KLA-Tencor Corporation
2518
11
Sigray, Inc.
87
11
Malvern PANalytical B.V.
133
11
Smiths Detection Germany GmbH
69
11
Halliburton Energy Services, Inc.
21320
10
FEI Company
1052
10
Paul Scherrer Institut
275
10
Vib VZW
902
10
Shin-Etsu Chemical Co., Ltd.
6083
9
Other owners 868