- All sections
- G - Physics
- G01Q - Scanning-probe techniques or apparatusapplications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
- G01Q 60/30 - Scanning potential microscopy
Patent holdings for IPC class G01Q 60/30
Total number of patents in this class: 119
10-year publication summary
|
6
|
10
|
17
|
12
|
12
|
3
|
5
|
3
|
2
|
3
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Bruker Nano, Inc. | 381 |
13 |
| Xallent Inc. | 20 |
6 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 48560 |
4 |
| Osaka University | 3263 |
4 |
| Centre National de La Recherche Scientifique | 11059 |
3 |
| Cornell University | 3441 |
3 |
| DCG Systems, Inc. | 50 |
3 |
| Forschungszentrum Julich GmbH | 632 |
3 |
| IMEC VZW | 1825 |
3 |
| National University Corporation Kanazawa University | 264 |
3 |
| Nederlandse Organisatie voor Toegepast-natuurwetenschappelijk Onderzoek TNO | 2445 |
3 |
| The Boeing Company | 20186 |
2 |
| Seagate Technology LLC | 3962 |
2 |
| Shimadzu Corporation | 6364 |
2 |
| Ecole Superieure d'electricite | 8 |
2 |
| Nanowear Inc. | 20 |
2 |
| PrimeNano, Inc. | 5 |
2 |
| Washington University | 1752 |
2 |
| Xallent, LLC | 4 |
2 |
| FEI Efa, Inc. | 18 |
2 |
| Other owners | 53 |