Abrégé

Provided are: a segmented crystal which can easily be manufactured, has little aberration, and can assume a large take-in angle; and an analyzer equipped with the segmented crystal. This segmented (100) diffracts X-rays generated from an X-ray source on a crystal plane and condenses the X-rays. The segmented crystal (100) comprises: a first crystal surface (111a) that is formed of spectroscopic crystals (111-113) along a Rowland circle; and second crystal surfaces (112a, 113a) that are formed of the spectroscopic crystals and are connected to the first crystal surface (111a). The second crystal surfaces (112a, 113a) are inclined with respect to the first crystal surface (111a).

Classes IPC  ?

• G21K 1/06 - Dispositions pour manipuler des particules ou des rayonnements ionisants, p. ex. pour focaliser ou pour modérer utilisant la diffraction, la réfraction ou la réflexion, p. ex. monochromateurs
• G01N 23/2273 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en mesurant l'effet photo-électrique, p. ex. microscopie d'émission photo-électronique [PEEM] en mesurant le spectre photo-électronique, p. ex. spectroscopie électronique pour l’analyse chimique [ESCA] ou spectroscopie photo-électronique par rayon X [XPS]

Abrégé

According to one embodiment of the present invention, a sample holder for radiation measurement comprises a placement part and a restriction part. The placement part comprises a placement surface on which a sample can be placed. The restriction part can be attached to and detached from the placement surface and, when attached to the placement surface, comprises a restriction surface that extends from the placement surface along the direction perpendicular to the placement surface. The restriction surface extends continuously along at least a portion of an outer edge of the sample as placed on the placement surface and thereby forms a recess. The placement surface is a bottom surface of the recess, and the restriction surface is a side surface of the recess that is connected to the bottom surface.

Classes IPC  ?

• G01N 23/20025 - Porte-échantillons ou leurs supports
• G01N 23/207 - Diffractométrie, p. ex. en utilisant une sonde en position centrale et un ou plusieurs détecteurs déplaçables en positions circonférentielles
• H01L 21/683 - Appareils spécialement adaptés pour la manipulation des dispositifs à semi-conducteurs ou des dispositifs électriques à l'état solide pendant leur fabrication ou leur traitementAppareils spécialement adaptés pour la manipulation des plaquettes pendant la fabrication ou le traitement des dispositifs à semi-conducteurs ou des dispositifs électriques à l'état solide ou de leurs composants pour le maintien ou la préhension

Abrégé

This replacement mechanism replaces a capillary, which is located at a measurement position, during measurement by a transmission method using an X-ray diffraction apparatus. Holders are capable of holding, in one-to-one correspondence, a plurality of capillaries filled with samples. A first drive unit is capable of moving any of the plurality of capillaries to the measurement position. A second drive unit is capable of rotating a capillary located at the measurement position about an axis extending in the longitudinal direction of said capillary. The plurality of capillaries are held in a positional relationship that enables measurement by the transmission method, with 2θ in the range of 0-160°, of a sample filled in the capillary located at the measurement position.

Classes IPC  ?

• G01N 23/207 - Diffractométrie, p. ex. en utilisant une sonde en position centrale et un ou plusieurs détecteurs déplaçables en positions circonférentielles
• G01N 1/28 - Préparation d'échantillons pour l'analyse
• G01N 23/20025 - Porte-échantillons ou leurs supports

Abrégé

Provided are an analyzing device, system, method, and program for analyzing the inclination of a specimen surface. The analyzing device comprises: a two-dimensional profile acquiring unit that acquires a two-dimensional profile obtained by detecting laser light reflected or diffracted by a specimen surface; a line profile generating unit that, with respect to a first straight line in the two-dimensional profile along which a plurality of peaks are linearly arranged and a second straight line in the two-dimensional profile which is orthogonal to the first straight line and along which a plurality of peaks are linearly arranged, generates a first line profile obtained by integrating, in a direction perpendicular to the first straight line, a predetermined region including at least a part of each of the first straight line and the second straight line, and a second line profile obtained by integrating the predetermined region in a direction perpendicular to the second straight line; a reflection position determining unit that determines a reflection position of the two-dimensional profile on the basis of the first line profile and the second line profile; and an inclination calculating unit that calculates the inclination of the specimen surface on the basis of the reflection position.

Classes IPC  ?

• G01B 11/26 - Dispositions pour la mesure caractérisées par l'utilisation de techniques optiques pour mesurer des angles ou des cônesDispositions pour la mesure caractérisées par l'utilisation de techniques optiques pour tester l'alignement des axes
• G01N 23/20 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux
• G01N 23/201 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux en mesurant la diffusion sous un petit angle, p. ex. la diffusion des rayons X sous un petit angle [SAXS]
• G01N 23/20008 - Détails de construction des appareils d’analyse, p. ex. caractérisés par la source de rayons X, le détecteur ou le système optique à rayons XLeurs accessoiresPréparation d’échantillons à cet effet

Abrégé

According to one embodiment of the present invention, a steam generation device is provided, the steam generation device comprising: a vaporization part having a porous body; a liquid feed part configured to supply water to the porous body; and a heating part configured to heat the porous body such that a first temperature at a water inlet portion of the porous body is lower than a second temperature of a portion in the porous body at the downstream side from the inlet portion in the water flow direction.

Classes IPC  ?

• F22B 1/28 - Méthodes de production de vapeur caractérisées par le genre de chauffage dans des chaudières chauffées électriquement
• B01L 7/00 - Appareils de chauffage ou de refroidissementDispositifs d'isolation thermique
• F22B 35/00 - Systèmes de commande pour chaudières à vapeur
• F22D 11/00 - Alimentation en eau non prévue dans les autres groupes principaux
• G01N 17/00 - Recherche de la résistance des matériaux aux intempéries, à la corrosion ou à la lumière
• G01N 25/00 - Recherche ou analyse des matériaux par l'utilisation de moyens thermiques
• G01N 25/20 - Recherche ou analyse des matériaux par l'utilisation de moyens thermiques en recherchant la production de quantités de chaleur, c.-à-d. la calorimétrie, p. ex. en mesurant la chaleur spécifique, en mesurant la conductivité thermique

Abrégé

In this scanning fluorescent X-ray analysis device, a quantification means (13) creates a peak profile by performing, on a preliminary measurement sample (14), measurement for a prescribed measurement time at a prescribed number of measurement points in a prescribed scanning angle range based on a theoretical 2θ peak angle, calculates a theoretical standard deviation for the intensity of the peak profile from the peak profile and the prescribed measurement time, and obtains an optimum measurement time on the basis of a reference value for the 2θ peak angle of the peak profile, a high-angle-side limit value and a low-angle-side limit value based on the theoretical standard deviation, and the allowable width of the 2θ peak angle.

Classes IPC  ?

• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X

Abrégé

This solar slit includes: a plurality of slit pieces; a plurality of spacer pairs including a first spacer and a second spacer; and a frame body. The frame body includes a base part, a first slit piece restricting part, a second slit piece restricting part, and a first spacer restricting part for restricting movement of the first spacer inward in a width direction. The first spacer includes a first engagement part that engages with the first spacer restricting part.

Classes IPC  ?

• G21K 1/02 - Dispositions pour manipuler des particules ou des rayonnements ionisants, p. ex. pour focaliser ou pour modérer utilisant des diaphragmes, des collimateurs
• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X

Abrégé

A calculation apparatus for calculating a correlation function from a structural model comprises a structural model acquiring section for acquiring the structural model including a plurality of types of atoms in space, an atomic species setting section for setting a specific atomic species in the structural model, and a correlation function calculating section for calculating the correlation function that is a ratio between a first radial distribution function and a second radial distribution function, wherein the first radial distribution function is a radial distribution function between atoms of the specific atomic species and atoms of the specific atomic species, and the second radial distribution function is a radial distribution function between atoms of the specific atomic species and atoms of two or more types of atomic species including the specific atomic species.

Classes IPC  ?

• G06F 17/15 - Calcul de fonction de corrélation
• G06F 30/20 - Optimisation, vérification ou simulation de l’objet conçu

Abrégé

Provided are an X-ray inspection device and an X-ray inspection system that make it possible, with a single device, to observe a sample by using a detector suitable for various applications. The present invention comprises: an X-ray source that projects parallel X-rays onto a plate-shaped sample; a sample stage on which the sample is held; a plurality of detectors 286-288 that each have a different resolution and that detect a projection image of the X-rays that were transmitted through the sample; a switching mechanism 281 for switching the detectors 286-288; and adjustment mechanisms 283 that adjust the disposition of the detectors 286-288, independently for each of the detectors 286-288. Adjustment mechanisms 284a-284d make it possible to move each of the detectors 286-288 in a direction of approaching or separating from the sample, along the optical axis of the irradiated X-rays.

Classes IPC  ?

• G01N 23/04 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau et formant des images des matériaux
• G01N 23/044 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau et formant des images des matériaux en utilisant la laminographie ou la tomosynthèse

Abrégé

An X-ray inspection apparatus and an X-ray inspection system capable of observing a sample using a detector suitable for each application are provided in a single apparatus. An X-ray source for irradiating parallel X-rays with a plate-shaped sample, a sample stage for holding the sample, a plurality of detectors each having a different resolution and detecting a projection image of X-rays transmitted through the sample, a switching mechanism for switching the detectors, and an adjusting mechanism for adjusting an arrangement of each of the detectors independently are comprised, and the adjusting mechanism enables each of the detectors to move in a direction close to or away from the sample along an optical axis of the irradiated X-rays.

Classes IPC  ?

• G01N 23/044 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau et formant des images des matériaux en utilisant la laminographie ou la tomosynthèse
• G01N 23/083 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau et mesurant l'absorption le rayonnement consistant en rayons X
• G01N 23/20008 - Détails de construction des appareils d’analyse, p. ex. caractérisés par la source de rayons X, le détecteur ou le système optique à rayons XLeurs accessoiresPréparation d’échantillons à cet effet

Abrégé

A control apparatus, a Kratky block, a control method and a control program capable of suppressing parasitic scattering and GISAXS scattering caused by the Kratky block are provided. A control apparatus for controlling an X-ray analysis apparatus for a laboratory and acquiring an X-ray scattering image of a molecule with the size of the 1000 Å order comprises an arrangement condition setting section for setting an arrangement condition including an opening degree and a height of a Kratky block, an arrangement controlling section for controlling the Kratky block so as to satisfy the arrangement condition, a data acquiring section for acquiring detected X-ray intensity data in each controlled arrangement and an arrangement condition determining section for determining an arrangement condition inducing the smallest effect of scattering by the Kratky block based on the acquired X-ray intensity data.

Classes IPC  ?

• G01N 23/201 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux en mesurant la diffusion sous un petit angle, p. ex. la diffusion des rayons X sous un petit angle [SAXS]
• G01N 23/207 - Diffractométrie, p. ex. en utilisant une sonde en position centrale et un ou plusieurs détecteurs déplaçables en positions circonférentielles
• G21K 1/04 - Dispositions pour manipuler des particules ou des rayonnements ionisants, p. ex. pour focaliser ou pour modérer utilisant des diaphragmes, des collimateurs utilisant des diaphragmes à ouverture variable, des obturateurs, des hacheurs

Abrégé

A calculation apparatus, a calculation method, a program, and a machine-learning model generating method for inferring a lattice volume from a profile of X-ray powder diffraction includes an information acquiring section for acquiring information on the profile of X-ray powder diffraction and an inference section for inferring the lattice volume from the acquired information on the profile of X-ray powder diffraction, the inference section including a machine-learning model for inputting information on the profile of X-ray powder diffraction and outputting the inferred lattice volume.

Classes IPC  ?

• G01N 23/2055 - Analyse des diagrammes de diffraction
• G01N 23/20058 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux en mesurant la diffraction des électrons, p. ex. la diffraction d’électrons lents [LEED] ou la diffraction d’électrons de haute énergie en incidence rasante [RHEED]
• G06N 3/045 - Combinaisons de réseaux

Produits et services

Laboratory apparatus and instruments; measuring apparatus and instruments; testing apparatus not for medical purposes; calorimeters; computer software, recorded; downloadable computer software; industrial X-ray apparatus; X-ray apparatus not for medical purposes; X-ray diffraction apparatus not for medical use; X-ray fluorescence analyzers; electronic publications. Design of mechanical, electromechanical and optoelectronic apparatus and instruments; computer programming; technological advice relating to computers, and industrial machines for use with X-ray analysis apparatus.

Abrégé

Measurement can be performed even when spaces divided by a partition film have a pressure difference therebetween, and the partition film is easily extended without causing warping and wrinkles. Provided is an X-ray fluorescence spectrometer, which includes: an irradiation chamber; and a sample chamber, the X-ray fluorescence spectrometer including: a window frame holding member; and a window frame member, which is configured to hold a partition film. The window frame member includes: an inner film holding member including a peripheral wall extending from a proximal end; and an outer film holding member, the outer film holding member being configured to be inserted from the distal end of the inner film holding member to be mounted to the proximal end of the inner film holding member so as to fix a surrounding of the part of the partition film to the inner film holding member.

Classes IPC  ?

• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X

Abrégé

To prevent an intensity of fluorescent X-rays to be detected from being reduced, to achieve high analytical accuracy and short measurement time, provided is an X-ray fluorescence spectrometer, which includes: a sample chamber in which a sample is to be arranged; and an irradiation chamber divided from the sample chamber by a partition wall, the X-ray fluorescence spectrometer including: an X-ray source arranged in the irradiation chamber; window frame member configured to hold a partition film; and a film supporting member having an elongated hole for allowing the X-rays to pass therethrough, the film supporting member being arranged adjacent to the irradiation chamber side of the partition film to support the partition film. In plan view as viewed from the sample chamber side toward the irradiation chamber side, the film supporting member is arranged so that the elongated hole is parallel to an optical axis of the X-rays.

Classes IPC  ?

• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X

Abrégé

In an automatic setting by an X-ray fluorescence spectrometer of the present invention, overlap correction coefficients are limited to negative values, and absorption/excitation correction coefficients are such that, in a case where standard samples do not contain components capable of exciting analytical lines, the absorption/excitation correction coefficients for all correction components are limited to positive values, theoretical intensities of fluorescent X-rays to be generated from samples of which compositions have been assumed are calculated, theoretical matrix correction coefficients are obtained on the basis of the theoretical intensities, and a numerical value obtained by multiplying each theoretical matrix correction coefficient by a predetermined number is, in a case of a positive numerical value, set as an upper limit value of the absorption/excitation correction coefficient or is, in a case of a negative numerical value, set as a lower limit value of the absorption/excitation correction coefficient, to perform multiple regression calculation.

Classes IPC  ?

• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X

Abrégé

Provided are an X-ray fluorescence analysis method and a sample pouch cell that enable measurement of a liquid sample, and radiation of X-rays while avoiding air bubbles formed during measurement. The sample pouch cell is a sample pouch cell for a liquid sample, which is to be arranged upright in a side-irradiation type X-ray fluorescence spectrometer. The sample pouch cell includes: a first resin film, which is arranged on a side to which primary X-rays are radiated; and a second resin film bonded to the first resin film in a region excluding an inlet for the liquid sample.

Classes IPC  ?

• G01N 23/2204 - Supports d’échantillons à cet effetMoyens de transport des échantillons à cet effet
• G01N 1/10 - Dispositifs pour prélever des échantillons à l'état liquide ou fluide
• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X

Abrégé

In an X-ray fluorescence spectrometer of the present invention, a quantification unit causes a displaying unit to display, as a quantitative-value theoretical standard deviation regarding an analytical component, a difference between a first quantitative value of the analytical component based on measured intensities regarding respective components and a second quantitative value of the analytical component obtained by causing, in calibration curve equations for the respective components, the measured intensities regarding the respective components to fluctuate in a direction in which change in the content of the analytical component increases.

Classes IPC  ?

• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X
• G01N 23/2209 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en utilisant la spectroscopie dispersive en longueur d’onde [WDS]

Abrégé

The present invention reduces the effect that precipitation of a degradable component has on a measurement result while suppressing any increase in manufacturing cost. Provided is a fluorescent X-ray analysis system comprising a rotation mechanism that causes a sample cell to rotate and a speed control unit that controls the rotation speed of the rotation mechanism, the fluorescent X-ray analysis system operating in operation modes including: a non-agitation measurement mode in which a detector performs measurement while the rotation mechanism is rotating at a constant speed under the control of the speed control unit; and an agitation measurement mode including an agitation period in which a liquid sample is agitated due to the speed control unit causing the rotation mechanism to rotate at a rotation speed at which a change occurs, and a post-agitation measurement period in which the detector performs measurement after the liquid sample has been agitated. A liquid sample cell accommodates the liquid sample and includes a portion in which the cross section of an accommodation space parallel to the lower surface is not a circle centered on the rotation axis of the sample cell.

Classes IPC  ?

• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X
• G01N 23/2204 - Supports d’échantillons à cet effetMoyens de transport des échantillons à cet effet

Abrégé

In an X-ray fluorescence spectrometer of the present invention, a quantification unit calculates a lower limit of detection on the basis of a calibration curve equation including an absorption/excitation correction term and an overlap correction term.

Classes IPC  ?

• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X
• G01N 23/2209 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en utilisant la spectroscopie dispersive en longueur d’onde [WDS]

Abrégé

Provided is a sample holder which facilitates replacement work of a sample by using a resin member, and that can suppress deterioration of the resin member due to X-rays. The sample holder for X-ray fluorescence analysis includes: a cylindrical member; a saucer; an elastic member; a resin member, which includes a bow part; and a bottom plate. The cylindrical member, the saucer, and the bottom plate are each made of a metal. The bow part includes a claw portion and a pressed portion. The cylindrical member includes a fitting portion and an exposure portion. The claw portion fit to the fitting portion. The pressed portion exposed to an outside through the exposure portion. The resin member is arranged between the saucer and the bottom plate, and portions of the resin member other than the pressed portion are surrounded by the cylindrical member, the saucer, and the bottom plate.

Classes IPC  ?

• G01N 23/2204 - Supports d’échantillons à cet effetMoyens de transport des échantillons à cet effet
• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X

Produits et services

(1) Laboratory apparatus and instruments for thermal analysis; measuring and testing machines and instruments, namely, thermogravimetric analyzers and differential thermal analyzers for the measurement, monitoring and evaluation of materials subjected to thermal changes; measuring and testing machines and instruments, namely, electronic and electro-technical thermobalance for the measurement of mass change under different atmospheres; calorimeters; differential scanning calorimeters; recorded and downloadable computer programs for operating thermal, thermo-mechanical, calorimetric and thermogravimetric measuring instruments; recorded and downloadable computer programs for monitoring and diagnosing thermal, thermo-mechanical, calorimetric and thermogravimetric measuring instruments.

Produits et services

Measuring and testing machines and instruments, namely, thermogravimetric analyzers and differential thermal analyzers for the measurement, monitoring and evaluation of materials subjected to thermal changes; measuring and testing machines and instruments, namely, electronic and electro-technical thermobalance for the measurement of mass change under different atmospheres; calorimeters; differential scanning calorimeters; recorded and downloadable computer programs for operating thermal, thermo-mechanical, calorimetric and thermogravimetric measuring instruments; recorded and downloadable computer programs for monitoring and diagnosing thermal, thermo-mechanical, calorimetric and thermogravimetric measuring instruments

Produits et services

Testing apparatus not for medical purposes, namely, electro-optical apparatus for analyzing chemical composition and structural properties of industrial and scientific materials; calorimeters; downloadable and recorded computer operating software and downloadable and recorded software for data analysis for use with X-ray analysis apparatus; industrial X-ray apparatus; X-ray analyzing apparatus for industrial use, namely, X-ray diffractometers not for medical purposes; X-ray apparatus not for medical purposes; X-ray diffraction apparatus not for medical use; X-ray fluorescence analyzers Design of mechanical, electromechanical and optoelectronic apparatus and instruments; computer programming for data analysis for use with X-ray analysis apparatus; technological advice relating to computers, and industrial machines for use with X-ray analysis apparatus

Produits et services

(1) Measuring apparatus and instruments, namely, X-ray analysis apparatus; testing apparatus not for medical purposes, namely, electro-optical apparatus for analyzing chemical composition and structural properties of industrial and scientific materials; calorimeters; downloadable and recorded computer operating software and downloadable and recorded software for data analysis for use with X-ray analysis apparatus; industrial X-ray apparatus; X-ray diffraction apparatus not for medical use; X-ray fluorescence analyzers; electronic publications. (1) Design of mechanical, electromechanical and optoelectronic apparatus and instruments; computer programming for data analysis for use with X-ray analysis apparatus; technological advice relating to computers, and industrial machines for use with X-ray analysis apparatus.

Abrégé

An information processing system is provided, including circuitry configured to: acquire projection data representing an X-ray CT projection image related to an object to be measured and an absorption model related to a mode of absorption of X-rays by the object, the projection data including information on the projection image(s) corresponding to azimuths where incident X-rays are applied to the object; generate corrected projection data for each candidate of hypothetical incident X-rays, the corrected projection data being the projection data in which correction on the basis of the candidate of hypothetical incident X-rays and the absorption model is performed; calculate a consistency index indicating a degree of consistency of the corrected projection images corresponding to the azimuths for each of the corrected projection data generated; and an output unit configured to output, on the basis of the consistency index, at least one piece of the corrected projection data generated.

Classes IPC  ?

• G06T 11/00 - Génération d'images bidimensionnelles [2D]

Abrégé

The present invention provides a top-irradiating X-ray fluorescence analyzer in which a holder conveyor can directly lift a sample holder loaded with a sample in a loading machine. This top-irradiating X-ray fluorescence analyzer comprises: a holder conveyor that lifts up and conveys a sample holder to a preparation position, the sample holder having a receiving tray, a frame body, and a biasing member that biases the receiving tray upward; a holder receptacle installed within the conveyance range of the holder conveyor; a sample transfer mechanism that transfers a sample conveyed by a sample conveyor extending between the outer and inner sides of the conveyance range of the holder conveyor onto the receiving tray of the sample holder placed in the holder receptacle; and a pushdown mechanism having an arm pivotally supported to allow the arm to rotate between a pushdown position where the arm pushes the receiving tray downward and a retracted position where the arms avoids interfering with the holder conveyor. When the arm is at the pushdown position, the sample transfer mechanism moves the sample over the receiving tray, and when the arm is at the retracted position, the holder conveyor lifts up the sample holder.

Classes IPC  ?

• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X
• G01N 23/2204 - Supports d’échantillons à cet effetMoyens de transport des échantillons à cet effet
• G01N 35/04 - Détails du transporteur

Abrégé

Provided is an X-ray analysis system in which it is possible to readily move a sample between a sample conveyance mechanism and a holder receiver, while having a simple and compact configuration. The present invention is an X-ray analysis system including: a holder receiver; a sample conveyance mechanism in which a sample is disposed and that conveys the sample from a first position to a second position close to the holder receiver; a sample movement mechanism that moves the sample between the second position and a sample holding position; a first inclined part that is disposed between the second position and the holder receiver, that is provided in an end section on the first sample conveyance mechanism side, and that gradually becomes higher toward the holder receiver side; and a sample bridge that is provided on the holder receiver side of the first inclined part so as to be contiguous with the first inclined part and that is provided with a support part for supporting the sample. When the sample is pushed out to the holder receiver side, an end section of the sample on the sample holder side abuts on the first inclined part and then slides on the first inclined part to reach a first support part. Furthermore, when the sample is pushed out from a position on the first support part to the second position side, the end section of the sample is placed directly on the first sample conveyance mechanism.

Classes IPC  ?

• G01N 23/2204 - Supports d’échantillons à cet effetMoyens de transport des échantillons à cet effet
• G01N 23/207 - Diffractométrie, p. ex. en utilisant une sonde en position centrale et un ou plusieurs détecteurs déplaçables en positions circonférentielles
• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X
• G01N 23/20025 - Porte-échantillons ou leurs supports

Abrégé

Provided is an x-ray fluorescence spectrometer. When a partition wall (10) has been closed, a sample chamber (1) and an irradiation chamber (2) are substituted with nitrogen, and a spectral chamber (3) is evacuated. A sample (4) is placed in the sample chamber (1) after the substitution is complete, and in response to an instruction from an operator, measurement is performed in a wait mode in which the sample (4) is irradiated with primary x-rays (6) and measurement begins after a prescribed amount of time has passed or a non-wait mode in which the sample (4) is irradiated with the primary x-rays (6) and measurement begins immediately. The prescribed amount of time of the wait mode is the amount of time, found in advance, until the ratio of the measurement intensity to a final arrival measurement intensity for x-ray fluorescence (8) of a prescribed wavelength becomes equal to or greater than a prescribed numerical value or is the amount of time until the ratio of the change in a preliminary measurement intensity to the preliminary measurement intensity for x-ray fluorescence (8) of a prescribed wavelength during preliminary measurement immediately after the sample (4) is irradiated with the primary x-rays (6) becomes equal to or less than a prescribed numerical value.

Classes IPC  ?

• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X
• G01N 23/2209 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en utilisant la spectroscopie dispersive en longueur d’onde [WDS]

Abrégé

A system capable of calculating a structure factor of a thin film formed on a substrate includes a measurement data acquiring section, a total scattering data calculating section, and a structure factor calculating section. The processing apparatus is configured to be capable of calculating a structure factor of a film formed on a substrate. The total scattering data calculating section acquires first total scattering data Isp and second total scattering data Isub from the measurement data acquiring section, and calculates total scattering data ITF of only a film portion based thereon. The total scattering data ITF of only the film portion is determined by subtracting a product of the second total scattering data Isub and an absorption factor Asub of the substrate from the first total scattering data Isp.

Classes IPC  ?

• G01N 23/207 - Diffractométrie, p. ex. en utilisant une sonde en position centrale et un ou plusieurs détecteurs déplaçables en positions circonférentielles
• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X

Produits et services

Laboratory apparatus and instruments; measuring apparatus and instruments; testing apparatus not for medical purposes; computer software, recorded; downloadable computer software; industrial X-ray apparatus; X-ray apparatus not for medical purposes; X-ray diffraction apparatus not for medical use; electronic publications.

Abrégé

A processing apparatus for performing non-negative matrix factorization to measured profiles of X-ray powder diffraction includes a measured profile acquiring section for acquiring a plurality of measured profiles; a decomposition section for applying non-negative matrix factorization to the measured profiles and calculating base profiles; an index calculating section for acquiring the base profiles and calculating indexes based on unevenness of the base profiles; a base profile classifying section for classifying the base profiles into a plurality of groups based on the indexes; and a base profile correcting section for performing correction based on the indexes on at least one of the plurality of groups and calculating a corrected base profile.

Classes IPC  ?

• G01N 23/2055 - Analyse des diagrammes de diffraction
• G01N 23/207 - Diffractométrie, p. ex. en utilisant une sonde en position centrale et un ou plusieurs détecteurs déplaçables en positions circonférentielles

Abrégé

A configuration is provided such that slit members 51 having slits can be moved by a slit-moving mechanism 60. The slit members 51 are moved by the slit-moving mechanism 60, so that the slits are arranged at positions near an inspection region of a sample held by a sample holding part. For example, during the replacement of the sample, the slit members 51 are retracted from the positions near the inspection region of the sample.

Classes IPC  ?

• G01N 23/201 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux en mesurant la diffusion sous un petit angle, p. ex. la diffusion des rayons X sous un petit angle [SAXS]
• G01N 23/20008 - Détails de construction des appareils d’analyse, p. ex. caractérisés par la source de rayons X, le détecteur ou le système optique à rayons XLeurs accessoiresPréparation d’échantillons à cet effet
• H01L 21/66 - Test ou mesure durant la fabrication ou le traitement

Produits et services

Laboratory apparatus and instruments; measuring apparatus and instruments; testing apparatus not for medical purposes; semiconductor testing apparatus; industrial X-ray apparatus; X-ray apparatus not for medical purposes; X-ray diffraction apparatus not for medical use; X-ray fluorescence analyzers.

Abrégé

A morphological analysis apparatus, a morphological analysis method and a morphological analysis program, which make it possible to recognize a morphology of a component of a molecule, are provided. A morphological analysis apparatus for analyzing a morphology of a molecule in a solution, comprises a reference data storing section for storing reference data which is molecular shape data of a subject molecule specified in advance, a subject data storing section for storing subject data which is molecular shape data of the subject molecule to be analyzed, and a morphological estimation section for estimating a morphology of a component of a molecule in the subject data by specifying a state of a physical quantity constituting a molecular shape of the subject data with respect to the reference data, wherein the reference data and the subject data each have a resolution of a molecular level.

Classes IPC  ?

• G16B 15/20 - Repliement de protéines ou de domaines
• G16B 40/00 - TIC spécialement adaptées aux biostatistiquesTIC spécialement adaptées à l’apprentissage automatique ou à l’exploration de données liées à la bio-informatique, p. ex. extraction de connaissances ou détection de motifs

Produits et services

Testing apparatus not for medical purposes, namely, electro-optical apparatus for analyzing chemical composition and structural properties of industrial and scientific materials; downloadable and recorded computer operating software and downloadable and recorded software for data analysis for use with X-ray analysis apparatus; industrial X-ray apparatus; X-ray analyzing apparatus for industrial use, namely, X-ray diffractometers, not for medical purposes; X-ray apparatus not for medical purposes; X-ray diffraction apparatus not for medical use.

Abrégé

Provided are a profile generation device, method, and program that can allow sampling (adaptive hyper sampling) set at arbitrary intervals instead of regular intervals and can improve a resolution or a S/N ratio, while maintaining a short distance between a sample and a detector. A profile generation device 200 for generating an X-ray scattering profile by performing sampling on X-ray scattering intensity data obtained by a pixel array detector comprises: a sampling position setting unit 223 for setting a plurality of sampling positions that are not at regular intervals in the wave number direction of a scattering vector on the basis of a specific relationship; a data extraction unit 225 for extracting intensity data in pixels overlapping the set sampling positions; and a profile generation unit 227 for generating a profile plotted on the basis of the extracted intensity data.

Classes IPC  ?

• G01N 23/201 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux en mesurant la diffusion sous un petit angle, p. ex. la diffusion des rayons X sous un petit angle [SAXS]

Abrégé

The present invention calculates, on the basis of objective standards, a scaling value that should be reproducible and theoretically-expected, and generates subtraction data as sample solution data for structure analysis. The present invention comprises: a scaling area setting unit 232 which sets a wave number range of a specific scattering vector as a scaling area excluding a data area in which information on a sample emerges; a matching degree evaluation unit 237 which evaluates, on the basis of specific evaluation standards and by using an X-ray scattering profile in the scaling area, the matching degree between an X-ray scattering profile of a sample solution and an X-ray scattering profile of a buffer solution which has been scaled on the basis of a scaling value k; an optimal value identification unit 239 which identifies an optimal value for the scaling value k on the basis of the evaluation of the matching degree; and a difference calculation unit 255 which performs, by using the optimal value, difference calculation in which the X-ray scattering profile of the buffer solution which has been scaled on the basis of the scaling value k is subtracted as a background from the X-ray scattering profile of the sample solution.

Classes IPC  ?

• G01N 23/20 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux

Abrégé

The present invention stably optimizes resolution obtained by upsampling on the basis of a perturbation factor in resolution improvement. The present invention is provided with: a relative position calculation unit 213 that calculates a plurality of relative positions between a detector and a beam stepped at travel increments smaller than the pixel size; a relative position control unit 214 that controls the plurality of relative positions by moving and stopping the beam or the detector; a measurement data storage unit 217 that stores X-ray scattering data acquired by the detector at each of the controlled relative positions; a data conversion unit 223 that generates intensity profiles on the basis of the acquired X-ray scattering data; an index calculation unit 232 that calculates, as a formal qmin, a parameter based on the wavenumber of the smallest scattering vector in which data having a statistical significance is present on each of the generated intensity profiles; and a setting identification unit 234 that identifies, as a suitable position, a relative position that gives the maximum value among the calculated formal qmin values.

Classes IPC  ?

• G01N 23/201 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux en mesurant la diffusion sous un petit angle, p. ex. la diffusion des rayons X sous un petit angle [SAXS]

Produits et services

Laboratory apparatus and instruments; measuring apparatus and instruments; testing apparatus not for medical purposes; semiconductor testing apparatus; computer software, recorded; downloadable computer software; industrial X-ray apparatus; X-ray apparatus not for medical purposes; X-ray diffraction apparatus not for medical use; electronic publications.

Abrégé

Provided are a structure evaluation method, a structure evaluation device, and a structure evaluation program with which it is possible to distinguish between diffracted X-rays generated for each region and evaluate respective structures. A structure evaluation method performed by measuring diffracted X-rays transmitted through a sample includes a step for simultaneously irradiating a plurality of regions of a large sample S11 in a single-crystal state with a white X-ray R11, and a step for detecting a diffracted X-ray produced by the irradiation. A measurement composed of the series of steps is performed a plurality of times. In at least one of the plurality of measurements, a slit 11 that selectively passes only a diffracted X-ray produced in a specific region among a plurality of regions C11, C12 irradiated with the X-ray is arranged on the back side of the large sample S10. Diffracted X-rays produced in the plurality of regions C11, C12 of the large sample S10 are each detected by using the slit 11, and the structure is evaluated for each of the regions.

Classes IPC  ?

• G01N 23/205 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux en utilisant des caméras de diffraction

Abrégé

Provided are a position identification method, a position identification device, and a position identification program capable of identifying, from a change in an obtained diffraction image, the position of a structure that becomes a cause of damage such as a crack in a sample in a single-crystal state. This position identification method for identifying the position of a target structure in a sample comprises: a step for vertically irradiating the surface of a sample S1 in a single-crystal state with white X-rays R10; a step for acquiring a diffraction image generated by irradiation; and a step for moving the position of irradiation on the surface of the sample S1. With the method, a parallel position of the target structure is identified on the basis of diffraction images acquired by repeatedly performing the series of steps from the vertical irradiation to the movement.

Classes IPC  ?

• G01N 23/205 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux en utilisant des caméras de diffraction

Produits et services

Testing apparatus not for medical purposes, namely, electro-optical apparatus for analyzing chemical composition and structural properties of industrial and scientific materials; semiconductor testing apparatus; industrial X-ray apparatus; X-ray apparatus not for medical purposes; X-ray diffraction apparatus not for medical use; X-ray fluorescence analyzers.

Abrégé

[Problem] To provide a technique that makes it possible to generate a trained model from acquired measurement data and perform inference using the same data. [Solution] According to one aspect of the present invention, an information processing system is provided. This information processing system comprises a learning unit and an inference unit. The learning unit inputs a first reconstructed image and a second reconstructed image to a learning model to generate a trained model in which the second reconstructed image is output when the first reconstructed image is input. Each of the first reconstructed image and the second reconstructed image is an image reconstructed on the basis of any one of a plurality of projection images included in the measurement data. The inference unit inputs a third reconstructed image to the trained model to acquire an output image, which is an image to be output. The third reconstructed image is an image reconstructed on the basis of any one of the plurality of projection images included in the measurement data.

Classes IPC  ?

• G06N 20/00 - Apprentissage automatique
• A61B 6/03 - Tomographie informatisée
• G06T 7/00 - Analyse d'image
• G06V 10/82 - Dispositions pour la reconnaissance ou la compréhension d’images ou de vidéos utilisant la reconnaissance de formes ou l’apprentissage automatique utilisant les réseaux neuronaux

Abrégé

The present invention is provided with a sample stage 11 for arranging a sample and a sample stage 10 including a sample stage moving mechanism 12 for moving the sample stage 11, and a goniometer 20 including first and second rotating arms 22 and 23 rotating independently. X-ray irradiation units 20, 30 for irradiating the surface of the sample with X-rays are mounted on the first rotating arm 22. An X-ray detection unit 60 for detecting X-rays diffracted or reflected from the sample is mounted on the second rotating arm 23. The goniometer 20 is further provided with a balancer 28 for adjusting the position of the center of gravity of the goniometer 20, and a center-of-gravity position adjusting mechanism 29 for maintaining the position of the center of gravity of the goniometer 20 adjusted by the balancer 28.

Classes IPC  ?

• G01N 23/20016 - Goniomètres
• H01L 21/66 - Test ou mesure durant la fabrication ou le traitement

Abrégé

A sample is irradiated with X-rays, and the X-rays diffracted or reflected from the sample are detected by an X-ray detection unit 60. The X-ray detection unit 60 includes a two-dimensional X-ray detector 61 and a light reception-side optical component automatic selection mechanism 70. The light reception-side optical component automatic selection mechanism 70 has a function for selecting a plurality of light reception-side optical components 62 to 65, automatically arranging each light reception-side optical component at a position in front of the two-dimensional X-ray detector 61, and automatically withdrawing each of the light reception-side optical components from the position.

Classes IPC  ?

• G01N 23/20008 - Détails de construction des appareils d’analyse, p. ex. caractérisés par la source de rayons X, le détecteur ou le système optique à rayons XLeurs accessoiresPréparation d’échantillons à cet effet
• H01L 21/66 - Test ou mesure durant la fabrication ou le traitement

Produits et services

Laboratory apparatus and instruments; measuring apparatus and instruments; testing apparatus not for medical purposes; computer software, recorded; downloadable computer software; downloadable and recorded computer software for computed tomography (CT) scanners; industrial X-ray apparatus; industrial use X-ray analyzing apparatus, namely, X-ray diffractometer not for medical purposes; X-ray apparatus not for medical purposes.

Abrégé

The present invention is provided with: a sample stage 10 including a sample stand 11 on which a sample is placed, and a sample stand moving mechanism 12 for moving the sample stand 11; and a goniometer 20 including first and second turning arms 22, 23 that turn independently. The first turning arm 22 has attached thereto a condensed X-ray irradiation unit 30 for irradiating the surface of the sample with a condensed X-ray. The second turning arm 23 has attached thereto an X-ray detection unit 60 for detecting the X-ray diffracted or reflected by the sample. Furthermore, the first turning arm 22 has incorporated therein an irradiation unit movement adjustment mechanism 50 for moving, on the first turning arm 22, the condensed X-ray irradiation unit 30.

Classes IPC  ?

• G01N 23/20016 - Goniomètres
• H01L 21/66 - Test ou mesure durant la fabrication ou le traitement

Produits et services

Testing apparatus not for medical purposes, namely, electro-optical apparatus for analyzing chemical composition and structural properties of industrial and scientific materials; semiconductor testing apparatus; downloadable and recorded computer operating software and downloadable and recorded software for data analysis for use with X-ray analysis apparatus; industrial X-ray apparatus; X-ray analyzing apparatus for industrial use, namely, X-ray diffractometers, not for medical purposes; X-ray apparatus not for medical purposes; X-ray diffraction apparatus not for medical use

Abrégé

This X-ray photoelectron spectrometer is provided with a sample stage 1 having a movement range such that the whole surface of a semiconductor wafer having a diameter of 300 mm or more can be inspected, and an X-ray optical device 2 having the configuration herein described. The X-ray optical device 2 includes a rotating anticathode X-ray source 20 and an X-ray optical system 30 as components. The X-ray optical system 30 extracts X-rays having a specific bandwidth through used of a flat crystal optical system 32 from X-rays collimated by a collimating optical system 31, condenses the X-rays having the specific bandwidth through use of a condensing optical system 33, and irradiates the surface of a semiconductor wafer.

Classes IPC  ?

• G01N 23/2273 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en mesurant l'effet photo-électrique, p. ex. microscopie d'émission photo-électronique [PEEM] en mesurant le spectre photo-électronique, p. ex. spectroscopie électronique pour l’analyse chimique [ESCA] ou spectroscopie photo-électronique par rayon X [XPS]

Produits et services

Laboratory apparatus and instruments; measuring apparatus and instruments; industrial X-ray apparatus; industrial use X-ray analyzing apparatus, namely, X-ray diffractometer not for medical purposes; X-ray analyzers, other than for medical use; X-ray scanners, other than for medical purposes.

Abrégé

An X-ray photoelectron spectroscopy of the present invention equipped with a sample stage (1) having a movable range where it is possible to inspect the entire surface of a semiconductor wafer having a diameter of 300 mm or more, including an X-ray optical device (2) that is configured to include a rotating anode type X-ray source (20) and an X-ray optical system (30) as components, the X-ray optical system (30) being configured such that X-rays of a specific bandwidth from X-rays collimated by a collimating optical system (31) are extracted by a planar crystal optical system (32), and the X-rays of the specific bandwidth are focused by a focusing optical system (33) to irradiate the surface of the semiconductor wafer with the X-rays.

Classes IPC  ?

• G01N 23/2273 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en mesurant l'effet photo-électrique, p. ex. microscopie d'émission photo-électronique [PEEM] en mesurant le spectre photo-électronique, p. ex. spectroscopie électronique pour l’analyse chimique [ESCA] ou spectroscopie photo-électronique par rayon X [XPS]
• H01J 35/10 - Anodes tournantesDispositions pour anodes tournantesRéfrigération des anodes tournantes
• H01J 35/14 - Dispositifs de concentration, de focalisation ou d'orientation du rayon cathodique

Abrégé

According to one aspect of the present invention, an information processing system is provided. The information processing system includes one or more processors. Each of the processors is configured to execute a program so that each of the following steps is performed. In an acquisition step, target measurement data indicating a result of measurement using X-rays for a sample to be analyzed, and one or more items of reference data are acquired. In a designation acceptance step, designation of the reference data is accepted. In a setting step, an objective function to be used when non-negative matrix factorization is performed is set on the basis of the designation, the objective function including a linear combination of one or more variable bases and one or more fixed bases. Each of the fixed bases corresponds to the designated reference data. The component of each of the variable bases is set to serve as a variable parameter when the non-negative matrix factorization is performed. The component of each of the fixed bases is set to serve as a fixed parameter when the non-negative matrix factorization is performed.

Classes IPC  ?

• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X
• G01N 23/085 - Structure fine d’absorption des rayons X [XAFS], p. ex. XAFS étendue [EXAFS]
• G01N 23/2273 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en mesurant l'effet photo-électrique, p. ex. microscopie d'émission photo-électronique [PEEM] en mesurant le spectre photo-électronique, p. ex. spectroscopie électronique pour l’analyse chimique [ESCA] ou spectroscopie photo-électronique par rayon X [XPS]
• G06F 17/15 - Calcul de fonction de corrélation

Abrégé

Provided are a notification device, a notification method, and a notification program that facilitate replacement management of a component of an X-ray generation unit included in an X-ray analysis device. This notification device 200 for notifying component replacement recommendation information comprises: an information storage unit 230 that stores information on a measurement value with respect to a target component included in an X-ray analysis device; a state determination unit 240 that determines, from information on the measurement value, whether the current state of the target component requires notification of replacement recommendation information for recommending replacement of the component; and a notification unit 250 that notifies the replacement recommendation information when it is determined that the current state of the target component requires notification of the replacement recommendation information. Examples of the target component are a filament, a target, and a shutter.

Classes IPC  ?

• H05G 1/26 - Mesure, commande ou protection
• G01N 23/20008 - Détails de construction des appareils d’analyse, p. ex. caractérisés par la source de rayons X, le détecteur ou le système optique à rayons XLeurs accessoiresPréparation d’échantillons à cet effet

Abrégé

According to an aspect of the present disclosure, an information processing system for processing a plurality of projection images taken by a CT device is provided. The information processing system includes a feature value acquisition unit, a spectral decomposition unit, and a synchronization processing unit. The feature value acquisition unit is configured to acquire waveform data, the waveform data being indicated as feature values obtained from each of the plurality of projection images. The spectral decomposition unit is configured to acquire decomposed waveform data by applying a predetermined analytical method to the waveform data, the decomposed waveform data being data of a waveform obtained by decomposing the waveform data. The synchronization processing unit is configured to determine a projection image to be used for reconstruction from among the plurality of projection images based on the waveform indicated by the decomposed waveform data.

Classes IPC  ?

• G06T 11/00 - Génération d'images bidimensionnelles [2D]

Abrégé

Provided is a structure for battery analysis in which an all-solid-state battery is used as a sample battery, wherein even higher airtightness is achieved in order to shield the sample battery S accommodated within a hollow part of a battery accommodation unit 20 from the atmosphere. Specifically, a route indicated by arrows leading from an X-ray window 11 to the sample battery S via a space between a partition member 12 and the inner wall of the battery accommodation unit 20 around the X-ray window 11 is shielded (second airtight structure) by providing an O-ring 51a (airtight member) to a discretionary location on the route.

Classes IPC  ?

• G01N 23/20025 - Porte-échantillons ou leurs supports
• H01M 10/48 - Accumulateurs combinés à des dispositions pour mesurer, tester ou indiquer l'état des éléments, p. ex. le niveau ou la densité de l'électrolyte

Abrégé

According to an aspect of the present invention, a radiation measurement system is provided. This radiation measurement system comprises: an irradiation unit; a target placement unit; a detection unit; and a candidate placement unit. The irradiation unit is configured to irradiate a measurement target with radiation. The target placement unit is configured so that the measurement target can be placed within the irradiation range of the radiation. The detection unit is configured to detect the radiation having passed through the measurement target. The candidate placement unit is configured to be able to place a candidate for the measurement target, and is provided with a shaft part, a first support part, and a second support part. The shaft part extends along the axial direction, and is configured to be rotatable about a rotation axis along the axial direction. The first support part is configured to be rotatable in accordance with rotation of the shaft part, and is provided with a plurality of first support regions. Each of the first support regions supports the candidate for the measurement target, and is disposed along the outer peripheral edge of the first support part. The second support part is configured to be rotatable in accordance with the rotation of the shaft part, and is provided with a plurality of second support regions. Each of the second support regions supports the candidate for the measurement target, and is disposed along the outer periphery of the shaft part. The first support part and the second support part are disposed at positions separated in the axial direction.

Classes IPC  ?

• G01N 23/046 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau et formant des images des matériaux en utilisant la tomographie, p. ex. la tomographie informatisée

Abrégé

[Problem] To provide a technology that makes it possible to more appropriately fix a sample holder which is assumed to be turned around on a sample stage. [Solution] According to one aspect of the present invention, a sample holder is provided which is used for radiation measurement. This sample holder has a base part and a holding part. The base part is configured to rotate about a rotation axis thereof, and has a first surface and a second surface. The first surface is connected to the holding part. The second surface has a first recess and a second recess, and is located opposite to the first surface in a direction in which the rotation axis extends. The first recess is provided at a position on the rotation axis. The second recess is provided at a position offset from the rotation axis. The holding part is configured to be capable of holding a sample.

Classes IPC  ?

• G01N 23/02 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau
• G01N 23/20 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux
• G01N 23/20025 - Porte-échantillons ou leurs supports

Produits et services

Testing apparatus not for medical purposes, namely, electro-optical apparatus for analyzing chemical composition and structural properties of industrial and scientific materials; downloadable and recorded computer operating software and downloadable and recorded software for data analysis for use with X-ray analysis apparatus; downloadable and recorded computer software for computed tomography (CT) scanners; industrial X-ray apparatus; X-ray diffractometer, being an industrial X-ray apparatus, not for medical purposes; X-ray fluorescence analyzers not for medical purposes.

Produits et services

Industrial X-ray apparatus; industrial use X-ray analyzing apparatus, namely, X-ray diffractometer not for medical purposes; X-ray analyzers not for medical purposes.

Abrégé

According to an aspect of the present invention, an X-ray diffraction apparatus is provided. The X-ray diffraction apparatus comprises: an X-ray source configured to irradiate a sample with an X-ray; a sample stage configured to allow the sample to be disposed in such a manner that the X-ray is diffracted; a detector configured to detect a diffracted X-ray, which is the X-ray that has been diffracted, in one dimension at a detection strip; a slit member provided between the sample stage and the detector, comprising a slit through which the diffracted X-ray can pass; wherein an axis in a longitudinal direction of the slit is parallel to an axis in a longitudinal direction of the detection strip.

Classes IPC  ?

• G01N 23/207 - Diffractométrie, p. ex. en utilisant une sonde en position centrale et un ou plusieurs détecteurs déplaçables en positions circonférentielles
• G01N 23/20016 - Goniomètres
• G01N 23/20025 - Porte-échantillons ou leurs supports

Produits et services

Laboratory apparatus and instruments; measuring apparatus and instruments; testing apparatus not for medical purposes; semiconductor testing apparatus; computer software, recorded; X-ray tubes not for medical purposes; industrial X-ray apparatus; X-ray apparatus not for medical purposes; X-ray diffraction apparatus not for medical use; apparatus and installations for the production of X-rays, not for medical purposes.

Abrégé

In a case that a Bragg angle corresponding to the crystal lattice plane is referred to as θ, making an X-ray incident on the sample at a first incident angle @1 of θ−δ or more and θ+δ or less, measuring 1 or 2 peak positions of φ by measuring a diffracted X-ray intensity while rotating the sample in-plane with the φ as a central axis, making an X-ray incident on the sample at a second incident angle ω2 of θ−δ or more and θ+δ or less different from a first incident angle ω1, measuring 1 or 2 peak positions of ω by measuring a diffracted X-ray intensity while rotating the sample in-plane with the φ as a central axis, and calculating the δ from the ω1, the ω2 and the peak positions of the φ obtained by the measurement.

Classes IPC  ?

• G01N 23/201 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux en mesurant la diffusion sous un petit angle, p. ex. la diffusion des rayons X sous un petit angle [SAXS]
• G01N 23/20016 - Goniomètres
• G01N 23/20025 - Porte-échantillons ou leurs supports

Abrégé

A scanning-type wavelength-dispersive X-ray fluorescence spectrometer comprising two dispersive elements, said wavelength-dispersive X-ray fluorescence spectrometer comprising a control means (11) that, among a second rotation mechanism (8B) which rotates a second dispersive element (6B) and a third rotation mechanism (8C) which rotates a detector (7), controls at least the second rotation mechanism (8B) such that, during measurement, while changing the wavelength of fluorescent X-rays (4D) dispersed by the second dispersive element (6B), the dispersed fluorescent X-rays (4D) are incident on the detector (7).

Classes IPC  ?

• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X

Abrégé

Provided is an X-ray fluorescence spectrometer that achieves a uniform state on a back side of a thin sheet-shaped sample so as to prevent a difference in a measurement condition depending on a measurement position. The X-ray fluorescence spectrometer includes: a sample stage a background correction cover, which is arranged adjacent to an outer side of the sample stage so that a surface of the background correction cover is substantially flush with a surface of the sample stage; and a moving mechanism. The moving mechanism moves the background correction cover based on movement of the sample stage and, when the sample stage is absent on a back side of the sample at a measurement position, moves the background correction cover so that the background correction cover is located on the back side of the sample at the measurement position.

Classes IPC  ?

• G01N 23/2204 - Supports d’échantillons à cet effetMoyens de transport des échantillons à cet effet
• G01N 23/2209 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en utilisant la spectroscopie dispersive en longueur d’onde [WDS]
• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X

Abrégé

A semiconductor inspection apparatus, semiconductor inspection system, and semiconductor inspection method capable of locally inspecting a microstructure inside a semiconductor by obtaining an enlarged image with sufficient intensity with a size that can be stored in a laboratory are provided. A semiconductor inspection apparatus using an enlarged X-ray image comprises an X-ray source having a micro focus and high output, an X-ray irradiation unit having a condenser mirror for condensing and irradiating emitted X-rays toward a sample of semiconductor, a sample holder for holding the sample, a reflecting mirror type X-ray lens unit for forming an image with an X-ray transmitted through the sample and an imaging unit for acquiring the formed X-ray image, and each mirror constituting the condenser mirror and the reflecting mirror type X-ray lens unit has a reflective surface that is formed of a multilayer film having a high reflectivity for X-rays with a specific wavelength.

Classes IPC  ?

• G01N 23/083 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau et mesurant l'absorption le rayonnement consistant en rayons X

Abrégé

A calculation apparatus, a system, a method, and a program for simply estimating an orientation direction from a two-dimensional diffraction image and calculating a structural model of a polymer are provided. A calculation apparatus for calculating a structural model of a polymer comprises a data acquiring section for acquiring a two-dimensional diffraction image and crystal structure data, an initial structural model generating section for generating an initial structural model including one crystallite, and a crystallite direction calculating section for calculating a direction of the crystallite, wherein the direction of the crystallite is calculated based on a two-dimensional diffraction image calculated from the initial structural model and the measured two-dimensional diffraction image.

Classes IPC  ?

• G06F 30/27 - Optimisation, vérification ou simulation de l’objet conçu utilisant l’apprentissage automatique, p. ex. l’intelligence artificielle, les réseaux neuronaux, les machines à support de vecteur [MSV] ou l’apprentissage d’un modèle

Produits et services

Laboratory apparatus and instruments for X-ray analysis, namely, X-ray diffractometers not for medical purposes; measuring apparatus and instruments, namely, X-ray analysis apparatus not for medical purposes; testing apparatus not for medical purposes, namely, electro-optical apparatus for analyzing chemical composition and structural properties of industrial and scientific materials; semiconductor testing apparatus; recorded computer operating software and recorded software for data analysis for use with X-ray analysis apparatus; X-ray tubes not for medical use; industrial X-ray apparatus; X-ray analyzing apparatus for industrial use, namely, X-ray diffractometers not for medical purposes; X-ray apparatus not for medical purposes; X-ray diffraction apparatus not for medical use; apparatus and installations for the production of X-rays being X-ray apparatus, not for medical use

Abrégé

A method for collating and matching images of a same measurement point of a same biological sample captured by an X-ray microscope and a light microscope, the method comprising the steps of: acquiring an image of the biological sample embedded in a wax block captured by the X-ray microscope using X-rays having an energy of 4-12 keV; acquiring an image, captured by the light microscope, of a part of the biological sample included in the image captured by the X-ray microscope; and selecting, from the acquired X-ray and light microscope images, arbitrary observation target regions of the biological sample in the images as location markers to collate and match the X-ray microscope image with the light microscope image using the location markers.

Classes IPC  ?

• G06V 20/69 - Objets microscopiques, p. ex. cellules biologiques ou pièces cellulaires
• G02B 21/36 - Microscopes aménagés pour la photographie ou la projection

Abrégé

A method for extracting an evaluation target region of a biological sample in three dimensions based on two images that are matched: an image of the biological sample embedded in a wax block captured by an X-ray microscope using X-rays having an energy of 4-12 keV and an image of a same measurement point of the same biological sample captured by a light microscope after the X-ray microscopy imaging, the method comprising the steps of: extracting a region of interest, including the evaluation target region, from the image of the X-ray microscope that has been matched with the image of the light microscope; and binarizing the region of interest to further extract the evaluation target region from the region of interest by using the image information of the light microscope and the X-ray microscope in a complementary manner.

Classes IPC  ?

• G06T 7/11 - Découpage basé sur les zones
• G02B 21/36 - Microscopes aménagés pour la photographie ou la projection
• G06T 7/174 - DécoupageDétection de bords impliquant l'utilisation de plusieurs images
• G06T 7/62 - Analyse des attributs géométriques de la superficie, du périmètre, du diamètre ou du volume
• G21K 7/00 - Microscopes à rayons gamma ou à rayons X

Abrégé

This method is for observing the same measurement place of the same biological sample by means of an X-ray microscope and an optical microscope by using a wax block in which a biological sample is embedded and the minimum value of the optical path length of the X-ray is 2 mm or less and the maximum value thereof is more than 2 mm. The method comprises: a step for imaging the biological sample by means of an X-ray microscope using an X-ray having an energy of 4-12 keV; a step for identifying, in reference to an arbitrarily defined position of the biological sample in an image captured by the X-ray microscope, positional information of an observation target region for imaging the biological sample by means of an optical microscope; and a step for obtaining a section of the biological sample including the observation target region on the basis of the identified positional information, and imaging the section by means of the optical microscope.

Classes IPC  ?

• G01N 1/36 - Enrobage ou montage analogue d'échantillons
• G01N 1/28 - Préparation d'échantillons pour l'analyse
• G01N 23/04 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau et formant des images des matériaux
• G01N 33/48 - Matériau biologique, p. ex. sang, urineHémocytomètres
• G01T 7/00 - Détails des instruments de mesure des radiations

Produits et services

Laboratory apparatus and instruments; measuring or testing machines and instruments; calorimeters; differential scanning calorimeters; computer software, recorded; industrial X-ray apparatus.

Abrégé

This microchannel device separates a sample solution, which contains a first component to be used as an analysis control and a second component to be analyzed, into a solution containing the first component and a solution containing the second component.

Classes IPC  ?

• B01L 3/00 - Récipients ou ustensiles pour laboratoires, p. ex. verrerie de laboratoireCompte-gouttes
• G01N 1/40 - Concentration des échantillons

Abrégé

A recording apparatus for recording apparatus information for estimating an error cause of a monitored apparatus having a function of outputting the apparatus information and an error signal indicating that an error has occurred when an error has occurred, comprises an apparatus information acquiring section for acquiring a plurality of pieces of the apparatus information from the monitored apparatus, an error signal acquiring section for acquiring the error signal from the monitored apparatus, a holding information indicating section for indicating the apparatus information to be held based on the error signal, and an apparatus information recording section for recording the apparatus information in a predetermined time including ranges before and after a moment at which the error signal has been output based on an indication by the holding information indicating section.

Classes IPC  ?

• G01N 23/20016 - Goniomètres
• G01N 23/20025 - Porte-échantillons ou leurs supports
• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X

Abrégé

To provide a technique for correcting SOD shifts with no distance sensor for CT devices, and an information processing system for processing information with the CT device. The CT device includes: a sample stage to place a sample; an X-ray generator generating a cone beam X-ray toward the sample and rotated around a rotation axis with respect to the sample stage; and a detector detecting the cone beam X-ray transmitted through the sample as measurement data, The information processing system includes a processor(s) executing: a tentative correction step of acquiring a tentatively corrected reconstruction image for the plural tentative correction parameters from the measurement data, by using a tentative correction function; an index calculation step of calculating an index related to sharpness of each tentatively corrected reconstruction image; and a shift quantity specification step of specifying a correction function of the SOD based on the plural calculated indices.

Classes IPC  ?

• G01N 23/046 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau et formant des images des matériaux en utilisant la tomographie, p. ex. la tomographie informatisée

Abrégé

A control apparatus, system, method, and program are provided that can efficiently acquire data significant for specifying the structure of a macromolecule in solution with a resolution greater than 30 Å. A control apparatus for controlling an X-ray analysis apparatus comprises a data converting section for converting sample solution data and reference solution data acquired from an X-ray analysis apparatus into profiles at each time, a first index calculating section for calculating a first index representing fluctuation in intensity calculated from a relationship between time and the intensity based on at least a profile of solution data of the converted profiles, a first index determining section for determining whether or not the calculated first index is within a predetermined range, and an apparatus controlling section for terminating measurement by the X-ray analysis apparatus when the first index is not within the predetermined range.

Classes IPC  ?

• G01N 23/20008 - Détails de construction des appareils d’analyse, p. ex. caractérisés par la source de rayons X, le détecteur ou le système optique à rayons XLeurs accessoiresPréparation d’échantillons à cet effet

Abrégé

Provided is a thermal analysis apparatus with which it is possible to easily perform detailed analysis of a change in the state of a sample, while visually grasping in detail the color of a sample and a change therein which accompanies a change in the temperature of the sample. Also provided is a thermal analysis apparatus which acquires thermal analysis data by measuring and calculating physical properties of a sample while changing temperature of the sample by heating or cooling and acquires image data by imaging the sample. Additionally, the apparatus is configured to display a graph of the thermal analysis data relating to temperature or time, a sample image of the sample data, color information data of range and type selected from the sample image, and a gradation in which colors generated from the color information data are arranged in correspondence with temperature or time, on a display.

Classes IPC  ?

• G01N 25/20 - Recherche ou analyse des matériaux par l'utilisation de moyens thermiques en recherchant la production de quantités de chaleur, c.-à-d. la calorimétrie, p. ex. en mesurant la chaleur spécifique, en mesurant la conductivité thermique

Abrégé

A peak two-dimensional detection data extracting unit 211 extracts two-dimensional detection data (peak two-dimensional detection data) of diffracted X-rays Xb presenting maximum X-ray intensity from two-dimensional detection data of the diffracted X-rays Xb obtained at a plurality of scan angles 2θ/θ. Next, a peak position identifying unit 212 identifies, from the peak two-dimensional detection data, a position at which the X-ray intensity is maximum (peak position). Then, data processing is performed using position information of the peak position identified for the peak two-dimensional detection data.

Classes IPC  ?

• G01N 23/2055 - Analyse des diagrammes de diffraction
• G01N 23/20025 - Porte-échantillons ou leurs supports
• G01N 23/207 - Diffractométrie, p. ex. en utilisant une sonde en position centrale et un ou plusieurs détecteurs déplaçables en positions circonférentielles

Produits et services

Laboratory apparatus and instruments; measuring apparatus and instruments; testing apparatus not for medical purposes; semiconductor testing apparatus; computer software, recorded; X-ray tubes not for medical purposes; industrial X-ray apparatus; X-ray apparatus not for medical purposes; X-ray diffraction apparatus not for medical use; X-ray fluorescence analyzers; apparatus and installations for the production of X-rays, not for medical purposes.

Produits et services

Laboratory apparatuses and instruments for the measurement, monitoring and evaluation of thermal processes, namely, thermogravimetric analyzers and differential thermal analyzers for measuring, monitoring, and evaluating materials subjected to thermal changes; measuring and testing machines and instruments, namely, thermogravimetric analyzers and differential thermal analyzers for the measurement, monitoring and evaluation of materials subjected to thermal changes; measuring and testing machines and instruments, namely, electronic and electro-technical thermobalance for the measurement of mass change under different atmospheres; calorimeters; differential scanning calorimeters; computer software, recorded, for operating thermal, thermo-mechanical, calorimetric and thermogravimetric measuring instruments; computer software, recorded, for monitoring and diagnosing thermal, thermo-mechanical, calorimetric and thermogravimetric measuring instruments; industrial X-ray apparatus

Abrégé

A monitoring module, an X-ray diffraction apparatus and a monitoring system capable of guaranteeing driving at a constant speed and maintaining traceability of each measurement are provided. A monitoring module for monitoring an operation of a stepping motor used in an X-ray diffraction apparatus, comprises a detection section for detecting a specific rotational position of a stepping motor and generating a detection signal, a measurement section for measuring a time interval of the detection signal, a determination section for determining whether or not a measurement value corresponding to the time interval of the detection signal coincides with a reference value corresponding to a rotation time between the specific rotational positions determined based on an operation instruction to the stepping motor and an information transmitting section for transmitting operation abnormality information to an outside when the measurement value does not coincide with the reference value.

Classes IPC  ?

• H02P 8/34 - Contrôle du fonctionnement
• G01N 23/20016 - Goniomètres
• G01N 23/20025 - Porte-échantillons ou leurs supports

Produits et services

Laboratory apparatus and instruments for X-ray analysis, namely, X-ray diffractometer, not for medical purposes; measuring apparatus and instruments, namely, X-ray analysis apparatus, not for medical purposes; testing apparatus not for medical purposes, namely, electro-optical apparatus for analyzing chemical composition and structural properties of industrial and scientific materials; semiconductor testing apparatus; recorded computer operating software and recorded software for data analysis for use with X-ray analysis apparatus; X-ray tubes not for medical use; industrial X-ray apparatus; X-ray analyzing apparatus for industrial use, namely, X-ray diffractometers, not for medical purposes; X-ray apparatus not for medical purposes; X-ray diffraction apparatus not for medical use; X-ray fluorescence analyzers; X-ray producing apparatus and installations not for medical use

Abrégé

Provided are an analysis device, an analysis method, and an analysis program which are capable of accurately analyzing a scatterer having a complicated cross-sectional shape and improving robustness of analysis. The present invention is provided with: an initial information setting unit 124c that sets an initial cross-sectional shape when fitting is repeated by changing the cross-sectional shape of a layer under the condition that a scatterer is formed by laminating, in the thickness direction of a plate-shaped sample, a layer having a constant cross-sectional shape represented by an angle and a radius centered about the origin; an intensity calculation unit 126 that calculates, on the basis of the cross-sectional shape of the layer, the scattering intensity of X-rays scattered by the plate-shaped sample; a fitting unit 127 that fits the calculated scattering intensity to the measured scattering intensity; and a parameter determination unit 128 that determines, according to the result of the fitting, the angle and radius representing the cross-sectional shape of the layer. The fitting unit repeats fitting by changing the cross-sectional shape of the layer.

Classes IPC  ?

• G01B 15/04 - Dispositions pour la mesure caractérisées par l'utilisation d'ondes électromagnétiques ou de radiations de particules, p. ex. par l'utilisation de micro-ondes, de rayons X, de rayons gamma ou d'électrons pour mesurer des contours ou des courbes
• G01N 23/201 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux en mesurant la diffusion sous un petit angle, p. ex. la diffusion des rayons X sous un petit angle [SAXS]

Abrégé

A correction apparatus reduces time and labor, reduces an artificiality, and improves reproducibility of correction by correcting a shift of a profile with an automatically estimated correction amount. A correction apparatus for correcting a profile of X-ray powder diffraction comprises processing circuitry configured to set a reference profile, set an estimation method for estimating a correction amount related to a sample height, estimate the correction amount based on the estimation method, and correct a subject profile based on the correction amount, wherein the correction amount is a value that maximizes a degree of coincidence between the corrected subject profile and the reference profile.

Classes IPC  ?

• G01N 23/00 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou
• G01N 23/207 - Diffractométrie, p. ex. en utilisant une sonde en position centrale et un ou plusieurs détecteurs déplaçables en positions circonférentielles

Abrégé

Provided is a structure for capturing a compound that includes at least one gene or a product thereof, or a combination thereof among a group of genes involved in the intracellular and extracellular transport function of the compound, the gene or the product thereof being multi-componented.

Classes IPC  ?

• C07K 14/245 - Escherichia (G)
• C07K 14/255 - Salmonella (G)
• G01N 33/68 - Analyse chimique de matériau biologique, p. ex. de sang ou d'urineTest par des méthodes faisant intervenir la formation de liaisons biospécifiques par ligandsTest immunologique faisant intervenir des protéines, peptides ou amino-acides

Abrégé

The present invention provides a structure for scavenging a compound, the structure including at least one gene from a gene group involved in the intracellular/extracellular transport of the compound, a product of the gene, or a combination of the gene and product.

Classes IPC  ?

• G01N 33/68 - Analyse chimique de matériau biologique, p. ex. de sang ou d'urineTest par des méthodes faisant intervenir la formation de liaisons biospécifiques par ligandsTest immunologique faisant intervenir des protéines, peptides ou amino-acides
• G16B 15/20 - Repliement de protéines ou de domaines

Abrégé

The present invention stretches a partition wall film for installation so as to enable measurement even when there is a pressure difference between spaces partitioned by the partition wall film and prevent the partition wall film from being bent or wrinkled easily. Provided is a fluorescent X-ray analysis apparatus comprising an irradiation chamber with a vacuum interior and a sample chamber with atmospheric pressure, the fluorescent X-ray analysis apparatus further comprising: a window frame holding member that constitutes a part of a partition wall between the irradiation chamber and the sample chamber and that has an opening through which X-rays pass; and a window frame member that is formed from a material that transmits X-rays, holds a partition wall film that is a part of the partition wall, and is disposed in the opening of the window frame holding member. The window frame member comprises: an annular inner film holding member that has a peripheral wall extending from a base end located on the sample chamber side toward a distal end located on the irradiation chamber side, the distal end forming an opening that is closed by a part of the partition wall film; and an annular outer film holding member that is inserted from the distal end of the inner film holding member and is attached to the base end of the inner film holding member, to thereby fix the periphery of a part of the partition wall film to the inner film holding member.

Classes IPC  ?

• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X
• G21K 5/00 - Dispositifs d'irradiation

Abrégé

The present invention enables measurement in a state in which a sample chamber is filled with air, and prevents damages to a partition film and a component placed in an irradiation chamber. This fluorescent X-ray analysis device comprises: a sample chamber in which a sample is placed; an irradiation chamber which is demarcated from the sample chamber by a partition including, in a part thereof, a partition film permeable to X-rays, and in which an X-ray source that emits X-rays to the sample chamber through the partition film is placed; and an information processing device. The information processing device comprises: an irradiation duration acquisition unit which acquires irradiation duration for which the partition film is irradiated with the X-rays; and a control unit which performs protection control, on the basis of the irradiation duration acquired by the irradiation duration acquisition unit, to protect the partition film from irradiation with the X-rays.

Classes IPC  ?

• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X
• G01N 23/2204 - Supports d’échantillons à cet effetMoyens de transport des échantillons à cet effet
• G01N 23/2209 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en utilisant la spectroscopie dispersive en longueur d’onde [WDS]

Abrégé

The present invention improves analysis accuracy and shortens measurement time by preventing a decrease in the intensity of fluorescent X-rays to be detected. This fluorescent X-ray analysis device includes: a sample chamber in which a sample is disposed; and an irradiation chamber which is partitioned from the sample chamber by using a partition. The fluorescent X-ray analysis device has: an X-ray source that is disposed in the irradiation chamber, and emits X-rays obliquely toward an opening provided in a partition wall between the sample chamber and the irradiation chamber; a window frame member that is formed of a material allowing transmission of the X-rays therethrough, holds a partition film constituting a part of the partition, and is disposed in the opening provided in the partition wall; and a film support member that has a long hole allowing passage of the X-rays therethrough, is disposed adjacent to the partition film on the irradiation chamber side, and supports the partition film from the irradiation chamber side. The film support member is disposed such that the long hole is parallel to the optical axis of the X-rays in a plan view from the sample chamber side to the irradiation chamber side.

Classes IPC  ?

• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X
• G21K 5/00 - Dispositifs d'irradiation

Abrégé

An information processing system is provided. The data group acquisition unit acquires a data group including a plurality of crystalline phase information. The subclass setting unit sets the crystalline phase information included in the data group into any of a first and second subclasses. A number of the first subclass(es) is one or more, a number of the second subclass(es) is zero or more, and a total number of the first and second subclasses is two or more. The crystalline phase selection unit selects the crystalline phase information from the first subclass or both of the first and second subclass, and defines the selected crystalline phase information as selected data. When there are a plurality of the first subclasses, the selected data includes the at least one crystalline phase information in each of the first subclasses. A profile generation unit generates the X-ray diffraction profile based on the selected data.

Classes IPC  ?

• G01N 23/20 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux
• G01N 33/38 - BétonChauxMortierPlâtreBriquesProduits céramiquesVerre

Abrégé

A calculation apparatus for calculating a statistics property of a structural model comprises a pre-calculation structural model acquiring section for acquiring a pre-calculation structural model in which atoms are periodically arranged, a pre-calculation information acquiring section for acquiring pre-calculation information that specifies atoms periodically arranged in the pre-calculation structural model, a post-calculation structural model acquiring section for acquiring a post-calculation structural model calculated by using the pre-calculation structural model as source data, a post-calculation information acquiring section for acquiring cluster information obtained by clustering atoms in the post-calculation structural model based on the pre-calculation information, and atom position information that is position information of atoms in the post-calculation structural model, and a statistics property calculating section for calculating centroid positions of atoms having the same cluster information based on the cluster information and the atom position information.

Classes IPC  ?

• G06F 30/13 - Conception architecturale, p. ex. conception architecturale assistée par ordinateur [CAAO] relative à la conception de bâtiments, de ponts, de paysages, d’usines ou de routes

Abrégé

Provided is an X-ray optical device (100) configured to align X-ray beams and the X-ray optics generating the X-ray beams in an automatized way. The X-ray optical device comprises a housing (110) to be arranged in front of an X-ray source (200); an X-ray optics (120) that is movably mounted in the housing (110) and configured to receive X-rays (220) from the X-ray source (200) to generate and project a beam of X-rays (220a); and an actuating unit (130) configured to move the X-ray optics (120) within the housing (110) in at least one direction transverse to an X-ray beam propagation direction while maintaining a pre-adjusted angle of incidence between the X-ray optics (120) and the incident X-rays (220) to move the X-ray beam (220a) in the at least one direction transverse to the propagation direction. Further provided is an X-ray generator comprising an X-ray source and the X-ray optical device.

Classes IPC  ?

• G01N 23/20008 - Détails de construction des appareils d’analyse, p. ex. caractérisés par la source de rayons X, le détecteur ou le système optique à rayons XLeurs accessoiresPréparation d’échantillons à cet effet

Abrégé

The present invention accurately and quickly detects water leakage in a spectroscopic chamber and thereby reduces the degree of failure in an X-ray fluorescence analysis device when water leakage occurs.　Provided is an X-ray fluorescence analysis device comprising: a high-voltage power supply that applies a voltage to an electron beam source; an X-ray tube that irradiates a sample disposed in a spectroscopic chamber with primary X-rays generated by irradiating a target with a generated electron beam; a water pump that delivers cooling water for cooling the target; a vacuum pump that evacuates the atmosphere from the spectroscopic chamber; a vacuum gauge that measures the pressure in the spectroscopic chamber; and a control unit that determines that the cooling water has leaked into the spectroscopic chamber on the basis of both the pressure measured by the vacuum gauge and the voltage of the high-voltage power supply applied to the electron beam source, and that stops the operation of the water pump.

Classes IPC  ?

• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X
• H05G 1/26 - Mesure, commande ou protection

Produits et services

Laboratory apparatus and instruments; measuring and testing machines and instruments; semiconductor testing apparatus; computer software, recorded; X-ray tubes not for medical purposes; industrial X-ray apparatus; X-ray apparatus not for medical purposes; X-ray diffraction apparatus not for medical use; apparatus and installations for the production of X-rays, not for medical purposes.

Abrégé

A crystal structure analysis in which: each of a plurality of samples are irradiated while the angle of incidence is continuously changed by rotating the crystal, whereby diffraction spot intensity and reliability for a plurality of crystal lattice planes are determined and a data set (Data-1, Data-2, Data-3, . . . , Data-n) is acquired; whether or not to perform merging, which is a process of combining multiple sets of data into one, is determined for each individual set of data on the basis of a merging criterion (e.g., Rint, completeness); merging is performed on data for which merging is to be performed; and a crystal structure is determined according to merged data. A crystal structure analysis result is obtained in a crystal structure analysis method, a crystal structure analysis device, and a crystal structure analysis program in which a crystal structure is determined by data-processing and analyzing a plurality of diffraction profiles.

Classes IPC  ?

• G01N 23/2055 - Analyse des diagrammes de diffraction

Abrégé

An X-ray fluorescence spectrometer according to the present invention includes a calculation unit (10) configured to calculate a content of each element in a sample (13) using an FP method, wherein the calculation unit (10) is configured to: in order to take into consideration an influence of unmeasured elements for which the fluorescent X-rays are not measured, use shorter-wavelength scattered X-rays of primary X-rays having a wavelength of 0.05 nm or more and 0.075 nm or less, and longer-wavelength scattered X-rays of the primary X-rays having a wavelength of 0.11 nm or more and 0.23 nm or less as scattered X-rays whose intensities are measured by a detection unit (9), assume a mean atomic number for elements other than hydrogen included in the unmeasured elements, and assume a content for hydrogen.

Classes IPC  ?

• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X