Goods & Services

Laboratory apparatus and instruments; measuring and testing machines and instruments; semiconductor testing apparatus; computer software, recorded; X-ray tubes not for medical purposes; industrial X-ray apparatus; X-ray apparatus not for medical purposes; X-ray diffraction apparatus not for medical use; apparatus and installations for the production of X-rays, not for medical purposes.

Abstract

An X-ray fluorescence spectrometer according to the present invention includes a calculation unit (10) configured to calculate a content of each element in a sample (13) using an FP method, wherein the calculation unit (10) is configured to: in order to take into consideration an influence of unmeasured elements for which the fluorescent X-rays are not measured, use shorter-wavelength scattered X-rays of primary X-rays having a wavelength of 0.05 nm or more and 0.075 nm or less, and longer-wavelength scattered X-rays of the primary X-rays having a wavelength of 0.11 nm or more and 0.23 nm or less as scattered X-rays whose intensities are measured by a detection unit (9), assume a mean atomic number for elements other than hydrogen included in the unmeasured elements, and assume a content for hydrogen.

IPC Classes  ?

• G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Abstract

Wt0W0Wt0t0)2It0It0 2WW0W0)2IW0IW0 2)1/2Wt0WWIt0IW0IW0: theoretical standard deviation of pre-correction differential intensity

IPC Classes  ?

• G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Goods & Services

Laboratory apparatus and instruments for X-ray analysis; measuring or testing machines and instruments, namely, X-ray analysis apparatus; recorded computer operating software and recorded software for data analysis for use with X-ray analysis apparatus; industrial X-ray apparatus; X-ray apparatus not for medical purposes; X-ray fluorescence analyzers.

Goods & Services

Laboratory apparatus and instruments; devices for analyzing protein sequence used as laboratory apparatus; photographic apparatus and instruments; optical machines and apparatus; microscopes; measuring or testing machines and instruments; testing apparatus not for medical purposes; computer software, recorded; industrial X-ray apparatus; X-ray apparatus not for medical purposes; X-ray diffraction apparatus not for medical use.

Abstract

[Problem] To provide a configuration capable of further supporting measurement in electron diffraction. [Solution] According to one aspect of the present invention, a structural analysis device using electron diffraction is provided. This structural analysis device is provided with at least one processor capable of executing a program so as to perform the following steps. In a display step, an image including a plurality of samples is displayed from transmitted electronic data, wherein the transmitted electronic data is transmitted electron data obtained by irradiating a region including the plurality of samples with an electron beam. In a calculation step, transmittance of each of the plurality of samples is calculated on the basis of the transmitted electronic data. In a selection step, at least one sample satisfying a predetermined condition is selected from within the image, wherein the predetermined condition is a condition related to the transmittance.

IPC Classes  ?

• G01N 23/20058 - Measuring diffraction of electrons, e.g. low energy electron diffraction [LEED] method or reflection high energy electron diffraction [RHEED] method
• G01N 23/04 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material
• G01N 23/20 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials

Goods & Services

Chemicals for use in industry and science; protein [raw material]; enzymes for industrial purposes; enzymes for research purposes; reagents for chemical analyses; biochemical reagents used for non-medical purposes; reagents for research purposes; assays for research purposes; reagents for use in scientific apparatus for chemical or biological analysis; chemical reagents, other than for medical or veterinary purposes. Laboratory apparatus and instruments; devices for analyzing protein sequence used as laboratory apparatus; photographic apparatus and instruments; optical machines and apparatus; microscopes; measuring or testing machines and instruments; testing apparatus not for medical purposes; computer software, recorded; industrial X-ray apparatus; X-ray apparatus not for medical purposes; X-ray diffraction apparatus not for medical use. Design of machines, apparatus and instruments; computer programming; computer software design; maintenance of computer software; technological advice relating to computers, automobiles and industrial machines; testing, inspection or research of pharmaceuticals, cosmetics or foodstuffs; pharmaceutical drug development services; laboratory research in the field of pharmaceuticals; pharmaceutical research; pharmaceutical product evaluation; testing of pharmaceuticals; providing medical and scientific research information in the field of pharmaceuticals and clinical trials; consultancy relating to pharmaceutical research and development; chemical analysis; testing, inspection or research on agriculture, livestock breeding or fisheries; testing or research on machines, apparatus and instruments; testing the functionality of apparatus and instruments; rental of measuring apparatus; rental of computers; providing computer programs on data networks; application service provider [ASP] services; rental of laboratory apparatus and instruments.

Abstract

An X-ray fluorescence spectrometer includes: a vacuum chamber (17) configured to be evacuated including at least a detection chamber in which a detector is disposed; drive units (18A to 18H) each including a drive source outside the vacuum chamber (17), and configured to perform a mechanical operation in the vacuum chamber (17); and a vacuum leakage location identification unit (23A, 23B) configured to: operate the drive units (18A to 18H) one at a time while monitoring a degree of vacuum in the vacuum chamber (17); if the change in the degree of vacuum in the vacuum chamber (17) before and after each operation is greater than or equal to a predetermined threshold, identify the relevant one of the drive units (18A to 18H) as a vacuum leakage location; and cause information to that effect to be displayed in a display unit (19) and/or be recorded in a recording unit (21).

IPC Classes  ?

• G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
• G01M 3/32 - Investigating fluid tightness of structures by using fluid or vacuum by measuring rate of loss or gain of fluid, e.g. by pressure-responsive devices, by flow detectors for containers, e.g. radiators

Goods & Services

Laboratory apparatus and instruments; measuring or testing machines and instruments; testing apparatus not for medical purposes; computer software, recorded; industrial X-ray apparatus; X-ray apparatus not for medical purposes; apparatus and installations for the production of X-rays, not for medical purposes; X-ray fluorescence analyzers.

Goods & Services

Laboratory apparatus and instruments; measuring apparatus and instruments; testing apparatus not for medical purposes; computer software, recorded; X-rays tubes, not for medical use; industrial X-ray apparatus; X-ray apparatus not for medical purposes; X-ray diffraction apparatus not for medical use; apparatus and installations for the production of X-rays, not for medical purposes.

Goods & Services

Laboratory apparatus and instruments; measuring apparatus and instruments; testing apparatus not for medical purposes; computer software, recorded; X-rays tubes, not for medical use; industrial X-ray apparatus; X-ray apparatus not for medical purposes; X-ray diffraction apparatus not for medical use; apparatus and installations for the production of X-rays, not for medical purposes.

Goods & Services

Laboratory apparatus and instruments; measuring apparatus and instruments; testing apparatus not for medical purposes; computer software, recorded; X-rays tubes, not for medical use; industrial X-ray apparatus; X-ray apparatus not for medical purposes; X-ray diffraction apparatus not for medical use; apparatus and installations for the production of X-rays, not for medical purposes.

Goods & Services

Laboratory apparatus and instruments; measuring or testing machines and instruments; calorimeters; computer software, recorded.

Goods & Services

Laboratory apparatus and instruments; measuring apparatus and instruments; testing apparatus not for medical purposes; semiconductor testing apparatus; computer software, recorded; X-ray tubes not for medical use; industrial X-ray apparatus; X-ray apparatus not for medical purposes; X-ray diffraction apparatus not for medical use; apparatus and installations for the production of X-rays, not for medical purposes.

Abstract

[PROBLEM ] To provide technology related to a window holding part, an X-ray generator, an X-ray analyzer, a control method for an X-ray generator, and a control system for an X-ray generator, the technology such that there is no need to provide an X-ray observation unit in a vacuum region and there is no need to use a portion of the X-rays used for X-ray analysis measurement. [SOLUTION] According to one embodiment of the present invention, an X-ray generator (20) is provided. The X-ray generator (20) is provided with an X-ray generation unit (203a) and an X-ray transmission window. The X-ray generation unit (203a) is configured to generate X-rays by receiving an electron beam from the outside. The X-ray transmission window includes a first X-ray transmission window (204a) and a second X-ray transmission window (205a). The first X-ray transmission window (204a) is configured to transmit, from among the X-rays, first X-rays (L1) which are oriented in a first direction (D1). The first X-rays (L1) are incident on an X-ray observation unit (21) that is disposed on the optical axis of the first X-rays and that is capable of observing the X-ray focal point of X-rays. The second X-ray transmission window (204) is configured to transmit, from among the X-rays, second X-rays (L2) which are oriented in a second direction (D2) different from the first direction (D1).

IPC Classes  ?

• G21K 1/00 - Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
• G01N 23/20008 - Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
• G21K 1/02 - Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
• G21K 5/02 - Irradiation devices having no beam-forming means
• H05G 1/00 - X-ray apparatus involving X-ray tubes; Circuits therefor

Abstract

To enable identification analysis of a fluorescent X-ray spectrum and verification of an analysis result to be easily performed, provided is a storage medium for storing a peak identification analysis program for causing a computer used for an X-ray fluorescence spectrometer. The program causes the computer to execute: a first list display step of displaying a list of elements and line types that are identified based on a designated angle or energy, as a first list; a first list reception step of receiving designation of elements and line types included in the first list; and a display update step of displaying, in a state where the first list is displayed, while showing that an element and a line type designated in the first list have been designated, a list of the designated element and line type and an angle or energy at which another line type of the designated element appears, as a second list.

IPC Classes  ?

• G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Abstract

An analysis apparatus for calculating an index indicating an optimization degree of a model with respect to measurement data includes processing circuitry configured to calculate an index indicating an optimization degree of a model including information of an electron density distribution with respect to measurement data, a probability distribution function followed by the measurement data being known, acquire the measurement data, acquire calculation data calculated from the model, and calculate an index GOF including a ratio of a residual, which is defined by a predetermined mathematical formula including the measurement data and the calculation data, and an expected value of the residual, which is defined based on the probability distribution function and the predetermined mathematical formula.

IPC Classes  ?

• G01N 23/2252 - Measuring emitted X-rays, e.g. electron probe microanalysis [EPMA]
• G01N 23/2055 - Analysing diffraction patterns

Abstract

Provided are: a fluorescent X-ray analysis method capable of measuring a liquid sample and emitting X-rays while avoiding bubbles generated during the measurement; and a sample pouch cell. The sample pouch cell for a liquid sample is disposed upright on a side-emissive fluorescent X-ray analyzer, and has: a first resin film disposed on a primary X-ray emission side; and a second resin film in which a region excluding an injection port for the liquid sample is bonded to the first resin film.

IPC Classes  ?

• G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
• G01N 1/10 - Devices for withdrawing samples in the liquid or fluent state
• G01N 23/2204 - Specimen supports therefor; Sample conveying means therefor

Abstract

Provided are a sample cell and a fluorescent X-ray analysis method capable of accurately irradiating the surface of a sample with X-rays even when the sample has a property of volatilizing by heat. This sample cell is to be used in a fluorescent X-ray analysis device and comprises: a first resin film disposed on the side from which a primary X-ray is emitted; a second resin film disposed so as to face the first resin film with a sample therebetween; and a holding member that holds a positional relationship between the sample and the first resin film. The first resin film and the second resin film are at least partially bonded at the periphery of a region where the sample is disposed.

IPC Classes  ?

• G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
• G01N 1/28 - Preparing specimens for investigation
• G01N 23/2204 - Specimen supports therefor; Sample conveying means therefor

Abstract

An analysis apparatus includes processing circuitry configured to store data of a scattering intensity measured by transmission of X-rays in one ω scan, perform coordinate conversion from the coordinate of the scattering vector to the coordinate of the tilt of the scattering body, with respect to a waveform based on the intensity of a specific diffraction point on the two-direction components, specify a peak position of the waveform of the intensity with respect to the coordinate of the tilt applied the coordinate conversion, and calculate a difference between the specified peak position and the peak position obtained on the assumption that the scattering body is not tilted from the direction perpendicular to the surface of the plate-shaped sample.

IPC Classes  ?

• G01N 23/201 - Measuring small-angle scattering, e.g. small angle X-ray scattering [SAXS]
• G01N 23/20025 - Sample holders or supports therefor

Abstract

An analysis system assembly and method for analyzing a plurality of samples and handling the cryogenically cooled samples from a shipping dewar into a position for analysis by an x-ray based analysis system. The system and method include a basket component containing a plurality of sample magazines each containing a plurality of samples, all covered by a volume of cryogenic liquid. The basket is transported from the shipping dewar to a transfer dewar. Cover components of the magazines are removed while the basket and magazines are submerged in a cryogenic liquid of the transfer dewar. The basket is removed from the transfer dewar and placed into a staging dewar of the analysis system. A robotic manipulator of the analysis system can then locate and transport individual samples to a sample stage of the analysis system.

IPC Classes  ?

• B01L 9/06 - Test-tube stands; Test-tube holders
• B01L 7/00 - Heating or cooling apparatus; Heat insulating devices
• B01L 9/02 - Laboratory benches or tables; Fittings therefor

Goods & Services

Laboratory apparatus and instruments for X-ray analysis, namely, X-ray spectrometer; measuring or testing machines and instruments, namely, X-ray analysis apparatus; recorded computer operating software and recorded software for data analysis for use with X-ray analysis apparatus; industrial X-ray apparatus; X-ray apparatus not for medical purposes; X-ray fluorescence analyzers

Goods & Services

Laboratory apparatus and instruments for X-ray analysis, namely, X-ray diffractometer; laboratory apparatus and instruments for extracting proteins, not for medical purposes; devices for analyzing protein sequence used as laboratory apparatus; microscopes; measuring or testing machines and instruments, namely, measuring or testing apparatus for X-ray analysis; measuring and testing machines and instruments for analysis of biochemical and biological substances, namely, protein sequencers and genetic analyzers; testing apparatus not for medical purposes, namely, electro-optical apparatus for analyzing chemical composition and structural properties of industrial and scientific materials; recorded computer operating software and recorded software for data analysis for use with X-ray analysis apparatus; industrial X-ray apparatus; X-ray apparatus not for medical purposes; X-ray diffraction apparatus not for medical use.

Goods & Services

Chemicals for use in industry and science; protein in raw material form for scientific and medical research; enzymes for industrial purposes; enzymes for research purposes; biochemical reagents used for non-medical purposes; reagents for research purposes; assays for research purposes; chemical reagents, other than for medical or veterinary purposes. Laboratory apparatus and instruments for X-ray analysis, namely, X-ray diffractometer; laboratory apparatus and instruments for extracting proteins, not for medical purposes; devices for analyzing protein sequence used as laboratory apparatus; microscopes; measuring or testing machines and instruments, namely, X-ray analysis apparatus; measuring and testing machines and instruments for analysis of biochemical and biological substances, namely, protein sequencers and genetic analyzers; testing apparatus not for medical purposes, namely, electro-optical apparatus for analyzing chemical composition and structural properties of industrial and scientific materials; recorded computer operating software and recorded software for data analysis for use with X-ray analysis apparatus; industrial X-ray apparatus; X-ray apparatus not for medical purposes; X-ray diffraction apparatus not for medical use. Design of machines, apparatus and instruments; computer programming; computer software design; maintenance of computer software; testing, inspection or research of pharmaceuticals; pharmaceutical drug development services; laboratory research in the field of pharmaceuticals; pharmaceutical research; pharmaceutical product evaluation; testing of pharmaceuticals; providing medical and scientific research information in the field of pharmaceuticals and clinical trials; consultancy relating to pharmaceutical research and development; chemical analysis; testing, inspection or research on agriculture, livestock breeding or fisheries; testing the functionality of apparatus and instruments; rental of measuring apparatus; rental of computers; application service provider [ASP] services for data analysis for use with X-ray analysis apparatus; rental of laboratory apparatus and instruments.

Goods & Services

Laboratory apparatus and instruments for X-ray analysis, namely, X-ray diffractometer; measuring apparatus and instruments, namely, X-ray analysis apparatus; testing apparatus not for medical purposes, namely, electro-optical apparatus for analyzing chemical composition and structural properties of industrial and scientific materials; X-ray tubes not for medical use; industrial X-ray apparatus; industrial use X-ray analyzing apparatus, namely, X-ray diffractometer; X-ray apparatus not for medical purposes; X-ray diffraction apparatus not for medical use; apparatus and installations for the production of X-rays, not for medical use

Goods & Services

Laboratory apparatus and instruments for X-ray analysis, namely, X-ray diffractometer; measuring apparatus and instruments, namely, X-ray analysis apparatus; testing apparatus not for medical purposes, namely, electro-optical apparatus for analyzing chemical composition and structural properties of industrial and scientific materials; recorded computer operating software and recorded software for data analysis for use with X-ray analysis apparatus; industrial X-ray apparatus; industrial use X-ray analyzing apparatus, namely, X-ray diffractometer; X-ray apparatus not for medical purposes; X-ray diffraction apparatus not for medical use.

Goods & Services

Laboratory apparatus and instruments for X-ray analysis, namely, X-ray diffractometer; measuring apparatus and instruments, namely, X-ray analysis apparatus; testing apparatus not for medical purposes, namely, electro-optical apparatus for analyzing chemical composition and structural properties of industrial and scientific materials; recorded computer operating software and recorded software for data analysis for use with X-ray analysis apparatus; industrial X-ray apparatus; industrial use X-ray analyzing apparatus, namely, X-ray diffractometer; X-ray apparatus not for medical purposes; X-ray diffraction apparatus not for medical use

Goods & Services

Laboratory apparatuses and instruments for the measurement, monitoring and evaluation of thermal processes; measuring or testing machines and instruments for the measurement, monitoring and evaluation of materials subjected to thermal changes; measuring or testing machines and instruments for thermogravimetry analysis, differential thermal analysis and multiple mode calorimetry; measuring or testing machines and instruments, namely, electronic and/or electro-technical thermobalance for the measurement of mass change under different atmospheres; calorimeters; calorimeters for thermogravimetry analysis, differential thermal analysis, multiple mode calorimetry and thermo-mechanical analysis; recorded computer software for operating thermal, thermo-mechanical, calorimetric and thermogravimetric measuring instruments.

Goods & Services

Laboratory apparatus and instruments for X-ray analysis, namely, X-ray diffractometer; measuring apparatus and instruments, namely, X-ray analysis apparatus; testing apparatus not for medical purposes, namely, electro-optical apparatus for analyzing chemical composition and structural properties of industrial and scientific materials; semiconductor testing apparatus; recorded computer operating software and recorded software for data analysis for use with X-ray analysis apparatus; X-ray tubes not for medical use; industrial X-ray apparatus; industrial use X-ray analyzing apparatus, namely, X-ray diffractometer; X-ray apparatus not for medical purposes; X-ray diffraction apparatus not for medical use; apparatus and installations for the production of X-rays, not for medical use.

Abstract

Provided is a fluorescence X-ray analysis device according to the present invention, wherein a quantitative determination means: limits overlap correction coefficients to negative values in the case of automatic setting; limits absorption and excitation correction coefficients to positive values with respect to all correction components when a standard sample does not include a component that can excite analytical rays, and calculates the theoretical intensity of fluorescence X-rays to be generated from a plurality of samples with assumed compositions; and obtains theoretical matrix correction coefficients through calculation based on the theoretical intensity and performs multiple regression calculation by setting a numerical value of a prescribed multiple of each of the theoretical matrix correction coefficients to an upper limit value of the absorption and excitation correction coefficients for a positive numerical value, and to a lower limit value of the absorption and excitation correction coefficients for a negative numerical value.

IPC Classes  ?

• G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Abstract

In this fluorescent X-ray analysis device, a quantification means calculates the lower detection limit on the basis of a calibration curve equation including an absorption excitation correction term and an overlap correction term.

IPC Classes  ?

• G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
• G01N 23/2209 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material using wavelength dispersive spectroscopy [WDS]

Abstract

In this fluorescent X-ray analysis device, a quantification means displays, on a display device, as a theoretical quantitative value standard deviation of analysis components, the difference between a first quantitative value of the analysis components, which is based on the measurement intensity with respect to each component, and a second quantitative value of the analysis components, which is found by varying the measurement intensity in a direction of increase in the change of content of the analysis components in a calibration curve for each component.

IPC Classes  ?

• G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
• G01N 23/2209 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material using wavelength dispersive spectroscopy [WDS]

Goods & Services

Laboratory apparatus and instruments for X-ray analysis, namely, X-ray spectrometer; measuring apparatus and instruments, namely, X-ray analysis apparatus; recorded computer operating software and recorded software for data analysis for use with X-ray analysis apparatus; industrial use X-ray analyzing apparatus, namely, X-ray spectrometer; X-ray apparatus not for medical purposes; X-ray spectroscopy apparatus not for medical use; X-ray fluorescence analyzers

Abstract

A radiation detector that suppress a double count which occurs by detecting a single pulse duplicately with a plurality of counters in counter switching, and can acquire highly accurate data, is configured to detect radiation in continuous exposure, comprises a sensor for generating a pulse when a particle of radiation is detected, a plurality of counters provided for counting the pulses, a setting holding circuit for holding a setting of an off-time for turning off any of the plurality of counters, and a control circuit for switching the counter performing counting the pulses after a lapse of the off-time with respect to a trigger signal.

IPC Classes  ?

• G01T 1/24 - Measuring radiation intensity with semiconductor detectors
• G01N 23/20008 - Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor

Abstract

A radiation analyzing system capable of synchronizing an external circuit are provided includes a sensor for generating pulses when radiation particles are detected by exposure, a counter provided so that the pulse can be counted for each frame, a readout circuit for reading out a count value generated by the counter, a control circuit for controlling the exposure and the reading by a signal, and a trigger signal generating circuit for generating a trigger-out signal, when one or a series of predetermined number of frames in which a High or Low interval is set is represented as one unit frame, for specifying the set High and Low intervals, are comprised.

IPC Classes  ?

• G01T 1/17 - Circuit arrangements not adapted to a particular type of detector
• G01T 1/24 - Measuring radiation intensity with semiconductor detectors

Abstract

Provided is a sample holder for which a resin member is used to simplify a sample exchange operation and with which deterioration of the resin member caused by X-rays can be suppressed. A sample holder for fluorescence X-ray analysis comprises: a cylindrical body that has a hole provided in a portion of a top end surface thereof, and that has a bottom end which is open; a receiving tray which is disposed on the inside of the cylindrical body and on which a sample is placed; an elastic body that biases the receiving tray upward; a resin member that has an arch part and that contacts a bottom end of the elastic body; and a bottom plate that is disposed on the bottom side of the resin member. The cylindrical body, the receiving tray, and the bottom plate are formed by metal. The arch part has a claw part that is provided to an end thereof and a pressing part that is pressed inward, and the arch part is elastically deformed inward by a pressing force on the pressing part. In the cylindrical body are formed a fitting part to which the claw part is fitted, and an exposed part via which the pressing part is exposed to the outside. The resin member is disposed between the receiving tray and the bottom plate, and portions thereof other than the pressing part are surrounded by the cylindrical body, the receiving tray, and the bottom plate.

IPC Classes  ?

• G01N 23/2204 - Specimen supports therefor; Sample conveying means therefor
• G01N 1/28 - Preparing specimens for investigation
• G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Abstract

A correction apparatus reduces calculation costs for correcting artifacts due to a beam hardening effect in reconstructing a CT image by correcting an artifact due to a beam hardening effect caused in reconstructing a CT image. The correction apparatus includes processing circuitry configured to acquire an incident X-ray distribution, acquire a linear absorption coefficient model representing an energy dependency of a linear absorption coefficient by a scale factor including a parameter, acquire a projection image, and correct the projection image using the incident X-ray distribution and the linear absorption coefficient model.

IPC Classes  ?

• G06T 11/00 - 2D [Two Dimensional] image generation

Abstract

To measure a pulse height of an X-ray signal at high speed and with high precision even for high count rate X-ray measurement regardless of the type of an X-ray detector and a circuit configuration of a preamplifier, provided is an X-ray spectrometer including: a learning unit which acquires a part of a stepped wave including a rise portion through use of incident time, and generates a trained model which has learned a correlation between a acquired part and a pulse height through use of training data including a plurality of combinations of the acquired part and the pulse height; and a pulse height predictor which acquires a part of the stepped wave from the newly converted stepped wave through use of the incident time, and calculates a predicted pulse height from the acquired part of the stepped wave and the trained model.

IPC Classes  ?

• G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
• G01N 23/2252 - Measuring emitted X-rays, e.g. electron probe microanalysis [EPMA]
• G01T 1/17 - Circuit arrangements not adapted to a particular type of detector
• G01T 1/36 - Measuring spectral distribution of X-rays or of nuclear radiation

Abstract

A detector stand for an X-ray detector is provided. A first arrangement portion arranges the X-ray detector in first orientation. A second arrangement portion arranges the X-ray detector in second orientation. The X-ray detector can be fixed to a mounting portion. In the detector stand, the X-ray detector is selectively mountable on the first arrangement portion or the second arrangement portion through the mounting portion. An arrangement angle of the X-ray detector fixed to the mounting portion is different between the first orientation and the second orientation.

IPC Classes  ?

• G01N 23/20008 - Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor

Abstract

Obtaining an X-ray CT image of a biological sample includes a step of penetrating a contrast agent into the biological sample and solidifying the contrast agent to provide a contrast image of the biological sample, the contrast agent comprising wax and having a density of 0.95 g/cm3 or less in its solidified state after penetration into the biological sample, and having a melting point of 40° C. to 80° C., a step of melting and resolidifying the solidified contrast agent, and a step of acquiring an X-ray CT image by irradiating the resolidified biological sample with an X ray having an energy of 4 to 12 keV, the shape of the biological sample being a shape with which a maximum optical path length of the X ray in the biological sample in the step of acquiring an X-ray CT image is 2 mm or less.

IPC Classes  ?

• G01N 33/58 - Chemical analysis of biological material, e.g. blood, urine; Testing involving biospecific ligand binding methods; Immunological testing involving labelled substances
• G01N 1/30 - Staining; Impregnating
• G01N 1/36 - Embedding or analogous mounting of samples
• G01N 23/046 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
• G01N 33/483 - Physical analysis of biological material

Abstract

The correction apparatus comprises a projection image acquiring section for acquiring a measured projection image, a virtual energy setting section for setting a virtual energy different from the measured energy that is the energy of the X-ray irradiated at the time of acquiring the measured projection image, a dual energy decomposing section for calculating a projection image under an assumed condition at the time of irradiating the X-ray of the virtual energy and performing dual energy decomposition, a consistency index evaluating section for evaluating a temporarily corrected image obtained by the dual energy decomposition with a consistency index to identify an optimum condition among the assumed conditions, and a correction image generating section for generating a projection image under the optimum condition as a corrected image.

IPC Classes  ?

• G06T 11/00 - 2D [Two Dimensional] image generation
• G06T 7/00 - Image analysis

Abstract

Provided is a degree-of-crystallinity measurement apparatus including: an X-ray scattering pattern acquisition module which acquires an X-ray scattering pattern of a sample including a crystalline portion and an amorphous portion of a target substance; a pattern decomposition module which acquires a diffraction pattern of the crystalline portion and a continuous pattern from the X-ray scattering pattern; a target substance intensity calculation module which calculates an integrated intensity of the target substance based on the X-ray scattering pattern and chemical formula information of the target substance; a target substance pattern calculation module which calculates, from the continuous pattern, a scattering pattern of the target substance including the crystalline portion and the amorphous portion; a structural disorder parameter determination module which determines a structural disorder parameter of the crystalline portion based on the diffraction pattern of the crystalline portion and the scattering pattern of the target substance; and a degree-of-crystallinity output module.

IPC Classes  ?

• G01N 23/2055 - Analysing diffraction patterns
• G01N 23/207 - Diffractometry, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Abstract

A pair of support sections arranged with a space for placing a sample, a frame supported by the pair of support sections, an irradiation section movably connected to the frame for irradiating radiation, and a detection section movably connected to the frame for detecting radiation scattered by the sample are comprised on a same plane, and the irradiation section and the detection section are movable on the same plane with respect to the frame. Thus, using a space formed between the pair of support sections, it is possible to measure a large sample in a wide range of diffraction angles. Therefore, it is easy to measure the diffraction of the low angle side. Further, since each part is movable on the same plane, it is easy to arrange the parts.

IPC Classes  ?

• G01N 23/20025 - Sample holders or supports therefor

Abstract

A processing apparatus, a system, a method and a program for applying non-negative matrix factorization to one or more measured profiles of X-ray powder diffraction based on known information are provided. A processing apparatus for applying non-negative matrix factorization to a measured profile of X-ray powder diffraction comprises a measured profile acquiring section for acquiring one or more measured profiles, a known information acquiring section for acquiring known information including a shape of a predetermined profile corresponding to a background or a predetermined substance included in the measured profile, or a restriction of a coefficient matrix of the predetermined profile, and a decomposition section for applying non-negative matrix factorization to the measured profile based on the known information.

IPC Classes  ?

• G01N 23/2055 - Analysing diffraction patterns
• G01N 23/207 - Diffractometry, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
• G06F 17/16 - Matrix or vector computation

Abstract

A processing apparatus for processing a structure factor including total scattering data and data of a structural model are provided comprises a structure factor acquiring section for acquiring a first structure factor based on measured total scattering data; a data converting section for separating the first structure factor into a short-range correlation and a long-range correlation; and a scattering intensity calculating section for acquiring a structural model indicating an atomic arrangement in a finite region, calculating a short-range scattering intensity of the structural model and calculating a second structure factor from the short-range scattering intensity and the long-range correlation.

IPC Classes  ?

• G16C 60/00 - Computational materials science, i.e. ICT specially adapted for investigating the physical or chemical properties of materials or phenomena associated with their design, synthesis, processing, characterisation or utilisation
• G01N 23/20016 - Goniometers

Abstract

A configuration is provided in which outside air is taken as a carrier gas into a carrier gas flow path (A, B). A CO2 sensor (specific gas detection sensor) (71) for detecting a CO2 gas desorbed from a sample is installed in a component gas detector (70). A CO2 sensor (air-containing specific gas detection sensor) (54) for detecting a CO2 gas contained in air taken into the carrier gas flow path by a blower fan (51) is installed separately. A CO2 gas detection amount detected by the air-containing specific gas detection sensor (54) is subtracted from a CO2 gas detection amount detected by the specific gas detection sensor (71) to calculate a detection amount of the CO2 gas desorbed from the sample.

IPC Classes  ?

• G01N 7/16 - Analysing materials by measuring the pressure or volume of a gas or vapour by allowing the material to emit a gas or vapour, e.g. water vapour, and measuring a pressure or volume difference by heating the material

Abstract

A thermal analysis apparatus includes circuitry for displaying a graph of the thermal analysis data relating to temperature or time on a display displaying a sample image on the display, generating color information data of range and type selected from the sample image, displaying a graph of the color information data relating to temperature or time side by side with the graph of the thermal analysis data relating to temperature or time without superimposing both graphs on the display, and displaying a marker at an arbitrary point on one of the graphs and displaying a marker on others of the graphs at a point whose measurement time is synchronized with the point where the marker is displayed.

IPC Classes  ?

• G01J 5/48 - Thermography; Techniques using wholly visual means
• G06T 11/20 - Drawing from basic elements, e.g. lines or circles

Abstract

Provided is a thermal analysis device with which it is possible to easily perform detailed analysis of a change in the state of a specimen, while visually grasping, in detail, the color of the specimen and a change therein which accompanies a change in the temperature of the specimen. Also provided is a control software for the thermal analysis device. This thermal analysis device which acquires thermal analysis data by measuring and calculating the physical properties of a specimen while changing the temperature of the specimen by heating or cooling, and acquires image data by imaging the specimen, comprises: a means for displaying a graph pertaining to the temperature or time of the thermal analysis data; a means for displaying a specimen image which is the image data; a means for generating color information data for a type and range selected from the specimen image; and a means for displaying colors generated on the basis of the color information data as a gradation in which the colors are associated with a temperature or time and arranged.

IPC Classes  ?

• G01N 25/20 - Investigating or analysing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity
• G01N 21/27 - Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection
• G01N 25/00 - Investigating or analysing materials by the use of thermal means

Abstract

A sample holder unit used for a single-crystal X-ray structure analysis apparatus, the sample holder unit comprising a sample holder for being attached to a goniometer in the single-crystal X-ray structure analysis apparatus, and an applicator that stores the sample holder, wherein the sample holder comprises a holding part that holds a porous complex crystal capable of soaking a sample in a plurality of fine pores formed therein, and the applicator comprises a space for soaking the sample in the porous complex crystal of the sample holder, wherein the applicator comprises a space for soaking the sample in the porous complex crystal of the sample holder, wherein the porous complex crystal is soaked only in a preserving solvent in the space.

IPC Classes  ?

• G01N 23/20025 - Sample holders or supports therefor
• G01N 1/28 - Preparing specimens for investigation
• G01N 23/20016 - Goniometers
• G01N 23/207 - Diffractometry, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Abstract

A user-friendly single-crystal X-ray structure analysis apparatus for quickly performing a single-crystal X-ray structure analysis using a crystalline sponge and easily making it possible by including managing related information and a method therefor, are provided. There are provided a sample holder comprising a porous complex crystal capable of soaking a sample in a plurality of fine pores formed therein; a goniometer that rotationally moves, the sample holder being attached to the goniometer; an information acquisition section 600 that acquires invariable information about the porous complex crystal or variable information provided after the sample is soaked therein; and an information storage section 111 that stores the invariable information or the variable information acquired by the information acquisition section 600.

IPC Classes  ?

• G01N 23/20025 - Sample holders or supports therefor
• G01N 1/28 - Preparing specimens for investigation
• G01N 23/207 - Diffractometry, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Abstract

A system that can reduce the cost for correcting artifacts due to motion in the reconstruction of CT images includes acquiring the temporarily corrected projection image and determining the reference center position correction function and the parameter of the temporary reference center position correction function by calculating a degree of coincidence between the temporarily corrected projection image and the projection image at the imaging angle opposing thereto, and correcting the main imaging data or the projection image based on the main imaging data using the reference center position correction function and the relative motion correction function.

IPC Classes  ?

• G06T 11/00 - 2D [Two Dimensional] image generation
• G06T 5/00 - Image enhancement or restoration

Abstract

Provided are a morphology analysis device, a morphology analysis method, and a morphology analysis program with which it is possible to recognize the morphology of the constituent elements of molecules. A morphology analysis device 200 for analyzing the morphology of molecules in a solution comprises: a reference data storage unit 234 that stores reference data, which is molecular shape data for a pre-identified test molecule; a target data storage unit 235 that stores target data, which is molecular shape data for the test molecule serving as an analysis target; and a morphology estimation unit 237 that estimates the morphology of the constituent elements of a molecule in the target data by identifying the state of physical quantities constituting the molecular shape of the target data with respect to the reference data. Both the reference data and the target data have a molecular level resolution.

IPC Classes  ?

• G01N 23/201 - Measuring small-angle scattering, e.g. small angle X-ray scattering [SAXS]

Abstract

Provided is a fluorescent X-ray analysis device in which a state at a rear surface of a thin plate-shaped sample is made uniform so as to prevent differences between measurement conditions depending on a measuring position. This fluorescent X-ray analysis device comprises an X-ray source for emitting primary X-rays onto a surface of a plate-shaped sample, a detector for measuring an intensity of fluorescent X-rays, a sample stage on which the sample is placed, an analyzing device for performing an analysis at a plurality of measuring positions on the surface of the sample, a background correction cover which has an outer edge part shaped to follow a portion of an outer edge of the sample stage, is adjacent to an outer side of the sample stage, and has a surface that is disposed in substantially the same plane as a surface of the sample stage, and a movement mechanism for moving the sample stage such that the primary X-rays are emitted onto an arbitrarily defined measuring position on the surface of the sample, wherein the movement mechanism moves the background correction cover in accordance with movement of the sample stage, and if the sample stage is not present at a rear surface of the sample at the measuring position, moves the background correction cover to the rear surface of the sample at the measuring position.

IPC Classes  ?

• G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
• G01N 23/2204 - Specimen supports therefor; Sample conveying means therefor

Abstract

Provided is a total reflection X-ray fluorescence spectrometer which has high analysis sensitivity and analysis speed. The total reflection X-ray fluorescence spectrometer includes: an X-ray source that has an electron beam focal point having an effective width in a direction parallel to a surface of a sample, and orthogonal to an X-ray irradiation direction, that is larger than a dimension in the irradiation direction; a reflective optic that has an effective width in the orthogonal direction that is larger than that of the electron beam focal point, and has a curved surface in the irradiation direction; and a plurality of detectors that are arranged in a row in the orthogonal direction, and are configured to measure intensities of fluorescent X-rays emitted from the sample irradiated with primary X-rays focused by the reflective optic.

IPC Classes  ?

• G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Abstract

An exclusion module (21) is configured to calculate a coating amount of each component whose measurement element is not contained in the base layers, for each of corresponding measurement lines, on an assumption that that component solely makes up the thin film and to adopt a maximum coating amount as an initial value of the coating amount of that component; and to calculate a coating amount of each component whose measurement element is contained in the base layers, for each of corresponding measurement lines, on the basis of initial values of coating amounts of individual components whose measurement elements are not contained in the base layers, if calculation results for all the corresponding measurement lines give errors, to exclude that component from analysis targets as an unquantifiable component, and in other cases, to adopt a maximum coating amount as an initial value of the coating amount of that component.

IPC Classes  ?

• G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Abstract

By regarding total precision of an X-ray intensity as counting precision due to statistical fluctuation and counting loss and by regarding the counting precision as a product of precision of an uncorrected intensity, which is an intensity before counting loss correction is performed, and a gradient of a corrected intensity with respect to the uncorrected intensity, a counting time calculation unit (13) included in an X-ray fluorescence spectrometer of the present invention calculates a counting time from specified total precision of the X-ray intensity, a given counting loss correction coefficient, and a given corrected intensity for each measurement line (5).

IPC Classes  ?

• G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
• A61B 6/00 - Apparatus for radiation diagnosis, e.g. combined with radiation therapy equipment

Abstract

A transmission type small-angle scattering device of the present invention includes a goniometer 10 including a rotation arm 11. The rotation arm 11 is freely turnable around a θ-axis extending in a horizontal direction from an origin with a vertical arrangement state of the rotation arm 11 being defined as the origin, and has a vertical arrangement structure in which an X-ray irradiation unit 20 is installed on a lower-side end portion of the rotation arm 11, and a two-dimensional X-ray detector 30 is installed on an upper-side end portion of the rotation arm 11 to form a vertical arrangement structure.

IPC Classes  ?

• G01N 23/201 - Measuring small-angle scattering, e.g. small angle X-ray scattering [SAXS]
• G01N 23/20016 - Goniometers
• G01N 23/20025 - Sample holders or supports therefor

Abstract

A transmission type small-angle scattering device of the present invention includes a goniometer 10 including a rotation arm 11. The rotation arm 11 is freely turnable around a θ-axis extending in a horizontal direction from an origin with a vertical arrangement state of the rotation arm 11 being defined as the origin, and has a vertical arrangement structure in which an X-ray irradiation unit 20 is installed on a lower-side end portion of the rotation arm 11, and a two-dimensional X-ray detector 30 is installed on an upper-side end portion of the rotation arm 11 to form a vertical arrangement structure.

IPC Classes  ?

• G01N 23/201 - Measuring small-angle scattering, e.g. small angle X-ray scattering [SAXS]
• G01N 23/20016 - Goniometers
• G01N 23/20025 - Sample holders or supports therefor

Abstract

Provided are: a semiconductor inspecting device capable of inspecting, for every region, a microstructure of the inside of a semiconductor by obtaining an enlarged image with sufficient strength, with a size accommodatable in a laboratory; and a corresponding semiconductor inspecting system and semiconductor inspecting method. This semiconductor inspecting device uses an enlarged X-ray image. The semiconductor inspecting device comprises: an X-ray source 120 with fine focus and high output power; an X-ray irradiation unit including a condenser mirror 130 that condenses emitted X-rays and irradiates a semiconductor sample with same; a sample holding unit holding the sample; a reflective mirror-type X-ray lens unit 150 forming an image of X-rays passing through the sample; and an imaging unit 190 acquiring the formed X-ray image. Each of mirrors constituting the condenser mirror 130 and the reflective mirror-type X-ray lens unit 150 has a reflection plane in which a multi-layered film having high reflectance against an X-ray having a designated wavelength is formed.

IPC Classes  ?

• G01N 23/18 - Investigating the presence of defects or foreign matter
• G21K 1/00 - Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
• G21K 1/06 - Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction, or reflection, e.g. monochromators
• G21K 7/00 - Gamma ray or X-ray microscopes

Abstract

This microchannel device separates a sample solution, which contains a first component to be used as an analysis control and a second component to be analyzed, into a solution containing the first component and a solution containing the second component.

IPC Classes  ?

• G01N 1/10 - Devices for withdrawing samples in the liquid or fluent state
• G01N 1/00 - Sampling; Preparing specimens for investigation

Abstract

A damage measurement technique capable of measuring damage of a sample in a single crystal state, regardless of the surrounding condition, includes irradiating microbeam white X-rays to a sample in a single crystal state, diffraction of a spot generated by the irradiation is detected, a coefficient on variance of an intensity distribution in a specific direction in the detected diffraction spot is calculated, and a damaged state of the sample is specified based on the calculated coefficient.

IPC Classes  ?

• G01N 23/2055 - Analysing diffraction patterns

Abstract

A correction apparatus for correcting a structure factor includes a structure factor acquisition section that acquires the structure factor; a PDF calculation section that calculates PDF from the acquired structure factor; a correction function preparation section that prepares a first correction function that is Fourier-transformed in a predetermined range, and a second correction function that is Fourier-transformed in the predetermined range, the first correction function comprising data of the PDF and a cut-off function for cutting off data on a long distance side of the PDF and the second correction function comprising the cut-off function; a correction amount calculation section that calculates a correction amount comprising the first correction function, the second correction function, and a scale factor; a structure factor correction section that corrects the structure factor; and an R-factor value calculation section that calculates an R-factor value indicating correction accuracy.

IPC Classes  ?

• G01N 23/207 - Diffractometry, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
• G01N 23/20016 - Goniometers

Abstract

The present invention provides a control device, a system, a method, and a program that make it possible to efficiently acquire data significant for identifying the structure of a macromolecule in a solution with a resolution greater than 30 Å. Provided is a control device 200 for controlling an X-ray analysis device, comprising: a data conversion unit 223 that converts, into profiles, sample solution data and reference solution data acquired from the X-ray analysis device at different points in time; a first indicator calculation unit 232 that calculates a first indicator representing fluctuation of intensity in the time axis direction on the basis of the profile of at least one of the sample solution data and the reference solution data out of the profiles obtained through the conversion; a first indicator determination unit 234 that determines whether or not the calculated first indicator is within a predetermined range; and a device control unit 268 that terminates the measurement by the X-ray analysis device if the first indicator is not within the predetermined range.

IPC Classes  ?

• G01N 23/20 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials

Abstract

Provided are a total reflection X-ray fluorescence spectrometer and an estimation method which are capable of easily and quickly estimating whether contamination exists on a substrate through use of a machine learning device. The total reflection X-ray fluorescence spectrometer includes: a spectrum acquisition unit configured to acquire a spectrum; and a learning unit which includes an estimation unit configured to generate estimation data on an element contained in contamination on a surface of a substrate in response to input of the spectrum, and for which learning by the estimation unit has been executed based on teacher data including the spectrum for learning and data on the element contained in the contamination on the surface of the substrate which has been used to acquire the spectrum for learning and the estimation data generated when the spectrum for learning is input to the estimation unit.

IPC Classes  ?

• G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
• G06N 3/0464 - Convolutional networks [CNN, ConvNet]

Abstract

A peak two-dimensional detection data extraction unit 211 extracts two-dimensional detection data (peak two-dimensional detection data) of the diffracted X-ray Xb with the maximum X-ray intensity, from two-dimensional detection data of diffracted X-rays Xb obtained at a plurality of scanning angles 2θ/θ. Next, a peak position specifying unit 212 specifies the position (peak position) where the X-ray intensity is maximum, from the peak two-dimensional detection data. Then, data processing is performed using positional information on the peak position specified for the peak two-dimensional detection data.

IPC Classes  ?

• G01N 23/2055 - Analysing diffraction patterns
• G01N 23/207 - Diffractometry, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Abstract

There is provided a technique capable of evaluating an anisotropy of an object with a large field of view, in a non-destructive manner and with high angular resolution. An object 1 is irradiated with X-rays from a radiation source 22 of a phase-contrast X-ray optical system 2. A change characteristic in X-ray scattering intensities for individual relative angles each formed between an incident angle of the X-rays and an anisotropic structure in the object 1 are then acquired. Evaluation data for evaluating a state of the anisotropic structure in the object 1 is then generated based on the change characteristic in the X-ray scattering intensities.

IPC Classes  ?

• G01N 23/041 - Phase-contrast imaging, e.g. using grating interferometers

Abstract

A device for analyzing a diffraction pattern of a mixture uses a fitting pattern including a term related to a known target pattern, which indicates a target component and which is changeable in shape with use of a shape parameter, and a term related to an unknown pattern, which indicates a residual group. The fitting pattern is fitted to an observed pattern with a given value assigned to the shape parameter and with the unknown pattern set to an initial pattern. The unknown pattern is then changed, to thereby fit the fitting pattern to the observed pattern. The fitting described above is executed with use of a plurality of shape parameters each of which is the shape parameter, and a calculation result related to one of the plurality of shape parameters is selected.

IPC Classes  ?

• G01N 23/2055 - Analysing diffraction patterns

Abstract

According to an aspect of the present invention, an X-ray diffraction apparatus is provided. The X-ray diffraction apparatus comprises: an X-ray source configured to irradiate a sample with an X-ray; a sample stage configured to allow the sample to be disposed in such a manner that the X-ray is diffracted; a detector configured to detect a diffracted X-ray, which is the X-ray that has been diffracted, in one dimension at a detection strip; a slit member provided between the sample stage and the detector, comprising a slit through which the diffracted X-ray can pass; wherein an axis in a longitudinal direction of the slit is parallel to an axis in a longitudinal direction of the detection strip.

IPC Classes  ?

• G01N 23/207 - Diffractometry, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
• G01N 23/20016 - Goniometers
• G01N 23/20025 - Sample holders or supports therefor

Abstract

An X-ray fluorescence spectrometer according to the present invention comprises: a vacuum chamber (17) that includes at least a detection chamber in which a detector is disposed, and that is evacuated; a plurality of drive units (18A-18H) that have a drive source outside the vacuum chamber (17) and that perform a mechanical operation in the vacuum chamber (17); and a vacuum leakage location-identifying means (23A, 23B) that drives each of the drive units (18A-18H) one by one while monitoring the degree of vacuum of the vacuum chamber (17), specifies, when a change in the degree of vacuum of the vacuum chamber (17) between before and after each operation has become equal to or more than a predetermined threshold, the driven drive unit (18A-18H) as a vacuum leakage location, and causes a display means (19) to display said information and/or causes a recording means (21) to record said information.

IPC Classes  ?

• G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Abstract

The present invention provides a structure for scavenging a compound, the structure including at least one gene from a gene group involved in the intracellular/extracellular transport of the compound, a product of the gene, or a combination of the gene and product.

IPC Classes  ?

• C12N 15/31 - Genes encoding microbial proteins, e.g. enterotoxins
• C07K 14/195 - Peptides having more than 20 amino acids; Gastrins; Somatostatins; Melanotropins; Derivatives thereof from bacteria
• C07K 14/37 - Peptides having more than 20 amino acids; Gastrins; Somatostatins; Melanotropins; Derivatives thereof from fungi
• C07K 14/415 - Peptides having more than 20 amino acids; Gastrins; Somatostatins; Melanotropins; Derivatives thereof from plants
• C07K 14/435 - Peptides having more than 20 amino acids; Gastrins; Somatostatins; Melanotropins; Derivatives thereof from humans
• C12N 15/12 - Genes encoding animal proteins
• C12N 15/29 - Genes encoding plant proteins, e.g. thaumatin
• C12P 21/02 - Preparation of peptides or proteins having a known sequence of two or more amino acids, e.g. glutathione

Abstract

Provided is a structure for capturing a compound that includes at least one gene or a product thereof, or a combination thereof among a group of genes involved in the intracellular and extracellular transport function of the compound, the gene or the product thereof being multi-componented.

IPC Classes  ?

• C12N 15/12 - Genes encoding animal proteins
• C12N 15/31 - Genes encoding microbial proteins, e.g. enterotoxins
• C12P 21/02 - Preparation of peptides or proteins having a known sequence of two or more amino acids, e.g. glutathione
• C07K 14/195 - Peptides having more than 20 amino acids; Gastrins; Somatostatins; Melanotropins; Derivatives thereof from bacteria
• C07K 14/37 - Peptides having more than 20 amino acids; Gastrins; Somatostatins; Melanotropins; Derivatives thereof from fungi
• C07K 14/415 - Peptides having more than 20 amino acids; Gastrins; Somatostatins; Melanotropins; Derivatives thereof from plants
• C07K 14/435 - Peptides having more than 20 amino acids; Gastrins; Somatostatins; Melanotropins; Derivatives thereof from humans

Abstract

According to an aspect of the present invention, provided is an information processing apparatus comprising a memory configured to store a program; and a processor configured to execute a program so as to output a parameter result in relation to a thin film by inputting a profile result in relation to an intensity of X-ray from the thin film to a neural network, wherein the neural network is a neural network that is allowed to machine-learn teacher data using profile data in relation to an intensity of X-ray from a thin film as input data and using parameter data in relation to the thin film as output data.

IPC Classes  ?

• G01N 23/20 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials

Abstract

Electron density map specifying circuitry is configured to accurately reproduce an electron density map of a macromolecule in a solution having a dynamically fluctuating structure. For example, the electron density map circuitry generates a plurality of electron density maps from a measured X-ray scattering profile acquired by measuring a sample, calculates an index representing a degree of coincidence between an X-ray scattering profile calculated from each of the plurality of electron density maps and the measured X-ray scattering profile, and selects a representative electron density map from the plurality of electron density maps based on the calculated index.

IPC Classes  ?

• G16B 15/00 - ICT specially adapted for analysing two-dimensional or three-dimensional molecular structures, e.g. structural or functional relations or structure alignment
• G01N 23/2055 - Analysing diffraction patterns

Abstract

According to an aspect of the present invention, provided is an information processing apparatus, comprising: a processor configured to execute a program so as to output a diagnostic result diagnosing an analysis profile result by inputting an input profile result in relation to an intensity of X-ray from a thin film and the analysis result of the input profile result to a neural network, wherein the neural network is a neural network that is allowed to machine-learn teacher data using input profile data in relation to an intensity of X-ray from a thin film and analysis profile data obtained from the input profile data as input data, and using diagnostic data obtained by diagnosing the analysis profile data as output data.

IPC Classes  ?

• G01N 23/20 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials
• G01N 23/083 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
• G06N 3/02 - Neural networks

Abstract

This X-ray fluorescence spectrometer comprises a calculation means (10) for calculating the content of an element in a sample (13) by an FP method, and, in order to take into account the effect of non-measured elements for which X-ray fluorescence is not measured, the calculation means (10) uses primary scattered X-rays on a short-wavelength side having a wavelength of 0.05-0.075 nm and primary scattered X-rays on a long-wavelength side having a wavelength of 0.11-0.23 nm as scattered rays for measuring intensity by a detection means (9), and assumes an average atomic number in the case of elements other than hydrogen among non-measured elements, and assumes the content of hydrogen in the case of hydrogen.

IPC Classes  ?

• G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Abstract

Provided is a crystal structure analysis method that includes: acquiring data (Data-1, Data-2, Data-3, ... Data-n) by applying radiation to each of a plurality of samples while changing an incident angle of the radiation to obtain diffraction point intensity and reliability with respect to a plurality of crystal lattice planes in each of the samples; determining whether to perform merging for individual data on the basis of a merging reference index (for example, Rint, integrity), the merging being processing of integrating a plurality of pieces of data into one piece; performing the merging to the data determined to be subjected to the merging, which is processing for integrating the plurality of these pieces of data into one piece; and specifying a structure of a crystal by the merged data obtained as a result of the merging. In the crystal structure analysis method, crystal structure analysis device, and crystal structure analysis program that specify a crystal structure by subjecting a plurality of diffraction patterns to data processing and analysis, the present invention makes it possible to obtain a crystal structure analysis result with high reliability.

IPC Classes  ?

• G01N 23/2055 - Analysing diffraction patterns
• G01N 23/20058 - Measuring diffraction of electrons, e.g. low energy electron diffraction [LEED] method or reflection high energy electron diffraction [RHEED] method
• G01N 23/205 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials using diffraction cameras

Abstract

There is provided a technique for non-destructively and relatively easily acquiring orientation information of an anisotropic material even for a large-sized object. An object is irradiated with X-rays in a tangential direction of a curved anisotropic material from a radiation source of a phase-contrast X-ray optical system. A scattering image is then obtained using a detection signal of X-rays having penetrated through the object. Structure information of the anisotropic material is acquired based on the scattering image.

IPC Classes  ?

• G01N 23/041 - Phase-contrast imaging, e.g. using grating interferometers

Goods & Services

Laboratory apparatus and instruments for X-ray diffraction analysis; Industrial X-ray machines and apparatus, not for medical use; X-ray analysis apparatus not for medical purpose.

Abstract

A correction amount specifying apparatus comprises circuitry for storing diffraction data including a combination of the diffraction angle of the irradiation X-rays with respect to the sample rotation angle and the sample surface height, the diffraction data being acquired by irradiating X-rays to a standard sample that is an aggregate of isotropic and stress free crystal particles, determining a first correspondence relationship based on the diffraction data, and specifying a correction amount of the sample surface height with respect to a desired sample rotation angle and a desired diffraction angle based on the first correspondence relationship.

IPC Classes  ?

• G01N 23/20016 - Goniometers

Abstract

The objective of the present invention is to perform identification analysis of fluorescent X-ray spectra, and verification of analysis results, easily. This peak identification analysis program causes a computer used in a fluorescent X-ray analysis device to execute: a spectrum acquisition step; a designating information acquisition step; a first list display step for displaying, as a first list of candidates of a fluorescent X-ray representing a peak contained in a fluorescent X-ray spectrum, a list of one or a plurality of elements and line types specified on the basis of a designated angle or energy; a first list accepting step for accepting, from a user, a designation of at least some of the one or plurality of elements and line types included in the first list; and a display updating step for displaying, as a second list while the first list is being displayed, a list of the designated element and line type, and the angle or energy at which other line types of the element appear, while indicating that the element and line type designated with respect to the first list have been designated.

IPC Classes  ?

• G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Abstract

A control apparatus, system, method and program that enable simultaneous measurement of counts of multiple energy ranges in an efficient configuration are provided. A control apparatus 200 for controlling an X-ray detector 100 and outputting a measurement result comprises a setting section 220 configured to set the energy range of X-rays to be detected for each unit region of the X-ray detector 100, a data management section 250 configured to acquire a count value of the set energy range for each unit region as measurement data by a result of the X-ray measurement, and an outputting section 270 configured to output the measurement data. Thus, counting of multiple energy ranges can simultaneously be measured.

IPC Classes  ?

• G01T 1/17 - Circuit arrangements not adapted to a particular type of detector
• G01T 1/24 - Measuring radiation intensity with semiconductor detectors

Abstract

Correcting artifacts by motion according to reconstruction of a CT image includes circuitry configured to acquire a projection image of 360-degree scanning; calculate a motion amount using parameters by setting a motion model including the parameters; calculate a relative motion amount of a projection data from the projection data of the projection image and opposite data thereto; prepare a fixed-point equation including the motion amount and the relative motion amount; determine the parameters in the motion model by self-consistently solving the fixed-point equation; and correct the projection image using the motion amount.

IPC Classes  ?

• G06T 11/00 - 2D [Two Dimensional] image generation
• G06T 5/00 - Image enhancement or restoration

Abstract

The invention provides a sample holder arrangement (1) comprising (a) a sample holding part (3) and (b) a base part (30), wherein the sample holding part (3) comprises an open-ended tube (10), wherein the open-ended tube (10) comprises a first tube end (11) and a second tube end (19), wherein the open-ended tube (10) comprises a narrowing part (15), wherein in the narrowing part (15) an internal tube dimension reduces in a direction from the first tube end (11) to the second tube end (19), wherein a single crystal of a porous framework (20) is arranged within the open-ended tube (10) between the first tube end (11) and the second tube end (19), and wherein dimensions of the narrowing part (15) and dimensions of the single crystal of the porous framework (20) are chosen such that the single crystal of the porous framework (20) cannot escape from the open-ended tube (10) via the second tube end (19); and wherein the base part (30) is configured to host the sample holding part (3), wherein the sample holding part (3) is detachably associated to the base part (30).

IPC Classes  ?

• G01N 23/20025 - Sample holders or supports therefor
• G01N 23/207 - Diffractometry, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Abstract

In the present invention, at a time of high count X-ray measurement, measurement of a wave height value of an X-ray signal is carried out rapidly and with high precision, regardless of the type of X-ray detector and the circuit configuration of preamplifier. The present invention includes: an excitation source; an X-ray detector; a preamplifier that outputs an analog signal; an AD convertor that converts the analog signal to a digital signal; a signal detection unit that detects an incident timing; a waveform conversion unit that converts the digital signal into a step wave including a rising section and flat sections before and after the rising section; a waveform shaping unit that generates a shaping wave including a step or a peak; a wave height value measurement unit that measures a wave height value on the basis of the incident timing, the step, and the like; a learning unit that uses the incident timing to acquire a portion of the step wave including the rising section and that uses learning data including a plurality of sets of the acquired portion and the wave height value to generate a learning model that has learned correlations thereof; and a wave height value prediction unit that uses the incident timing to acquire a portion of the step wave from the newly converted step wave and that calculates a predicted wave height value on the basis of the acquired portion of the step wave and the learning model.

IPC Classes  ?

• G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
• G01T 1/36 - Measuring spectral distribution of X-rays or of nuclear radiation

Abstract

Provided are a quantitative analysis method, a quantitative analysis program, and an X-ray fluorescence. The quantitative analysis method includes: a step of acquiring a representative composition set to represent contents of analysis components; a step of acquiring a plurality of comparative compositions, in each of which the content of one of the analysis components of the representative composition is changed by a predetermined content; a detection intensity calculation step of calculating a detection intensity indicating an intensity of fluorescent X-rays detected under the influence of the geometry effect through use of an FP method with respect to a virtual sample having a thickness set in advance and being indicated by each of the representative composition and the comparative compositions; and a step of calculating a matrix correction coefficient for each of the analysis components based on the detection intensity.

IPC Classes  ?

• G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
• G01N 23/2208 - Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement all measurements being of secondary emission, e.g. combination of SE measurement and characteristic X-ray measurement

Abstract

An X-ray fluorescence spectrometer of the present invention includes: a determination module (21) configured to determine, with respect to every one of measurement lines that correspond to secondary X-rays having intensities to be measured, whether or not a ratio of a theoretical intensity in thin film calculated on the basis of an assumed thickness and known contents of respective components to a theoretical intensity in bulk calculated on the basis of the known contents of the respective components exceeds a predetermined threshold; and a saturation thickness quantification module (23) configured to, according to a positive determination by the determination module (21), calculate a saturation thickness with respect to each of the measurement lines, at which the theoretical intensity saturates, on the basis of the known contents of the respective components and to adopt a largest saturation thickness as a quantitative value of a thickness.

IPC Classes  ?

• G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Abstract

Provided are a correction device, a correction system, a correction method, and a correction program with which it is possible to reduce calculation cost for correcting an artifact due to a beam-hardening effect in reconstruction of a CT image. A correction device 400 for correcting an artifact due to a beam-hardening effect in reconstruction of a CT image, comprises: an incident X-ray distribution acquisition unit 410 that acquires an incident X-ray distribution; a linear absorption coefficient model acquisition unit 420 for acquiring a linear absorption coefficient model in which energy dependence of a linear absorption coefficient is expressed by a scale factor including a parameter; a projected image acquisition unit 430 that acquires a projected image; and a correction unit 440 that corrects the projected image by using the incident X-ray distribution and the linear absorption coefficient model.

IPC Classes  ?

• G01N 23/046 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
• G01T 7/00 - MEASUREMENT OF NUCLEAR OR X-RADIATION - Details of radiation-measuring instruments

Abstract

Provided are an information processing device, information processing method, and program that make visual quantitative assessment possible through the allocation of color or shading to measured values using a statistical method. This information processing device comprises: a measurement unit that measures a prescribed physical quantity in a given region of an object under measurement and acquires measured values in association with coordinates representing positions in the given region; a computation unit that calculates a statistical representative value and dispersion of the measured values and allocates the measured value of each coordinate to one of a plurality of classifications, which are based on the dispersion, according to the magnitude of the difference between the measured value and the representative value; and a display unit that displays the coordinates in display modes corresponding to the classifications.

IPC Classes  ?

• G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
• G01N 23/04 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material
• G01N 23/046 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
• G01N 23/205 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials using diffraction cameras
• G01T 7/00 - MEASUREMENT OF NUCLEAR OR X-RADIATION - Details of radiation-measuring instruments
• G06T 1/00 - General purpose image data processing

Abstract

The angle error estimating apparatus 310 comprises a storing section 315 for storing a series of projection data of an X-ray CT and control values of projection angles respectively associated with the projection data, a temporary correction section 330 for correcting the control values of the projection angles to temporary correction values with an error model using an assumed parameter, a temporary reconstruction section 332 for reconstructing a plurality of temporarily corrected images using the temporary correction values of the projection angles for each of different projection data sets composed of a part of the series of projection data, a consistency evaluating section 340 for evaluating consistency of the plurality of temporarily corrected images, and a parameter determining section 345 for determining an optimum parameter used for the error model based on the evaluated consistency.

IPC Classes  ?

• G06T 11/00 - 2D [Two Dimensional] image generation
• G01N 23/046 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
• G01N 23/083 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and measuring the absorption the radiation being X-rays

Abstract

Provided are a distribution calculation device, method, and program whereby the distribution of a physical value in a sample can be calculated from radiation CT data even when there are no calibration data obtained from a calibration sample. The present invention comprises a discrimination unit 340 for using radiation CT data obtained by measuring an object sample formed from a material having a single composition to discriminate between a region of the object sample and a region on the periphery of the object sample in the radiation CT data, a conversion coefficient calculation unit 370 for calculating a conversion coefficient for converting the luminance value of the object sample in each pixel of the region of the object sample to a mass density, and a distribution calculation unit 380 for using the conversion coefficient to calculate the distribution of a physical value in the object sample from the luminance values of the radiation CT data. By thus calculating a conversion coefficient using luminance values of an object sample formed from a material having a single composition, the distribution of a physical value in the object sample can be calculated from radiation CT data without a separately prepared calibration sample.

IPC Classes  ?

• G01N 23/046 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
• G01N 23/083 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and measuring the absorption the radiation being X-rays

Abstract

An X-ray fluorescence analysis device according to the present invention comprises a quantitative means (13) that uses the FP method, the quantitative means (13) executing: an intensity ratio instrument sensitivity curve creation step for creating an intensity ratio instrument sensitivity curve that is a correlation between a measured intensity ratio, which is the ratio of the measured intensity of the contrasting principal component to the measured intensity of a reference principal component, and a theoretical intensity ratio, which is the ratio of the theoretical intensity of the contrasting principal component to the theoretical intensity of the reference principal component; an intensity ratio conversion step for converting the measured intensity ratio into a theoretical intensity scale on the basis of the intensity ratio instrument sensitivity curve to obtain a converted measured intensity ratio; a content ratio update step for updating the content ratio, which is the ratio of the content of the contrasting principal component to the content of the reference principal component, on the basis of the converted measured intensity ratio; and a content update step for updating the content of each component on the basis of the latest content ratio.

IPC Classes  ?

• G01N 23/2209 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material using wavelength dispersive spectroscopy [WDS]
• G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Abstract

A quantitative analysis apparatus, a method, a program, and a manufacturing control system are provided. A WPPF section 320 for determining parameters of theoretical diffraction intensity by performing whole powder pattern fitting with respect to an X-ray diffraction profile to be analyzed, a scale factor acquiring section 325 for acquiring a scale factor of a test component among the determined parameters, a calibration curve storing section 350 for storing a calibration curve indicating a correlation between scale factors of the test component acquired with respect to a standard sample and content ratios of the test component in the standard sample, and a conversion section 370 for converting the scale factor of the test component acquired with respect to an objective sample into the content ratio of the test component in the objective sample using the stored calibration curve, are comprised.

IPC Classes  ?

• G01N 23/207 - Diffractometry, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
• G01N 23/2055 - Analysing diffraction patterns

Abstract

A measured pattern acquisition unit acquires a measured X-ray scattering pattern of a sample containing a target substance and another known mixed substance. A known pattern acquisition unit acquires a known X-ray scattering pattern of the other known mixed substance. A crystalline pattern acquisition unit at least partially acquires an X-ray diffraction pattern of a crystalline portion included in the target substance. A crystalline integrated intensity calculation unit calculates an integrated intensity for the acquired X-ray diffraction pattern of the crystalline portion. A target substance integrated intensity calculation unit calculates an integrated intensity for an X-ray scattering pattern of the target substance. A degree-of-crystallinity calculation unit calculates a degree of crystallinity of the target substance based on the integrated intensity for the X-ray diffraction pattern of the crystalline portion and the integrated intensity for the X-ray scattering pattern of the target substance.

IPC Classes  ?

• G01N 23/20 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials

Abstract

The present invention relates to a method for obtaining an x-ray CT image of a biological sample, and the like, said method including: a step for contrasting by causing a contrast medium that includes wax, that has a density of 0.95 g/cm3 or less in a state of having permeated a biological sample and hardened, and that has a melting point of 40-80°C, to permeate a biological sample and hardening said contrast medium; a step for melting and resolidifying the hardened contrast medium; and a step for irradiating the resolidified biological sample with x-rays having 4-12 keV of energy and acquiring an x-ray CT image. Moreover, said method is such that the shape of the biological sample is a shape for which the maximum optical path length of x-rays within the biological sample in the step for acquiring the x-ray CT image is 2 mm or less.

IPC Classes  ?

• G01N 23/046 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]

Abstract

Provided are an X-ray fluorescence spectrometer and a control method for an X-ray fluorescence spectrometer which are capable of preventing deterioration and breakage of a sample, and contamination of an inside of an apparatus even when an abnormality occurs in the X-ray fluorescence spectrometer. The X-ray fluorescence spectrometer includes: a measuring unit including: a moving mechanism configured to move a sample between a standby position and a measurement position; an X-ray source; a detector; and a first control unit; and an information processing unit including: an analysis unit; and a second control unit configured to control the measuring unit by communicating with the first control unit, the first control unit including retreat controller configured to perform retreat control for causing the moving mechanism to retreat the sample present at the measurement position to the standby position when communication between the first control unit and the second control unit is interrupted.

IPC Classes  ?

• G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
• G01N 23/2209 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material using wavelength dispersive spectroscopy [WDS]

Abstract

A tolerance error estimating apparatus, method, program, reconstruction apparatus and control apparatus capable of estimating a deviation of a drive axis from a reference position with respect to driving time are provided. A tolerance error estimating apparatus (processing apparatus 300) X-ray analysis apparatus comprises a specific position calculating section 320 for obtaining a specific position of a reference sample at each rotation driving time from X-ray detection images and a deviation amount calculating section 330 for calculating the deviation amount Δx in the x direction and Δy in the y direction of the center position of a rotation drive shaft as the rotation drive axis at each rotation driving time from the reference position based on the specific position, when the z direction of the orthogonal coordinate system fixed to the sample is set the direction parallel to the rotation drive axis.

IPC Classes  ?

• G06T 11/00 - 2D [Two Dimensional] image generation
• G01N 23/046 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
• G01N 23/083 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and measuring the absorption the radiation being X-rays

Abstract

This radiation measuring instrument comprises: a pair of support parts 110, 120 arranged so as to have a space therebetween in which a sample is to be placed; a frame 130 supported by the support parts 110, 120; an irradiation part 150 that is movably connected to the frame 130 and that emits radiation rays; and a detection part 170 that is movably connected to the frame 130 and that detects radiation rays scattered by a sample S1. The irradiation part 150 and the detection part 170 can move within the same plane with respect to the frame 130. Accordingly, it is possible to measure a large sample S1 at wide range of diffraction angles by using the space formed between the support parts 110, 120. Thus, measurement of diffraction on a low angle side is facilitated. Moreover, arrangement of respective parts is easy since the parts can be moved within the same plane.

IPC Classes  ?

• G01N 23/20008 - Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
• G01N 23/20 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials

Goods & Services

Downloadable and recorded computer programs, namely, downloadable and recorded computer operating software and downloadable and recorded software for data analysis for use with X ray analysis apparatus and thermal analyzers

Goods & Services

Downloadable and recorded computer programs, namely, downloadable and recorded computer operating software and downloadable and recorded software for data analysis for use with X ray analysis apparatus and thermal analyzers

Abstract

A structure for battery analysis of the present invention includes a pressurizing unit (30) having a pressurizing mechanism, and a pressure receiving unit (10) for receiving pressure acting on a sample battery (S), and pressurizes the sample battery (S) accommodated in a hollow portion of a battery accommodation unit (20) between the pressurizing unit (30) and the pressure receiving unit (10) to suppress expansion and contraction of the sample battery (S).

IPC Classes  ?

• G01N 23/207 - Diffractometry, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
• G01N 23/20041 - Sample holders or supports therefor for high pressure testing, e.g. anvil cells
• H01M 10/42 - Methods or arrangements for servicing or maintenance of secondary cells or secondary half-cells
• H01M 10/0525 - Rocking-chair batteries, i.e. batteries with lithium insertion or intercalation in both electrodes; Lithium-ion batteries