- All sections
- G - Physics
- G01Q - Scanning-probe techniques or apparatusapplications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
- G01Q 20/04 - Self-detecting probes, i.e. wherein the probe itself generates a signal representative of its position, e.g. piezoelectric gauge
Patent holdings for IPC class G01Q 20/04
Total number of patents in this class: 99
10-year publication summary
|
1
|
7
|
10
|
6
|
4
|
8
|
2
|
8
|
2
|
1
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Bruker Nano, Inc. | 381 |
9 |
| Centre National de La Recherche Scientifique | 11092 |
7 |
| Nano Analytik GmbH | 7 |
5 |
| Nederlandse Organisatie voor Toegepast-natuurwetenschappelijk Onderzoek TNO | 2455 |
4 |
| Vmicro | 10 |
4 |
| Commissariat à l'énergie atomique et aux energies alternatives | 11128 |
3 |
| Technische Universitat Ilmenau | 104 |
3 |
| The Regents of the University of California | 20868 |
2 |
| International Business Machines Corporation | 62769 |
2 |
| Massachusetts Institute of Technology | 10290 |
2 |
| Shimadzu Corporation | 6373 |
2 |
| The Research Foundation for The State University of New York | 1764 |
2 |
| Technische Universitat Wien | 403 |
2 |
| Yale University | 2565 |
2 |
| Université Lille 1 - | 3 |
2 |
| Nearfield Instruments B.V. | 62 |
2 |
| Xallent Inc. | 20 |
2 |
| Samsung Electronics Co., Ltd. | 158842 |
1 |
| STMicroelectronics S.r.l. | 3370 |
1 |
| Board of Regents, The University of Texas System | 6161 |
1 |
| Other owners | 41 |