HORIBA, Ltd.

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Type PI
        Brevet 1 180
        Marque 224
Juridiction
        États-Unis 686
        International 661
        Europe 44
        Canada 13
Propriétaire / Filiale
[Owner] HORIBA, Ltd. 789
HORIBA STEC, Co., Ltd. 314
Horiba Instruments Incorporated 121
Horiba ABX SAS 111
Horiba Jobin Yvon SAS 49
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Date
Nouveautés (dernières 4 semaines) 8
2025 février (MACJ) 4
2025 janvier 15
2024 décembre 11
2024 novembre 4
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Classe IPC
G05D 7/06 - Commande de débits caractérisée par l'utilisation de moyens électriques 87
G01N 1/22 - Dispositifs pour prélever des échantillons à l'état gazeux 81
G01M 17/007 - Véhicules à roues ou à chenilles 74
G01N 15/02 - Recherche de la dimension ou de la distribution des dimensions des particules 71
G01N 21/3504 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique en utilisant la lumière infrarouge pour l'analyse des gaz, p. ex. analyse de mélanges de gaz 61
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Classe NICE
09 - Appareils et instruments scientifiques et électriques 181
07 - Machines et machines-outils 30
10 - Appareils et instruments médicaux 27
42 - Services scientifiques, technologiques et industriels, recherche et conception 23
05 - Produits pharmaceutiques, vétérinaires et hygièniques 21
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Statut
En Instance 103
Enregistré / En vigueur 1 301
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1.

OPEN AIR BATTERY EMISSIONS DILUTION AND SAMPLING

      
Numéro d'application 18452191
Statut En instance
Date de dépôt 2023-08-18
Date de la première publication 2025-02-20
Propriétaire HORIBA INSTRUMENTS INCORPORATED (USA)
Inventeur(s)
  • Rahman, Montajir
  • Stocker, Richard
  • Sobczak, Terry
  • Israel, Joshua

Abrégé

An open air battery emissions dilution and sampling system includes a sample accumulator that defines a funneled cavity having an open end exposed to ambient dilution air and that captures and dilutes with the ambient dilution air emissions from a battery, at least partially disposed within the funneled cavity and experiencing thermal runaway, to form diluted exhaust.

Classes IPC  ?

  • H01M 10/52 - Enlèvement des gaz situés à l'intérieur de l'élément secondaire, p. ex. par absorption
  • H01M 10/42 - Procédés ou dispositions pour assurer le fonctionnement ou l'entretien des éléments secondaires ou des demi-éléments secondaires
  • H01M 10/615 - Chauffage ou maintien de la chaleur
  • H01M 50/317 - Aménagements refermables

2.

ENCLOSED BATTERY EMISSIONS DILUTION AND SAMPLING

      
Numéro d'application 18452131
Statut En instance
Date de dépôt 2023-08-18
Date de la première publication 2025-02-20
Propriétaire HORIBA INSTRUMENTS INCORPORATED (USA)
Inventeur(s)
  • Rahman, Montajir
  • Stocker, Richard
  • Sobczak, Terry

Abrégé

An enclosed battery emissions dilution and sampling system includes a heated exhaust tube, an enclosure defining at least one inlet port on one end of the enclosure and an outlet port on another end of the enclosure fed into the heated exhaust tube, a dilution air line, at least one heated inlet line arranged with an end of the dilution air line and fed into the at least one inlet port, and a bypass line connected between the dilution air line and heated exhaust tube, and around the enclosure.

Classes IPC  ?

  • G01F 1/684 - Dispositions de structureMontage des éléments, p. ex. relativement à l'écoulement de fluide
  • G01F 1/696 - Circuits à cet effet, p. ex. débitmètres à courant constant
  • G01F 15/00 - Détails des appareils des groupes ou accessoires pour ces derniers, dans la mesure où de tels accessoires ou détails ne sont pas adaptés à ces types particuliers d'appareils, p. ex. pour l'indication à distance
  • H01M 10/42 - Procédés ou dispositions pour assurer le fonctionnement ou l'entretien des éléments secondaires ou des demi-éléments secondaires

3.

ENERGY MANAGEMENT SYSTEM, ENERGY MANAGEMENT METHOD, AND ENERGY MANAGEMENT PROGRAM

      
Numéro d'application JP2024027995
Numéro de publication 2025/033401
Statut Délivré - en vigueur
Date de dépôt 2024-08-06
Date de publication 2025-02-13
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Iwao, Keijiro
  • Kakino, Toru
  • Ishikuma, Toru

Abrégé

The present invention is an energy management system that realizes energy conservation focusing on a frequency distribution indicating the frequency of energy consumption amounts in an energy demand facility, the energy management system managing consumed energy in the energy demand facility, wherein the energy management system comprises a clustering unit for clustering past energy consumption amounts for the energy demand facility into a plurality of clusters on the basis of a prescribed condition, a modeling unit for modeling a frequency distribution indicating the frequency of the energy consumption amounts in each cluster into a distribution having at least one positive skew, and a schedule adjustment unit for adjusting the operation schedule of the energy demand facility so as to reduce the variance of the modeled distribution.

Classes IPC  ?

4.

POLISPECTRA

      
Numéro d'application 019138490
Statut En instance
Date de dépôt 2025-02-04
Propriétaire HORIBA Instruments Incorporated (USA)
Classes de Nice  ? 09 - Appareils et instruments scientifiques et électriques

Produits et services

SCIENTIFIC APPARATUS AND INSTRUMENTS FOR OPTICAL ANALYSIS, SPECTROSCOPY, NAMELY, IMAGING CCD AND SCMOS SPECTROMETERS AND SPECTROGRAPHS.

5.

GAS ANALYSIS DEVICE, GAS ANALYSIS METHOD, AND PROGRAM FOR GAS ANALYSIS DEVICE

      
Numéro d'application 18696835
Statut En instance
Date de dépôt 2022-10-03
Date de la première publication 2025-01-30
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Nagura, Naoki
  • Kawabuchi, Yasushi
  • Takahashi, Daichi
  • Hara, Kenji
  • Kikuta, Takayuki
  • Yoshioka, Masaya
  • Nakamura, Kotaro

Abrégé

A gas analysis device includes a sample cell into which sample gas is introduced, a light source that irradiates the sample cell with light, a photodetector that detects light intensity of light which passes through the sample cell irradiated by the light source, a concentration calculation unit which calculates a concentration of a measurement target component contained in the sample gas based on light intensity outputted from the photodetector, and a light intensity output unit that outputs, comparably with a reference light intensity set in advance, a light intensity at calibration detected by the photodetector during calibration.

Classes IPC  ?

  • G01N 21/3504 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique en utilisant la lumière infrarouge pour l'analyse des gaz, p. ex. analyse de mélanges de gaz
  • G01N 1/22 - Dispositifs pour prélever des échantillons à l'état gazeux
  • G01N 21/03 - Détails de structure des cuvettes
  • G01N 21/35 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique en utilisant la lumière infrarouge
  • G01N 21/39 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique en utilisant des lasers à longueur d'onde réglable

6.

Yumivet

      
Numéro d'application 1834279
Statut Enregistrée
Date de dépôt 2024-12-04
Date d'enregistrement 2024-12-04
Propriétaire HORIBA ABX SAS (France)
Classes de Nice  ? 10 - Appareils et instruments médicaux

Produits et services

Veterinary apparatus and instruments.

7.

Miscellaneous Design

      
Numéro d'application 1835060
Statut Enregistrée
Date de dépôt 2024-11-28
Date d'enregistrement 2024-11-28
Propriétaire HORIBA, Ltd. (Japon)
Classes de Nice  ?
  • 09 - Appareils et instruments scientifiques et électriques
  • 10 - Appareils et instruments médicaux

Produits et services

Computer software; computer software for medical use; computer software for electronic chart for medical purposes; computer software for veterinary use; computer software for electronic chart for veterinary purposes; computer programs; measuring or testing machines and instruments; laboratory apparatus and instruments; photographic machines and apparatus; optical machines and apparatus. Medical apparatus and instruments; diagnostic apparatus and instruments; veterinary apparatus and instruments; veterinary diagnostic apparatus and instruments.

8.

BLOOD ANALYSIS APPARATUS, BLOOD ANALYSIS METHOD, AND RECORDING MEDIUM

      
Numéro d'application 18715686
Statut En instance
Date de dépôt 2022-11-28
Date de la première publication 2025-01-23
Propriétaire HORIBA, Ltd. (Japon)
Inventeur(s)
  • Isshiki, Ryota
  • Ikeda, Motohide
  • Osawa, Kenta

Abrégé

A blood analysis apparatus includes: a container information acquisition portion that acquires container information on the type of sample container to be used; a needle that sucks and discharges a blood sample contained in the sample container; a blood analysis portion having a chamber that receives the blood sample sucked from the sample container and discharged into it with the needle; and a control portion that controls suction and discharge of the blood sample with the needle based on the container information. The control portion sets the amount of blood sample to be sucked with the needle based on the container information.

Classes IPC  ?

  • G01N 35/10 - Dispositifs pour transférer les échantillons vers, dans ou à partir de l'appareil d'analyse, p. ex. dispositifs d'aspiration, dispositifs d'injection
  • G01N 1/14 - Dispositifs d'aspiration, p. ex. pompesDispositifs d'éjection
  • G01N 35/00 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes Manipulation de matériaux à cet effet

9.

OUTPUT DEVICE, BLOOD ANALYSIS APPARATUS, BLOOD ANALYSIS METHOD, AND RECORDING MEDIUM

      
Numéro d'application 18715671
Statut En instance
Date de dépôt 2022-11-28
Date de la première publication 2025-01-16
Propriétaire HORIBA, Ltd. (Japon)
Inventeur(s)
  • Nishimori, Masashi
  • Ohashi, Akika
  • Nakagawa, Yohei

Abrégé

An output device includes: a measurement information reception portion configured to receive measurement information including a measurement result on a blood sample; a code information generation portion configured to generate code information by adding the measurement information to browsing destination information indicating a browsing destination at which to browse the measurement information; and an output portion configured to output the code information.

Classes IPC  ?

  • G16H 10/40 - TIC spécialement adaptées au maniement ou au traitement des données médicales ou de soins de santé relatives aux patients pour des données relatives aux analyses de laboratoire, p. ex. pour des analyses d’échantillon de patient
  • G01N 33/48 - Matériau biologique, p. ex. sang, urineHémocytomètres
  • G06F 21/60 - Protection de données
  • G06K 19/06 - Supports d'enregistrement pour utilisation avec des machines et avec au moins une partie prévue pour supporter des marques numériques caractérisés par le genre de marque numérique, p. ex. forme, nature, code

10.

FLOW RATE CALCULATION DEVICE AND FLOW RATE CALCULATION METHOD

      
Numéro d'application 18770538
Statut En instance
Date de dépôt 2024-07-11
Date de la première publication 2025-01-16
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s) Horinouchi, Osamu

Abrégé

A flow rate calculation device includes: a specific flow path and a bypass flow path which are provided to branch from a main flow path; a first fluid resistance element which is provided in the specific flow path; a second fluid resistance element which is provided in the bypass flow path; a container which is arranged in the specific flow path; a pressure sensor which detects a pressure in the container; and a flow rate calculation unit. The flow rate calculation unit calculates the flow rate of a first branch fluid diverted to the specific flow path based on a change in the pressure in the container, and calculates the flow rate of the fluid flowing through the main flow path based on the calculated flow rate of the first branch fluid and a diversion ratio determined according to the first fluid resistance element and the second fluid resistance element.

Classes IPC  ?

  • G01F 1/36 - Mesure du débit volumétrique ou du débit massique d'un fluide ou d'un matériau solide fluent, dans laquelle le fluide passe à travers un compteur par un écoulement continu en utilisant des effets mécaniques en mesurant la pression ou la différence de pression la pression ou la différence de pression étant produite par une contraction de la veine fluide

11.

RADIATION DETECTION DEVICE AND SIGNAL PROCESSING METHOD

      
Numéro d'application JP2024021278
Numéro de publication 2025/013496
Statut Délivré - en vigueur
Date de dépôt 2024-06-12
Date de publication 2025-01-16
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Matsunaga, Daisuke
  • Murata, Shunsuke
  • Ohashi, Satoshi
  • Valiev, Ildar
  • Aoyama, Tomoki
  • Okubo, Yuji

Abrégé

Provided are a radiation detection device and a signal processing method that are capable of preventing damage to a radiation detector. The radiation detection device comprises: a radiation detector that outputs a signal in response to the entry of radiation or light; and a stop processing unit that determines whether excessive radiation or excessive light has entered the radiation detector on the basis of the signal output from the radiation detector, and that stops the operation of the radiation detector or stops the generation of radiation or light when it is determined that excessive radiation or excessive light has entered the radiation detector.

Classes IPC  ?

  • G01T 1/17 - Dispositions de circuits non adaptés à un type particulier de détecteur
  • G01T 1/24 - Mesure de l'intensité de radiation avec des détecteurs à semi-conducteurs

12.

VERIDRIVE

      
Numéro d'application 1833419
Statut Enregistrée
Date de dépôt 2024-11-26
Date d'enregistrement 2024-11-26
Propriétaire HORIBA, Ltd. (Japon)
Classes de Nice  ?
  • 09 - Appareils et instruments scientifiques et électriques
  • 37 - Services de construction; extraction minière; installation et réparation
  • 42 - Services scientifiques, technologiques et industriels, recherche et conception

Produits et services

Measurement apparatus and instruments for vehicle engine emission, and parts and fittings therefor; measurement apparatus and instruments for engine emission, and parts and fittings therefor; measurement apparatus and instruments for emission, and parts and fittings therefor; measurement apparatus and instruments for exhaust gases, and parts and fittings therefor; measurement apparatus and instruments for process gases, and parts and fittings therefor; measuring and analyzing apparatus and instruments for vehicle engine emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for engine emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for exhaust gases, and parts and fittings therefor; measuring and analyzing apparatus and instruments for process gases, and parts and fittings therefor; on-board measurement apparatus and instruments for vehicle engine emission, and parts and fittings therefor; on-board measurement apparatus and instruments for engine emission, and parts and fittings therefor; on-board measurement apparatus and instruments for emission, and parts and fittings therefor; on-board measurement apparatus and instruments for exhaust gases, and parts and fittings therefor; on-board measurement apparatus and instruments for process gases, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for vehicle engine emission, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for engine emission, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for emission, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for exhaust gases, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for process gases, and parts and fittings therefor; portable measurement apparatus and instruments for vehicle engine emission, and parts and fittings therefor; portable measurement apparatus and instruments for engine emission, and parts and fittings therefor; portable measurement apparatus and instruments for emission, and parts and fittings therefor; portable measurement apparatus and instruments for exhaust gases, and parts and fittings therefor; portable measurement apparatus and instruments for process gases, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for vehicle engine emission, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for engine emission, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for emission, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for exhaust gases, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for process gases, and parts and fittings therefor; measurement apparatus and instruments for automobile emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for automobile emission, and parts and fittings therefor; measurement apparatus and instruments for vehicle emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for vehicle emission, and parts and fittings therefor; vehicle engine testing apparatus and instruments, and parts and fittings therefor; automotive engine testing apparatus and instruments, and parts and fittings therefor; engine testing apparatus and instruments, and parts and fittings therefor; computer software for controlling measurement apparatus and instruments for vehicle engine emission; computer software for controlling measurement apparatus and instruments for engine emission; computer software for controlling measurement apparatus and instruments for emission; computer software for controlling measurement apparatus and instruments for exhaust gases; computer software for controlling measurement apparatus and instruments for process gases; computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; computer software for controlling measuring and analyzing apparatus and instruments for engine emission; computer software for controlling measuring and analyzing apparatus and instruments for emission; computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; computer software for controlling measuring and analyzing apparatus and instruments for process gases; computer software for controlling engine testing apparatus and instruments; computer software; measuring or testing machines and instruments; laboratory apparatus and instruments; optical machines and apparatus; cinematographic machines and apparatus; photographic machines and apparatus. Repair or maintenance of measurement apparatus and instruments for vehicle engine emission; repair or maintenance of measurement apparatus and instruments for engine emission; repair or maintenance of measurement apparatus and instruments for emission; repair or maintenance of measurement apparatus and instruments for exhaust gases; repair or maintenance of measurement apparatus and instruments for process gases; repair or maintenance of measuring and analyzing apparatus and instruments for vehicle engine emission; repair or maintenance of measuring and analyzing apparatus and instruments for engine emission; repair or maintenance of measuring and analyzing apparatus and instruments for emission; repair or maintenance of measuring and analyzing apparatus and instruments for exhaust gases; repair or maintenance of measuring and analyzing apparatus and instruments for process gases; repair or maintenance of on-board measurement apparatus and instruments for vehicle engine emission; repair or maintenance of on-board measurement apparatus and instruments for engine emission; repair or maintenance of on-board measurement apparatus and instruments for emission; repair or maintenance of on-board measurement apparatus and instruments for exhaust gases; repair or maintenance of on-board measurement apparatus and instruments for process gases; repair or maintenance of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; repair or maintenance of on-board measuring and analyzing apparatus and instruments for engine emission; repair or maintenance of on-board measuring and analyzing apparatus and instruments for emission; repair or maintenance of on-board measuring and analyzing apparatus and instruments for exhaust gases; repair or maintenance of on-board measuring and analyzing apparatus and instruments for process gases; repair or maintenance of portable measurement apparatus and instruments for vehicle engine emission; repair or maintenance of portable measurement apparatus and instruments for engine emission; repair or maintenance of portable measurement apparatus and instruments for emission; repair or maintenance of portable measurement apparatus and instruments for exhaust gases; repair or maintenance of portable measurement apparatus and instruments for process gases; repair or maintenance of portable measuring and analyzing apparatus and instruments for vehicle engine emission; repair or maintenance of portable measuring and analyzing apparatus and instruments for engine emission; repair or maintenance of portable measuring and analyzing apparatus and instruments for emission; repair or maintenance of portable measuring and analyzing apparatus and instruments for exhaust gases; repair or maintenance of portable measuring and analyzing apparatus and instruments for process gases; repair or maintenance of measurement apparatus and instruments for automobile emission; repair or maintenance of measuring and analyzing apparatus and instruments for automobile emission; repair or maintenance of measurement apparatus and instruments for vehicle emission; repair or maintenance of measuring and analyzing apparatus and instruments for vehicle emission; repair or maintenance of vehicle engine testing apparatus and instruments; repair or maintenance of automotive engine testing apparatus and instruments; repair or maintenance of engine testing apparatus and instruments; repair or maintenance of measuring or testing machines and instruments; repair or maintenance of laboratory apparatus and instruments; repair or maintenance of optical machines and apparatus; repair or maintenance of cinematographic machines and apparatus; repair or maintenance of photographic machines and apparatus. Rental of measurement apparatus and instruments for vehicle engine emission; rental of measurement apparatus and instruments for engine emission; rental of measurement apparatus and instruments for emission; rental of measurement apparatus and instruments for exhaust gases; rental of measurement apparatus and instruments for process gases; rental of measuring and analyzing apparatus and instruments for vehicle engine emission; rental of measuring and analyzing apparatus and instruments for engine emission; rental of measuring and analyzing apparatus and instruments for emission; rental of measuring and analyzing apparatus and instruments for exhaust gases; rental of measuring and analyzing apparatus and instruments for process gases; rental of on-board measurement apparatus and instruments for vehicle engine emission; rental of on-board measurement apparatus and instruments for engine emission; rental of on-board measurement apparatus and instruments for emission; rental of on-board measurement apparatus and instruments for exhaust gases; rental of on-board measurement apparatus and instruments for process gases; rental of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; rental of on-board measuring and analyzing apparatus and instruments for engine emission; rental of on-board measuring and analyzing apparatus and instruments for emission; rental of on-board measuring and analyzing apparatus and instruments for exhaust gases; rental of on-board measuring and analyzing apparatus and instruments for process gases; rental of portable measurement apparatus and instruments for vehicle engine emission; rental of portable measurement apparatus and instruments for engine emission; rental of portable measurement apparatus and instruments for emission; rental of portable measurement apparatus and instruments for exhaust gases; rental of portable measurement apparatus and instruments for process gases; rental of portable measuring and analyzing apparatus and instruments for vehicle engine emission; rental of portable measuring and analyzing apparatus and instruments for engine emission; rental of portable measuring and analyzing apparatus and instruments for emission; rental of portable measuring and analyzing apparatus and instruments for exhaust gases; rental of portable measuring and analyzing apparatus and instruments for process gases; rental of measurement apparatus and instruments for automobile emission; rental of measuring and analyzing apparatus and instruments for automobile emission; rental of measurement apparatus and instruments for vehicle emission; rental of measuring and analyzing apparatus and instruments for vehicle emission; rental of vehicle engine testing apparatus and instruments; rental of automotive engine testing apparatus and instruments; rental of engine testing apparatus and instruments; rental of measuring or testing machines and instruments; rental of laboratory apparatus and instruments; calibration of measurement apparatus and instruments for vehicle engine emission; calibration of measurement apparatus and instruments for engine emission; calibration of measurement apparatus and instruments for emission; calibration of measurement apparatus and instruments for exhaust gases; calibration of measurement apparatus and instruments for process gases; calibration of measuring and analyzing apparatus and instruments for vehicle engine emission; calibration of measuring and analyzing apparatus and instruments for engine emission; calibration of measuring and analyzing apparatus and instruments for emission; calibration of measuring and analyzing apparatus and instruments for exhaust gases; calibration of measuring and analyzing apparatus and instruments for process gases; calibration of on-board measurement apparatus and instruments for vehicle engine emission; calibration of on-board measurement apparatus and instruments for engine emission; calibration of on-board measurement apparatus and instruments for emission; calibration of on-board measurement apparatus and instruments for exhaust gases; calibration of on-board measurement apparatus and instruments for process gases; calibration of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; calibration of on-board measuring and analyzing apparatus and instruments for engine emission; calibration of on-board measuring and analyzing apparatus and instruments for emission; calibration of on-board measuring and analyzing apparatus and instruments for exhaust gases; calibration of on-board measuring and analyzing apparatus and instruments for process gases; calibration of portable measurement apparatus and instruments for vehicle engine emission; calibration of portable measurement apparatus and instruments for engine emission; calibration of portable measurement apparatus and instruments for emission; calibration of portable measurement apparatus and instruments for exhaust gases; calibration of portable measurement apparatus and instruments for process gases; calibration of portable measuring and analyzing apparatus and instruments for vehicle engine emission; calibration of portable measuring and analyzing apparatus and instruments for engine emission; calibration of portable measuring and analyzing apparatus and instruments for emission; calibration of portable measuring and analyzing apparatus and instruments for exhaust gases; calibration of portable measuring and analyzing apparatus and instruments for process gases; calibration of measurement apparatus and instruments for automobile emission; calibration of measuring and analyzing apparatus and instruments for automobile emission; calibration of measurement apparatus and instruments for vehicle emission; calibration of measuring and analyzing apparatus and instruments for vehicle emission; calibration of vehicle engine testing apparatus and instruments; calibration of automotive engine testing apparatus and instruments; calibration of engine testing apparatus and instruments; calibration of measuring or testing machines and instruments; calibration of laboratory apparatus and instruments; calibration of optical machines and apparatus; calibration of cinematographic machines and apparatus; calibration of photographic machines and apparatus; design of measurement apparatus and instruments for vehicle engine emission; design of measurement apparatus and instruments for engine emission; design of measurement apparatus and instruments for emission; design of measurement apparatus and instruments for exhaust gases; design of measurement apparatus and instruments for process gases; design of measuring and analyzing apparatus and instruments for vehicle engine emission; design of measuring and analyzing apparatus and instruments for engine emission; design of measuring and analyzing apparatus and instruments for emission; design of measuring and analyzing apparatus and instruments for exhaust gases; design of measuring and analyzing apparatus and instruments for process gases; design of on-board measurement apparatus and instruments for vehicle engine emission; design of on-board measurement apparatus and instruments for engine emission; design of on-board measurement apparatus and instruments for emission; design of on-board measurement apparatus and instruments for exhaust gases; design of on-board measurement apparatus and instruments for process gases; design of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; design of on-board measuring and analyzing apparatus and instruments for engine emission; design of on-board measuring and analyzing apparatus and instruments for emission; design of on-board measuring and analyzing apparatus and instruments for exhaust gases; design of on-board measuring and analyzing apparatus and instruments for process gases; design of portable measurement apparatus and instruments for vehicle engine emission; design of portable measurement apparatus and instruments for engine emission; design of portable measurement apparatus and instruments for emission; design of portable measurement apparatus and instruments for exhaust gases; design of portable measurement apparatus and instruments for process gases; design of portable measuring and analyzing apparatus and instruments for vehicle engine emission; design of portable measuring and analyzing apparatus and instruments for engine emission; design of portable measuring and analyzing apparatus and instruments for emission; design of portable measuring and analyzing apparatus and instruments for exhaust gases; design of portable measuring and analyzing apparatus and instruments for process gases; design of measurement apparatus and instruments for automobile emission; design of measuring and analyzing apparatus and instruments for automobile emission; design of measurement apparatus and instruments for vehicle emission; design of measuring and analyzing apparatus and instruments for vehicle emission; design of vehicle engine testing apparatus and instruments; design of automotive engine testing apparatus and instruments; design of engine testing apparatus and instruments; design of measuring or testing machines and instruments; design of laboratory apparatus and instruments; design of optical machines and apparatus; design of cinematographic machines and apparatus; design of photographic machines and apparatus; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for vehicle engine emission; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for engine emission; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for emission; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for exhaust gases; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for process gases; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for engine emission; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for emission; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for process gases; design, programming and maintenance of computer software for controlling engine testing apparatus and instruments; design, programming and maintenance of computer software; rental of computer software for controlling measurement apparatus and instruments for vehicle engine emission; rental of computer software for controlling measurement apparatus and instruments for engine emission; rental of computer software for controlling measurement apparatus and instruments for emission; rental of computer software for controlling measurement apparatus and instruments for exhaust gases; rental of computer software for controlling measurement apparatus and instruments for process gases; rental of computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; rental of computer software for controlling measuring and analyzing apparatus and instruments for engine emission; rental of computer software for controlling measuring and analyzing apparatus and instruments for emission; rental of computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; rental of computer software for controlling measuring and analyzing apparatus and instruments for process gases; rental of computer software for controlling engine testing apparatus and instruments; rental of computer software; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for vehicle engine emission; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for engine emission; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for emission; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for exhaust gases; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for process gases; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for engine emission; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for emission; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for process gases; providing on-line non-downloadable computer software for controlling engine testing apparatus and instruments; providing on-line non-downloadable computer software; designing of machines, apparatus, instruments [including their parts] or systems composed of such machines, apparatus and instruments; computer software design, computer programming, or maintenance of computer software; technological advice relating to computers, automobiles and industrial machines; testing or research on machines, apparatus and instruments.

13.

ANALYSIS DEVICE AND ANALYSIS METHOD

      
Numéro d'application 18574020
Statut En instance
Date de dépôt 2022-05-25
Date de la première publication 2025-01-09
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Tachibana, Kohei
  • Nakamura, Keishi
  • Niina, Kodai
  • Miyawaki, Daisuke
  • Watanabe, Tsuyoshi
  • Ido, Takuya

Abrégé

To appropriately take explosion-proof measures for an analysis device while suppressing consumption of a purge gas, an analysis device includes a filling unit, an irradiation unit, a propagation unit, a housing, a purge gas introduction unit, and an explosion-proof gas introduction unit. The filling unit is filled with a sample gas containing a gas to be measured. The irradiation unit emits measurement light to be used for analyzing the gas to be measured. The propagation unit is disposed between the filling unit and the irradiation unit, so as to form a propagation space for propagating the measurement light emitted from the irradiation unit to the filling unit. The housing houses the filling unit, the irradiation unit, and the propagation unit. The purge gas introduction unit introduces the purge gas into the propagation space. The explosion-proof gas introduction unit introduces an explosion-proof gas into the internal space of the housing.

Classes IPC  ?

  • G01N 21/31 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique
  • G01N 33/00 - Recherche ou analyse des matériaux par des méthodes spécifiques non couvertes par les groupes

14.

GATELINK

      
Numéro d'application 1831423
Statut Enregistrée
Date de dépôt 2024-11-28
Date d'enregistrement 2024-11-28
Propriétaire HORIBA, Ltd. (Japon)
Classes de Nice  ?
  • 09 - Appareils et instruments scientifiques et électriques
  • 10 - Appareils et instruments médicaux

Produits et services

Computer software; computer software for medical use; computer software for electronic chart for medical purposes; computer software for veterinary use; computer software for electronic chart for veterinary purposes; computer programs; measuring or testing machines and instruments; laboratory apparatus and instruments; photographic machines and apparatus; optical machines and apparatus. Medical apparatus and instruments; diagnostic apparatus and instruments; veterinary apparatus and instruments; veterinary diagnostic apparatus and instruments.

15.

GAS ANALYSIS DEVICE, FUEL GAS SUPPLY MECHANISM, AND GAS ANALYSIS METHOD

      
Numéro d'application JP2024018439
Numéro de publication 2025/004598
Statut Délivré - en vigueur
Date de dépôt 2024-05-20
Date de publication 2025-01-02
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Kondo, Yosuke
  • Kasugai, Tetsuya
  • Nishigai, Hiroki

Abrégé

The present invention is a fuel gas supply mechanism for replacing a fuel gas cylinder without causing an accidental fire of hydrogen flame in a hydrogen flame ionization detection device, and comprises a first fuel gas port 51 to which a first fuel gas cylinder 10a is connected, a second fuel gas port 52 to which a second fuel gas cylinder 10b is connected, a first fuel gas flow passage 53 that connects the first fuel gas port 51 and an FID detector 4, a second fuel gas flow passage 54 that connects the second fuel gas port 52 and the FID detector 4, and a fuel gas backflow prevention mechanism 50 that prevents backflow from the first fuel gas flow passage 53 to the second fuel gas flow passage 54 or backflow from the second fuel gas flow passage 54 to the first fuel gas flow passage 53.

Classes IPC  ?

  • G01N 27/626 - Recherche ou analyse des matériaux par l'emploi de moyens électriques, électrochimiques ou magnétiques en recherchant l'ionisation des gaz, p. ex. des aérosolsRecherche ou analyse des matériaux par l'emploi de moyens électriques, électrochimiques ou magnétiques en recherchant les décharges électriques, p. ex. l'émission cathodique utilisant la chaleur pour ioniser un gaz
  • G01M 15/10 - Test des moteurs à combustion interne par contrôle des gaz d'échappement

16.

ANALYSIS DEVICE AND ANALYSIS METHOD

      
Numéro d'application JP2024021190
Numéro de publication 2025/004791
Statut Délivré - en vigueur
Date de dépôt 2024-06-11
Date de publication 2025-01-02
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Nakamura, Ryuhei
  • Ito, Hiroshi
  • Matsumoto, Erika

Abrégé

The present invention acquires analysis results relating to the mass concentration and the elements of an analysis object in a short time and with a simple device configuration. An analysis device (100) comprises a β ray source (51), a detection unit (7, 7', 7"), and an analysis unit (9). The β ray source (51) irradiates the analysis object with β rays. The detection unit (7, 7', 7") simultaneously detects transmitted β rays that have passed through the analysis object and fluorescent X-rays that have been produced by irradiating the analysis object with the β rays, and outputs detection signals. The analysis unit (9) acquires, from the detection signals, a first signal produced by detecting the transmitted β rays and a second signal produced by detecting the fluorescent X-rays. The analysis unit (9) calculates information relating to the mass concentration of the analysis object on the basis of the first signal, and calculates information relating to the elements included in the analysis object on the basis of the second signal.

Classes IPC  ?

  • G01N 23/2206 - Combinaison de plusieurs mesures, l'une au moins étant celle d’une émission secondaire, p. ex. combinaison d’une mesure d’électrons secondaires [ES] et d’électrons rétrodiffusés [ER]
  • G01N 23/02 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau

17.

BATTERY CASE EVALUATION SYSTEM, BATTERY CASE EVALUATION PROGRAM, AND BATTERY CASE EVALUATION METHOD

      
Numéro d'application JP2024023511
Numéro de publication 2025/005247
Statut Délivré - en vigueur
Date de dépôt 2024-06-28
Date de publication 2025-01-02
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Matsunaga, Shimpachi
  • Hatakeyama, Hiroshi
  • Tatsukawa, Shogo

Abrégé

A battery case evaluation system 100 for evaluating the thermal properties of a battery case BC constituting a battery pack or of a component of said battery case BC, said system being equipped with a simulation battery 10 which is installed in the battery case BC and simulates the thermal behavior of an actual battery which is a component of a battery pack, a power supply device 20 which supplies power to the simulation battery 10, and a control device 30 which controls the power supply device 20, wherein the control device 30 is configured so as to have: a parameter reception unit 31 which receives an input profile expressing the change over time in the current, voltage or power supplied to the actual battery as one evaluation parameter; a resistance value calculation unit 331 which calculates a resistance value of the actual battery which changes over time on the basis of the simulation battery temperature and the input profile; and a supply power control unit 33 which controls the power supply device 20 by using the resistance value calculated by the resistance value calculation unit 331.

Classes IPC  ?

  • G01R 31/367 - Logiciels à cet effet, p. ex. pour le test des batteries en utilisant une modélisation ou des tables de correspondance
  • G01N 25/18 - Recherche ou analyse des matériaux par l'utilisation de moyens thermiques en recherchant la conductivité thermique
  • G01R 31/382 - Dispositions pour la surveillance de variables des batteries ou des accumulateurs, p. ex. état de charge
  • G01R 31/385 - Dispositions pour mesurer des variables des batteries ou des accumulateurs
  • G01R 31/389 - Mesure de l’impédance interne, de la conductance interne ou des variables similaires
  • G01R 31/392 - Détermination du vieillissement ou de la dégradation de la batterie, p. ex. état de santé
  • H01M 10/48 - Accumulateurs combinés à des dispositions pour mesurer, tester ou indiquer l'état des éléments, p. ex. le niveau ou la densité de l'électrolyte

18.

TEST SAMPLE TESTING SYSTEM, TEMPERATURE ADJUSTMENT DEVICE, TEST SAMPLE TESTING METHOD, AND TEST SAMPLE TESTING PROGRAM

      
Numéro d'application JP2024021305
Numéro de publication 2025/004803
Statut Délivré - en vigueur
Date de dépôt 2024-06-12
Date de publication 2025-01-02
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Tatsukawa, Shogo
  • Hatakeyama, Hiroshi
  • Matsunaga, Shimpachi

Abrégé

The present invention is for testing a test sample while simulating heat input or heat dissipation via an actual power line during actual use, and is a test sample testing system 100 for testing a test sample W, which is an electrical device, the test sample testing system 100 comprising: a test power line 4 that is connected to the test sample W; and a temperature adjustment device 5 for adjusting the temperature of the test power line 4 connected to the test sample W.

Classes IPC  ?

  • G01M 17/007 - Véhicules à roues ou à chenilles
  • G01R 31/36 - Dispositions pour le test, la mesure ou la surveillance de l’état électrique d’accumulateurs ou de batteries, p. ex. de la capacité ou de l’état de charge

19.

ANALYSIS DEVICE, ANALYSIS METHOD, AND PROGRAM

      
Numéro d'application JP2024023176
Numéro de publication 2025/005137
Statut Délivré - en vigueur
Date de dépôt 2024-06-26
Date de publication 2025-01-02
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Matsumoto, Erika
  • Ito, Hiroshi

Abrégé

The present invention efficiently performs analysis regarding the amount of an analyte and analysis regarding an element. An analysis device (100) comprises a radiation source, a detector (5), and an analysis unit (6). The radiation source irradiates particulate matter (FP) with radiation. The detector (5) detects transmitted radiation passing through the particulate matter (FP) and a fluorescent X-ray generated through the irradiation of the particulate matter (FP) with radiation. The analysis unit (6) performs analysis regarding the amount of the particulate matter (FP) on the basis of the transmitted radiation detected by the detector (5), and performs analysis regarding an element contained in the particulate matter (FP) on the basis of the fluorescent X-ray detected by the detector (5).

Classes IPC  ?

  • G01N 23/2206 - Combinaison de plusieurs mesures, l'une au moins étant celle d’une émission secondaire, p. ex. combinaison d’une mesure d’électrons secondaires [ES] et d’électrons rétrodiffusés [ER]
  • G01N 1/02 - Dispositifs pour prélever des échantillons
  • G01N 23/02 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau
  • G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X

20.

FUEL CELL EVALUATION SYSTEM, INCLINATION TEST DEVICE, FUEL CELL EVALUATION METHOD, AND PROGRAM FOR FUEL CELL EVALUATION SYSTEM

      
Numéro d'application JP2024020546
Numéro de publication 2024/262315
Statut Délivré - en vigueur
Date de dépôt 2024-06-05
Date de publication 2024-12-26
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Mizutaka, Toshio
  • Tabata, Kunio
  • Komada, Mineyuki

Abrégé

This fuel cell evaluation system evaluates a test piece that is a fuel cell to be mounted on a movable body or a portion of the fuel cell, the fuel cell evaluation system comprising: a hydrogen gas supply line for supplying hydrogen gas to the test piece; an electric discharge unit that controls an electric discharge load on the test piece; and an inclination test device that has a mounting base on which the test piece is mounted and that inclines the mounting base so as to change the orientation of the test piece according to the movement state of the movable body.

Classes IPC  ?

  • H01M 8/04 - Dispositions auxiliaires, p. ex. pour la commande de la pression ou pour la circulation des fluides
  • H01M 8/00 - Éléments à combustibleLeur fabrication
  • H01M 8/04746 - PressionDébit

21.

METHOD FOR GENERATING DATA FOR PARTICLE ANALYSIS, NON-TRANSITORY COMPUTER PROGRAM FOR GENERATING DATA FOR PARTICLE ANALYSIS, AND DEVICE FOR GENERATING DATA FOR PARTICLE ANALYSIS

      
Numéro d'application 18813339
Statut En instance
Date de dépôt 2024-08-23
Date de la première publication 2024-12-19
Propriétaire HORIBA, Ltd. (Japon)
Inventeur(s)
  • Koshikawa, Hiroyuki
  • Akiyama, Hisashi
  • Mori, Tetsuya
  • Matsuo, Kosuke
  • Nakatani, Hitoshi
  • Katsuda, Toshihiro

Abrégé

In relation to application of artificial intelligence to image analysis of particles, to make it possible to provide data for machine learning corresponding to user demands while making it possible to reduce, as much as possible, man-hours taken to, for example, prepare vast amounts of actual image data obtained by actually capturing images of particles, the present invention generates virtual particle image data, which is image data of a virtual particle, on the basis of a predetermined condition, generates label data corresponding to the virtual particle, and associates the virtual particle image data with the label data.

Classes IPC  ?

  • G01N 15/1433 - Traitement du signal utilisant la reconnaissance d’image
  • G01N 15/14 - Techniques de recherche optique, p. ex. cytométrie en flux
  • G06N 20/00 - Apprentissage automatique

22.

TEST SPECIMEN TESTING SYSTEM, TEST SPECIMEN DRIVING SYSTEM, TEST SPECIMEN TESTING METHOD, AND TEST SPECIMEN TESTING PROGRAM

      
Numéro d'application JP2024018448
Numéro de publication 2024/257552
Statut Délivré - en vigueur
Date de dépôt 2024-05-20
Date de publication 2024-12-19
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Furukawa, Kazuki
  • Saito, Takashi

Abrégé

The present invention relates to a test specimen testing system for testing a test specimen by controlling vehicle pedals of the test specimen to target operation amounts while imparting running resistance to the test specimen, the test specimen testing system comprising; a driving device 2 for driving the test specimen V by operating the vehicle pedals V3, V4 of the test specimen V or inputting operation signals corresponding to the operation of the vehicle pedals; a dynamometer 4 that imparts running resistance corresponding to the vehicle speed of the test specimen V being driven by the driving device 2; a data acquiring unit 31 that acquires target operation amount data, which are time-series data of the target operation amounts of the vehicle pedals V3, V4; and a driving device control unit 33 that performs feed-forward control of a driving robot 2 on the basis of the target operation amount data acquired by the data acquiring unit 31.

Classes IPC  ?

23.

ANALYSIS DEVICE AND ANALYSIS METHOD

      
Numéro d'application 18704347
Statut En instance
Date de dépôt 2022-11-25
Date de la première publication 2024-12-19
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Hanada, Takaaki
  • Nagura, Naoki
  • Shibuya, Kyoji
  • Hara, Kenji

Abrégé

The present invention measures with high accuracy a concentration of a measurement target component contained in a combustion gas, in which a concentration of nitric oxide is calculated based on absorption by the nitric oxide, a concentration of nitrogen dioxide is calculated based on absorption by the nitrogen dioxide, a concentration of nitrous oxide is calculated based on absorption by the nitrous oxide, a concentration of ammonia is calculated based on absorption by the ammonia, a concentration of ethane is calculated based on absorption by the ethane, a concentration of formaldehyde or acetaldehyde is calculated based on absorption by the formaldehyde or the acetaldehyde, a concentration of sulfur dioxide is calculated based on absorption by the sulfur dioxide, a concentration of methane is calculated based on absorption by the methane, and a concentration of methanol or ethanol is calculated based on absorption by the methanol or the ethanol.

Classes IPC  ?

  • G01N 21/3504 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique en utilisant la lumière infrarouge pour l'analyse des gaz, p. ex. analyse de mélanges de gaz

24.

MACHINE LEARNING DEVICE, EXHAUST GAS ANALYSIS DEVICE, MACHINE LEARNING METHOD, EXHAUST GAS ANALYSIS METHOD, MACHINE LEARNING PROGRAM, AND EXHAUST GAS ANALYSIS PROGRAM

      
Numéro d'application 18717865
Statut En instance
Date de dépôt 2022-10-26
Date de la première publication 2024-12-19
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Nagaoka, Makoto
  • Saito, Takashi

Abrégé

A machine learning device used in an exhaust gas analysis device that irradiates combustion exhaust gas with light, performs a detection of light transmitted through the combustion exhaust gas, and analyzes the combustion exhaust gas based on a detection signal includes a training data reception unit that receives training data including a reference value of a specific component concentration and at least one of spectrum data obtained by irradiating the combustion exhaust gas with light or an individual component concentration selected based on an element balance formula for determining the specific component concentration, or an arithmetic value of a specific component concentration calculated using the individual component concentration in the element balance formula, and a machine learning unit that performs machine learning on a relationship between the reference value and at least one of the spectrum data, the individual component concentration, or the arithmetic value using the training data.

Classes IPC  ?

  • G01N 21/3504 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique en utilisant la lumière infrarouge pour l'analyse des gaz, p. ex. analyse de mélanges de gaz
  • G01N 21/35 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique en utilisant la lumière infrarouge
  • G06N 20/00 - Apprentissage automatique

25.

FLUID CONTROL VALVE, FLUID CONTROL DEVICE, AND PROTECTION METHOD FOR FLUID CONTROL VALVE

      
Numéro d'application JP2024014958
Numéro de publication 2024/252790
Statut Délivré - en vigueur
Date de dépôt 2024-04-15
Date de publication 2024-12-12
Propriétaire HORIBA STEC, CO., LTD. (Japon)
Inventeur(s)
  • Miyamoto, Hideaki
  • Shikata, Daichi

Abrégé

According to the present invention, a fluid control valve uses a piezo actuator that is formed by layering a plurality of piezo stacks. The fluid control valve applies drive voltage to the actuator to make the piezo stacks extend and contract and thereby makes a valve body contact and separate from a valve seat. To disperse the stress that acts on the piezo stacks during extension and contraction and suppress deterioration of a piezo stack that is close to the valve body, a first drive voltage that is applied to the piezo stack that is closest to the valve body is, over at least a prescribed period, lower than a second drive voltage that is applied to any one of the other piezo stacks.

Classes IPC  ?

  • F16K 31/02 - Moyens de fonctionnementDispositifs de retour à la position de repos électriquesMoyens de fonctionnementDispositifs de retour à la position de repos magnétiques
  • H02N 2/06 - Circuits d'entraînementDispositions pour la commande
  • H10N 30/20 - Dispositifs piézo-électriques ou électrostrictifs à entrée électrique et sortie mécanique, p. ex. fonctionnant comme actionneurs ou comme vibrateurs

26.

DEVICE FOR HOLDING A MICROFLUIDIC CARDTRIDGE

      
Numéro d'application FR2024050740
Numéro de publication 2024/252105
Statut Délivré - en vigueur
Date de dépôt 2024-06-06
Date de publication 2024-12-12
Propriétaire HORIBA ABX SAS (France)
Inventeur(s) Cremien, Didier

Abrégé

The invention relates to a device (1) for holding a microfluidic cartridge (3), the device comprising: - a base (19) arranged to support a microfluidic cartridge (3); and - a cover (21) having an opening (29) and connected to the base (19) by a pivot connection (31), which pivot connection (31) allows the cover (21) to pivot so as to reach a closed position in which, when a microfluidic cartridge (3) is supported by the base (19), the opening (29) is opposite a fluidic inlet (13) of the microfluidic cartridge (3). The device (1) further comprises a flushing system (23) arranged to selectively connect the opening (29) to a reservoir in order to flush a microfluidic cartridge (3) supported by the base (19).

Classes IPC  ?

  • B01L 9/00 - Dispositifs de supportDispositifs de serrage

27.

ANALYSIS DEVICE, ANALYSIS METHOD, AND PROGRAM

      
Numéro d'application JP2024018060
Numéro de publication 2024/247732
Statut Délivré - en vigueur
Date de dépôt 2024-05-16
Date de publication 2024-12-05
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Shibuya, Kyoji
  • Niina, Kodai
  • Okuda, Naoki
  • Miyawaki, Daisuke
  • Ido, Takuya

Abrégé

The purpose of the present invention is to easily determine whether an obtained analysis result is abnormal. An analysis device (100) is provided with an irradiation unit (5), a detection unit (75), and a calculation unit (91). The irradiation unit (5) has a laser that radiates a measurement light (L) toward a sample gas (SG). The detection unit (75) detects the measurement light (L) that has passed through the sample gas (SG). The calculation unit (91) outputs a signal for determining whether the analysis result of a predetermined gas is abnormal on the basis of a residual between detection signal information based on a detection signal obtained by detecting the measurement light (L) by the detection unit (75) and reference signal information based on a reference signal obtained in advance by causing the predetermined gas to absorb the measurement light (L).

Classes IPC  ?

  • G01N 21/3504 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique en utilisant la lumière infrarouge pour l'analyse des gaz, p. ex. analyse de mélanges de gaz
  • G01N 21/39 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique en utilisant des lasers à longueur d'onde réglable

28.

CELL FOR SPECTROSCOPIC ANALYSIS, SPECTROSCOPIC ANALYSIS DEVICE, AND SPECTROSCOPIC ANALYSIS METHOD

      
Numéro d'application JP2024019843
Numéro de publication 2024/248081
Statut Délivré - en vigueur
Date de dépôt 2024-05-30
Date de publication 2024-12-05
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Ueno, Kusuo
  • Murakami, Tatsuki
  • Minowa, Hiroki

Abrégé

In order to prevent cracking of a translucent plate even in cases where a wide range of a sample is measured while speeding up the measurement in a non-exposed environment by pressing and flattening the sample with a translucent plate such as a glass plate, or in cases where the translucent plate is thin, this cell 100 which is used for spectroscopic analysis and holds a sample S is provided with: a base 10 for supporting the sample S; a sealing member 20 that surrounds the sample S on the base 10; a translucent plate 30 for having the sample S sandwiched between itself and the base 10; and a decompression flow path L that is in communication with a sample space which is surrounded by the base 10, the sealing member 20, and the translucent plate 30.

Classes IPC  ?

29.

COMPUTATION DEVICE, PRESSURE MEASUREMENT DEVICE, COMPUTATION METHOD, AND COMPUTATION PROGRAM

      
Numéro d'application JP2024011338
Numéro de publication 2024/247452
Statut Délivré - en vigueur
Date de dépôt 2024-03-22
Date de publication 2024-12-05
Propriétaire HORIBA STEC, CO., LTD. (Japon)
Inventeur(s)
  • Hamada, Chihiro
  • Kandori, Satsuki

Abrégé

The present invention comprises: a reception unit 10 that receives an input value from a sensor S; a data group storage unit 40 that stores a data group comprising a plurality of input values acquired in advance; a statistical distance calculation unit 50 that calculates the statistical distance, with respect to the data group, of the input value received by the reception unit 10; a smoothing processing unit 20 that performs smoothing processing on the input value received by the reception unit 10; a determination unit 70 that determines whether or not the statistical distance satisfies a predetermined condition; and an expression change unit 80 that, if the statistical distance does not satisfy the predetermined condition, changes an arithmetic expression used for the smoothing processing from a first arithmetic expression used when the statistical distance satisfies the predetermined condition to a second arithmetic expression having higher followability.

Classes IPC  ?

  • G01D 3/00 - Dispositions pour la mesure prévues pour les objets particuliers indiqués dans les sous-groupes du présent groupe
  • G01L 19/06 - Moyens pour empêcher la surcharge ou l'influence délétère du milieu à mesurer sur le dispositif de mesure ou vice versa

30.

YUMIVET

      
Numéro de série 79415026
Statut En instance
Date de dépôt 2024-12-04
Propriétaire HORIBA ABX SAS (France)
Classes de Nice  ? 10 - Appareils et instruments médicaux

Produits et services

Veterinary apparatus and instruments.

31.

RADIATION TEMPERATURE MEASUREMENT DEVICE, RADIATION TEMPERATURE MEASUREMENT METHOD, AND PROGRAM FOR RADIATION TEMPERATURE MEASUREMENT DEVICE

      
Numéro d'application JP2024010200
Numéro de publication 2024/241674
Statut Délivré - en vigueur
Date de dépôt 2024-03-15
Date de publication 2024-11-28
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Fujino, Sho
  • Tominaga, Koji

Abrégé

Provided is a radiation temperature measurement device that measures the temperature of an object-to-be-measured having a substrate and a thin film formed on the surface of the substrate, wherein the radiation temperature measurement device comprises: an infrared detection unit that detects the amount of infrared rays radiated from the object-to-be-measured; a substrate spectral characteristic data storage unit that stores substrate spectral characteristic data indicating the temperature characteristics of the spectral characteristics of the substrate; an individual spectral characteristic data reception unit that receives an input of individual spectral characteristic data indicating information pertaining to the reflectance and transmittance of the object-to-be-measured at a prescribed temperature; a spectral characteristic calculation unit that calculates the temperature characteristics of the spectral characteristics of the object-to-be-measured on the basis of the substrate spectral characteristic data and the individual spectral characteristic data; and a temperature calculation unit that calculates the temperature of the object-to-be-measured on the basis of the amount of infrared rays detected by the infrared detection unit and the temperature characteristics of the spectral characteristics of the object-to-be-measured calculated by the spectral characteristic calculation unit.

Classes IPC  ?

  • G01J 5/70 - Compensation passive des mesures du pyromètre, p. ex. par utilisation de mesures de la température ambiante ou de la température interne du boîtier
  • G01J 5/00 - Pyrométrie des radiations, p. ex. thermométrie infrarouge ou optique
  • G01J 5/60 - Pyrométrie des radiations, p. ex. thermométrie infrarouge ou optique en utilisant la détermination de la température de couleur
  • H01L 21/66 - Test ou mesure durant la fabrication ou le traitement

32.

ANALYSIS DEVICE, PROGRAM FOR ANALYSIS DEVICE, AND ANALYSIS METHOD

      
Numéro d'application JP2024017471
Numéro de publication 2024/241920
Statut Délivré - en vigueur
Date de dépôt 2024-05-10
Date de publication 2024-11-28
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Shibuya, Kyoji
  • Hamauchi, Shota
  • Niina, Kodai
  • Yamamoto, Tomomi

Abrégé

The present invention is an analysis device 100 that analyzes acetylene in a sample gas containing acetylene and at least one type of hydrocarbon other than acetylene. The analysis device 100 includes: a laser light source 2 that irradiates the sample gas with a laser beam; a photodetector 3 that detects the intensity of sample light, which is the laser beam that has passed through the sample gas; and a signal processing device 4 that calculates the concentration of acetylene on the basis of the output signal of the photodetector 3. The signal processing device 4 calculates the concentration of acetylene on the basis of the absorption of acetylene between 7.56 μm and 7.66 μm or between 7.27 μm and 7.83 μm.

Classes IPC  ?

  • G01N 21/3504 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique en utilisant la lumière infrarouge pour l'analyse des gaz, p. ex. analyse de mélanges de gaz
  • G01N 21/39 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique en utilisant des lasers à longueur d'onde réglable

33.

VERIDRIVE

      
Numéro de série 79414515
Statut En instance
Date de dépôt 2024-11-26
Propriétaire HORIBA, Ltd. (Japon)
Classes de Nice  ?
  • 09 - Appareils et instruments scientifiques et électriques
  • 37 - Services de construction; extraction minière; installation et réparation
  • 42 - Services scientifiques, technologiques et industriels, recherche et conception

Produits et services

Measurement apparatus and instruments for vehicle engine emission, and parts and fittings therefor; measurement apparatus and instruments for engine emission, and parts and fittings therefor; measurement apparatus and instruments for emission, and parts and fittings therefor; measurement apparatus and instruments for exhaust gases, and parts and fittings therefor; measurement apparatus and instruments for process gases, and parts and fittings therefor; measuring and analyzing apparatus and instruments for vehicle engine emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for engine emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for exhaust gases, and parts and fittings therefor; measuring and analyzing apparatus and instruments for process gases, and parts and fittings therefor; on-board measurement apparatus and instruments for vehicle engine emission, and parts and fittings therefor; on-board measurement apparatus and instruments for engine emission, and parts and fittings therefor; on-board measurement apparatus and instruments for emission, and parts and fittings therefor; on-board measurement apparatus and instruments for exhaust gases, and parts and fittings therefor; on-board measurement apparatus and instruments for process gases, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for vehicle engine emission, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for engine emission, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for emission, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for exhaust gases, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for process gases, and parts and fittings therefor; portable measurement apparatus and instruments for vehicle engine emission, and parts and fittings therefor; portable measurement apparatus and instruments for engine emission, and parts and fittings therefor; portable measurement apparatus and instruments for emission, and parts and fittings therefor; portable measurement apparatus and instruments for exhaust gases, and parts and fittings therefor; portable measurement apparatus and instruments for process gases, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for vehicle engine emission, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for engine emission, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for emission, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for exhaust gases, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for process gases, and parts and fittings therefor; measurement apparatus and instruments for automobile emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for automobile emission, and parts and fittings therefor; measurement apparatus and instruments for vehicle emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for vehicle emission, and parts and fittings therefor; vehicle engine testing apparatus and instruments, and parts and fittings therefor; automotive engine testing apparatus and instruments, and parts and fittings therefor; engine testing apparatus and instruments, and parts and fittings therefor; computer software for controlling measurement apparatus and instruments for vehicle engine emission; computer software for controlling measurement apparatus and instruments for engine emission; computer software for controlling measurement apparatus and instruments for emission; computer software for controlling measurement apparatus and instruments for exhaust gases; computer software for controlling measurement apparatus and instruments for process gases; computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; computer software for controlling measuring and analyzing apparatus and instruments for engine emission; computer software for controlling measuring and analyzing apparatus and instruments for emission; computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; computer software for controlling measuring and analyzing apparatus and instruments for process gases; computer software for controlling engine testing apparatus and instruments; computer software; measuring or testing machines and instruments; laboratory apparatus and instruments; optical machines and apparatus; cinematographic machines and apparatus; photographic machines and apparatus. Repair or maintenance of measurement apparatus and instruments for vehicle engine emission; repair or maintenance of measurement apparatus and instruments for engine emission; repair or maintenance of measurement apparatus and instruments for emission; repair or maintenance of measurement apparatus and instruments for exhaust gases; repair or maintenance of measurement apparatus and instruments for process gases; repair or maintenance of measuring and analyzing apparatus and instruments for vehicle engine emission; repair or maintenance of measuring and analyzing apparatus and instruments for engine emission; repair or maintenance of measuring and analyzing apparatus and instruments for emission; repair or maintenance of measuring and analyzing apparatus and instruments for exhaust gases; repair or maintenance of measuring and analyzing apparatus and instruments for process gases; repair or maintenance of on-board measurement apparatus and instruments for vehicle engine emission; repair or maintenance of on-board measurement apparatus and instruments for engine emission; repair or maintenance of on-board measurement apparatus and instruments for emission; repair or maintenance of on-board measurement apparatus and instruments for exhaust gases; repair or maintenance of on-board measurement apparatus and instruments for process gases; repair or maintenance of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; repair or maintenance of on-board measuring and analyzing apparatus and instruments for engine emission; repair or maintenance of on-board measuring and analyzing apparatus and instruments for emission; repair or maintenance of on-board measuring and analyzing apparatus and instruments for exhaust gases; repair or maintenance of on-board measuring and analyzing apparatus and instruments for process gases; repair or maintenance of portable measurement apparatus and instruments for vehicle engine emission; repair or maintenance of portable measurement apparatus and instruments for engine emission; repair or maintenance of portable measurement apparatus and instruments for emission; repair or maintenance of portable measurement apparatus and instruments for exhaust gases; repair or maintenance of portable measurement apparatus and instruments for process gases; repair or maintenance of portable measuring and analyzing apparatus and instruments for vehicle engine emission; repair or maintenance of portable measuring and analyzing apparatus and instruments for engine emission; repair or maintenance of portable measuring and analyzing apparatus and instruments for emission; repair or maintenance of portable measuring and analyzing apparatus and instruments for exhaust gases; repair or maintenance of portable measuring and analyzing apparatus and instruments for process gases; repair or maintenance of measurement apparatus and instruments for automobile emission; repair or maintenance of measuring and analyzing apparatus and instruments for automobile emission; repair or maintenance of measurement apparatus and instruments for vehicle emission; repair or maintenance of measuring and analyzing apparatus and instruments for vehicle emission; repair or maintenance of vehicle engine testing apparatus and instruments; repair or maintenance of automotive engine testing apparatus and instruments; repair or maintenance of engine testing apparatus and instruments; repair or maintenance of measuring or testing machines and instruments; repair or maintenance of laboratory apparatus and instruments; repair or maintenance of optical machines and apparatus; repair or maintenance of cinematographic machines and apparatus; repair or maintenance of photographic machines and apparatus. Rental of measurement apparatus and instruments for vehicle engine emission; rental of measurement apparatus and instruments for engine emission; rental of measurement apparatus and instruments for emission; rental of measurement apparatus and instruments for exhaust gases; rental of measurement apparatus and instruments for process gases; rental of measuring and analyzing apparatus and instruments for vehicle engine emission; rental of measuring and analyzing apparatus and instruments for engine emission; rental of measuring and analyzing apparatus and instruments for emission; rental of measuring and analyzing apparatus and instruments for exhaust gases; rental of measuring and analyzing apparatus and instruments for process gases; rental of on-board measurement apparatus and instruments for vehicle engine emission; rental of on-board measurement apparatus and instruments for engine emission; rental of on-board measurement apparatus and instruments for emission; rental of on-board measurement apparatus and instruments for exhaust gases; rental of on-board measurement apparatus and instruments for process gases; rental of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; rental of on-board measuring and analyzing apparatus and instruments for engine emission; rental of on-board measuring and analyzing apparatus and instruments for emission; rental of on-board measuring and analyzing apparatus and instruments for exhaust gases; rental of on-board measuring and analyzing apparatus and instruments for process gases; rental of portable measurement apparatus and instruments for vehicle engine emission; rental of portable measurement apparatus and instruments for engine emission; rental of portable measurement apparatus and instruments for emission; rental of portable measurement apparatus and instruments for exhaust gases; rental of portable measurement apparatus and instruments for process gases; rental of portable measuring and analyzing apparatus and instruments for vehicle engine emission; rental of portable measuring and analyzing apparatus and instruments for engine emission; rental of portable measuring and analyzing apparatus and instruments for emission; rental of portable measuring and analyzing apparatus and instruments for exhaust gases; rental of portable measuring and analyzing apparatus and instruments for process gases; rental of measurement apparatus and instruments for automobile emission; rental of measuring and analyzing apparatus and instruments for automobile emission; rental of measurement apparatus and instruments for vehicle emission; rental of measuring and analyzing apparatus and instruments for vehicle emission; rental of vehicle engine testing apparatus and instruments; rental of automotive engine testing apparatus and instruments; rental of engine testing apparatus and instruments; rental of measuring or testing machines and instruments; rental of laboratory apparatus and instruments; calibration of measurement apparatus and instruments for vehicle engine emission; calibration of measurement apparatus and instruments for engine emission; calibration of measurement apparatus and instruments for emission; calibration of measurement apparatus and instruments for exhaust gases; calibration of measurement apparatus and instruments for process gases; calibration of measuring and analyzing apparatus and instruments for vehicle engine emission; calibration of measuring and analyzing apparatus and instruments for engine emission; calibration of measuring and analyzing apparatus and instruments for emission; calibration of measuring and analyzing apparatus and instruments for exhaust gases; calibration of measuring and analyzing apparatus and instruments for process gases; calibration of on-board measurement apparatus and instruments for vehicle engine emission; calibration of on-board measurement apparatus and instruments for engine emission; calibration of on-board measurement apparatus and instruments for emission; calibration of on-board measurement apparatus and instruments for exhaust gases; calibration of on-board measurement apparatus and instruments for process gases; calibration of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; calibration of on-board measuring and analyzing apparatus and instruments for engine emission; calibration of on-board measuring and analyzing apparatus and instruments for emission; calibration of on-board measuring and analyzing apparatus and instruments for exhaust gases; calibration of on-board measuring and analyzing apparatus and instruments for process gases; calibration of portable measurement apparatus and instruments for vehicle engine emission; calibration of portable measurement apparatus and instruments for engine emission; calibration of portable measurement apparatus and instruments for emission; calibration of portable measurement apparatus and instruments for exhaust gases; calibration of portable measurement apparatus and instruments for process gases; calibration of portable measuring and analyzing apparatus and instruments for vehicle engine emission; calibration of portable measuring and analyzing apparatus and instruments for engine emission; calibration of portable measuring and analyzing apparatus and instruments for emission; calibration of portable measuring and analyzing apparatus and instruments for exhaust gases; calibration of portable measuring and analyzing apparatus and instruments for process gases; calibration of measurement apparatus and instruments for automobile emission; calibration of measuring and analyzing apparatus and instruments for automobile emission; calibration of measurement apparatus and instruments for vehicle emission; calibration of measuring and analyzing apparatus and instruments for vehicle emission; calibration of vehicle engine testing apparatus and instruments; calibration of automotive engine testing apparatus and instruments; calibration of engine testing apparatus and instruments; calibration of measuring or testing machines and instruments; calibration of laboratory apparatus and instruments; calibration of optical machines and apparatus; calibration of cinematographic machines and apparatus; calibration of photographic machines and apparatus; design of measurement apparatus and instruments for vehicle engine emission; design of measurement apparatus and instruments for engine emission; design of measurement apparatus and instruments for emission; design of measurement apparatus and instruments for exhaust gases; design of measurement apparatus and instruments for process gases; design of measuring and analyzing apparatus and instruments for vehicle engine emission; design of measuring and analyzing apparatus and instruments for engine emission; design of measuring and analyzing apparatus and instruments for emission; design of measuring and analyzing apparatus and instruments for exhaust gases; design of measuring and analyzing apparatus and instruments for process gases; design of on-board measurement apparatus and instruments for vehicle engine emission; design of on-board measurement apparatus and instruments for engine emission; design of on-board measurement apparatus and instruments for emission; design of on-board measurement apparatus and instruments for exhaust gases; design of on-board measurement apparatus and instruments for process gases; design of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; design of on-board measuring and analyzing apparatus and instruments for engine emission; design of on-board measuring and analyzing apparatus and instruments for emission; design of on-board measuring and analyzing apparatus and instruments for exhaust gases; design of on-board measuring and analyzing apparatus and instruments for process gases; design of portable measurement apparatus and instruments for vehicle engine emission; design of portable measurement apparatus and instruments for engine emission; design of portable measurement apparatus and instruments for emission; design of portable measurement apparatus and instruments for exhaust gases; design of portable measurement apparatus and instruments for process gases; design of portable measuring and analyzing apparatus and instruments for vehicle engine emission; design of portable measuring and analyzing apparatus and instruments for engine emission; design of portable measuring and analyzing apparatus and instruments for emission; design of portable measuring and analyzing apparatus and instruments for exhaust gases; design of portable measuring and analyzing apparatus and instruments for process gases; design of measurement apparatus and instruments for automobile emission; design of measuring and analyzing apparatus and instruments for automobile emission; design of measurement apparatus and instruments for vehicle emission; design of measuring and analyzing apparatus and instruments for vehicle emission; design of vehicle engine testing apparatus and instruments; design of automotive engine testing apparatus and instruments; design of engine testing apparatus and instruments; design of measuring or testing machines and instruments; design of laboratory apparatus and instruments; design of optical machines and apparatus; design of cinematographic machines and apparatus; design of photographic machines and apparatus; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for vehicle engine emission; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for engine emission; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for emission; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for exhaust gases; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for process gases; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for engine emission; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for emission; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for process gases; design, programming and maintenance of computer software for controlling engine testing apparatus and instruments; design, programming and maintenance of computer software; rental of computer software for controlling measurement apparatus and instruments for vehicle engine emission; rental of computer software for controlling measurement apparatus and instruments for engine emission; rental of computer software for controlling measurement apparatus and instruments for emission; rental of computer software for controlling measurement apparatus and instruments for exhaust gases; rental of computer software for controlling measurement apparatus and instruments for process gases; rental of computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; rental of computer software for controlling measuring and analyzing apparatus and instruments for engine emission; rental of computer software for controlling measuring and analyzing apparatus and instruments for emission; rental of computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; rental of computer software for controlling measuring and analyzing apparatus and instruments for process gases; rental of computer software for controlling engine testing apparatus and instruments; rental of computer software; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for vehicle engine emission; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for engine emission; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for emission; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for exhaust gases; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for process gases; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for engine emission; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for emission; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for process gases; providing on-line non-downloadable computer software for controlling engine testing apparatus and instruments; providing on-line non-downloadable computer software; designing of machines, apparatus, instruments [including their parts] or systems composed of such machines, apparatus and instruments; computer software design, computer programming, or maintenance of computer software; technological advice relating to computers, automobiles and industrial machines; testing or research on machines, apparatus and instruments.

34.

ION ANALYSIS DEVICE AND FUEL CELL EVALUATION SYSTEM

      
Numéro d'application 18564875
Statut En instance
Date de dépôt 2022-06-02
Date de la première publication 2024-11-21
Propriétaire
  • HORIBA, LTD. (Japon)
  • HORIBA ADVANCED TECHNO, CO., LTD. (Japon)
Inventeur(s)
  • Okada, Yoichi
  • Tanaka, Yoshinori
  • Sasai, Kohei
  • Watanabe, Shunta
  • Miyamura, Kazuhiro

Abrégé

An ion analysis device includes a sampling unit configured to sample condensate of exhaust gas flowing through an exhaust gas line in a fuel cell; and a sensor unit configured to measure an ion concentration of the condensate, in which the sampling unit is configured to sample the condensate of the exhaust gas from a first reservoir that is provided to the exhaust gas line and where the condensate of the exhaust gas is collected, or to sample the exhaust gas from the exhaust gas line and to collect condensate of the sampled exhaust gas in a second reservoir.

Classes IPC  ?

35.

FLUID CONTROL VALVE AND FLUID CONTROL DEVICE

      
Numéro d'application 18610819
Statut En instance
Date de dépôt 2024-03-20
Date de la première publication 2024-10-31
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Kondo, Noriaki
  • Miyamoto, Hideaki
  • Tasaka, Naoya

Abrégé

A fluid control valve improves position stability of a displacement expanding mechanism, and includes an actuator for driving the valve body, and the displacement expanding mechanism interposed between the valve body and the actuator to expand displacement of the actuator and transmit the displacement to the valve body. The displacement expanding mechanism includes an input member that is displaced upon receiving a driving force from the actuator, and a plurality of lever members that are disposed around a central axis of the valve body between the input member and the valve body, and expand displacement of the input member and transmit the displacement to the valve body. The plurality of lever members each have a contact surface with which the input member comes into contact to serve as a force point portion. The contact surface forms a downward gradient toward the central axis of the valve body.

Classes IPC  ?

  • F16K 31/524 - Moyens mécaniques d'actionnement à manivelle, excentrique ou came à came
  • F16K 7/14 - Dispositifs d'obturation à diaphragme, p. ex. dont un élément est déformé, sans être déplacé entièrement, pour fermer l'ouverture à diaphragme plat, en forme d'assiette ou en forme de bol disposé pour être déformé contre un siège plat
  • F16K 31/00 - Moyens de fonctionnementDispositifs de retour à la position de repos

36.

FLUID CONTROL VALVE, FLUID CONTROL DEVICE, AND MATERIAL SUPPLY SYSTEM

      
Numéro d'application 18642642
Statut En instance
Date de dépôt 2024-04-22
Date de la première publication 2024-10-31
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Hanada, Kazuo
  • Taguchi, Akihiro
  • Tayama, Kenta

Abrégé

A fluid control valve includes a casing, and a piezo actuator that is housed in the casing and held at one end side of the casing to extend toward another end side of the casing, where the casing has a vent hole.

Classes IPC  ?

  • F16K 27/00 - Structures des logementsMatériaux utilisés à cet effet
  • F16K 31/00 - Moyens de fonctionnementDispositifs de retour à la position de repos

37.

EXHAUST GAS SAMPLING DEVICE, EXHAUST GAS ANALYSIS SYSTEM, EXHAUST GAS SAMPLING METHOD, AND PROGRAM FOR EXHAUST GAS SAMPLING DEVICE

      
Numéro d'application 18701045
Statut En instance
Date de dépôt 2022-10-03
Date de la première publication 2024-10-17
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Kimura, Takeshi
  • Kuriaki, Kazunori
  • Higuchi, Masahiro
  • Komatsu, Yoji
  • Tomita, Jun

Abrégé

An exhaust gas sampling device that collects an exhaust gas emitted from a vehicle including an engine or a part of the vehicle into a sampling bag includes a main channel through which the exhaust gas flows, a main valve that opens and shuts the main channel, a dilution gas channel that is connected downstream from the main valve in the main channel and introduces a dilution gas into the main channel, a purge gas channel that branches from the dilution gas channel and has a downstream end connected downstream from the main valve in the main channel and upstream from a junction of the dilution gas channel and a purge pump that is disposed in the purge gas channel, sucks a part of the dilution gas flowing through the dilution gas channel, and delivers the sucked part as a purge gas to the main channel.

Classes IPC  ?

  • G01M 15/10 - Test des moteurs à combustion interne par contrôle des gaz d'échappement
  • G01N 1/22 - Dispositifs pour prélever des échantillons à l'état gazeux

38.

TEST SYSTEM, TEST METHOD, AND PROGRAM RECORDING MEDIUM FOR TEST SYSTEM

      
Numéro d'application 18292121
Statut En instance
Date de dépôt 2022-07-25
Date de la première publication 2024-10-10
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Michikita, Toshiyuki
  • Kawazoe, Hiroshi
  • Furukawa, Kazuki
  • Hirose, Yoku
  • Shiomi, Kenji

Abrégé

A test system that conducts a test of a test subject that is a vehicle or a part thereof that includes an electronic control device, comprises a drive test device for conducting a drive test of the test subject, an automatic driving robot that drives the test subject, and a signal control unit that is connected to the test subject by wire or wirelessly and that transmits, to the electronic control device, a test signal for evaluating the electronic control device.

Classes IPC  ?

  • G01M 17/007 - Véhicules à roues ou à chenilles
  • G06F 21/57 - Certification ou préservation de plates-formes informatiques fiables, p. ex. démarrages ou arrêts sécurisés, suivis de version, contrôles de logiciel système, mises à jour sécurisées ou évaluation de vulnérabilité

39.

SILICON DRIFT DETECTION ELEMENT, SILICON DRIFT DETECTOR, AND RADIATION DETECTION DEVICE

      
Numéro d'application 18744506
Statut En instance
Date de dépôt 2024-06-14
Date de la première publication 2024-10-10
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Matsunaga, Daisuke
  • Aoyama, Junichi
  • Okubo, Yuji
  • Ikawa, Seiji

Abrégé

A silicon drift detector includes a housing and a silicon drift detection element that is disposed inside the housing. The housing includes an opening that is not closed. The silicon drift detection element includes a top surface facing the opening, and a light shielding film is provided on the top surface.

Classes IPC  ?

  • G01T 1/24 - Mesure de l'intensité de radiation avec des détecteurs à semi-conducteurs
  • G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X
  • H01L 31/0203 - Conteneurs; Encapsulations
  • H01L 31/0216 - Revêtements
  • H01L 31/0224 - Electrodes
  • H01L 31/08 - Dispositifs à semi-conducteurs sensibles aux rayons infrarouges, à la lumière, au rayonnement électromagnétique d'ondes plus courtes, ou au rayonnement corpusculaire, et spécialement adaptés, soit comme convertisseurs de l'énergie dudit rayonnement e; Procédés ou appareils spécialement adaptés à la fabrication ou au traitement de ces dispositifs ou de leurs parties constitutives; Leurs détails dans lesquels le rayonnement commande le flux de courant à travers le dispositif, p.ex. photo-résistances

40.

TEST SPECIMEN DISPLAY RECOGNITION DEVICE, TEST SPECIMEN TESTING SYSTEM, TEST SPECIMEN DISPLAY SETTING DEVICE, TEST SPECIMEN DISPLAY RECOGNITION METHOD, AND TEST SPECIMEN DISPLAY RECOGNITION PROGRAM

      
Numéro d'application JP2024013028
Numéro de publication 2024/204704
Statut Délivré - en vigueur
Date de dépôt 2024-03-29
Date de publication 2024-10-03
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Komatsu, Yoji
  • Michikita, Toshiyuki
  • Yoshinaka, Yuji
  • Prasad, Rohit Shiv
  • Yabushita, Hirotaka
  • Matsueda, Atsuo
  • Otake, Ryoga

Abrégé

The present invention provides a test specimen display recognition device for identifying a test specimen display for indicating a state of a test specimen, from an image obtained by imaging a meter panel of the test specimen by means of a camera, the test specimen display recognition device comprising: a setting information accepting unit for accepting a selection signal indicating the type of an image recognition algorithm for identifying the test specimen display from the image; a setting information storage unit for storing the selection signal accepted by the setting information accepting unit as setting information; and a test sample display recognition unit for acquiring the setting information from the setting information storage unit and identifying an instructed value indicated by test specimen display on the basis of the setting information.

Classes IPC  ?

41.

PIEZO ELEMENT DIAGNOSIS DEVICE, PIEZO ELEMENT DIAGNOSIS METHOD, PIEZO ELEMENT DIAGNOSIS PROGRAM, FLUID CONTROL DEVICE, AND VAPORIZATION SYSTEM

      
Numéro d'application 18597775
Statut En instance
Date de dépôt 2024-03-06
Date de la première publication 2024-09-26
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Taguchi, Akihiro
  • Hamada, Chihiro

Abrégé

The present invention enables a piezo element to be replaced or maintained at an appropriate timing, and is a piezo element diagnosis device for making a diagnosis of a piezo element incorporated in a piece of equipment, and includes a driving information acquisition unit that acquires driving information of the piezo element, and a life calculation unit that calculates a consumed life or a remaining life of the piezo element based on the driving information.

Classes IPC  ?

  • H10N 30/80 - Détails de structure
  • G01N 29/22 - Recherche ou analyse des matériaux par l'emploi d'ondes ultrasonores, sonores ou infrasonoresVisualisation de l'intérieur d'objets par transmission d'ondes ultrasonores ou sonores à travers l'objet Détails

42.

PARTICLE SIZE DISTRIBUTION MEASUREMENT DEVICE, PARTICLE SIZE DISTRIBUTION MEASUREMENT METHOD, AND PROGRAM FOR PARTICLE SIZE DISTRIBUTION MEASUREMENT DEVICE

      
Numéro d'application 18257390
Statut En instance
Date de dépôt 2021-11-24
Date de la première publication 2024-09-19
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s) Yamaguchi, Tetsuji

Abrégé

A centrifugal sedimentation-type particle size distribution measurement device that measures the particle size distribution in a measurement sample by rotating a measurement cell that contains the measurement sample and causing particles in the measurement sample to sediment, said particle size distribution measurement device comprising: a light source that irradiates the measurement cell with light; a scattered light detector that detects the intensity of scattered light caused by the particles in the measurement cell; and a particle size distribution calculation unit that measures the particle size distribution in the measurement sample on the basis of the change over time in the scattered light intensity, said change being caused by the particle sedimentation.

Classes IPC  ?

  • G01N 15/0205 - Recherche de la dimension ou de la distribution des dimensions des particules par des moyens optiques
  • G01N 15/04 - Recherche de la sédimentation des suspensions de particules

43.

CENTRIFUGAL SEDIMENTATION-TYPE MEASUREMENT APPARATUS AND CENTRIFUGAL SEDIMENTATION-TYPE MEASUREMENT METHOD

      
Numéro d'application JP2024005978
Numéro de publication 2024/190313
Statut Délivré - en vigueur
Date de dépôt 2024-02-20
Date de publication 2024-09-19
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Yamaguchi, Tetsuji
  • Igushi, Tatsuo
  • Sato, Yusui
  • Yashiki, Shota

Abrégé

With the purpose of enabling multiple kinds of substances contained in a sample to be analyzed all at once without requiring replacement of light sources and other such labor by using a centrifugal sedimentation-type measurement apparatus, this invention additionally involves a second light source that illuminates a cell with light having a wavelength different from the wavelength of light from a first light source, and a second detector that detects secondary light generated due to the sample being illuminated with the light from the second light source.

Classes IPC  ?

  • G01N 15/04 - Recherche de la sédimentation des suspensions de particules

44.

SPECIMEN ANALYZER, SPECIMEN ANALYSIS SYSTEM, AND SPECIMEN DISPENSING METHOD

      
Numéro d'application JP2024007536
Numéro de publication 2024/190437
Statut Délivré - en vigueur
Date de dépôt 2024-02-29
Date de publication 2024-09-19
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Hirata Katsuki
  • Sano Tomoki

Abrégé

This specimen analyzer is provided with a specimen measuring cell and a dispensing mechanism for dispensing a specimen. The dispensing mechanism dispenses a specimen into the specimen measuring cell and a test device that is held at a different position from the specimen measuring cell.

Classes IPC  ?

  • G01N 35/10 - Dispositifs pour transférer les échantillons vers, dans ou à partir de l'appareil d'analyse, p. ex. dispositifs d'aspiration, dispositifs d'injection
  • G01N 35/00 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes Manipulation de matériaux à cet effet
  • G01N 35/08 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes Manipulation de matériaux à cet effet en utilisant un courant d'échantillons discrets circulant dans une canalisation, p. ex. analyse à injection dans un écoulement
  • G01N 37/00 - Détails non couverts par les autres groupes de la présente sous-classe

45.

APPARATUS AND METHOD FOR TESTING AUTOMATED VEHICLES

      
Numéro d'application 18667380
Statut En instance
Date de dépôt 2024-05-17
Date de la première publication 2024-09-12
Propriétaire HORIBA INSTRUMENTS INCORPORATED (USA)
Inventeur(s) Breton, Leo Alphonse Gerard

Abrégé

A processor, responsive to a set of location or motion data describing one or more objects relative to a first, local frame of reference, generates a transformed set of location or motion data describing the one or more objects relative to a second, local frame of reference different than the first local frame of reference, such that the set of location or motion data and the transformed set of location or motion data relative to a global frame of reference are same. The processor also outputs the transformed set of location or motion data to a vehicle such that the vehicle performs control operations responsive thereto.

Classes IPC  ?

  • B60W 40/105 - Vitesse
  • B60W 10/06 - Commande conjuguée de sous-ensembles de véhicule, de fonction ou de type différents comprenant la commande des ensembles de propulsion comprenant la commande des moteurs à combustion
  • B60W 60/00 - Systèmes d’aide à la conduite spécialement adaptés aux véhicules routiers autonomes
  • G01M 17/00 - Test des véhicules

46.

TESTING DEVICE AND METHOD FOR THE OPTICAL RECORDING OF A STEERABLE WHEEL OF A MOTOR VEHICLE, AND VEHICLE TEST STAND COMPRISING THE TESTING DEVICE

      
Numéro d'application EP2024053711
Numéro de publication 2024/179838
Statut Délivré - en vigueur
Date de dépôt 2024-02-14
Date de publication 2024-09-06
Propriétaire HORIBA EUROPE GMBH (Allemagne)
Inventeur(s)
  • Engelbert, André
  • Poppe, Jan

Abrégé

A testing device (10) for a steerable wheel (21) of a motor vehicle is described, the device comprising a main structure (11), which is indirectly or directly supported on a surface (UG), comprising a first roller (14-1) and a second roller (14-2), which are arranged on or against the main structure (12) and on which the steerable wheel (21) of the motor vehicle can be supported, wherein the first roller (14-1) and the second roller (14-2), with the wheel (21) supported on them, are rotatable in relation to the surface (UG) about a steering axis (LA) that is substantially orthogonal to a wheel axis (RA), further comprising at least one sensor device (60), which is designed to record a steering angle and/or a rolling speed of the wheel (21), and comprising a control unit (52), which is designed to process data recorded by the sensor device (60). According to the invention, the sensor device (60) is arranged along the wheel axis (RA) at a distance (SRA) from a rim (21f) of the wheel (21), and the distance (SRA) is chosen such that an image of the rim (21f) of the wheel (21) and/or of essentially the entire wheel (21) can be recorded by means of the sensor device (60) on the basis of electromagnetic radiation that is incident on the sensor device (60) from the rim (21f) or the wheel (21), in particular reflected from the rim or the wheel. Also described are a vehicle test stand comprising such a testing device and a method for recording movements of a steerable wheel.

Classes IPC  ?

  • G01M 17/06 - Comportement de la directionComportement du train de roulement
  • G01M 17/007 - Véhicules à roues ou à chenilles

47.

ELEMENTAL ANALYSIS DEVICE AND ELEMENTAL ANALYSIS METHOD

      
Numéro d'application JP2024005932
Numéro de publication 2024/181221
Statut Délivré - en vigueur
Date de dépôt 2024-02-20
Date de publication 2024-09-06
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Yamada, Takahiro
  • Kawakami, Shun
  • Park, Sangwoon

Abrégé

An elemental analysis device 100 comprises: a heating furnace 1 that heats a sample to generate a sample gas G; a flow path L1 through which the sample gas G flows; a flow rate adjusting unit 3 provided in the flow path L1 to adjust the flow rate of the sample gas G; an oxidizer 4 provided downstream of the flow rate adjusting unit 3 in the flow path L1 to oxidize the sample gas G; and an analyzing unit 5 provided downstream of the oxidizer 4 in the flow path L1 to analyze elements contained in the sample gas G.

Classes IPC  ?

  • G01N 31/12 - Utilisation de la combustion
  • G01N 31/00 - Recherche ou analyse des matériaux non biologiques par l'emploi des procédés chimiques spécifiés dans les sous-groupesAppareils spécialement adaptés à de tels procédés

48.

CONCENTRATION CONTROL DEVICE, RAW MATERIAL VAPORIZATION SYSTEM, CONCENTRATION CONTROL METHOD, AND RECORDING MEDIUM STORING CONCENTRATION CONTROL PROGRAM

      
Numéro d'application 18588463
Statut En instance
Date de dépôt 2024-02-27
Date de la première publication 2024-08-29
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s) Takijiri, Kotaro

Abrégé

A concentration control device enables concentration control at high speed and with suppressed overshoot and is used in a raw material vaporization system that introduces a carrier gas into a liquid or solid raw material contained in a vaporization tank, vaporizes the carrier gas, and supplies a raw material gas generated by vaporization. The concentration control device includes flow rate control equipment that controls a flow rate of the carrier gas, a concentration measurement unit that measures a concentration of the raw material gas, and a flow rate control unit that controls a flow rate operation amount input to the flow rate control equipment by model predictive control based on a target concentration value of the raw material gas and a measured concentration value of the concentration measurement unit.

Classes IPC  ?

49.

PARTICLE IMAGE ANALYSIS APPARATUS, PARTICLE IMAGE ANALYSIS SYSTEM, PARTICLE IMAGE ANALYSIS METHOD, AND PROGRAM FOR PARTICLE IMAGE ANALYSIS APPARATUS

      
Numéro d'application 18572629
Statut En instance
Date de dépôt 2022-03-25
Date de la première publication 2024-08-29
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s) Tatewaki, Yasuhiro

Abrégé

A particle analysis apparatus includes: an individual particle image generation unit that extracts individual particles from the original image and generates individual particle images; a particle characteristic calculation unit that calculates one or a plurality of types of particle characteristics for a particle in each of the individual particle images, based on the each of the individual particle images; a classification unit that classifies, with respect to a plurality of classes defined by some or all of the one or plurality of types of particle characteristics, the particles into the classes that correspond to the calculated one or plurality of particle characteristics; and an individual particle image storing unit that stores in a storage the individual particle images of particles belonging to each of the plurality of classes.

Classes IPC  ?

  • G06V 20/69 - Objets microscopiques, p. ex. cellules biologiques ou pièces cellulaires
  • G01N 15/0205 - Recherche de la dimension ou de la distribution des dimensions des particules par des moyens optiques
  • G06V 10/98 - Détection ou correction d’erreurs, p. ex. en effectuant une deuxième exploration du motif ou par intervention humaineÉvaluation de la qualité des motifs acquis

50.

BENCH TEST DEVICE AND BENCH TEST METHOD

      
Numéro d'application 18564931
Statut En instance
Date de dépôt 2022-05-27
Date de la première publication 2024-08-15
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s) Kawazoe, Hiroshi

Abrégé

The present invention is to inexpensively configure a bench test device with a steering function for testing a vehicle. A bench test device for testing a test piece, which is a vehicle or a part thereof, includes a rotating body on which a wheel which is a steering wheel of the test piece is placed, a support bench which rotatably supports the rotating body along with rotation of the wheel, and a movement mechanism that moves the support bench on an installation surface using a rotational force of the wheel.

Classes IPC  ?

51.

PARTICLE DIAMETER DISTRIBUTION MEASUREMENT DEVICE, PARTICLE DIAMETER DISTRIBUTION MEASUREMENT METHOD, AND PARTICLE DIAMETER DISTRIBUTION MEASUREMENT PROGRAM

      
Numéro d'application JP2024002288
Numéro de publication 2024/166705
Statut Délivré - en vigueur
Date de dépôt 2024-01-25
Date de publication 2024-08-15
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s) Sugasawa, Hirosuke

Abrégé

A particle diameter distribution measurement device 100 comprising an imaging means 3 that images particles in a cell 1 and an analysis unit 41 that calculates a particle diameter distribution by calculating diffusion velocity due to Brownian motion of the particles in imaging data obtained by the imaging means 3, said particle diameter distribution measurement device 100 being provided with: a data group acquisition unit 43 that acquires, at each of a plurality of focus positions in the cell 1, an imaging data group which comprises a plurality of pieces of imaging data obtained by the imaging means 3; a variable value calculation unit 44 that calculates a variable value of a prescribed evaluation parameter obtained from each of the plurality of pieces of imaging data constituting the imaging data groups; and a focus position determination unit 45 that, on the basis of variable values respectively corresponding to the plurality of focus positions, determines a measurement focus position to be used during measurement.

Classes IPC  ?

  • G01N 15/0227 - Recherche de la dimension ou de la distribution des dimensions des particules par des moyens optiques utilisant l’imagerieRecherche de la dimension ou de la distribution des dimensions des particules par des moyens optiques utilisant l’holographie
  • G03B 13/36 - Systèmes de mise au point automatique

52.

LIQUID MATERIAL VAPORIZATION DEVICE AND LIQUID MATERIAL VAPORIZATION SYSTEM

      
Numéro d'application JP2023044041
Numéro de publication 2024/166518
Statut Délivré - en vigueur
Date de dépôt 2023-12-08
Date de publication 2024-08-15
Propriétaire HORIBA STEC, CO., LTD. (Japon)
Inventeur(s)
  • Kanamaru, Takashi
  • Watanabe, Takao
  • Kawakado, Hajime

Abrégé

A liquid material vaporization device comprising: an accommodation container having side walls and a bottom wall that form an accommodation space for accommodating a liquid material; and a heater that heats and vaporizes the liquid material accommodated in the accommodation space, wherein an insertion hole opening on the outside surface of the accommodation container is formed within the side walls or the bottom wall and extends along the inner wall surface thereof, and the heater is inserted in the insertion hole.

Classes IPC  ?

  • H01L 21/31 - Traitement des corps semi-conducteurs en utilisant des procédés ou des appareils non couverts par les groupes pour former des couches isolantes en surface, p. ex. pour masquer ou en utilisant des techniques photolithographiquesPost-traitement de ces couchesEmploi de matériaux spécifiés pour ces couches
  • B01J 7/02 - Appareillage pour la production de gaz par voie humide
  • C23C 16/448 - Revêtement chimique par décomposition de composés gazeux, ne laissant pas de produits de réaction du matériau de la surface dans le revêtement, c.-à-d. procédés de dépôt chimique en phase vapeur [CVD] caractérisé par le procédé de revêtement caractérisé par le procédé utilisé pour produire des courants de gaz réactifs, p. ex. par évaporation ou par sublimation de matériaux précurseurs
  • H01L 21/205 - Dépôt de matériaux semi-conducteurs sur un substrat, p. ex. croissance épitaxiale en utilisant la réduction ou la décomposition d'un composé gazeux donnant un condensat solide, c.-à-d. un dépôt chimique

53.

TEST OBJECT TESTING SYSTEM, TRAVEL RESISTANCE CALCULATION DEVICE, TRAVEL RESISTANCE CALCULATION PROGRAM, AND TEST OBJECT TESTING METHOD

      
Numéro d'application 18563896
Statut En instance
Date de dépôt 2022-05-24
Date de la première publication 2024-08-08
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s) Kawazoe, Hiroshi

Abrégé

The present invention is a test object testing device that reproduces real driving in a real world with high accuracy using a bench test device and tests a test object that is a vehicle or a part of the vehicle, the test object testing device including a dynamometer that applies a load to the test object, a travel route setting unit that sets a travel route using a map, a road information acquisition unit that acquires road information of the travel route from a map, a travel resistance calculation unit that calculates a travel resistance of the test object on the basis of the road information, and a dynamometer control unit that controls the dynamometer on the basis of the travel resistance.

Classes IPC  ?

  • G01C 21/00 - NavigationInstruments de navigation non prévus dans les groupes

54.

WAFER TEMPERATURE CONTROL DEVICE, WAFER TEMPERATURE CONTROL METHOD AND WAFER TEMPERATURE CONTROL PROGRAM

      
Numéro d'application 18423244
Statut En instance
Date de dépôt 2024-01-25
Date de la première publication 2024-08-01
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Hayashi, Daisuke
  • Takijiri, Kotaro

Abrégé

A wafer temperature control device controls a temperature of a wafer by adjusting pressure of a gas, predicts future a temperature, and controls the temperature to a target temperature. The wafer is placed on a temperature adjusted plate and the gas is supplied between the plate and the wafer to control the wafer temperature. The control device comprises a pressure regulator that adjusts the pressure of the gas, a sensor that measures the vicinity temperature of the wafer, and a pressure control unit that controls a pressure operation amount input to the pressure regulator by model predictive control based on the vicinity temperature and target temperature of the wafer, and the pressure control unit uses a model, in which a heat transfer coefficient between the plate and the wafer is a variable obtained from the pressure of the gas, as a predictive model for the model predictive control.

Classes IPC  ?

  • H01L 21/67 - Appareils spécialement adaptés pour la manipulation des dispositifs à semi-conducteurs ou des dispositifs électriques à l'état solide pendant leur fabrication ou leur traitementAppareils spécialement adaptés pour la manipulation des plaquettes pendant la fabrication ou le traitement des dispositifs à semi-conducteurs ou des dispositifs électriques à l'état solide ou de leurs composants
  • H01L 21/66 - Test ou mesure durant la fabrication ou le traitement

55.

FLUID CONTROL DEVICE, FLUID CONTROL SYSTEM, FLUID CONTROL DEVICE PROGRAM, AND FLUID CONTROL METHOD

      
Numéro d'application 18560174
Statut En instance
Date de dépôt 2022-03-11
Date de la première publication 2024-07-25
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Matsuura, Kazuhiro
  • Nagai, Kentaro
  • Matsumoto, Sota

Abrégé

A fluid control device in which a fluid control valve, an upstream pressure sensor, a fluid resistance element, and a downstream pressure sensor are arranged in this order from an upstream side, includes: an actual flow rate calculation unit that calculates a flow rate on basis of pressures measured by the upstream pressure sensor and the downstream pressure sensor; a delayed flow rate calculation unit that calculates a delayed flow rate by generating a response delay in the calculated flow rate calculated by the actual flow rate calculation unit; and a flow rate output unit that compares an absolute difference between a predetermined reference value and the calculated flow rate and an absolute difference between the reference value and the delayed flow rate, and outputs the calculated flow rate or the delayed flow rate having a smaller absolute difference.

Classes IPC  ?

  • G05D 7/06 - Commande de débits caractérisée par l'utilisation de moyens électriques

56.

TCA

      
Numéro d'application 019054282
Statut Enregistrée
Date de dépôt 2024-07-15
Date d'enregistrement 2025-01-09
Propriétaire HORIBA, Ltd. (Japon)
Classes de Nice  ? 09 - Appareils et instruments scientifiques et électriques

Produits et services

Hydrogen gas analyzers, and parts and accessories thereof; hydrogen meters, and parts and accessories thereof; measuring apparatus for measuring the concentration of hydrogen, and parts and accessories thereof; apparatus for analyzing gases, and parts and accessories thereof; measuring or testing machines and instruments; laboratory apparatus and instruments; optical machines and apparatus; computer software for use with the aforesaid goods.

57.

TCA

      
Numéro de série 98648442
Statut En instance
Date de dépôt 2024-07-15
Propriétaire HORIBA, Ltd. (Japon)
Classes de Nice  ? 09 - Appareils et instruments scientifiques et électriques

Produits et services

Hydrogen gas analyzers, and parts and accessories thereof; hydrogen meters, and parts and accessories thereof; measuring apparatus for measuring the concentration of hydrogen, and parts and accessories thereof; apparatus for analyzing gases, and parts and accessories thereof; computer software for use with the aforesaid goods.

58.

WAFER TEMPERATURE CONTROL DEVICE, WAFER TEMPERATURE CONTROL METHOD, AND WAFER TEMPERATURE CONTROL PROGRAM

      
Numéro d'application 18484626
Statut En instance
Date de dépôt 2023-10-11
Date de la première publication 2024-07-11
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Hayashi, Daisuke
  • Takijiri, Kotaro

Abrégé

The present invention is a wafer temperature control device for controlling the temperature of a wafer by regulating the pressure of a heat transfer gas, the wafer temperature control device being capable of estimating the temperature of the wafer with sufficient accuracy and controlling the temperature of the wafer to a target temperature, and including: a pressure regulator configured to regulate the pressure of the heat transfer gas; a nearby temperature sensor configured to measure a nearby temperature of the wafer, a temperature estimation observer configured to estimate the temperature of the wafer based on the nearby temperature measured by the nearby temperature sensor and a manipulated pressure variable input to the pressure regulator or the pressure regulated by the pressure regulator, and a controller configured to control the manipulated pressure variable based on a temperature setting and an estimated wafer temperature estimated by the temperature estimation observer.

Classes IPC  ?

  • H01L 21/67 - Appareils spécialement adaptés pour la manipulation des dispositifs à semi-conducteurs ou des dispositifs électriques à l'état solide pendant leur fabrication ou leur traitementAppareils spécialement adaptés pour la manipulation des plaquettes pendant la fabrication ou le traitement des dispositifs à semi-conducteurs ou des dispositifs électriques à l'état solide ou de leurs composants
  • G05D 23/19 - Commande de la température caractérisée par l'utilisation de moyens électriques

59.

ANALYSIS DEVICE, ANALYSIS METHOD, AND OZONE DECOMPOSER

      
Numéro d'application JP2023041259
Numéro de publication 2024/142653
Statut Délivré - en vigueur
Date de dépôt 2023-11-16
Date de publication 2024-07-04
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Otsuka, Gaku
  • Yamada, Ryusuke
  • Mizumoto, Kazunori

Abrégé

The present invention addresses the problem of generating, from a sample gas, a suitable reference gas from which components other than ozone are not excessively removed. An analysis device (100) comprises: a measurement cell (1) into which a sample gas (Gs) and a reference gas (Gr) are alternately introduced; a light source (3) that outputs measurement light (L); a detection unit (5) that detects measurement light (L) which has passed through the measurement cell (1); a computation unit (91) that analyzes the ozone contained in the sample gas (Gs); and an ozone decomposer (71) that generates the reference gas (Gr) from the sample gas (Gs) by means of heating. The ozone decomposer (71) includes: an introduction tube (71a) for introducing the sample gas (Gs); a heating unit (71b) that heats the introduction tube (71a); and a porous first filling material (71c) that is filled into the heated portion of the introduction tube (71a) heated by the heating unit (71b), and that comprises a substance which is inert to sulfur dioxide.

Classes IPC  ?

  • G01N 21/33 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique en utilisant la lumière ultraviolette
  • G01N 21/61 - Analyseurs de gaz non dispersifs

60.

SPECTROSCOPIC ANALYSIS DEVICE AND SPECTROSCOPIC ANALYSIS METHOD

      
Numéro d'application JP2023045761
Numéro de publication 2024/143122
Statut Délivré - en vigueur
Date de dépôt 2023-12-20
Date de publication 2024-07-04
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Wakabayashi, Satoru
  • Uchigashima, Mikiko
  • Naka, Nobuyuki

Abrégé

Provided are a spectroscopic analysis device and a spectroscopic analysis method that can analyze components in a liquid sample over a wide concentration range. The spectroscopic analysis device comprises: a first analysis unit that performs fluorescence spectroscopic analysis and/or absorption spectroscopic analysis on a first component contained in a liquid sample by using secondary light generated from the liquid sample irradiated with primary light; a second analysis unit that performs Raman spectroscopic analysis on a second component contained in the liquid sample by using the secondary light generated from the liquid sample irradiated with primary light; a concentration measurement unit that measures the concentration of the first component and the second component contained in the liquid sample; and a control unit. The control unit causes the first analysis unit or the second analysis unit to perform analysis in accordance with the concentration measured by the concentration measurement unit.

Classes IPC  ?

  • G01N 21/65 - Diffusion de Raman
  • G01N 21/17 - Systèmes dans lesquels la lumière incidente est modifiée suivant les propriétés du matériau examiné
  • G01N 21/27 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en utilisant la détection photo-électrique
  • G01N 21/64 - FluorescencePhosphorescence

61.

VEHICLE DIAGNOSIS DEVICE, VEHICLE DIAGNOSIS METHOD, AND VEHICLE DIAGNOSIS PROGRAM

      
Numéro d'application JP2023037166
Numéro de publication 2024/142547
Statut Délivré - en vigueur
Date de dépôt 2023-10-13
Date de publication 2024-07-04
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Shiota Aoi
  • Kawazoe Hiroshi
  • Saito Takashi
  • Tanaka Sayaka
  • Nishikawa Masahiro

Abrégé

This vehicle diagnosis device comprises: a feature data acquisition unit for acquiring a plurality of items of feature data included in a prescribed output pattern of a vehicle; a real data acquisition unit for acquiring output data based on real travel by the vehicle in a prescribed period in the past, and real measured data indicating real measured quantities with regard to a parameter required for vehicle diagnosis during travel of the vehicle in the prescribed period; an equivalent pattern generation unit for generating an equivalent output pattern regarded as equivalent to the prescribed output pattern by splicing out, from the output data of the prescribed period, points or segments similar to the plurality of items of feature data; and a real measured quantity extraction unit for extracting the real measured quantities of each of the points or each of the segments included in the equivalent output pattern from the real measured data in the prescribed period.

Classes IPC  ?

  • G01R 31/392 - Détermination du vieillissement ou de la dégradation de la batterie, p. ex. état de santé
  • B60L 3/00 - Dispositifs électriques de sécurité sur véhicules propulsés électriquementContrôle des paramètres de fonctionnement, p. ex. de la vitesse, de la décélération ou de la consommation d’énergie
  • B60L 15/20 - Procédés, circuits ou dispositifs pour commander la propulsion des véhicules à traction électrique, p. ex. commande de la vitesse des moteurs de traction en vue de réaliser des performances désiréesAdaptation sur les véhicules à traction électrique de l'installation de commande à distance à partir d'un endroit fixe, de différents endroits du véhicule ou de différents véhicules d'un même train pour la commande du véhicule ou de son moteur en vue de réaliser des performances désirées, p. ex. vitesse, couple, variation programmée de la vitesse
  • B60L 50/60 - Propulsion électrique par source d'énergie intérieure au véhicule utilisant de la puissance de propulsion fournie par des batteries ou des piles à combustible utilisant de l'énergie fournie par des batteries
  • B60L 58/12 - Procédés ou agencements de circuits pour surveiller ou commander des batteries ou des piles à combustible, spécialement adaptés pour des véhicules électriques pour la surveillance et la commande des batteries en fonction de l'état de charge [SoC]
  • B60L 58/16 - Procédés ou agencements de circuits pour surveiller ou commander des batteries ou des piles à combustible, spécialement adaptés pour des véhicules électriques pour la surveillance et la commande des batteries en fonction du vieillissement de la batterie, p. ex. du nombre de cycles de charge ou de l'état de santé [SoH]
  • F02D 45/00 - Commande électrique non prévue dans les groupes
  • G01M 17/007 - Véhicules à roues ou à chenilles
  • G01R 31/367 - Logiciels à cet effet, p. ex. pour le test des batteries en utilisant une modélisation ou des tables de correspondance
  • G01R 31/382 - Dispositions pour la surveillance de variables des batteries ou des accumulateurs, p. ex. état de charge
  • G01R 31/385 - Dispositions pour mesurer des variables des batteries ou des accumulateurs
  • G01R 31/389 - Mesure de l’impédance interne, de la conductance interne ou des variables similaires
  • H01M 10/42 - Procédés ou dispositions pour assurer le fonctionnement ou l'entretien des éléments secondaires ou des demi-éléments secondaires
  • H01M 10/48 - Accumulateurs combinés à des dispositions pour mesurer, tester ou indiquer l'état des éléments, p. ex. le niveau ou la densité de l'électrolyte

62.

GAS MEASUREMENT SYSTEM AND GAS MEASUREMENT METHOD

      
Numéro d'application JP2023040601
Numéro de publication 2024/142622
Statut Délivré - en vigueur
Date de dépôt 2023-11-10
Date de publication 2024-07-04
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Oida Takuji
  • Ishida Kentaro
  • Yokota Yoshihiro
  • Fujiwara Masahiko

Abrégé

A gas measurement system comprising a first oxygen concentration sensor which measures, as a first oxygen concentration, the concentration of oxygen in an exhaust gas exhausted from a test specimen on the basis of a pressure difference between the oxygen in the exhaust gas and a first reference gas in which the concentration of oxygen is a first predetermined concentration, a first reference gas supply unit which supplies the first reference gas to the first oxygen concentration sensor, and a calculation unit which calculates an oxygen consumption amount of the test specimen on the basis of a flow amount of the exhaust gas and the first oxygen concentration. The first predetermined concentration of the first reference gas is set within a first predetermined range with respect to the first oxygen concentration.

Classes IPC  ?

  • B60L 58/30 - Procédés ou agencements de circuits pour surveiller ou commander des batteries ou des piles à combustible, spécialement adaptés pour des véhicules électriques pour la surveillance et la commande des piles à combustible
  • G01N 1/22 - Dispositifs pour prélever des échantillons à l'état gazeux
  • G01N 27/74 - Recherche ou analyse des matériaux par l'emploi de moyens électriques, électrochimiques ou magnétiques en recherchant des variables magnétiques des fluides

63.

ANALYSIS DEVICE, ANALYSIS METHOD, AND PROGRAM

      
Numéro d'application JP2023041258
Numéro de publication 2024/142652
Statut Délivré - en vigueur
Date de dépôt 2023-11-16
Date de publication 2024-07-04
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Okuda, Tatsuya
  • Otsuka, Gaku
  • Mizumoto, Kazunori
  • Nagasawa, Kenya

Abrégé

12111) is inputted, declines to or below a prescribed threshold (Th).

Classes IPC  ?

  • G01N 21/33 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique en utilisant la lumière ultraviolette
  • G01N 21/61 - Analyseurs de gaz non dispersifs

64.

SPECTROSCOPIC ANALYSIS DEVICE AND SPECTROSCOPIC ANALYSIS METHOD

      
Numéro d'application JP2023045769
Numéro de publication 2024/143124
Statut Délivré - en vigueur
Date de dépôt 2023-12-20
Date de publication 2024-07-04
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s) Wakabayashi, Satoru

Abrégé

Provided are a spectroscopic analysis device and a spectroscopic analysis method, whereby the precision of spectroscopic analysis can be enhanced by more accurately performing correction of detection results. The spectroscopic analysis device comprises: an imaging element that has a first region and a second region different from the first region, and detects light that is incident on the first region and the second region; a first optical system that radiates primary light to a sample and causes secondary light generated from the sample to be incident on the first region; a second optical system that causes reference light to be incident on the second region; and an analysis unit that corrects a result of detection of the secondary light incident on the first region, on the basis of a result of detection of the reference light incident on the second region.

Classes IPC  ?

65.

FLUID CONTROL DEVICE, FLUID CONTROL SYSTEM, STORAGE MEDIUM STORING A PROGRAM FOR FLUID CONTROL DEVICE, AND FLUID CONTROL METHOD

      
Numéro d'application 18596573
Statut En instance
Date de dépôt 2024-03-05
Date de la première publication 2024-06-27
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Matsumoto, Sota
  • Nagai, Kentaro
  • Hisamori, Yosuke
  • Matsuura, Kazuhiro

Abrégé

In order to prevent unnatural behavior of a calculated flow rate, provided is a fluid control device in which a fluid control valve and upstream and downstream pressure sensors are provided on a flow path. The device includes a calculation unit configured to calculate a flow rate based on measured pressures; and an output unit configured to output the calculated flow rate, and exhibit a zero output function of outputting a zero value regardless of the calculated flow rate when the valve is in a closed state. The device is further configured to switch between execution and stop of the zero output function, and when the valve is in an open state and a difference between the measured pressures of the pressure sensors is larger than a threshold, stop the zero output function and cause the flow rate output unit to output the calculated flow rate.

Classes IPC  ?

  • G05D 7/06 - Commande de débits caractérisée par l'utilisation de moyens électriques
  • F17D 3/01 - Dispositions pour la surveillance ou la commande des opérations de fonctionnement pour commander, signaler ou surveiller le transfert d'un produit
  • G01F 1/36 - Mesure du débit volumétrique ou du débit massique d'un fluide ou d'un matériau solide fluent, dans laquelle le fluide passe à travers un compteur par un écoulement continu en utilisant des effets mécaniques en mesurant la pression ou la différence de pression la pression ou la différence de pression étant produite par une contraction de la veine fluide
  • G01F 15/00 - Détails des appareils des groupes ou accessoires pour ces derniers, dans la mesure où de tels accessoires ou détails ne sont pas adaptés à ces types particuliers d'appareils, p. ex. pour l'indication à distance

66.

OPTICAL ANALYSIS DEVICE, OPTICAL ANALYSIS METHOD, AND PROGRAM FOR OPTICAL ANALYSIS DEVICE

      
Numéro d'application JP2023026667
Numéro de publication 2024/134949
Statut Délivré - en vigueur
Date de dépôt 2023-07-20
Date de publication 2024-06-27
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s) Saito, Takashi

Abrégé

Provided is an optical analysis device 1 that analyses a component of interest by leading, to a measuring cell 4, light which has been emitted from a light source 2 and detecting, with a detector, light which has passed through the measuring cell 4, said optical analysis device 1 comprising: a moving mirror 8 that reflects the light emitted from the light source 2 while reciprocating; a moving mechanism 9 that reciprocates the moving mirror 8; a movement control unit 11a that controls the application voltage or application current to the moving mechanism 9; and a cause inference unit 11f that uses actual waveform data, which indicates the application voltage or application current to the moving mechanism 9 at each time, and reference waveform data, which indicates the application voltage or application current to the moving mechanism 9 at each time and which has been obtained in advance, to infer a cause of an anomaly which affects the moving mirror.

Classes IPC  ?

  • G01N 21/35 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique en utilisant la lumière infrarouge
  • G01J 3/02 - SpectrométrieSpectrophotométrieMonochromateursMesure de la couleur Parties constitutives
  • G01J 3/45 - Spectrométrie par interférence
  • G01N 21/45 - RéfringencePropriétés liées à la phase, p. ex. longueur du chemin optique en utilisant des méthodes interférométriquesRéfringencePropriétés liées à la phase, p. ex. longueur du chemin optique en utilisant les méthodes de Schlieren
  • G02B 26/06 - Dispositifs ou dispositions optiques pour la commande de la lumière utilisant des éléments optiques mobiles ou déformables pour commander la phase de la lumière

67.

TEST-SUBJECT-TESTING SYSTEM, TEST-SUBJECT-TESTING METHOD, AND TEST-SUBJECT-TESTING PROGRAM

      
Numéro d'application JP2023037562
Numéro de publication 2024/135072
Statut Délivré - en vigueur
Date de dépôt 2023-10-17
Date de publication 2024-06-27
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s) Kawazoe, Hiroshi

Abrégé

The present invention is a test-subject-testing system that tests a test subject while spraying water droplets in accordance with the velocity of the test subject and recreating rainfall or snowfall, the test-subject-testing system testing a test subject that is a vehicle or a part thereof, the test-subject-testing system comprising: a test device on which the test subject is placed or to which the test subject is connected; a spray unit for spraying water droplets towards the test subject from the surroundings of the test subject; and a changing unit for changing the spray speed, the position, or the angle of the spray unit according to the velocity of the test subject.

Classes IPC  ?

68.

GAS MEASURING SYSTEM, GAS MEASURING METHOD, AND GAS MEASURING PROGRAM

      
Numéro d'application JP2023040600
Numéro de publication 2024/135153
Statut Délivré - en vigueur
Date de dépôt 2023-11-10
Date de publication 2024-06-27
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Oida Takuji
  • Nakatani Shigeru
  • Ishida Kentaro

Abrégé

This gas measuring system comprises: a flowmeter for measuring a flow rate of a gas flowing through a pipe, to acquire flow rate information comprising time-series data; a first gas sensor for measuring a concentration of a prescribed gas component contained in the gas, to acquire first concentration information comprising time-series data; a second gas sensor for measuring the concentration of the prescribed gas component contained in the gas, to acquire second concentration information comprising time-series data; and a computing unit for calculating a time difference between measuring times of the concentrations of the prescribed gas component contained in the gas, on the basis of the first concentration information and the second concentration information, and correcting a time deviation in the first concentration information or the second concentration information with respect to the flow rate information on the basis of the calculated time difference.

Classes IPC  ?

  • G01N 27/26 - Recherche ou analyse des matériaux par l'emploi de moyens électriques, électrochimiques ou magnétiques en recherchant des variables électrochimiquesRecherche ou analyse des matériaux par l'emploi de moyens électriques, électrochimiques ou magnétiques en utilisant l'électrolyse ou l'électrophorèse

69.

TEST SPECIMEN TESTING SYSTEM AND TEST SPECIMEN TESTING METHOD

      
Numéro d'application JP2023041298
Numéro de publication 2024/135178
Statut Délivré - en vigueur
Date de dépôt 2023-11-16
Date de publication 2024-06-27
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s) Kawazoe, Hiroshi

Abrégé

The present invention provides a test specimen testing system 100 for testing a test specimen while reproducing splashing generated from a vehicle traveling at the periphery thereof, the test specimen testing system being used to test a test specimen W, which is a vehicle or part thereof, and comprising: a testing device 2 having the test specimen W installed therein or connected thereto; and a splash simulating device 3 for simulating splashing from another vehicle.

Classes IPC  ?

70.

SPECTROSCOPIC ANALYSIS DEVICE, SPECTROSCOPIC ANALYSIS METHOD, SPECTROSCOPIC ANALYSIS PROGRAM, LEARNING DEVICE, LEARNING METHOD, AND LEARNING PROGRAM

      
Numéro d'application JP2023043717
Numéro de publication 2024/135369
Statut Délivré - en vigueur
Date de dépôt 2023-12-06
Date de publication 2024-06-27
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Saito, Takashi
  • Gyoten, Yuji
  • Nishimura, Katsumi

Abrégé

The present invention provides a spectroscopic analysis device with which a concentration of a measurement target component is measured accurately from a measured spectrum without obtaining a calibration curve for each spectroscopic analysis device, the spectroscopic analysis device comprising: a spectrum generating unit 51 for generating a spectrum of light that has been transmitted through a sample; a storage unit 52 for storing a standard calibration curve created by a standard device 200 and a standard spectrum generated by the standard device 200, the standard spectrum serving as a standard for the spectroscopic analysis device; a correcting unit 53 for correcting either a measured spectrum, which is the spectrum of the sample generated by the spectrum generating unit 51, or the standard calibration curve, on the basis of a comparison result between a reference spectrum, which is a spectrum of a standard gas, generated by the spectrum generating unit 51, and the standard spectrum; and a concentration calculating unit 54 for calculating the concentration of the measurement target component on the basis of either the standard calibration curve and the corrected measured spectrum, or the corrected standard calibration curve and the measured spectrum.

Classes IPC  ?

  • G01N 21/27 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en utilisant la détection photo-électrique

71.

EQUIPMENT FOR CALIBRATING PARTICLE COUNT MEASUREMENT DEVICE, CALIBRATION PROGRAM, METHOD FOR DETERMINING PARTICLE SIZE FOR CALIBRATION, AND METHOD FOR CALIBRATING PARTICLE COUNT MEASUREMENT DEVICE

      
Numéro d'application JP2023044809
Numéro de publication 2024/135520
Statut Délivré - en vigueur
Date de dépôt 2023-12-14
Date de publication 2024-06-27
Propriétaire
  • NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY (Japon)
  • HORIBA, LTD. (Japon)
Inventeur(s)
  • Kojima Kentarou
  • Murashima Yoshiko
  • Sakurai Hiromu

Abrégé

Provided are equipment for calibrating a particle count measurement device, a calibration program, a method for determining particle size for calibration, and a method for calibrating a particle count measurement device with which it is possible to reduce the effect of a post-classification particle size change and perform a more accurate calibration. The calibration equipment 1 is provided with: a particle generation unit 10; an input unit 51; a particle classification unit 20; a particle-sensing unit 30; a computation unit 52 that obtains, on the basis of the particle size distribution of the particles at the particle-sensing unit 30a or a physical quantity factor that causes a change in the particle size at the particle-sensing unit 30, a degree of change by which the particle size of particles arriving at the particle-sensing unit 30 has changed from a target particle size, and calculates, on the basis of the degree of change, a corrective amount for the particle size extracted by the particle classification unit 20 such that the particle size arriving at the particle-sensing unit 30 matches the target particle size; and a correction command unit 53 for issuing, on the basis of the corrective amount calculated by the computation unit 52, a command to the particle classification unit 20 so as to change the particle size of the particles extracted by the particle classification unit 20 to a particle size for calibration.

Classes IPC  ?

  • G01N 15/02 - Recherche de la dimension ou de la distribution des dimensions des particules

72.

MEASUREMENT DEVICE MANAGEMENT APPARATUS, MANAGEMENT METHOD, MANAGEMENT PROGRAM, AND MANAGEMENT SYSTEM

      
Numéro d'application JP2023044863
Numéro de publication 2024/135532
Statut Délivré - en vigueur
Date de dépôt 2023-12-14
Date de publication 2024-06-27
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Nakane Ikuya
  • Sakuta Hiromichi
  • Nishimori Masashi
  • Nakajima Kyosuke

Abrégé

This measurement device management apparatus comprises a data reception unit that accepts, from a measurement device, data concerning recording of at least one of a first action after input of power to the measurement device and a second action prior to shut-down of operation of the measurement device, and a report creation unit that creates a report including a predetermined period of the data accepted by the data reception unit.

Classes IPC  ?

  • G16H 40/40 - TIC spécialement adaptées à la gestion ou à l’administration de ressources ou d’établissements de santéTIC spécialement adaptées à la gestion ou au fonctionnement d’équipement ou de dispositifs médicaux pour la gestion d’équipement ou de dispositifs médicaux, p. ex. pour planifier la maintenance ou les mises à jour
  • G01N 35/00 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes Manipulation de matériaux à cet effet
  • G06Q 10/20 - Administration de la réparation ou de la maintenance des produits

73.

VEHICLE TEST SYSTEM, VEHICLE TEST SYSTEM CABLE, AND VEHICLE TEST METHOD

      
Numéro d'application JP2023043705
Numéro de publication 2024/128100
Statut Délivré - en vigueur
Date de dépôt 2023-12-06
Date de publication 2024-06-20
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s) Togawa, Susumu

Abrégé

A vehicle test system 100 for testing a product X under test, which is a vehicle or part thereof, the vehicle test system including a test unit 10 that is provided in one of the inside or outside of the product X under test, a control unit 20 that is provided in the other of the inside or outside of the product X under test and controls the test unit 10, a cable 30 that connects the test unit 10 and control unit 20 and has a shielding layer 43 for noise shielding, and a leakage detection circuit 50 connected to the shielding layer 43.

Classes IPC  ?

  • G01R 31/58 - Test de lignes, de câbles ou de conducteurs
  • G01R 31/52 - Test pour déceler la présence de courts-circuits, de fuites de courant ou de défauts à la terre

74.

BATTERY EVALUATION DEVICE, MACHINE LEARNING DEVICE, BATTERY EVALUATION PROGRAM, BATTERY EVALUATION METHOD, MACHINE LEARNING PROGRAM, AND MACHINE LEARNING METHOD

      
Numéro d'application JP2023044163
Numéro de publication 2024/128174
Statut Délivré - en vigueur
Date de dépôt 2023-12-11
Date de publication 2024-06-20
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Ding, Li
  • Saito, Takashi
  • Yabushita, Hirotaka
  • Hirose, Jun

Abrégé

The present invention makes it possible to accurately calculate the degradation state of a battery from EIS data of the battery, and comprises: a correlation data storage unit that stores correlation data indicating the correlation between DRT data related to relaxation time distribution obtained from EIS data of batteries and degradation states of the batteries; a DRT data acquisition unit that acquires DRT data of an EUT battery being evaluated; and a degradation state calculation unit that calculates the degradation state of the EUT battery on the basis of the DRT data acquired by the DRT data acquisition unit and the correlation data.

Classes IPC  ?

  • G01R 31/392 - Détermination du vieillissement ou de la dégradation de la batterie, p. ex. état de santé
  • G01R 31/367 - Logiciels à cet effet, p. ex. pour le test des batteries en utilisant une modélisation ou des tables de correspondance
  • G01R 31/389 - Mesure de l’impédance interne, de la conductance interne ou des variables similaires
  • H01M 10/42 - Procédés ou dispositions pour assurer le fonctionnement ou l'entretien des éléments secondaires ou des demi-éléments secondaires
  • H01M 10/48 - Accumulateurs combinés à des dispositions pour mesurer, tester ou indiquer l'état des éléments, p. ex. le niveau ou la densité de l'électrolyte
  • H02J 7/00 - Circuits pour la charge ou la dépolarisation des batteries ou pour alimenter des charges par des batteries

75.

EVALUATION DEVICE, EVALUATION METHOD, AND PROGRAM FOR EVALUATION DEVICE

      
Numéro d'application 18286606
Statut En instance
Date de dépôt 2022-04-11
Date de la première publication 2024-06-20
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s) Itaya, Takahiro

Abrégé

Provided is an evaluation device that evaluates performance of a predetermined object to be evaluated by varying a temperature condition. The evaluation device comprises a heating furnace having a furnace inner space that houses the object to be evaluated, a temperature adjusting mechanism that adjusts a temperature of the object to be evaluated or its surroundings by heating or cooling, a temperature acquisition unit that acquires the temperatures of a plurality of locations of the object to be evaluated or its surroundings, and a temperature adjusting mechanism control unit that controls the temperature adjusting mechanism to keep an absolute value of a temperature difference between the temperatures of a plurality of the locations acquired by the temperature acquisition unit lower than or equal to a predetermined value.

Classes IPC  ?

76.

VAPORIZER AND LIQUID MATERIAL VAPORIZING DEVICE

      
Numéro d'application 18545984
Statut En instance
Date de dépôt 2023-12-19
Date de la première publication 2024-06-20
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s) Nishiwaki, Keisuke

Abrégé

A vaporizer includes a vaporization chamber in which a liquid material is heated and vaporized and a heat exchange element arranged in the vaporization chamber. The vaporization chamber has a groove in its inner surface. This helps improve vaporization performance of the liquid material and the vaporization of the liquid material at a high flow rate.

Classes IPC  ?

  • B01B 1/00 - ÉbullitionAppareils à ébullition en vue d'applications physiques ou chimiques
  • B01F 23/232 - Mélange de gaz avec des liquides en introduisant des gaz dans des milieux liquides, p. ex. pour produire des liquides aérés en utilisant des moyens de mélange à écoulement pour introduire les gaz, p. ex. des chicanes
  • B01F 25/4314 - Tubes de mélange droits avec des chicanes ou des obstructions qui ne provoquent pas de chute de pression importanteChicanes à cet effet avec des chicanes hélicoïdales
  • B01F 35/92 - Systèmes de chauffage ou de refroidissement pour chauffer l'extérieur du récipient, p. ex. vestes chauffantes ou brûleurs

77.

GAS ANALYSIS DEVICE AND LASER LIGHT TRANSMISSION MECHANISM

      
Numéro d'application 18287544
Statut En instance
Date de dépôt 2022-03-16
Date de la première publication 2024-06-20
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Takahashi, Motonobu
  • Akamatsu, Takeshi
  • Nakane, Masahiro
  • Hara, Kenji
  • Shibuya, Kyoji

Abrégé

In order to provide a more practical gas analysis device than that having conventionally been, while keeping the laser source and the photodetector separated from the gas cell, thereby preventing exposure to a high temperature, the gas analysis device includes: a gas cell; a laser source or a photodetector separated from the gas cell; and a laser light transmission mechanism provided between the gas cell and the laser source or the photodetector. The laser light transmission mechanism includes one or a plurality of tubular members, and an inner space of the one or the plurality of tubular members provides a light path for the laser light.

Classes IPC  ?

  • G01N 21/3504 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique en utilisant la lumière infrarouge pour l'analyse des gaz, p. ex. analyse de mélanges de gaz

78.

GAS ANALYSIS DEVICE, FLUID CONTROL SYSTEM, PROGRAM FOR GAS ANALYSIS, AND GAS ANALYSIS METHOD

      
Numéro d'application 18288097
Statut En instance
Date de dépôt 2022-02-14
Date de la première publication 2024-06-20
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s) Takahashi, Motonobu

Abrégé

A gas analysis device for analyzing a compound gas and H2O gas produced in a main reaction in which an aqueous solution including a compound and water is vaporized, includes a first concentration calculating unit that calculates a concentration of the compound gas, a second concentration calculating unit that calculates a concentration of the H2O gas, an analysis unit that compares a first actual concentration which is the concentration of the compound gas calculated by the first concentration calculating unit with a first ideal concentration which is the concentration of the compound gas in case that the main reaction proceeds ideally, and that compares a second actual concentration which is the concentration of the H2O gas calculated by the second concentration calculating unit with a second ideal concentration which is the concentration of the H2O gas in case that the main reaction proceeds ideally and an output unit.

Classes IPC  ?

  • G01N 33/00 - Recherche ou analyse des matériaux par des méthodes spécifiques non couvertes par les groupes
  • G01N 1/02 - Dispositifs pour prélever des échantillons
  • G01N 33/18 - Eau

79.

ANALYSIS DEVICE, MACHINE LEARNING DEVICE, CALCULATION DEVICE, ANALYSIS METHOD, AND ANALYSIS PROGRAM

      
Numéro d'application JP2023042471
Numéro de publication 2024/127968
Statut Délivré - en vigueur
Date de dépôt 2023-11-28
Date de publication 2024-06-20
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Gyoten, Yuji
  • Saito, Takashi

Abrégé

The present invention highly accurately estimates the concentration of a measurement target component included in a measurement sample. The present invention comprises: a measurement sensor that measures a measurement sample and outputs a sensor signal; a correlation data storage unit that stores first correlation data and second correlation data which indicate a correlation between the concentration of the measurement target component included in the measurement sample and the sensor signal or a feature amount determined by the sensor signal and which differ from each other; a first concentration calculation unit that calculates a first concentration of the measurement target component on the basis of the first correlation data and of the sensor signal or the feature amount; a second concentration calculation unit that calculates a second concentration of the measurement target component on the basis of the second correlation data and of the sensor signal or the feature amount; and a third concentration calculation unit that synthesizes a prescribed frequency component of the first concentration and a prescribed frequency component of the second concentration and calculates a third concentration of the measurement target component.

Classes IPC  ?

  • G01N 21/3504 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique en utilisant la lumière infrarouge pour l'analyse des gaz, p. ex. analyse de mélanges de gaz

80.

SIGNAL PROCESSING METHOD, SIGNAL PROCESSING DEVICE, RADIATION DETECTING DEVICE, AND COMPUTER PROGRAM

      
Numéro d'application JP2023044958
Numéro de publication 2024/128301
Statut Délivré - en vigueur
Date de dépôt 2023-12-15
Date de publication 2024-06-20
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Murata, Shunsuke
  • Valiev, Ildar

Abrégé

Provided are a signal processing method, a signal processing device, a radiation detecting device, and a computer program for obtaining an accurate radiation spectrum in a stable manner. The signal processing method involves: measuring a slope of a non-response line, which is a part, other than a staircase wave generated in response to radiation detection, included in a signal that includes the staircase wave; measuring a wave height of the staircase wave; and correcting the wave height in accordance with the slope.

Classes IPC  ?

  • G01T 1/17 - Dispositions de circuits non adaptés à un type particulier de détecteur
  • G01T 1/36 - Mesure de la distribution spectrale des rayons X ou d'une radiation nucléaire

81.

SYSTEM FOR MEASURING AMOUNT OF CONSUMED HYDROGEN

      
Numéro d'application 18285254
Statut En instance
Date de dépôt 2022-03-31
Date de la première publication 2024-06-13
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Oida, Takuji
  • Nakatani, Shigeru
  • Aoyama, Junichi
  • Yokota, Yoshihiro

Abrégé

There is provided a hydrogen consumption quantity measurement system that, even in a case in which there is a possibility that leakage hydrogen is contained in exhaust gas from a fuel cell or a hydrogen engine, makes it possible to accurately determine a total quantity of hydrogen consumption of the fuel cell without having to modify a vehicle or the like. This hydrogen consumption quantity measurement system measures a hydrogen consumption quantity in a test body, which is formed by a moving body or portion thereof that includes a hydrogen reactor that causes hydrogen to undergo a chemical reaction, and that utilizes energy obtained from this chemical reaction, and includes an oxygen concentration sensor that measures a concentration of oxygen contained in exhaust gas from the test body.

Classes IPC  ?

  • H01M 8/0444 - ConcentrationDensité
  • G01N 33/00 - Recherche ou analyse des matériaux par des méthodes spécifiques non couvertes par les groupes
  • H01M 8/04119 - Dispositions pour la commande des paramètres des réactifs, p. ex. de la pression ou de la concentration des réactifs gazeux avec apport simultané ou évacuation simultanée d’électrolyteHumidification ou déshumidification
  • H01M 8/0438 - PressionPression ambianteDébit
  • H01M 8/04492 - HumiditéHumidité ambianteTeneur en eau

82.

DRIVE AND LOAD SYSTEM FOR A ROTATING ELECTRIC MACHINE, TEST STAND, AND ELECTRIC LOAD AND DRIVE TRAIN

      
Numéro d'application EP2023083517
Numéro de publication 2024/120925
Statut Délivré - en vigueur
Date de dépôt 2023-11-29
Date de publication 2024-06-13
Propriétaire HORIBA EUROPE GMBH (Allemagne)
Inventeur(s) Sennhenn, Herbert

Abrégé

SetSetSetSetSet [n(t)] depending on the speed n(t) of the electric machine.

Classes IPC  ?

  • H02P 27/08 - Dispositions ou procédés pour la commande de moteurs à courant alternatif caractérisés par le type de tension d'alimentation utilisant une tension d’alimentation à fréquence variable, p. ex. tension d’alimentation d’onduleurs ou de convertisseurs utilisant des convertisseurs de courant continu en courant alternatif ou des onduleurs avec modulation de largeur d'impulsions
  • G01M 17/00 - Test des véhicules

83.

DETECTION OF INFECTIOUS AGENT BASED ON RECOMBINASE POLYMERASE AMPLIFICATION COMBINED WITH A MAGNETIC FIELD-ENHANCED AGGLUTINATION

      
Numéro d'application 18549058
Statut En instance
Date de dépôt 2021-03-09
Date de la première publication 2024-06-06
Propriétaire
  • Etablissement Français du Sang (France)
  • Université de Montpellier (France)
  • INSTITUT NATIONAL DE LA SANTE ET DE LA RECHERCHE MEDICALE (INSERM) (France)
  • HORIBA ABX SAS (France)
Inventeur(s)
  • Fournier-Wirth, Chantal
  • Leon, Fanny
  • Cantaloube, Jean-François
  • Molès, Jean-Pierre
  • Pinchon, Elena
  • Daynès, Aurélien
  • Mayran, Charly

Abrégé

The present invention concerns a method for the molecular detection of an infectious agent based on isothermal amplification by recombinase polymerase amplification (RPA) combined with a Magnetic Field-Enhanced Agglutination (MFEA) readout.

Classes IPC  ?

  • C12Q 1/70 - Procédés de mesure ou de test faisant intervenir des enzymes, des acides nucléiques ou des micro-organismesCompositions à cet effetProcédés pour préparer ces compositions faisant intervenir des virus ou des bactériophages
  • C12Q 1/6804 - Analyse d’acides nucléiques utilisant des immunogènes
  • C12Q 1/6844 - Réactions d’amplification d’acides nucléiques
  • C12Q 1/689 - Produits d’acides nucléiques utilisés dans l’analyse d’acides nucléiques, p. ex. amorces ou sondes pour la détection ou l’identification d’organismes pour les bactéries

84.

PARTICLE INSPECTION DEVICE AND PARTICLE INSPECTION METHOD

      
Numéro d'application 18282621
Statut En instance
Date de dépôt 2022-02-07
Date de la première publication 2024-05-16
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Someya, Shota
  • Kanzaki, Toyoki

Abrégé

The present invention reduces erroneous detection due to diffracted light from a pattern, and provides a particle inspection device that inspects a particle adhering to a substrate on which a pattern is formed, including: a light irradiation unit that linearly scans and irradiate the substrate with a laser beam; a first light detection unit and a second light detection unit that detect light reflected by the substrate; and a particle detection unit that detects the particle based on output signals of the first light detection unit and the second light detection unit, in which the first light detection unit and the second light detection unit are arranged such that a light reception elevation angle α with respect to a surface of the substrate and a light reception horizontal angle β with respect to a scanning direction of the laser beam are different from each other.

Classes IPC  ?

  • G01N 21/94 - Recherche de souillures, p. ex. de poussières
  • G01N 21/88 - Recherche de la présence de criques, de défauts ou de souillures
  • G01N 21/956 - Inspection de motifs sur la surface d'objets

85.

FLUID CONTROL VALVE AND FLUID CONTROL DEVICE

      
Numéro d'application JP2023040288
Numéro de publication 2024/101403
Statut Délivré - en vigueur
Date de dépôt 2023-11-08
Date de publication 2024-05-16
Propriétaire HORIBA STEC, CO., LTD. (Japon)
Inventeur(s)
  • Hayashi, Shigeyuki
  • Shakudo, Kazuya

Abrégé

The present invention can be used in a semiconductor manufacturing process and makes it possible to reduce dead volume while keeping a valve structure simple. The present invention comprises a flow path block 2 in which an internal flow path 2R is formed, a valve seat member 5 having a valve seat surface 5a, a valve body 6 that is provided with a permanent magnet 60 and has a seating surface 6a seated on the valve seat surface 5a, and an actuator part 7 that drives the valve body 6 by using the permanent magnet 60, the permanent magnet 60 being sealed by a corrosion-resistant alloy.

Classes IPC  ?

  • F16K 31/06 - Moyens de fonctionnementDispositifs de retour à la position de repos électriquesMoyens de fonctionnementDispositifs de retour à la position de repos magnétiques utilisant un aimant

86.

MEASUREMENT METHOD, MEASUREMENT SYSTEM AND TEST REAGENT KIT

      
Numéro d'application JP2023035443
Numéro de publication 2024/095648
Statut Délivré - en vigueur
Date de dépôt 2023-09-28
Date de publication 2024-05-10
Propriétaire
  • HORIBA, LTD. (Japon)
  • HORIBA ABX SAS (France)
Inventeur(s)
  • Manio Mark Christian Carizon
  • Nishimura Tanikawa Jun Ivan
  • Igushi Tatsuo
  • Donnarumma Dario

Abrégé

A measurement method for determining the concentration of reticulocytes or nucleated red blood cells contained in a blood specimen, the measurement method including a staining step, a removal step and a measurement step. In the staining step, reticulocytes or nucleated red blood cells, among red blood cells contained in the blood specimen, are stained. In the removal step, a surfactant is added to the blood specimen to take out hemoglobin from the red blood cells. In the measurement step, the concentration of the reticulocytes or nucleated red blood cells contained in the blood specimen is determined using the blood specimen after the staining and removal steps.

Classes IPC  ?

  • G01N 33/49 - Analyse physique de matériau biologique de matériau biologique liquide de sang

87.

SEC

      
Numéro d'application 1788051
Statut Enregistrée
Date de dépôt 2023-11-14
Date d'enregistrement 2023-11-14
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Classes de Nice  ?
  • 07 - Machines et machines-outils
  • 09 - Appareils et instruments scientifiques et électriques

Produits et services

Machines for manufacturing semiconductor, solar cell, light emitting diode, display, liquid crystal and organic electroluminescence, and parts therefor; fluid controllers for use with machines for manufacturing semiconductor, solar cell, light emitting diode, display, liquid crystal and organic electroluminescence; flow controllers for use with machines for manufacturing semiconductor, solar cell, light emitting diode, display, liquid crystal and organic electroluminescence; pressure controllers for manufacturing semiconductor, solar cell, light emitting diode, display, liquid crystal and organic electroluminescence. Fluid measurement apparatus for manufacturing semiconductor, solar cell, light emitting diode, display, liquid crystal and organic electroluminescence; fluid flow meters for manufacturing semiconductor, solar cell, light emitting diode, display, liquid crystal and organic electroluminescence; fluid flow sensors for manufacturing semiconductor, solar cell, light emitting diode, display, liquid crystal and organic electroluminescence; pressure gauges for manufacturing semiconductor, solar cell, light emitting diode, display, liquid crystal and organic electroluminescence; pressure sensors for manufacturing semiconductor, solar cell, light emitting diode, display, liquid crystal and organic electroluminescence.

88.

SEMICONDUCTOR LASER DEVICE

      
Numéro d'application 18280195
Statut En instance
Date de dépôt 2022-02-21
Date de la première publication 2024-05-02
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Awane, Yusuke
  • Matsuhama, Makoto
  • Tsukatani, Kosuke
  • Niina, Kodai
  • Ido, Takuya

Abrégé

To suppress individual differences in intensity of output laser light for each semiconductor laser device as much as possible while suppressing generation of stray light in a package of the semiconductor laser device, provided is a semiconductor laser device used for optical analysis, including: a package that accommodates a semiconductor laser element therein; and a light reflection reducing member that is provided inside the package and suppresses reflection of light emitted from the semiconductor laser element, in which the light reflection reducing member is bonded to an inner surface of the package.

Classes IPC  ?

  • H01S 5/028 - Revêtements
  • G01N 21/31 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique
  • G01N 33/00 - Recherche ou analyse des matériaux par des méthodes spécifiques non couvertes par les groupes
  • H01S 5/022 - SupportsBoîtiers

89.

ANALYSIS DEVICE, METHOD FOR DRIVING LASER ELEMENT, AND ANALYSIS METHOD

      
Numéro d'application JP2023032392
Numéro de publication 2024/090042
Statut Délivré - en vigueur
Date de dépôt 2023-09-05
Date de publication 2024-05-02
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Terakado, Tomoji
  • Adachi, Masayuki
  • Nakatani, Shigeru

Abrégé

The present invention provides a high performance analysis device while utilizing a laser element that oscillates in a plurality of longitudinal modes. This analysis device comprises a laser element 31 that irradiates a sample with laser light L1, a drive unit 4 that drives the laser element 31, and a photodetector 5 that detects the laser light L1 that has passed through the sample. The laser element 31 oscillates in a plurality of longitudinal modes to emit the laser light L1 having a plurality of oscillation wavelengths. The drive unit 4 pulses the laser element 31 and causes the laser element 31 to sweep through the plurality of oscillation wavelengths for each pulse.

Classes IPC  ?

  • G01N 21/39 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique en utilisant des lasers à longueur d'onde réglable

90.

INSPECTION DEVICE, INSPECTION METHOD, AND INSPECTION PROGRAM

      
Numéro d'application JP2023035235
Numéro de publication 2024/090109
Statut Délivré - en vigueur
Date de dépôt 2023-09-27
Date de publication 2024-05-02
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Someya, Shota
  • Iida, Hiroshi
  • Kanzaki, Toyoki
  • Nakagawa, Kazuya

Abrégé

The present invention comprises: a light irradiation unit 2 that irradiates a light-transmissive and film-like test object W with inspection light L1; a scattered light detection unit 3 for detecting scattered light L2 which is produced from the test object W; a diffracted light detection section 4 for detecting diffracted light L3 which is produced from the test object W; and a signal processing unit 5 that determines, on the basis of a scattered light intensity signal from the scattered light detection unit 3 and a diffracted light intensity signal from the diffracted light detection unit 4, the presence or absence of foreign matter S which has adhered to the test object W and the presence or absence of a pinhole P which has been formed in the test object W.

Classes IPC  ?

  • G03F 1/62 - Pellicules, p. ex. assemblage de pellicules ayant une membrane sur un cadre de supportLeur préparation
  • G01N 21/894 - Trous d'épingle

91.

FUEL CELL EVALUATION SYSTEM AND FUEL CELL EVALUATION METHOD

      
Numéro d'application 18282504
Statut En instance
Date de dépôt 2022-03-14
Date de la première publication 2024-05-02
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Okada, Yoichi
  • Tanaka, Yoshinori
  • Sasai, Kohei
  • Watanabe, Shunta

Abrégé

The present invention is a fuel cell evaluation system that obtains an actual gas consumption amount in a fuel cell in real time with accuracy and calculates a consumption amount of a fuel gas in the fuel cell, the fuel cell evaluation system including: a fuel gas supply path that supplies a fuel gas of a first flow rate to the fuel cell; a fuel gas discharge path that discharges the fuel gas from the fuel cell; an inert gas introduction path that introduces an inert gas of a second flow rate into the fuel gas discharge path or the fuel gas supply path; a first fuel gas concentration meter that measures a fuel gas concentration in a mixed gas of the fuel gas and the inert gas flowing through the fuel gas discharge path; and a fuel gas consumption amount calculation unit that calculates the consumption amount of the fuel gas in the fuel cell based on the first flow rate, the second flow rate, and the fuel gas concentration measured by the first fuel gas concentration meter.

Classes IPC  ?

  • H01M 8/0444 - ConcentrationDensité
  • H01M 8/04089 - Dispositions pour la commande des paramètres des réactifs, p. ex. de la pression ou de la concentration des réactifs gazeux
  • H01M 8/0438 - PressionPression ambianteDébit

92.

BATTERY PERFORMANCE ESTIMATION METHOD, BATTERY PERFORMANCE ESTIMATION DEVICE, AND BATTERY PERFORMANCE ESTIMATION PROGRAM

      
Numéro d'application JP2023035784
Numéro de publication 2024/080171
Statut Délivré - en vigueur
Date de dépôt 2023-09-29
Date de publication 2024-04-18
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s) Yoshida, Kotaro

Abrégé

According to the present invention, the performance of a battery manufactured using carbon as a negative electrode active material is estimated with high accuracy from the physical properties of the carbon. A method for estimating the performance of a battery manufactured using carbon as a negative electrode active material from the physical properties of the carbon is characterized in that the performance of the battery is estimated using a machine learning model obtained on the basis of training data including the following physical properties (a) and (b) of carbon, and values related to the battery performance measured for the battery manufactured using the carbon as the negative electrode active material. (a) The ratio (ID/IG) of the peak top intensity (ID) of the D band calculated from the Raman spectrum to the peak top intensity (IG) of the G band or a value relating to the ratio (b) The width of the G band calculated from the Raman spectrum or a value relating to the width

Classes IPC  ?

  • H01M 10/48 - Accumulateurs combinés à des dispositions pour mesurer, tester ou indiquer l'état des éléments, p. ex. le niveau ou la densité de l'électrolyte
  • G01R 31/367 - Logiciels à cet effet, p. ex. pour le test des batteries en utilisant une modélisation ou des tables de correspondance
  • G01R 31/382 - Dispositions pour la surveillance de variables des batteries ou des accumulateurs, p. ex. état de charge
  • G01R 31/385 - Dispositions pour mesurer des variables des batteries ou des accumulateurs
  • G01R 31/387 - Détermination de la capacité ampère-heure ou de l’état de charge
  • H02J 7/00 - Circuits pour la charge ou la dépolarisation des batteries ou pour alimenter des charges par des batteries

93.

FLUID SUPPLY MECHANISM AND FLUID SUPPLY METHOD

      
Numéro d'application JP2023031488
Numéro de publication 2024/080020
Statut Délivré - en vigueur
Date de dépôt 2023-08-30
Date de publication 2024-04-18
Propriétaire HORIBA STEC, CO., LTD. (Japon)
Inventeur(s)
  • Yada, Hidetaka
  • Nishiwaki, Keisuke

Abrégé

Provided is a fluid supply mechanism 100 that repeatedly supplies and stops supply of a fluid to a chamber CH, the fluid supply mechanism 100 comprising: a fluid supply path L1 that communicates with the chamber 100; a tank T provided to the fluid supply path L1, the fluid being introduced into the tank T; and a downstream-side valve Vd provided on the downstream side of the tank T in the fluid supply path. The internal volume of the tank T changes due to deformation.

Classes IPC  ?

  • B01J 4/00 - Dispositifs d'alimentationDispositifs de commande d'alimentation ou d'évacuation
  • H01L 21/205 - Dépôt de matériaux semi-conducteurs sur un substrat, p. ex. croissance épitaxiale en utilisant la réduction ou la décomposition d'un composé gazeux donnant un condensat solide, c.-à-d. un dépôt chimique
  • H01L 21/31 - Traitement des corps semi-conducteurs en utilisant des procédés ou des appareils non couverts par les groupes pour former des couches isolantes en surface, p. ex. pour masquer ou en utilisant des techniques photolithographiquesPost-traitement de ces couchesEmploi de matériaux spécifiés pour ces couches

94.

LIQUID MATERIAL VAPORIZER AND LIQUID MATERIAL VAPORIZATION METHOD

      
Numéro d'application JP2023035869
Numéro de publication 2024/080180
Statut Délivré - en vigueur
Date de dépôt 2023-10-02
Date de publication 2024-04-18
Propriétaire HORIBA STEC, CO., LTD. (Japon)
Inventeur(s) Nishiwaki Keisuke

Abrégé

This liquid material vaporizer comprises: a gas-liquid mixing section that mixes a liquid material and a carrier gas to generate a gas-liquid mixture; a carrier gas supply channel that supplies the carrier gas to the gas-liquid mixing section; a channel section through which the gas-liquid mixture generated in the gas-liquid mixing section flows; a vaporizer that heats and vaporizes the liquid material contained in the gas-liquid mixture that flows through the channel section; and a cooling section that cools the channel section. The cooling section is connected to the carrier gas supply channel.

Classes IPC  ?

  • B01J 7/00 - Appareillage pour la production de gaz
  • B05B 7/04 - Pistolets pulvérisateursAppareillages pour l'évacuation avec des dispositifs permettant le mélange de liquides ou d'autres matériaux fluides avant l'évacuation
  • C23C 16/448 - Revêtement chimique par décomposition de composés gazeux, ne laissant pas de produits de réaction du matériau de la surface dans le revêtement, c.-à-d. procédés de dépôt chimique en phase vapeur [CVD] caractérisé par le procédé de revêtement caractérisé par le procédé utilisé pour produire des courants de gaz réactifs, p. ex. par évaporation ou par sublimation de matériaux précurseurs
  • H01L 21/31 - Traitement des corps semi-conducteurs en utilisant des procédés ou des appareils non couverts par les groupes pour former des couches isolantes en surface, p. ex. pour masquer ou en utilisant des techniques photolithographiquesPost-traitement de ces couchesEmploi de matériaux spécifiés pour ces couches

95.

RADIATION DETECTION ELEMENT, RADIATION DETECTOR, AND RADIATION DETECTION DEVICE

      
Numéro d'application JP2023033568
Numéro de publication 2024/070737
Statut Délivré - en vigueur
Date de dépôt 2023-09-14
Date de publication 2024-04-04
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Ishikura, Koji
  • Okubo, Yuji
  • Matsunaga, Daisuke

Abrégé

Provided are a radiation detection element, a radiation detector, and a radiation detection device with which it is possible to increase a sensitive region. This radiation detection element comprises: a semiconductor part having an incident surface on which radiation is incident; a first electrode which is provided on a surface on the rear side of the incident surface, and into which charges, generated inside the semiconductor part by the incidence of radiation, flow; and a second electrode which is disposed on the incident surface and positioned on the rear side of the first electrode, and to which a voltage required for the inflow of the charges to the first electrode, wherein the radiation detection element includes a third electrode provided on the incident surface and disposed at a position surrounding the second electrode, the third electrode is electrically connected to the second electrode, and a voltage is applied across the second electrode and the third electrode such that the potential changes from the third electrode to the second electrode.

Classes IPC  ?

  • G01T 1/24 - Mesure de l'intensité de radiation avec des détecteurs à semi-conducteurs

96.

RADIATION TEMPERATURE MEASUREMENT DEVICE AND RADIATION TEMPERATURE MEASUREMENT METHOD

      
Numéro d'application 18285428
Statut En instance
Date de dépôt 2022-03-08
Date de la première publication 2024-04-04
Propriétaire HORIBA, Ltd. (Japon)
Inventeur(s)
  • Fujino, Sho
  • Tominaga, Koji

Abrégé

There is provided a radiation temperature measurement device that accurately measures a temperature of an object being measured, and that includes two infrared detection units that detect mutually different infrared wavelength bands, a spectral characteristics data storage unit that stores spectral characteristics data showing a transmittance and a reflectance of each of the objects being measured, and a temperature calculation unit that, based on infrared ray quantities detected by each of the two infrared detection units, and on the transmittance and reflectance of each of the objects being measured, calculates the temperature of each of the objects being measured.

Classes IPC  ?

97.

TEST SPECIMEN TESTING SYSTEM, TEST SPECIMEN TESTING METHOD, AND TEST SPECIMEN TESTING PROGRAM

      
Numéro d'application JP2023034178
Numéro de publication 2024/070865
Statut Délivré - en vigueur
Date de dépôt 2023-09-21
Date de publication 2024-04-04
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Komatsu, Yoji
  • Yoshinaka, Yuji
  • Koyama, Satoshi

Abrégé

The objective of the present invention is to reduce the number of man-hours required for testing a vehicle that includes an automated driving system or an advanced driving assistance system, and to enable a development period for the same to be reduced, and to this end, the present invention provides a test specimen testing system 100 for testing a test specimen W, which is a vehicle including an ADAS or an AD, or a portion of said vehicle, the test specimen testing system 100 comprising a dynamometer 2 for causing the test specimen W to run in a simulated manner, an ambient environment input device 3 for inputting an ambient environment to the test piece W, and an automated driving robot 4 for performing a brake operation, an accelerator operation, or a steering wheel operation of the test specimen W, wherein, on the basis of an input from the ambient environment input device 3, the automated driving robot 4 causes an active running state in which the test specimen W runs actively by means of the ADAS or the AD, and a passive running state in which the test specimen W runs passively by means of the brake operation, the accelerator operation or the steering wheel operation, to be linked together.

Classes IPC  ?

98.

APPARATUS AND METHOD FOR ALIGNING A TEST SPECIMEN AXIS RELATIVE TO THE AXIS OF A TEST STAND

      
Numéro d'application EP2023076519
Numéro de publication 2024/068613
Statut Délivré - en vigueur
Date de dépôt 2023-09-26
Date de publication 2024-04-04
Propriétaire HORIBA EUROPE GMBH (Allemagne)
Inventeur(s)
  • Palesch, Nils
  • Buff, Hendrik

Abrégé

The invention relates to an apparatus (2) for aligning the axis (9) of a test specimen (3) relative to the axis (6) of a test stand (1), said apparatus comprising: a first plate (11) which is designed for fastening to a mounting plate (7) of the test stand (1); and a second plate (12) which is designed to fasten the test specimen (3), the first plate (11) and the second plate (12) being positioned flat against one another and being fastened by a fastening device (18), the fastening device (18) allowing at least two fastening states, specifically an alignment state and a fixing state, such that the two plates (11, 12) can be displaced parallel to one another in the alignment state and such that the two plates (11, 12) are fixed relative to one another in the fixing state, and an adjusting device (22) being provided for displacing one of the two plates (11, 12) parallel relative to the other plate (11, 12) in the alignment state.

Classes IPC  ?

  • G01M 15/02 - Détails ou accessoires pour appareils de test
  • G01M 99/00 - Matière non prévue dans les autres groupes de la présente sous-classe
  • G01R 1/04 - BoîtiersOrganes de supportAgencements des bornes
  • G01R 31/34 - Tests de machines dynamoélectriques

99.

FLUORESCENCE ANALYSIS CELL, FLUORESCENCE ANALYSIS DEVICE, FLUORESCENCE ANALYSIS METHOD, AND METHOD FOR MANUFACTURING CELL TO BE SUBJECTED TO ANALYSIS

      
Numéro d'application JP2023030431
Numéro de publication 2024/062833
Statut Délivré - en vigueur
Date de dépôt 2023-08-24
Date de publication 2024-03-28
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Kitagawa, Yuichi
  • Higuchi,seiji
  • Mimura, Susumu

Abrégé

Provided is a fluorescence analysis cell 10 for use in fluorescence analysis on a liquid X of interest, the fluorescence analysis cell 10 comprising a pair of translucent portions 11a, 11b opposed to each other with an internal space containing the liquid X of interest therebetween and a spacer portion 12 provided to surround the internal space so that the distance between opposed surfaces 111a, 111b of the pair of translucent portions 11a, 11b is 500 nm to 1 mm inclusive.

Classes IPC  ?

100.

PARTICLE GROUP CHARACTERISTIC MEASUREMENT DEVICE, PARTICLE GROUP CHARACTERISTIC MEASUREMENT METHOD, STORAGE MEDIUM RECORDING PROGRAM FOR PARTICLE GROUP CHARACTERISTIC MEASUREMENT DEVICE, PARTICLE DIAMETER DISTRIBUTION MEASUREMENT DEVICE, AND PARTICLE DIAMETER DISTRIBUTION MEASUREMENT METHOD

      
Numéro d'application 17754831
Statut En instance
Date de dépôt 2020-10-06
Date de la première publication 2024-03-28
Propriétaire HORIBA, Ltd. (Japon)
Inventeur(s)
  • Tatewaki, Yasuhiro
  • Fujiwara, Shingo

Abrégé

A particle group characteristic measurement device includes an image acquisition portion that acquires images of a particle group, a particle information extraction portion that processes acquisition images acquired by the image acquisition portion, and then extracts particle information which is information about particles appearing in the acquisition images, and a particle group characteristic calculation portion that calculates a particle group characteristic at a plurality of time points in a time series based on the particle information extracted from a plurality of the acquisition images acquired prior to respective time points. The particle group characteristic calculation portion calculates the particle group characteristic at each time point based on the plurality of acquisition images used to calculate the particle group characteristic at time points previous to that time point, and on the particle information extracted from the plurality of acquisition images whose image acquisition time periods partially overlap each other.

Classes IPC  ?

  • G01N 15/0227 - Recherche de la dimension ou de la distribution des dimensions des particules par des moyens optiques utilisant l’imagerieRecherche de la dimension ou de la distribution des dimensions des particules par des moyens optiques utilisant l’holographie
  • G01N 15/0205 - Recherche de la dimension ou de la distribution des dimensions des particules par des moyens optiques
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