An article inspection apparatus that inspects a quality state of an article to be transported by performing image processing on an image obtained by imaging the article, includes: an image storage unit configured to store the image as a captured image; a first image processing unit configured to detect a partial image region of a defect candidate in the captured image by comparison between an inference value obtained by applying a trained model to the captured image and a predetermined threshold value; and a second image processing unit configured to execute processing of measuring a feature amount with a predetermined image processing algorithm for pass/fail determination for the partial image region of the defect candidate.
09 - Scientific and electric apparatus and instruments
38 - Telecommunications services
42 - Scientific, technological and industrial services, research and design
Goods & Services
Measuring, detecting, monitoring and controlling devices for telecommunications networks, including devices using artificial intelligence technology; Testing and quality control devices; Software; Software for diagnostics and troubleshooting; software for network service assurance and network monitoring; software for network analysis; software for management of telecommunication network infrastructure; artificial intelligence software for analysis; artificial intelligence software for monitoring. Telecommunication services; Operation of a telecommunications network; management of telecommunication network infrastructure; Advice and consultancy in relation to aforementioned. Cloud computing services; Design and development of software; Consulting in the field of cloud computing networks and applications; Platform as a Service [PaaS], including for network service assurance; Software as a Service [SaaS] including with software for network service assurance; Technical support services relating to computer software; Maintenance of computer software; Providing temporary use of on-line non-downloadable software for network service assurance; infrastructure as a Service [IaaS] including for network service assurance; Quality assurance services; Monitoring of network systems; Computer analysis services; network analysis services; Troubleshooting of computer hardware, software and network problems; Artificial intelligence as a service [AIaaS]; Technology consultation in the field of artificial intelligence; design and development of artificial intelligence based measurement solutions; Advice and consultancy in relation to aforementioned.
3.
TEST SYSTEM OF MULTI-SIM DEVICE AND TEST METHOD THEREOF
A test system includes a plurality of simulated base station devices that simulate a base station of a radio communication system in correspondence with each of a plurality of SIMs of a multi-SIM device, and a mobile terminal test device that tests the multi-SIM device by controlling the plurality of simulated base station devices, in which the mobile terminal test device includes a plurality of base station control portions that control the simulated base station devices in correspondence with each of the plurality of simulated base station devices, one primary scenario processing portion that controls communication corresponding to one SIM of the multi-SIM device by controlling one of the plurality of base station control portions, and one or more secondary scenario processing portions that control communication corresponding to one SIM of the multi-SIM device by controlling one of the plurality of base station control portions.
In an experimental environment including a test system that adds an ASE noise to signal light between a transmitting transponder and a receiving transponder connected in a back-to-back manner, OSNR of the signal light and BER of the signal light received by the receiving transponder are measured while changing a ratio of the signal light to the ASE noise, SNRASE_test of the signal light to which the ASE noise is added is obtained, and total SNRTOT including the test system and the transponders is obtained. SNRTRX indicating an amount of the noise in the transponders is obtained. In a commercial environment in which the test system is provided at upstream of the receiving transponder between the transmitting transponder and the receiving transponder connected via an optical transmission network, the same measurement as in the experimental environment is performed, and GSNR of the optical transmission network is obtained.
H04B 10/079 - Arrangements for monitoring or testing transmission systemsArrangements for fault measurement of transmission systems using an in-service signal using measurements of the data signal
5.
ARTICLE INSPECTION APPARATUS AND ARTICLE INSPECTION SYSTEM
An article inspection apparatus includes a sensor that outputs a detection signal for inspecting an article, an inspection unit that applies a trained model to the detection signal to inspect the article, a communication interface, model information storage means for storing identification information of the trained model, trained model acquisition means for transmitting the identification information of the trained model specified by software update waiting information related to an addition or update of the trained model to an external server and acquiring the trained model and the identification information, and an identification information management unit that, in a case where the acquired trained model is installed in the inspection unit, additionally stores the identification information of the trained model in the model information storage means.
G01N 23/04 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material
G01N 23/083 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
6.
ARTICLE INSPECTION APPARATUS AND PERFORMANCE CONFIRMATION METHOD THEREOF
An article inspection apparatus includes: a sensitivity correction unit configured to execute light reception sensitivity correction of an X-ray detector and output an X-ray inspection image after the sensitivity correction; an image quality change detection unit configured to detect an occurrence of a change or a change factor of image quality in the X-ray inspection image; a reference image storage unit configured to store a reference image of a non-defective product; an evaluation image generation unit configured to generate an evaluation image obtained by synthesizing the reference image with the X-ray inspection image after the sensitivity correction at a time of image quality change factor detection; and an inspection performance evaluation unit configured to determine propriety of a determination result of a determination unit after causing an image processing unit to perform image processing on the evaluation image.
G01N 23/083 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
G01N 23/04 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material
G01N 23/18 - Investigating the presence of defects or foreign matter
A test system includes a singular value decomposition processing unit that performs singular value decomposition on instantaneous characteristics H(k, nRS) into a form of U0(k, nRS)D0(k, nRS)V0(k, nRS)H; a signal conversion unit that converts NTx parallel test signals, including the CSI-RS transmitted from NTx transmitting antennas, into R parallel signals by multiplying them by V0(k, nRS)H, a time-domain signal generation unit that generates OFDM modulation signals from the R parallel signals, and a convolution operation unit that performs a convolution operation between the OFDM modulation signals and impulse responses of a product U0(k, nRS)D0(k, nRS) of U0(k, nRS) and D0(k, nRS) to generate NRx parallel test signals in the time domain that are respectively received by NRx receiving antennas of a UE.
In a downlink test, a network test device connected to a wireless terminal connected to a communication network via a base station causes the wireless terminal to periodically transmit a measurement packet to a network test device as a server, and in a case where the measurement packet is received from the wireless terminal, the network test device detects an address of a transmission source of the measurement packet and transmits the measurement packet to the address.
A calibration device for a signal generator includes a waveform data storage unit that outputs I waveform data and Q waveform data at an IF frequency to an I channel and a Q channel, respectively, a signal analysis unit that captures a modulated signal output from the quadrature modulator and quadrature-demodulates the modulated signal into I demodulated waveform data and Q demodulated waveform data at the IF frequency, an error calculation unit that calculates a difference in IF frequency-amplitude characteristics and a difference in IF frequency-phase characteristics, and an error correction unit that includes correction filters correcting the difference in IF frequency-amplitude characteristics between the I component and the Q component and the difference in IF frequency-phase characteristics between the I component and the Q component.
An X-ray inspection device includes an image processing unit that performs predetermined image processing on an X-ray inspection image of an article and outputs determination data indicating a quality state, a determination unit that determines whether or not the article is defective based on the determination data, a sorting information setting unit that sets a discharge direction corresponding to a determination result, a sorting unit that sorts the article, a sorting operation control unit that controls a sorting operation of the sorting unit on the article at a predetermined sorting timing based on the determination result of the determination unit, and a sorting check image generation unit that generates a sorting check pseudo NG image showing that the article is to be discharged in the predetermined discharge direction set by the sorting information setting unit based on the determination result of the determination unit, using a sorting check sample.
B07C 5/34 - Sorting according to other particular properties
G01N 23/04 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material
G01N 23/083 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
An article inspection device that inspects quality of a transported article by imaging the article as an inspection object and performing image processing on an inspection image of the article, which is obtained by the imaging, includes an image storage unit that stores the inspection image of the article, a display unit that displays the inspection image of the article, which is stored in the image storage unit, designation means for designating any position of the inspection image of the article, which is displayed on the display unit, through double tapping and a display control unit that causes the display unit to display a position of the inspection image of the article, which is designated by the designation means, in an enlarged manner at a predetermined enlargement ratio.
G01N 23/04 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material
G01N 23/18 - Investigating the presence of defects or foreign matter
G06F 3/041 - Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
G06F 3/044 - Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
G06F 3/0482 - Interaction with lists of selectable items, e.g. menus
G06F 3/04845 - Interaction techniques based on graphical user interfaces [GUI] for the control of specific functions or operations, e.g. selecting or manipulating an object, an image or a displayed text element, setting a parameter value or selecting a range for image manipulation, e.g. dragging, rotation, expansion or change of colour
G06F 3/0488 - Interaction techniques based on graphical user interfaces [GUI] using specific features provided by the input device, e.g. functions controlled by the rotation of a mouse with dual sensing arrangements, or of the nature of the input device, e.g. tap gestures based on pressure sensed by a digitiser using a touch-screen or digitiser, e.g. input of commands through traced gestures
An X-ray inspection apparatus that performs an inspection of an inspection object by detecting X-rays emitted to and transmitted through the inspection object includes: a housing; an X-ray detection portion that is disposed in the housing and detects the X-rays; an air conditioner that cools an inside of the housing; and first dehumidifying means and second dehumidifying means for dehumidifying the inside of the housing.
A first detector that receives and detects 3-tone signals of three patterns of a first 3-tone signal obtained by combining three waves of angular frequencies ω1, ω2, and ω3 (here, ω2−ω1=ω3−ω2=Δω is established), a second 3-tone signal in which each tone has a phase offset, and a third 3-tone signal having a phase offset different from the phase offset of the second 3-tone signal, a BPF that allows only a beat component of an angular frequency difference Δω between adjacent waves of the 3-tone signals among signals output from the first detector to pass, a second detector that detects power of the beat component that has passed through the BPF, a voltmeter that measures a voltage of a signal output from the second detector, and a phase calculator that calculates a phase based on the measured voltage values of the three patterns.
G01R 25/00 - Arrangements for measuring phase angle between a voltage and a current or between voltages or currents
G01R 19/00 - Arrangements for measuring currents or voltages or for indicating presence or sign thereof
G01R 23/14 - Arrangements for measuring frequency, e.g. pulse repetition rateArrangements for measuring period of current or voltage by heterodyningArrangements for measuring frequency, e.g. pulse repetition rateArrangements for measuring period of current or voltage by beat-frequency comparison
G01R 25/04 - Arrangements for measuring phase angle between a voltage and a current or between voltages or currents involving adjustment of a phase shifter to produce a predetermined phase difference, e.g. zero difference
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15.
X-RAY INSPECTION DEVICE AND ARTICLE INSPECTION SYSTEM
An X-ray inspection device performs relative mass inspection of an inspection object based on an X-ray inspection image obtained by X-ray imaging the inspection object at a predetermined transport position, and includes: a morphological feature imaging unit that images an appearance of the inspection object and outputs appearance image data including classifiable morphological features of the inspection object; a variant feature image recognition unit that detects an image feature value for each variant, by which a content component type of the inspection object is specifiable, from the appearance image data; and an inspection control unit that varies specific inspection parameters for the relative mass inspection in accordance with the image feature value for each variant recognized by the variant feature image recognition unit.
G01N 23/083 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
G01N 23/10 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and measuring the absorption the material being confined in a container, e.g. in luggage X-ray scanners
An article inspection device includes an image storage unit that stores an inspection image by imaging an article, a determination unit that determines a quality state of the article by obtaining an inference value related to the quality state as confidence for each predetermined unit region of the inspection image and comparing with a threshold value using a learning model, an inference value image generation unit that generates an inference value image having a pixel density corresponding to the inference value, a projection image generation unit that generates a projection image by projecting a maximum value of the density corresponding to the inference value to an x-axis for a plurality of line image regions xpi present in a y-axis direction in the inference value image, and a display control unit that displays the projection image by adding a line corresponding to the threshold value.
G01N 23/046 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
17.
JITTER TOLERANCE MEASUREMENT APPARATUS AND JITTER TOLERANCE MEASUREMENT METHOD
A jitter tolerance measurement apparatus includes an error measurement unit that measures an error measurement value of an output signal of a DUT that receives a pattern signal in synchronization with a jitter clock subjected to phase modulation by a jitter modulation signal, over a predetermined measurement time, a jitter tolerance measurement unit that changes jitter amplitude and jitter frequency of the jitter modulation signal to estimate, as a jitter tolerance of the DUT, a maximum jitter amplitude at which the error measurement value measured by the error measurement unit is equal to or less than a predetermined allowable value for each jitter frequency, a confidence level calculation unit that calculates a confidence level related to an allowable value of an error rate of the output signal of the DUT, and a display unit that displays result display screens showing the jitter tolerance and the confidence level.
An X-ray inspection apparatus includes: an X-ray generator that irradiates an inspection object with X-rays; an X-ray detector that outputs detection data for each of a plurality of line sensors disposed in a transport direction; an image generation unit that generates an inspection image including a plurality of pixels each having a density value based on the detection data; and an inspection processing unit that inspects a quality of the inspection object based on the inspection image, in which the X-ray detector includes a scintillator having good afterglow characteristics, and the line sensor including CMOS type photoelectric sensors that output the detection data, and the image generation unit generates the inspection image based on light reception data obtained by integrating the detection data output by the X-ray detector by a TDI method.
G01N 23/04 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material
G01N 23/083 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
A mobile communication test system has a test control unit including a setting control unit that sets a test scenario including a transmission mode defined in a layer that allows protocol testing to be performed without going through the PHY layer and RF unit; and a pseudo communication control unit that generates an IP packet with a changed format according to the set transmission mode when performing a protocol test, and controls the pseudo base station unit to transmit and receive the IP packet with the changed format between the codec processing unit and the opposing codec processing unit, and thereby the protocol test is performed without going through the PHY layer and RF unit.
A delay addition unit that adds a propagation delay of a signal in a case of being via a satellite, which is calculated from position information of the satellite and UE, to an uplink signal from the UE and outputs the signal, a timing generation unit that generates a downlink signal and synchronizes with the UE, a power measurement unit that measures power of the uplink signal received from the UE, a reception processing unit that performs a reception process of the received uplink signal, a heat map generation unit that displays a power measurement value measured by the power measurement unit on a heat map in which the power measurement value is arranged in time series, on a display unit, and a timing misalignment detection unit that displays a position of an NPRACH of a 3GPP standard in a superimposed manner on the heat map.
A satellite orbit calculation unit that calculates a satellite orbit based on position information and a movement speed of a satellite at a start of measurement, a Doppler shift calculation unit that calculates a Doppler shift amount and displays, on the display unit, a difference between a carrier frequency of a downlink signal and a carrier frequency at the start of the measurement and a difference between a carrier frequency of an uplink signal and the carrier frequency at the start of the measurement, a Doppler shift removal unit that removes a Doppler shift added to the uplink signal based on the calculated Doppler shift amount, and a frequency error measurement unit that calculates a difference between the carrier frequency after the Doppler shift is removed and the carrier frequency at the start of the measurement and displays the difference on the display unit are provided.
An article inspection device inspects quality of a transported article by imaging the article as an inspection object and performing image processing on an inspection image of the article, which is obtained by the imaging, and includes an image storage unit that stores the inspection image of the article, a display unit that displays the inspection image of the article, which is stored in the image storage unit, instruction means for giving an instruction to expand and contract a distance between any two points of the inspection image of the article, which is displayed on the display unit, through a multi-touch operation, and a display control unit that causes the display unit to display the inspection image of the article in an enlarged manner or a reduced manner according to the amount of expansion and contraction instructed by the instruction means.
G01N 23/04 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material
G06F 3/044 - Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
G06F 3/04845 - Interaction techniques based on graphical user interfaces [GUI] for the control of specific functions or operations, e.g. selecting or manipulating an object, an image or a displayed text element, setting a parameter value or selecting a range for image manipulation, e.g. dragging, rotation, expansion or change of colour
G06F 3/0488 - Interaction techniques based on graphical user interfaces [GUI] using specific features provided by the input device, e.g. functions controlled by the rotation of a mouse with dual sensing arrangements, or of the nature of the input device, e.g. tap gestures based on pressure sensed by a digitiser using a touch-screen or digitiser, e.g. input of commands through traced gestures
23.
MEASUREMENT APPARATUS AND METHOD FOR LIMITING PARAMETERS THEREOF
Provided is a measurement apparatus that can limit a settable range of parameters according to executable functions to suppress parameter setting errors. A measurement apparatus includes a plurality of measurement devices 51A and 51B that measure SISO communication and an integrated control device 55 that controls the measurement devices 51A and 51B to measure a wireless signal transmitted and received by a DUT 1 which performs MIMO communication. The integrated control device 55 collects executable functions of each of the measurement devices 51A and 51B and limits a setting range of parameters for the MIMO communication based on the executable functions of the measurement devices 51A and 51B.
Provided is a measurement device that makes a screen for setting parameters easy to see, makes it possible to easily find a parameter desired to be set, and can suppress parameter setting errors. A measurement device includes a display unit 15 that displays an image and a control unit 16 that switches a setting screen for a Capability Element parameter between a setting screen for SISO communication and a setting screen for MIMO communication and displays the setting screen on the display unit 15 when communication conforming to an IEEE 802.11be standard is measured.
The measurement apparatus includes a measurement test selection unit that selects a test item to be measured, a measurement condition analysis unit that analyzes a measurement condition of the selected test item, a wiring condition selection unit that inputs a frequency band to be measured and an antenna terminal of a mobile terminal to be used in the frequency band as a wiring condition for the selected test item, a recommended wiring calculation unit that calculates a wiring method that satisfies the wiring condition and the measurement condition and minimizes the number of times of reconnection to the cable between the port of the measurement device and the antenna terminal of the mobile terminal, and a wiring method display unit that displays the wiring method calculated by the recommended wiring calculation unit as a wiring diagram.
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An article inspection device capable of increasing accuracy of learning or performance verification without an effort to acquire an inspection image to be used for learning or performance verification for setting an inspection condition is provided. An article inspection device includes an inspection unit that inspects a quality state of an article using an inspection image obtained by imaging the article being transported, in which the inspection unit sets an inspection condition of the quality state of the article based on a pseudo-image of the inspection image generated by a generative AI. The inspection unit inspects the quality state of the article by applying a trained model as an inspection condition created by learning the pseudo-image.
G06V 10/764 - Arrangements for image or video recognition or understanding using pattern recognition or machine learning using classification, e.g. of video objects
G06V 10/774 - Generating sets of training patternsBootstrap methods, e.g. bagging or boosting
In a metal detector, a magnetic field output unit generates an alternating magnetic field, a magnetic field detection unit detects a change in magnetic field caused by an inspection object passing through the alternating magnetic field to output a detection signal, and a control unit detects whether or not metal foreign matter is contained in the inspection object based on the detection signal. A storage unit sequentially stores influence value information including phase information, amplitude information, or a Lissajous waveform obtained based on the detection signal when an accepted product that is determined not to contain metal foreign matter passes through the alternating magnetic field. When the influence value information is changed to exceed a predetermined criterion, the control unit determines that a state of the inspection object is changed, and a notification unit notifies the determination.
G01D 5/22 - Mechanical means for transferring the output of a sensing memberMeans for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for convertingTransducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying inductance, e.g. by a movable armature differentially influencing two coils
The article inspection apparatus includes an image processing unit that performs an image process with respect to an imaging data of an article and outputs determination data, a determination unit that determines a quality state of the article based on the determination data, an operation check image generation unit that generates an image including an NG feature image in which the quality state is determined to be defective as an operation check image used in an operation check processing unit based on an inspection image during a driving operation, and an operation check processing unit that executes an operation check process using the predetermined image processing algorithm in parallel with an operation of the image processing unit during the driving operation, and determines whether the operations of the image processing unit and the determination unit are normal.
G01N 23/04 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material
G01N 23/083 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
G01N 23/18 - Investigating the presence of defects or foreign matter
Provided is a metal detector that reduces capacitive coupling between a transmitting coil and a receiving coil and is easy to handle. A metal detector that determines whether or not metal is contained in an inspection object, the metal detector including: a housing; a transmitting coil and a receiving coil disposed inside the housing; a holding material configured to hold the transmitting coil and the receiving coil in the housing; and a shield member disposed between the transmitting coil and the receiving coil. An electrical resistivity of the shield member is higher than an electrical resistivity of the housing.
G01D 5/20 - Mechanical means for transferring the output of a sensing memberMeans for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for convertingTransducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying inductance, e.g. by a movable armature
31.
SIGNAL GENERATION APPARATUS AND SIGNAL GENERATION METHOD
A clock source configured to generate a clock of a reference frequency; a jitter modulation source configured to generate a jitter clock by applying a modulation to the clock of the reference frequency generated by the clock source; a signal generation source configured to generate a time series pattern signal of a Test Flow at a timing of the jitter clock in order to perform a test; and an operation unit configured to set a type of pattern for each flow of the time series pattern signal, a manual or automatic switching method for each flow, and a transmission time of a pattern for each flow in the automatic switching method in a pattern setting list in tabular form, in which the time series pattern signal of the Test Flow is transmitted to a device under test W in accordance with the settings of the operation unit.
A high-frequency circuit includes a printed circuit board on which a circuit including a plurality of electronic components is disposed, a shield case that is electrically connected to a ground of the printed circuit board and covers the circuit, and at least one spring contact that is electrically connected to the ground in a space formed by the printed circuit board and an inner wall of the shield case, in which the shield case includes a frame that is surface-mounted on the ground and is electrically connected to the ground, and a cover that includes a ceiling surface facing the printed circuit board and is electrically connected to the frame by being in contact with the frame, and the spring contact electrically connects the ground and the cover by being in contact with a part of the ceiling surface.
In an ADC calibration device, the calibration signal generator generates a frequency modulated wave, as a calibration signal, in which frequency changes in a frequency pattern, which is predetermined, within an applicable frequency range over time. A TI-ADC outputs a sample signal obtained by performing an AD conversion of the calibration signal input. Individual frequency characteristic detection units are provided in parallel corresponding to the plurality of AD converters and individually detect frequency characteristics of the sample signal for each of the plurality of AD converters. In a control unit, a mismatch calculation unit calculates frequency characteristics of mismatch characteristics between the plurality of AD converters from the frequency characteristics of the sample signal for each of the plurality of AD converters, and calculates correction information for correcting a mismatch.
An orchestration system acquires inspection result data of an inspection object from a plurality of inspection modules on a production line, inputs the acquired inspection result data into a learning model associated with a first inspection module to determine which of a plurality of clusters the inspection object belongs to based on output from the learning model, and acquires a setting value of a parameter used by an inspection module other than the first inspection module, the setting value being stored in a storage unit in accordance with the cluster to which the inspection object belongs.
G05B 19/418 - Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
35.
HIGH-FREQUENCY CIRCUIT AND ABNORMALITY DETECTION METHOD THEREOF
A high-frequency circuit includes a capacitor connected to a main line of a transmission line, a resistor connected in parallel between two terminals of the capacitor, and bias terminals connected to the main line, disposed on both outsides of an inspection circuit that includes the resistor and the capacitor, and connected to a measurement device in a case of abnormality diagnosis, in which the measurement device applies a direct current voltage or a direct current to the inspection circuit through the bias terminals, measures at least one kind of measurement value of a resistance value, a voltage, and a current between the bias terminals, and detects whether or not at least one kind of abnormality including disconnection of the main line or short circuit of the capacitor occurs based on the measurement value.
A spectroscopic measurement device capable of adjusting a light quantity acquired by a light detection unit to an appropriate light quantity is provided. The spectroscopic measurement device includes: a light source unit configured to emit light from a light source toward a tablet; and the light detection unit configured to measure a spectral characteristic of transmission light emitted from the light source unit and transmitted through the tablet with a spectroscope, in which the light source unit is configured such that a relative distance to the tablet is adjustable based on a control signal input from an outside, and the light detection unit is configured such that a relative distance to the tablet is adjustable based on a control signal input from an outside.
G01N 21/31 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
G01N 21/84 - Systems specially adapted for particular applications
G01N 21/88 - Investigating the presence of flaws, defects or contamination
37.
TEST SYSTEM AND TRANSMISSION ANTENNA CORRELATION ESTIMATION METHOD
A test system includes an actual propagation path estimation characteristic calculation unit that calculates estimation characteristics of propagation path characteristics of an actual propagation path, an actual propagation path channel capacity calculation unit that calculates an actual propagation path channel capacity of the actual propagation path from the estimation characteristics, a simulation propagation path characteristic calculation unit that calculates simulation propagation path characteristics of a channel model, a simulation channel capacity calculation unit that calculates a simulation channel capacity of the channel model from the simulation propagation path characteristics, a transmission antenna correlation coefficient estimation unit that estimates a transmission antenna correlation coefficient in which a difference between the actual propagation path channel capacity and the simulation channel capacity is smaller than a specified value, and a transmission antenna correlation calculation unit that calculates a transmission antenna correlation based on the transmission antenna correlation coefficient.
An error rate measurement apparatus includes: a symbol count unit that counts decision results as PAM symbols, and calculates a ratio of a determination frequency of a symbol level of 3 to a determination frequency of a symbol level of 2, and a ratio of a determination frequency of a symbol level of 1 to a determination frequency of a symbol level of 0; and a control unit that adjusts and controls Vth_Middle such that Vth_Middle has the voltage value of the average DC value voltage of the PAM4 signal measured, adjusts and controls Vth_Upper such that the determination frequency of the symbol level of 3 and the determination frequency of the symbol level of 2 have a desired ratio, and adjusts and controls Vth_Lower such that the determination frequency of the symbol level of 1 and the determination frequency of the symbol level of 0 have a desired ratio.
A measurement device capable of reducing noise during EVM measurement in a case where a level of an input signal changes is provided. A measurement device includes a first input port, a first variable attenuator that attenuates a signal level of an uplink signal input into the first input port in accordance with a set input level, a first AD converter that converts an analog signal attenuated by the first variable attenuator into a digital signal, a signal analysis unit that performs modulation analysis on a section to be measured in the digital signal output from the first AD converter, and a control unit that, in measuring an input signal that consists of a plurality of sections and that has different signal levels in each section, changes the input level in accordance with a section to be measured during measurement of each section.
A control unit 10 that obtains an offset value and a slope of time information from a global navigation satellite system (GNSS) time reception unit 5 and information from a main body clock 7, from captured data acquired by connecting an output port 11 and an input port 12 in a shortest manner, that corrects the delay time obtained from the captured data by the offset value and the slope of the time information from the GNSS reception unit 5 and the time information from the main body clock 7 by measuring a delay time by a delay measurement unit 3 and acquiring the captured data by a capture unit 4, and that corrects the corrected delay time by a maximum value and a minimum value of the delay time measured by the delay measurement unit 3, is included.
An error rate measurement apparatus 1 includes an error count unit 13a that calculates an error count value by determining an error with respect to expected symbol levels of a PAM signal with two or more levels; and a control unit 6 that adjusts and controls a threshold voltage for each interval between the symbol levels such that a first error count value and a second error count value for each interval between adjacent symbol levels calculated by the error count unit 13a are close to each other.
H04L 1/20 - Arrangements for detecting or preventing errors in the information received using signal-quality detector
H04L 25/03 - Shaping networks in transmitter or receiver, e.g. adaptive shaping networks
H04L 25/49 - Transmitting circuitsReceiving circuits using code conversion at the transmitterTransmitting circuitsReceiving circuits using predistortionTransmitting circuitsReceiving circuits using insertion of idle bits for obtaining a desired frequency spectrumTransmitting circuitsReceiving circuits using three or more amplitude levels
42.
ERROR RATE MEASUREMENT APPARATUS AND SIGNAL DETECTION METHOD
There is provided an error rate measurement apparatus including: a display unit; a reference signal holding unit that holds a part of a head of the internal signal as a reference signal; a head detection unit that detects a head of the specific pattern in an input signal from the DUT by comparing the reference signal with the input signal; a detection signal output unit that outputs a detection signal synchronized with a timing at which the head of the specific pattern is detected by the head detection unit; a latch unit that holds the detection signal; and a control unit that displays a detection notification image indicating that the head of the specific pattern is detected by the head detection unit, on the display unit, during a period in which the detection signal is held by the latch unit.
An inspection apparatus that enables a foreign object contained in or attached to an object as an inspection target to be easily detected and that can improve accuracy of inspection is provided. An inspection apparatus that inspects an object as an inspection target at least partially including a non-transparent region allowing transmission of visible light includes a light source unit that emits the visible light to the object at an inspection position, an imaging unit that is disposed in a side opposite to the light source unit with the object interposed between the imaging unit and the light source unit and that images transmitted light transmitted through the object, and an inspection unit that inspects the object based on an image captured by the imaging unit.
A spectroscopic measurement device capable of preventing entry of stray light into an optical fiber and preventing a decrease in accuracy of data of a spectrum of light incident on the optical fiber. The spectroscopic measurement device includes a light source unit, and a light detection unit in which transmission light transmitted through the article is incident on an optical fiber and a spectral characteristic of the transmission light passing through the optical fiber is measured by the spectroscope, in which the light detection unit further includes a tubular member between the article and the optical fiber, and an opening on an end of the tubular member on a side facing toward the article is positioned on the article side with respect to an incidence end of the optical fiber and the transmission light passes through the tubular member from the opening and is incident on the optical fiber.
G01N 21/31 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
45.
SPECTROSCOPIC MEASUREMENT DEVICE AND ARTICLE INSPECTION DEVICE INCLUDING THE SAME
A spectroscopic measurement device includes a light source unit configured to irradiate a tablet with light, and a light detection unit configured to measure a spectral characteristic of transmission light transmitted through the tablet, in which the light source unit includes a condensing member configured to condense light emitted from a light source, the condensing member includes a first opening on which the light emitted from the light source is incident, a second opening formed to face the light detection unit and having an opening area smaller than an opening area of the first opening, and a transfer path configured to communicate the first opening and the second opening and transfer light entering the first opening to the second opening, and the transfer path has an inner dimension decreasing from the first opening toward the second opening and includes a wall surface consisting of a reflection surface.
Provided is an article inspection apparatus that improves inspection accuracy. An AI processing unit outputs determination data indicating a quality of an article captured in a captured image using a learning model that has been trained with an image, and a rule-based processing unit outputs determination data indicating the quality of the article captured in the captured image using an image processing unit that performs image processing on the captured image. A comprehensive determination unit performs comprehensive determination of the quality of the article captured in the captured image based on both the determination data output from the AI processing unit and the rule-based processing unit.
G06V 10/764 - Arrangements for image or video recognition or understanding using pattern recognition or machine learning using classification, e.g. of video objects
47.
FOREIGN MATTER INSPECTION DEVICE AND FOREIGN MATTER INSPECTION METHOD
A foreign matter inspection device includes a region-of-interest setting unit that sets a region of interest including a foreign matter candidate region which is likely to include an image of a foreign matter contained in a product, a mask image generation unit that generates a mask image obtained by masking the foreign matter candidate region, a restored image generation unit that generates a restored image of a good product from the mask image based on a restoration algorithm, a difference evaluation value calculation unit that calculates a difference evaluation value for evaluating a difference between a region-of-interest image and the restored image, and a foreign matter determination unit that determines whether or not the foreign matter candidate region includes the image of the foreign matter based on a comparison between the difference evaluation value and a predetermined threshold value.
G01N 23/18 - Investigating the presence of defects or foreign matter
G01N 9/24 - Investigating density or specific gravity of materialsAnalysing materials by determining density or specific gravity by observing the transmission of wave or particle radiation through the material
G01N 23/04 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material
G01N 23/083 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
There is provided an inspection device including: a camera that captures an image of an inspection object to acquire image data; image inference means for outputting a determination result indicating a quality of the inspection object based on the input image data; and domain adaptation means for outputting adapted image data, which is adapted to a distribution of learning image data used for model generation by the image inference means, based on first image data obtained by capturing the image of the inspection object and metadata indicating a distribution of the first image data.
G01N 23/04 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material
G01N 23/083 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
49.
DIFFERENTIAL SKEW GENERATION DEVICE AND DIFFERENTIAL SKEW GENERATION METHOD
A differential skew generation device 1 includes: a clock oscillator 2 that oscillates and outputs a clock signal; a first signal generator (PPG) 4A that outputs a positive signal to an evaluation target W at a timing of a signal in which a phase angle is adjusted by in-phase and quadrature-phase (IQ) modulation of the clock signal; and a second signal generator (PPG) 4B that outputs a negative signal to the evaluation target W at a timing of a signal in which a phase angle is adjusted by IQ modulation of the clock signal. The first signal generator (PPG) 4A and the second signal generator (PPG) 4B operate in synchronization with each other and allocate an integer unit of a unit interval (UI) of a set skew amount to transmission timing shift and a decimal unit to IQ modulation.
There is provided a mobile terminal testing device that can improve measurement reproducibility at the same measurement position. The terminal testing device includes a positioner operation recording unit 16c that stores an operation path of the DUT scanning mechanism 56 to the measurement position by tracing back from the measurement position to a preset number of the angular sample points PS, and a positioner operation control unit 16d that controls the DUT scanning mechanism 56 according to the operation path stored in the positioner operation recording unit 16c to adjust the DUT 100 to an angle of the measurement position when performing measurement at the measurement position.
There is provided a mobile terminal testing device that can reduce the time required for measurement. A Wait time analysis control unit 18c that performs changes in a plurality of angles, the number of measurements, and signal settings to measure changes in signal level over time a plurality of times, estimates a time for a beam selection process based on the measurement results, obtains a Wait time from the estimated time for the beam selection process, and stores the obtained Wait time to a Wait time management table 16b in association with a corresponding DUT 100 is provided.
An object of the present disclosure is to measure a GOSNR to which a nonlinear noise power is added from signal light. According to the present disclosure, there is provided a GOSNR measurement device including: a calculation processing unit (14) that calculates a total noise power (Ptotal-noise), which is a sum of a nonlinear noise power (Pnl) and an ASE noise power (Pase) in an optical fiber transmission line (93), by using Stokes parameters obtained by causing signal light to propagate through the optical fiber transmission line, and measures a generalized optical signal to noise ratio (GOSNR) by using the total noise power.
H04B 10/079 - Arrangements for monitoring or testing transmission systemsArrangements for fault measurement of transmission systems using an in-service signal using measurements of the data signal
53.
MOBILE TERMINAL TESTING DEVICE AND MOBILE TERMINAL TESTING METHOD
There is provided a mobile terminal testing device that can improve the accuracy of measurement results. A reference position measurement control unit 18c that measures output power of a DUT 100 at a Reference position, which is any preset measurement position, each time a certain period of time elapses in a case where a total spherical scanning of the DUT 100 is performed, and that, in a case where the output power is equal to or less than a preset regulated Power, interrupts the measurement, excludes measurement data after the previous measurement at a Reference position from the measured value, and enables the measurement to be resumed from the excluded measurement position is provided.
Provided is a mobile terminal testing device that can reduce time required for measurement. An Early Fail control unit includes a Fail condition setting unit that sets a condition for determining whether a measurement result is Fail, a Fail point management unit that manages information on a Fail point, which is a measurement position at which the measured level is below a regulated level and is determined to be Fail, and an Early Fail determination unit that determines whether a result is Fail even if the measurement is continued, based on information on the Fail points managed by the Fail point management unit. When measurement of Spherical coverage of 5G NR is performed, the Early Fail control unit determines whether the result is Early Fail in which the result is Fail even if the measurement is continued, and stops the measurement when the result is determined to be Early Fail.
To provide a mobile terminal test apparatus capable of confirming whether call connection is possible by using setting of a test apparatus before the call connection and improving efficiency of a test. A control unit 6 that acquires UE Capability Information through communication with a mobile terminal 10, collates whether a Band Combination set in the own apparatus is present in a Carrier Aggregation Band Combination List included in the UE Capability Information, and displays, on a display unit 5, that call connection is possible, in a case where the Band Combination set in the mobile terminal test apparatus is present in the Carrier Aggregation Band Combination List is provided.
A rejection device includes a detection sensor that detects an article, pressurization point setting means for setting an essential pressurization point of the article by using a distance from a front end of the article and a transport time corresponding to a transport speed for each type of the article by a compressed air, a management timer that manages a rejection delay time set by using a delay time from a detection time point when a rear end of the article is detected by a detection sensor to a time point when the essential pressurization point enters a discharge bias section, and rejection command means for inputting a rejection command signal to the rejection unit for a predetermined command time from a time-up time point of the management timer.
A sequence pattern generation device that can control skew between lanes of a plurality of lanes by controlling a transmission start timing of a sequence pattern of a plurality of outputs. The sequence pattern generation device includes a primary module 2 and a secondary module 3 each having two outputs of data signals, and a device control unit 16 that, in a case where a start of a sequence of the outputs of the data signals is synchronized, sets delay amounts, aligns phases of clocks of the primary module 2 and the secondary module 3, locks phases of clocks of a primary data generation unit 26 of the primary module 2 and a secondary data generation unit 36 of the secondary module 3, and starts the sequence with the delay amounts set in the primary data generation unit 26 and the secondary data generation unit 36.
A measurement apparatus includes a display part that displays an image, and a control part that displays a plurality of resource unit display parts, which are graphic forms indicating resource units disposed in a frequency bandwidth of a channel, on the display part in a selectable manner in a case in which measurement of communication in accordance with a standard of IEEE 802.11be is performed, that divides the frequency bandwidth of the channel into two or more frequency bandwidths to display only the plurality of resource unit display parts belonging to one of the divided frequency bandwidths in a case in which the frequency bandwidth of the channel is equal to or greater than a predetermined value, and that allows selection of at least one of the plurality of resource unit display parts to allocate a resource unit as a measurement target.
A plurality of resource unit display parts are displayed on a display part in a selectable manner in a case in which measurement of communication in accordance with a standard of IEEE 802.11 is performed, a predetermined number of the resource unit display parts based on a position of a cursor is enlarged to display the enlarged resource unit display part as an enlarged selection part in a case in which a frequency bandwidth of a channel is equal to or greater than a predetermined value and the cursor is placed within a preset range of the display selection part, and a resource unit as a measurement target is allocated by the resource unit display part displayed in the enlarged selection part.
A plurality of resource unit display parts, which are graphic forms indicating resource units disposed in a frequency bandwidth of a channel, are displayed on a display part in a selectable manner in a case in which measurement of communication in accordance with a standard of IEEE 802.11 is performed, display of the display selection part is divided into a plurality of the display selection parts in a frequency direction to display one display selection part in an enlarged manner in the frequency direction in a case in which the frequency bandwidth of the channel is equal to or greater than a predetermined value, and selection of at least one of the plurality of resource unit display parts is allowed to allocate the resource unit as a measurement target.
The network measurement system has a first network measurement device and a second network measurement device respectively having a GNSS receiving function, and with the first network measurement device connected to the UE and the second network measurement device arranged outside the data center and connected to the server device, both devices measure the one-way delay between the UE and the server device. In accordance with this, the second network measurement device simultaneously measures the one-way delay and two-way delay between the server device and estimates the time error of the server device based on the results of the one-way delay and two-way delay measurements.
09 - Scientific and electric apparatus and instruments
Goods & Services
Electric or magnetic meters and testers; measuring or
testing machines and instruments; optical machines and
apparatus; computer programs; electronic instruments for
inspection and detection of contaminants in medicines; metal
detectors; weighing apparatus and instruments; detectors;
measuring instruments and their parts for analyzing and
inspecting components of medicines, tablets, capsules and
liquid agent; measuring instruments and their parts for
analyzing and inspecting the concentration of components of
medicines, tablets, capsules and liquid agent; measuring
instruments and their parts for analysis and inspection of
foreign substances in medicines, tablets, capsules and
liquid agent; measuring instruments and their parts for
analysis and inspection of the weight of medicines, tablets,
capsules and liquid agent; measuring instruments and their
parts for the analysis and inspection of foreign metal
contamination in medicines, tablets, capsules and liquid
agent; measuring instruments and their parts for analyzing
and inspecting the appearance of medicines, tablets,
capsules and liquid agent using cameras; computer software
for measuring and inspecting medicines, tablets, capsules
and liquid agent.
63.
ARTICLE INSPECTION APPARATUS AND LEARNING MODEL UPDATE SYSTEM
There are provided a sensor that outputs a detection signal for inspecting a quality state of an article, an inspection unit that inspects the quality state of the article by applying a trained model created by training in advance to the detection signal output by the sensor, update means for updating the trained model based on an external input, evaluation means for evaluating the trained model by using a verification dataset which is not used for training the trained model, and output means for outputting an evaluation result by the evaluation means, as statistical data related to an inspection result by the inspection unit with the verification dataset, and it is possible to quantitatively grasp a deterioration in inspection performance according to the update of the trained model.
An article inspection apparatus that inspects an inspection object article by applying a predetermined image processing algorithm to an inspection image obtained by imaging the inspection object article, the article inspection apparatus comprising a learning unit that evaluates suitability of each of a plurality of image processing algorithms applied to the inspection image based on performance information representing inspection performance in a case where the plurality of image processing algorithms are applied to a plurality of acquired images, and that calculates a plurality of evaluation values representing evaluation results for each of the plurality of image processing algorithms, and an image processing algorithm setting unit that sets a predetermined image processing algorithm used for determining a quality state of the inspection object article based on the plurality of calculated evaluation values.
G01N 23/04 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material
65.
HIGHER-ORDER MODE SUPPRESSOR, WAVEGUIDE FILTER DEVICE USING SAME, SPECTRUM ANALYZER, SIGNAL ANALYZER, SIGNAL GENERATION DEVICE, HIGHER-ORDER MODE SUPPRESSION CONTROL METHOD, AND FILTER CONFIGURATION METHOD
Provided are a higher-order mode suppressor, a waveguide filter device using the same, a spectrum analyzer, a signal analyzer, a signal generation device, a higher-order mode suppression control method, and a filter configuration method, which can reliably prevent a passage of an occurring higher-order mode with a simple structure, and which can realize highly reliable spectrum measurement, signal analysis, and signal generation which are not affected by the higher-order mode, by applying the structure. In a higher-order mode suppressor, a ridge waveguide portion is configured with dimensions such that an inner diameter of a waveguide path is narrower than inner diameters of waveguide paths of waveguides, and when a frequency band including a basic frequency band is input from an input side, the higher-order mode occurring on the input side is suppressed with respect to a frequency band of twice or more than a cutoff frequency.
A phase characteristic measurement device includes a first detector 11 that receives and detects two patterns of three-tone signals of a first three-tone signal obtained by combining the three waves of angular frequencies ω1, ω2, ω3 (wherein ω2−ω1=ω3−ω2=Δω) and a second three-tone signal obtained by changing a phase of one tone out of the first three-tone signal, a BPF 12 that allows only a beat component of an angular frequency difference Δω of adjacent waves of the three-tone signal from the signal output from the first detector to pass therethrough, a second detector 13 that detects power of the beat component that has passed through the BPF 12, a voltmeter 14 that measures the voltage of the signal output from the second detector, and a phase calculator 15 that calculates the phase based on the measured voltage value.
09 - Scientific and electric apparatus and instruments
Goods & Services
Electric or magnetic meters and testers, namely, electric or magnetic meters and testers for inspection and detection of contaminants in medicines for scientific purposes and manufacturing purposes; measuring or testing machines and instruments, namely, measuring or testing machines and instruments for inspection and detection of contaminants in medicines for scientific purposes and manufacturing purposes; optical machines and apparatus, namely, optical machines and apparatus for inspection and detection of contaminants in medicines for scientific purposes and manufacturing purposes; Downloadable and recorded computer programs for measuring and inspecting medicines, tablets, capsules and liquid agent; electronic instruments for inspection and detection of contaminants in medicines for scientific purposes and manufacturing purposes; metal detectors; weighing apparatus and instruments; electronic metal detectors; measuring instruments and their structural and replacement parts for analyzing and inspecting components of medicines, tablets, capsules and liquid agent for scientific purposes and manufacturing purposes; measuring instruments and their structural and replacement parts for analyzing and inspecting the concentration of components of medicines, tablets, capsules and liquid agent for scientific purposes and manufacturing purposes; measuring instruments and their structural and replacement parts for analysis and inspection of foreign substances in medicines, tablets, capsules and liquid agent for scientific purposes and manufacturing purposes; measuring instruments and their structural and replacement parts for analysis and inspection of the weight of medicines, tablets, capsules and liquid agent for scientific purposes and manufacturing purposes; measuring instruments and their structural and replacement parts for the analysis and inspection of foreign metal contamination in medicines, tablets, capsules and liquid agent for scientific purposes and manufacturing purposes; measuring instruments and their structural and replacement parts for analyzing and inspecting the appearance of medicines, tablets, capsules and liquid agent using cameras for scientific purposes and manufacturing purposes; downloadable and recorded computer software for measuring and inspecting medicines, tablets, capsules and liquid agent
An article inspection apparatus includes a detection data output unit that incorporates a detection signal from an X-ray detector to output detection data, an image generation unit that generates an inspection image, based on the detection data, a level conversion processing unit that adjusts the detection data to improve image quality of the inspection image, when a specific inspection condition which deteriorates the image quality of the inspection image is established, and an inspection processing unit that performs inspection processing for inspecting a quality state of an article, based on inspection image data. When the specific inspection condition is established, the image generation unit generates the inspection image, based on the detection data adjusted by the level conversion processing unit, and the inspection processing unit performs the inspection processing, based on data of the inspection image.
G01N 23/04 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material
G01N 23/083 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
The signal generation apparatus includes a phase difference calculation processing unit that calculates an initial phase difference between a division clock or an external clock selected by a clock selection unit and an initial value of the phase of the toggle pattern based on a relationship between the voltage value acquired by the phase acquisition processing unit and a change amount from the initial value of the phase of the toggle pattern, and a phase shift processing unit that moves the phase of the toggle pattern from the initial value by the initial phase difference such that a phase difference between the division clock or the external clock selected by the clock selection unit and the toggle pattern is within a predetermined range.
H04L 25/49 - Transmitting circuitsReceiving circuits using code conversion at the transmitterTransmitting circuitsReceiving circuits using predistortionTransmitting circuitsReceiving circuits using insertion of idle bits for obtaining a desired frequency spectrumTransmitting circuitsReceiving circuits using three or more amplitude levels
An X-ray inspection device includes an X-ray detection element that outputs a pulse signal with a peak value corresponding to an energy of an X-ray passing through an inspection region, an X-ray detection unit consisting of a plurality of pixels that detect the number of the pulse signals exceeding a predetermined threshold voltage, among the pulse signals output from the X-ray detection element, a storage unit that stores, for each pixel, a correspondence relationship between a value of a control parameter to cause the number of the pulse signals exceeding the threshold voltage to change and the number of the pulse signals detected by respective pixels, and an output unit that outputs abnormal pixel information based on the correspondence relationship between the value of the control parameter and the number of the pulse signals detected by respective pixels, the correspondence relationship being read out from the storage unit.
G01N 23/083 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
G01N 23/04 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material
71.
MASS ESTIMATION METHOD AND X-RAY INSPECTION APPARATUS
A mass estimation method includes a step of generating X-ray transmission image data for each transmission region of a sample of an inspection object, a step of generating a histogram of pixel values of pixels that are included in N pieces of the X-ray transmission image data of the sample and that correspond to the respective transmission regions, a step of generating a histogram matrix consisting of N row vectors corresponding to N histograms of the sample, a step of using a product of the histogram matrix and a weight vector consisting of a weight coefficient for each pixel value of the N pieces of X-ray transmission image data, to calculate the weight vector that minimizes a variance of the N relative mass estimation values, and a step of estimating mass of the inspection object by using the weight vector.
G01N 23/10 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and measuring the absorption the material being confined in a container, e.g. in luggage X-ray scanners
G01N 23/083 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
72.
X-RAY SHIELDING MATERIAL, X-RAY INSPECTION APPARATUS INCLUDING SAME, AND METHOD OF MANUFACTURING X-RAY SHIELDING MATERIAL
Provided are an X-ray shielding material that is lightweight, easy to be manufactured, and excellent in processability to be able to respond to a complicated shape, an X-ray inspection apparatus including the X-ray shielding material, and a method of manufacturing an X-ray shielding material. The X-ray shielding material is used for an X-ray inspection apparatus and shields X-rays. The X-ray shielding material is configured by a sintered body containing a metal binder and a metal powder of metal having an atomic number that is equal to or larger than an atomic number of the metal binder.
G21F 1/08 - MetalsAlloysCermets, i.e. sintered mixtures of ceramics and metals
G01N 23/10 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and measuring the absorption the material being confined in a container, e.g. in luggage X-ray scanners
73.
X-RAY SHIELDING MATERIAL, X-RAY INSPECTION APPARATUS INCLUDING SAME, AND METHOD OF MANUFACTURING X-RAY SHIELDING MATERIAL
Provided are an X-ray shielding material capable of improving heat dissipation efficiency as compared with the related art, and thus contributing to reduction in size and manufacturing cost of an X-ray inspection apparatus, an X-ray inspection apparatus including the X-ray shielding material, and a method of manufacturing an X-ray shielding material. The X-ray shielding material is used in an X-ray inspection apparatus and shields X-rays, and the X-ray shielding material is configured by a sintered body containing a metal binder formed of metal having a higher thermal conductivity than lead, and a metal powder of metal having predetermined shielding performance against the X-rays.
A spectrum analyzer includes: a spectrum display control unit that displays a graph showing a spectrum characteristic, a frequency marker, and a level marker on a spectrum display screen; an input-enabled state display control unit that displays a frequency indication frame in an input-enabled state, in response to an operation of selecting the frequency marker via a keyboard; and a marker position setting display control unit that receives input of a desired frequency to the frequency indication frame in a case of the input-enabled state, changes a position of the frequency marker on a horizontal axis (frequency axis) to a position of the input frequency, and updates a value of a frequency indicated by the frequency indication frame to a value of the input frequency to display the updated value.
G01R 29/08 - Measuring electromagnetic field characteristics
G06F 3/0484 - Interaction techniques based on graphical user interfaces [GUI] for the control of specific functions or operations, e.g. selecting or manipulating an object, an image or a displayed text element, setting a parameter value or selecting a range
75.
MEASUREMENT SYSTEM AND TIME INFORMATION CORRECTION METHOD THEREOF
A measurement system is capable of improving the accuracy of a time at a low cost with a simple configuration. A measurement device has a 1PPS signal input unit that receives a 1PPS signal generated by an external signal generation device to output to a PTP time control unit, and a PTP time control unit that performs PTP time control by referring to the 1PPS signal, and a control PC which transmits processing delay prospect information to the PTP time control unit together with time information acquired from an NTP server by an operation performed on an operation unit by a user, in which the PTP time control unit corrects the time information received from the control PC while including the processing delay prospect information by referring to the 1PPS signal, and uses the corrected time information as time information of the PTP.
The measurement device that measures the performance of an O-RU constituting a base station of an O-RAN that performs orthogonal frequency division multiplexing radio communication includes: an O-DU Emulator that emulates the O-DU of the base station and transmits IQ packets for DL test to the O-RU through the fronthaul; a power measurement instrument that measures the power per one subcarrier and the total power of all subcarriers that measures the power of the RF signal generated and outputted based on the IQ packet received by the O-RU; a control unit that calculates the IQ power level per one subcarrier in the IQ packet based on the set value of the total IQ power level of all subcarriers in the IQ packet; and a display unit that displays the IQ power level per one subcarrier calculated by the control unit.
There are provided an Ethernet unit that performs transmission and reception of a packet with an O-RU, a time generation unit that generates a base time of a measurement device, a transmission time error insertion unit that inserts an error in a time generated by the time generation unit in a case of inserting a PTP error, and a reception time error insertion unit that inserts an error in a time which is notified by the Ethernet unit in a case of inserting a PTP error, in which the transmission time error insertion unit and the reception time error insertion unit add an error amount while gradually increasing the error amount to an offset value in a case where an offset-attached error addition test is performed, and perform the error addition test in a case where the error amount reaches the offset value.
There is provided an X-ray generator and an X-ray inspection apparatus including the same, which can achieve miniaturization and weight reduction. An X-ray tube that generates X-rays, a high-voltage circuit substrate that applies a high tube voltage to the X-ray tube, and a housing which is filled with an insulating oil and in which the X-ray tube and the high-voltage circuit substrate are accommodated, in which a shielding cover made of a shielding material which shields the X-rays is provided in the housing, the X-ray tube is disposed in the shielding cover, and the high-voltage circuit substrate is attached to an outer bottom surface of the shielding cover.
H05G 1/06 - X-ray tube and at least part of the power supply apparatus being mounted within the same housing
G01N 23/04 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material
G01N 23/083 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
G01N 23/18 - Investigating the presence of defects or foreign matter
An error rate measurement apparatus includes a display unit that displays a setting screen for setting a measurement condition of an error rate of an input signal from a DUT, and a processing unit that calculates a measurement time based on the measurement condition input to the setting screen, in which the setting screen includes a target confidence level input portion for inputting a target confidence level, a transmission rate input portion for inputting a transmission rate, a target error rate input portion for inputting a target error rate, an assumed-number-of-errors input portion for inputting an assumed number of errors during the measurement time, and a measurement time display portion for displaying the measurement time.
There is provided an X-ray inspection apparatus including: an X-ray inspection unit and an inspection processing unit that execute an image process on X-ray transmission image data in a plurality of energy regions to generate an inspection image and inspect an inspection object; a display panel for displaying an inspection result; a display image generation portion for executing an image process on the X-ray transmission image data in the plurality of energy regions to generate a display image as a candidate image in which an image brightness of the inspection object is visually different from an image brightness of the inspection image used in the inspection processing unit; and a display control portion for causing the display panel to display the inspection result and the display image different from the inspection image.
G01N 23/04 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material
G06T 5/50 - Image enhancement or restoration using two or more images, e.g. averaging or subtraction
A test system includes an actual propagation path characteristic calculation unit that calculates estimation characteristics, at analysis target timings, of propagation path characteristics of channels constituting an actual propagation path, a channel model parameter calculation unit that calculates channel model parameters characterizing statistical properties of the estimation characteristics, a simulation propagation path characteristic generation unit that generates simulation propagation path characteristics according to the channel model parameters, a simulation channel capacity calculation unit that calculates a channel capacity of the simulation propagation path characteristics, an actual propagation path channel capacity calculation unit that calculates a channel capacity of the estimation characteristics at some analysis target timings among the analysis target timings, and a channel capacity evaluation unit that calculates an evaluation indicator for evaluating a degree of similarity between the channel capacity of the simulation propagation path characteristics and the channel capacity of the estimation characteristics.
A test system includes an actual propagation path estimation characteristic calculation unit that calculates estimation characteristics, at a plurality of analysis target timings, of propagation path characteristics of an analysis target channel among one or more channels constituting an actual propagation path, and a parameter calculation unit that calculates a maximum Doppler frequency of the analysis target channel, as one of parameters characterizing statistical properties of the estimation characteristics of the propagation path characteristics, in which the parameter calculation unit includes a maximum Doppler frequency estimation unit that estimates a maximum value among the frequencies of frequency components of a quasi-Doppler spectrum of the analysis target channel that have power equal to or higher than specified power, as the maximum Doppler frequency.
The mobile terminal testing device includes a terminal information storage unit that stores information on a mobile terminal to be tested, an information request unit that transmits an RF signal requesting the mobile terminal to transmit UE Capability Information, a data reception unit that outputs the UE Capability Information received from the mobile terminal to a data conversion unit, the data conversion unit that decodes the received UE Capability Information based on a data structure information stored in a data structure information storage unit and generates character string data, the data structure information storage unit that stores the data structure information which defines the data structure of the UE Capability Information, and a character string search unit that searches the character string data generated by the data conversion unit for information necessary for a test.
An analog signal generation device according to the present invention includes a DA converter that adjusts a signal level of a digital signal according to a DAC correction amount and then converts the digital signal into an analog signal, a detector that detects the analog signal and outputs a detection signal, a storage unit that stores a characteristic equation for calculating the DAC correction amount, and a control unit, in which in a case where the differential voltage when the digital signal having a signal level of a predetermined value is input to the DA converter is larger than a threshold value, the control unit calculates a new DAC correction amount based on the differential voltage by using the characteristic equation, and in a case where the differential voltage does not fall within the threshold value, the control unit corrects the characteristic equation.
An object of the present invention is to provide a signal generation device and a signal generation method, the signal generation device having a function of preventing the power of the analog RF signal which is output by the RF converter from exceeding the rating of the RF amplifier and a function of checking whether or not the RF converter and the RF amplifier are connected to each other. According to the present invention, there is provided a signal generation device in which the control performed by the control unit includes adjusting an output of the RF converter based on a detected voltage which is output by the detector, and determining whether or not the RF converter and the RF amplifier are connected to each other based on a change in the detected voltage when the attenuation amount of the variable attenuator is changed.
To provide an X-ray inspection apparatus capable of obtaining a clear transmission image with less noise without reducing a conveyance speed of an inspection object. There is provided an X-ray inspection apparatus in which an X-ray generator and an X-ray detector are disposed to face each other with a conveyance path interposed between the X-ray generator and the X-ray detector, conveyance path through which inspection objects that are sequentially conveyed pass. The X-ray generator and the X-ray detector are configured to move back and forth in a conveyance direction of the inspection object and an opposite direction thereof. The X-ray detector captures an image of the inspection object while the X-ray generator and the X-ray detector moves in the conveyance direction from an image capturing start position to an image capturing end position at a speed equal to the conveyance speed of the inspection object.
G01N 23/04 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material
G01N 23/083 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
90.
X-ray inspection apparatus and X-ray inspection system
To provide an X-ray inspection apparatus capable of obtaining a clear transmission image with less noise without reducing a conveyance speed of an inspection object. There is provided an X-ray inspection apparatus in which an X-ray generator and an X-ray detector are disposed to face each other with a conveyance path interposed between the X-ray generator and the X-ray detector, conveyance path through which inspection objects that are sequentially conveyed pass. The X-ray generator is configured to rotate within a range of a predetermined angle, and the X-ray detector is configured to move back and forth in a conveyance direction of the inspection object and an opposite direction, in conjunction with the rotation of the X-ray generator. A capturing axis from the X-ray generator to the X-ray detector follows the inspection object moving forth in the conveyance direction during at least capturing an image of the inspection object.
G01N 23/083 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
G01N 23/18 - Investigating the presence of defects or foreign matter
91.
Filter bank circuit, spectrum analyzer, signal analyzer, signal generator using the same, and control method for the filter bank circuit
The present invention provides a filter bank circuit capable of measuring or testing a frequency band, a spectrum analyzer, a signal analyzer, a signal generator using the filter bank circuit, and a method for controlling the filter bank circuit. A filter bank circuit 10 includes, for example, a one-pole two-throw changeover switch 20 and filter groups G1 and G2, each of which has m filters. The passbands of the filters included in each filter group do not overlap with each other, and the adjacent passbands of the filters included in all the filter groups overlap with each other.
There are provided a waveform memory 10 that stores waveform data of an arbitrary waveform, a control unit 30 that outputs the waveform data stored in the waveform memory in time-series order at predetermined time intervals, and a waveform signal generation unit 20 that generates a waveform signal by performing digital-analog conversion on the waveform data output under the control of the control unit. A data processing unit 40 that sequentially calculates, when generating a pulse pattern waveform, waveform data in time-series order based on pulse pattern data is further provided, and the control unit outputs the sequentially calculated waveform data at predetermined time intervals from the data processing unit to the waveform signal generation unit, and causes the waveform signal generation unit to generate a waveform signal by performing digital-analog conversion.
There are provided a waveform memory that stores waveform data of an arbitrary waveform, a control unit that outputs the waveform data stored in the waveform memory in time-series order at predetermined time intervals, a waveform signal generation unit that generates a waveform signal by D/A converting the output waveform data, and a data processing unit that sequentially calculates waveform data in time-series order based on pulse pattern data, in which the control unit outputs the sequentially calculated waveform data from the data processing unit to the waveform signal generation unit at predetermined time intervals, and causes the waveform signal generation unit to generate a waveform signal by D/A conversion. The control unit includes a data working unit that executes data working processing on designated pulse pattern data, and generates worked waveform data having a capacity, which is storable in the waveform memory, at a data preparation stage.
In an error detector 4, a symbol mask generation unit 27 generates a mask pattern, an error detection unit 30 detects and counts an error in a portion corresponding to Flit in a PAM4 signal from a device under test W, and a Flit error detection unit 31 detects and counts an FEC symbol error in a portion corresponding to Flit for each ECC group, and determines in which the number of FEC symbol errors exceeds a threshold value to be a Flit error.
H03M 13/00 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes
H03M 13/01 - Coding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes
H03M 13/33 - Synchronisation based on error coding or decoding
95.
Error rate measurement apparatus and error rate measurement method
An operation unit 2 sets a Flit length according to the number of lanes, a mask pattern length and a mask pattern period for masking a portion corresponding to an SKP OS, and a threshold value for Flit error determination. In an error detector 4, a symbol mask generation unit 25 generates a mask pattern, an error detection unit 28 detects and counts an error in the portion corresponding to Flit by dividing the mask pattern at intervals of a Flit length of a PAM4 signal from a device under test, and masking a portion corresponding to the SKP OS with the mask pattern, and a Flit error detection unit 29 detects and counts an FEC symbol error in the portion corresponding to Flit for each ECC group, and determines the ECC group in which the number of FEC symbol errors exceeds a threshold value to be a Flit error.
When a PAM4 signal based on bit string data of the Flit pattern is transmitted from a pattern generator 3 to a device under test in a loopback state, an error detection unit 44 of an error detector 4 detects and counts an error in a portion corresponding to the Flit in the PAM4 signal received from the device under test. A Flit error detection unit 45 detects and counts an FEC symbol error in the portion corresponding to the Flit for each ECC Group, and determines an ECC group in which the number of FEC symbol errors exceeds a threshold value, to be the Flit error.
H03M 13/00 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes
H03M 13/31 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes combining coding for error detection or correction and efficient use of the spectrum
97.
Measurement apparatus and non-psc connection method therefor
The measurement apparatus includes a signal generation unit 11 that generates control data for communicating with a DUT 100 and various data related to measurement, a channel selection control unit 12 that selects one channel to be used from among a plurality of channels supported by the DUT, a wireless communication unit 13 that makes a network connection with the DUT on the channel selected by the channel selection control unit 12, an RF measurement unit 14 that measures transmission and reception characteristics of the DUT on the channel through which the network connection between the wireless communication unit 13 and the DUT are made, and a control unit 16 that automatically makes a connection on PSC, and then transmits a channel switching instruction to the DUT to switch the connection to Non-PSC, when there is a channel connection instruction from a user and the channel is Non-PSC.
To provide a measurement apparatus capable of simplifying a test configuration and reducing cost. A measurement apparatus includes a measurement unit 2 that measures an RF signal received from a DUT 20, a signal generation unit 3 that generates and transmits a test RF signal to be transmitted to the DUT 20, and a 1-PPS signal generation unit 4 that generates a 1-PPS signal for synchronization of transmission/reception timing between the measurement unit 2, the signal generation unit 3, and the DUT 20, and outputs the generated 1-PPS signal to each of the measurement unit 2, the signal generation unit 3, and the DUT 20.
G01S 5/02 - Position-fixing by co-ordinating two or more direction or position-line determinationsPosition-fixing by co-ordinating two or more distance determinations using radio waves
G01R 35/00 - Testing or calibrating of apparatus covered by the other groups of this subclass
The estimation apparatus includes an antenna device that receives beams of a transmission signal transmitted from a base station antenna, as a reception signal at measurement points in a measurement area, a position and azimuth acquisition device that acquires a position and an azimuth of the measurement points at which the antenna device is disposed, a data recording device that records data of the reception signal received by the antenna device disposed at the measurement points, and data of the position and the azimuth of the measurement points acquired by the position and azimuth acquisition device, and a signal processing device that estimates a beam direction and a beam width of the beams from the data of the reception signal and the data of the position and the azimuth of the measurement points, which have been recorded in the data recording device.
