- All sections
- G - Physics
- G01Q - Scanning-probe techniques or apparatusapplications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
- G01Q 60/06 - SNOM [Scanning Near-field Optical Microscopy] combined with AFM [Atomic Force Microscopy]
Patent holdings for IPC class G01Q 60/06
Total number of patents in this class: 38
10-year publication summary
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1
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3
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5
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0
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2
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5
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1
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2
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4
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1
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| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Bruker Nano, Inc. | 340 |
4 |
| Centre National de La Recherche Scientifique | 10464 |
3 |
| Hitachi, Ltd. | 15513 |
3 |
| Applied Materials Israel, Ltd. | 614 |
2 |
| Lehigh University | 167 |
2 |
| The Regents of the University of California | 19961 |
1 |
| Actoprobe, LLC | 3 |
1 |
| attocube Systems AG | 37 |
1 |
| Brown University | 647 |
1 |
| Bruker Nano GmbH | 67 |
1 |
| Consejo Superior de Investigaciones Cientificas (csic) | 1371 |
1 |
| Humboldt-universitat zu Berlin | 76 |
1 |
| JPK Instruments AG | 20 |
1 |
| Karlsruher Institut fuer Technologie | 115 |
1 |
| Max-Planck-Gesellschaft zur Forderung der Wissenschaften e.V. | 1780 |
1 |
| National Center for Nanoscience and Technology | 58 |
1 |
| The Regents of the University of Colorado, a body corporate | 2649 |
1 |
| The Research Foundation for The State University of New York | 1621 |
1 |
| Stc. UNM | 85 |
1 |
| Synchrotron Soleil | 23 |
1 |
| Other owners | 9 |