- All sections
- G - Physics
- G01Q - Scanning-probe techniques or apparatusapplications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
- G01Q 60/08 - MFM [Magnetic Force Microscopy] combined with AFM [Atomic Force Microscopy]
Patent holdings for IPC class G01Q 60/08
Total number of patents in this class: 10
10-year publication summary
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2
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0
|
1
|
2
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1
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1
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2
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1
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0
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0
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| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Taiwan Semiconductor Manufacturing Company, Ltd. | 48302 |
3 |
| President and Fellows of Harvard College | 6094 |
3 |
| Consejo Superior de Investigaciones Cientificas (csic) | 1443 |
1 |
| Ernst-Moritz-Arndt-Universität Greifswald | 37 |
1 |
| National Cheng Kung University | 632 |
1 |
| Universidad Autonoma de Madrid | 203 |
1 |
| Other owners | 0 |