A monitoring module, an X-ray diffraction apparatus and a monitoring system capable of guaranteeing driving at a constant speed and maintaining traceability of each measurement are provided. A monitoring module for monitoring an operation of a stepping motor used in an X-ray diffraction apparatus, comprises a detection section for detecting a specific rotational position of a stepping motor and generating a detection signal, a measurement section for measuring a time interval of the detection signal, a determination section for determining whether or not a measurement value corresponding to the time interval of the detection signal coincides with a reference value corresponding to a rotation time between the specific rotational positions determined based on an operation instruction to the stepping motor and an information transmitting section for transmitting operation abnormality information to an outside when the measurement value does not coincide with the reference value.
Provided are an analysis device, an analysis method, and an analysis program which are capable of accurately analyzing a scatterer having a complicated cross-sectional shape and improving robustness of analysis. The present invention is provided with: an initial information setting unit 124c that sets an initial cross-sectional shape when fitting is repeated by changing the cross-sectional shape of a layer under the condition that a scatterer is formed by laminating, in the thickness direction of a plate-shaped sample, a layer having a constant cross-sectional shape represented by an angle and a radius centered about the origin; an intensity calculation unit 126 that calculates, on the basis of the cross-sectional shape of the layer, the scattering intensity of X-rays scattered by the plate-shaped sample; a fitting unit 127 that fits the calculated scattering intensity to the measured scattering intensity; and a parameter determination unit 128 that determines, according to the result of the fitting, the angle and radius representing the cross-sectional shape of the layer. The fitting unit repeats fitting by changing the cross-sectional shape of the layer.
G01B 15/04 - Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures
G01N 23/201 - Measuring small-angle scattering, e.g. small angle X-ray scattering [SAXS]
3.
CORRECTION APPARATUS, CORRECTION METHOD, AND CORRECTION PROGRAM
A correction apparatus reduces time and labor, reduces an artificiality, and improves reproducibility of correction by correcting a shift of a profile with an automatically estimated correction amount. A correction apparatus for correcting a profile of X-ray powder diffraction comprises processing circuitry configured to set a reference profile, set an estimation method for estimating a correction amount related to a sample height, estimate the correction amount based on the estimation method, and correct a subject profile based on the correction amount, wherein the correction amount is a value that maximizes a degree of coincidence between the corrected subject profile and the reference profile.
Provided is a structure for capturing a compound that includes at least one gene or a product thereof, or a combination thereof among a group of genes involved in the intracellular and extracellular transport function of the compound, the gene or the product thereof being multi-componented.
The present invention provides a structure for scavenging a compound, the structure including at least one gene from a gene group involved in the intracellular/extracellular transport of the compound, a product of the gene, or a combination of the gene and product.
The present invention stretches a partition wall film for installation so as to enable measurement even when there is a pressure difference between spaces partitioned by the partition wall film and prevent the partition wall film from being bent or wrinkled easily. Provided is a fluorescent X-ray analysis apparatus comprising an irradiation chamber with a vacuum interior and a sample chamber with atmospheric pressure, the fluorescent X-ray analysis apparatus further comprising: a window frame holding member that constitutes a part of a partition wall between the irradiation chamber and the sample chamber and that has an opening through which X-rays pass; and a window frame member that is formed from a material that transmits X-rays, holds a partition wall film that is a part of the partition wall, and is disposed in the opening of the window frame holding member. The window frame member comprises: an annular inner film holding member that has a peripheral wall extending from a base end located on the sample chamber side toward a distal end located on the irradiation chamber side, the distal end forming an opening that is closed by a part of the partition wall film; and an annular outer film holding member that is inserted from the distal end of the inner film holding member and is attached to the base end of the inner film holding member, to thereby fix the periphery of a part of the partition wall film to the inner film holding member.
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
The present invention enables measurement in a state in which a sample chamber is filled with air, and prevents damages to a partition film and a component placed in an irradiation chamber. This fluorescent X-ray analysis device comprises: a sample chamber in which a sample is placed; an irradiation chamber which is demarcated from the sample chamber by a partition including, in a part thereof, a partition film permeable to X-rays, and in which an X-ray source that emits X-rays to the sample chamber through the partition film is placed; and an information processing device. The information processing device comprises: an irradiation duration acquisition unit which acquires irradiation duration for which the partition film is irradiated with the X-rays; and a control unit which performs protection control, on the basis of the irradiation duration acquired by the irradiation duration acquisition unit, to protect the partition film from irradiation with the X-rays.
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
G01N 23/2204 - Specimen supports thereforSample conveying means therefor
G01N 23/2209 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material using wavelength dispersive spectroscopy [WDS]
The present invention improves analysis accuracy and shortens measurement time by preventing a decrease in the intensity of fluorescent X-rays to be detected. This fluorescent X-ray analysis device includes: a sample chamber in which a sample is disposed; and an irradiation chamber which is partitioned from the sample chamber by using a partition. The fluorescent X-ray analysis device has: an X-ray source that is disposed in the irradiation chamber, and emits X-rays obliquely toward an opening provided in a partition wall between the sample chamber and the irradiation chamber; a window frame member that is formed of a material allowing transmission of the X-rays therethrough, holds a partition film constituting a part of the partition, and is disposed in the opening provided in the partition wall; and a film support member that has a long hole allowing passage of the X-rays therethrough, is disposed adjacent to the partition film on the irradiation chamber side, and supports the partition film from the irradiation chamber side. The film support member is disposed such that the long hole is parallel to the optical axis of the X-rays in a plan view from the sample chamber side to the irradiation chamber side.
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
An information processing system is provided. The data group acquisition unit acquires a data group including a plurality of crystalline phase information. The subclass setting unit sets the crystalline phase information included in the data group into any of a first and second subclasses. A number of the first subclass(es) is one or more, a number of the second subclass(es) is zero or more, and a total number of the first and second subclasses is two or more. The crystalline phase selection unit selects the crystalline phase information from the first subclass or both of the first and second subclass, and defines the selected crystalline phase information as selected data. When there are a plurality of the first subclasses, the selected data includes the at least one crystalline phase information in each of the first subclasses. A profile generation unit generates the X-ray diffraction profile based on the selected data.
G01N 23/20 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using diffraction of the radiation by the materials, e.g. for investigating crystal structureInvestigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materialsInvestigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials
A calculation apparatus for calculating a statistics property of a structural model comprises a pre-calculation structural model acquiring section for acquiring a pre-calculation structural model in which atoms are periodically arranged, a pre-calculation information acquiring section for acquiring pre-calculation information that specifies atoms periodically arranged in the pre-calculation structural model, a post-calculation structural model acquiring section for acquiring a post-calculation structural model calculated by using the pre-calculation structural model as source data, a post-calculation information acquiring section for acquiring cluster information obtained by clustering atoms in the post-calculation structural model based on the pre-calculation information, and atom position information that is position information of atoms in the post-calculation structural model, and a statistics property calculating section for calculating centroid positions of atoms having the same cluster information based on the cluster information and the atom position information.
G06F 30/13 - Architectural design, e.g. computer-aided architectural design [CAAD] related to design of buildings, bridges, landscapes, production plants or roads
11.
AUTOMATIZED ALIGNMENT OF X-RAY OPTICS AND X-RAY BEAMS
Provided is an X-ray optical device (100) configured to align X-ray beams and the X-ray optics generating the X-ray beams in an automatized way. The X-ray optical device comprises a housing (110) to be arranged in front of an X-ray source (200); an X-ray optics (120) that is movably mounted in the housing (110) and configured to receive X-rays (220) from the X-ray source (200) to generate and project a beam of X-rays (220a); and an actuating unit (130) configured to move the X-ray optics (120) within the housing (110) in at least one direction transverse to an X-ray beam propagation direction while maintaining a pre-adjusted angle of incidence between the X-ray optics (120) and the incident X-rays (220) to move the X-ray beam (220a) in the at least one direction transverse to the propagation direction. Further provided is an X-ray generator comprising an X-ray source and the X-ray optical device.
G01N 23/20008 - Constructional details of analysers, e.g. characterised by X-ray source, detector or optical systemAccessories thereforPreparing specimens therefor
12.
X-RAY FLUORESCENCE ANALYSIS DEVICE, WATER LEAKAGE MANAGEMENT METHOD FOR X-RAY FLUORESCENCE ANALYSIS DEVICE, INFORMATION STORAGE MEDIUM, AND PROGRAM
The present invention accurately and quickly detects water leakage in a spectroscopic chamber and thereby reduces the degree of failure in an X-ray fluorescence analysis device when water leakage occurs. Provided is an X-ray fluorescence analysis device comprising: a high-voltage power supply that applies a voltage to an electron beam source; an X-ray tube that irradiates a sample disposed in a spectroscopic chamber with primary X-rays generated by irradiating a target with a generated electron beam; a water pump that delivers cooling water for cooling the target; a vacuum pump that evacuates the atmosphere from the spectroscopic chamber; a vacuum gauge that measures the pressure in the spectroscopic chamber; and a control unit that determines that the cooling water has leaked into the spectroscopic chamber on the basis of both the pressure measured by the vacuum gauge and the voltage of the high-voltage power supply applied to the electron beam source, and that stops the operation of the water pump.
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
09 - Scientific and electric apparatus and instruments
Goods & Services
Laboratory apparatus and instruments; measuring and testing
machines and instruments; semiconductor testing apparatus;
computer software, recorded; X-ray tubes not for medical
purposes; industrial X-ray apparatus; X-ray apparatus not
for medical purposes; X-ray diffraction apparatus not for
medical use; apparatus and installations for the production
of X-rays, not for medical purposes.
An X-ray fluorescence spectrometer according to the present invention includes a calculation unit (10) configured to calculate a content of each element in a sample (13) using an FP method, wherein the calculation unit (10) is configured to: in order to take into consideration an influence of unmeasured elements for which the fluorescent X-rays are not measured, use shorter-wavelength scattered X-rays of primary X-rays having a wavelength of 0.05 nm or more and 0.075 nm or less, and longer-wavelength scattered X-rays of the primary X-rays having a wavelength of 0.11 nm or more and 0.23 nm or less as scattered X-rays whose intensities are measured by a detection unit (9), assume a mean atomic number for elements other than hydrogen included in the unmeasured elements, and assume a content for hydrogen.
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
09 - Scientific and electric apparatus and instruments
Goods & Services
Laboratory apparatus and instruments for X-ray analysis;
measuring or testing machines and instruments, namely, X-ray
analysis apparatus; recorded computer operating software and
recorded software for data analysis for use with X-ray
analysis apparatus; industrial X-ray apparatus; X-ray
apparatus not for medical purposes; X-ray fluorescence
analyzers.
09 - Scientific and electric apparatus and instruments
Goods & Services
Laboratory apparatus and instruments; devices for analyzing
protein sequence used as laboratory apparatus; photographic
apparatus and instruments; optical machines and apparatus;
microscopes; measuring or testing machines and instruments;
testing apparatus not for medical purposes; computer
software, recorded; industrial X-ray apparatus; X-ray
apparatus not for medical purposes; X-ray diffraction
apparatus not for medical use.
18.
STRUCTURAL ANALYSIS DEVICE, STRUCTURAL ANALYSIS METHOD, AND STRUCTURAL ANALYSIS PROGRAM
[Problem] To provide a configuration capable of further supporting measurement in electron diffraction. [Solution] According to one aspect of the present invention, a structural analysis device using electron diffraction is provided. This structural analysis device is provided with at least one processor capable of executing a program so as to perform the following steps. In a display step, an image including a plurality of samples is displayed from transmitted electronic data, wherein the transmitted electronic data is transmitted electron data obtained by irradiating a region including the plurality of samples with an electron beam. In a calculation step, transmittance of each of the plurality of samples is calculated on the basis of the transmitted electronic data. In a selection step, at least one sample satisfying a predetermined condition is selected from within the image, wherein the predetermined condition is a condition related to the transmittance.
G01N 23/20058 - Measuring diffraction of electrons, e.g. low energy electron diffraction [LEED] method or reflection high energy electron diffraction [RHEED] method
G01N 23/04 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material
G01N 23/20 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using diffraction of the radiation by the materials, e.g. for investigating crystal structureInvestigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materialsInvestigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials
09 - Scientific and electric apparatus and instruments
Goods & Services
Laboratory apparatus and instruments for X-ray analysis, namely, X-ray diffractometer; measuring apparatus and instruments, namely, X-ray analysis apparatus; testing apparatus not for medical purposes, namely, electro-optical apparatus for analyzing chemical composition and structural properties of industrial and scientific materials; semiconductor testing apparatus; recorded computer operating software and recorded software for data analysis for use with X-ray analysis apparatus; X-ray tubes not for medical use; industrial X-ray apparatus; X-ray analyzing apparatus for industrial use, namely, X-ray diffractometers; X-ray apparatus not for medical purposes; X-ray diffraction apparatus not for medical use; apparatus and installations for the production of X-rays, not for medical use
01 - Chemical and biological materials for industrial, scientific and agricultural use
09 - Scientific and electric apparatus and instruments
42 - Scientific, technological and industrial services, research and design
Goods & Services
Chemicals for use in industry and science; protein [raw
material]; enzymes for industrial purposes; enzymes for
research purposes; reagents for chemical analyses;
biochemical reagents used for non-medical purposes; reagents
for research purposes; assays for research purposes;
reagents for use in scientific apparatus for chemical or
biological analysis; chemical reagents, other than for
medical or veterinary purposes. Laboratory apparatus and instruments; devices for analyzing
protein sequence used as laboratory apparatus; photographic
apparatus and instruments; optical machines and apparatus;
microscopes; measuring or testing machines and instruments;
testing apparatus not for medical purposes; computer
software, recorded; industrial X-ray apparatus; X-ray
apparatus not for medical purposes; X-ray diffraction
apparatus not for medical use. Design of machines, apparatus and instruments; computer
programming; computer software design; maintenance of
computer software; technological advice relating to
computers, automobiles and industrial machines; testing,
inspection or research of pharmaceuticals, cosmetics or
foodstuffs; pharmaceutical drug development services;
laboratory research in the field of pharmaceuticals;
pharmaceutical research; pharmaceutical product evaluation;
testing of pharmaceuticals; providing medical and scientific
research information in the field of pharmaceuticals and
clinical trials; consultancy relating to pharmaceutical
research and development; chemical analysis; testing,
inspection or research on agriculture, livestock breeding or
fisheries; testing or research on machines, apparatus and
instruments; testing the functionality of apparatus and
instruments; rental of measuring apparatus; rental of
computers; providing computer programs on data networks;
application service provider [ASP] services; rental of
laboratory apparatus and instruments.
An X-ray fluorescence spectrometer includes: a vacuum chamber (17) configured to be evacuated including at least a detection chamber in which a detector is disposed; drive units (18A to 18H) each including a drive source outside the vacuum chamber (17), and configured to perform a mechanical operation in the vacuum chamber (17); and a vacuum leakage location identification unit (23A, 23B) configured to: operate the drive units (18A to 18H) one at a time while monitoring a degree of vacuum in the vacuum chamber (17); if the change in the degree of vacuum in the vacuum chamber (17) before and after each operation is greater than or equal to a predetermined threshold, identify the relevant one of the drive units (18A to 18H) as a vacuum leakage location; and cause information to that effect to be displayed in a display unit (19) and/or be recorded in a recording unit (21).
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
09 - Scientific and electric apparatus and instruments
Goods & Services
Laboratory apparatus and instruments; measuring or testing
machines and instruments; testing apparatus not for medical
purposes; computer software, recorded; industrial X-ray
apparatus; X-ray apparatus not for medical purposes;
apparatus and installations for the production of X-rays,
not for medical purposes; X-ray fluorescence analyzers.
09 - Scientific and electric apparatus and instruments
Goods & Services
Laboratory apparatus and instruments; measuring apparatus
and instruments; testing apparatus not for medical purposes;
computer software, recorded; X-rays tubes, not for medical
use; industrial X-ray apparatus; X-ray apparatus not for
medical purposes; X-ray diffraction apparatus not for
medical use; apparatus and installations for the production
of X-rays, not for medical purposes.
09 - Scientific and electric apparatus and instruments
Goods & Services
Laboratory apparatus and instruments; measuring apparatus
and instruments; testing apparatus not for medical purposes;
computer software, recorded; X-rays tubes, not for medical
use; industrial X-ray apparatus; X-ray apparatus not for
medical purposes; X-ray diffraction apparatus not for
medical use; apparatus and installations for the production
of X-rays, not for medical purposes.
09 - Scientific and electric apparatus and instruments
Goods & Services
Laboratory apparatus and instruments; measuring apparatus
and instruments; testing apparatus not for medical purposes;
computer software, recorded; X-rays tubes, not for medical
use; industrial X-ray apparatus; X-ray apparatus not for
medical purposes; X-ray diffraction apparatus not for
medical use; apparatus and installations for the production
of X-rays, not for medical purposes.
09 - Scientific and electric apparatus and instruments
Goods & Services
Laboratory apparatus and instruments; measuring apparatus
and instruments; testing apparatus not for medical purposes;
semiconductor testing apparatus; computer software,
recorded; X-ray tubes not for medical use; industrial X-ray
apparatus; X-ray apparatus not for medical purposes; X-ray
diffraction apparatus not for medical use; apparatus and
installations for the production of X-rays, not for medical
purposes.
28.
X-RAY GENERATOR, X-RAY ANALYZER, CONTROL METHOD FOR X-RAY GENERATOR, AND CONTROL SYSTEM FOR X-RAY GENERATOR
[PROBLEM ] To provide technology related to a window holding part, an X-ray generator, an X-ray analyzer, a control method for an X-ray generator, and a control system for an X-ray generator, the technology such that there is no need to provide an X-ray observation unit in a vacuum region and there is no need to use a portion of the X-rays used for X-ray analysis measurement. [SOLUTION] According to one embodiment of the present invention, an X-ray generator (20) is provided. The X-ray generator (20) is provided with an X-ray generation unit (203a) and an X-ray transmission window. The X-ray generation unit (203a) is configured to generate X-rays by receiving an electron beam from the outside. The X-ray transmission window includes a first X-ray transmission window (204a) and a second X-ray transmission window (205a). The first X-ray transmission window (204a) is configured to transmit, from among the X-rays, first X-rays (L1) which are oriented in a first direction (D1). The first X-rays (L1) are incident on an X-ray observation unit (21) that is disposed on the optical axis of the first X-rays and that is capable of observing the X-ray focal point of X-rays. The second X-ray transmission window (204) is configured to transmit, from among the X-rays, second X-rays (L2) which are oriented in a second direction (D2) different from the first direction (D1).
G21K 1/00 - Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
G01N 23/20008 - Constructional details of analysers, e.g. characterised by X-ray source, detector or optical systemAccessories thereforPreparing specimens therefor
G21K 1/02 - Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
G21K 5/02 - Irradiation devices having no beam-forming means
To enable identification analysis of a fluorescent X-ray spectrum and verification of an analysis result to be easily performed, provided is a storage medium for storing a peak identification analysis program for causing a computer used for an X-ray fluorescence spectrometer. The program causes the computer to execute: a first list display step of displaying a list of elements and line types that are identified based on a designated angle or energy, as a first list; a first list reception step of receiving designation of elements and line types included in the first list; and a display update step of displaying, in a state where the first list is displayed, while showing that an element and a line type designated in the first list have been designated, a list of the designated element and line type and an angle or energy at which another line type of the designated element appears, as a second list.
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
An analysis apparatus for calculating an index indicating an optimization degree of a model with respect to measurement data includes processing circuitry configured to calculate an index indicating an optimization degree of a model including information of an electron density distribution with respect to measurement data, a probability distribution function followed by the measurement data being known, acquire the measurement data, acquire calculation data calculated from the model, and calculate an index GOF including a ratio of a residual, which is defined by a predetermined mathematical formula including the measurement data and the calculation data, and an expected value of the residual, which is defined based on the probability distribution function and the predetermined mathematical formula.
Provided are: a fluorescent X-ray analysis method capable of measuring a liquid sample and emitting X-rays while avoiding bubbles generated during the measurement; and a sample pouch cell. The sample pouch cell for a liquid sample is disposed upright on a side-emissive fluorescent X-ray analyzer, and has: a first resin film disposed on a primary X-ray emission side; and a second resin film in which a region excluding an injection port for the liquid sample is bonded to the first resin film.
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
G01N 1/10 - Devices for withdrawing samples in the liquid or fluent state
G01N 23/2204 - Specimen supports thereforSample conveying means therefor
Provided are a sample cell and a fluorescent X-ray analysis method capable of accurately irradiating the surface of a sample with X-rays even when the sample has a property of volatilizing by heat. This sample cell is to be used in a fluorescent X-ray analysis device and comprises: a first resin film disposed on the side from which a primary X-ray is emitted; a second resin film disposed so as to face the first resin film with a sample therebetween; and a holding member that holds a positional relationship between the sample and the first resin film. The first resin film and the second resin film are at least partially bonded at the periphery of a region where the sample is disposed.
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
An analysis apparatus includes processing circuitry configured to store data of a scattering intensity measured by transmission of X-rays in one ω scan, perform coordinate conversion from the coordinate of the scattering vector to the coordinate of the tilt of the scattering body, with respect to a waveform based on the intensity of a specific diffraction point on the two-direction components, specify a peak position of the waveform of the intensity with respect to the coordinate of the tilt applied the coordinate conversion, and calculate a difference between the specified peak position and the peak position obtained on the assumption that the scattering body is not tilted from the direction perpendicular to the surface of the plate-shaped sample.
An analysis system assembly and method for analyzing a plurality of samples and handling the cryogenically cooled samples from a shipping dewar into a position for analysis by an x-ray based analysis system. The system and method include a basket component containing a plurality of sample magazines each containing a plurality of samples, all covered by a volume of cryogenic liquid. The basket is transported from the shipping dewar to a transfer dewar. Cover components of the magazines are removed while the basket and magazines are submerged in a cryogenic liquid of the transfer dewar. The basket is removed from the transfer dewar and placed into a staging dewar of the analysis system. A robotic manipulator of the analysis system can then locate and transport individual samples to a sample stage of the analysis system.
09 - Scientific and electric apparatus and instruments
Goods & Services
Laboratory apparatus and instruments for X-ray analysis, namely, X-ray spectrometer; measuring or testing machines and instruments, namely, X-ray analysis apparatus; recorded computer operating software and recorded software for data analysis for use with X-ray analysis apparatus; industrial X-ray apparatus; X-ray apparatus not for medical purposes; X-ray fluorescence analyzers
09 - Scientific and electric apparatus and instruments
Goods & Services
Laboratory apparatus and instruments for X-ray analysis, namely, X-ray diffractometer; laboratory apparatus and instruments for extracting proteins, not for medical purposes; devices for analyzing protein sequence used as laboratory apparatus; microscopes; measuring or testing machines and instruments, namely, measuring or testing apparatus for X-ray analysis; measuring and testing machines and instruments for analysis of biochemical and biological substances, namely, protein sequencers and genetic analyzers; testing apparatus not for medical purposes, namely, electro-optical apparatus for analyzing chemical composition and structural properties of industrial and scientific materials; recorded computer operating software and recorded software for data analysis for use with X-ray analysis apparatus; industrial X-ray apparatus; X-ray apparatus not for medical purposes; X-ray diffraction apparatus not for medical use.
01 - Chemical and biological materials for industrial, scientific and agricultural use
09 - Scientific and electric apparatus and instruments
42 - Scientific, technological and industrial services, research and design
Goods & Services
Chemicals for use in industry and science; protein in raw material form for scientific and medical research; enzymes for industrial purposes; enzymes for research purposes; biochemical reagents used for non-medical purposes; reagents for research purposes; assays for research purposes; chemical reagents, other than for medical or veterinary purposes. Laboratory apparatus and instruments for X-ray analysis, namely, X-ray diffractometer; laboratory apparatus and instruments for extracting proteins, not for medical purposes; devices for analyzing protein sequence used as laboratory apparatus; microscopes; measuring or testing machines and instruments, namely, X-ray analysis apparatus; measuring and testing machines and instruments for analysis of biochemical and biological substances, namely, protein sequencers and genetic analyzers; testing apparatus not for medical purposes, namely, electro-optical apparatus for analyzing chemical composition and structural properties of industrial and scientific materials; recorded computer operating software and recorded software for data analysis for use with X-ray analysis apparatus; industrial X-ray apparatus; X-ray apparatus not for medical purposes; X-ray diffraction apparatus not for medical use. Design of machines, apparatus and instruments; computer programming; computer software design; maintenance of computer software; testing, inspection or research of pharmaceuticals; pharmaceutical drug development services; laboratory research in the field of pharmaceuticals; pharmaceutical research; pharmaceutical product evaluation; testing of pharmaceuticals; providing medical and scientific research information in the field of pharmaceuticals and clinical trials; consultancy relating to pharmaceutical research and development; chemical analysis; testing, inspection or research on agriculture, livestock breeding or fisheries; testing the functionality of apparatus and instruments; rental of measuring apparatus; rental of computers; application service provider [ASP] services for data analysis for use with X-ray analysis apparatus; rental of laboratory apparatus and instruments.
09 - Scientific and electric apparatus and instruments
Goods & Services
Laboratory apparatus and instruments for X-ray analysis, namely, X-ray diffractometer; measuring apparatus and instruments, namely, X-ray analysis apparatus; testing apparatus not for medical purposes, namely, electro-optical apparatus for analyzing chemical composition and structural properties of industrial and scientific materials; X-ray tubes not for medical use; industrial X-ray apparatus; industrial use X-ray analyzing apparatus, namely, X-ray diffractometer; X-ray apparatus not for medical purposes; X-ray diffraction apparatus not for medical use; apparatus and installations for the production of X-rays, not for medical use
09 - Scientific and electric apparatus and instruments
Goods & Services
Laboratory apparatus and instruments for X-ray analysis, namely, X-ray diffractometer; measuring apparatus and instruments, namely, X-ray analysis apparatus; testing apparatus not for medical purposes, namely, electro-optical apparatus for analyzing chemical composition and structural properties of industrial and scientific materials; recorded computer operating software and recorded software for data analysis for use with X-ray analysis apparatus; industrial X-ray apparatus; industrial use X-ray analyzing apparatus, namely, X-ray diffractometer; X-ray apparatus not for medical purposes; X-ray diffraction apparatus not for medical use
09 - Scientific and electric apparatus and instruments
Goods & Services
Laboratory apparatus and instruments for X-ray analysis, namely, X-ray diffractometer; measuring apparatus and instruments, namely, X-ray analysis apparatus; testing apparatus not for medical purposes, namely, electro-optical apparatus for analyzing chemical composition and structural properties of industrial and scientific materials; recorded computer operating software and recorded software for data analysis for use with X-ray analysis apparatus; industrial X-ray apparatus; industrial use X-ray analyzing apparatus, namely, X-ray diffractometer; X-ray apparatus not for medical purposes; X-ray diffraction apparatus not for medical use.
09 - Scientific and electric apparatus and instruments
Goods & Services
Laboratory apparatuses and instruments for the measurement, monitoring and evaluation of thermal processes; measuring or testing machines and instruments for the measurement, monitoring and evaluation of materials subjected to thermal changes; measuring or testing machines and instruments for thermogravimetry analysis, differential thermal analysis and multiple mode calorimetry; measuring or testing machines and instruments, namely, electronic and/or electro-technical thermobalance for the measurement of mass change under different atmospheres; calorimeters; calorimeters for thermogravimetry analysis, differential thermal analysis, multiple mode calorimetry and thermo-mechanical analysis; recorded computer software for operating thermal, thermo-mechanical, calorimetric and thermogravimetric measuring instruments.
09 - Scientific and electric apparatus and instruments
Goods & Services
Laboratory apparatus and instruments for X-ray analysis, namely, X-ray diffractometer; measuring apparatus and instruments, namely, X-ray analysis apparatus; testing apparatus not for medical purposes, namely, electro-optical apparatus for analyzing chemical composition and structural properties of industrial and scientific materials; semiconductor testing apparatus; recorded computer operating software and recorded software for data analysis for use with X-ray analysis apparatus; X-ray tubes not for medical use; industrial X-ray apparatus; industrial use X-ray analyzing apparatus, namely, X-ray diffractometer; X-ray apparatus not for medical purposes; X-ray diffraction apparatus not for medical use; apparatus and installations for the production of X-rays, not for medical use.
Provided is a fluorescence X-ray analysis device according to the present invention, wherein a quantitative determination means: limits overlap correction coefficients to negative values in the case of automatic setting; limits absorption and excitation correction coefficients to positive values with respect to all correction components when a standard sample does not include a component that can excite analytical rays, and calculates the theoretical intensity of fluorescence X-rays to be generated from a plurality of samples with assumed compositions; and obtains theoretical matrix correction coefficients through calculation based on the theoretical intensity and performs multiple regression calculation by setting a numerical value of a prescribed multiple of each of the theoretical matrix correction coefficients to an upper limit value of the absorption and excitation correction coefficients for a positive numerical value, and to a lower limit value of the absorption and excitation correction coefficients for a negative numerical value.
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
In this fluorescent X-ray analysis device, a quantification means calculates the lower detection limit on the basis of a calibration curve equation including an absorption excitation correction term and an overlap correction term.
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
G01N 23/2209 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material using wavelength dispersive spectroscopy [WDS]
In this fluorescent X-ray analysis device, a quantification means displays, on a display device, as a theoretical quantitative value standard deviation of analysis components, the difference between a first quantitative value of the analysis components, which is based on the measurement intensity with respect to each component, and a second quantitative value of the analysis components, which is found by varying the measurement intensity in a direction of increase in the change of content of the analysis components in a calibration curve for each component.
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
G01N 23/2209 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material using wavelength dispersive spectroscopy [WDS]
09 - Scientific and electric apparatus and instruments
Goods & Services
Laboratory apparatus and instruments for X-ray analysis, namely, X-ray spectrometer; measuring apparatus and instruments, namely, X-ray analysis apparatus; recorded computer operating software and recorded software for data analysis for use with X-ray analysis apparatus; industrial use X-ray analyzing apparatus, namely, X-ray spectrometer; X-ray apparatus not for medical purposes; X-ray spectroscopy apparatus not for medical use; X-ray fluorescence analyzers
47.
RADIATION DETECTOR, RADIATION MEASURING APPARATUS, AND METHOD FOR SETTING RADIATION DETECTOR
A radiation detector that suppress a double count which occurs by detecting a single pulse duplicately with a plurality of counters in counter switching, and can acquire highly accurate data, is configured to detect radiation in continuous exposure, comprises a sensor for generating a pulse when a particle of radiation is detected, a plurality of counters provided for counting the pulses, a setting holding circuit for holding a setting of an off-time for turning off any of the plurality of counters, and a control circuit for switching the counter performing counting the pulses after a lapse of the off-time with respect to a trigger signal.
G01T 1/24 - Measuring radiation intensity with semiconductor detectors
G01N 23/20008 - Constructional details of analysers, e.g. characterised by X-ray source, detector or optical systemAccessories thereforPreparing specimens therefor
48.
RADIATION DETECTOR, TRIGGER SIGNAL GENERATOR, AND RADIATION ANALYZING SYSTEM
A radiation analyzing system capable of synchronizing an external circuit are provided includes a sensor for generating pulses when radiation particles are detected by exposure, a counter provided so that the pulse can be counted for each frame, a readout circuit for reading out a count value generated by the counter, a control circuit for controlling the exposure and the reading by a signal, and a trigger signal generating circuit for generating a trigger-out signal, when one or a series of predetermined number of frames in which a High or Low interval is set is represented as one unit frame, for specifying the set High and Low intervals, are comprised.
Provided is a sample holder for which a resin member is used to simplify a sample exchange operation and with which deterioration of the resin member caused by X-rays can be suppressed. A sample holder for fluorescence X-ray analysis comprises: a cylindrical body that has a hole provided in a portion of a top end surface thereof, and that has a bottom end which is open; a receiving tray which is disposed on the inside of the cylindrical body and on which a sample is placed; an elastic body that biases the receiving tray upward; a resin member that has an arch part and that contacts a bottom end of the elastic body; and a bottom plate that is disposed on the bottom side of the resin member. The cylindrical body, the receiving tray, and the bottom plate are formed by metal. The arch part has a claw part that is provided to an end thereof and a pressing part that is pressed inward, and the arch part is elastically deformed inward by a pressing force on the pressing part. In the cylindrical body are formed a fitting part to which the claw part is fitted, and an exposed part via which the pressing part is exposed to the outside. The resin member is disposed between the receiving tray and the bottom plate, and portions thereof other than the pressing part are surrounded by the cylindrical body, the receiving tray, and the bottom plate.
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
A correction apparatus reduces calculation costs for correcting artifacts due to a beam hardening effect in reconstructing a CT image by correcting an artifact due to a beam hardening effect caused in reconstructing a CT image. The correction apparatus includes processing circuitry configured to acquire an incident X-ray distribution, acquire a linear absorption coefficient model representing an energy dependency of a linear absorption coefficient by a scale factor including a parameter, acquire a projection image, and correct the projection image using the incident X-ray distribution and the linear absorption coefficient model.
To measure a pulse height of an X-ray signal at high speed and with high precision even for high count rate X-ray measurement regardless of the type of an X-ray detector and a circuit configuration of a preamplifier, provided is an X-ray spectrometer including: a learning unit which acquires a part of a stepped wave including a rise portion through use of incident time, and generates a trained model which has learned a correlation between a acquired part and a pulse height through use of training data including a plurality of combinations of the acquired part and the pulse height; and a pulse height predictor which acquires a part of the stepped wave from the newly converted stepped wave through use of the incident time, and calculates a predicted pulse height from the acquired part of the stepped wave and the trained model.
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
G01N 23/2252 - Measuring emitted X-rays, e.g. electron probe microanalysis [EPMA]
G01T 1/17 - Circuit arrangements not adapted to a particular type of detector
G01T 1/36 - Measuring spectral distribution of X-rays or of nuclear radiation
A detector stand for an X-ray detector is provided. A first arrangement portion arranges the X-ray detector in first orientation. A second arrangement portion arranges the X-ray detector in second orientation. The X-ray detector can be fixed to a mounting portion. In the detector stand, the X-ray detector is selectively mountable on the first arrangement portion or the second arrangement portion through the mounting portion. An arrangement angle of the X-ray detector fixed to the mounting portion is different between the first orientation and the second orientation.
G01N 23/20008 - Constructional details of analysers, e.g. characterised by X-ray source, detector or optical systemAccessories thereforPreparing specimens therefor
53.
X-RAY CONTRAST MEDIUM AND X-RAY IMAGE ACQUISITION METHOD
Obtaining an X-ray CT image of a biological sample includes a step of penetrating a contrast agent into the biological sample and solidifying the contrast agent to provide a contrast image of the biological sample, the contrast agent comprising wax and having a density of 0.95 g/cm3 or less in its solidified state after penetration into the biological sample, and having a melting point of 40° C. to 80° C., a step of melting and resolidifying the solidified contrast agent, and a step of acquiring an X-ray CT image by irradiating the resolidified biological sample with an X ray having an energy of 4 to 12 keV, the shape of the biological sample being a shape with which a maximum optical path length of the X ray in the biological sample in the step of acquiring an X-ray CT image is 2 mm or less.
G01N 1/36 - Embedding or analogous mounting of samples
G01N 23/046 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
G01N 33/483 - Physical analysis of biological material
54.
CORRECTION APPARATUS, METHOD AND PROGRAM FOR CORRECTING ARTIFACTS
The correction apparatus comprises a projection image acquiring section for acquiring a measured projection image, a virtual energy setting section for setting a virtual energy different from the measured energy that is the energy of the X-ray irradiated at the time of acquiring the measured projection image, a dual energy decomposing section for calculating a projection image under an assumed condition at the time of irradiating the X-ray of the virtual energy and performing dual energy decomposition, a consistency index evaluating section for evaluating a temporarily corrected image obtained by the dual energy decomposition with a consistency index to identify an optimum condition among the assumed conditions, and a correction image generating section for generating a projection image under the optimum condition as a corrected image.
Provided is a degree-of-crystallinity measurement apparatus including: an X-ray scattering pattern acquisition module which acquires an X-ray scattering pattern of a sample including a crystalline portion and an amorphous portion of a target substance; a pattern decomposition module which acquires a diffraction pattern of the crystalline portion and a continuous pattern from the X-ray scattering pattern; a target substance intensity calculation module which calculates an integrated intensity of the target substance based on the X-ray scattering pattern and chemical formula information of the target substance; a target substance pattern calculation module which calculates, from the continuous pattern, a scattering pattern of the target substance including the crystalline portion and the amorphous portion; a structural disorder parameter determination module which determines a structural disorder parameter of the crystalline portion based on the diffraction pattern of the crystalline portion and the scattering pattern of the target substance; and a degree-of-crystallinity output module.
A pair of support sections arranged with a space for placing a sample, a frame supported by the pair of support sections, an irradiation section movably connected to the frame for irradiating radiation, and a detection section movably connected to the frame for detecting radiation scattered by the sample are comprised on a same plane, and the irradiation section and the detection section are movable on the same plane with respect to the frame. Thus, using a space formed between the pair of support sections, it is possible to measure a large sample in a wide range of diffraction angles. Therefore, it is easy to measure the diffraction of the low angle side. Further, since each part is movable on the same plane, it is easy to arrange the parts.
A processing apparatus, a system, a method and a program for applying non-negative matrix factorization to one or more measured profiles of X-ray powder diffraction based on known information are provided. A processing apparatus for applying non-negative matrix factorization to a measured profile of X-ray powder diffraction comprises a measured profile acquiring section for acquiring one or more measured profiles, a known information acquiring section for acquiring known information including a shape of a predetermined profile corresponding to a background or a predetermined substance included in the measured profile, or a restriction of a coefficient matrix of the predetermined profile, and a decomposition section for applying non-negative matrix factorization to the measured profile based on the known information.
A processing apparatus for processing a structure factor including total scattering data and data of a structural model are provided comprises a structure factor acquiring section for acquiring a first structure factor based on measured total scattering data; a data converting section for separating the first structure factor into a short-range correlation and a long-range correlation; and a scattering intensity calculating section for acquiring a structural model indicating an atomic arrangement in a finite region, calculating a short-range scattering intensity of the structural model and calculating a second structure factor from the short-range scattering intensity and the long-range correlation.
G16C 60/00 - Computational materials science, i.e. ICT specially adapted for investigating the physical or chemical properties of materials or phenomena associated with their design, synthesis, processing, characterisation or utilisation
A configuration is provided in which outside air is taken as a carrier gas into a carrier gas flow path (A, B). A CO2 sensor (specific gas detection sensor) (71) for detecting a CO2 gas desorbed from a sample is installed in a component gas detector (70). A CO2 sensor (air-containing specific gas detection sensor) (54) for detecting a CO2 gas contained in air taken into the carrier gas flow path by a blower fan (51) is installed separately. A CO2 gas detection amount detected by the air-containing specific gas detection sensor (54) is subtracted from a CO2 gas detection amount detected by the specific gas detection sensor (71) to calculate a detection amount of the CO2 gas desorbed from the sample.
G01N 7/16 - Analysing materials by measuring the pressure or volume of a gas or vapour by allowing the material to emit a gas or vapour, e.g. water vapour, and measuring a pressure or volume difference by heating the material
60.
THERMAL ANALYSIS APPARATUS AND CONTROL SOFTWARE FOR THERMAL ANALYSIS APPARATUS
A thermal analysis apparatus includes circuitry for displaying a graph of the thermal analysis data relating to temperature or time on a display displaying a sample image on the display, generating color information data of range and type selected from the sample image, displaying a graph of the color information data relating to temperature or time side by side with the graph of the thermal analysis data relating to temperature or time without superimposing both graphs on the display, and displaying a marker at an arbitrary point on one of the graphs and displaying a marker on others of the graphs at a point whose measurement time is synchronized with the point where the marker is displayed.
Provided is a thermal analysis device with which it is possible to easily perform detailed analysis of a change in the state of a specimen, while visually grasping, in detail, the color of the specimen and a change therein which accompanies a change in the temperature of the specimen. Also provided is a control software for the thermal analysis device. This thermal analysis device which acquires thermal analysis data by measuring and calculating the physical properties of a specimen while changing the temperature of the specimen by heating or cooling, and acquires image data by imaging the specimen, comprises: a means for displaying a graph pertaining to the temperature or time of the thermal analysis data; a means for displaying a specimen image which is the image data; a means for generating color information data for a type and range selected from the specimen image; and a means for displaying colors generated on the basis of the color information data as a gradation in which the colors are associated with a temperature or time and arranged.
G01N 25/20 - Investigating or analysing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity
G01N 21/27 - ColourSpectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection
G01N 25/00 - Investigating or analysing materials by the use of thermal means
62.
Single-crystal X-ray structure analysis apparatus and method, and sample holder unit therefor
A sample holder unit used for a single-crystal X-ray structure analysis apparatus, the sample holder unit comprising a sample holder for being attached to a goniometer in the single-crystal X-ray structure analysis apparatus, and an applicator that stores the sample holder, wherein the sample holder comprises a holding part that holds a porous complex crystal capable of soaking a sample in a plurality of fine pores formed therein, and the applicator comprises a space for soaking the sample in the porous complex crystal of the sample holder, wherein the applicator comprises a space for soaking the sample in the porous complex crystal of the sample holder, wherein the porous complex crystal is soaked only in a preserving solvent in the space.
A user-friendly single-crystal X-ray structure analysis apparatus for quickly performing a single-crystal X-ray structure analysis using a crystalline sponge and easily making it possible by including managing related information and a method therefor, are provided. There are provided a sample holder comprising a porous complex crystal capable of soaking a sample in a plurality of fine pores formed therein; a goniometer that rotationally moves, the sample holder being attached to the goniometer; an information acquisition section 600 that acquires invariable information about the porous complex crystal or variable information provided after the sample is soaked therein; and an information storage section 111 that stores the invariable information or the variable information acquired by the information acquisition section 600.
A system that can reduce the cost for correcting artifacts due to motion in the reconstruction of CT images includes acquiring the temporarily corrected projection image and determining the reference center position correction function and the parameter of the temporary reference center position correction function by calculating a degree of coincidence between the temporarily corrected projection image and the projection image at the imaging angle opposing thereto, and correcting the main imaging data or the projection image based on the main imaging data using the reference center position correction function and the relative motion correction function.
Provided are a morphology analysis device, a morphology analysis method, and a morphology analysis program with which it is possible to recognize the morphology of the constituent elements of molecules. A morphology analysis device 200 for analyzing the morphology of molecules in a solution comprises: a reference data storage unit 234 that stores reference data, which is molecular shape data for a pre-identified test molecule; a target data storage unit 235 that stores target data, which is molecular shape data for the test molecule serving as an analysis target; and a morphology estimation unit 237 that estimates the morphology of the constituent elements of a molecule in the target data by identifying the state of physical quantities constituting the molecular shape of the target data with respect to the reference data. Both the reference data and the target data have a molecular level resolution.
Provided is a fluorescent X-ray analysis device in which a state at a rear surface of a thin plate-shaped sample is made uniform so as to prevent differences between measurement conditions depending on a measuring position. This fluorescent X-ray analysis device comprises an X-ray source for emitting primary X-rays onto a surface of a plate-shaped sample, a detector for measuring an intensity of fluorescent X-rays, a sample stage on which the sample is placed, an analyzing device for performing an analysis at a plurality of measuring positions on the surface of the sample, a background correction cover which has an outer edge part shaped to follow a portion of an outer edge of the sample stage, is adjacent to an outer side of the sample stage, and has a surface that is disposed in substantially the same plane as a surface of the sample stage, and a movement mechanism for moving the sample stage such that the primary X-rays are emitted onto an arbitrarily defined measuring position on the surface of the sample, wherein the movement mechanism moves the background correction cover in accordance with movement of the sample stage, and if the sample stage is not present at a rear surface of the sample at the measuring position, moves the background correction cover to the rear surface of the sample at the measuring position.
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
G01N 23/2204 - Specimen supports thereforSample conveying means therefor
Provided is a total reflection X-ray fluorescence spectrometer which has high analysis sensitivity and analysis speed. The total reflection X-ray fluorescence spectrometer includes: an X-ray source that has an electron beam focal point having an effective width in a direction parallel to a surface of a sample, and orthogonal to an X-ray irradiation direction, that is larger than a dimension in the irradiation direction; a reflective optic that has an effective width in the orthogonal direction that is larger than that of the electron beam focal point, and has a curved surface in the irradiation direction; and a plurality of detectors that are arranged in a row in the orthogonal direction, and are configured to measure intensities of fluorescent X-rays emitted from the sample irradiated with primary X-rays focused by the reflective optic.
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
An exclusion module (21) is configured to calculate a coating amount of each component whose measurement element is not contained in the base layers, for each of corresponding measurement lines, on an assumption that that component solely makes up the thin film and to adopt a maximum coating amount as an initial value of the coating amount of that component; and to calculate a coating amount of each component whose measurement element is contained in the base layers, for each of corresponding measurement lines, on the basis of initial values of coating amounts of individual components whose measurement elements are not contained in the base layers, if calculation results for all the corresponding measurement lines give errors, to exclude that component from analysis targets as an unquantifiable component, and in other cases, to adopt a maximum coating amount as an initial value of the coating amount of that component.
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
By regarding total precision of an X-ray intensity as counting precision due to statistical fluctuation and counting loss and by regarding the counting precision as a product of precision of an uncorrected intensity, which is an intensity before counting loss correction is performed, and a gradient of a corrected intensity with respect to the uncorrected intensity, a counting time calculation unit (13) included in an X-ray fluorescence spectrometer of the present invention calculates a counting time from specified total precision of the X-ray intensity, a given counting loss correction coefficient, and a given corrected intensity for each measurement line (5).
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
A61B 6/00 - Apparatus or devices for radiation diagnosisApparatus or devices for radiation diagnosis combined with radiation therapy equipment
A transmission type small-angle scattering device of the present invention includes a goniometer 10 including a rotation arm 11. The rotation arm 11 is freely turnable around a θ-axis extending in a horizontal direction from an origin with a vertical arrangement state of the rotation arm 11 being defined as the origin, and has a vertical arrangement structure in which an X-ray irradiation unit 20 is installed on a lower-side end portion of the rotation arm 11, and a two-dimensional X-ray detector 30 is installed on an upper-side end portion of the rotation arm 11 to form a vertical arrangement structure.
A transmission type small-angle scattering device of the present invention includes a goniometer 10 including a rotation arm 11. The rotation arm 11 is freely turnable around a θ-axis extending in a horizontal direction from an origin with a vertical arrangement state of the rotation arm 11 being defined as the origin, and has a vertical arrangement structure in which an X-ray irradiation unit 20 is installed on a lower-side end portion of the rotation arm 11, and a two-dimensional X-ray detector 30 is installed on an upper-side end portion of the rotation arm 11 to form a vertical arrangement structure.
Provided are: a semiconductor inspecting device capable of inspecting, for every region, a microstructure of the inside of a semiconductor by obtaining an enlarged image with sufficient strength, with a size accommodatable in a laboratory; and a corresponding semiconductor inspecting system and semiconductor inspecting method. This semiconductor inspecting device uses an enlarged X-ray image. The semiconductor inspecting device comprises: an X-ray source 120 with fine focus and high output power; an X-ray irradiation unit including a condenser mirror 130 that condenses emitted X-rays and irradiates a semiconductor sample with same; a sample holding unit holding the sample; a reflective mirror-type X-ray lens unit 150 forming an image of X-rays passing through the sample; and an imaging unit 190 acquiring the formed X-ray image. Each of mirrors constituting the condenser mirror 130 and the reflective mirror-type X-ray lens unit 150 has a reflection plane in which a multi-layered film having high reflectance against an X-ray having a designated wavelength is formed.
G01N 23/18 - Investigating the presence of defects or foreign matter
G21K 1/00 - Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
G21K 1/06 - Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction, or reflection, e.g. monochromators
This microchannel device separates a sample solution, which contains a first component to be used as an analysis control and a second component to be analyzed, into a solution containing the first component and a solution containing the second component.
Chubu Electric Power Company, Incorporated (Japan)
Inventor
Yokoyama, Ryouichi
Omote, Kazuhiko
Kobayashi, Daisuke
Abstract
A damage measurement technique capable of measuring damage of a sample in a single crystal state, regardless of the surrounding condition, includes irradiating microbeam white X-rays to a sample in a single crystal state, diffraction of a spot generated by the irradiation is detected, a coefficient on variance of an intensity distribution in a specific direction in the detected diffraction spot is calculated, and a damaged state of the sample is specified based on the calculated coefficient.
A correction apparatus for correcting a structure factor includes a structure factor acquisition section that acquires the structure factor; a PDF calculation section that calculates PDF from the acquired structure factor; a correction function preparation section that prepares a first correction function that is Fourier-transformed in a predetermined range, and a second correction function that is Fourier-transformed in the predetermined range, the first correction function comprising data of the PDF and a cut-off function for cutting off data on a long distance side of the PDF and the second correction function comprising the cut-off function; a correction amount calculation section that calculates a correction amount comprising the first correction function, the second correction function, and a scale factor; a structure factor correction section that corrects the structure factor; and an R-factor value calculation section that calculates an R-factor value indicating correction accuracy.
The present invention provides a control device, a system, a method, and a program that make it possible to efficiently acquire data significant for identifying the structure of a macromolecule in a solution with a resolution greater than 30 Å. Provided is a control device 200 for controlling an X-ray analysis device, comprising: a data conversion unit 223 that converts, into profiles, sample solution data and reference solution data acquired from the X-ray analysis device at different points in time; a first indicator calculation unit 232 that calculates a first indicator representing fluctuation of intensity in the time axis direction on the basis of the profile of at least one of the sample solution data and the reference solution data out of the profiles obtained through the conversion; a first indicator determination unit 234 that determines whether or not the calculated first indicator is within a predetermined range; and a device control unit 268 that terminates the measurement by the X-ray analysis device if the first indicator is not within the predetermined range.
G01N 23/20 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using diffraction of the radiation by the materials, e.g. for investigating crystal structureInvestigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materialsInvestigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials
77.
Total reflection X-ray fluorescence spectrometer and estimation method
Provided are a total reflection X-ray fluorescence spectrometer and an estimation method which are capable of easily and quickly estimating whether contamination exists on a substrate through use of a machine learning device. The total reflection X-ray fluorescence spectrometer includes: a spectrum acquisition unit configured to acquire a spectrum; and a learning unit which includes an estimation unit configured to generate estimation data on an element contained in contamination on a surface of a substrate in response to input of the spectrum, and for which learning by the estimation unit has been executed based on teacher data including the spectrum for learning and data on the element contained in the contamination on the surface of the substrate which has been used to acquire the spectrum for learning and the estimation data generated when the spectrum for learning is input to the estimation unit.
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
A peak two-dimensional detection data extraction unit 211 extracts two-dimensional detection data (peak two-dimensional detection data) of the diffracted X-ray Xb with the maximum X-ray intensity, from two-dimensional detection data of diffracted X-rays Xb obtained at a plurality of scanning angles 2θ/θ. Next, a peak position specifying unit 212 specifies the position (peak position) where the X-ray intensity is maximum, from the peak two-dimensional detection data. Then, data processing is performed using positional information on the peak position specified for the peak two-dimensional detection data.
There is provided a technique capable of evaluating an anisotropy of an object with a large field of view, in a non-destructive manner and with high angular resolution. An object 1 is irradiated with X-rays from a radiation source 22 of a phase-contrast X-ray optical system 2. A change characteristic in X-ray scattering intensities for individual relative angles each formed between an incident angle of the X-rays and an anisotropic structure in the object 1 are then acquired. Evaluation data for evaluating a state of the anisotropic structure in the object 1 is then generated based on the change characteristic in the X-ray scattering intensities.
A device for analyzing a diffraction pattern of a mixture uses a fitting pattern including a term related to a known target pattern, which indicates a target component and which is changeable in shape with use of a shape parameter, and a term related to an unknown pattern, which indicates a residual group. The fitting pattern is fitted to an observed pattern with a given value assigned to the shape parameter and with the unknown pattern set to an initial pattern. The unknown pattern is then changed, to thereby fit the fitting pattern to the observed pattern. The fitting described above is executed with use of a plurality of shape parameters each of which is the shape parameter, and a calculation result related to one of the plurality of shape parameters is selected.
According to an aspect of the present invention, an X-ray diffraction apparatus is provided. The X-ray diffraction apparatus comprises: an X-ray source configured to irradiate a sample with an X-ray; a sample stage configured to allow the sample to be disposed in such a manner that the X-ray is diffracted; a detector configured to detect a diffracted X-ray, which is the X-ray that has been diffracted, in one dimension at a detection strip; a slit member provided between the sample stage and the detector, comprising a slit through which the diffracted X-ray can pass; wherein an axis in a longitudinal direction of the slit is parallel to an axis in a longitudinal direction of the detection strip.
An X-ray fluorescence spectrometer according to the present invention comprises: a vacuum chamber (17) that includes at least a detection chamber in which a detector is disposed, and that is evacuated; a plurality of drive units (18A-18H) that have a drive source outside the vacuum chamber (17) and that perform a mechanical operation in the vacuum chamber (17); and a vacuum leakage location-identifying means (23A, 23B) that drives each of the drive units (18A-18H) one by one while monitoring the degree of vacuum of the vacuum chamber (17), specifies, when a change in the degree of vacuum of the vacuum chamber (17) between before and after each operation has become equal to or more than a predetermined threshold, the driven drive unit (18A-18H) as a vacuum leakage location, and causes a display means (19) to display said information and/or causes a recording means (21) to record said information.
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
The present invention provides a structure for scavenging a compound, the structure including at least one gene from a gene group involved in the intracellular/extracellular transport of the compound, a product of the gene, or a combination of the gene and product.
C12N 15/31 - Genes encoding microbial proteins, e.g. enterotoxins
C07K 14/195 - Peptides having more than 20 amino acidsGastrinsSomatostatinsMelanotropinsDerivatives thereof from bacteria
C07K 14/37 - Peptides having more than 20 amino acidsGastrinsSomatostatinsMelanotropinsDerivatives thereof from fungi
C07K 14/415 - Peptides having more than 20 amino acidsGastrinsSomatostatinsMelanotropinsDerivatives thereof from plants
C07K 14/435 - Peptides having more than 20 amino acidsGastrinsSomatostatinsMelanotropinsDerivatives thereof from animalsPeptides having more than 20 amino acidsGastrinsSomatostatinsMelanotropinsDerivatives thereof from humans
Provided is a structure for capturing a compound that includes at least one gene or a product thereof, or a combination thereof among a group of genes involved in the intracellular and extracellular transport function of the compound, the gene or the product thereof being multi-componented.
C12N 15/31 - Genes encoding microbial proteins, e.g. enterotoxins
C12P 21/02 - Preparation of peptides or proteins having a known sequence of two or more amino acids, e.g. glutathione
C07K 14/195 - Peptides having more than 20 amino acidsGastrinsSomatostatinsMelanotropinsDerivatives thereof from bacteria
C07K 14/37 - Peptides having more than 20 amino acidsGastrinsSomatostatinsMelanotropinsDerivatives thereof from fungi
C07K 14/415 - Peptides having more than 20 amino acidsGastrinsSomatostatinsMelanotropinsDerivatives thereof from plants
C07K 14/435 - Peptides having more than 20 amino acidsGastrinsSomatostatinsMelanotropinsDerivatives thereof from animalsPeptides having more than 20 amino acidsGastrinsSomatostatinsMelanotropinsDerivatives thereof from humans
85.
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, NONTRANSITORY COMPUTER READABLE MEDIA STORING PROGRAM, AND X-RAY ANALYSIS APPARATUS
According to an aspect of the present invention, provided is an information processing apparatus comprising a memory configured to store a program; and a processor configured to execute a program so as to output a parameter result in relation to a thin film by inputting a profile result in relation to an intensity of X-ray from the thin film to a neural network, wherein the neural network is a neural network that is allowed to machine-learn teacher data using profile data in relation to an intensity of X-ray from a thin film as input data and using parameter data in relation to the thin film as output data.
G01N 23/20 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using diffraction of the radiation by the materials, e.g. for investigating crystal structureInvestigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materialsInvestigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials
86.
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, NON-TRANSITORY COMPUTER READABLE MEDIA STORING PROGRAM, AND X-RAY ANALYSIS APPARATUS
According to an aspect of the present invention, provided is an information processing apparatus, comprising: a processor configured to execute a program so as to output a diagnostic result diagnosing an analysis profile result by inputting an input profile result in relation to an intensity of X-ray from a thin film and the analysis result of the input profile result to a neural network, wherein the neural network is a neural network that is allowed to machine-learn teacher data using input profile data in relation to an intensity of X-ray from a thin film and analysis profile data obtained from the input profile data as input data, and using diagnostic data obtained by diagnosing the analysis profile data as output data.
G01N 23/20 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using diffraction of the radiation by the materials, e.g. for investigating crystal structureInvestigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materialsInvestigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials
G01N 23/083 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
Electron density map specifying circuitry is configured to accurately reproduce an electron density map of a macromolecule in a solution having a dynamically fluctuating structure. For example, the electron density map circuitry generates a plurality of electron density maps from a measured X-ray scattering profile acquired by measuring a sample, calculates an index representing a degree of coincidence between an X-ray scattering profile calculated from each of the plurality of electron density maps and the measured X-ray scattering profile, and selects a representative electron density map from the plurality of electron density maps based on the calculated index.
G16B 15/00 - ICT specially adapted for analysing two-dimensional or three-dimensional molecular structures, e.g. structural or functional relations or structure alignment
This X-ray fluorescence spectrometer comprises a calculation means (10) for calculating the content of an element in a sample (13) by an FP method, and, in order to take into account the effect of non-measured elements for which X-ray fluorescence is not measured, the calculation means (10) uses primary scattered X-rays on a short-wavelength side having a wavelength of 0.05-0.075 nm and primary scattered X-rays on a long-wavelength side having a wavelength of 0.11-0.23 nm as scattered rays for measuring intensity by a detection means (9), and assumes an average atomic number in the case of elements other than hydrogen among non-measured elements, and assumes the content of hydrogen in the case of hydrogen.
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
89.
CRYSTAL STRUCTURE ANALYSIS METHOD, CRYSTAL STRUCTURE ANALYSIS DEVICE, AND CRYSTAL STRUCTURE ANALYSIS PROGRAM
Provided is a crystal structure analysis method that includes: acquiring data (Data-1, Data-2, Data-3, ... Data-n) by applying radiation to each of a plurality of samples while changing an incident angle of the radiation to obtain diffraction point intensity and reliability with respect to a plurality of crystal lattice planes in each of the samples; determining whether to perform merging for individual data on the basis of a merging reference index (for example, Rint, integrity), the merging being processing of integrating a plurality of pieces of data into one piece; performing the merging to the data determined to be subjected to the merging, which is processing for integrating the plurality of these pieces of data into one piece; and specifying a structure of a crystal by the merged data obtained as a result of the merging. In the crystal structure analysis method, crystal structure analysis device, and crystal structure analysis program that specify a crystal structure by subjecting a plurality of diffraction patterns to data processing and analysis, the present invention makes it possible to obtain a crystal structure analysis result with high reliability.
G01N 23/20058 - Measuring diffraction of electrons, e.g. low energy electron diffraction [LEED] method or reflection high energy electron diffraction [RHEED] method
G01N 23/205 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using diffraction of the radiation by the materials, e.g. for investigating crystal structureInvestigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materialsInvestigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials using diffraction cameras
90.
Structure information acquisition method and structure information acquisition apparatus
There is provided a technique for non-destructively and relatively easily acquiring orientation information of an anisotropic material even for a large-sized object. An object is irradiated with X-rays in a tangential direction of a curved anisotropic material from a radiation source of a phase-contrast X-ray optical system. A scattering image is then obtained using a detection signal of X-rays having penetrated through the object. Structure information of the anisotropic material is acquired based on the scattering image.
09 - Scientific and electric apparatus and instruments
Goods & Services
Laboratory apparatus and instruments for X-ray diffraction analysis; Industrial X-ray machines and apparatus, not for medical use; X-ray analysis apparatus not for medical purpose.
92.
CORRECTION AMOUNT SPECIFYING APPARATUS, METHOD, PROGRAM, AND JIG
A correction amount specifying apparatus comprises circuitry for storing diffraction data including a combination of the diffraction angle of the irradiation X-rays with respect to the sample rotation angle and the sample surface height, the diffraction data being acquired by irradiating X-rays to a standard sample that is an aggregate of isotropic and stress free crystal particles, determining a first correspondence relationship based on the diffraction data, and specifying a correction amount of the sample surface height with respect to a desired sample rotation angle and a desired diffraction angle based on the first correspondence relationship.
The objective of the present invention is to perform identification analysis of fluorescent X-ray spectra, and verification of analysis results, easily. This peak identification analysis program causes a computer used in a fluorescent X-ray analysis device to execute: a spectrum acquisition step; a designating information acquisition step; a first list display step for displaying, as a first list of candidates of a fluorescent X-ray representing a peak contained in a fluorescent X-ray spectrum, a list of one or a plurality of elements and line types specified on the basis of a designated angle or energy; a first list accepting step for accepting, from a user, a designation of at least some of the one or plurality of elements and line types included in the first list; and a display updating step for displaying, as a second list while the first list is being displayed, a list of the designated element and line type, and the angle or energy at which other line types of the element appear, while indicating that the element and line type designated with respect to the first list have been designated.
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
A control apparatus, system, method and program that enable simultaneous measurement of counts of multiple energy ranges in an efficient configuration are provided. A control apparatus 200 for controlling an X-ray detector 100 and outputting a measurement result comprises a setting section 220 configured to set the energy range of X-rays to be detected for each unit region of the X-ray detector 100, a data management section 250 configured to acquire a count value of the set energy range for each unit region as measurement data by a result of the X-ray measurement, and an outputting section 270 configured to output the measurement data. Thus, counting of multiple energy ranges can simultaneously be measured.
Correcting artifacts by motion according to reconstruction of a CT image includes circuitry configured to acquire a projection image of 360-degree scanning; calculate a motion amount using parameters by setting a motion model including the parameters; calculate a relative motion amount of a projection data from the projection data of the projection image and opposite data thereto; prepare a fixed-point equation including the motion amount and the relative motion amount; determine the parameters in the motion model by self-consistently solving the fixed-point equation; and correct the projection image using the motion amount.
The invention provides a sample holder arrangement (1) comprising (a) a sample holding part (3) and (b) a base part (30), wherein the sample holding part (3) comprises an open-ended tube (10), wherein the open-ended tube (10) comprises a first tube end (11) and a second tube end (19), wherein the open-ended tube (10) comprises a narrowing part (15), wherein in the narrowing part (15) an internal tube dimension reduces in a direction from the first tube end (11) to the second tube end (19), wherein a single crystal of a porous framework (20) is arranged within the open-ended tube (10) between the first tube end (11) and the second tube end (19), and wherein dimensions of the narrowing part (15) and dimensions of the single crystal of the porous framework (20) are chosen such that the single crystal of the porous framework (20) cannot escape from the open-ended tube (10) via the second tube end (19); and wherein the base part (30) is configured to host the sample holding part (3), wherein the sample holding part (3) is detachably associated to the base part (30).
In the present invention, at a time of high count X-ray measurement, measurement of a wave height value of an X-ray signal is carried out rapidly and with high precision, regardless of the type of X-ray detector and the circuit configuration of preamplifier. The present invention includes: an excitation source; an X-ray detector; a preamplifier that outputs an analog signal; an AD convertor that converts the analog signal to a digital signal; a signal detection unit that detects an incident timing; a waveform conversion unit that converts the digital signal into a step wave including a rising section and flat sections before and after the rising section; a waveform shaping unit that generates a shaping wave including a step or a peak; a wave height value measurement unit that measures a wave height value on the basis of the incident timing, the step, and the like; a learning unit that uses the incident timing to acquire a portion of the step wave including the rising section and that uses learning data including a plurality of sets of the acquired portion and the wave height value to generate a learning model that has learned correlations thereof; and a wave height value prediction unit that uses the incident timing to acquire a portion of the step wave from the newly converted step wave and that calculates a predicted wave height value on the basis of the acquired portion of the step wave and the learning model.
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
G01T 1/36 - Measuring spectral distribution of X-rays or of nuclear radiation
98.
Quantitative analysis method, quantitative analysis program, and X-ray fluorescence spectrometer
Provided are a quantitative analysis method, a quantitative analysis program, and an X-ray fluorescence. The quantitative analysis method includes: a step of acquiring a representative composition set to represent contents of analysis components; a step of acquiring a plurality of comparative compositions, in each of which the content of one of the analysis components of the representative composition is changed by a predetermined content; a detection intensity calculation step of calculating a detection intensity indicating an intensity of fluorescent X-rays detected under the influence of the geometry effect through use of an FP method with respect to a virtual sample having a thickness set in advance and being indicated by each of the representative composition and the comparative compositions; and a step of calculating a matrix correction coefficient for each of the analysis components based on the detection intensity.
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
G01N 23/2208 - Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement all measurements being of secondary emission, e.g. combination of SE measurement and characteristic X-ray measurement
An X-ray fluorescence spectrometer of the present invention includes: a determination module (21) configured to determine, with respect to every one of measurement lines that correspond to secondary X-rays having intensities to be measured, whether or not a ratio of a theoretical intensity in thin film calculated on the basis of an assumed thickness and known contents of respective components to a theoretical intensity in bulk calculated on the basis of the known contents of the respective components exceeds a predetermined threshold; and a saturation thickness quantification module (23) configured to, according to a positive determination by the determination module (21), calculate a saturation thickness with respect to each of the measurement lines, at which the theoretical intensity saturates, on the basis of the known contents of the respective components and to adopt a largest saturation thickness as a quantitative value of a thickness.
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
Provided are a correction device, a correction system, a correction method, and a correction program with which it is possible to reduce calculation cost for correcting an artifact due to a beam-hardening effect in reconstruction of a CT image. A correction device 400 for correcting an artifact due to a beam-hardening effect in reconstruction of a CT image, comprises: an incident X-ray distribution acquisition unit 410 that acquires an incident X-ray distribution; a linear absorption coefficient model acquisition unit 420 for acquiring a linear absorption coefficient model in which energy dependence of a linear absorption coefficient is expressed by a scale factor including a parameter; a projected image acquisition unit 430 that acquires a projected image; and a correction unit 440 that corrects the projected image by using the incident X-ray distribution and the linear absorption coefficient model.
G01N 23/046 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
G01T 7/00 - Details of radiation-measuring instruments
