- All sections
- H - Electricity
- H04Q - Selecting
- H04Q 1/20 - Testing circuits or apparatusCircuits or apparatus for detecting, indicating, or signalling faults or troubles
Patent holdings for IPC class H04Q 1/20
Total number of patents in this class: 201
10-year publication summary
|
9
|
7
|
6
|
7
|
5
|
6
|
4
|
2
|
2
|
0
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Samsung Electronics Co., Ltd. | 152304 |
9 |
| National Instruments Corporation | 755 |
8 |
| Texas Instruments Incorporated | 19567 |
7 |
| Huawei Technologies Co., Ltd. | 118879 |
7 |
| Viavi Solutions Inc. | 1491 |
7 |
| ZTE Corporation | 43451 |
6 |
| Marvell Asia PTE, Ltd. | 6376 |
6 |
| Cavium International | 4814 |
6 |
| Avago Technologies International Sales Pte. Limited | 8632 |
6 |
| Futurewei Technologies, Inc. | 3768 |
5 |
| Keysight Technologies, Inc. | 1248 |
5 |
| ROHDE & Schwarz GmbH & Co. KG | 1979 |
5 |
| Apple Inc. | 57432 |
4 |
| NEC Corporation | 36475 |
4 |
| Realtek Semiconductor Corp. | 3405 |
4 |
| Anritsu Corporation | 420 |
4 |
| Ericsson | 22203 |
3 |
| Hubbell Incorporated | 3376 |
3 |
| CommScope Technologies LLC | 3262 |
3 |
| Molex, LLC | 2012 |
3 |
| Other owners | 96 |