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2024
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G/S
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Scientific apparatus, namely, a Focused Ion Beam Scanning
Electron Microscope (FIB-SEM) for semi... |
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Invention
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Methods and systems for elemental mapping.
Methods and systems for imaging a sample with a charg... |
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Invention
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Particle-induced x-ray emission (pixe) using hydrogen and multi-species focused ion beams.
An ap... |
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Invention
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Charged particle microscope for examining a specimen, and method of determining an aberration of ... |
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Invention
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Method and system for spectroscopic analysis.
Methods and systems for spectroscopic analysis of ... |
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G/S
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Providing online non-downloadable workflow management
software. |
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G/S
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Downloadable workflow management software. |
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Invention
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Systems and methods of clamp compensation.
A positioning system, can include a control unit incl... |
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G/S
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Scientific apparatus, namely, a Focused Ion Beam Scanning Electron Microscope (FIB-SEM) for semic... |
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Invention
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Method and system for sample preparation.
A sample is milled to expose the region of interest (R... |
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Invention
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Method and system for sample preparation. A sample is milled to expose the region of interest (RO... |
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Invention
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Methods for three-dimensional tomography of elongated samples.
A method of three-dimensional (3D... |
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Invention
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Method for confirming and finding an ionization edge within a measured eels spectrum.
A method f... |
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Invention
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Method of preparing a cryogenic sample with improved cooling characteristic.
The invention relat... |
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Invention
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Transmission charged particle microscope with an electron energy loss spectroscopy detector.
The... |
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Invention
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Systems and methods for performing sample lift-out for highly reactive materials.
Methods and sy... |
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Invention
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Supervised machine learning based classification of adeno associated viruses in cryogenic electro... |
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Invention
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Systems and methods for accurate layer detection and analysis in charged particle microscopes.
E... |
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Invention
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Techniques for reducing electromagnetic interference effects in charged particle microscopy. Embo... |
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Invention
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Support structure of inverted lamella for tall roi.
Lamellae with thin regions for TEM of region... |
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Invention
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Bifocal electron microscope.
Methods for using a single electron microscope system for investiga... |
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Invention
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Instrument optimization using analyte based mass spectrometer and algorithm parameters. Disclosed... |
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Invention
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System for generating gel-lane plots highlighting deconvoluted masses. Disclosed herein are scien... |
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Invention
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Techniques for narrowing zero loss peaks in monochromated charged particles sources.
Charged par... |
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G/S
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Downloadable workflow management software |
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G/S
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Providing online non-downloadable workflow management software |
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G/S
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transmission electron microscope (TEM) |
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2023
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Invention
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Detectors for microscopy.
Improved detectors for microscopy are described herein. In one aspect,... |
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Invention
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Method for alignment free ion column.
Disclosed herein are systems and methods for calibration o... |
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Invention
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Fiber fabry-perot cavity laser phase plate for charged particle microscopy.
Fiber Fabry-Perot Ca... |
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Invention
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Method of evaluating a sample using charged particle microscopy.
The invention relates to a meth... |
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Invention
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Method for micromachining a biological sample for creating a lamella for analysis in a cryo-charg... |
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Invention
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Hollow core waveguide flow cell. A flow cell (100) for use with a spectrometer is described. The ... |
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Invention
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Hollow core waveguide flow cell.
A flow cell for use with a spectrometer is described. The flow ... |
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Invention
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Frame-based precession mapping in electron microscopy. Methods include directing a charged partic... |
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Invention
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In-vacuum chamber controlled-gas-film device to reduce laser ablation redeposits.
Surface contam... |
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G/S
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Laboratory instrument, namely, a scanning electron microscope for material imaging and analysis |
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Invention
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Method of sample preparaton and analysis.
The present invention provides a method of sample prep... |
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Invention
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Device line understanding using composed templates.
Systems, components, methods, and algorithms... |
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Invention
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Precision handling system with compliant gripper.
A precision handling system including a grippe... |
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Invention
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Techniques for detecting probe landing in integrated circuit testing systems.
Systems, methods, ... |
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Invention
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Detecting charged particle events at high dose rates.
Charged particle microscope (CPM) support ... |
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Invention
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Automated beam on edge vibration analysis.
Disclosed herein are scientific instrument support sy... |
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Invention
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Capacitance-based detection of probe contact.
Techniques for detecting contact of a probe on a s... |
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Invention
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Plasma control for spark optical emission spectroscopy.
An apparatus for plasma control is discl... |
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Invention
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Few-shot learning for processing microscopy images.
Disclosed herein are scientific instrument s... |
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Invention
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Techniques for electron energy loss spectroscopy at high energy.
Systems, devices, methods, and ... |
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Invention
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Augmentation of electron energy loss spectroscopy in charged particle microscopes.
Systems and t... |
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G/S
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Laboratory apparatus, namely, a carrier for samples in the
field of electron microscopy. |
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Invention
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Crenellated sample holder and sputter target for sample preparation in cryo electron microscopy a... |
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Invention
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Method of preparing a sample for transmission electron microscopy (tem) analysis.
A method of pr... |
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G/S
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Laboratory instrument, namely, an ion beam polisher. |
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G/S
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Laboratory instrument, namely, an ion beam polisher. |
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Invention
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Deep learning techniques for fast anomaly detection in experimental data.
Disclosed herein are s... |
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Invention
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Deep learning techniques for analyses of experimental data generated by two or more detectors.
D... |
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G/S
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Scanning transmission electron microscope for sample preparation and imaging analysis in the fiel... |
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2022
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Invention
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Trained neural network model for parameter-less peak detection. Disclosed herein are scientific i... |
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Invention
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Condensate precursors and contaminant purge apparatus and methods.
Methods include arranging a s... |
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Invention
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Pole piece incorporating optical cavity for improved phase-contrast in electron microscope imagin... |
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Invention
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Laser device with safety interlock and scientific instrument for use with the same.
A laser devi... |
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Invention
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Charged particle sensors including wide bandgap materials.
Charged particle microscopy systems, ... |
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Invention
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Eels auto-alignment using full image simulation.
Methods and systems for automatically tuning an... |
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G/S
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Laboratory apparatus, namely, a container for holding biological samples to be viewed on an elect... |
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G/S
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Laboratory instrument, namely, ion milling machines for preparing specimens for observation with ... |
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2021
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G/S
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cryo dual-beam electron microscope |
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G/S
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Laboratory apparatus, namely, an optical instrument for imaging inside an electron microscope |
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G/S
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Providing demonstration of products in the field of electron
microscopes. Providing facilities f... |
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2020
|
G/S
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Providing demonstration of products in the field of electron microscopes Providing facilities for... |
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G/S
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Electron microscopes. |
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2019
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G/S
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Electron microscope |
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G/S
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Electron microscope. |
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G/S
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Laboratory instrument for processing samples for single
particle analysis and/or cryo-tomography... |
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G/S
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High brightness, submicron ion and electron beam columns
using field emission technology for sci... |
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G/S
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Laboratory instrument for processing samples for single particle analysis and/or cryo-tomography ... |
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2018
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G/S
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high brightness, submicron ion and electron beam columns using field emission technology, namely,... |
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2002
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G/S
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Equipment and micro-machining equipment for manufacture of semi-conductors, data storage componen... |
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2001
|
G/S
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Scientific, nautical, surveying, electric, photographic, cinematographic, optical, weighing, meas... |
