- All sections
- G - Physics
- G01N - Investigating or analysing materials by determining their chemical or physical properties
- G01N 23/207 - Diffractometry, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
Patent holdings for IPC class G01N 23/207
Total number of patents in this class: 666
10-year publication summary
|
69
|
61
|
68
|
64
|
59
|
66
|
43
|
46
|
36
|
11
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Rigaku Corporation | 479 |
107 |
| Bruker AXS, Inc. | 36 |
17 |
| Shimadzu Corporation | 6304 |
16 |
| Bruker Technologies Ltd. | 73 |
16 |
| Malvern PANalytical B.V. | 132 |
14 |
| Sigray, Inc. | 86 |
11 |
| Xinmei Fontana Holding (Hong Kong) Limited | 155 |
10 |
| FEI Company | 1045 |
9 |
| KLA-Tencor Corporation | 2523 |
9 |
| LG Energy Solution, Ltd. | 17738 |
9 |
| Shin-Etsu Chemical Co., Ltd. | 5966 |
8 |
| Bruker AXS SE | 38 |
8 |
| LG Chem, Ltd. | 17846 |
7 |
| Semiconductor Energy Laboratory Co., Ltd. | 11701 |
7 |
| Xnovo Technology ApS | 10 |
7 |
| Proto Patents Ltd. | 16 |
7 |
| Danmarks Tekniske Universitet | 1017 |
6 |
| JEOL Ltd. | 617 |
6 |
| Sintokogio, Ltd. | 1180 |
6 |
| The University of Tokyo | 4329 |
6 |
| Other owners | 380 |