HORIBA, Ltd.

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        Patent 1,262
        Trademark 234
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[Owner] HORIBA, Ltd. 833
HORIBA STEC, Co., Ltd. 353
Horiba Instruments Incorporated 127
Horiba ABX SAS 111
Horiba Jobin Yvon SAS 48
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Date
New (last 4 weeks) 9
2025 December (MTD) 4
2025 November 5
2025 October 13
2025 September 7
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IPC Class
G05D 7/06 - Control of flow characterised by the use of electric means 97
G01M 17/007 - Wheeled or endless-tracked vehicles 83
G01N 1/22 - Devices for withdrawing samples in the gaseous state 81
G01N 15/02 - Investigating particle size or size distribution 70
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence 66
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NICE Class
09 - Scientific and electric apparatus and instruments 193
07 - Machines and machine tools 31
42 - Scientific, technological and industrial services, research and design 29
10 - Medical apparatus and instruments 27
37 - Construction and mining; installation and repair services 27
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Status
Pending 124
Registered / In Force 1,372
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1.

CCEVA

      
Application Number 1889994
Status Registered
Filing Date 2025-10-14
Registration Date 2025-10-14
Owner HORIBA, Ltd. (Japan)
NICE Classes  ?
  • 09 - Scientific and electric apparatus and instruments
  • 37 - Construction and mining; installation and repair services
  • 42 - Scientific, technological and industrial services, research and design

Goods & Services

Carbon dioxide measuring apparatus, and parts and fittings therefor; carbon dioxide analyzing apparatus, and parts and fittings therefor; carbon dioxide measuring and analyzing apparatus, and parts and fittings therefor; gas measuring apparatus, and parts and fittings therefor; gas analyzing apparatus, and parts and fittings therefor; gas measuring and analyzing apparatus, and parts and fittings therefor; fluid flow meters; measuring or testing machines and instruments; laboratory apparatus and instruments; photographic machines and apparatus; cinematographic machines and apparatus; optical machines and apparatus; telecommunication machines and apparatus; electronic computer and data processing machines and apparatus and their parts; downloadable and recorded computer software for controlling carbon dioxide measuring apparatus, carbon dioxide analyzing apparatus, and carbon dioxide measuring and analyzing apparatus; downloadable and recorded computer software for controlling gas measuring apparatus, gas analyzing apparatus, and gas measuring and analyzing apparatus; computer software; computer programs. Repair and maintenance of carbon dioxide measuring apparatus; repair and maintenance of carbon dioxide analyzing apparatus; repair and maintenance of carbon dioxide measuring and analyzing apparatus; repair and maintenance of gas measuring apparatus; repair and maintenance of gas analyzing apparatus; repair and maintenance of gas measuring and analyzing apparatus; repair and maintenance of fluid flow meters; repair and maintenance of measuring or testing machines and instruments; repair and maintenance of laboratory apparatus and instruments; repair and maintenance of photographic machines and apparatus; repair and maintenance of cinematographic machines and apparatus; repair and maintenance of optical machines and apparatus; repair and maintenance of telecommunication machines and apparatus; repair and maintenance of electronic machines and apparatus. Rental of carbon dioxide measuring apparatus; rental of carbon dioxide analyzing apparatus; rental of carbon dioxide measuring and analyzing apparatus; rental of gas measuring apparatus; rental of gas analyzing apparatus; rental of gas measuring and analyzing apparatus; rental of fluid flow meters; rental of measuring or testing machines and instruments; rental of laboratory apparatus and instruments; rental of computers; calibration of carbon dioxide measuring apparatus; calibration of carbon dioxide analyzing apparatus; calibration of carbon dioxide measuring and analyzing apparatus; calibration of gas measuring apparatus; calibration of gas analyzing apparatus; calibration of gas measuring and analyzing apparatus; calibration of fluid flow meters; calibration of measuring or testing machines and instruments; calibration of laboratory apparatus and instruments; calibration of photographic machines and apparatus; calibration of cinematographic machines and apparatus; calibration of optical machines and apparatus; calibration of telecommunication machines and apparatus; calibration of electronic machines and apparatus; design of carbon dioxide measuring apparatus; design of carbon dioxide analyzing apparatus; design of carbon dioxide measuring and analyzing apparatus; design of gas measuring apparatus; design of gas analyzing apparatus; design of gas measuring and analyzing apparatus; design of fluid flow meters; design of measuring or testing machines and instruments; design of laboratory apparatus and instruments; design of photographic machines and apparatus; design of cinematographic machines and apparatus; design of optical machines and apparatus; design of telecommunication machines and apparatus; design of electronic machines and apparatus; design, programming and maintenance of computer software for controlling carbon dioxide measuring apparatus, carbon dioxide analyzing apparatus, and carbon dioxide measuring and analyzing apparatus; design, programming and maintenance of computer software for controlling gas measuring apparatus, gas analyzing apparatus, gas measuring and analyzing apparatus, and fluid flow meters; design, programming and maintenance of computer software; design, programming and maintenance of computer programs; providing on-line non-downloadable computer software for controlling carbon dioxide measuring apparatus, carbon dioxide analyzing apparatus, and carbon dioxide measuring and analyzing apparatus; providing on-line non-downloadable computer software for controlling gas measuring apparatus, gas analyzing apparatus, gas measuring and analyzing apparatus, and fluid flow meters; providing on-line non-downloadable computer software; providing on-line non-downloadable computer programs; designing of machines, apparatus, instruments [including their parts] or systems composed of such machines, apparatus and instruments; technological advice relating to computers, automobiles and industrial machines; testing or research on machines, apparatus and instruments.

2.

FLUID CONTROL VALVE, FLUID CONTROL DEVICE, AND METHOD FOR MANUFACTURING ORIFICE

      
Application Number 18867430
Status Pending
Filing Date 2023-05-09
First Publication Date 2025-12-04
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor
  • Miyamoto, Hideaki
  • Tasaka, Naoya

Abstract

The present invention achieves a larger flow rate of a fluid control valve without increasing a size of an orifice or an actuator. The fluid control valve includes an orifice having a valve seat surface and a valve body having a seating surface to be seated on the valve seat surface. The orifice has a plurality of inflow ports and a plurality of outflow ports that are open along a first direction on the valve seat surface. The plurality of inflow ports and the plurality of outflow ports are arranged side by side in a second direction intersecting the first direction.

IPC Classes  ?

  • F16K 1/42 - Valve seats
  • F16K 31/02 - Operating meansReleasing devices electricOperating meansReleasing devices magnetic
  • F16K 37/00 - Special means in or on valves or other cut-off apparatus for indicating or recording operation thereof, or for enabling an alarm to be given

3.

VALVE CONTROL DEVICE, VALVE CONTROL METHOD, VALVE CONTROL PROGRAM, AND FLUID CONTROL DEVICE

      
Application Number 18681377
Status Pending
Filing Date 2022-07-14
First Publication Date 2025-12-04
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor
  • Tokunaga, Kazuya
  • Takijiri, Kotaro

Abstract

To improve responsiveness while reducing the effect of noise, a valve control method for controlling a valve of a fluid control device includes generating a target response function converted from the flow rate setting using a target response transfer function; generating a target voltage function by making a correction in nonlinearity of a drive voltage for the valve and a flow rate, with respect to the target response function; generating a feedforward voltage signal from the target voltage function by making a correction corresponding to the delay characteristic of the valve; causing a feedback controller to generate a feedback voltage signal from a deviation between the target response function and a flow rate measurement of a flow rate sensor; generating a corrected command voltage signal using a feedforward voltage signal and the feedback voltage signal; and controlling the valve using the corrected command voltage signal.

IPC Classes  ?

  • G05D 7/06 - Control of flow characterised by the use of electric means
  • G01F 1/34 - Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow by using mechanical effects by measuring pressure or differential pressure

4.

WAFER TEMPERATURE CONTROL DEVICE, CONTROL METHOD FOR WAFER TEMPERATURE CONTROL DEVICE, AND PROGRAM FOR WAFER TEMPERATURE CONTROL DEVICE

      
Application Number 18681369
Status Pending
Filing Date 2022-08-02
First Publication Date 2025-12-04
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor
  • Takijiri, Kotaro
  • Hayashi, Daisuke

Abstract

In order to provide a wafer temperature control device capable of estimating a wafer temperature with sufficient accuracy and controlling the wafer temperature to a target temperature even when a cooling operation amount input to a cooler is changed, a heater that heats a wafer according to an input heating operation amount, a cooler that cools the wafer [W] according to an input cooling operation amount, a vicinity temperature measuring instrument that measures a vicinity temperature of the wafer, a temperature estimation observer that estimates the wafer temperature on a basis of the vicinity temperature measured by the vicinity temperature measuring instrument, and the cooling operation amount input to the cooler or the cooling amount output from the cooler, and a temperature controller that controls the cooling operation amount so as to reduce a temperature deviation between a set temperature and the estimated wafer temperature are provided.

IPC Classes  ?

  • H01L 21/67 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereofApparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components
  • H01L 21/687 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereofApparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches

5.

LIQUID SAMPLE ANALYSIS METHOD, LIQUID SAMPLE ANALYSIS PROGRAM, AND LIQUID SAMPLE ANALYSIS SYSTEM

      
Application Number JP2025016885
Publication Number 2025/243856
Status In Force
Filing Date 2025-05-08
Publication Date 2025-11-27
Owner HORIBA, LTD. (Japan)
Inventor
  • Aoyama, Tomoki
  • Mori, Tetsuya

Abstract

Even for a liquid sample in which particle elements forming solid particles partially overlap compound elements forming a compound dissolved in a solution, the present invention quantifies only the solid particles. The present invention involves: measuring the concentration of elements (hereinafter referred to as non-overlapping elements) in the liquid not overlapping particle elements; calculating the concentration of elements (hereinafter referred to as overlapping elements) in the liquid overlapping the particle elements; measuring the total concentration of the overlapping elements and the particle elements included in the liquid sample; and calculating the concentration of the particle elements by subtracting the concentration of the overlapping elements from the total concentration.

IPC Classes  ?

  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

6.

TEST SYSTEM, TEST METHOD, AND TEST PROGRAM FOR HEAT MANAGEMENT SYSTEM

      
Application Number JP2025017856
Publication Number 2025/243948
Status In Force
Filing Date 2025-05-16
Publication Date 2025-11-27
Owner HORIBA, LTD. (Japan)
Inventor
  • Hirai, Seiji
  • Iseki, Hirotaka
  • Michikita, Toshiyuki
  • Yoshimura, Ryo

Abstract

The present invention makes it possible to improve tracking with respect to changes in an amount of heat at a heat management system and comprises a simulated heat source body 2 for thermally simulating a heat source component, a heat supply device 3 that supplies heat to the simulated heat source body 2, a heat amount acquisition unit 41 that acquires the amount of heat produced by a heat source component of a heat-generating device, and a heat simulation control unit 42 that controls the heat supply device 3 to thermally simulate the heat source component using the simulated heat source body 2. The heat simulation control unit 42 controls the heat supply device 3 on the basis of the amount of heat acquired by the heat amount acquisition unit 41 and an outlet temperature T5 or an outlet flow rate FR5 for a test object temperature adjustment apparatus 210 of a heat management system 200.

IPC Classes  ?

  • G01M 17/007 - Wheeled or endless-tracked vehicles
  • G01M 99/00 - Subject matter not provided for in other groups of this subclass

7.

FLUID CONTROL VALVE AND FLUID CONTROL DEVICE

      
Application Number 19212430
Status Pending
Filing Date 2025-05-19
First Publication Date 2025-11-20
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor
  • Shakudo, Kazuya
  • Hida, Yuki

Abstract

The present invention reduces seat leakage while increasing a flow rate, and includes an orifice 31 having a valve seat surface 31s and a valve body 32 having a seating surface 32s seated on the valve seat surface 31s. The orifice 31 has an annular groove M1 formed in the valve seat surface 31s and an internal flow path L1 communicating with an upstream flow path R1 and opened in the annular groove M1. The internal flow path L1 is opened on the same plane as the valve seat surface 31s and extends outward of the annular groove M1 in plan view.

IPC Classes  ?

8.

UR-Z

      
Application Number 1886814
Status Registered
Filing Date 2025-09-08
Registration Date 2025-09-08
Owner HORIBA STEC, Co., Ltd. (Japan)
NICE Classes  ?
  • 07 - Machines and machine tools
  • 09 - Scientific and electric apparatus and instruments

Goods & Services

Automatic pressure regulators being parts of machines; pressure regulators being parts of machines; pressure regulating valves being parts of machines; semiconductor manufacturing machines, and part and fittings therefor; machines for manufacturing batteries, and part and fittings therefor; machines for manufacturing electric storage batteries, and part and fittings therefor; machines for manufacturing solar cell, and part and fittings therefor; machines for manufacturing electronic components, and part and fittings therefor; machines for manufacturing light emitting diode, and part and fittings therefor; machines for manufacturing displays, and part and fittings therefor; machines for manufacturing liquid crystal, and part and fittings therefor; machines for manufacturing organic electroluminescence, and part and fittings therefor; pressure regulators for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; pressure controllers [valves] being parts of machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; pressure gauges for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; pressure sensors for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor. Pressure gauges for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; pressure sensors for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor.

9.

Fluid control device

      
Application Number 29836390
Grant Number D1101105
Status In Force
Filing Date 2022-04-26
First Publication Date 2025-11-04
Grant Date 2025-11-04
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor
  • Shakudo, Kazuya
  • Oe, Kenichi
  • Kunita, Daichi

10.

EVALUATION SYSTEM, PROGRAM FOR EVALUATION SYSTEM, AND EVALUATION METHOD

      
Application Number JP2025014891
Publication Number 2025/225466
Status In Force
Filing Date 2025-04-16
Publication Date 2025-10-30
Owner HORIBA, LTD. (Japan)
Inventor Echigoya, Takeshi

Abstract

An evaluation system according to the present invention evaluates the performance of an electrolysis cell that electrolyzes supplied steam to generate hydrogen gas or a test piece that is a portion thereof and comprises a steam supply line that supplies steam to the test piece, a hydrogen gas extraction line that extracts hydrogen gas that is generated from the test piece by electrolysis, a generated hydrogen information acquisition unit that acquires generated hydrogen information that directly or indirectly indicates the hydrogen gas content of a fluid that flows along the hydrogen gas extraction line, and a steam control unit that controls the flow rate of the steam supplied to the test piece from the steam supply line on the basis of the acquired generated hydrogen information.

IPC Classes  ?

  • C25B 15/023 - Measuring, analysing or testing during electrolytic production
  • C25B 1/042 - Hydrogen or oxygen by electrolysis of water by electrolysis of steam
  • G01N 1/00 - SamplingPreparing specimens for investigation

11.

SYSTEMS AND METHODS FOR BRAKE-EMISSIONS TESTING

      
Application Number US2025024833
Publication Number 2025/226475
Status In Force
Filing Date 2025-04-16
Publication Date 2025-10-30
Owner HORIBA INSTRUMENTS INCORPORATED (USA)
Inventor
  • Filer, Gregory
  • Newberger, Norman Malcolm

Abstract

A free-wheeling hub wheel can be mounted to a wheel hub of a vehicle such that the free-wheeling hub wheel surrounds a brake of the vehicle. A cover is disposed over the brake and mounted around a perimeter of a rim of the free-wheeling hub wheel such that the rim and cover define a sealed container completely encapsulating the brake to capture emissions from the brake.

IPC Classes  ?

  • G01M 17/007 - Wheeled or endless-tracked vehicles
  • F16D 66/00 - Arrangements for monitoring working conditions of brakes, e.g. wear or temperature

12.

Fluid control device

      
Application Number 29836396
Grant Number D1100142
Status In Force
Filing Date 2022-04-26
First Publication Date 2025-10-28
Grant Date 2025-10-28
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor
  • Shakudo, Kazuya
  • Oe, Kenichi
  • Kunita, Daichi

13.

MICROCHIP, SPECIMEN TESTING APPARATUS, AND SPECIMEN TESTING METHOD

      
Application Number 18290726
Status Pending
Filing Date 2022-07-13
First Publication Date 2025-10-23
Owner HORIBA, Ltd. (Japan)
Inventor
  • Matsuda, Yasunori
  • Hirata, Katsuki

Abstract

A microchip (3) has a fluid circuit in it. The fluid circuit includes: a specimen introduction portion (31) into which a specimen is introduced; a component separation portion (32) that, when a centrifugal force in a first direction (D1) occurs in the microchip (3), separates, under the centrifugal force in the first direction (D1), a component contained in the specimen introduced into the specimen introduction portion (31); and a reagent reaction portion (33) that has a carrier member (330) carrying a reagent and that makes part of the component introduced from the component separation portion (32) into the carrier member (330) react with the reagent. When a centrifugal force in a second direction (D2) different from the first direction (D1) occurs in the microchip (3), the component separated in the component separation portion (32) is introduced, under the centrifugal force in the second direction (D2), from the component separation portion (32) into the carrier member (330).

IPC Classes  ?

  • B01L 3/00 - Containers or dishes for laboratory use, e.g. laboratory glasswareDroppers
  • G01N 21/77 - Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator

14.

SYSTEMS AND METHODS FOR BRAKE-EMISSIONS TESTING

      
Application Number 18643556
Status Pending
Filing Date 2024-04-23
First Publication Date 2025-10-23
Owner HORIBA Instruments Incorporated (USA)
Inventor
  • Filer, Gregory
  • Newberger, Norman Malcolm

Abstract

A free-wheeling hub wheel can be mounted to a wheel hub of a vehicle such that the free-wheeling hub wheel surrounds a brake of the vehicle. A cover is disposed over the brake and mounted around a perimeter of a rim of the free-wheeling hub wheel such that the rim and cover define a sealed container completely encapsulating the brake to capture emissions from the brake.

IPC Classes  ?

  • F16D 65/00 - Parts or details of brakes
  • F16D 65/853 - Features relating to cooling for disc brakes with closed cooling system
  • F16D 66/00 - Arrangements for monitoring working conditions of brakes, e.g. wear or temperature

15.

GAS ANALYSIS DEVICE, LIGHT EMISSION-INDUCING GAS GENERATION DEVICE, AND ANALYSIS METHOD

      
Application Number JP2025008487
Publication Number 2025/220352
Status In Force
Filing Date 2025-03-07
Publication Date 2025-10-23
Owner HORIBA, LTD. (Japan)
Inventor
  • Miyahara, Kohei
  • Nagasawa, Kenya
  • Mizumoto, Kazunori
  • Yamada, Ryusuke
  • Kobayashi, Go
  • Serizawa, Izumi

Abstract

The present invention suppresses the generation of components other than a light emission-inducing gas. The gas analysis device (100) comprises a light emission-inducing gas generation device (9) that generates a light emission-inducing gas that interacts with a gas to be analyzed to generate reaction light. The light emission-inducing gas generation device (9) has a housing (91) and a light source (92). The housing (91) has an internal space (SP) into which a raw material gas serving as a raw material for the light emission-inducing gas is introduced. The light source (92) is provided in the internal space (SP) and emits light for generating a light emission-inducing gas from the raw material gas. At least one of electric wires of the light source (92) is disposed in the internal space SP of the housing (91). The electrical wires disposed in the internal space (SP) of the housing (91) are electrically connected at a portion facing the internal space of the housing (91).

IPC Classes  ?

16.

INFRARED GAS ANALYZER, AND INFRARED GAS ANALYSIS METHOD

      
Application Number 18863980
Status Pending
Filing Date 2023-04-27
First Publication Date 2025-10-16
Owner HORIBA, LTD. (Japan)
Inventor
  • Sakakura, Seiji
  • Imamura, Yuki

Abstract

The present invention is one which reduces running costs by eliminating the need for a catalyst, which is a consumable item, and comprises a measurement cell into which sample gas is introduced, an infrared light source that irradiates the measurement cell with infrared light, an infrared light detector that detects infrared light that has passed through the measurement cell, and a gas filter within which a plurality of interference components that interfere with a measurement component in the sample gas are enclosed.

IPC Classes  ?

  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis

17.

VERIFICATION METHOD OF THERMAL SIMULATION SYSTEM, VERIFICATION PROGRAM, VERIFICATION DEVICE FOR THERMAL SIMULATION SYSTEM, THERMAL SIMULATION SYSTEM, TEST METHOD, AND TEST SYSTEM

      
Application Number JP2025013513
Publication Number 2025/216147
Status In Force
Filing Date 2025-04-02
Publication Date 2025-10-16
Owner HORIBA, LTD. (Japan)
Inventor
  • Iseki, Hirotaka
  • Hirai, Seiji
  • Michikita, Toshiyuki
  • Yoshimura, Ryo

Abstract

The present invention facilitates parameter setting of a thermal simulation system used for a test of a thermal management system and is a verification method of a thermal simulation system 100 for testing the thermal management system for managing heat generated from one or a plurality of heat source components of a vehicle, the method including an acquisition step for acquiring heat quantity data indicating a heat quantity generated from the heat source component and an arithmetic step for inputting the acquired heat quantity data to a thermal simulation system model M, which is software obtained by modeling the thermal simulation system 100, and calculating a parameter of the thermal simulation system 100 for reproducing the heat quantity, by the thermal simulation system model M.

IPC Classes  ?

18.

SHIFT OPERATION MECHANISM, AUTOMATED DRIVING ROBOT, TEST SPECIMEN TESTING SYSTEM, AND SHIFT OPERATION METHOD FOR AUTOMATED DRIVING ROBOT

      
Application Number JP2025013678
Publication Number 2025/211427
Status In Force
Filing Date 2025-04-03
Publication Date 2025-10-09
Owner HORIBA, LTD. (Japan)
Inventor
  • Yamada, Daiki
  • Aoyagi, Kazuma
  • Kugai, Kotaro
  • Hirose, Yoku
  • Oi, Kousuke

Abstract

This shift operation mechanism 1 for an automated driving robot 100 that drives a test specimen, which is a vehicle or a part thereof, comprises a clamping mechanism 10 that clamps a rotary type dial shift R, and an actuator 20 that rotates the clamping mechanism 10 about the axis of rotation of the dial shift R, wherein the clamping mechanism 10 comprises: a plurality of clamping pieces 11 that clamp the dial shift R from the sides of the dial shift R; and an elastic member 12 that imparts an elastic force in the direction in which the plurality of clamping pieces 11 clamp the dial shift R.

IPC Classes  ?

19.

SHIFT OPERATION MECHANISM, AUTOMATIC DRIVING ROBOT, TEST PRODUCT TESTING SYSTEM, AND SHIFT OPERATION METHOD OF AUTOMATIC DRIVING ROBOT

      
Application Number JP2025013679
Publication Number 2025/211428
Status In Force
Filing Date 2025-04-03
Publication Date 2025-10-09
Owner HORIBA, LTD. (Japan)
Inventor
  • Yamada, Daiki
  • Kugai, Kotaro
  • Nara, Kazuteru
  • Hashimoto, Kaho
  • Furukawa, Kazuki
  • Hirose, Yoku
  • Matsubara, Yoshiaki

Abstract

Provided is a shift operation mechanism 1 of an automatic driving robot for driving a test product, which is a vehicle or a part thereof, said shift operation mechanism 1 comprising: a shift lever operation unit 11 that operates a shift lever of the test product; a shift button operation unit 12 that operates a button B provided to the shift lever L of the test product; and a control unit 13 that controls the shift lever operation unit 11 and the shift button operation unit 12.

IPC Classes  ?

20.

FLUID CONTROL DEVICE, CONTROL METHOD FOR A FLUID CONTROL VALVE, FLUID CONTROL METHOD, AND FLUID CONTROL PROGRAM

      
Application Number 19095159
Status Pending
Filing Date 2025-03-31
First Publication Date 2025-10-09
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor
  • Nakaya, Yugo
  • Nishizato, Hiroshi

Abstract

The present invention reduces damage to a valve seat surface or a valve body that occurs when a fluid control valve is fully closed, and is provided with a fluid control valve in which a distance between a valve seat surface and a valve body varies in accordance with a value of a drive signal, and a control mechanism that outputs the drive signal so as to control the fluid control valve. In a case in which the fluid control valve is to be fully closed, the control mechanism outputs to the fluid control valve a drive signal that causes the fluid control valve to temporarily stop prior to being placed in the fully closed state, and thereafter outputs to the fluid control valve a drive signal that causes the fluid control valve to be placed in the fully closed state.

IPC Classes  ?

  • G05D 7/06 - Control of flow characterised by the use of electric means

21.

CHARACTERIZATION AND CHANGE OF POLYHYDROXYALKANOATE (PHA) CRYSTALLOGRAPHIC PHASE

      
Application Number 18623559
Status Pending
Filing Date 2024-04-01
First Publication Date 2025-10-02
Owner HORIBA Instruments Incorporated (USA)
Inventor Adar, Fran

Abstract

A composition and/or processing conditions of a development sample of polyhydroxyalkanoate can be changed based on data gathered from techniques described herein to alter a crystallographic property of the development sample in an attempt to produce non-centrosymmetric β crystallographic structure in the development sample with stable piezoelectric properties. Such would have use in a variety of applications.

IPC Classes  ?

  • C08G 63/06 - Polyesters derived from hydroxy carboxylic acids or from polycarboxylic acids and polyhydroxy compounds derived from hydroxy carboxylic acids
  • G01N 21/31 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
  • G16C 20/10 - Analysis or design of chemical reactions, syntheses or processes

22.

CONCENTRATION MEASUREMENT DEVICE, CONCENTRATION MEASUREMENT METHOD, STARTING MATERIAL VAPORIZATION SYSTEM, AND CONCENTRATION MEASUREMENT METHOD FOR STARTING MATERIAL VAPORIZATION SYSTEM

      
Application Number 18868515
Status Pending
Filing Date 2023-01-23
First Publication Date 2025-10-02
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor
  • Imanishi, Michie
  • Shimizu, Toru

Abstract

A concentration measurement device measures a concentration of starting material gas contained in mixed gas, and includes: a partial pressure sensor configured to detect a partial pressure of the starting material gas contained in the mixed gas, and output a partial pressure signal indicating the partial pressure; a total pressure sensor configured to detect a total pressure that is a pressure of the mixed gas, and output a total pressure signal indicating the total pressure; a delay filter configured to perform processing of delaying a response speed of the total pressure signal, and output a delayed total pressure signal that is a total pressure signal after the processing; and a calculation unit configured to calculate a concentration of the starting material gas contained in the mixed gas based on the partial pressure signal and the delayed total pressure signal.

IPC Classes  ?

  • G01N 7/14 - Analysing materials by measuring the pressure or volume of a gas or vapour by allowing the material to emit a gas or vapour, e.g. water vapour, and measuring a pressure or volume difference
  • C23C 16/448 - Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
  • G01L 9/00 - Measuring steady or quasi-steady pressure of a fluid or a fluent solid material by electric or magnetic pressure-sensitive elementsTransmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means
  • G01L 11/02 - Measuring steady or quasi-steady pressure of a fluid or a fluent solid material by means not provided for in group or by optical means
  • G01N 33/00 - Investigating or analysing materials by specific methods not covered by groups

23.

MEXACUBE

      
Application Number 1877758
Status Registered
Filing Date 2025-07-30
Registration Date 2025-07-30
Owner HORIBA, Ltd. (Japan)
NICE Classes  ?
  • 09 - Scientific and electric apparatus and instruments
  • 37 - Construction and mining; installation and repair services
  • 42 - Scientific, technological and industrial services, research and design

Goods & Services

Measurement apparatus and instruments for vehicle engine emission, and parts and fittings therefor; measurement apparatus and instruments for engine emission, and parts and fittings therefor; measurement apparatus and instruments for emission, and parts and fittings therefor; measurement apparatus and instruments for exhaust gases, and parts and fittings therefor; measurement apparatus and instruments for process gases, and parts and fittings therefor; measuring and analyzing apparatus and instruments for vehicle engine emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for engine emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for exhaust gases, and parts and fittings therefor; measuring and analyzing apparatus and instruments for process gases, and parts and fittings therefor; on-board measurement apparatus and instruments for vehicle engine emission, and parts and fittings therefor; on-board measurement apparatus and instruments for engine emission, and parts and fittings therefor; on-board measurement apparatus and instruments for emission, and parts and fittings therefor; on-board measurement apparatus and instruments for exhaust gases, and parts and fittings therefor; on-board measurement apparatus and instruments for process gases, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for vehicle engine emission, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for engine emission, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for emission, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for exhaust gases, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for process gases, and parts and fittings therefor; portable measurement apparatus and instruments for vehicle engine emission, and parts and fittings therefor; portable measurement apparatus and instruments for engine emission, and parts and fittings therefor; portable measurement apparatus and instruments for emission, and parts and fittings therefor; portable measurement apparatus and instruments for exhaust gases, and parts and fittings therefor; portable measurement apparatus and instruments for process gases, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for vehicle engine emission, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for engine emission, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for emission, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for exhaust gases, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for process gases, and parts and fittings therefor; measurement apparatus and instruments for automobile emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for automobile emission, and parts and fittings therefor; measurement apparatus and instruments for vehicle emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for vehicle emission, and parts and fittings therefor; gas measurement apparatus and instruments, and parts and fittings therefor; gas measuring and analyzing apparatus and instruments, and parts and fittings therefor; vehicle engine testing apparatus and instruments, and parts and fittings therefor; automotive engine testing apparatus and instruments, and parts and fittings therefor; engine testing apparatus and instruments, and parts and fittings therefor; computer software for controlling measurement apparatus and instruments for vehicle engine emission; computer software for controlling measurement apparatus and instruments for engine emission; computer software for controlling measurement apparatus and instruments for emission; computer software for controlling measurement apparatus and instruments for exhaust gases; computer software for controlling measurement apparatus and instruments for process gases; computer software for controlling gas measurement apparatus and instruments; computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; computer software for controlling measuring and analyzing apparatus and instruments for engine emission; computer software for controlling measuring and analyzing apparatus and instruments for emission; computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; computer software for controlling measuring and analyzing apparatus and instruments for process gases; computer software for controlling gas measuring and analyzing apparatus and instruments; computer software for controlling engine testing apparatus and instruments; computer software; measuring or testing machines and instruments; laboratory apparatus and instruments; optical machines and apparatus; cinematographic machines and apparatus; photographic machines and apparatus. Repair or maintenance of measurement apparatus and instruments for vehicle engine emission; repair or maintenance of measurement apparatus and instruments for engine emission; repair or maintenance of measurement apparatus and instruments for emission; repair or maintenance of measurement apparatus and instruments for exhaust gases; repair or maintenance of measurement apparatus and instruments for process gases; repair or maintenance of measuring and analyzing apparatus and instruments for vehicle engine emission; repair or maintenance of measuring and analyzing apparatus and instruments for engine emission; repair or maintenance of measuring and analyzing apparatus and instruments for emission; repair or maintenance of measuring and analyzing apparatus and instruments for exhaust gases; repair or maintenance of measuring and analyzing apparatus and instruments for process gases; repair or maintenance of on-board measurement apparatus and instruments for vehicle engine emission; repair or maintenance of on-board measurement apparatus and instruments for engine emission; repair or maintenance of on-board measurement apparatus and instruments for emission; repair or maintenance of on-board measurement apparatus and instruments for exhaust gases; repair or maintenance of on-board measurement apparatus and instruments for process gases; repair or maintenance of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; repair or maintenance of on-board measuring and analyzing apparatus and instruments for engine emission; repair or maintenance of on-board measuring and analyzing apparatus and instruments for emission; repair or maintenance of on-board measuring and analyzing apparatus and instruments for exhaust gases; repair or maintenance of on-board measuring and analyzing apparatus and instruments for process gases; repair or maintenance of portable measurement apparatus and instruments for vehicle engine emission; repair or maintenance of portable measurement apparatus and instruments for engine emission; repair or maintenance of portable measurement apparatus and instruments for emission; repair or maintenance of portable measurement apparatus and instruments for exhaust gases; repair or maintenance of portable measurement apparatus and instruments for process gases; repair or maintenance of portable measuring and analyzing apparatus and instruments for vehicle engine emission; repair or maintenance of portable measuring and analyzing apparatus and instruments for engine emission; repair or maintenance of portable measuring and analyzing apparatus and instruments for emission; repair or maintenance of portable measuring and analyzing apparatus and instruments for exhaust gases; repair or maintenance of portable measuring and analyzing apparatus and instruments for process gases; repair or maintenance of measurement apparatus and instruments for automobile emission; repair or maintenance of measuring and analyzing apparatus and instruments for automobile emission; repair or maintenance of measurement apparatus and instruments for vehicle emission; repair or maintenance of measuring and analyzing apparatus and instruments for vehicle emission; repair or maintenance of gas measurement apparatus and instruments; repair or maintenance of gas measuring and analyzing apparatus and instruments; repair or maintenance of vehicle engine testing apparatus and instruments; repair or maintenance of automotive engine testing apparatus and instruments; repair or maintenance of engine testing apparatus and instruments; repair or maintenance of measuring or testing machines and instruments; repair or maintenance of laboratory apparatus and instruments; repair or maintenance of optical machines and apparatus; repair or maintenance of cinematographic machines and apparatus; repair or maintenance of photographic machines and apparatus. Rental of measurement apparatus and instruments for vehicle engine emission; rental of measurement apparatus and instruments for engine emission; rental of measurement apparatus and instruments for emission; rental of measurement apparatus and instruments for exhaust gases; rental of measurement apparatus and instruments for process gases; rental of measuring and analyzing apparatus and instruments for vehicle engine emission; rental of measuring and analyzing apparatus and instruments for engine emission; rental of measuring and analyzing apparatus and instruments for emission; rental of measuring and analyzing apparatus and instruments for exhaust gases; rental of measuring and analyzing apparatus and instruments for process gases; rental of on-board measurement apparatus and instruments for vehicle engine emission; rental of on-board measurement apparatus and instruments for engine emission; rental of on-board measurement apparatus and instruments for emission; rental of on-board measurement apparatus and instruments for exhaust gases; rental of on-board measurement apparatus and instruments for process gases; rental of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; rental of on-board measuring and analyzing apparatus and instruments for engine emission; rental of on-board measuring and analyzing apparatus and instruments for emission; rental of on-board measuring and analyzing apparatus and instruments for exhaust gases; rental of on-board measuring and analyzing apparatus and instruments for process gases; rental of portable measurement apparatus and instruments for vehicle engine emission; rental of portable measurement apparatus and instruments for engine emission; rental of portable measurement apparatus and instruments for emission; rental of portable measurement apparatus and instruments for exhaust gases; rental of portable measurement apparatus and instruments for process gases; rental of portable measuring and analyzing apparatus and instruments for vehicle engine emission; rental of portable measuring and analyzing apparatus and instruments for engine emission; rental of portable measuring and analyzing apparatus and instruments for emission; rental of portable measuring and analyzing apparatus and instruments for exhaust gases; rental of portable measuring and analyzing apparatus and instruments for process gases; rental of measurement apparatus and instruments for automobile emission; rental of measuring and analyzing apparatus and instruments for automobile emission; rental of measurement apparatus and instruments for vehicle emission; rental of measuring and analyzing apparatus and instruments for vehicle emission; rental of gas measurement apparatus and instruments; rental of gas measuring and analyzing apparatus and instruments; rental of vehicle engine testing apparatus and instruments; rental of automotive engine testing apparatus and instruments; rental of engine testing apparatus and instruments; rental of measuring or testing machines and instruments; rental of laboratory apparatus and instruments; calibration of measurement apparatus and instruments for vehicle engine emission; calibration of measurement apparatus and instruments for engine emission; calibration of measurement apparatus and instruments for emission; calibration of measurement apparatus and instruments for exhaust gases; calibration of measurement apparatus and instruments for process gases; calibration of measuring and analyzing apparatus and instruments for vehicle engine emission; calibration of measuring and analyzing apparatus and instruments for engine emission; calibration of measuring and analyzing apparatus and instruments for emission; calibration of measuring and analyzing apparatus and instruments for exhaust gases; calibration of measuring and analyzing apparatus and instruments for process gases; calibration of on-board measurement apparatus and instruments for vehicle engine emission; calibration of on-board measurement apparatus and instruments for engine emission; calibration of on-board measurement apparatus and instruments for emission; calibration of on-board measurement apparatus and instruments for exhaust gases; calibration of on-board measurement apparatus and instruments for process gases; calibration of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; calibration of on-board measuring and analyzing apparatus and instruments for engine emission; calibration of on-board measuring and analyzing apparatus and instruments for emission; calibration of on-board measuring and analyzing apparatus and instruments for exhaust gases; calibration of on-board measuring and analyzing apparatus and instruments for process gases; calibration of portable measurement apparatus and instruments for vehicle engine emission; calibration of portable measurement apparatus and instruments for engine emission; calibration of portable measurement apparatus and instruments for emission; calibration of portable measurement apparatus and instruments for exhaust gases; calibration of portable measurement apparatus and instruments for process gases; calibration of portable measuring and analyzing apparatus and instruments for vehicle engine emission; calibration of portable measuring and analyzing apparatus and instruments for engine emission; calibration of portable measuring and analyzing apparatus and instruments for emission; calibration of portable measuring and analyzing apparatus and instruments for exhaust gases; calibration of portable measuring and analyzing apparatus and instruments for process gases; calibration of measurement apparatus and instruments for automobile emission; calibration of measuring and analyzing apparatus and instruments for automobile emission; calibration of measurement apparatus and instruments for vehicle emission; calibration of measuring and analyzing apparatus and instruments for vehicle emission; calibration of gas measurement apparatus and instruments; calibration of gas measuring and analyzing apparatus and instruments; calibration of vehicle engine testing apparatus and instruments; calibration of automotive engine testing apparatus and instruments; calibration of engine testing apparatus and instruments; calibration of measuring or testing machines and instruments; calibration of laboratory apparatus and instruments; calibration of optical machines and apparatus; calibration of cinematographic machines and apparatus; calibration of photographic machines and apparatus; design of measurement apparatus and instruments for vehicle engine emission; design of measurement apparatus and instruments for engine emission; design of measurement apparatus and instruments for emission; design of measurement apparatus and instruments for exhaust gases; design of measurement apparatus and instruments for process gases; design of measuring and analyzing apparatus and instruments for vehicle engine emission; design of measuring and analyzing apparatus and instruments for engine emission; design of measuring and analyzing apparatus and instruments for emission; design of measuring and analyzing apparatus and instruments for exhaust gases; design of measuring and analyzing apparatus and instruments for process gases; design of on-board measurement apparatus and instruments for vehicle engine emission; design of on-board measurement apparatus and instruments for engine emission; design of on-board measurement apparatus and instruments for emission; design of on-board measurement apparatus and instruments for exhaust gases; design of on-board measurement apparatus and instruments for process gases; design of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; design of on-board measuring and analyzing apparatus and instruments for engine emission; design of on-board measuring and analyzing apparatus and instruments for emission; design of on-board measuring and analyzing apparatus and instruments for exhaust gases; design of on-board measuring and analyzing apparatus and instruments for process gases; design of portable measurement apparatus and instruments for vehicle engine emission; design of portable measurement apparatus and instruments for engine emission; design of portable measurement apparatus and instruments for emission; design of portable measurement apparatus and instruments for exhaust gases; design of portable measurement apparatus and instruments for process gases; design of portable measuring and analyzing apparatus and instruments for vehicle engine emission; design of portable measuring and analyzing apparatus and instruments for engine emission; design of portable measuring and analyzing apparatus and instruments for emission; design of portable measuring and analyzing apparatus and instruments for exhaust gases; design of portable measuring and analyzing apparatus and instruments for process gases; design of measurement apparatus and instruments for automobile emission; design of measuring and analyzing apparatus and instruments for automobile emission; design of measurement apparatus and instruments for vehicle emission; design of measuring and analyzing apparatus and instruments for vehicle emission; design of gas measurement apparatus and instruments; design of gas measuring and analyzing apparatus and instruments; design of vehicle engine testing apparatus and instruments; design of automotive engine testing apparatus and instruments; design of engine testing apparatus and instruments; design of measuring or testing machines and instruments; design of laboratory apparatus and instruments; design of optical machines and apparatus; design of cinematographic machines and apparatus; design of photographic machines and apparatus; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for vehicle engine emission; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for engine emission; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for emission; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for exhaust gases; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for process gases; design, programming and maintenance of computer software for controlling gas measurement apparatus and instruments; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for engine emission; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for emission; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for process gases; design, programming and maintenance of computer software for controlling gas measuring and analyzing apparatus and instruments; design, programming and maintenance of computer software for controlling engine testing apparatus and instruments; design, programming and maintenance of computer software; rental of computer software for controlling measurement apparatus and instruments for vehicle engine emission; rental of computer software for controlling measurement apparatus and instruments for engine emission; rental of computer software for controlling measurement apparatus and instruments for emission; rental of computer software for controlling measurement apparatus and instruments for exhaust gases; rental of computer software for controlling measurement apparatus and instruments for process gases; rental of computer software for controlling gas measurement apparatus and instruments; rental of computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; rental of computer software for controlling measuring and analyzing apparatus and instruments for engine emission; rental of computer software for controlling measuring and analyzing apparatus and instruments for emission; rental of computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; rental of computer software for controlling measuring and analyzing apparatus and instruments for process gases; rental of computer software for controlling gas measuring and analyzing apparatus and instruments; rental of computer software for controlling engine testing apparatus and instruments; rental of computer software; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for vehicle engine emission; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for engine emission; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for emission; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for exhaust gases; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for process gases; providing on-line non-downloadable computer software for controlling gas measurement apparatus and instruments; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for engine emission; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for emission; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for process gases; providing on-line non-downloadable computer software for controlling gas measuring and analyzing apparatus and instruments; providing on-line non-downloadable computer software for controlling engine testing apparatus and instruments; providing on-line non-downloadable computer software; designing of machines, apparatus, instruments [including their parts] or systems composed of such machines, apparatus and instruments; computer software design, computer programming, or maintenance of computer software; technological advice relating to computers, automobiles and industrial machines; testing or research on machines, apparatus and instruments.

24.

MATERIAL GAS SUPPLY SYSTEM, MATERIAL GAS SUPPLY METHOD, AND MATERIAL GAS SUPPLY PROGRAM

      
Application Number JP2025009315
Publication Number 2025/197717
Status In Force
Filing Date 2025-03-12
Publication Date 2025-09-25
Owner HORIBA, LTD. (Japan)
Inventor
  • Saito, Takashi
  • Ding, Li
  • Ichikawa, Takato
  • Shibuya, Kyoji
  • Yamamoto, Tomomi

Abstract

The present invention reduces the burden of managing the flow rate of a material gas that is supplied to a processing device that uses a chemical reaction. The present invention comprises: a flow rate controller that controls the flow rate of the material gas that is supplied to the processing device; a gas analysis device that measures the concentration of a component to be measured that is included in a derivation gas emitted from the processing device; and a control device that inputs a flow rate setting value to the flow rate controller on the basis of the concentration measurement value of the component to be measured obtained by the gas analysis device. The control device determines a flow rate setting value to be inputted to the flow rate controller, on the basis of a control parameter determined by using a simulation model based on a chemical reaction occurring in the processing device or the volume of a reaction space in the processing device.

IPC Classes  ?

  • G05D 7/06 - Control of flow characterised by the use of electric means

25.

FLUID CONTROL DEVICE, CONTROL UNIT FOR FLUID CONTROL DEVICE, FLUID CONTROL METHOD, AND FLUID CONTROL PROGRAM

      
Application Number 19066647
Status Pending
Filing Date 2025-02-28
First Publication Date 2025-09-18
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor
  • Hamada, Chihiro
  • Hayashi, Daisuke

Abstract

The present invention makes it possible to perform highly accurate flow rate control while also achieving a fast response. Based on a deviation between a flow rate measurement value output by a flow rate sensor and a flow rate estimation value output by a flow rate sensor model, an observer determines a model error estimation value, which is obtained by estimating a model error in the flow rate sensor model relative to the flow rate sensor, and a flow rate error estimation value, which is obtained by estimating a flow rate error caused by a change in a fluid control valve, and inputs the model error estimation value into the flow rate sensor model, and then outputs an estimation value to a feedback controller based on the flow rate error estimation value and the valve flow rate estimation value output by the valve model.

IPC Classes  ?

  • G05D 7/06 - Control of flow characterised by the use of electric means

26.

SPECIMEN MEASUREMENT CHIP, METHOD FOR MANUFACTURING SPECIMEN MEASUREMENT CHIP, SPECIMEN MEASUREMENT DEVICE, SPECIMEN MEASUREMENT METHOD, AND SPECIMEN MEASUREMENT PROGRAM

      
Application Number JP2025009380
Publication Number 2025/192655
Status In Force
Filing Date 2025-03-12
Publication Date 2025-09-18
Owner HORIBA, LTD. (Japan)
Inventor
  • Anzai, Hiroshi
  • Hirata, Katsuki

Abstract

A specimen measurement chip 2, which is used for measuring a specimen, has a space 22 in which a specimen or a reagent is accommodated so as to prevent erroneous detection of the accommodation state of the specimen or the reagent while obtaining a stable reflected light quantity. The specimen measurement chip 2 includes a detection unit 23 formed on an inner surface 2a forming the space 22 and detecting the accommodation state of the specimen or the reagent. The detection unit 23 includes: a linear groove 231 formed with a reflection surface 231x that reflects light on a bottom surface; and an air lead-out passage 232 communicating with one end 231a of the groove 231.

IPC Classes  ?

  • G01N 35/08 - Automatic analysis not limited to methods or materials provided for in any single one of groups Handling materials therefor using a stream of discrete samples flowing along a tube system, e.g. flow injection analysis
  • G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups Handling materials therefor
  • G01N 37/00 - Details not covered by any other group of this subclass

27.

THERMAL CONDUCTIVITY GAS ANALYZER

      
Application Number JP2025006631
Publication Number 2025/182986
Status In Force
Filing Date 2025-02-26
Publication Date 2025-09-04
Owner HORIBA, LTD. (Japan)
Inventor Shintaku Akira

Abstract

A thermal conductivity gas analyzer according to the present invention comprises: a plurality of cells respectively housing resistors constituting a Wheatstone bridge circuit; a first flow path section through which a sample gas or a reference gas flows; a second flow path section provided so as to branch off of the first flow path section; and a supply gas switching unit connected to the first flow path section. Each resistor is constituted by a thermal conductivity thin-film sensor or a thermal conductivity semiconductor sensor. The plurality of cells include measurement cells that respectively house resistors located on one pair of opposite sides of the Wheatstone bridge circuit. The second flow path section connects to the measurement cells. The supply gas switching unit alternately supplies the sample gas and the reference gas to the first flow path section.

IPC Classes  ?

  • G01N 27/18 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of an electrically-heated body in dependence upon change of temperature caused by changes in the thermal conductivity of a surrounding material to be tested
  • G01N 25/18 - Investigating or analysing materials by the use of thermal means by investigating thermal conductivity

28.

RADIATION TEMPERATURE MEASUREMENT DEVICE, RADIATION TEMPERATURE MEASUREMENT METHOD, AND RADIATION TEMPERATURE MEASUREMENT PROGRAM

      
Application Number JP2025005873
Publication Number 2025/182774
Status In Force
Filing Date 2025-02-20
Publication Date 2025-09-04
Owner HORIBA, LTD. (Japan)
Inventor
  • Fujino, Sho
  • Saito, Takashi
  • Tominaga, Koji
  • Hirai, Asuka

Abstract

A radiation temperature measurement device 100 that detects infrared rays radiated from a measurement subject W to measure the temperature of the measurement subject W, the radiation temperature measurement device 100 comprising: an infrared ray detection unit 2 that detects the respective infrared ray amounts of a plurality of wavelength components and that detects the infrared ray amount of each of a plurality of polarization components in at least one of the plurality of wavelength components; and a temperature computation unit 3 that computes the temperature of the measurement subject W on the basis of at least three kinds of infrared ray amounts detected by the infrared ray detection unit 2.

IPC Classes  ?

  • G01J 5/59 - Radiation pyrometry, e.g. infrared or optical thermometry using polarisationDetails thereof
  • G01J 5/00 - Radiation pyrometry, e.g. infrared or optical thermometry
  • G01J 5/60 - Radiation pyrometry, e.g. infrared or optical thermometry using determination of colour temperature

29.

VAPORIZER AND VAPORIZATION SYSTEM

      
Application Number JP2025003893
Publication Number 2025/182512
Status In Force
Filing Date 2025-02-06
Publication Date 2025-09-04
Owner HORIBA STEC, CO., LTD. (Japan)
Inventor
  • Hirai, Soichiro
  • Yada, Hidetaka

Abstract

This vaporizer vaporizes a liquid material by heating a heating flow path through which the liquid material flows, and is characterized by including: a filter that is provided in the heating flow path and collects particles flowing through the heating flow path; a heat exchanger that is provided upstream of the filter in the heating flow path and performs heat exchange with the liquid material; and a pre-filter that is provided upstream of the filter in the heating flow path and collects the particles. The vaporizer is also characterized in that, in a cross-section taken orthogonal to the direction in which the fluid flows, a cross-section of the filter is provided so as to block the heating flow path, and a cross-section of the pre-filter does not block the heating flow path when compared to the cross-section of the filter.

IPC Classes  ?

  • C23C 16/448 - Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
  • B01J 7/02 - Apparatus for generating gases by wet methods
  • H01L 21/205 - Deposition of semiconductor materials on a substrate, e.g. epitaxial growth using reduction or decomposition of a gaseous compound yielding a solid condensate, i.e. chemical deposition

30.

FLUID DEVICE

      
Application Number 19057586
Status Pending
Filing Date 2025-02-19
First Publication Date 2025-08-21
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor Horiguchi, Hiroshi

Abstract

According to the present invention, it is possible to fix a fluid resistance element to a flow path while reducing positional displacement or vibration of the fluid resistance element in the flow path. A fixing mechanism that fixes a fluid resistance element to an internal flow path includes: an element holder that holds the fluid resistance element; a holder mounting portion that is formed to communicate with the internal flow path in a flow path block and on which the element holder is mounted; and a seal member interposed between the element holder and the holder mounting portion. In a state where the seal member is crushed by the element holder and a surface facing the element holder in the holder mounting portion, the element holder is positioned and mounted on the holder mounting portion.

IPC Classes  ?

  • G05D 7/06 - Control of flow characterised by the use of electric means
  • G01F 1/34 - Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow by using mechanical effects by measuring pressure or differential pressure
  • G01F 15/00 - Details of, or accessories for, apparatus of groups insofar as such details or appliances are not adapted to particular types of such apparatus

31.

UCMN

      
Application Number 1870108
Status Registered
Filing Date 2025-06-09
Registration Date 2025-06-09
Owner HORIBA, Ltd. (Japan)
NICE Classes  ?
  • 09 - Scientific and electric apparatus and instruments
  • 37 - Construction and mining; installation and repair services
  • 42 - Scientific, technological and industrial services, research and design

Goods & Services

Apparatus and instruments for measuring unburnt combustible content in ash, and parts and fittings therefor; apparatus and instruments for measuring and analyzing unburnt combustible content in ash, and parts and fittings therefor; gas measuring and analyzing apparatus and instruments, and parts and fittings therefor; mass concentration measuring apparatus and instruments, and parts and fittings therefor; mass concentration measuring and analyzing apparatus and instruments, and parts and fittings therefor; X-ray fluorescence apparatus and instruments for elemental analysis, and parts and fittings therefor; X-ray fluorescence apparatus and instruments for elemental measurement and analysis, and parts and fittings therefor; computer software for controlling apparatus and instruments for measuring unburnt combustible content in ash; computer software for controlling apparatus and instruments for measuring and analyzing unburnt combustible content in ash; computer software for controlling gas measuring and analyzing apparatus and instruments; computer software for controlling mass concentration measuring apparatus and instruments; computer software for controlling mass concentration measuring and analyzing apparatus and instruments; computer software for controlling X-ray fluorescence apparatus and instruments for elemental analysis; computer software for controlling X-ray fluorescence apparatus and instruments for elemental measurement and analysis; computer software for measuring or testing machines and instruments; computer software for laboratory apparatus and instruments; computer software; electronic computer and data processing machines and apparatus and their parts; measuring or testing machines and instruments; laboratory apparatus and instruments; optical machines and apparatus; cinematographic machines and apparatus; photographic machines and apparatus. Repair and maintenance of apparatus and instruments for measuring unburnt combustible content in ash; repair and maintenance of apparatus and instruments for measuring and analyzing unburnt combustible content in ash; repair and maintenance of gas measuring and analyzing apparatus and instruments; repair and maintenance of mass concentration measuring apparatus and instruments; repair and maintenance of mass concentration measuring and analyzing apparatus and instruments; repair and maintenance of X-ray fluorescence apparatus and instruments for elemental analysis; repair and maintenance of X-ray fluorescence apparatus and instruments for elemental measurement and analysis; repair and maintenance of measuring or testing machines and instruments; repair and maintenance of laboratory apparatus and instruments; repair and maintenance of electronic machines and apparatus; repair and maintenance of optical machines and apparatus; repair and maintenance of cinematographic machines and apparatus; repair and maintenance of photographic machines and apparatus. Rental of apparatus and instruments for measuring unburnt combustible content in ash; rental of apparatus and instruments for measuring and analyzing unburnt combustible content in ash; rental of gas measuring and analyzing apparatus and instruments; rental of mass concentration measuring apparatus and instruments; rental of mass concentration measuring and analyzing apparatus and instruments; rental of X-ray fluorescence apparatus and instruments for elemental analysis; rental of X-ray fluorescence apparatus and instruments for elemental measurement and analysis; rental of measuring or testing machines and instruments; rental of laboratory apparatus and instruments; rental of computers; calibration of apparatus and instruments for measuring unburnt combustible content in ash; calibration of apparatus and instruments for measuring and analyzing unburnt combustible content in ash; calibration of gas measuring and analyzing apparatus and instruments; calibration of mass concentration measuring apparatus and instruments; calibration of mass concentration measuring and analyzing apparatus and instruments; calibration of X-ray fluorescence apparatus and instruments for elemental analysis; calibration of X-ray fluorescence apparatus and instruments for elemental measurement and analysis; calibration of measuring or testing machines and instruments; calibration of laboratory apparatus and instruments; calibration of electronic machines and apparatus; calibration of optical machines and apparatus; calibration of cinematographic machines and apparatus; calibration of photographic machines and apparatus; design of apparatus and instruments for measuring unburnt combustible content in ash; design of apparatus and instruments for measuring and analyzing unburnt combustible content in ash; design of gas measuring and analyzing apparatus and instruments; design of mass concentration measuring apparatus and instruments; design of mass concentration measuring and analyzing apparatus and instruments; design of X-ray fluorescence apparatus and instruments for elemental analysis; design of X-ray fluorescence apparatus and instruments for elemental measurement and analysis; design of measuring or testing machines and instruments; design of laboratory apparatus and instruments; design of electronic machines and apparatus; design of optical machines and apparatus; design of cinematographic machines and apparatus; design of photographic machines and apparatus; design, programming and maintenance of computer software for controlling apparatus and instruments for measuring unburnt combustible content in ash; design, programming and maintenance of computer software for controlling apparatus and instruments for measuring and analyzing unburnt combustible content in ash; design, programming and maintenance of computer software for controlling gas measuring and analyzing apparatus and instruments; design, programming and maintenance of computer software for controlling mass concentration measuring apparatus and instruments; design, programming and maintenance of computer software for controlling mass concentration measuring and analyzing apparatus and instruments; design, programming and maintenance of computer software for controlling X-ray fluorescence apparatus and instruments for elemental analysis; design, programming and maintenance of computer software for controlling X-ray fluorescence apparatus and instruments for elemental measurement and analysis; design, programming and maintenance of computer software; rental of computer software for controlling apparatus and instruments for measuring unburnt combustible content in ash; rental of computer software for controlling apparatus and instruments for measuring and analyzing unburnt combustible content in ash; rental of computer software for controlling gas measuring and analyzing apparatus and instruments; rental of computer software for controlling mass concentration measuring apparatus and instruments; rental of computer software for controlling mass concentration measuring and analyzing apparatus and instruments; rental of computer software for controlling X-ray fluorescence apparatus and instruments for elemental analysis; rental of computer software for controlling X-ray fluorescence apparatus and instruments for elemental measurement and analysis; rental of computer software; providing on-line non-downloadable computer software for controlling apparatus and instruments for measuring unburnt combustible content in ash; providing on-line non-downloadable computer software for controlling apparatus and instruments for measuring and analyzing unburnt combustible content in ash; providing on-line non-downloadable computer software for controlling gas measuring and analyzing apparatus and instruments; providing on-line non-downloadable computer software for controlling mass concentration measuring apparatus and instruments; providing on-line non-downloadable computer software for controlling mass concentration measuring and analyzing apparatus and instruments; providing on-line non-downloadable computer software for controlling X-ray fluorescence apparatus and instruments for elemental analysis; providing on-line non-downloadable computer software for controlling X-ray fluorescence apparatus and instruments for elemental measurement and analysis; providing on-line non-downloadable computer software; designing of machines, apparatus, instruments [including their parts] or systems composed of such machines, apparatus and instruments; computer software design, computer programming, or maintenance of computer software; technological advice relating to computers, automobiles and industrial machines; testing or research on machines, apparatus and instruments.

32.

PARTICLE ANALYSIS DEVICE

      
Application Number 18702425
Status Pending
Filing Date 2023-01-17
First Publication Date 2025-08-14
Owner HORIBA, Ltd. (Japan)
Inventor
  • Sakuramoto, Keijiro
  • Mori, Tetsuya

Abstract

In order to enable a device to be installed in a limited space on the periphery of a line and to keep a path for transportation of a sample from the line short, the present invention is configured so as to comprise a flow cell through which a sample including particles flows, a light source for radiating light to the particles in the flow cell, a photodetector for detecting secondary light from the particles, and a computation circuit for detecting an autocorrelation function from a light intensity signal outputted from the photodetector and analyzing the autocorrelation function or the particles included in the sample, an optical system unit including the flow cell and the light source, and a control unit including the photodetector and the computation circuit being separate from each other and connected via a light guiding member for guiding the secondary light to the photodetector.

IPC Classes  ?

  • G01N 15/0205 - Investigating particle size or size distribution by optical means

33.

LIQUID MATERIAL VAPORIZING DEVICE, METHOD FOR CONTROLLING LIQUID MATERIAL VAPORIZING DEVICE, AND PROGRAM FOR CONTROLLING LIQUID MATERIAL VAPORIZING DEVICE

      
Application Number JP2024045290
Publication Number 2025/169623
Status In Force
Filing Date 2024-12-20
Publication Date 2025-08-14
Owner HORIBA STEC, CO., LTD. (Japan)
Inventor
  • Kawakado, Hajime
  • Oba, Hidenori
  • Taguchi, Akihiro

Abstract

This liquid material vaporizing device comprises: a tank 1 that stores a liquid material and in which the liquid material is vaporized; a supply path R1 that supplies the liquid material to the tank 1; a liquid level detection unit 2 that detects at least a first liquid level that is one of the liquid levels in the tank 1; a valve V1 that is provided in the supply path R1 and opens and closes the supply path R1; and a valve control unit 41 that opens the valve V1 to supply the liquid material to the tank 1 when the liquid level in the tank 1 is less than the first liquid level. The valve control unit 41 provides a closing duration at least once in which the closed state of the valve V1 continues until the liquid level in the tank 1 reaches the first liquid level from a level less than the first liquid level.

IPC Classes  ?

  • B01J 7/00 - Apparatus for generating gases
  • B01J 4/00 - Feed devicesFeed or outlet control devices
  • G05D 7/06 - Control of flow characterised by the use of electric means

34.

APPARATUS AND METHOD FOR TESTING AUTOMATED VEHICLES

      
Application Number 19189329
Status Pending
Filing Date 2025-04-25
First Publication Date 2025-08-07
Owner HORIBA INSTRUMENTS INCORPORATED (USA)
Inventor Breton, Leo Alphonse Gerard

Abstract

A vehicle test system includes a free-wheeling automobile wheel including a rim defining a rim passage, and a bearing that extends through the rim passage such that the bearing is outside the rim to support the free-wheeling automobile wheel and retracts through the rim passage such that the bearing is inside the rim.

IPC Classes  ?

  • G01M 17/013 - Wheels
  • G07C 5/08 - Registering or indicating performance data other than driving, working, idle, or waiting time, with or without registering driving, working, idle, or waiting time

35.

ENERGY ANALYSIS DEVICE, ENERGY MANAGEMENT SYSTEM, ENERGY ANALYSIS PROGRAM, AND ENERGY ANALYSIS METHOD

      
Application Number JP2025002590
Publication Number 2025/164611
Status In Force
Filing Date 2025-01-28
Publication Date 2025-08-07
Owner HORIBA, LTD. (Japan)
Inventor
  • Higa, Kazushi
  • Iwao, Keijiro
  • Shiomi, Kenji
  • Kakino, Toru

Abstract

The present invention enables efficient efforts for energy saving by analyzing electric power consumption data of a plurality of electric power supply facilities, the invention comprising: an electric power consumption data acquisition unit that acquires electric power consumption data of each of a plurality of electric power supply facilities for supplying electric power to a plurality of energy demand facilities; an electric power supply pattern model generation unit that performs multivariate analysis on the electric power consumption data, and generates an electric power supply pattern profile in which the plurality of electric power supply facilities are respectively classified into a plurality of electric power fluctuation patterns and/or an electric power supply pattern operation state sequence indicating operation states over time of the electric power supply pattern profile; and an electric power load amount calculation unit that, on the basis of the electric power supply pattern profile and/or the electric power supply pattern operation state sequence, calculates the electric power load amount of a plurality of energy demand facilities or the plurality of electric power supply facilities corresponding to the plurality of electric power fluctuation patterns, or the electric power load amount over time corresponding to the plurality of electric power fluctuation patterns.

IPC Classes  ?

  • H02J 13/00 - Circuit arrangements for providing remote indication of network conditions, e.g. an instantaneous record of the open or closed condition of each circuitbreaker in the networkCircuit arrangements for providing remote control of switching means in a power distribution network, e.g. switching in and out of current consumers by using a pulse code signal carried by the network
  • G06Q 50/06 - Energy or water supply

36.

GAS-LIQUID MIXER AND LIQUID MATERIAL VAPORIZER

      
Application Number 19041070
Status Pending
Filing Date 2025-01-30
First Publication Date 2025-08-07
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor
  • Hirai, Soichiro
  • Nishiwaki, Keisuke

Abstract

To reduce pressure loss in a gas-liquid mixer, provided is a main body block for mixing together a liquid material and a carrier gas, and a control valve disposed in the main body block that adjusts a flow rate of the liquid material. An annular liquid material supply groove having a supply port for the liquid material formed in an inner surface thereof, and an annular gas-liquid mixing groove having a supply port for the carrier gas and a discharge port for the gas-liquid mixture formed in an inner surface thereof are formed in a valve seat portion of the main body block which the control valve is either in contact with or is separated from. One of either the liquid material supply groove or the gas-liquid mixing groove is formed on an inner side of the other of the liquid material supply groove or the gas-liquid mixing groove.

IPC Classes  ?

  • B01F 35/83 - Forming a predetermined ratio of the substances to be mixed by controlling the ratio of two or more flows, e.g. using flow sensing or flow controlling devices
  • B01F 23/213 - Mixing gases with liquids by introducing liquids into gaseous media by spraying or atomising of the liquids
  • B01F 35/90 - Heating or cooling systems

37.

PLASMA GENERATOR AND COOLING JACKET

      
Application Number 19041307
Status Pending
Filing Date 2025-01-30
First Publication Date 2025-08-07
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor Watanabe, Yoshio

Abstract

A plasma generator includes: a microwave-generating source that generates a microwave; a cylindrical plasma generation tube through which a gas to be plasmatized by the microwave flows; a waveguide that transmits the microwave to the plasma generation tube; a matching device provided to the waveguide between the microwave-generating source and the plasma generation tube; a cooling jacket that is provided on an outer peripheral surface of the plasma generation tube for cooling; and a cylindrical casing that houses the plasma generation tube and the cooling jacket. The cooling jacket includes: three slits that extend along a traveling direction of the gas flowing through the plasma generation tube, or along a direction inclined with respect to the traveling direction, and through which the microwave passes toward the plasma generation tube; and a cooling channel that is provided between the slits adjacent to each other, and through which a cooling fluid flows.

IPC Classes  ?

  • H01J 37/32 - Gas-filled discharge tubes
  • H01J 37/244 - DetectorsAssociated components or circuits therefor

38.

MULTI-TRACK RAMAN ANALYZER

      
Application Number US2025013122
Publication Number 2025/160520
Status In Force
Filing Date 2025-01-27
Publication Date 2025-07-31
Owner HORIBA INSTRUMENTS INCORPORATED (USA)
Inventor
  • Vezard, Nicolas
  • Tuladhar, Aashish
  • George, Chris

Abstract

A spectroscopy system simultaneously obtains Raman measurements from multiple samples or multiple areas of a liquid or solid sample. At least two Raman probes simultaneously acquire spectra from the sample(s) using an imaging spectrometer having a single shared two-dimensional scientific CMOS sensor. Each probe is coupled to a laser, which may be integrated into the probe, and the spectrometer and includes a lens focusing laser light within or on the sample and collecting light from the sample for the spectrometer. The spectrometer images light from multiple probes simultaneously on the scientific CMOS sensor, spaced from one another to reduce crosstalk. A sample positioning device and a probe positioning mechanism may provide relative movement between samples or sample areas and the probes to acquire data from a different subset of samples or sample areas, and may also adjust probe distance from the sample(s) for desired laser focus spot size and location.

IPC Classes  ?

39.

MEXACUBE

      
Serial Number 79433442
Status Pending
Filing Date 2025-07-30
Owner HORIBA, Ltd. (Japan)
NICE Classes  ?
  • 09 - Scientific and electric apparatus and instruments
  • 37 - Construction and mining; installation and repair services
  • 42 - Scientific, technological and industrial services, research and design

Goods & Services

Measurement apparatus and instruments for vehicle engine emission, and parts and fittings therefor; measurement apparatus and instruments for engine emission, and parts and fittings therefor; measurement apparatus and instruments for emission, and parts and fittings therefor; measurement apparatus and instruments for exhaust gases, and parts and fittings therefor; measurement apparatus and instruments for process gases, and parts and fittings therefor; measuring and analyzing apparatus and instruments for vehicle engine emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for engine emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for exhaust gases, and parts and fittings therefor; measuring and analyzing apparatus and instruments for process gases, and parts and fittings therefor; on-board measurement apparatus and instruments for vehicle engine emission, and parts and fittings therefor; on-board measurement apparatus and instruments for engine emission, and parts and fittings therefor; on-board measurement apparatus and instruments for emission, and parts and fittings therefor; on-board measurement apparatus and instruments for exhaust gases, and parts and fittings therefor; on-board measurement apparatus and instruments for process gases, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for vehicle engine emission, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for engine emission, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for emission, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for exhaust gases, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for process gases, and parts and fittings therefor; portable measurement apparatus and instruments for vehicle engine emission, and parts and fittings therefor; portable measurement apparatus and instruments for engine emission, and parts and fittings therefor; portable measurement apparatus and instruments for emission, and parts and fittings therefor; portable measurement apparatus and instruments for exhaust gases, and parts and fittings therefor; portable measurement apparatus and instruments for process gases, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for vehicle engine emission, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for engine emission, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for emission, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for exhaust gases, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for process gases, and parts and fittings therefor; measurement apparatus and instruments for automobile emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for automobile emission, and parts and fittings therefor; measurement apparatus and instruments for vehicle emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for vehicle emission, and parts and fittings therefor; gas measurement apparatus and instruments, and parts and fittings therefor; gas measuring and analyzing apparatus and instruments, and parts and fittings therefor; vehicle engine testing apparatus and instruments, and parts and fittings therefor; automotive engine testing apparatus and instruments, and parts and fittings therefor; engine testing apparatus and instruments, and parts and fittings therefor; computer software for controlling measurement apparatus and instruments for vehicle engine emission; computer software for controlling measurement apparatus and instruments for engine emission; computer software for controlling measurement apparatus and instruments for emission; computer software for controlling measurement apparatus and instruments for exhaust gases; computer software for controlling measurement apparatus and instruments for process gases; computer software for controlling gas measurement apparatus and instruments; computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; computer software for controlling measuring and analyzing apparatus and instruments for engine emission; computer software for controlling measuring and analyzing apparatus and instruments for emission; computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; computer software for controlling measuring and analyzing apparatus and instruments for process gases; computer software for controlling gas measuring and analyzing apparatus and instruments; computer software for controlling engine testing apparatus and instruments; computer software; measuring or testing machines and instruments; laboratory apparatus and instruments; optical machines and apparatus; cinematographic machines and apparatus; photographic machines and apparatus. Repair or maintenance of measurement apparatus and instruments for vehicle engine emission; repair or maintenance of measurement apparatus and instruments for engine emission; repair or maintenance of measurement apparatus and instruments for emission; repair or maintenance of measurement apparatus and instruments for exhaust gases; repair or maintenance of measurement apparatus and instruments for process gases; repair or maintenance of measuring and analyzing apparatus and instruments for vehicle engine emission; repair or maintenance of measuring and analyzing apparatus and instruments for engine emission; repair or maintenance of measuring and analyzing apparatus and instruments for emission; repair or maintenance of measuring and analyzing apparatus and instruments for exhaust gases; repair or maintenance of measuring and analyzing apparatus and instruments for process gases; repair or maintenance of on-board measurement apparatus and instruments for vehicle engine emission; repair or maintenance of on-board measurement apparatus and instruments for engine emission; repair or maintenance of on-board measurement apparatus and instruments for emission; repair or maintenance of on-board measurement apparatus and instruments for exhaust gases; repair or maintenance of on-board measurement apparatus and instruments for process gases; repair or maintenance of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; repair or maintenance of on-board measuring and analyzing apparatus and instruments for engine emission; repair or maintenance of on-board measuring and analyzing apparatus and instruments for emission; repair or maintenance of on-board measuring and analyzing apparatus and instruments for exhaust gases; repair or maintenance of on-board measuring and analyzing apparatus and instruments for process gases; repair or maintenance of portable measurement apparatus and instruments for vehicle engine emission; repair or maintenance of portable measurement apparatus and instruments for engine emission; repair or maintenance of portable measurement apparatus and instruments for emission; repair or maintenance of portable measurement apparatus and instruments for exhaust gases; repair or maintenance of portable measurement apparatus and instruments for process gases; repair or maintenance of portable measuring and analyzing apparatus and instruments for vehicle engine emission; repair or maintenance of portable measuring and analyzing apparatus and instruments for engine emission; repair or maintenance of portable measuring and analyzing apparatus and instruments for emission; repair or maintenance of portable measuring and analyzing apparatus and instruments for exhaust gases; repair or maintenance of portable measuring and analyzing apparatus and instruments for process gases; repair or maintenance of measurement apparatus and instruments for automobile emission; repair or maintenance of measuring and analyzing apparatus and instruments for automobile emission; repair or maintenance of measurement apparatus and instruments for vehicle emission; repair or maintenance of measuring and analyzing apparatus and instruments for vehicle emission; repair or maintenance of gas measurement apparatus and instruments; repair or maintenance of gas measuring and analyzing apparatus and instruments; repair or maintenance of vehicle engine testing apparatus and instruments; repair or maintenance of automotive engine testing apparatus and instruments; repair or maintenance of engine testing apparatus and instruments; repair or maintenance of measuring or testing machines and instruments; repair or maintenance of laboratory apparatus and instruments; repair or maintenance of optical machines and apparatus; repair or maintenance of cinematographic machines and apparatus; repair or maintenance of photographic machines and apparatus. Rental of measurement apparatus and instruments for vehicle engine emission; rental of measurement apparatus and instruments for engine emission; rental of measurement apparatus and instruments for emission; rental of measurement apparatus and instruments for exhaust gases; rental of measurement apparatus and instruments for process gases; rental of measuring and analyzing apparatus and instruments for vehicle engine emission; rental of measuring and analyzing apparatus and instruments for engine emission; rental of measuring and analyzing apparatus and instruments for emission; rental of measuring and analyzing apparatus and instruments for exhaust gases; rental of measuring and analyzing apparatus and instruments for process gases; rental of on-board measurement apparatus and instruments for vehicle engine emission; rental of on-board measurement apparatus and instruments for engine emission; rental of on-board measurement apparatus and instruments for emission; rental of on-board measurement apparatus and instruments for exhaust gases; rental of on-board measurement apparatus and instruments for process gases; rental of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; rental of on-board measuring and analyzing apparatus and instruments for engine emission; rental of on-board measuring and analyzing apparatus and instruments for emission; rental of on-board measuring and analyzing apparatus and instruments for exhaust gases; rental of on-board measuring and analyzing apparatus and instruments for process gases; rental of portable measurement apparatus and instruments for vehicle engine emission; rental of portable measurement apparatus and instruments for engine emission; rental of portable measurement apparatus and instruments for emission; rental of portable measurement apparatus and instruments for exhaust gases; rental of portable measurement apparatus and instruments for process gases; rental of portable measuring and analyzing apparatus and instruments for vehicle engine emission; rental of portable measuring and analyzing apparatus and instruments for engine emission; rental of portable measuring and analyzing apparatus and instruments for emission; rental of portable measuring and analyzing apparatus and instruments for exhaust gases; rental of portable measuring and analyzing apparatus and instruments for process gases; rental of measurement apparatus and instruments for automobile emission; rental of measuring and analyzing apparatus and instruments for automobile emission; rental of measurement apparatus and instruments for vehicle emission; rental of measuring and analyzing apparatus and instruments for vehicle emission; rental of gas measurement apparatus and instruments; rental of gas measuring and analyzing apparatus and instruments; rental of vehicle engine testing apparatus and instruments; rental of automotive engine testing apparatus and instruments; rental of engine testing apparatus and instruments; rental of measuring or testing machines and instruments; rental of laboratory apparatus and instruments; calibration of measurement apparatus and instruments for vehicle engine emission; calibration of measurement apparatus and instruments for engine emission; calibration of measurement apparatus and instruments for emission; calibration of measurement apparatus and instruments for exhaust gases; calibration of measurement apparatus and instruments for process gases; calibration of measuring and analyzing apparatus and instruments for vehicle engine emission; calibration of measuring and analyzing apparatus and instruments for engine emission; calibration of measuring and analyzing apparatus and instruments for emission; calibration of measuring and analyzing apparatus and instruments for exhaust gases; calibration of measuring and analyzing apparatus and instruments for process gases; calibration of on-board measurement apparatus and instruments for vehicle engine emission; calibration of on-board measurement apparatus and instruments for engine emission; calibration of on-board measurement apparatus and instruments for emission; calibration of on-board measurement apparatus and instruments for exhaust gases; calibration of on-board measurement apparatus and instruments for process gases; calibration of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; calibration of on-board measuring and analyzing apparatus and instruments for engine emission; calibration of on-board measuring and analyzing apparatus and instruments for emission; calibration of on-board measuring and analyzing apparatus and instruments for exhaust gases; calibration of on-board measuring and analyzing apparatus and instruments for process gases; calibration of portable measurement apparatus and instruments for vehicle engine emission; calibration of portable measurement apparatus and instruments for engine emission; calibration of portable measurement apparatus and instruments for emission; calibration of portable measurement apparatus and instruments for exhaust gases; calibration of portable measurement apparatus and instruments for process gases; calibration of portable measuring and analyzing apparatus and instruments for vehicle engine emission; calibration of portable measuring and analyzing apparatus and instruments for engine emission; calibration of portable measuring and analyzing apparatus and instruments for emission; calibration of portable measuring and analyzing apparatus and instruments for exhaust gases; calibration of portable measuring and analyzing apparatus and instruments for process gases; calibration of measurement apparatus and instruments for automobile emission; calibration of measuring and analyzing apparatus and instruments for automobile emission; calibration of measurement apparatus and instruments for vehicle emission; calibration of measuring and analyzing apparatus and instruments for vehicle emission; calibration of gas measurement apparatus and instruments; calibration of gas measuring and analyzing apparatus and instruments; calibration of vehicle engine testing apparatus and instruments; calibration of automotive engine testing apparatus and instruments; calibration of engine testing apparatus and instruments; calibration of measuring or testing machines and instruments; calibration of laboratory apparatus and instruments; calibration of optical machines and apparatus; calibration of cinematographic machines and apparatus; calibration of photographic machines and apparatus; design of measurement apparatus and instruments for vehicle engine emission; design of measurement apparatus and instruments for engine emission; design of measurement apparatus and instruments for emission; design of measurement apparatus and instruments for exhaust gases; design of measurement apparatus and instruments for process gases; design of measuring and analyzing apparatus and instruments for vehicle engine emission; design of measuring and analyzing apparatus and instruments for engine emission; design of measuring and analyzing apparatus and instruments for emission; design of measuring and analyzing apparatus and instruments for exhaust gases; design of measuring and analyzing apparatus and instruments for process gases; design of on-board measurement apparatus and instruments for vehicle engine emission; design of on-board measurement apparatus and instruments for engine emission; design of on-board measurement apparatus and instruments for emission; design of on-board measurement apparatus and instruments for exhaust gases; design of on-board measurement apparatus and instruments for process gases; design of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; design of on-board measuring and analyzing apparatus and instruments for engine emission; design of on-board measuring and analyzing apparatus and instruments for emission; design of on-board measuring and analyzing apparatus and instruments for exhaust gases; design of on-board measuring and analyzing apparatus and instruments for process gases; design of portable measurement apparatus and instruments for vehicle engine emission; design of portable measurement apparatus and instruments for engine emission; design of portable measurement apparatus and instruments for emission; design of portable measurement apparatus and instruments for exhaust gases; design of portable measurement apparatus and instruments for process gases; design of portable measuring and analyzing apparatus and instruments for vehicle engine emission; design of portable measuring and analyzing apparatus and instruments for engine emission; design of portable measuring and analyzing apparatus and instruments for emission; design of portable measuring and analyzing apparatus and instruments for exhaust gases; design of portable measuring and analyzing apparatus and instruments for process gases; design of measurement apparatus and instruments for automobile emission; design of measuring and analyzing apparatus and instruments for automobile emission; design of measurement apparatus and instruments for vehicle emission; design of measuring and analyzing apparatus and instruments for vehicle emission; design of gas measurement apparatus and instruments; design of gas measuring and analyzing apparatus and instruments; design of vehicle engine testing apparatus and instruments; design of automotive engine testing apparatus and instruments; design of engine testing apparatus and instruments; design of measuring or testing machines and instruments; design of laboratory apparatus and instruments; design of optical machines and apparatus; design of cinematographic machines and apparatus; design of photographic machines and apparatus; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for vehicle engine emission; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for engine emission; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for emission; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for exhaust gases; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for process gases; design, programming and maintenance of computer software for controlling gas measurement apparatus and instruments; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for engine emission; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for emission; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for process gases; design, programming and maintenance of computer software for controlling gas measuring and analyzing apparatus and instruments; design, programming and maintenance of computer software for controlling engine testing apparatus and instruments; design, programming and maintenance of computer software; rental of computer software for controlling measurement apparatus and instruments for vehicle engine emission; rental of computer software for controlling measurement apparatus and instruments for engine emission; rental of computer software for controlling measurement apparatus and instruments for emission; rental of computer software for controlling measurement apparatus and instruments for exhaust gases; rental of computer software for controlling measurement apparatus and instruments for process gases; rental of computer software for controlling gas measurement apparatus and instruments; rental of computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; rental of computer software for controlling measuring and analyzing apparatus and instruments for engine emission; rental of computer software for controlling measuring and analyzing apparatus and instruments for emission; rental of computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; rental of computer software for controlling measuring and analyzing apparatus and instruments for process gases; rental of computer software for controlling gas measuring and analyzing apparatus and instruments; rental of computer software for controlling engine testing apparatus and instruments; rental of computer software; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for vehicle engine emission; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for engine emission; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for emission; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for exhaust gases; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for process gases; providing on-line non-downloadable computer software for controlling gas measurement apparatus and instruments; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for engine emission; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for emission; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for process gases; providing on-line non-downloadable computer software for controlling gas measuring and analyzing apparatus and instruments; providing on-line non-downloadable computer software for controlling engine testing apparatus and instruments; providing on-line non-downloadable computer software; designing of machines, apparatus, instruments [including their parts] or systems composed of such machines, apparatus and instruments; computer software design, computer programming, or maintenance of computer software; technological advice relating to computers, automobiles and industrial machines; testing or research on machines, apparatus and instruments.

40.

Flow ratio controller system operating in alternative control modes

      
Application Number 18416713
Grant Number 12399516
Status In Force
Filing Date 2024-01-18
First Publication Date 2025-07-24
Grant Date 2025-08-26
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor
  • Lowery, Patrick
  • Gundlach, Maximilian Martin
  • Yasuda, Tadahiro
  • Price, Andrew

Abstract

A flow ratio controller system includes an inlet receiving a total inlet fluid flow from one or more inlet channels, distribution channels fluidically connected to the inlet and arranged in parallel in a branching flow path downstream of the inlet, and a controller. The distribution channels includes a hybrid distribution channel. The controller selectively operates in alternative control modes including a flow verification control mode and a flow ratio control mode. In the flow verification control mode, the controller calculates a calibrated value for a reference volume using measurements from a mass flow meter in the hybrid distribution channel, then calculates a target channel calibration value for the mass flow meter in the target distribution channel. In the flow ratio control mode, the controller controls each of the distribution channels, including the hybrid channel, according to a respective flow ratio setpoint for each distribution channel.

IPC Classes  ?

  • G05D 11/13 - Controlling ratio of two or more flows of fluid or fluent material characterised by the use of electric means
  • G01F 25/10 - Testing or calibration of apparatus for measuring volume, volume flow or liquid level or for metering by volume of flowmeters

41.

RADIATION DETECTION DEVICE AND RADIATION DETECTOR

      
Application Number 18851523
Status Pending
Filing Date 2023-04-25
First Publication Date 2025-07-10
Owner HORIBA, LTD. (Japan)
Inventor
  • Matsunaga, Daisuke
  • Minowa, Hiroki

Abstract

A radiation detection device including an illumination unit illuminating a sample, an irradiation unit irradiating the sample with X-rays and a radiation detection element detecting X-rays generated from the sample is provided with a magnetic field production unit that produces a magnetic field in part of a space from the sample to the radiation detection element and a block that holds the magnetic field production unit. The block is located at a position where light from the illumination unit to the radiation detection element is shielded.

IPC Classes  ?

  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
  • G01T 1/24 - Measuring radiation intensity with semiconductor detectors

42.

RADIATION DETECTION ELEMENT, RADIATION DETECTOR, RADIATION DETECTION DEVICE, AND METHOD FOR MANUFACTURING RADIATION DETECTION ELEMENT

      
Application Number 18681896
Status Pending
Filing Date 2022-08-18
First Publication Date 2025-07-10
Owner HORIBA, LTD. (Japan)
Inventor Ishikura, Koji

Abstract

A radiation detection element includes: a semiconductor part including an incidence surface to which radiations to be detected are incident; a first electrode provided on the incidence surface; and a second electrode that is provided on the incidence surface and is disposed at a position surrounding the periphery of the first electrode. The radiation detection element is a silicon drift-type radiation detection element, and is provided with an insulating protective film that covers the second electrode.

IPC Classes  ?

  • G01T 1/24 - Measuring radiation intensity with semiconductor detectors
  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
  • H10F 39/00 - Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group , e.g. radiation detectors comprising photodiode arrays
  • H10F 39/18 - Complementary metal-oxide-semiconductor [CMOS] image sensorsPhotodiode array image sensors

43.

CONVEYANCE DEVICE, ANALYSIS SYSTEM, PROGRAM FOR CONVEYANCE DEVICE, AND CONVEYANCE METHOD

      
Application Number 18853181
Status Pending
Filing Date 2023-03-31
First Publication Date 2025-07-10
Owner HORIBA, Ltd. (Japan)
Inventor
  • Tatewaki, Yasuhiro
  • Mori, Tetsuya

Abstract

To provide a conveyance device that is more user-friendly than conventional devices, and further enhance workability, a conveyance device that conveys a container accommodating a sample to an analysis device includes: a pallet in which a plurality of installation portions is provided, the container being installed in the installation portions; sensors that are provided for the respective installation portions in one-to-one correspondence, and acquire container information that is information obtained when the container is installed; a conveyance unit that picks up the container installed in the pallet, and conveys the container to the analysis device; and a conveyance control unit that causes the conveyance unit to pick up the container in accordance with a pick-up order determined on the basis of the container information.

IPC Classes  ?

  • G01N 35/04 - Details of the conveyor system
  • B65G 1/137 - Storage devices mechanical with arrangements or automatic control means for selecting which articles are to be removed
  • G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups Handling materials therefor

44.

ION ANALYSIS DEVICE AND ION ANALYSIS METHOD

      
Application Number JP2024041993
Publication Number 2025/142287
Status In Force
Filing Date 2024-11-27
Publication Date 2025-07-03
Owner
  • HORIBA ADVANCED TECHNO, CO., LTD. (Japan)
  • HORIBA, LTD. (Japan)
Inventor
  • Miyamura, Kazuhiro
  • Kido, Masanori
  • Okada, Yoichi
  • Yamashita, Tsubasa

Abstract

Provided is an ion analysis device capable of performing measurements using a sample liquid with a smaller liquid volume than conventional methods. The ion analysis device comprises: a measurement electrode provided with a response unit which responds to ions; a reference electrode provided with a liquid junction section; a measurement flow path in which the response membrane and the liquid junction section are disposed; and a calculation unit that calculates the ion concentration in the sample liquid on the basis of the potential difference between the measurement electrode and the reference electrode, the device further comprising a hydrophilic section connecting the response unit and the liquid junction section inside the measurement flow path.

IPC Classes  ?

  • G01N 27/416 - Systems
  • G01N 27/28 - Electrolytic cell components
  • G01N 27/30 - Electrodes, e.g. test electrodesHalf-cells
  • H01M 8/02 - Fuel cellsManufacture thereof Details
  • H01M 8/04 - Auxiliary arrangements, e.g. for control of pressure or for circulation of fluids
  • H01M 8/0444 - ConcentrationDensity

45.

GAS ANALYSIS DEVICE, GAS ANALYSIS METHOD, AND PROGRAM FOR GAS ANALYSIS DEVICE

      
Application Number JP2024043601
Publication Number 2025/142454
Status In Force
Filing Date 2024-12-10
Publication Date 2025-07-03
Owner HORIBA, LTD. (Japan)
Inventor
  • Mizutani, Naoto
  • Nakamura, Kentaro

Abstract

This gas analysis device is for analyzing a target gas containing hydrogen gas that is a main component and at least one impurity gas that is a sub-component. The gas analysis device comprises: a comparison chamber where a first resistance element that has a constant current flowing therethrough and that generates heat is disposed, and where hydrogen gas is introduced into; a measurement chamber where a second resistance element that has a constant current flowing therethrough and that generates heat is disposed, and where the target gas is introduced into; a bridge circuit that is formed by comprising the first resistance element and the second resistance element in a closed circuit and that detects the resistivity of the second resistance element or a related value thereof; a calibration curve data storage unit that is for storing calibration curve data that indicates, using the hydrogen gas as a base gas and a predetermined single component gas other than the hydrogen gas as a span gas, the relationship between the resistivity of the second resistance element detected by the bridge circuit or a related value thereof and the concentration of the span gas; and a concentration calculation unit for estimating the total concentration of the impurity gas in the target gas in terms of a gas component in which the thermal conductivity is greater than or equal to that of oxygen, on the basis of the calibration curve data and the resistivity of the second resistance element detected by the bridge circuit or the related value thereof.

IPC Classes  ?

  • G01N 25/18 - Investigating or analysing materials by the use of thermal means by investigating thermal conductivity
  • G01N 27/12 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a solid body in dependence upon absorption of a fluidInvestigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a solid body in dependence upon reaction with a fluid

46.

MEASUREMENT PROBE, MEASUREMENT PROBE UNIT, MEASUREMENT DEVICE, AND MEASUREMENT METHOD

      
Application Number JP2024044569
Publication Number 2025/142627
Status In Force
Filing Date 2024-12-17
Publication Date 2025-07-03
Owner HORIBA, LTD. (Japan)
Inventor Wakabayashi Satoru

Abstract

Provided is a measurement probe for realizing a measurement device capable of measuring characteristic values of biopolymers, such as protein, in real time at a lower concentration than conventional devices. The measurement probe is used by being connected to a light source and a detector by means of an optical fiber, and comprises: a cylindrical housing having a first port and a second port formed at one end, the first port introducing light from a first optical fiber and outputting light to the first optical fiber, and the second port outputting light to a second optical fiber; a reflective member that is located inside the housing, is provided at an end of the housing on the opposite side to the end at which the first port and the second port are formed, and reflects and refracts light introduced from the first port toward the second port; and a measurement target liquid accommodating portion formed between two window members that are disposed on an output optical path passing between the reflective member and the second port.

IPC Classes  ?

  • G01N 21/01 - Arrangements or apparatus for facilitating the optical investigation
  • G01N 21/47 - Scattering, i.e. diffuse reflection
  • G01N 21/59 - Transmissivity
  • G01N 21/64 - FluorescencePhosphorescence

47.

END POINT DETECTION DEVICE, ETCHING CONTROL SYSTEM, END POINT DETECTION METHOD, AND END POINT DETECTION PROGRAM

      
Application Number 18999366
Status Pending
Filing Date 2024-12-23
First Publication Date 2025-07-03
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor
  • Imanishi, Michie
  • Hada, Miyako
  • Sakaguchi, Yuhei
  • Minami, Masakazu
  • Takahashi, Motonobu

Abstract

An end point detection device that detects an end point in etching processing of a multilayer film, includes a measurement unit that measures a physical quantity that changes with the etching processing, an end point detection unit that detects an end point in a target film for which the end point is to be detected using a predetermined detection algorithm based on a measurement value obtained by the measurement unit, and an algorithm change unit that changes the detection algorithm in the film that is being subjected to the etching processing based on the measurement value obtained by the measurement unit when another film of a same type as the target film was being subjected to the etching processing in a same multilayer film as the target film currently being etching processed.

IPC Classes  ?

  • H01L 21/67 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereofApparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components

48.

VEHICLE TESTING SYSTEM, VEHICLE TESTING METHOD, AND VEHICLE TESTING PROGRAM

      
Application Number JP2024043828
Publication Number 2025/142489
Status In Force
Filing Date 2024-12-11
Publication Date 2025-07-03
Owner HORIBA, LTD. (Japan)
Inventor
  • Shiota Aoi
  • Kawazoe Hiroshi

Abstract

This vehicle testing system comprises: a first output pattern acquiring unit that acquires, as a first output pattern, travel data when a target vehicle travels in a prescribed environment; a second output pattern acquiring unit that acquires, as a second output pattern, travel data when a traveling vehicle travels along a prescribed travel route; a data acquiring unit that acquires, from the first output pattern, a plurality of items of similar data and a plurality of items of instantaneous energy consumption data; and a calculating unit that adds up a plurality of instantaneous energy consumptions to calculate a total energy consumption when the target vehicle is assumed to travel along the prescribed travel route.

IPC Classes  ?

49.

FLUORESCENCE MEASUREMENT PROBE, FLUORESCENCE MEASUREMENT PROBE UNIT, AND FLUORESCENCE MEASURING DEVICE

      
Application Number JP2024044582
Publication Number 2025/142635
Status In Force
Filing Date 2024-12-17
Publication Date 2025-07-03
Owner HORIBA, LTD. (Japan)
Inventor Wakabayashi, Satoru

Abstract

Provided is a fluorescence measuring device capable of measuring biopolymers such as proteins in real time at lower concentrations than in conventional devices. This fluorescence measurement probe is used by being connected by an optical fiber to a light source for irradiating a liquid being measured with excitation light and a detector for detecting fluorescence derived from the liquid being measured that is excited by the excitation light from the light source, the fluorescence measurement probe being provided with: a port for introducing the excitation light from the optical fiber and for guiding out fluorescence and scattered light from the liquid being measured to the optical fiber; a condensing optical system for collimating and/or condensing the excitation light, the fluorescence, and the scattered light; a polarizing plate transparent to the excitation light, the fluorescence, and the scattered light; and a housing for internally accommodating the condensing optical system and the polarizing plate and having an opening portion for injecting the excitation light into the liquid being measured and taking in the fluorescence and the scattered light from the liquid being measured.

IPC Classes  ?

50.

HYDROGEN ELECTROCHEMICAL SYSTEM, METHOD FOR DETERMINING STATE OF HYDROGEN CELL STACK, AND PROGRAM

      
Application Number JP2024045705
Publication Number 2025/142931
Status In Force
Filing Date 2024-12-24
Publication Date 2025-07-03
Owner HORIBA, LTD. (Japan)
Inventor
  • Matsunaga Shimpachi
  • Higa Kazushi
  • Yamashita Tsubasa

Abstract

In the present invention, a hydrogen electrochemical system 100 comprises an acquisition unit 541, a storage unit 53, and a determination unit 544. The acquisition unit 541 acquires at least distribution information Ds2, De2, and Dt2 indicating the distribution of a physical quantity Q in a hydrogen cell stack 1. In the hydrogen cell stack 1, water is generated by an electrochemical reaction in which hydrogen is used, or vice versa. The storage unit 53 stores correlation data Dc. The correlation data Dc indicates a correlation between the state of the hydrogen cell stack 1 and a feature amount φ that is converted from at least the information Ds2 and De2 regarding the distribution in the hydrogen cell stack 1 in a state including a normal state and one or more abnormal states. On the basis of the correlation information Dc, the determination unit 544 determines the state of the hydrogen cell stack 1 from at least the distribution information Dt2 of the hydrogen cell stack 1 in operation.

IPC Classes  ?

  • H01M 8/04 - Auxiliary arrangements, e.g. for control of pressure or for circulation of fluids
  • C25B 1/04 - Hydrogen or oxygen by electrolysis of water
  • C25B 9/00 - Cells or assemblies of cellsConstructional parts of cellsAssemblies of constructional parts, e.g. electrode-diaphragm assembliesProcess-related cell features
  • C25B 15/025 - Measuring, analysing or testing during electrolytic production of electrolyte parameters
  • C25B 15/027 - Temperature
  • H01M 8/10 - Fuel cells with solid electrolytes
  • H01M 8/0432 - TemperatureAmbient temperature
  • H01M 8/04492 - HumidityAmbient humidityWater content
  • H01M 8/04664 - Failure or abnormal function
  • H01M 8/04992 - Processes for controlling fuel cells or fuel cell systems characterised by the implementation of mathematical or computational algorithms, e.g. feedback control loops, fuzzy logic, neural networks or artificial intelligence

51.

CLEANING DEVICE AND SUBSTRATE PROCESSING SYSTEM

      
Application Number JP2024044607
Publication Number 2025/142639
Status In Force
Filing Date 2024-12-17
Publication Date 2025-07-03
Owner HORIBA STEC, CO., LTD. (Japan)
Inventor Watanabe Yoshio

Abstract

This cleaning device 100 for separating an inflow gas Go and particles that are contained in the gas Go includes a housing 1, a plate-shaped baffle 2, and a plurality of plasma units 5. The housing 1 has a cylindrical shape extending in the axial direction Da, and has an inflow port 121 and an outflow port 131 for the gas Go. The baffle 2 is disposed within the housing 1. The plasma units 5 generate plasma within the housing 1. The inside of the housing 1 has a plurality of internal spaces 14, and is configured so that the gas Go flowing thereinto from the inflow port 121 can flow out from the outflow port 131. Some internal spaces 14 adjacent to each other are connected so that the gas Go can flow therethrough. At least some adjacent internal spaces 14 are adjacent to each other by the intermediary of the baffle 2. The plasma units 5 are disposed with respect to at least two internal spaces 14.

IPC Classes  ?

  • C23C 16/44 - Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
  • C23C 14/00 - Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
  • H01L 21/31 - Treatment of semiconductor bodies using processes or apparatus not provided for in groups to form insulating layers thereon, e.g. for masking or by using photolithographic techniquesAfter-treatment of these layersSelection of materials for these layers
  • H01L 21/205 - Deposition of semiconductor materials on a substrate, e.g. epitaxial growth using reduction or decomposition of a gaseous compound yielding a solid condensate, i.e. chemical deposition
  • H01L 21/3065 - Plasma etchingReactive-ion etching
  • H05H 1/46 - Generating plasma using applied electromagnetic fields, e.g. high frequency or microwave energy

52.

FLUID CONTROL VALVE, FLUID CONTROL DEVICE, AND FLUID CONTROL VALVE MANUFACTURING METHOD

      
Application Number 18852129
Status Pending
Filing Date 2023-03-27
First Publication Date 2025-06-26
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor Shakudo, Kazuya

Abstract

The present invention improves the sealability of a fluid control valve, and includes a valve seat having a flat valve seat surface and a valve plug having a flat sitting surface sitting on the valve seat surface. A first surface that is one of the valve seat surface and the sitting surface has a surface hardness higher than a surface hardness of a second surface that is the other one of the valve seat surface and the sitting surface.

IPC Classes  ?

  • F16K 1/42 - Valve seats
  • F16K 1/54 - Arrangements for modifying the way in which the rate of flow varies during the actuation of the valve
  • F16K 37/00 - Special means in or on valves or other cut-off apparatus for indicating or recording operation thereof, or for enabling an alarm to be given

53.

PRESSURE FLOW RATE SENSOR, FLOW RATE CALCULATION DEVICE, FLOW RATE CALCULATION METHOD, FLOW RATE CALCULATION PROGRAM, AND FLUID CONTROL DEVICE

      
Application Number 18990774
Status Pending
Filing Date 2024-12-20
First Publication Date 2025-06-26
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor Yokoi, Shuntaro

Abstract

The present invention is configured to calculate a flow rate across a wide range of flow rate, from a low range to a high range, and includes: a fluid resistance element provided to a channel; an upstream pressure sensor that detects an upstream pressure with respect to the fluid resistance element; a downstream pressure sensor that detects a downstream pressure with respect to the fluid resistance element; and a flow rate calculation unit that calculates a flow rate based on the upstream pressure and the downstream pressure, in which the flow rate calculation unit calculates the flow rate based on viscous resistance, inertial resistance, and a degree of effect of rarefaction.

IPC Classes  ?

  • G01F 1/36 - Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow by using mechanical effects by measuring pressure or differential pressure the pressure or differential pressure being created by the use of flow constriction

54.

PARTICLE NUMBER MEASUREMENT SYSTEM, BRAKE INSPECTION SYSTEM, AND PARTICLE NUMBER MEASUREMENT METHOD

      
Application Number JP2024036850
Publication Number 2025/134506
Status In Force
Filing Date 2024-10-16
Publication Date 2025-06-26
Owner HORIBA, LTD. (Japan)
Inventor
  • Kitahara, Takahiro
  • Fukushima, Suguru

Abstract

The present invention reduces the cost for introducing a particle number measurement system, and reduces the difference between the uncertainty in measurement of the number of solid particles and the uncertainty in measurement of the total number of particles. The present invention comprises: a first diluter for diluting a sample gas; an evaporator for vaporizing volatile particles contained in the sample gas diluted by the first diluter; a second diluter for diluting the sample gas that has passed through the evaporator; a first particle number measurement device for measuring the number of particles contained in the sample gas diluted by the second diluter as the number of solid particles obtained by removing the volatile particles; and a second particle number measurement device for measuring the number of particles contained in the sample gas that has been diluted by the first diluter and is yet to pass through the evaporator as the total number of particles including the volatile particles.

IPC Classes  ?

  • G01N 15/06 - Investigating concentration of particle suspensions
  • G01M 17/007 - Wheeled or endless-tracked vehicles
  • G01N 1/02 - Devices for withdrawing samples
  • G01N 15/00 - Investigating characteristics of particlesInvestigating permeability, pore-volume or surface-area of porous materials

55.

PARTICLE SIZE DISTRIBUTION MEASUREMENT DEVICE, PARTICLE SIZE DISTRIBUTION MEASUREMENT METHOD, AND PROGRAM FOR PARTICLE SIZE DISTRIBUTION MEASUREMENT DEVICE

      
Application Number JP2024042708
Publication Number 2025/134758
Status In Force
Filing Date 2024-12-03
Publication Date 2025-06-26
Owner HORIBA, LTD. (Japan)
Inventor Sugasawa, Hirosuke

Abstract

The present invention is a particle size distribution measurement device, wherein is provided a history data management part 33 that facilitates integrated recognition of various stored operations, states of devices, and instantaneous values of particle size measurement results, and that causes a history data storage part D1 to store an operation history indicating the history of operations performed on the particle size distribution measurement device 100 by an operator, a measurement result history indicating the history of particle size measurement results, or a device state history indicating the history of the state of the particle size distribution measurement device 100, in a format that can be displayed as a time-series graph.

IPC Classes  ?

  • G01N 15/0205 - Investigating particle size or size distribution by optical means

56.

PARTICLE SIZE DISTRIBUTION MEASUREMENT SYSTEM, PARTICLE SIZE DISTRIBUTION MEASUREMENT METHOD, AND PARTICLE SIZE DISTRIBUTION MEASUREMENT PROGRAM

      
Application Number JP2024043046
Publication Number 2025/134788
Status In Force
Filing Date 2024-12-05
Publication Date 2025-06-26
Owner HORIBA, LTD. (Japan)
Inventor
  • Sakuramoto, Keijiro
  • Mori, Tetsuya

Abstract

This particle size distribution measurement system comprises: a cell that accommodates a test liquid containing particles; a test liquid supply unit that samples the test liquid from a generation flow passage through which the test liquid flows, and supplies the test liquid to the cell via a flow passage; a particle size distribution measurement unit that measures the particle size distribution of the particles by irradiating the test liquid with light and detecting scattered light produced from the particles; a cleaning liquid supply unit that, after the measurement of the particle size distribution is complete, supplies a cleaning liquid to the cell via a flow passage, said cleaning liquid being a liquid that cleans the cell; and a contamination determination unit that determines contamination of the cell on the basis of transmitted light and/or scattered light from the cell during a condition in which the cleaning liquid is supplied to the cell.

IPC Classes  ?

  • G01N 15/0205 - Investigating particle size or size distribution by optical means
  • G01N 1/00 - SamplingPreparing specimens for investigation
  • G01N 21/15 - Preventing contamination of the components of the optical system or obstruction of the light path

57.

INFORMATION PROCESSING METHOD, INFORMATION PROCESSING DEVICE, AND COMPUTER PROGRAM

      
Application Number JP2024041560
Publication Number 2025/134691
Status In Force
Filing Date 2024-11-25
Publication Date 2025-06-26
Owner HORIBA, LTD. (Japan)
Inventor Murata, Shunsuke

Abstract

Provided are an information processing method, an information processing device, and a computer program for outputting a response corresponding to a request of a user with respect to an analysis device. In the present invention, a query pertaining to an analysis device is acquired, a language generation model is used to acquire a response pertaining to control of the analysis device corresponding to the query, and the response is output.

IPC Classes  ?

  • G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups Handling materials therefor
  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

58.

RADIATION DETECTION DEVICE, CONTROL METHOD, AND COMPUTER PROGRAM

      
Application Number JP2024041367
Publication Number 2025/126801
Status In Force
Filing Date 2024-11-22
Publication Date 2025-06-19
Owner HORIBA, LTD. (Japan)
Inventor
  • Matsunaga, Daisuke
  • Bamba, Tomohiro

Abstract

Provided are a radiation detection device, a control method, and a computer program capable of appropriately adjusting the temperature of a radiation detection element. The radiation detection device comprises: a sample chamber inside which a sample is disposed; a radiation detection element that is disposed inside the sample chamber and is for detecting radiation generated from the sample; an atmosphere adjustment unit that adjusts the atmosphere inside the sample chamber to either a state in which the inside of the sample chamber is depressurized or a state in which a predetermined gas is introduced into the sample chamber; a temperature adjustment unit that adjusts the temperature of the radiation detection element; and a control unit. When the atmosphere adjustment unit adjusts the atmosphere inside the sample chamber to the state in which the predetermined gas is introduced, the control unit causes the temperature adjustment unit to adjust the temperature of the radiation detection element to a higher temperature than when the atmosphere adjustment unit adjusts the atmosphere inside the sample chamber to the state in which the inside of the sample chamber is depressurized.

IPC Classes  ?

  • H01J 37/244 - DetectorsAssociated components or circuits therefor
  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
  • G01T 7/00 - Details of radiation-measuring instruments
  • H01J 37/252 - Tubes for spot-analysing by electron or ion beamsMicroanalysers

59.

XTROLOGY

      
Application Number 1859351
Status Registered
Filing Date 2025-04-03
Registration Date 2025-04-03
Owner HORIBA STEC, Co., Ltd. (Japan)
NICE Classes  ? 09 - Scientific and electric apparatus and instruments

Goods & Services

Semiconductor wafer inspection apparatus; analyzing apparatus for defect of semiconductor wafers; analyzing apparatus for stress of semiconductor wafers; analyzing apparatus for composition of semiconductor wafers; semiconductor wafer measuring apparatus; semiconductor wafer testing apparatus; semiconductor photomask inspection apparatus; analyzing apparatus for defect of semiconductor photomasks; analyzing apparatus for stress of semiconductor photomasks; analyzing apparatus for composition of semiconductor photomasks; semiconductor photomask measuring apparatus; semiconductor photomask testing apparatus; semiconductor reticle inspection apparatus; analyzing apparatus for defect of semiconductor reticles; analyzing apparatus for stress of semiconductor reticles; analyzing apparatus for composition of semiconductor reticles; semiconductor reticle measuring apparatus; semiconductor reticle testing apparatus; semiconductor substrate inspection apparatus; analyzing apparatus for defect of semiconductor substrates; analyzing apparatus for stress of semiconductor substrates; analyzing apparatus for composition of semiconductor substrates; semiconductor substrate measuring apparatus; semiconductor substrate testing apparatus; sensors for mapping semiconductor wafers; Raman spectrographic measurement apparatus, and parts and accessories therefor; Raman spectroscopic analyzing apparatus, and parts and accessories therefor; measuring apparatus for measuring film thickness; measuring apparatus for spectral measurements; automated optical inspection apparatus; X-ray fluorescence measuring apparatus; measuring or testing machines and instruments, and parts and accessories therefor; photoluminescence or fluorescence microscope spectrometers, and parts and accessories therefor; photoluminescence or fluorescence microscope spectrographs, and parts and accessories therefor; optical machines and apparatus; photographic machines and apparatus; cinematographic machines and apparatus; laboratory apparatus and instruments; computer software for inspection, defect analysis, stress analysis, composition analysis, measurement and testing of semiconductor wafers, photomasks, reticles and substrates; computer software; computer programs; scanning probe microscopes; X-ray fluorescence analyzing apparatus; electronic computer and data processing machines and apparatus and their parts; power distribution or control machines and apparatus; rotary converters; phase modifiers; batteries and cells; electric or magnetic meters and testers; electric wires and cables; spectacles [eyeglasses and goggles]; life-saving apparatus and equipment; telecommunication machines and apparatus; fire alarms; gas alarms; water leak alarms; oil leak alarms; anti-theft warning apparatus.

60.

ELECTROSTATIC CHUCK DEVICE AND COOLING PLATE

      
Application Number 18956305
Status Pending
Filing Date 2024-11-22
First Publication Date 2025-06-12
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor
  • Gonzalez, Esteban
  • Nayak, Ajayaketan
  • Yasuda, Tadahiro

Abstract

The present invention is an electrostatic chuck device which makes a temperature of a target object clamped to a clamping plate uniform and clamps the target object via an electrostatic force, including: a clamping plate having a clamping surface that clamps a target object to its front surface side; and a cooling plate which is provided on a back surface side of the clamping plate and which has an internal flow channel through which a coolant flows, in which the internal flow channel forms a flow channel geometry in which flow channel elements of an identical pattern in a plan view are systematically connected.

IPC Classes  ?

  • H01L 21/683 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereofApparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components for supporting or gripping
  • H01J 37/32 - Gas-filled discharge tubes

61.

BATTERY CHARGING DEVICE, BATTERY CHARGING METHOD, AND BATTERY CHARGING PROGRAM

      
Application Number JP2024041531
Publication Number 2025/121172
Status In Force
Filing Date 2024-11-22
Publication Date 2025-06-12
Owner HORIBA, LTD. (Japan)
Inventor
  • Matsunaga, Shimpachi
  • Tatsukawa, Shogo

Abstract

The present invention is for efficiently measuring internal resistance for use as a battery degradation index during battery charging, and comprises: a battery charging unit 2 that supplies charging current and/or voltage to a battery B; a battery management unit 3 that manages the charging state of the battery B; a pulse signal generation unit 4 that superimposes, at one or more charging points corresponding to the charging state of the battery B, pulse current or voltage on the charging current or voltage and supplies the same to the battery; an internal resistance calculation unit 5 that calculates the internal resistance of the battery B on the basis of the current value and the voltage value of the battery obtained when charging power superposed with pulse power has been supplied; and a data management unit 6 that records, in a memory, the internal resistance calculated by the internal resistance calculation unit 5.

IPC Classes  ?

  • H02J 7/10 - Regulation of the charging current or voltage using discharge tubes or semiconductor devices using semiconductor devices only
  • G01R 31/382 - Arrangements for monitoring battery or accumulator variables, e.g. SoC
  • G01R 31/385 - Arrangements for measuring battery or accumulator variables
  • G01R 31/389 - Measuring internal impedance, internal conductance or related variables
  • G01R 31/392 - Determining battery ageing or deterioration, e.g. state of health
  • H01M 10/44 - Methods for charging or discharging
  • H01M 10/48 - Accumulators combined with arrangements for measuring, testing or indicating the condition of cells, e.g. the level or density of the electrolyte
  • H02J 7/00 - Circuit arrangements for charging or depolarising batteries or for supplying loads from batteries

62.

MULTI-TRACK RAMAN ANALYZER

      
Application Number 19037340
Status Pending
Filing Date 2025-01-27
First Publication Date 2025-06-12
Owner HORIBA INSTRUMENTS INCORPORATED (USA)
Inventor
  • Vezard, Nicolas
  • Tuladhar, Aashish
  • George, Chris

Abstract

A spectroscopy system simultaneously obtains Raman measurements from multiple samples or multiple areas of a liquid or solid sample. At least two Raman probes simultaneously acquire spectra from the sample(s) using an imaging spectrometer having a single shared two-dimensional scientific CMOS sensor. Each probe is coupled to a laser, which may be integrated into the probe, and the spectrometer and includes a lens focusing laser light within or on the sample and collecting light from the sample for the spectrometer. The spectrometer images light from multiple probes simultaneously on the scientific CMOS sensor, spaced from one another to reduce crosstalk. A sample positioning device and a probe positioning mechanism may provide relative movement between samples or sample areas and the probes to acquire data from a different subset of samples or sample areas, and may also adjust probe distance from the sample(s) for desired laser focus spot size and location.

IPC Classes  ?

  • G01J 3/44 - Raman spectrometryScattering spectrometry
  • G01J 3/02 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours Details
  • G01J 3/12 - Generating the spectrumMonochromators
  • G01N 21/65 - Raman scattering

63.

VAPORIZATION DEVICE, MATERIAL STATE DETERMINATION DEVICE, MATERIAL STATE DETERMINATION METHOD FOR VAPORIZATION DEVICE, AND MATERIAL STATE DETERMINATION PROGRAM FOR VAPORIZATION DEVICE

      
Application Number 18956405
Status Pending
Filing Date 2024-11-22
First Publication Date 2025-06-12
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor
  • Ikeyama, Toshihiro
  • Watanabe, Takao

Abstract

A vaporizer that vaporizes a material, a flow rate control device including a flow rate sensor that measures a flow rate of a material gas generated by the vaporizer, and a determination unit that determines that the material gas has returned to a state before the vaporization on the basis of a transient response of the flow rate measured by the flow rate sensor are included.

IPC Classes  ?

  • G05D 7/06 - Control of flow characterised by the use of electric means
  • G01F 1/68 - Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow by using thermal effects
  • G01N 11/02 - Investigating flow properties of materials, e.g. viscosity or plasticityAnalysing materials by determining flow properties by measuring flow of the material

64.

SYSTEM AND METHOD FOR ENHANCED RF POWER DELIVERY USING HARMONIC WAVEFORM SYNTHESIS

      
Application Number 18976123
Status Pending
Filing Date 2024-12-10
First Publication Date 2025-06-12
Owner HORIBA STEC CO., LTD. (Japan)
Inventor Turner, Terry R.

Abstract

The present disclosure provides a RF power delivery method for delivering the RF power to a plasma load in a microelectronic manufacturing environment. The RF power delivery method includes generating a harmonically distorted sinusoidal waveform. Such harmonically distorted sinusoidal waveform being derived from a predetermined harmonic signature corresponding to a desired plasma state. Next, the method includes amplifying the harmonically distorted sinusoidal waveform and capable of operating under conditions of high reflected power. Next, the method includes interfacing with a non-linear plasma load impedance. Thereafter, the method includes measuring the RF power spectrum at an output of the fixed impedance matching network, the measured spectrum being used to adjust the amplified harmonically distorted sinusoidal waveform to recreate a desired plasma state.

IPC Classes  ?

65.

PARTICLE ANALYZING DEVICE, PARTICLE ANALYSIS METHOD, AND PARTICLE ANALYSIS PROGRAM

      
Application Number 18841496
Status Pending
Filing Date 2023-03-02
First Publication Date 2025-06-05
Owner HORIBA, Ltd. (Japan)
Inventor Tatewaki, Yasuhiro

Abstract

In analysis of a particle by a PTA method, in order to enable each particle to be analyzed for each type while suppressing increase in size and cost of a device even in a case where excitation wavelengths of fluorescent markers or particles having property of autofluorescence overlap each other, a light irradiation unit (2) that irradiates a sample emitting fluorescence of a plurality of colors with excitation light, one or a plurality of filters (5) that transmits the fluorescence of the plurality of colors while cutting off excitation light, an imaging unit (3) having color identification ability to image fluorescence passing through the filter (5), and an analysis unit (43) that obtains a diffusion rate due to Brownian motion of a particle included in a sample from image data of fluorescence obtained by the imaging unit (3) and analyzes physical property of the particle are included.

IPC Classes  ?

66.

SAMPLE CARRIER AND SAMPLE ANALYSIS SYSTEM

      
Application Number JP2024038894
Publication Number 2025/115509
Status In Force
Filing Date 2024-10-31
Publication Date 2025-06-05
Owner HORIBA, LTD. (Japan)
Inventor
  • Kawakami, Shun
  • Park, Sangwoon

Abstract

This sample carrier is used in a sample analyzer for extracting and analyzing a component, as a gas, generated by heating a measurement sample, and is detachably attached to a predetermined sample input position provided to the sample analyzer. The sample carrier comprises: a container body which has an accommodation chamber for accommodating the measurement sample therein, and which has formed on the bottom surface thereof a sample outlet port for discharging the measurement sample in the accommodation chamber; a bottom plate which is rotatably attached to a bottom part of the container body through a seal member, and on which through-holes are formed in a manner opening to the upper surface and the lower surface; and a distance adjustment mechanism for adjusting an inter-surface distance between the upper surface of the bottom plate and the bottom surface of the container body. The sample carrier is configured such that, by having one of the container body and the bottom plate rotate with respect to the other, the sample outlet port moves between: a predetermined sealed position where the sample outlet port is blocked by the upper surface of the bottom plate and the accommodating chamber is sealed airtight; and an open position where the sample outlet port opens to the through-holes of the bottom plate and the measurement sample can be discharged. The distance adjustment mechanism adjusts an inter-surface distance while the sample outlet port is moving between the sealed position and the open position so as to be longer than the inter-surface distance when the sample outlet port is at the sealed position.

IPC Classes  ?

  • G01N 31/12 - Investigating or analysing non-biological materials by the use of the chemical methods specified in the subgroupsApparatus specially adapted for such methods using combustion
  • G01N 1/00 - SamplingPreparing specimens for investigation

67.

PROCESSING ADJUSTING DEVICE, PARTICLE SIZE DISTRIBUTION MEASURING SYSTEM, PROCESSING ADJUSTING METHOD, AND PROCESSING ADJUSTING PROGRAM

      
Application Number JP2024040665
Publication Number 2025/115654
Status In Force
Filing Date 2024-11-15
Publication Date 2025-06-05
Owner HORIBA, LTD. (Japan)
Inventor
  • Sakuramoto, Keijiro
  • Mori, Tetsuya

Abstract

This processing adjusting device is for adjusting processes in a particle size distribution measuring system comprising a particle size distribution measuring unit that measures the particle size distribution of a sample, and a sample supply unit that samples the sample and supplies the sample to the particle size distribution measuring unit, the processing adjusting device comprising: a sampling interval accepting unit that accepts a sampling interval, which is a time from the start of a sampling process for sampling the sample to the start of the next sampling process; and a process time adjusting unit that, if the sampling interval accepted by the sampling interval accepting unit is equal to or less than a prescribed value, adjusts the processing time of at least one of the sampling process for sampling the sample, a measuring process for measuring the particle size distribution of the sample, a cleaning process for cleaning the particle size distribution measuring unit or the sample supply unit, and a standby process for waiting until the start of the next sampling process.

IPC Classes  ?

  • G01N 15/0205 - Investigating particle size or size distribution by optical means
  • G01N 1/00 - SamplingPreparing specimens for investigation
  • G01N 15/00 - Investigating characteristics of particlesInvestigating permeability, pore-volume or surface-area of porous materials
  • G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups Handling materials therefor

68.

INVERTAU

      
Application Number 1858474
Status Registered
Filing Date 2025-04-28
Registration Date 2025-04-28
Owner HORIBA Instruments Incorporated (USA)
NICE Classes  ? 09 - Scientific and electric apparatus and instruments

Goods & Services

Fluorescence spectrometers; scientific apparatus and instruments for optical analysis, namely, spectrometers, photoluminescence and fluorescence spectrometers; apparatus and instruments for photoluminescence lifetime measurement and spectrographs; microscopes; confocal microscopes for performing fluorescence lifetime imaging (FLIM); microscopes for capturing and analyzing fluorescence decay profiles for use in measuring molecular interactions, local environmental conditions, and biological parameters including FRET, pH, viscosity, binding efficiency, and temperature.

69.

PARTICLE SIZE DISTRIBUTION MEASUREMENT SYSTEM, PARTICLE SIZE DISTRIBUTION MEASUREMENT METHOD, AND PARTICLE SIZE DISTRIBUTION MEASUREMENT PROGRAM

      
Application Number JP2024040664
Publication Number 2025/115653
Status In Force
Filing Date 2024-11-15
Publication Date 2025-06-05
Owner HORIBA, LTD. (Japan)
Inventor
  • Sakuramoto, Keijiro
  • Mori, Tetsuya

Abstract

This particle size distribution measurement system comprises: a particle size distribution measurement unit that measures the particle size distribution of specimens; a specimen supply unit that samples the specimens and supplies the sampled specimens to the particle size distribution measurement unit through a flow path through which the sampled specimens flow; and an arrival time calculation unit that calculates, on the basis of flow path information that is information about the flow path, an arrival time that is the period of time from when the specimens are sampled to when the specimens reach the particle size distribution measurement unit.

IPC Classes  ?

  • G01N 15/0205 - Investigating particle size or size distribution by optical means
  • G01N 1/00 - SamplingPreparing specimens for investigation
  • G01N 1/10 - Devices for withdrawing samples in the liquid or fluent state
  • G01N 15/00 - Investigating characteristics of particlesInvestigating permeability, pore-volume or surface-area of porous materials
  • G01N 15/0227 - Investigating particle size or size distribution by optical means using imagingInvestigating particle size or size distribution by optical means using holography

70.

DEVICE AND METHOD FOR PRODUCING A CONCENTRATED REAGENT FROM A SOLID SUBSTANCE

      
Application Number FR2024051558
Publication Number 2025/114665
Status In Force
Filing Date 2024-11-26
Publication Date 2025-06-05
Owner HORIBA ABX SAS (France)
Inventor
  • Donnarumma, Dario
  • Couderc, Guilhem

Abstract

The invention relates to a device (1) for producing a concentrated reagent, comprising: - a solvent reservoir (3), - a container (5) containing a solid substance having a solubility in water at 20°C of greater than or equal to 340 g/l, - a pump (9), and - a production circuit (11) including a first line (13) provided with a first valve (15) and a second line (17) provided with a second valve (19). The pump (9) is fluidically connected to the reservoir (3) and to the container (5) respectively by the first line (13) and the second line (17). The pump (9) makes it possible to take solvent from the reservoir (3) and then deliver it to the container (5) such that a concentrated reagent is produced therein by dissolving at least a portion of the solid substance in the solvent.

IPC Classes  ?

  • G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
  • B01F 21/20 - Dissolving using flow mixing
  • B01F 21/00 - Dissolving
  • B01F 35/71 - Feed mechanisms
  • B01F 35/75 - Discharge mechanisms

71.

DEVICE AND METHOD FOR PERFORMING A COMPLETE BLOOD COUNT AND DETERMINING A SEDIMENTATION RATE

      
Application Number 18856808
Status Pending
Filing Date 2023-04-14
First Publication Date 2025-05-29
Owner HORIBA ABX SAS (France)
Inventor
  • Piedcoq, Philippe
  • Couderc, Guilhem

Abstract

A device for performing a complete blood count and for determining a sedimentation rate comprises a first group (4) arranged so as to sample a blood sample from a tube and to carry out a complete blood count on this sample, characterised in that it comprises a second group (6) arranged so as to sample a blood sample from a tube and to carry out a sedimentation rate determination. This device comprises at least one sampling member (8) which could be controlled for a measurement by the first group (4) and a measurement by the second group (6) for sampling a blood sample so that a sample sampled for the first group (4) is not used by the second group (6), and that a sample sampled for the second group (6) is not used by the first group (4), the second group (6) being provided with a sensor (20) comprising an infrared light source (12) and an optical sensor (14) arranged substantially opposite one another around a tube (16) connected to an outlet end of the at least one sampling member (8) so that the light emitted by the infrared light source (12) reaches the optical sensor (14) after having crossed said tube (16). This device further comprises a converter (10) arranged so as to receive one or more light-transmission measurement(s) from the optical sensor (14) and to determine a sedimentation rate.

IPC Classes  ?

  • G01N 15/05 - Investigating sedimentation of particle suspensions in blood
  • G01N 15/01 - Investigating characteristics of particlesInvestigating permeability, pore-volume or surface-area of porous materials specially adapted for biological cells, e.g. blood cells
  • G01N 15/14 - Optical investigation techniques, e.g. flow cytometry

72.

MACHINE LEARNING DEVICE, VEHICLE TESTING SYSTEM, MACHINE LEARNING METHOD, AND VEHICLE TESTING METHOD

      
Application Number 18868716
Status Pending
Filing Date 2023-05-15
First Publication Date 2025-05-29
Owner HORIBA, LTD. (Japan)
Inventor
  • Komatsu, Yoji
  • Nagaoka, Makoto

Abstract

The present invention makes it possible to simplify the task of reproducing a load such as a road gradient resistance or the like when a vehicle is actually traveling on a road, and includes a learning data acquisition unit that acquires learning data formed by load data that includes a road gradient resistance of a travel route and driving resistance variables deriving from a vehicle's behavior, and by vehicle traveling data that includes a vehicle's speed, accelerator pedal position, and brake pedal position when that vehicle is traveling on the travel route, and a machine learning unit that employs machine learning to determine a correlation between the load data and the vehicle traveling data, and then creates a simulated gradient prediction model that shows the correlation between the load data and the vehicle traveling data.

IPC Classes  ?

  • G06F 30/27 - Design optimisation, verification or simulation using machine learning, e.g. artificial intelligence, neural networks, support vector machines [SVM] or training a model
  • G01M 17/007 - Wheeled or endless-tracked vehicles
  • G06F 119/14 - Force analysis or force optimisation, e.g. static or dynamic forces

73.

Device and method for determining a sedimentation rate

      
Application Number 18856821
Grant Number 12449343
Status In Force
Filing Date 2023-04-13
First Publication Date 2025-05-29
Grant Date 2025-10-21
Owner HORIBA ABX SAS (France)
Inventor
  • Piedcoq, Philippe
  • Couderc, Guilhem
  • Fudaly, Christophe

Abstract

A device for determining a sedimentation rate comprises at least one member for sampling a blood sample, and a sensor comprising an infrared light source and an optical sensor arranged substantially opposite each other around a substantially transparent portion of the sampling member so that the light emitted by the infrared light source reaches the optical sensor after having passed through said substantially transparent portion. The optical sensor is arranged so as to carry out a blank measurement. A converter is arranged so as to receive one or more light transmission measurements from the optical sensor, to calculate the ratio between the blank measurement and the one or more light transmission measurements and to return a sedimentation rate.

IPC Classes  ?

  • G01N 15/05 - Investigating sedimentation of particle suspensions in blood

74.

Device for spreading or colouring and determining a sedimentation rate

      
Application Number 18856813
Grant Number 12313516
Status In Force
Filing Date 2023-04-13
First Publication Date 2025-05-27
Grant Date 2025-05-27
Owner HORIBA ABX SAS (France)
Inventor
  • Couderc, Guilhem
  • Beauducel, Florent
  • Thoraval, Coralie

Abstract

A device for spreading or colouring and for determining a sedimentation rate includes a first group arranged so as to sample a blood sample from a tube and to carry out a smear test on the sample and a second group arranged so as to sample a blood sample from a tube and to carry out a sedimentation rate determination. At least one sampling member is controllable for an operation by the first group and an operation by the second group for sampling a blood sample so that a sample sampled for one group is not used by the other group. The second group is provided with a sensor. A converter is arranged so as to receive one or more light-transmission measurements from the sensor and to determine a sedimentation rate.

IPC Classes  ?

  • G01N 15/05 - Investigating sedimentation of particle suspensions in blood
  • G01N 1/28 - Preparing specimens for investigation
  • G01N 33/49 - Physical analysis of biological material of liquid biological material blood

75.

FLOW RATE MEASUREMENT MECHANISM AND FLUID CONTROL APPARATUS

      
Application Number 18948860
Status Pending
Filing Date 2024-11-15
First Publication Date 2025-05-22
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor
  • Cocciadiferro, Edward
  • Dick, John

Abstract

A fluid resistance element is disposed on a flow path along which flows a fluid, and in which a resistance flow path is formed. A fluid receiving portion is provided on the flow path and is hit by the fluid flowing from upstream of the fluid resistance element so as to cause the fluid to flow to a side. Flexible components support the fluid resistance element and deform in accordance with a flow rate of the fluid. A displacement sensor measures a displacement of the flexible components, and a flow rate calculation unit calculates a flow rate of the fluid based on the displacement. The fluid that is made to flow to the side by the fluid receiving portion flows along the resistance flow path of the fluid resistance element.

IPC Classes  ?

  • G01F 1/38 - Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow by using mechanical effects by measuring pressure or differential pressure the pressure or differential pressure being created by the use of flow constriction the pressure or differential pressure being measured by means of a movable element, e.g. diaphragm, piston, Bourdon tube or flexible capsule
  • G01F 1/40 - Details of construction of the flow constriction devices

76.

ANALYSIS DEVICE, ANALYSIS SYSTEM, ANALYSIS METHOD, AND PROGRAM

      
Application Number JP2024038226
Publication Number 2025/105150
Status In Force
Filing Date 2024-10-25
Publication Date 2025-05-22
Owner HORIBA, LTD. (Japan)
Inventor Yamaguchi, Kazuki

Abstract

The objective of the present invention is to accurately calculate an amount of particulate matter without being affected by changes in the amount of light emitted onto the particulate matter. An analysis device (100) comprises: a holding member (1) that holds particulate matter (FP); a light source (3) that emits light toward an imaging target area (VA) including a holding area of the holding member (1) in which the particulate matter (FP) is held; a two-dimensional sensor (4) that images the imaging target area (VA); and a calculating unit (5) that calculates particle amount-related information relating to the amount of particulate matter (FP) on the basis of analysis image data acquired by employing the two-dimensional sensor (4) to image the imaging target area (VA) for use in analyzing the particulate matter (FP), and an impact resulting from a change in the amount of light from the light source (3) when the analysis image data were acquired, relative to a reference amount of light.

IPC Classes  ?

  • G01N 15/075 - Investigating concentration of particle suspensions by optical means
  • G01N 1/02 - Devices for withdrawing samples
  • G01N 21/17 - Systems in which incident light is modified in accordance with the properties of the material investigated
  • G06T 7/00 - Image analysis
  • G06V 20/69 - Microscopic objects, e.g. biological cells or cellular parts

77.

PARTICLE ANALYSIS DEVICE, PARTICLE ANALYSIS DEVICE PROGRAM, AND PARTICLE ANALYSIS METHOD

      
Application Number 18841503
Status Pending
Filing Date 2023-03-28
First Publication Date 2025-05-22
Owner HORIBA, Ltd. (Japan)
Inventor
  • Sugasawa, Hirosuke
  • Tatewaki, Yasuhiro
  • Igushi, Tatsuo

Abstract

A particle analysis device can take a fluorescence observation mode in which fluorescence emitted by a fluorescent marker added to a particle or by the particle itself is imaged by irradiating the particle with excitation light, and a scattered light observation mode in which scattered light produced by irradiating the particle with the light is imaged. A particle specifying unit specifies the particle to which the fluorescent marker is added or the particle that emits the fluorescence from fluorescence image data obtained in the fluorescence observation mode. An analyzing unit analyzes physical properties of the particle by obtaining diffusion speed due to the Brownian motion of the particle specified by the particle specifying unit from the image data of the scattered light obtained in the scattered light observation mode having a frame number larger than that in the fluorescence observation mode.

IPC Classes  ?

  • G01N 15/1434 - Optical arrangements
  • G01N 15/01 - Investigating characteristics of particlesInvestigating permeability, pore-volume or surface-area of porous materials specially adapted for biological cells, e.g. blood cells
  • G01N 33/58 - Chemical analysis of biological material, e.g. blood, urineTesting involving biospecific ligand binding methodsImmunological testing involving labelled substances

78.

LIQUID MATERIAL VAPORIZATION APPARATUS AND OPERATION SETTING METHOD THEREOF

      
Application Number 18950461
Status Pending
Filing Date 2024-11-18
First Publication Date 2025-05-22
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor
  • Oba, Hidenori
  • Kawakado, Hajime

Abstract

A liquid material vaporization apparatus operates such that, in a gas generation mode, a liquid material is supplied to a tank through a supply path via a first on-off valve set to a predetermined first opening degree, and operates such that, in a purge mode, a purge gas is introduced into the tank through the supply path via the first on-off valve set to a second opening degree that is larger than the first opening degree.

IPC Classes  ?

  • F22B 35/00 - Control systems for steam boilers
  • F22B 37/78 - Adaptations or mounting of level indicators
  • H01L 21/67 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereofApparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components

79.

X-RAY ANALYSIS DEVICE

      
Application Number JP2024038984
Publication Number 2025/105205
Status In Force
Filing Date 2024-10-31
Publication Date 2025-05-22
Owner HORIBA, LTD. (Japan)
Inventor
  • Aoyama, Tomoki
  • Ohashi, Satoshi
  • Tajima, Mikiya

Abstract

An x-ray analysis device according to the present invention is to analyze the elements included in a measurement sample transported in a prescribed direction and comprises an x-ray irradiation unit that radiates x-rays toward the measurement sample, an x-ray detection unit that faces the measurement sample and detects x-ray fluorescence produced from the measurement sample, and a standard sample that has a known element content and is provided in a region of overlap between a region irradiated with the x-rays radiated from the x-ray irradiation unit and a region in which x-ray fluorescence can be detected by the x-ray detection unit.

IPC Classes  ?

  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

80.

HYDROGEN DETECTION DEVICE AND HYDROGEN DETECTION METHOD

      
Application Number JP2024033736
Publication Number 2025/100115
Status In Force
Filing Date 2024-09-20
Publication Date 2025-05-15
Owner HORIBA, LTD. (Japan)
Inventor
  • Shiba, Takumi
  • Naya, Hiroshi

Abstract

This hydrogen detection device for detecting hydrogen contained in a gas in a chamber or in a pipe comprises: a casing which is inserted into the chamber or the pipe and has an internal space into which the gas can be introduced; a physical quantity change part which is provided in the internal space and in which a physical quantity changes according to the concentration of the hydrogen; and a physical quantity detection part which is provided in the internal space and detects the physical quantity in the physical quantity change part. The internal space is separated into a first space and a second space by a separation member. The gas is introduced into the first space and the physical quantity change part is housed in the first space. The gas is not introduced into the second space and the physical quantity detection part is housed in the second space.

IPC Classes  ?

  • G01N 21/78 - Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator producing a change of colour

81.

PARTICLE SIZE DISTRIBUTION MEASURING DEVICE, PARTICLE SIZE DISTRIBUTION MEASURING METHOD, PROGRAM FOR PARTICLE SIZE DISTRIBUTION MEASURING DEVICE, AND KIT FOR PARTICLE SIZE DISTRIBUTION MEASURING DEVICE

      
Application Number 18728676
Status Pending
Filing Date 2023-01-18
First Publication Date 2025-05-15
Owner HORIBA, Ltd. (Japan)
Inventor Tatewaki, Yasuhiro

Abstract

A particle size distribution measuring device includes: a measurement cell including a sample accommodation space that accommodates a sample obtained by dispersing a plurality of particles in a dispersion medium; a stirring means that stirs the sample by sucking and discharging the sample in the measurement cell; a light irradiation unit that irradiates the sample in the measurement cell with light; a light detection unit that detects scattered light or fluorescent light generated from the sample in the measurement cell; and an analysis unit that measures a particle size distribution of a particle group including the plurality of particles using a detection signal obtained by the light detection unit.

IPC Classes  ?

  • G01N 15/0205 - Investigating particle size or size distribution by optical means
  • G01N 1/38 - Diluting, dispersing or mixing samples
  • G01N 15/01 - Investigating characteristics of particlesInvestigating permeability, pore-volume or surface-area of porous materials specially adapted for biological cells, e.g. blood cells

82.

PITOT TUBE FLOWMETER, GAS ANALYSIS DEVICE, AND GAS ANALYSIS METHOD

      
Application Number 18835696
Status Pending
Filing Date 2023-03-02
First Publication Date 2025-05-08
Owner HORIBA, LTD. (Japan)
Inventor
  • Mizutani, Naoto
  • Nagaoka, Makoto
  • Inoue, Kentaro
  • Uraoka, Masaru
  • Iseki, Hirotaka

Abstract

The present invention makes a pitot tube type flowmeter less affected by the flow velocity distribution caused by the flow passage shape on the upstream side, and includes a pitot tube having total pressure holes for detecting a total pressure of a fluid and static pressure holes for detecting a static pressure of the fluid, and a differential pressure sensor that is connected to the pitot tube and detects a differential pressure between the total pressure and the static pressure. The pitot tube includes a main tube portion, and a plurality of branch tube portions, which branches off from the main tube portion and in which the total pressure holes and the static pressure holes are formed. Each of the main tube portion and the plurality of branch tube portions has a shape that reduces a pressure loss.

IPC Classes  ?

83.

CONTROL PARAMETER CALCULATION APPARATUS, CONTROL PARAMETER CALCULATION METHOD, AND CONTROL PARAMETER CALCULATION PROGRAM

      
Application Number 18938474
Status Pending
Filing Date 2024-11-06
First Publication Date 2025-05-08
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor
  • Higuchi, Seiji
  • Takijiri, Kotaro

Abstract

A control parameter calculation apparatus calculates a control parameter of a fluid control apparatus that controls a fluid. The control parameter calculation apparatus stores correlation data indicating a correlation of a reference control parameter of the fluid control apparatus and a reference response signal output by using the reference control parameter, acquires a target response signal output by using a target control parameter of the fluid control apparatus different from the fluid control apparatus serving as a reference, acquires the correlation data and the target response signal and calculates a correlation control parameter corresponding to the target response signal in the fluid control apparatus serving as a reference by using the correlation data, and calculates an adjustment amount of the target control parameter based on the correlation control parameter and the reference control parameter.

IPC Classes  ?

  • G05D 7/06 - Control of flow characterised by the use of electric means

84.

COMPOSITION FOR HEMATOLOGY ANALYSES

      
Application Number FR2024051428
Publication Number 2025/093835
Status In Force
Filing Date 2024-10-29
Publication Date 2025-05-08
Owner HORIBA ABX SAS (France)
Inventor
  • Donnarumma, Dario
  • Adjemian, Jocelyne

Abstract

The invention relates to a composition for hematology analyses and to the method for producing same. The composition comprises an anticoagulant, in an amount of between 0.1% and 8% by weight, preferably between 2% and 6%; a salt in an amount of between 30% and 90% by weight, preferably between 50% and 80%; a pH buffer in an amount of between 0.1% and 50% by weight, preferably greater than or equal to 10%; and a surfactant in an amount of between 0.01% and 2% by weight, preferably between 0.05% and 1.5%, in solid form. The invention also relates to a solution obtained from the solid composition.

IPC Classes  ?

  • G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups Handling materials therefor

85.

DILUTION MECHANISM, PARTICLE SIZE DISTRIBUTION MEASUREMENT SYSTEM, PARTICLE SIZE DISTRIBUTION MEASUREMENT METHOD, AND PROGRAM FOR PARTICLE SIZE DISTRIBUTION MEASUREMENT

      
Application Number 18728729
Status Pending
Filing Date 2023-01-17
First Publication Date 2025-05-01
Owner
  • HORIBA, Ltd. (Japan)
  • HORIBA Advanced Techno, Co., Ltd. (Japan)
Inventor
  • Sakuramoto, Keijiro
  • Mori, Tetsuya
  • Habu, Kazunori

Abstract

A dilution mechanism includes: a sample line that guides the sample containing the particles to the particle size distribution measurement device; a dilution line that merges with the sample line and through which a diluent flows; a concentration adjusting unit that adjusts the concentration of the particles contained in the diluted sample; a conductivity measuring unit that measures a conductivity of the diluted sample; a control unit that controls the concentration adjusting unit to bring the conductivity measured by the conductivity measuring unit or a conductivity-related value that is a value calculated from the conductivity, to a predetermined target value.

IPC Classes  ?

  • G01N 15/06 - Investigating concentration of particle suspensions
  • G01N 1/38 - Diluting, dispersing or mixing samples
  • G01N 15/14 - Optical investigation techniques, e.g. flow cytometry

86.

DYNAMIC LIGHT SCATTERING TYPE PARTICLE DIAMETER DISTRIBUTION MEASURING DEVICE, DYNAMIC LIGHT SCATTERING TYPE PARTICLE DIAMETER DISTRIBUTION MEASURING METHOD, AND DYNAMIC LIGHT SCATTERING TYPE PARTICLE DIAMETER DISTRIBUTION MEASURING PROGRAM

      
Application Number JP2024037561
Publication Number 2025/089267
Status In Force
Filing Date 2024-10-22
Publication Date 2025-05-01
Owner HORIBA, LTD. (Japan)
Inventor Sakuramoto, Keijiro

Abstract

Provided is a dynamic light scattering type particle diameter distribution measuring device comprising: a light irradiation unit that irradiates a sample flowing through a flow path with light; a light detection unit that detects light scattered by the sample; a particle diameter distribution calculation unit that calculates the particle diameter distribution of the sample on the basis of the light intensity obtained by the light detection unit; a flow rate acquisition unit that acquires the flow rate of the sample flowing through the flow path; and a particle diameter distribution correction unit that corrects the particle diameter distribution calculated by the particle diameter distribution calculation unit, on the basis of the flow rate acquired by the flow rate acquisition unit.

IPC Classes  ?

  • G01N 15/0205 - Investigating particle size or size distribution by optical means

87.

INVERTAU

      
Serial Number 99154006
Status Pending
Filing Date 2025-04-24
Owner HORIBA Instruments Incorporated ()
NICE Classes  ? 09 - Scientific and electric apparatus and instruments

Goods & Services

Fluorescence spectrometers other than for medical purposes; scientific apparatus and instruments for optical analysis, namely, spectrometers, photoluminescence and fluorescence spectrometers; scientific apparatus and instruments for photoluminescence lifetime measurement and spectrographs; microscopes; confocal microscopes for performing fluorescence lifetime imaging (FLIM); microscopes for capturing and analyzing fluorescence decay profiles for use in measuring molecular interactions, local environmental conditions, and biological parameters including FRET, pH, viscosity, binding efficiency, and temperature

88.

SIGNAL PROCESSING METHOD, SIGNAL PROCESSING DEVICE, RADIATION DETECTION APPARATUS AND RECORDING MEDIUM

      
Application Number 18682769
Status Pending
Filing Date 2022-08-12
First Publication Date 2025-04-24
Owner HORIBA, LTD. (Japan)
Inventor
  • Murata, Shunsuke
  • Valiev, Ildar

Abstract

A signal processing method for processing a signal including a response wave generated in response to detection of radiation, includes: measuring a feature corresponding to a duration of a response wave or a response wave group composed of a plurality of response waves; counting, for each wave height, the number of response waves or response wave groups whose measured features are included in a predetermined first range in which a feature of a single response wave is included; and performing correction processing of subtracting a specific value from a counted number according to a response wave or a response wave group whose feature is not included in the first range.

IPC Classes  ?

  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
  • G01T 1/17 - Circuit arrangements not adapted to a particular type of detector

89.

FLUID CONTROL VALVE, FLUID CONTROL DEVICE AND DRIVE CIRCUIT

      
Application Number 18923498
Status Pending
Filing Date 2024-10-22
First Publication Date 2025-04-24
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor Takakura, Hiroshi

Abstract

A drive circuit of a piezo actuator is provided with a flyback transformer whose primary winding is connected to a DC power supply, and whose secondary winding is connected to the piezo actuator, a charging switch that is connected to the primary winding, a discharging switch that is connected to the secondary winding, a regenerative capacitor that is connected to the primary winding and in which discharge energy from the piezo actuator is regenerated, and a switch control unit that controls ON/OFF operations of the charging switch and the discharging switch. The switch control unit controls the ON/OFF operations of the charging switch and the discharging switch so as to repeatedly charge and discharge the piezo actuator and thereby control the applied voltage of the piezo actuator.

IPC Classes  ?

  • F16K 31/00 - Operating meansReleasing devices
  • G05D 7/06 - Control of flow characterised by the use of electric means
  • H01L 21/67 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereofApparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components

90.

FLUID CONTROL VALVE AND FLUID CONTROL DEVICE

      
Application Number 18923513
Status Pending
Filing Date 2024-10-22
First Publication Date 2025-04-24
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor
  • Kawai, Yuya
  • Ieki, Atsushi

Abstract

In order to configure a fluid control valve to have the life prolonged while keeping an inexpensive configuration, the fluid control valve includes: a valve body that can come into contact and separate from a valve seat; an actuator that causes the valve body to move; a diaphragm member provided between the valve body and the actuator and having a protruding part protruding toward the valve body; and a sphere housed inside the protruding part, in which the actuator moves the valve body by pressing a distal end of the protruding part through the sphere, and the sphere is formed of a ceramic material.

IPC Classes  ?

  • F16K 7/12 - Diaphragm cut-off apparatus, e.g. with a member deformed, but not moved bodily, to close the passage with flat, dished, or bowl-shaped diaphragm
  • F16K 37/00 - Special means in or on valves or other cut-off apparatus for indicating or recording operation thereof, or for enabling an alarm to be given

91.

LF-F

      
Application Number 1850530
Status Registered
Filing Date 2025-01-17
Registration Date 2025-01-17
Owner HORIBA STEC, Co., Ltd. (Japan)
NICE Classes  ?
  • 07 - Machines and machine tools
  • 09 - Scientific and electric apparatus and instruments

Goods & Services

Semiconductor manufacturing machines, and part and fittings therefor; machines for manufacturing batteries, and part and fittings therefor; machines for manufacturing electric storage batteries, and part and fittings therefor; machines for manufacturing solar cell, and part and fittings therefor; machines for manufacturing electronic components, and part and fittings therefor; machines for manufacturing light emitting diode, and part and fittings therefor; machines for manufacturing displays, and part and fittings therefor; machines for manufacturing liquid crystal, and part and fittings therefor; machines for manufacturing organic electroluminescence, and part and fittings therefor; fluid controllers for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; flow controllers for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; pressure controllers for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; temperature controllers for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; fluid measurement apparatus for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; fluid flow meters for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; fluid flow sensors for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; pressure gauges for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; pressure sensors for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; temperature gauges for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; temperature sensors for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; apparatus for measuring temperature difference for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor. Measuring or testing machines and instruments; fluid controllers; flow controllers; fluid measurement apparatus; fluid flow meters; fluid flow sensors; pressure controllers; pressure gauges; pressure sensors; temperature controllers; temperature gauges; temperature sensors; apparatus for measuring temperature difference; automatic controllers for measurement of fluid; automatic controllers for measurement of flow; automatic controllers for measurement of pressure; automatic controllers for measurement of temperature; laboratory apparatus and instruments; electronic computer and data processing machines and apparatus and their parts; computer programs; computer software.

92.

RADIATION DETECTION ELEMENT MANUFACTURING METHOD, RADIATION DETECTION ELEMENT, AND RADIATION DETECTOR

      
Application Number JP2024035360
Publication Number 2025/079486
Status In Force
Filing Date 2024-10-03
Publication Date 2025-04-17
Owner HORIBA, LTD. (Japan)
Inventor Ishikura, Koji

Abstract

Provided are a radiation detection element manufacturing method, a radiation detection element, and a radiation detector that make it possible to accurately detect radiation having low energy. This radiation detection element manufacturing method comprises: forming an oxide layer composed of an oxide of a semiconductor on a first semiconductor layer; forming a second semiconductor layer on the oxide layer; and implanting, into the first semiconductor layer via the second semiconductor layer and the oxide layer, ions of a dopant that alters a semiconductor forming the first semiconductor layer to a semiconductor of a different type, thereby forming a doping layer composed of a semiconductor doped with the dopant between the first semiconductor layer and the oxide layer.

IPC Classes  ?

  • G01T 1/24 - Measuring radiation intensity with semiconductor detectors

93.

XTROLOGY

      
Serial Number 79425805
Status Pending
Filing Date 2025-04-03
Owner HORIBA STEC, Co., Ltd. (Japan)
NICE Classes  ? 09 - Scientific and electric apparatus and instruments

Goods & Services

Semiconductor wafer inspection apparatus; analyzing apparatus for defect of semiconductor wafers; analyzing apparatus for stress of semiconductor wafers; analyzing apparatus for composition of semiconductor wafers; semiconductor wafer measuring apparatus; semiconductor wafer testing apparatus; semiconductor photomask inspection apparatus; analyzing apparatus for defect of semiconductor photomasks; analyzing apparatus for stress of semiconductor photomasks; analyzing apparatus for composition of semiconductor photomasks; semiconductor photomask measuring apparatus; semiconductor photomask testing apparatus; semiconductor reticle inspection apparatus; analyzing apparatus for defect of semiconductor reticles; analyzing apparatus for stress of semiconductor reticles; analyzing apparatus for composition of semiconductor reticles; semiconductor reticle measuring apparatus; semiconductor reticle testing apparatus; semiconductor substrate inspection apparatus; analyzing apparatus for defect of semiconductor substrates; analyzing apparatus for stress of semiconductor substrates; analyzing apparatus for composition of semiconductor substrates; semiconductor substrate measuring apparatus; semiconductor substrate testing apparatus; sensors for mapping semiconductor wafers; Raman spectrographic measurement apparatus, and parts and accessories therefor; Raman spectroscopic analyzing apparatus, and parts and accessories therefor; measuring apparatus for measuring film thickness; measuring apparatus for spectral measurements; automated optical inspection apparatus; X-ray fluorescence measuring apparatus; measuring or testing machines and instruments, and parts and accessories therefor; photoluminescence or fluorescence microscope spectrometers, and parts and accessories therefor; photoluminescence or fluorescence microscope spectrographs, and parts and accessories therefor; optical machines and apparatus; photographic machines and apparatus; cinematographic machines and apparatus; laboratory apparatus and instruments; computer software for inspection, defect analysis, stress analysis, composition analysis, measurement and testing of semiconductor wafers, photomasks, reticles and substrates; computer software; computer programs; scanning probe microscopes; X-ray fluorescence analyzing apparatus; electronic computer and data processing machines and apparatus and their parts; power distribution or control machines and apparatus; rotary converters; phase modifiers; batteries and cells; electric or magnetic meters and testers; electric wires and cables; spectacles [eyeglasses and goggles]; life-saving apparatus and equipment; telecommunication machines and apparatus; fire alarms; gas alarms; water leak alarms; oil leak alarms; anti-theft warning apparatus.

94.

PATTERN MEASUREMENT DEVICE, PATTERN MEASUREMENT PROGRAM, AND PATTERN MEASUREMENT METHOD

      
Application Number 18899560
Status Pending
Filing Date 2024-09-27
First Publication Date 2025-04-03
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor
  • Higuchi, Seiji
  • Ogaki, Ryosuke
  • Ueda, Takayuki

Abstract

The present invention is to accurately measure a dimension of a pattern by using statistical outlier processing, and is a pattern measurement device for measuring a dimension of a pattern formed on a sample. The pattern measurement device includes: a dimension measurement unit configured to measure a dimension of the pattern; an outlier removal unit configured to execute outlier processing at least twice on a plurality of dimension values measured by the dimension measurement unit; and a representative value determination unit configured to obtain a representative dimension value of the pattern from one or a plurality of the dimension values from which an outlier has been removed by the outlier removal unit.

IPC Classes  ?

  • G01B 11/14 - Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures

95.

X-RAY ANALYSIS DEVICE, X-RAY ANALYSIS METHOD, INFORMATION PROCESSING DEVICE, AND COMPUTER PROGRAM

      
Application Number JP2024034558
Publication Number 2025/070683
Status In Force
Filing Date 2024-09-27
Publication Date 2025-04-03
Owner HORIBA, LTD. (Japan)
Inventor Aoyama, Tomoki

Abstract

Provided are: an X-ray analysis device that is capable of individually measuring the amounts of elements contained in layers on the obverse surface side and the reverse surface side of a multilayer sample; an X-ray analysis method; an information processing device; and a computer program. This X-ray analysis device is provided with: an emission unit that emits X-rays to a sample in which a plurality of layers are laminated, so as to sequentially penetrate a first layer, an intermediate layer, and a second layer; a fluorescent X-ray detector that detects fluorescent X-rays generated from the first layer or the second layer; a penetrating X-ray detector that detects penetrating X-rays that have penetrated the sample; and an analysis unit. The analysis unit calculates the amount of a specific element contained in one of the first layer or the second layer in accordance with the intensity of fluorescent X-rays having a prescribed first energy, calculates the total amount of the specific element contained in the first layer and the second layer in accordance with the intensity of penetrating X-rays having a prescribed second energy higher than the first energy, and calculates the amount of the specific element contained in the other of the first layer or the second layer.

IPC Classes  ?

  • G01N 23/2206 - Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement
  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

96.

FLUID CONTROL VALVE AND FLUID CONTROL DEVICE

      
Application Number JP2024029184
Publication Number 2025/069770
Status In Force
Filing Date 2024-08-16
Publication Date 2025-04-03
Owner HORIBA STEC, CO., LTD. (Japan)
Inventor Dick, John

Abstract

The present invention improves the durability of a displacement changing mechanism that changes the displacement of an actuator and transmits this displacement to a valve body, while reducing the number of components to achieve a compact configuration. A displacement changing mechanism 6 for changing the displacement of an actuator 4 and transmitting this displacement to a valve body 3 side is provided with: a cylindrical holding member 61 interposed between the valve body 3 and the actuator 4; a plurality of movable members 62 forming a partial columnar shape corresponding to the inner peripheral surface of the holding member 61; and a plurality of rotation support shafts 63 for rotatably supporting the plurality of movable members 62 with respect to the holding member 61. Each of the plurality of movable members 62 has an input part 62a displaced by receiving the driving force from the actuator 4, and an output part 62b for changing the displacement applied to the input part 62a and transmitting this displacement to the valve body 3 side.

IPC Classes  ?

  • F16K 1/32 - Lift valves, i.e. cut-off apparatus with closure members having at least a component of their opening and closing motion perpendicular to the closing faces Details

97.

PLATINALINK

      
Application Number 1847626
Status Registered
Filing Date 2024-12-13
Registration Date 2024-12-13
Owner HORIBA, Ltd. (Japan)
NICE Classes  ?
  • 09 - Scientific and electric apparatus and instruments
  • 37 - Construction and mining; installation and repair services
  • 42 - Scientific, technological and industrial services, research and design

Goods & Services

Computer software for verifying data integrity; computer software for verifying data accuracy, completeness and consistency; computer software for access control, user identification, verification and security management; computer software for generating reports regarding data integrity; computer software for generating reports regarding data accuracy, completeness and consistency; computer software for measuring, controlling, testing, experimenting, data collection and management of engines, brakes and drives and apparatus attached thereto for vehicles and automobiles; computer software for measuring, controlling, testing, experimenting, data collection and management of pharmaceuticals, cosmetics, foodstuffs and dietary supplements; computer software for measuring, controlling, testing, experimenting, data collection and management of solid samples, gaseous samples and liquid samples; computer software for use with measuring or testing machines and instruments; computer software for use with laboratory apparatus and instruments; computer software; electronic computer and data processing machines and apparatus and their parts; measuring or testing machines and instruments; laboratory apparatus and instruments; optical machines and apparatus. Repair or maintenance of measuring or testing machines and instruments; repair or maintenance of laboratory apparatus and instruments; repair or maintenance of electronic machines and apparatus; repair or maintenance of optical machines and apparatus. Design, programming and maintenance of computer software for verifying data integrity; design, programming and maintenance of computer software for verifying data accuracy, completeness and consistency; design, programming and maintenance of computer software for access control, user identification, verification and security management; design, programming and maintenance of computer software; computer software design, computer programming, or maintenance of computer software; rental of computer software for verifying data integrity; rental of computer software for verifying data accuracy, completeness and consistency; rental of computer software for access control, user identification, verification and security management; rental of computer software; providing on-line non-downloadable computer software for verifying data integrity; providing on-line non-downloadable computer software for verifying data accuracy, completeness and consistency; providing on-line non-downloadable computer software for access control, user identification, verification and security management; providing on-line non-downloadable computer software; rental of measuring or testing machines and instruments; rental of laboratory apparatus and instruments; rental of computers; calibration of measuring or testing machines and instruments for testing engines, brakes and drives and apparatus attached thereto for vehicles and automobiles, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of laboratory apparatus and instruments for testing engines, brakes and drives and apparatus attached thereto for vehicles and automobiles, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of measuring or testing machines and instruments for testing pharmaceuticals, cosmetics, foodstuffs and dietary supplements, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of laboratory apparatus and instruments for testing pharmaceuticals, cosmetics, foodstuffs and dietary supplements, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of measuring or testing machines and instruments for testing solid samples, gaseous samples and liquid samples, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of laboratory apparatus and instruments for testing solid samples, gaseous samples and liquid samples, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of measuring or testing machines and instruments; calibration of laboratory apparatus and instruments; calibration of electronic machines and apparatus; calibration of optical machines and apparatus; design of measuring or testing machines and instruments; design of laboratory apparatus and instruments; design of electronic machines and apparatus; design of optical machines and apparatus; designing of machines, apparatus, instruments [including their parts] or systems composed of such machines, apparatus and instruments; technological advice relating to computers, automobiles and industrial machines; testing or research on measuring or testing machines and instruments.

98.

HORIBA PLATINALINK

      
Application Number 1847627
Status Registered
Filing Date 2024-12-13
Registration Date 2024-12-13
Owner HORIBA, Ltd. (Japan)
NICE Classes  ?
  • 09 - Scientific and electric apparatus and instruments
  • 37 - Construction and mining; installation and repair services
  • 42 - Scientific, technological and industrial services, research and design

Goods & Services

Computer software for verifying data integrity; computer software for verifying data accuracy, completeness and consistency; computer software for access control, user identification, verification and security management; computer software for generating reports regarding data integrity; computer software for generating reports regarding data accuracy, completeness and consistency; computer software for measuring, controlling, testing, experimenting, data collection and management of engines, brakes and drives and apparatus attached thereto for vehicles and automobiles; computer software for measuring, controlling, testing, experimenting, data collection and management of pharmaceuticals, cosmetics, foodstuffs and dietary supplements; computer software for measuring, controlling, testing, experimenting, data collection and management of solid samples, gaseous samples and liquid samples; computer software for use with measuring or testing machines and instruments; computer software for use with laboratory apparatus and instruments; computer software; electronic computer and data processing machines and apparatus and their parts; measuring or testing machines and instruments; laboratory apparatus and instruments; optical machines and apparatus. Repair or maintenance of measuring or testing machines and instruments; repair or maintenance of laboratory apparatus and instruments; repair or maintenance of electronic machines and apparatus; repair or maintenance of optical machines and apparatus. Design, programming and maintenance of computer software for verifying data integrity; design, programming and maintenance of computer software for verifying data accuracy, completeness and consistency; design, programming and maintenance of computer software for access control, user identification, verification and security management; design, programming and maintenance of computer software; computer software design, computer programming, or maintenance of computer software; rental of computer software for verifying data integrity; rental of computer software for verifying data accuracy, completeness and consistency; rental of computer software for access control, user identification, verification and security management; rental of computer software; providing on-line non-downloadable computer software for verifying data integrity; providing on-line non-downloadable computer software for verifying data accuracy, completeness and consistency; providing on-line non-downloadable computer software for access control, user identification, verification and security management; providing on-line non-downloadable computer software; rental of measuring or testing machines and instruments; rental of laboratory apparatus and instruments; rental of computers; calibration of measuring or testing machines and instruments for testing engines, brakes and drives and apparatus attached thereto for vehicles and automobiles, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of laboratory apparatus and instruments for testing engines, brakes and drives and apparatus attached thereto for vehicles and automobiles, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of measuring or testing machines and instruments for testing pharmaceuticals, cosmetics, foodstuffs and dietary supplements, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of laboratory apparatus and instruments for testing pharmaceuticals, cosmetics, foodstuffs and dietary supplements, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of measuring or testing machines and instruments for testing solid samples, gaseous samples and liquid samples, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of laboratory apparatus and instruments for testing solid samples, gaseous samples and liquid samples, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of measuring or testing machines and instruments; calibration of laboratory apparatus and instruments; calibration of electronic machines and apparatus; calibration of optical machines and apparatus; design of measuring or testing machines and instruments; design of laboratory apparatus and instruments; design of electronic machines and apparatus; design of optical machines and apparatus; designing of machines, apparatus, instruments [including their parts] or systems composed of such machines, apparatus and instruments; technological advice relating to computers, automobiles and industrial machines; testing or research on measuring or testing machines and instruments.

99.

VAPORIZER AND VAPORIZING SYSTEM

      
Application Number 18904016
Status Pending
Filing Date 2024-10-01
First Publication Date 2025-04-03
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor
  • Kanamaru, Takashi
  • Kawakado, Hajime

Abstract

A vaporizer for vaporizing a liquid substance includes: a tank for storing the liquid substance; a heater for heating the liquid substance by heating the tank; and a porous structure, disposed inside the tank, for breaking up and letting pass through it bubbles that form as a result of the liquid substance being heated by the heater.

IPC Classes  ?

  • B01J 7/02 - Apparatus for generating gases by wet methods

100.

ANALYSIS DEVICE AND ANALYSIS METHOD

      
Application Number JP2024031091
Publication Number 2025/062997
Status In Force
Filing Date 2024-08-29
Publication Date 2025-03-27
Owner HORIBA, LTD. (Japan)
Inventor Park, Sangwoon

Abstract

This analysis device is provided with: an impulse heating furnace or a high-frequency heating furnace that heats a sample to generate a sample gas containing elements that constitute the sample; a suction flow path that sucks the sample gas generated in the impulse heating furnace or the high-frequency heating furnace by means of a suction unit; and an element detecting unit that is provided in the suction flow path to detect the elements contained in the sample gas.

IPC Classes  ?

  • G01N 31/12 - Investigating or analysing non-biological materials by the use of the chemical methods specified in the subgroupsApparatus specially adapted for such methods using combustion
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