Anritsu Corporation

Japon

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Type PI
        Brevet 360
        Marque 29
Juridiction
        États-Unis 326
        International 62
        Europe 1
Propriétaire / Filiale
[Owner] Anritsu Corporation 385
Anritsu A/S 4
Date
Nouveautés (dernières 4 semaines) 2
2025 janvier (MACJ) 2
2024 décembre 1
2024 novembre 1
2024 octobre 7
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Classe IPC
H04B 17/00 - Surveillance; Tests 50
H04W 24/06 - Réalisation de tests en trafic simulé 50
H04W 24/08 - Réalisation de tests en trafic réel 21
H04B 17/10 - Surveillance; Tests d’émetteurs 18
H04B 17/15 - Tests de performance 18
Voir plus
Classe NICE
09 - Appareils et instruments scientifiques et électriques 27
42 - Services scientifiques, technologiques et industriels, recherche et conception 14
37 - Services de construction; extraction minière; installation et réparation 7
38 - Services de télécommunications 1
Statut
En Instance 69
Enregistré / En vigueur 320
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1.

ERROR RATE MEASUREMENT APPARATUS AND ERROR RATE MEASUREMENT METHOD

      
Numéro d'application 18630484
Statut En instance
Date de dépôt 2024-04-09
Date de la première publication 2025-01-16
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Iwai, Tatsuya
  • Yoshioka, Hironori

Abrégé

An error rate measurement apparatus includes a display unit that displays a setting screen for setting a measurement condition of an error rate of an input signal from a DUT, and a processing unit that calculates a measurement time based on the measurement condition input to the setting screen, in which the setting screen includes a target confidence level input portion for inputting a target confidence level, a transmission rate input portion for inputting a transmission rate, a target error rate input portion for inputting a target error rate, an assumed-number-of-errors input portion for inputting an assumed number of errors during the measurement time, and a measurement time display portion for displaying the measurement time.

Classes IPC  ?

  • G01R 31/317 - Tests de circuits numériques
  • G01R 31/28 - Test de circuits électroniques, p.ex. à l'aide d'un traceur de signaux

2.

ERROR RATE MEASUREMENT APPARATUS AND ERROR RATE MEASUREMENT METHOD

      
Numéro d'application 18631416
Statut En instance
Date de dépôt 2024-04-10
Date de la première publication 2025-01-16
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Yoshioka, Hironori
  • Iwai, Tatsuya

Abrégé

An error rate measurement apparatus includes a provisional confidence level calculation unit that calculates a provisional confidence level CLx by using the sum x, an upper and lower limit value update unit that substitutes the sum x for the variable min_x in a case where the provisional confidence level CLx is equal to or lower than a target confidence level CLs, and substitutes the sum x for the variable max_x in a case where the provisional confidence level CLx is higher than the target confidence level CLs, and a measurement time calculation unit that calculates, in a case where changes in a value of the sum x calculated by the average value calculation unit are converged in a predetermined range, a value obtained by dividing the converged sum x by a product of a data rate and a target error rate ERs, as the measurement time.

Classes IPC  ?

  • G01R 31/317 - Tests de circuits numériques
  • G01R 31/3185 - Reconfiguration pour les essais, p.ex. LSSD, découpage

3.

TEST SYSTEM AND EVALUATION METHOD

      
Numéro d'application 18652071
Statut En instance
Date de dépôt 2024-05-01
Date de la première publication 2024-12-05
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Kobayashi, Takeshi
  • Takizawa, Keisuke
  • Suganuma, Hirofumi
  • Otani, Ikuya

Abrégé

A test system includes an actual propagation path characteristic calculation unit that calculates estimation characteristics, at analysis target timings, of propagation path characteristics of channels constituting an actual propagation path, a channel model parameter calculation unit that calculates channel model parameters characterizing statistical properties of the estimation characteristics, a simulation propagation path characteristic generation unit that generates simulation propagation path characteristics according to the channel model parameters, a simulation channel capacity calculation unit that calculates a channel capacity of the simulation propagation path characteristics, an actual propagation path channel capacity calculation unit that calculates a channel capacity of the estimation characteristics at some analysis target timings among the analysis target timings, and a channel capacity evaluation unit that calculates an evaluation indicator for evaluating a degree of similarity between the channel capacity of the simulation propagation path characteristics and the channel capacity of the estimation characteristics.

Classes IPC  ?

4.

TEST SYSTEM AND MAXIMUM DOPPLER FREQUENCY CALCULATION METHOD

      
Numéro d'application 18652138
Statut En instance
Date de dépôt 2024-05-01
Date de la première publication 2024-11-28
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Kobayashi, Takeshi
  • Takizawa, Keisuke

Abrégé

A test system includes an actual propagation path estimation characteristic calculation unit that calculates estimation characteristics, at a plurality of analysis target timings, of propagation path characteristics of an analysis target channel among one or more channels constituting an actual propagation path, and a parameter calculation unit that calculates a maximum Doppler frequency of the analysis target channel, as one of parameters characterizing statistical properties of the estimation characteristics of the propagation path characteristics, in which the parameter calculation unit includes a maximum Doppler frequency estimation unit that estimates a maximum value among the frequencies of frequency components of a quasi-Doppler spectrum of the analysis target channel that have power equal to or higher than specified power, as the maximum Doppler frequency.

Classes IPC  ?

  • G01R 29/08 - Mesure des caractéristiques du champ électromagnétique
  • H04B 17/00 - Surveillance; Tests

5.

MOBILE TERMINAL TESTING DEVICE AND TERMINAL INFORMATION ANALYSIS METHOD THEREOF

      
Numéro d'application 18630318
Statut En instance
Date de dépôt 2024-04-09
Date de la première publication 2024-10-24
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Yokobori, Kuniyuki

Abrégé

The mobile terminal testing device includes a terminal information storage unit that stores information on a mobile terminal to be tested, an information request unit that transmits an RF signal requesting the mobile terminal to transmit UE Capability Information, a data reception unit that outputs the UE Capability Information received from the mobile terminal to a data conversion unit, the data conversion unit that decodes the received UE Capability Information based on a data structure information stored in a data structure information storage unit and generates character string data, the data structure information storage unit that stores the data structure information which defines the data structure of the UE Capability Information, and a character string search unit that searches the character string data generated by the data conversion unit for information necessary for a test.

Classes IPC  ?

6.

OPTICAL SPECTRUM ANALYZER

      
Numéro d'application 18626486
Statut En instance
Date de dépôt 2024-04-04
Date de la première publication 2024-10-17
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Ueno, Maki
  • Morimoto, Shinji
  • Yoshino, Hajime

Abrégé

Provided is an optical spectrum analyzer capable of stably measuring a spectrum of pulsed light while suppressing a decrease in a sweep speed. An A/D conversion unit 17 has a plurality of inputs to which the outputs of a plurality of amplifiers Amp21 to Amp2m are connected. A control unit 12 selects one of the plurality of amplifiers Amp21 to Amp2m whose output is not saturated based on optical power signals amplified by the plurality of amplifiers Amp21 to Amp2m. The control unit 12 sets an average value of the optical power signals sampled by the A/D conversion unit 17 and amplified by the selected one of the amplifiers Amp21 to Amp2m as the optical power signal of the next wavelength, while sweeping from the previous wavelength to the next wavelength is performed.

Classes IPC  ?

  • G01J 3/28 - Etude du spectre
  • G01J 3/18 - Production du spectre; Monochromateurs en utilisant des éléments diffractants, p.ex. réseaux

7.

MULTIPLEXER, AND SPECTRUM ANALYZER, SIGNAL ANALYZER, AND SIGNAL GENERATION DEVICE USING SAME, AND MULTIPLEXER CONTROL METHOD

      
Numéro d'application 18626532
Statut En instance
Date de dépôt 2024-04-04
Date de la première publication 2024-10-17
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Watanabe, Kenichi
  • Kishi, Yuji

Abrégé

Provided is a multiplexer that can easily vary the passband without switching filters, and is adaptable to high-precision measurement, analysis, and testing of high-frequency signals with a simple and inexpensive structure, and a spectrum analyzer, signal analyzer, and signal generation device using the same, and a multiplexer control method. The multiplexer 10 includes two BPFs 20a1 that are connected in parallel between a hybrid coupler 18a1 and a hybrid coupler 19a1, a BPF 20b1 that is connected to a port P4 of the hybrid coupler 18a1 and has a passband adjacent to a passband of the BPF 20a1, and passband variable means 40a, 40b, and 40c that vary the passbands of the BPFs 20a1 and the hybrid coupler 18a1 within a range of bands forming mutually overlapping bands within a predetermined frequency range.

Classes IPC  ?

  • H01P 5/12 - Dispositifs de couplage présentant au moins trois accès
  • H04L 43/08 - Surveillance ou test en fonction de métriques spécifiques, p.ex. la qualité du service [QoS], la consommation d’énergie ou les paramètres environnementaux

8.

ANALOG SIGNAL GENERATION DEVICE AND CALIBRATION METHOD OF SAME

      
Numéro d'application 18616665
Statut En instance
Date de dépôt 2024-03-26
Date de la première publication 2024-10-10
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Ono, Hirofumi
  • Yamashita, Koji

Abrégé

An analog signal generation device according to the present invention includes a DA converter that adjusts a signal level of a digital signal according to a DAC correction amount and then converts the digital signal into an analog signal, a detector that detects the analog signal and outputs a detection signal, a storage unit that stores a characteristic equation for calculating the DAC correction amount, and a control unit, in which in a case where the differential voltage when the digital signal having a signal level of a predetermined value is input to the DA converter is larger than a threshold value, the control unit calculates a new DAC correction amount based on the differential voltage by using the characteristic equation, and in a case where the differential voltage does not fall within the threshold value, the control unit corrects the characteristic equation.

Classes IPC  ?

  • H03M 1/06 - Compensation ou prévention continue de l'influence indésirable de paramètres physiques
  • H03M 1/10 - Calibrage ou tests

9.

SIGNAL GENERATION DEVICE AND SIGNAL GENERATION METHOD

      
Numéro d'application 18616690
Statut En instance
Date de dépôt 2024-03-26
Date de la première publication 2024-10-10
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Ono, Hirofumi
  • Miyauchi, Naoto
  • Hirakawa, Yasuki

Abrégé

An object of the present invention is to provide a signal generation device and a signal generation method, the signal generation device having a function of preventing the power of the analog RF signal which is output by the RF converter from exceeding the rating of the RF amplifier and a function of checking whether or not the RF converter and the RF amplifier are connected to each other. According to the present invention, there is provided a signal generation device in which the control performed by the control unit includes adjusting an output of the RF converter based on a detected voltage which is output by the detector, and determining whether or not the RF converter and the RF amplifier are connected to each other based on a change in the detected voltage when the attenuation amount of the variable attenuator is changed.

Classes IPC  ?

  • H03F 3/19 - Amplificateurs à haute fréquence, p.ex. amplificateurs radiofréquence comportant uniquement des dispositifs à semi-conducteurs

10.

X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION SYSTEM

      
Numéro d'application 18605269
Statut En instance
Date de dépôt 2024-03-14
Date de la première publication 2024-10-03
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Miyazaki, Itaru
  • Tsujimura, Eiji

Abrégé

To provide an X-ray inspection apparatus capable of obtaining a clear transmission image with less noise without reducing a conveyance speed of an inspection object. There is provided an X-ray inspection apparatus in which an X-ray generator and an X-ray detector are disposed to face each other with a conveyance path interposed between the X-ray generator and the X-ray detector, conveyance path through which inspection objects that are sequentially conveyed pass. The X-ray generator and the X-ray detector are configured to move back and forth in a conveyance direction of the inspection object and an opposite direction thereof. The X-ray detector captures an image of the inspection object while the X-ray generator and the X-ray detector moves in the conveyance direction from an image capturing start position to an image capturing end position at a speed equal to the conveyance speed of the inspection object.

Classes IPC  ?

  • G01N 23/04 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p.ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau et formant des images des matériaux
  • G01N 23/083 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p.ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau et mesurant l'absorption le rayonnement consistant en rayons X

11.

X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION SYSTEM

      
Numéro d'application 18605293
Statut En instance
Date de dépôt 2024-03-14
Date de la première publication 2024-10-03
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Miyazaki, Itaru
  • Tsujimura, Eiji

Abrégé

To provide an X-ray inspection apparatus capable of obtaining a clear transmission image with less noise without reducing a conveyance speed of an inspection object. There is provided an X-ray inspection apparatus in which an X-ray generator and an X-ray detector are disposed to face each other with a conveyance path interposed between the X-ray generator and the X-ray detector, conveyance path through which inspection objects that are sequentially conveyed pass. The X-ray generator is configured to rotate within a range of a predetermined angle, and the X-ray detector is configured to move back and forth in a conveyance direction of the inspection object and an opposite direction, in conjunction with the rotation of the X-ray generator. A capturing axis from the X-ray generator to the X-ray detector follows the inspection object moving forth in the conveyance direction during at least capturing an image of the inspection object.

Classes IPC  ?

  • G01N 23/083 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p.ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau et mesurant l'absorption le rayonnement consistant en rayons X
  • G01N 23/18 - Recherche de la présence de défauts ou de matériaux étrangers

12.

FILTER BANK CIRCUIT, SPECTRUM ANALYZER, SIGNAL ANALYZER, SIGNAL GENERATOR USING THE SAME, AND CONTROL METHOD FOR THE FILTER BANK CIRCUIT

      
Numéro d'application 18402871
Statut En instance
Date de dépôt 2024-01-03
Date de la première publication 2024-09-26
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Kishi, Yuji
  • Watanabe, Kenichi

Abrégé

The present invention provides a filter bank circuit capable of measuring or testing a frequency band, a spectrum analyzer, a signal analyzer, a signal generator using the filter bank circuit, and a method for controlling the filter bank circuit. A filter bank circuit 10 includes, for example, a one-pole two-throw changeover switch 20 and filter groups G1 and G2, each of which has m filters. The passbands of the filters included in each filter group do not overlap with each other, and the adjacent passbands of the filters included in all the filter groups overlap with each other.

Classes IPC  ?

  • G01R 23/163 - Analyse de spectre; Analyse de Fourier adaptées à la mesure dans des circuits comportant des constantes réparties
  • G01R 23/167 - Analyse de spectre; Analyse de Fourier en utilisant des filtres des filtres numériques

13.

ARBITRARY WAVEFORM GENERATION APPARATUS AND ARBITRARY WAVEFORM GENERATION METHOD

      
Numéro d'application 18416161
Statut En instance
Date de dépôt 2024-01-18
Date de la première publication 2024-09-26
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Hosaka, Yasuo
  • Iwai, Tatsuya

Abrégé

There are provided a waveform memory 10 that stores waveform data of an arbitrary waveform, a control unit 30 that outputs the waveform data stored in the waveform memory in time-series order at predetermined time intervals, and a waveform signal generation unit 20 that generates a waveform signal by performing digital-analog conversion on the waveform data output under the control of the control unit. A data processing unit 40 that sequentially calculates, when generating a pulse pattern waveform, waveform data in time-series order based on pulse pattern data is further provided, and the control unit outputs the sequentially calculated waveform data at predetermined time intervals from the data processing unit to the waveform signal generation unit, and causes the waveform signal generation unit to generate a waveform signal by performing digital-analog conversion.

Classes IPC  ?

  • H03K 5/01 - Mise en forme d'impulsions
  • H03M 1/66 - Convertisseurs numériques/analogiques

14.

ARBITRARY WAVEFORM GENERATION APPARATUS AND ARBITRARY WAVEFORM GENERATION METHOD

      
Numéro d'application 18416328
Statut En instance
Date de dépôt 2024-01-18
Date de la première publication 2024-09-26
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Hosaka, Yasuo
  • Onuma, Hiroyuki

Abrégé

There are provided a waveform memory that stores waveform data of an arbitrary waveform, a control unit that outputs the waveform data stored in the waveform memory in time-series order at predetermined time intervals, a waveform signal generation unit that generates a waveform signal by D/A converting the output waveform data, and a data processing unit that sequentially calculates waveform data in time-series order based on pulse pattern data, in which the control unit outputs the sequentially calculated waveform data from the data processing unit to the waveform signal generation unit at predetermined time intervals, and causes the waveform signal generation unit to generate a waveform signal by D/A conversion. The control unit includes a data working unit that executes data working processing on designated pulse pattern data, and generates worked waveform data having a capacity, which is storable in the waveform memory, at a data preparation stage.

Classes IPC  ?

  • G06F 1/02 - Générateurs de fonctions numériques
  • G06F 1/03 - Générateurs de fonctions numériques travaillant, au moins partiellement, par consultation de tables
  • G06F 7/58 - Générateurs de nombres aléatoires ou pseudo-aléatoires

15.

ERROR RATE MEASUREMENT APPARATUS AND ERROR RATE MEASUREMENT METHOD

      
Numéro d'application 18423574
Statut En instance
Date de dépôt 2024-01-26
Date de la première publication 2024-09-26
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Kidokoro, Hisao

Abrégé

In an error detector 4, a symbol mask generation unit 27 generates a mask pattern, an error detection unit 30 detects and counts an error in a portion corresponding to Flit in a PAM4 signal from a device under test W, and a Flit error detection unit 31 detects and counts an FEC symbol error in a portion corresponding to Flit for each ECC group, and determines in which the number of FEC symbol errors exceeds a threshold value to be a Flit error.

Classes IPC  ?

  • H03M 13/01 - Hypothèses de base sur la théorie du codage; Limites de codage; Méthodes d'évaluation de la probabilité d'erreur; Modèles de canaux; Simulation ou test des codes
  • H03M 13/33 - Synchronisation basée sur le codage ou le décodage d'erreurs

16.

ERROR RATE MEASUREMENT APPARATUS AND ERROR RATE MEASUREMENT METHOD

      
Numéro d'application 18423519
Statut En instance
Date de dépôt 2024-01-26
Date de la première publication 2024-09-26
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Kidokoro, Hisao

Abrégé

An operation unit 2 sets a Flit length according to the number of lanes, a mask pattern length and a mask pattern period for masking a portion corresponding to an SKP OS, and a threshold value for Flit error determination. In an error detector 4, a symbol mask generation unit 25 generates a mask pattern, an error detection unit 28 detects and counts an error in the portion corresponding to Flit by dividing the mask pattern at intervals of a Flit length of a PAM4 signal from a device under test, and masking a portion corresponding to the SKP OS with the mask pattern, and a Flit error detection unit 29 detects and counts an FEC symbol error in the portion corresponding to Flit for each ECC group, and determines the ECC group in which the number of FEC symbol errors exceeds a threshold value to be a Flit error.

Classes IPC  ?

  • H04L 1/24 - Tests pour s'assurer du fonctionnement correct
  • H04L 1/00 - Dispositions pour détecter ou empêcher les erreurs dans l'information reçue

17.

ERROR RATE MEASUREMENT APPARATUS AND ERROR RATE MEASUREMENT METHOD

      
Numéro d'application 18426637
Statut En instance
Date de dépôt 2024-01-30
Date de la première publication 2024-09-26
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Kidokoro, Hisao

Abrégé

When a PAM4 signal based on bit string data of the Flit pattern is transmitted from a pattern generator 3 to a device under test in a loopback state, an error detection unit 44 of an error detector 4 detects and counts an error in a portion corresponding to the Flit in the PAM4 signal received from the device under test. A Flit error detection unit 45 detects and counts an FEC symbol error in the portion corresponding to the Flit for each ECC Group, and determines an ECC group in which the number of FEC symbol errors exceeds a threshold value, to be the Flit error.

Classes IPC  ?

  • H03M 13/31 - Codage, décodage ou conversion de code pour détecter ou corriger des erreurs; Hypothèses de base sur la théorie du codage; Limites de codage; Méthodes d'évaluation de la probabilité d'erreur; Modèles de canaux; Simulation ou test des codes combinant le codage pour la détection ou pour la correction d'erreurs avec une utilisation efficace du spectre

18.

MEASUREMENT APPARATUS AND Non-PSC CONNECTION METHOD THEREFOR

      
Numéro d'application 18517571
Statut En instance
Date de dépôt 2023-11-22
Date de la première publication 2024-08-15
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Uda, Yasuko
  • Koike, Kazuyuki

Abrégé

The measurement apparatus includes a signal generation unit 11 that generates control data for communicating with a DUT 100 and various data related to measurement, a channel selection control unit 12 that selects one channel to be used from among a plurality of channels supported by the DUT, a wireless communication unit 13 that makes a network connection with the DUT on the channel selected by the channel selection control unit 12, an RF measurement unit 14 that measures transmission and reception characteristics of the DUT on the channel through which the network connection between the wireless communication unit 13 and the DUT are made, and a control unit 16 that automatically makes a connection on PSC, and then transmits a channel switching instruction to the DUT to switch the connection to Non-PSC, when there is a channel connection instruction from a user and the channel is Non-PSC.

Classes IPC  ?

  • H04W 36/06 - Resélection d'une ressource de communication au point d'accès serveur
  • H04W 72/0453 - Ressources du domaine fréquentiel, p.ex. porteuses dans des AMDF [FDMA]

19.

MEASUREMENT APPARATUS

      
Numéro d'application 18421000
Statut En instance
Date de dépôt 2024-01-24
Date de la première publication 2024-08-08
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Iwase, Takashi
  • Kondo, Yuki
  • Liang, Chunqing

Abrégé

To provide a measurement apparatus capable of simplifying a test configuration and reducing cost. A measurement apparatus includes a measurement unit 2 that measures an RF signal received from a DUT 20, a signal generation unit 3 that generates and transmits a test RF signal to be transmitted to the DUT 20, and a 1-PPS signal generation unit 4 that generates a 1-PPS signal for synchronization of transmission/reception timing between the measurement unit 2, the signal generation unit 3, and the DUT 20, and outputs the generated 1-PPS signal to each of the measurement unit 2, the signal generation unit 3, and the DUT 20.

Classes IPC  ?

  • G01S 5/02 - Localisation par coordination de plusieurs déterminations de direction ou de ligne de position; Localisation par coordination de plusieurs déterminations de distance utilisant les ondes radioélectriques
  • G01R 35/00 - Test ou étalonnage des appareils couverts par les autres groupes de la présente sous-classe

20.

ESTIMATION APPARATUS AND ESTIMATION METHOD

      
Numéro d'application 18392286
Statut En instance
Date de dépôt 2023-12-21
Date de la première publication 2024-07-18
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Mitsui, Tsutomu
  • Suganuma, Hirofumi

Abrégé

The estimation apparatus includes an antenna device that receives beams of a transmission signal transmitted from a base station antenna, as a reception signal at measurement points in a measurement area, a position and azimuth acquisition device that acquires a position and an azimuth of the measurement points at which the antenna device is disposed, a data recording device that records data of the reception signal received by the antenna device disposed at the measurement points, and data of the position and the azimuth of the measurement points acquired by the position and azimuth acquisition device, and a signal processing device that estimates a beam direction and a beam width of the beams from the data of the reception signal and the data of the position and the azimuth of the measurement points, which have been recorded in the data recording device.

Classes IPC  ?

  • G01S 5/04 - Position de source déterminée par plusieurs radiogoniomètres espacés

21.

TestDeck

      
Numéro d'application 1798934
Statut Enregistrée
Date de dépôt 2024-04-26
Date d'enregistrement 2024-04-26
Propriétaire Anritsu Corporation (Japon)
Classes de Nice  ? 42 - Services scientifiques, technologiques et industriels, recherche et conception

Produits et services

Software as a service [SaaS] for electronic measuring instruments.

22.

PRODUCTION MANAGEMENT SYSTEM AND NON-TRANSITORY STORAGE MEDIUM STORING PRODUCTION MANAGEMENT PROGRAM

      
Numéro d'application 18523088
Statut En instance
Date de dépôt 2023-11-29
Date de la première publication 2024-06-20
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Kawamata, Jyunki
  • Koizumi, Koji
  • Fukushima, Hiroshi
  • Amamoto, Kanto

Abrégé

A production management system includes a server device and production line devices that are a weighing scale, a filling machine, a packaging machine, a printing machine, a printing inspection machine, an appearance inspection machine, a weight sorting machine, a metal detector, an X-ray inspection machine, and a caser. Each production line device and the server device are configured to communicate via a network. Each production line device transmits event data regarding a running status and an abnormal state to the server device. The server device displays the running status and the abnormal state of each production line device in a chronological order based on the received event data, and displays the display which is displayed in the chronological order for each production line device, in a direction intersecting a direction along the chronological order, in an order of arranging the production line devices on the production line.

Classes IPC  ?

  • G06Q 10/087 - Gestion d’inventaires ou de stocks, p.ex. exécution des commandes, approvisionnement ou régularisation par rapport aux commandes

23.

MOBILE TERMINAL TESTING DEVICE AND MOBILE TERMINAL TESTING METHOD

      
Numéro d'application 18522811
Statut En instance
Date de dépôt 2023-11-29
Date de la première publication 2024-06-06
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Yamashita, Shusaku
  • Yamasaki, Toru
  • Arayama, Masahiro
  • Yoshito, Akihito

Abrégé

A mobile terminal testing device includes: a pseudo base station unit that simulates a base station communicating with a mobile terminal; a scheduling information setting unit that sets scheduling information for specifying any one of a first carrier and a second carrier used for an uplink from the mobile terminal to the base station, for each slot of the uplink; a base station control unit that controls the pseudo base station unit based on the scheduling information; a first RF measurement unit that measures a first UL signal, which is transmitted from the mobile terminal to the pseudo base station unit using the first carrier, based on the scheduling information; and a second RF measurement unit that measures a second UL signal, which is transmitted from the mobile terminal to the pseudo base station unit using the second carrier, based on the scheduling information.

Classes IPC  ?

  • H04W 24/08 - Réalisation de tests en trafic réel
  • H04L 5/14 - Fonctionnement à double voie utilisant le même type de signal, c. à d. duplex

24.

REMOVED ARTICLE STORAGE BOX AND ARTICLE INSPECTION SYSTEM

      
Numéro d'application 18507531
Statut En instance
Date de dépôt 2023-11-13
Date de la première publication 2024-06-06
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Takata, Osamu
  • Waki, Shinya
  • Kawamata, Jyunki

Abrégé

A removed article storage box having a box-shaped body into which an article to be removed to an outside of a transport path due to a specific inspection result is input includes weight measuring unit for measuring a weight value of the article input into the box-shaped body and for measuring a first measurement value measured at a preset fixed cycle and a second measurement value measured at a time at which a predetermined time elapses after the removal, input determination unit for determining, based on the first and second measurement values, whether or not the article with the specific inspection result is input into the box-shaped body from the transport path within a predetermined time after the removal, and notification output unit for performing a notification output of a storage state of the article in the box-shaped body according to a determination result of the input determination unit.

Classes IPC  ?

  • G01G 19/387 - Appareils ou méthodes de pesée adaptés à des fins particulières non prévues dans les groupes pour peser par combinaison, c. à d. en choisissant une combinaison d'articles dont le poids total ou le nombre est le plus proche d'une valeur désirée
  • B65G 47/46 - Dispositifs pour décharger les objets ou matériaux des transporteurs avec distribution, p.ex. automatique, aux points voulus

25.

CLOCK RECOVERY CIRCUIT, ERROR RATE MEASUREMENT APPARATUS, AND ERROR RATE MEASUREMENT METHOD

      
Numéro d'application 18485814
Statut En instance
Date de dépôt 2023-10-12
Date de la première publication 2024-05-30
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Yamane, Kazuhiro

Abrégé

A clock recovery circuit includes a reference clock generation unit that generates a reference clock subjected to SSC modulation, a clock recovery unit that recovers an SSC modulated clock of a data signal subjected to the SSC modulation in synchronization with the reference clock, and a modulation signal generation unit that generates a modulation signal based on cycle information indicating a cycle of a FM demodulated signal obtained by performing FM demodulation on the SSC modulated clock recovered by the clock recovery unit and slope information indicating a slope of the FM demodulated signal, in which the reference clock generation unit generates the reference clock by performing the SSC modulation on a clock of a VCO with the modulation signal, and feeds back the reference clock subjected to the SSC modulation to the clock recovery unit.

Classes IPC  ?

  • G06F 1/12 - Synchronisation des différents signaux d'horloge
  • H04B 1/7087 - Aspects de la synchronisation de la porteuse

26.

MEASUREMENT APPARATUS AND MEASUREMENT TARGET SETTING METHOD THEREOF

      
Numéro d'application 18482317
Statut En instance
Date de dépôt 2023-10-06
Date de la première publication 2024-05-09
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Uda, Yasuko

Abrégé

A measurement apparatus includes a display unit that displays an image, and a control unit that displays a plurality of resource unit display portions, which are graphic forms indicating resource units disposed in a frequency bandwidth of a channel, on the display unit and allows selection of at least one of the plurality of resource unit display portions, in which the measurement apparatus performs measurement on radio signals transmitted and received by a communication apparatus to measure transmission/reception characteristics of the communication apparatus, and the control unit displays the resource unit display portions differently between a resource unit corresponding to a multiple resource unit of IEEE 802.11be and a resource unit that does not correspond to the IEEE 802.11be, and allows selection of a resource unit as a measurement target by allowing selection of at least one of the plurality of resource unit display portions.

Classes IPC  ?

  • H04W 28/20 - Négociation de la bande passante
  • H04W 48/20 - Sélection d'un point d'accès
  • H04W 72/0453 - Ressources du domaine fréquentiel, p.ex. porteuses dans des AMDF [FDMA]

27.

TESTDECK

      
Numéro de série 79399658
Statut En instance
Date de dépôt 2024-04-26
Propriétaire Anritsu Corporation (Japon)
Classes de Nice  ? 42 - Services scientifiques, technologiques et industriels, recherche et conception

Produits et services

Software as a service [SaaS] for electronic measuring instruments.

28.

ARTICLE INSPECTION SYSTEM

      
Numéro d'application 18478456
Statut En instance
Date de dépôt 2023-09-29
Date de la première publication 2024-04-11
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Asai, Eiji
  • Tsujimura, Eiji
  • Kikuchi, Toshiaki

Abrégé

There is provided an article inspection system including: an additional processing control unit that executes additional processing on an article determined to be defective among inspected articles, according to an inspection result of an article inspection unit, in which the additional processing control unit includes a quality state determination unit that determines which one of a plurality of preset quality states the inspection result corresponds to, and processing request selection means for selecting any one of first processing request information for requesting a working machine to perform first additional processing work by the working machine and second processing request information for requesting second manual additional processing work, according to a determination result of the quality state determination unit.

Classes IPC  ?

  • A22C 17/00 - Autres dispositifs pour le traitement de la viande ou des os
  • A22C 21/00 - Traitement de la volaille

29.

SIGNAL GENERATOR AND EMPHASIS SWITCHING METHOD USING SIGNAL GENERATOR

      
Numéro d'application 18335419
Statut En instance
Date de dépôt 2023-06-15
Date de la première publication 2024-03-07
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Iwai, Tatsuya

Abrégé

There are provided a signal generator capable of flexibly increasing the number of taps while realizing high-speed emphasis switching and an emphasis switching method using the signal generator. A signal generator includes: an emphasis addition circuit including at least one finite impulse response (FIR) filter unit that generates an emphasis waveform pattern by adding an emphasis to a pattern of a pulse amplitude modulation (PAM) signal including multi-values which are two or more values; and a tap value setting unit that switches M tap values C(0), C(−1), . . . , and C(1−M) and sets the M tap values C(0), C(−1), . . . , and C(1−M) to each FIR filter unit according to an emphasis switching request from a DUT 100. The FIR filter unit is configured on an FPGA or an ASIC.

Classes IPC  ?

30.

X-RAY INSPECTION APPARATUS

      
Numéro d'application 18260983
Statut En instance
Date de dépôt 2022-01-06
Date de la première publication 2024-02-29
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Yamazaki, Takeshi
  • Kanai, Takashi

Abrégé

An X-ray inspection apparatus includes: a transportation unit that transports an object through an inspection area; an X-ray generation source; an X-ray detection unit; an image data generation unit that generates image data from an output of the X-ray detection unit; a good or not determination unit that performs quality inspection of the object based on the generated image data and a predetermined criterion; and a control unit that controls the inspection, wherein the control unit switches between an inspection mode and a calibration mode in which calibration data for bringing into uniformity the brightness of the image is generated. The control unit includes a calibration data generation unit that generates calibration data based on image data generated before and after a calibration member is inspected in the calibration mode, and a correction unit that corrects the image data of the object, based on the calibration data.

Classes IPC  ?

  • G01N 23/04 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p.ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau et formant des images des matériaux

31.

ARTICLE CONVEYING DEVICE

      
Numéro d'application 18455225
Statut En instance
Date de dépôt 2023-08-24
Date de la première publication 2024-02-29
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Suzuki, Takashi

Abrégé

A container conveying device includes a contact support portion which comes into contact with one side surface of a container, a star wheel, a contact support portion which comes into contact with the other side surface of the container, and a holding wheel provided to be relatively rotatable with respect to the star wheel. When the container is not located at a container inspection position, the container conveying device conveys the container while maintaining a posture of the container by bringing the contact support portion into contact with the container, and when the container is located at the container inspection position, the container conveying device separates the contact support portion which comes into contact with the surface of the container. The container is released from the contact support portion at the container inspection position while the star wheel is paused.

Classes IPC  ?

  • B65G 47/84 - Roues en forme d'étoiles ou dispositifs à courroies ou chaînes sans fin, les roues ou dispositifs étant dotés d'éléments venant en prise avec les objets

32.

ERROR RATE MEASUREMENT APPARATUS AND ERROR RATE MEASUREMENT METHOD

      
Numéro d'application 18318283
Statut En instance
Date de dépôt 2023-05-16
Date de la première publication 2024-02-08
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Onuma, Hiroyuki

Abrégé

An error rate measurement apparatus includes an operation display unit and a display control unit. Displays a measurement result when the matrix scan function is executed. The display control unit displays a first coefficient value in a selectable manner by tabs of a number corresponding to the Full Swing value, uses each one of combinations of the first coefficient value, each second coefficient value, and each third coefficient value on the selected table as the cell, displays an error count value and the bit error rate for each cell, which are obtained by the matrix scan function on a display screen in a matrix, and identifies and displays the bit error rate for each cell on the display screen according to an error degree.

Classes IPC  ?

  • G06F 11/22 - Détection ou localisation du matériel d'ordinateur défectueux en effectuant des tests pendant les opérations d'attente ou pendant les temps morts, p.ex. essais de mise en route
  • G06F 11/273 - Matériel de test, c. à d. circuits de traitement de signaux de sortie
  • G06F 11/32 - Surveillance du fonctionnement avec indication visuelle du fonctionnement de la machine

33.

ERROR RATE MEASUREMENT APPARATUS AND ERROR RATE MEASUREMENT METHOD

      
Numéro d'application 18318396
Statut En instance
Date de dépôt 2023-05-16
Date de la première publication 2024-02-08
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Onuma, Hiroyuki

Abrégé

An error rate measurement apparatus includes a display control unit, an operation display unit, and a control unit. The display control unit displays a firsts coefficient value in a selectable manner by tabs of a number corresponding to a Full Swing value, performs matrix display on a display screen by using each one of combinations of each second coefficient value and each third coefficient value in the first coefficient value on the selected tab, and displays each coefficient value on the display screen in a three-dimensional bird-eye view by using each second coefficient value and each third coefficient value as a combination of a horizontal direction coordinate axis and a vertical direction coordinate axis and using the first coefficient value as a depth direction coordinate axis. The operation display unit selects a range including at least one cell as a scanning target in the matrix display or a bird-eye display.

Classes IPC  ?

  • G01R 31/317 - Tests de circuits numériques
  • G01R 31/319 - Matériel de test, c. à d. circuits de traitement de signaux de sortie

34.

MOBILE TERMINAL TESTING DEVICE AND METHOD FOR DISPLAYING EVM MEASUREMENT RESULT OF SRS USING SAME

      
Numéro d'application 18308808
Statut En instance
Date de dépôt 2023-04-28
Date de la première publication 2024-02-01
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Inoue, Naoki

Abrégé

To provide a mobile terminal testing device capable of easily referring to an EVM measurement result of an SRS by automatically calculating an allocation position of the SRS. The mobile terminal testing device includes: a pseudo base station unit 2 that transmits and receives an RF signal to and from a mobile terminal 10; a scenario processing unit 3 that transmits notification information to the pseudo base station unit 2 and executes a communication sequence with the mobile terminal 10, based on a scenario of a test; and a control unit 6 that calculates an allocation position of an SRS based on a set parameter, and displays an EVM measurement result such that the allocation position of the SRS is recognized.

Classes IPC  ?

35.

SIGNAL GENERATION DEVICE AND SIGNAL GENERATION METHOD

      
Numéro d'application 18333858
Statut En instance
Date de dépôt 2023-06-13
Date de la première publication 2024-02-01
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Yoshioka, Hironori
  • Iwai, Tatsuya

Abrégé

A signal generation device includes m transceivers, a usage amount determination unit that executes a usage amount determination process that determines the usage amount of the FIFO of each transceiver, and a phase adjustment unit that adjusts the phase of the read clock signal for the FIFO. The signal generation device performs the second usage amount determination process on the condition that the count that the usage amount of the FIFO of each transceiver is determined to be less than the usage amount threshold by the first usage amount determination process consecutively reaches the first determination count, and terminates the adjustment of the phase of the read clock signal on the condition that the count that the usage amount of the FIFO of each transceiver is determined by the second usage amount determination process to be greater than the usage amount threshold consecutively reaches the second determination count.

Classes IPC  ?

  • H04L 7/00 - Dispositions pour synchroniser le récepteur avec l'émetteur
  • H04B 1/04 - Circuits
  • H04L 7/02 - Commande de vitesse ou de phase au moyen des signaux de code reçus, les signaux ne contenant aucune information de synchronisation particulière

36.

MOBILE TERMINAL TESTING DEVICE AND MCS SET VALUE SEARCHING METHOD THEREFOR

      
Numéro d'application 18296053
Statut En instance
Date de dépôt 2023-04-05
Date de la première publication 2024-02-01
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Hosoya, Takahiro

Abrégé

Provided is a mobile terminal testing device that can improve efficiency of test by automatically searching for a set value that satisfies a predetermined condition according to a set parameter. A mobile terminal testing device includes: a pseudo base station unit 2 that transmits and receives an RF signal to and from a mobile terminal 10; a scenario processing unit 3 that causes the pseudo base station unit 2 to transmit notification information or to execute a communication sequence with the mobile terminal 10, based on a scenario of a test; and a control unit 6 that searches for and presents a set value of an MCS that satisfies a predetermined condition according to a parameter set to simulate a base station.

Classes IPC  ?

  • H04W 24/06 - Réalisation de tests en trafic simulé

37.

EVENT DETECTION DEVICE AND EVENT DETECTION METHOD

      
Numéro d'application 18323516
Statut En instance
Date de dépôt 2023-05-25
Date de la première publication 2023-12-14
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Takasu, Ryota
  • Murakami, Taichi

Abrégé

An object of the present disclosure is to improve an SN ratio while maintaining a distance resolution and to accurately detect an event occurrence location. An event detection device according to the present disclosure includes: an OTDR waveform acquisition unit that acquires an OTDR waveform of an optical fiber to be measured; a feature quantity extraction unit that performs wavelet transform on the OTDR waveform and generates a scalogram with each wavelet coefficient as a feature quantity; a peak extraction unit that calculates a noise threshold value from the OTDR waveform, and extracts a peak from the feature quantity on the scalogram based on the noise threshold value to generate a peak graph; and an event identification unit that identifies an event in the optical fiber to be measured from the peak graph.

Classes IPC  ?

  • G01M 11/00 - Test des appareils optiques; Test des structures ou des ouvrages par des méthodes optiques, non prévu ailleurs
  • H04B 10/071 - Dispositions pour la surveillance ou le test de systèmes de transmission; Dispositions pour la mesure des défauts de systèmes de transmission utilisant un signal réfléchi, p.ex. utilisant des réflectomètres optiques temporels [OTDR]

38.

OPTICAL PULSE TEST DEVICE AND OPTICAL PULSE TEST METHOD

      
Numéro d'application 18330044
Statut En instance
Date de dépôt 2023-06-06
Date de la première publication 2023-12-14
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Takasu, Ryota
  • Murakami, Taichi
  • Ishida, Kodai

Abrégé

According to the present disclosure, an optical pulse test device includes an OTDR waveform measurement unit that measures an OTDR waveform with a plurality of pulse widths, an event analysis unit that calculates a level, a loss, and a return loss at a start point of each event, and an analysis result integration unit that calculates a cumulative loss at the start point and an end point of each event from the level, the loss, and the return loss at the start point of each event, determines a pulse width that enables securing of a required SN ratio or more for each of the start point and the end point of each event, integrates the cumulative loss at each of the start point and the end point of each event with the determined pulse width, and sets the integrated cumulative loss as an analysis result.

Classes IPC  ?

  • G01M 11/00 - Test des appareils optiques; Test des structures ou des ouvrages par des méthodes optiques, non prévu ailleurs

39.

LOSS ANALYSIS DEVICE AND LOSS ANALYSIS METHOD

      
Numéro d'application 18332085
Statut En instance
Date de dépôt 2023-06-09
Date de la première publication 2023-12-14
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Takasu, Ryota
  • Murakami, Taichi

Abrégé

An object of the present disclosure is to provide a loss analysis device and a loss analysis method of detecting an event with high reproducibility when an SN ratio is small or when an event interval is short. According to the present disclosure, a loss analysis device includes an OTDR waveform acquisition unit that acquires an OTDR waveform of a measurement target optical fiber, and a calculation unit that performs nonlinear fitting of an event model function to the OTDR waveform and calculates a position of a start point of each event included in the OTDR waveform, a level at the start point of each event, a loss of each event, and a return loss of each event, the event model function using the position, the level, the loss, and the return loss as parameters.

Classes IPC  ?

  • G01D 5/353 - Moyens mécaniques pour le transfert de la grandeur de sortie d'un organe sensible; Moyens pour convertir la grandeur de sortie d'un organe sensible en une autre variable, lorsque la forme ou la nature de l'organe sensible n'imposent pas un moyen de conversion déterminé; Transducteurs non spécialement adaptés à une variable particulière utilisant des moyens optiques, c. à d. utilisant de la lumière infrarouge, visible ou ultraviolette avec atténuation ou obturation complète ou partielle des rayons lumineux les rayons lumineux étant détectés par des cellules photo-électriques en modifiant les caractéristiques de transmission d'une fibre optique

40.

MOBILE TERMINAL TESTING DEVICE AND MOBILE TERMINAL TESTING METHOD

      
Numéro d'application 18297189
Statut En instance
Date de dépôt 2023-04-07
Date de la première publication 2023-11-16
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Wu, Zhihui

Abrégé

A reception sensitivity test control unit 18 provided in a measurement device 1 and configured to execute a reception sensitivity test by repeatedly transmitting and receiving a test signal to a mobile terminal includes a test condition setting unit 18a that initially sets a test condition including an initial step level SL0 and a starting output level OL0 of the test signal at a start of the reception sensitivity test, and an AI prediction test condition change setting unit 18b that sets an AI prediction output level OL01, which is AI-predicted in advance by an AI prediction model based on the test condition set by the test condition setting unit 18a, as a first output level instead of the output level OL0.

Classes IPC  ?

41.

X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION METHOD

      
Numéro d'application 18245200
Statut En instance
Date de dépôt 2021-09-13
Date de la première publication 2023-11-16
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Ishida, Masaru

Abrégé

An X-ray inspection apparatus includes an X-ray generator; an X-ray detector; and a determination unit determining a quality state of an inspection object, based on an X-ray detection signal. The apparatus has an X-ray image storing unit storing a first inspection image, corresponding to the X-ray detection signal outputted from the X-ray detector, whose observation direction is the direction in which the X-rays transmits the inspection object; a pseudo three-dimensional information generation model generating pseudo three-dimensional information regarding a type of object to be learned; and an inspection image generation unit creating a second inspection image regarding the type of object to be learned having an observation direction different from the first inspection image, based on the first inspection image regarding the type of object to be learned. The determination unit performs the determination based on at least the second inspection image created by the inspection image generation unit.

Classes IPC  ?

  • G01N 23/18 - Recherche de la présence de défauts ou de matériaux étrangers

42.

MOBILE TERMINAL TEST APPARATUS AND CONTROL MESSAGE TRANSMISSION METHOD THEREOF

      
Numéro d'application 18052742
Statut En instance
Date de dépôt 2022-11-04
Date de la première publication 2023-11-09
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Morita, Atsuki
  • Kano, Daiki
  • Nakamura, Takumi
  • Arayama, Masahiro
  • Shimakawa, Nobuaki
  • Nakagawa, Daisuke

Abrégé

There is provided a mobile terminal test apparatus capable of efficiently performing a test by collectively processing control messages. There is included a control unit 6 that switches, as a mode for transmitting a control message to a mobile terminal 10, between an Automatic mode in which by a setting of a parameter by a user, the control message is transmitted to the mobile terminal 10 when it becomes necessary to transmit the control message to the mobile terminal 10, and a Manual mode in which change information on the parameter by the setting of the parameter by the user is held, and the control message corresponding to the held change information is transmitted to the mobile terminal 10 when a parameter application instruction is given by the user.

Classes IPC  ?

  • H04W 24/06 - Réalisation de tests en trafic simulé

43.

MOBILE TERMINAL TEST SYSTEM AND MOBILE TERMINAL TEST METHOD

      
Numéro d'application 18186603
Statut En instance
Date de dépôt 2023-03-20
Date de la première publication 2023-10-12
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Kato, Seiya
  • Chinbe, Ryota

Abrégé

There is provided a mobile terminal test system and a mobile terminal test method capable of greatly reducing a time required to a setting of a parameter for a plurality of test cases. A common parameter extraction unit that extracts parameters of the same type among a plurality of parameters included in a plurality of test cases selected by an operation unit as a plurality of common parameters, a display control unit that displays a list of plurality of common parameters extracted by the common parameter extraction unit on a display unit, a common parameter setting unit that collectively sets respective change values input by the operation unit to the plurality of common parameters, and a test execution unit that executes a test of the plurality of test cases by using the plurality of common parameters set by the common parameter setting unit are included.

Classes IPC  ?

  • H04W 24/06 - Réalisation de tests en trafic simulé

44.

MEASUREMENT DEVICE AND MEASUREMENT METHOD

      
Numéro d'application 18163933
Statut En instance
Date de dépôt 2023-02-03
Date de la première publication 2023-10-05
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Kasagi, Takahiro
  • Inoue, Koichi
  • Tanikage, Hiroyuki

Abrégé

A measurement device includes: a display unit that displays information related to a test; a device control unit group that includes a plurality of device control units controlling control target devices of a control target device group, respectively, the control target device group including the control target devices that each simulate the component of the component group, respectively; a measurement target setting unit that sets a component selected from the component group as a measurement target device; a test case creation unit that creates a test case by displaying a use order of device control units to be used for the test of the measurement target device among the device control unit group on the display unit in a user-settable manner; and a test case execution unit that executes the test case as to the device control units to be used for the test in the set use order.

Classes IPC  ?

  • H04W 24/08 - Réalisation de tests en trafic réel
  • H04W 80/04 - Protocoles de couche réseau, p.ex. protocole Internet mobile [IP Internet Protocol]

45.

Signal generation apparatus, level correction value calculation system, and level correction value calculation method

      
Numéro d'application 18069401
Numéro de brevet 12074580
Statut Délivré - en vigueur
Date de dépôt 2022-12-21
Date de la première publication 2023-09-28
Date d'octroi 2024-08-27
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Ono, Hirofumi
  • Yamashita, Koji
  • Ito, Shinichi

Abrégé

A signal generation unit 2, a DA converter 3, variable attenuators 40, 42, 44, and 46, a measurement unit 6 that detects a level of the signal attenuated by the variable attenuators 40, 42, 44, and 46 and passed through one or more semiconductor components, a switch 48 that switches between an Internal path through which the signal attenuated by the variable attenuator 40, 42, 44, and 46 is transmitted to the measurement unit 6 and an External path through which the signal attenuated by the variable attenuator 40, 42, 44, and 46 is output from an output terminal 10, and a control unit 7 that obtains a correction value of an attenuation amount of the variable attenuators 40, 42, and 44 with the Internal path and obtains a correction value of an attenuation amount of the variable attenuator 46 with the External path.

Classes IPC  ?

  • H03G 1/00 - RÉGLAGE DE L'AMPLIFICATION - Détails des dispositions pour le réglage de l'amplification
  • H03H 7/25 - Affaiblisseurs indépendants de la fréquence comprenant un élément commandé par une variable électrique ou magnétique

46.

MOBILE TERMINAL TEST APPARATUS AND POSITION CORRECTION METHOD OF MOBILE TERMINAL

      
Numéro d'application 18187054
Statut En instance
Date de dépôt 2023-03-21
Date de la première publication 2023-09-28
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Osone, Dan
  • Chinbe, Ryota
  • Kasai, Ryuso

Abrégé

The mobile terminal test apparatus includes a positioner that adjusts a position of UE, a camera that captures an image of a state of the position of the UE controlled by the positioner, and a control unit that sets the position of the positioner with data on a Peak point of a transmission radio wave in a database, and then compares the current image data of the UE obtained by image capturing of the camera and image data of the Peak point of a transmission radio wave in the database, and displays the current image data of the UE obtained by image capturing of the camera and the image data of the Peak point of the transmission radio wave in the database when an error is greater than a predetermined threshold value.

Classes IPC  ?

  • H04W 24/10 - Planification des comptes-rendus de mesures
  • H04W 24/04 - Configurations pour maintenir l'état de fonctionnement
  • H04W 64/00 - Localisation d'utilisateurs ou de terminaux pour la gestion du réseau, p.ex. gestion de la mobilité

47.

MOBILE TERMINAL TEST SYSTEM AND MOBILE TERMINAL TEST METHOD

      
Numéro d'application 18187232
Statut En instance
Date de dépôt 2023-03-21
Date de la première publication 2023-09-28
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Gao, Wujie
  • Chinbe, Ryota

Abrégé

A parameter calculation unit that calculates, according to one or more input values of a parameter, a value of another parameter, a standard conformance determination unit that determines whether or not the input value of the parameter and the value of the parameter calculated by the parameter calculation unit conform with a 3GPP standard, a parameter adjustment unit that adjusts a value of a parameter, which does not conform with the 3GPP standard, to a value in conformity with the 3GPP standard, and a conformance and nonconformance determination criterion value calculation unit that calculates a conformance and nonconformance determination criterion value of a test case by using at least one of a parameter having a value determined to conform with the 3GPP standard by the standard conformance determination unit and a parameter having a value adjusted by the parameter adjustment unit are included.

Classes IPC  ?

  • H04W 24/00 - Dispositions de supervision, de contrôle ou de test
  • H04W 8/22 - Traitement ou transfert des données du terminal, p.ex. statut ou capacités physiques

48.

ARTICLE INSPECTION VERIFICATION SYSTEM

      
Numéro d'application 18187913
Statut En instance
Date de dépôt 2023-03-22
Date de la première publication 2023-09-28
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Asai, Eiji
  • Kikuchi, Toshiaki
  • Ito, Takamasa
  • Ozawa, Mami
  • Inagaki, Tatsuya

Abrégé

There is provided an article inspection verification system provided in an article inspection line including a plurality of article inspection devices that determine whether an inspection target article is a non-defective product or a defective product. The article inspection verification system includes physical effect generators that generate a physical effect that causes the inspection target article to be determined to be the defective product while the inspection target article passes through inspection sections corresponding each of article inspection devices, and a physical effect control unit that stores generation conditions of the physical effect by the physical effect generators and drives the physical effect generators in accordance with the generation conditions during an operation of the article inspection line.

Classes IPC  ?

  • G01N 35/00 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet
  • G01N 23/083 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p.ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau et mesurant l'absorption le rayonnement consistant en rayons X
  • G01V 3/10 - Prospection ou détection électrique ou magnétique; Mesure des caractéristiques du champ magnétique de la terre, p.ex. de la déclinaison ou de la déviation fonctionnant au moyen de champs magnétiques ou électriques produits ou modifiés par les objets ou les structures géologiques, ou par les dispositifs de détection en utilisant des cadres inducteurs
  • G01N 23/18 - Recherche de la présence de défauts ou de matériaux étrangers
  • B07C 5/18 - Tri selon le poids utilisant un seul mécanisme fixe de pesée
  • B07C 5/344 - Tri en fonction d'autres propriétés particulières selon les propriétés électriques ou magnétiques
  • B07C 5/34 - Tri en fonction d'autres propriétés particulières

49.

LOCAL 5G MONITORING SYSTEM USING WIRELESS TERMINAL

      
Numéro d'application 18067339
Statut En instance
Date de dépôt 2022-12-16
Date de la première publication 2023-09-14
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Usuba, Mitsuhiro
  • Furuki, Atsushi
  • Fukagawa, Yoshihiro
  • Sasaki, Satoshi

Abrégé

The local 5G monitoring system includes the wireless terminals that measure radio waves from a base station of a local 5G system, a first server device that belongs to the same wireless local area network (wireless LAN) as the wireless terminals, collects measurement data from the wireless terminals, and is connected to the Internet, and a second server device that is connected to the first server device via the Internet, and is configured to be referred to by a user, in which the first server device uses the measurement data from the wireless terminals when installation of the local 5G system is completed, as reference information, and determines and notifies the user that an abnormal state occurs, when the measurement data from the wireless terminals during an operation of the local 5G system exceeds a threshold from the reference information.

Classes IPC  ?

  • H04W 24/08 - Réalisation de tests en trafic réel
  • H04W 24/10 - Planification des comptes-rendus de mesures

50.

LOCAL 5G MONITORING SYSTEM

      
Numéro d'application 18068810
Statut En instance
Date de dépôt 2022-12-20
Date de la première publication 2023-09-14
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Usuba, Mitsuhiro
  • Furuki, Atsushi
  • Fukagawa, Yoshihiro
  • Sasaki, Satoshi

Abrégé

The local 5G monitoring system includes a measuring device that measures radio waves from a base station of a local 5G system, wireless terminals, a first server device that belongs to the same wireless local area network (wireless LAN) as the measuring device and the wireless terminals, collects measurement data from the wireless terminals, belongs to the same local area network (LAN) as the measuring device, and is connected to the Internet, and a second server device that is connected to the first server device via the Internet, and is configured to be referred to by a user, in which the first server device uses the measurement data when installation of the local 5G system is completed, as reference information, and determines and notifies the user that an abnormal state occurs, when the measurement data during an operation of the local 5G system exceeds a threshold from the reference information.

Classes IPC  ?

  • H04W 24/08 - Réalisation de tests en trafic réel
  • H04W 24/10 - Planification des comptes-rendus de mesures

51.

LOCAL 5G MONITORING SYSTEM AND MEASUREMENT DATA PROVIDING METHOD THEREOF

      
Numéro d'application 18068850
Statut En instance
Date de dépôt 2022-12-20
Date de la première publication 2023-09-14
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Usuba, Mitsuhiro
  • Furuki, Atsushi
  • Fukagawa, Yoshihiro
  • Sasaki, Satoshi

Abrégé

The local 5G monitoring system includes measuring devices that measure radio waves from a base station of the local 5G system, a first server device that belongs to the same local area network (LAN) as the measuring devices, and collects measurement data from the measuring devices, and a second server device that is connected to the first server device via the Internet, and is configured to be referred to by a user, in which the first server device uses the measurement data from the measuring devices when installation of the local 5G system is completed, as reference information, and determines and notifies the user that an abnormal state occurs, when the measurement data from the measuring devices during an operation of the local 5G system exceeds a threshold from the reference information.

Classes IPC  ?

  • H04W 24/08 - Réalisation de tests en trafic réel
  • H04W 24/10 - Planification des comptes-rendus de mesures

52.

LOCAL 5G MONITORING SYSTEM AND ABNORMAL STATE DETECTION METHOD THEREOF

      
Numéro d'application 18067200
Statut En instance
Date de dépôt 2022-12-16
Date de la première publication 2023-09-14
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Usuba, Mitsuhiro
  • Furuki, Atsushi
  • Fukagawa, Yoshihiro
  • Sasaki, Satoshi

Abrégé

The local 5G monitoring system includes measuring devices that measure radio waves from a base station of a local 5G system, and a server device that collects measurement data from the measuring devices, in which the server device uses the measurement data from the measuring devices when installation of the local 5G system is completed, as reference information, and determines that an abnormal state occurs, when the measurement data from the measuring devices during an operation of the local 5G system exceeds a threshold from the reference information.

Classes IPC  ?

  • H04W 24/08 - Réalisation de tests en trafic réel
  • H04W 16/18 - Outils de planification de réseau

53.

LOCAL 5G MONITORING SYSTEM AND STATE DISPLAY METHOD THEREOF

      
Numéro d'application 18068893
Statut En instance
Date de dépôt 2022-12-20
Date de la première publication 2023-09-14
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Usuba, Mitsuhiro
  • Furuki, Atsushi
  • Fukagawa, Yoshihiro
  • Sasaki, Satoshi

Abrégé

The local 5G monitoring system includes measuring devices that measure radio waves from a base station of the local 5G system, and a server device that belongs to the same local area network (LAN) as the measuring devices, or is connected to the Internet, and collects measurement data from the measuring devices, in which the server device generates, based on the measurement data measured by the measuring devices at predetermined time intervals, a heat map showing a distribution of states of the measurement data, and displays the heat map at a time designated by a user, from the generated heat map.

Classes IPC  ?

  • H04L 43/045 - Traitement des données de surveillance capturées, p.ex. pour la génération de fichiers journaux pour la visualisation graphique des données de surveillance

54.

INSPECTION DEVICE, LEARNED MODEL GENERATION METHOD, AND INSPECTION METHOD

      
Numéro d'application 18160778
Statut En instance
Date de dépôt 2023-01-27
Date de la première publication 2023-08-10
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Tsunoda, Koetsu
  • Yamazaki, Takeshi

Abrégé

To improve accuracy of inspecting a quality state of an inspection object. An inspection device 1 includes: an image storage unit 21 that captures a plurality of images having different input channels for an inspection object W under an imaging condition corresponding to each input channel, and stores multiple inspection images obtained by the capturing and combining the plurality of images of the inspection object W; and a determination unit 24 that obtains a defective quality degree for the multiple inspection images stored in the image storage unit 21 based on a learned model 22 created in advance by learning using an image having a same imaging condition as the multiple inspection images, and determines a quality state of the inspection object W by comparison between the defective quality degree and a preset threshold.

Classes IPC  ?

  • G06T 7/00 - Analyse d'image
  • G01N 23/18 - Recherche de la présence de défauts ou de matériaux étrangers
  • G01N 23/083 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p.ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau et mesurant l'absorption le rayonnement consistant en rayons X

55.

RADIO TERMINAL TEST APPARATUS AND RADIO TERMINAL TEST METHOD

      
Numéro d'application 18154979
Statut En instance
Date de dépôt 2023-01-16
Date de la première publication 2023-08-10
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Ikebe, Takasumi
  • Hikino, Nozomu

Abrégé

A radio terminal test apparatus that tests radio communication performance of a radio terminal, the apparatus including: a radio signal processing unit that performs measurement processing on a radio signal transmitted from the radio terminal and acquires measurement data; a communication control unit that transmits and receives data to and from the radio signal processing unit; and a bus that connects the radio signal processing unit and the communication control unit. The radio signal processing unit includes a division determination unit that determines necessity of division of the measurement data, and, when the division determination unit determines that the measurement data needs to be divided, the measurement data is divided, and divided pieces of the measurement data are division-transmitted a plurality of times from the radio signal processing unit to the communication control unit via the bus.

Classes IPC  ?

56.

INSPECTION DEVICE, LEARNED MODEL GENERATION METHOD, AND INSPECTION METHOD

      
Numéro d'application 18162202
Statut En instance
Date de dépôt 2023-01-31
Date de la première publication 2023-08-10
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Tsunoda, Koetsu
  • Yamazaki, Takeshi

Abrégé

To improve accuracy of inspecting a quality state of an inspection object. An inspection device 1 includes: an image storage unit 21 that stores, as pseudo RGB images, three inspection images for an inspection object W, which have different transmission characteristics and are obtained by capturing a predetermined type of the inspection object W; and a determination unit 24 that obtains a defective quality degree for the pseudo RGB image stored in the image storage unit 21 based on a learned model 22 created in advance by learning using an image having a same format as the pseudo RGB image, and determines a quality state of the inspection object W by comparison between the defective quality degree and a preset threshold.

Classes IPC  ?

  • G06T 7/00 - Analyse d'image
  • G01N 23/04 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p.ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau et formant des images des matériaux
  • G01N 23/083 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p.ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau et mesurant l'absorption le rayonnement consistant en rayons X
  • G01N 23/18 - Recherche de la présence de défauts ou de matériaux étrangers

57.

Signal generation apparatus, level correction value calculation system, and level correction value calculation method

      
Numéro d'application 18069435
Numéro de brevet 12074651
Statut Délivré - en vigueur
Date de dépôt 2022-12-21
Date de la première publication 2023-08-03
Date d'octroi 2024-08-27
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Ono, Hirofumi
  • Yamashita, Koji
  • Ito, Shinichi

Abrégé

A signal generation unit 2, a DA converter 3, variable attenuators 40, 42, 44, and 46 that attenuate an analog signal converted by the DA converter 3, a measurement unit 6 that detects a level of the signal attenuated by the variable attenuators 40, 42, 44, and 46 and passed through one or more semiconductor components, and a control unit 7 that obtains a value of a step error, which is a correction value of an attenuation amount of the variable attenuators 40, 42, 44, and 46 in each of a plurality of steps obtained by dividing a maximum value of the attenuation amount of the variable attenuators 40, 42, 44, and 46 by a variation amount, which is a predetermined attenuation amount are included.

Classes IPC  ?

  • H04B 3/46 - Surveillance; Tests
  • H04B 1/04 - Circuits
  • H04B 17/10 - Surveillance; Tests d’émetteurs
  • H04B 17/13 - Surveillance; Tests d’émetteurs pour l’étalonnage d’amplificateurs de puissance, p.ex. de gain ou de non-linéarité

58.

INSPECTION APPARATUS

      
Numéro d'application 18155310
Statut En instance
Date de dépôt 2023-01-17
Date de la première publication 2023-08-03
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Ishida, Masaru
  • Nakajima, Hiroki
  • Shibukawa, Mikio

Abrégé

To provide an inspection apparatus capable of simultaneously picking up images of one side and the other side of an inspection item with an image pickup device. An inspection apparatus 1 includes a first conveyance unit 31 and a second conveyance unit 32 arranged with a predetermined gap G and inspects a workpiece W when the workpiece W passes over the predetermined gap G. The inspection apparatus 1 includes a first image pickup device 11 provided on one side with the predetermined gap G in a direction intersecting with a conveyance direction of the workpiece W, a second image pickup device 12 provided on the other side, a first light emission device 21 disposed at a position facing the first image pickup device 11, and a second light emission device 22 disposed at a position facing the second image pickup device 12.

Classes IPC  ?

  • H04N 23/90 - Agencement de caméras ou de modules de caméras, p. ex. de plusieurs caméras dans des studios de télévision ou des stades de sport
  • H04N 23/56 - Caméras ou modules de caméras comprenant des capteurs d'images électroniques; Leur commande munis de moyens d'éclairage

59.

ARTICLE ORIENTATION CHANGE DEVICE

      
Numéro d'application 18159849
Statut En instance
Date de dépôt 2023-01-26
Date de la première publication 2023-08-03
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Suzuki, Takashi

Abrégé

An article orientation change device 30 includes a flap 11 is provided so as to be vertically swingable about a swing shaft 13 as a fulcrum, a conveying member 25 that pushes out a tablet W to a predetermined position on the placement surface 11a, and a pressing member 12 that presses the tablet W against the wall portion 1A, in which a tapered surface 25A is provided on a facing surface of the conveying member 25, the conveying member 25 conveys the tablet W to the placement surface 11a to push out the tablet W to the predetermined position in a state where the tablet W maintains the first orientation, and the pressing member 12 moves in a direction approaching the wall portion 1A to change an orientation of the tablet W on the placement surface 11a from the first orientation to a second orientation.

Classes IPC  ?

  • G01N 3/40 - Recherche de la dureté ou de la dureté au rebondissement
  • G01N 3/06 - Adaptations particulières des moyens d'indication ou d'enregistrement

60.

VIDIUS

      
Numéro d'application 018897887
Statut Enregistrée
Date de dépôt 2023-07-06
Date d'enregistrement 2023-12-06
Propriétaire Anritsu A/S (Danemark)
Classes de Nice  ?
  • 09 - Appareils et instruments scientifiques et électriques
  • 38 - Services de télécommunications
  • 42 - Services scientifiques, technologiques et industriels, recherche et conception

Produits et services

Measuring, detecting, monitoring and controlling devices for telecommunications networks; Testing and quality control devices; Software; Software for diagnostics and troubleshooting; Software for network service assurance and network monitoring; Software for network analysis; Software for management of telecommunication network infrastructure.. Telecommunication services; Operation of a telecommunications network; Management of telecommunication network infrastructure; Advice and consultancy in relation to aforementioned.. Cloud computing services; Design and development of software; Consulting in the field of cloud computing networks and applications; Platform as a Service [PaaS], including for network service assurance; Software as a Service [SaaS] including with software for network service assurance; Technical support services relating to computer software; Maintenance of computer software; Providing temporary use of on-line non-downloadable software for network service assurance; Infrastructure as a Service [IaaS] including for network service assurance; Quality assurance services; Monitoring of network systems; Computer analysis services; network analysis services; Troubleshooting of computer hardware, software and network problems; Advice and consultancy in relation to aforementioned..

61.

Signal generation apparatus, level correction value calculation system, and level correction value calculation method

      
Numéro d'application 18069457
Numéro de brevet 11689192
Statut Délivré - en vigueur
Date de dépôt 2022-12-21
Date de la première publication 2023-06-27
Date d'octroi 2023-06-27
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Ono, Hirofumi
  • Yamashita, Koji
  • Ito, Shinichi

Abrégé

A signal generation unit 2, a DA converter 3, variable attenuators 40, 42, 44, and 46 that attenuate the analog signal converted by the DA converter 3, a measurement unit 6 that detects a level of the signal attenuated by the variable attenuators 40, 42, 44, and 46 and passed through one or more semiconductor components, and a control unit 7 that obtains a value of a step error, which is a correction value of an attenuation amount of the variable attenuators 40, 42, 44, and 46 in each of a plurality of steps obtained by dividing a maximum value of the attenuation amount of the variable attenuators 40, 42, 44, and 46 by a variation amount, which is a predetermined attenuation amount are included.

Classes IPC  ?

  • H03K 5/02 - Mise en forme d'impulsions par amplification
  • G01R 19/252 - Dispositions pour procéder aux mesures de courant ou de tension ou pour en indiquer l'existence ou le signe utilisant une méthode de mesure numérique utilisant des convertisseurs analogiques/numériques du type à conversion de la tension ou du courant en fréquence et mesure de cette fréquence
  • H03H 11/24 - Atténuateurs indépendants de la fréquence

62.

MOBILE TERMINAL TEST DEVICE AND PARAMETER SETTING METHOD THEREOF

      
Numéro d'application 18055468
Statut En instance
Date de dépôt 2022-11-15
Date de la première publication 2023-06-22
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Nakagawa, Daisuke
  • Kano, Daiki
  • Nakamura, Takumi
  • Morita, Atsuki
  • Arayama, Masahiro

Abrégé

To provide a mobile terminal test device capable of efficiently performing a test by facilitating switching of parameter settings when switching a simulated base station. The mobile terminal test device includes a control unit 6 that, when a test is performed by simulating a plurality of base stations, retains a parameter common to the plurality of simulated base stations and a parameter individual for each of the plurality of simulated base stations, as the parameters for simulating the base stations, and sets the parameter common to the simulated base stations as it is, and switches and sets the parameter individual for each of the simulated base stations.

Classes IPC  ?

  • H04W 24/06 - Réalisation de tests en trafic simulé
  • H04W 72/04 - Affectation de ressources sans fil

63.

MOBILE TERMINAL TEST APPARATUS AND PARAMETER SETTING METHOD THEREOF

      
Numéro d'application 18062101
Statut En instance
Date de dépôt 2022-12-06
Date de la première publication 2023-06-22
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Shimakawa, Nobuaki
  • Morita, Atsuki
  • Arayama, Masahiro
  • Kano, Daiki
  • Nakagawa, Daisuke
  • Nakamura, Takumi

Abrégé

There is provided a mobile terminal test apparatus capable of easily assigning and setting a frequency of each CC in the same frequency band of carrier aggregation. An operation unit 4 that accepts an operation input from a user, a display unit 5 that displays an image, and a control unit 6 that sets a contiguousness relationship of the plurality of component carriers and sets a predetermined premise parameter of the component carrier, and then automatically sets the parameter of the component carrier defined by a predetermined communication standard, by designating a type of the contiguousness relationship and a predetermined designation parameter are included.

Classes IPC  ?

64.

WAVEGUIDE CONNECTION STRUCTURE, DETERMINATION METHOD THEREOF, MANUFACTURING METHOD THEREOF, AND WAVEGUIDE SWITCH USING SAME

      
Numéro d'application 18055993
Statut En instance
Date de dépôt 2022-11-16
Date de la première publication 2023-06-15
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Takemoto, Yusa
  • Mattori, Shigenori

Abrégé

Provided is a waveguide connection structure 1 in which two waveguides 10 and 20 respectively formed with waveguide paths 11 and 21 face each other, in which a choke groove 25 having a depth corresponding to a leakage prevention target frequency is provided, at the end face 20a of the waveguide 20, in a band-shaped region whose center is a center of the waveguide path 21, and which is bounded by an inner ellipse and an outer ellipse, the minor radius of the outer ellipse is longer than the minor radius of the inner ellipse by a length corresponding, and the choke groove 25 includes two groove portions 25a and 25b that are in contact with the inner ellipse and the outer ellipse and are located on the longer side of the rectangle, in the band-shaped region.

Classes IPC  ?

  • H01P 3/12 - Guides d'ondes creux
  • H01P 1/10 - Dispositifs commutateurs ou interrupteurs
  • H01P 11/00 - Appareils ou procédés spécialement adaptés à la fabrication de guides d'ondes, résonateurs, lignes ou autres dispositifs du type guide d'ondes

65.

Mobile terminal test device and band filter setting method thereof

      
Numéro d'application 18047809
Numéro de brevet 11799566
Statut Délivré - en vigueur
Date de dépôt 2022-10-19
Date de la première publication 2023-05-18
Date d'octroi 2023-10-24
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Arayama, Masahiro
  • Morita, Atsuki
  • Shimakawa, Nobuaki
  • Kano, Daiki
  • Nakagawa, Daisuke
  • Nakamura, Takumi

Abrégé

To provide a mobile terminal test device capable of performing a test with high efficiency by automatically setting a Band filter. A mobile terminal test device includes a simulated base station unit 2 that performs 5G NR communication with a mobile terminal 10 in accordance with the 5G NR standard, a scenario processing unit 3 that reads a stored scenario and causes the simulated base station unit 2 to transmit notification information or execute a communication sequence with the mobile terminal 10, based on the scenario, and a control unit 6 that, when being connected to the mobile terminal 10, sets, as a Band filter, a band set as a communicable frequency band and transmits the set band to the mobile terminal 10.

Classes IPC  ?

66.

MOBILE TERMINAL TESTING SYSTEM

      
Numéro d'application 18048634
Statut En instance
Date de dépôt 2022-10-21
Date de la première publication 2023-05-18
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Kano, Daiki
  • Shimakawa, Nobuaki

Abrégé

According to the present invention, provided is a mobile terminal testing system that can be easily adding or deleting test functions of another communication standard to or from test functions of a predetermined communication standard. A mobile terminal testing system includes a mobile terminal testing device 1 including an LTE measurement unit 12 which transmits and receives a signal to and from a mobile terminal by LTE, and an NR measurement unit 13 which transmits and receives the signal to and from the mobile terminal by NR, and a personal computer device 2 including an LTE interface unit 22 which controls an interface with a user for LTE, and an NR interface unit 23 which controls an interface with the user for NR, in which the LTE interface unit 22 and the LTE measurement unit 12 transmit and receive information via the NR interface unit 23.

Classes IPC  ?

  • H04W 24/06 - Réalisation de tests en trafic simulé

67.

MOBILE TERMINAL TESTING SYSTEM AND PARAMETER SETTING METHOD THEREOF

      
Numéro d'application 18049038
Statut En instance
Date de dépôt 2022-10-24
Date de la première publication 2023-05-18
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Kano, Daiki
  • Shimakawa, Nobuaki

Abrégé

A mobile terminal testing system includes a mobile terminal testing device 1 that includes an LTE measurement unit 12 which transmits and receives a signal to and from a mobile terminal by LTE and an NR measurement unit 13 which transmits and receives the signal to and from the mobile terminal by NR, and a personal computer device 2 that includes an LTE interface unit 22 which controls an interface with a user for LTE and an NR interface unit 23 which controls an interface with the user for NR, in which the LTE interface unit 22 acquires a hardware configuration of the LTE measurement unit 12, and converts and sets a parameter set in the interface with a user into a parameter suitable for the hardware configuration of the LTE measurement unit 12.

Classes IPC  ?

68.

MOBILE TERMINAL TEST DEVICE AND PARAMETER SETTING METHOD THEREOF

      
Numéro d'application 17935660
Statut En instance
Date de dépôt 2022-09-27
Date de la première publication 2023-05-11
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Inoue, Naoki

Abrégé

To provide a mobile terminal test device capable of efficiently testing a mobile terminal compatible with NSA while suppressing a test configuration to be small. A mobile terminal test device includes a first analysis unit 24a and a second analysis unit 24b that analyze a signal received from a mobile terminal, a first port 21a, a second port 21b, a first port 31a, and a second port 31b connected to the mobile terminal, a selection unit 22 that selects the ports to be connected to the first analysis unit 24a and the second analysis unit 24b, and a control unit 6 that performs control such that it is not possible to perform measurement setting for a measurement target of which it is not possible to simultaneously perform measurement, based on the measurement target to be measured by the set first analysis unit 24a and second analysis unit 24b.

Classes IPC  ?

69.

Mobile terminal test device and port connection method thereof

      
Numéro d'application 17934649
Numéro de brevet 12177374
Statut Délivré - en vigueur
Date de dépôt 2022-09-23
Date de la première publication 2023-05-11
Date d'octroi 2024-12-24
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Inoue, Naoki

Abrégé

b, from a connection state between the port and the mobile terminal.

Classes IPC  ?

  • H04B 17/00 - Surveillance; Tests
  • H04B 17/21 - Surveillance; Tests de récepteurs pour la correction des mesures
  • H04M 1/24 - Dispositions pour les tests

70.

ARTICLE INSPECTION APPARATUS AND ARTICLE INSPECTION METHOD

      
Numéro d'application 18045636
Statut En instance
Date de dépôt 2022-10-11
Date de la première publication 2023-04-20
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Takata, Osamu
  • Waki, Shinya

Abrégé

An article inspection apparatus inspects a workpiece W including a plurality of ingredients Wa, Wb, Wc, and Wd by using an inspection image of the workpiece. The article inspection apparatus includes an X-ray image memory 61 that stores information of a predetermined detection value related to the inspection image, a configuration determination unit 53 that determines a material configuration of a content in the workpiece W by performing predetermined recognition processing based on image data of the workpiece W obtained by capturing of the camera 41, and a proposal output unit 54 that, when the configuration determination unit 53 determines the material configuration of the content, estimates detection sensitivity to the predetermined detection value based on information stored in the X-ray image memory 61 and a management sensitivity memory 64, and proposes and outputs a determination criterion for an article inspection.

Classes IPC  ?

71.

Error detection device and error detection method using a pattern signal

      
Numéro d'application 17931237
Numéro de brevet 12007862
Statut Délivré - en vigueur
Date de dépôt 2022-09-12
Date de la première publication 2023-04-13
Date d'octroi 2024-06-11
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Sunayama, Ryo

Abrégé

Provided herein are an error detection device and an error detection method to intuitively identify the reason for a handshake failure. An entire state transition flow including each state based on the communication standard and a state transition condition to be executed between states is displayed as a state transition setting screen, and an immediately preceding state in which the state transition fails and the failed state transition condition are highlighted on the state transition setting screen, when the handshake with the device under test ends.

Classes IPC  ?

  • G06F 11/27 - Tests intégrés
  • G06F 11/22 - Détection ou localisation du matériel d'ordinateur défectueux en effectuant des tests pendant les opérations d'attente ou pendant les temps morts, p.ex. essais de mise en route

72.

Error detection device and error detection method

      
Numéro d'application 17931250
Numéro de brevet 11934282
Statut Délivré - en vigueur
Date de dépôt 2022-09-12
Date de la première publication 2023-04-06
Date d'octroi 2024-03-19
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Sunayama, Ryo

Abrégé

a, and input setting for the state transition condition is possible on the state transition setting screen 11.

Classes IPC  ?

  • G06F 11/27 - Tests intégrés
  • G06F 11/22 - Détection ou localisation du matériel d'ordinateur défectueux en effectuant des tests pendant les opérations d'attente ou pendant les temps morts, p.ex. essais de mise en route

73.

Measurement system and measurement method

      
Numéro d'application 17934016
Numéro de brevet 11965921
Statut Délivré - en vigueur
Date de dépôt 2022-09-21
Date de la première publication 2023-03-30
Date d'octroi 2024-04-23
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Iida, Hiroaki
  • Iwata, Koki
  • Horiuchi, Kayoko

Abrégé

A measurement system and method tests for spurious emissions included in a signal transmitted from a mobile terminal in a shorter time than before. The system includes: a band division unit for dividing the measurement frequency band into a plurality of divided bands; a first spurious measurement control unit which causes a measurement device to measure the spurious emissions of the signal to be measured in each divided band and the peak power of the spear in each divided band; and a first pass/fail determination unit that determines whether or not pass determination criteria is satisfied. The first pass/fail determination unit determines whether the peak power does not exceed the threshold of the pass determination criteria in each divided band. The threshold value of the pass determination criteria is lower than the threshold of the standard determination criteria defined by the 3GPP standard.

Classes IPC  ?

  • G01R 29/08 - Mesure des caractéristiques du champ électromagnétique
  • G01R 23/06 - Dispositions pour procéder à la mesure de fréquences, p.ex. taux de répétition d'impulsions; Dispositions pour procéder à la mesure de la période d'un courant ou d'une tension par conversion de la fréquence en une amplitude de courant ou de tension
  • G01R 23/167 - Analyse de spectre; Analyse de Fourier en utilisant des filtres des filtres numériques
  • H04B 17/17 - Détection de contre-performance ou d’exécution défectueuse, p.ex. déviations de réponse

74.

Error rate measuring apparatus and uncorrectable codeword search method

      
Numéro d'application 17661170
Numéro de brevet 11677418
Statut Délivré - en vigueur
Date de dépôt 2022-04-28
Date de la première publication 2023-03-09
Date d'octroi 2023-06-13
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Onuma, Hiroyuki

Abrégé

An error rate measuring apparatus includes: an operation unit that sets a codeword length, an FEC symbol length, and an FEC symbol error threshold; error counting unit for counting FEC symbol error and an uncorrectable codeword; a display unit that performs display by setting one zone of a display area as one FEC symbol length, matching a zone length of a horizontal axis of the display area with one codeword length, and performing line feed in codeword length units according to presence or absence of the FEC symbol error in FEC symbol length units based on a counting result; search unit for searching for the uncorrectable codeword starting from the cursor on the identification display; and display control unit for performing display control of the cursor at a position of a head error of the searched uncorrectable codeword.

Classes IPC  ?

  • H03M 13/01 - Hypothèses de base sur la théorie du codage; Limites de codage; Méthodes d'évaluation de la probabilité d'erreur; Modèles de canaux; Simulation ou test des codes
  • H03M 13/43 - Décodage par logique majoritaire ou selon le seuil
  • H03M 13/25 - Détection d'erreurs ou correction d'erreurs transmises par codage spatial du signal, c. à d. en ajoutant une redondance dans la constellation du signal, p.ex. modulation codée en treillis [TMC]
  • H03M 13/00 - Codage, décodage ou conversion de code pour détecter ou corriger des erreurs; Hypothèses de base sur la théorie du codage; Limites de codage; Méthodes d'évaluation de la probabilité d'erreur; Modèles de canaux; Simulation ou test des codes

75.

NETWORK MEASUREMENT DEVICE AND NETWORK MEASUREMENT METHOD

      
Numéro d'application 17804384
Statut En instance
Date de dépôt 2022-05-27
Date de la première publication 2023-03-09
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Furuki, Atsushi
  • Seto, Shinichi

Abrégé

A network measurement device includes a display control unit that displays location information stored in a location information table and a setting control unit that sets the location information selected from the displayed location information as positioning start location information of a moving destination, and has a configuration of, after setting the positioning start location information, executing positioning at the moving destination based on reception signal information from a GNSS and measuring a time synchronization error between reference time information acquired from the GNSS and reference time information under test used by an apparatus in a location of the moving destination by comparing the reference time information and the reference time information under test.

Classes IPC  ?

  • H04W 4/029 - Services de gestion ou de suivi basés sur la localisation
  • H04W 24/08 - Réalisation de tests en trafic réel
  • G01S 19/24 - Acquisition ou poursuite des signaux émis par le système

76.

Error rate measuring apparatus and codeword error display method

      
Numéro d'application 17659924
Numéro de brevet 11632131
Statut Délivré - en vigueur
Date de dépôt 2022-04-20
Date de la première publication 2023-03-09
Date d'octroi 2023-04-18
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Onuma, Hiroyuki

Abrégé

An error rate measuring apparatus includes: an operation unit that sets a codeword length, an FEC symbol length, and an FEC symbol error threshold in accordance with a communication standard of a device under test W; error counting means for counting FEC symbol error detected at one FEC symbol interval and an uncorrectable codeword; a display unit that identifies and displays bit string data according to presence or absence of the FEC symbol error in FEC symbol length units based on a counting result; and display control means for performing display control by setting one zone of a display area of identification display as one FEC symbol length, matching a zone length of a horizontal axis of the display area with one codeword length, and performing line feed in codeword length units.

Classes IPC  ?

  • H03M 13/00 - Codage, décodage ou conversion de code pour détecter ou corriger des erreurs; Hypothèses de base sur la théorie du codage; Limites de codage; Méthodes d'évaluation de la probabilité d'erreur; Modèles de canaux; Simulation ou test des codes
  • H03M 13/11 - Détection d'erreurs ou correction d'erreurs transmises par redondance dans la représentation des données, c.à d. mots de code contenant plus de chiffres que les mots source utilisant un codage par blocs, c.à d. un nombre prédéterminé de bits de contrôle ajouté à un nombre prédéterminé de bits d'information utilisant plusieurs bits de parité

77.

MEASUREMENT DEVICE AND MEASUREMENT METHOD

      
Numéro d'application 17664493
Statut En instance
Date de dépôt 2022-05-23
Date de la première publication 2023-03-09
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Furuki, Atsushi
  • Ishizuka, Yasuji
  • Seto, Shinichi

Abrégé

A network measurement device includes a setting control unit that sets, for example, a single GNSS as a transmission source of a signal of a multi-band, a multi-band abnormality detection unit that detects a multi-band reception abnormality based on an existing GNSS antenna receiving a signal in the multi-band transmitted from the GNSS, which is the transmission source, and reception signal information obtained by reception processing in a state in which the network measurement device is connected to the apparatus of a moving destination, for example, a boundary clock, and the existing GNSS antenna is connected to an antenna input terminal, for example, and an alert notification control unit that notifies a user of an alert notification that a multi-band reception abnormality occurs when a multi-band reception abnormality is detected.

Classes IPC  ?

  • H04W 24/10 - Planification des comptes-rendus de mesures
  • H04B 17/15 - Tests de performance
  • H04W 56/00 - Dispositions de synchronisation
  • G01S 19/25 - Acquisition ou poursuite des signaux émis par le système faisant intervenir des données d'assistance reçues en provenance d'un élément coopérant, p.ex. un GPS assisté
  • H04J 3/06 - Dispositions de synchronisation

78.

Article inspection apparatus using spectrum analyzer

      
Numéro d'application 17814034
Numéro de brevet 11860110
Statut Délivré - en vigueur
Date de dépôt 2022-07-21
Date de la première publication 2023-02-02
Date d'octroi 2024-01-02
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Arai, Shigeo
  • Taniguchi, Eiji
  • Suzuki, Takashi

Abrégé

To provide an article inspection apparatus capable of sensitively and stably detecting a change in a spectrum when an unspecified foreign substance is contained and determining a defective product. A transport unit that transports a tablet for inspection to an article inspection position, a light irradiation unit that irradiates the tablet transported to the article inspection position with light, a light detection unit that detects light transmitted through the tablet, and an article inspection unit that inspects a quality of the tablet based on spectral characteristics of the light detected by the light detection unit are provided, and the article inspection unit standardizes a measured value of a spectrum of the light detected by the light detection unit for each wavelength and determines whether the tablet is a normal product or a defective product based on a standardized value.

Classes IPC  ?

  • G01N 21/95 - Recherche de la présence de criques, de défauts ou de souillures caractérisée par le matériau ou la forme de l'objet à analyser
  • G01N 21/84 - Systèmes spécialement adaptés à des applications particulières
  • G01N 21/88 - Recherche de la présence de criques, de défauts ou de souillures

79.

Test apparatus and test method

      
Numéro d'application 17663449
Numéro de brevet 11921140
Statut Délivré - en vigueur
Date de dépôt 2022-05-16
Date de la première publication 2023-02-02
Date d'octroi 2024-03-05
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Maruo, Tomohiko
  • Hasegawa, Hiroshi

Abrégé

b, for measuring the transmission characteristics or the reception characteristics of the DUT, a reflector that reflects a radio signal radiated by the first test antenna and converts the radio signal into a plane wave radio signal, and a movable antenna mechanism 60 that moves a position of the second test antenna such that the radio signal is transmitted to or received from the DUT installed in a far field at a plurality of angles of arrival, with reference to a radio-wave arrival direction from the first test antenna.

Classes IPC  ?

  • G01R 29/10 - Diagrammes de rayonnement d'antennes
  • G01R 29/08 - Mesure des caractéristiques du champ électromagnétique

80.

Receiving device

      
Numéro d'application 17811165
Numéro de brevet 11665042
Statut Délivré - en vigueur
Date de dépôt 2022-07-07
Date de la première publication 2023-01-26
Date d'octroi 2023-05-30
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Morita, Atsuki
  • Isip, Mark Joseph Aquino

Abrégé

Included are a demodulation unit 20 that demodulates a received OFDM modulation signal to acquire a demodulated constellation signal, an ideal constellation signal generation unit 312 that generates an ideal constellation signal from the demodulated constellation signal, a data extraction unit 313 that extracts signal data included in some symbol sections including a known reference symbol, among all symbol sections, from the demodulated constellation signal and the ideal constellation signal, a phase error calculation unit 314 that calculates the phase error of the demodulated constellation signal for the ideal constellation signal, with respect to the extracted signal data, a phase error characteristics estimation unit 315 that estimates the frequency characteristics of the phase error, and a phase error correction unit 316 that corrects the phase error of the demodulated constellation signal, based on the frequency characteristics of the phase error.

Classes IPC  ?

  • H04L 27/34 - Systèmes à courant porteur à modulation de phase et d'amplitude, p.ex. en quadrature d'amplitude
  • H04L 27/26 - Systèmes utilisant des codes à fréquences multiples
  • H04L 5/00 - Dispositions destinées à permettre l'usage multiple de la voie de transmission

81.

Signal generating device and floor noise reduction method therefor

      
Numéro d'application 17807750
Numéro de brevet 12199649
Statut Délivré - en vigueur
Date de dépôt 2022-06-20
Date de la première publication 2023-01-12
Date d'octroi 2025-01-14
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Kaji, Ittetsu
  • Tanaka, Takanori
  • Horiuchi, Kayoko

Abrégé

The signal generating device includes a signal generator that generates a signal of a predetermined frequency, a high-pass filter bank that removes a signal of a frequency lower than or equal to a first frequency lower than a predetermined frequency from the signal generated by the signal generator, a YTF that removes a signal outside a predetermined frequency band from the signal output by the high-pass filter bank, a splitter that distributes the signal output by the YTF into a plurality of signals, two amplifiers that adjust levels of the signals distributed by the splitter, respectively, and two low-pass filter banks that remove signals of frequencies equal to or higher than a second frequency which is higher than the predetermined frequency from each of the signals output by the amplifiers.

Classes IPC  ?

82.

Signal generation apparatus and linearity correction method thereof

      
Numéro d'application 17808165
Numéro de brevet 11909420
Statut Délivré - en vigueur
Date de dépôt 2022-06-22
Date de la première publication 2023-01-05
Date d'octroi 2024-02-20
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Kaji, Ittetsu
  • Horiuchi, Kayoko

Abrégé

There are provided a signal generation unit that generates a predetermined digital signal, a level conversion unit that converts a level of the digital signal generated by the signal generation unit, a DA converter that converts the digital signal of which the level is converted by the level conversion unit into an analog signal in a predetermined intermediate frequency bandwidth, and a control unit that creates correction data for correcting a linearity of a level of an output signal of the DA converter for all frequencies to be used, based on actual data which is data of a level of an actual output signal when a setting of the level of the output signal of the DA converter is changed at a predetermined level interval, at a predetermined frequency, and converts a level of an input signal of the DA converter with the correction data.

Classes IPC  ?

  • H03M 1/00 - Conversion analogique/numérique; Conversion numérique/analogique
  • H03M 3/00 - Conversion de valeurs analogiques en, ou à partir d'une modulation différentielle
  • G01R 35/00 - Test ou étalonnage des appareils couverts par les autres groupes de la présente sous-classe
  • G01R 31/319 - Matériel de test, c. à d. circuits de traitement de signaux de sortie

83.

PRODUCTION MANAGEMENT SYSTEM AND NON-TRANSITORY STORAGE MEDIUM STORING PRODUCTION MANAGEMENT PROGRAM

      
Numéro d'application 17807253
Statut En instance
Date de dépôt 2022-06-16
Date de la première publication 2022-12-29
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Koizumi, Koji
  • Kawamata, Jyunki

Abrégé

A production management system is capable of detecting an abnormal tendency in a production line device forming a production line and finding out a trouble of the production line device at an early stage. The production management system includes a weighing device and a packaging device which are production line devices, an inspection device, and a host computer. The production line devices, the inspection device, and the host computer are configured to communicate with each other via a network. The inspection device transmits inspection result information in the own device to the host computer. The weighing device and the packaging device transmit processing result information in the own devices to the host computer. The host computer detects the abnormal tendency of the production line device based on the inspection result information and/or the processing result information and outputs an alarm.

Classes IPC  ?

  • G05B 19/418 - Commande totale d'usine, c.à d. commande centralisée de plusieurs machines, p.ex. commande numérique directe ou distribuée (DNC), systèmes d'ateliers flexibles (FMS), systèmes de fabrication intégrés (IMS), productique (CIM)

84.

Error rate measuring apparatus and error rate measuring method

      
Numéro d'application 17656502
Numéro de brevet 11977464
Statut Délivré - en vigueur
Date de dépôt 2022-03-25
Date de la première publication 2022-12-15
Date d'octroi 2024-05-07
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Sunayama, Ryo

Abrégé

An error rate measuring apparatus detects a bit error of input data returned from a device under test with transmission of a test signal at an error detector, and includes a log recording unit that records log data of state transition of each lane by handshakes of a plurality of lanes in a predetermined communication standard with respect to the device under test in making the device under test transit to a state of LOOPBACK, and a display unit that displays the recorded log data of the state transition of each lane in a time-series order.

Classes IPC  ?

  • G06F 11/263 - Génération de signaux d'entrée de test, p.ex. vecteurs, formes ou séquences de test
  • G06F 11/07 - Réaction à l'apparition d'un défaut, p.ex. tolérance de certains défauts
  • G06F 11/273 - Matériel de test, c. à d. circuits de traitement de signaux de sortie
  • G06F 11/30 - Surveillance du fonctionnement

85.

X-RAY INSPECTION APPARATUS

      
Numéro d'application 17663874
Statut En instance
Date de dépôt 2022-05-18
Date de la première publication 2022-11-24
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Saito, Naoya
  • Noda, Akihiro
  • Okano, Keishi

Abrégé

There is provided an X-ray inspection apparatus that inspects an inspection object by irradiating the inspection object with X-rays and detecting transmitted X-rays, the apparatus includes a module group (X-ray detection portion) which is disposed inside a housing and in which an electric component that is vulnerable to dew condensation caused by cooling of cooling means is mounted, a humidity sensor that monitors a humidity inside the housing, dehumidifying means (air conditioner) for dehumidifying an inside of the housing, and a control portion that performs supplying of power to the module group when the humidity monitored by the humidity sensor is equal to or lower than a predetermined value.

Classes IPC  ?

  • A61B 6/00 - Appareils pour diagnostic par radiations, p.ex. combinés avec un équipement de thérapie par radiations

86.

PRODUCTION MANAGEMENT SYSTEM AND NON-TRANSITORY STORAGE MEDIUM STORING PRODUCTION MANAGEMENT PROGRAM

      
Numéro d'application 17664068
Statut En instance
Date de dépôt 2022-05-19
Date de la première publication 2022-11-24
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Koizumi, Koji
  • Kawamata, Jyunki

Abrégé

There is provided a production management system capable of grasping a production line device that has caused a decrease in production efficiency and notifying an operator that the production efficiency of the entirety of the production line has decreased. A production line device including a weighing device, a packaging device, an inspection device, and a caser, and a host computer are configured to communicate via a network. In a case where a predetermined event has occurred in each of the production line devices, the production line device transmits event data indicating that the event has occurred, to the host computer. In a case where the host computer determines that production efficiency has decreased, based on the received event data, the host computer specifies the production line device that has caused the decrease in the production efficiency and outputs an alarm indicating that the production efficiency has decreased.

Classes IPC  ?

  • G06Q 50/04 - Fabrication
  • G06Q 10/06 - Ressources, gestion de tâches, des ressources humaines ou de projets; Planification d’entreprise ou d’organisation; Modélisation d’entreprise ou d’organisation

87.

Jitter tolerance measurement apparatus and jitter tolerance measurement method

      
Numéro d'application 17652156
Numéro de brevet 11626944
Statut Délivré - en vigueur
Date de dépôt 2022-02-23
Date de la première publication 2022-10-20
Date d'octroi 2023-04-11
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Iwai, Tatsuya

Abrégé

There are provided a data comparison unit that detects an FEC symbol error of a signal under test output from a DUT in accordance with an input of a jitter signal, an error counting unit that counts the number of detected FEC symbol errors for each codeword for each phase modulation amount, a codeword classification unit that classifies a plurality of codewords included in the signal under test into a plurality of groups based on the counted number of FEC symbol errors, a codeword number counting unit that counts the number of codewords in each group for each phase modulation amount, and a display control unit that controls a display of a first graph having a horizontal axis as the phase modulation amount and a vertical axis as a ratio of the number of codewords in each group, on a display screen.

Classes IPC  ?

  • H04L 1/00 - Dispositions pour détecter ou empêcher les erreurs dans l'information reçue
  • H04L 1/24 - Tests pour s'assurer du fonctionnement correct
  • H04L 41/22 - Dispositions pour la maintenance, l’administration ou la gestion des réseaux de commutation de données, p.ex. des réseaux de commutation de paquets comprenant des interfaces utilisateur graphiques spécialement adaptées [GUI]
  • H04L 1/20 - Dispositions pour détecter ou empêcher les erreurs dans l'information reçue en utilisant un détecteur de la qualité du signal

88.

Optical spectrum analyzer

      
Numéro d'application 17654683
Numéro de brevet 11598669
Statut Délivré - en vigueur
Date de dépôt 2022-03-14
Date de la première publication 2022-09-29
Date d'octroi 2023-03-07
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Morimoto, Shinji
  • Banno, Motohiro
  • Murakami, Taichi

Abrégé

An optical spectrum analyzer is provided that can separate measurement target light into orthogonal polarization components and perform measurement and enable optical spectrum measurement that does not depend on polarization of the measurement target light. Measurement target light is separated into two orthogonal polarization components, the two polarization components whose position is shifted in an engraved line direction of a diffraction grating are incident on the diffraction grating, diffracted light of the two polarization components emitted from the diffraction grating is condensed, and the condensed diffracted light is incident on an incident side end surface of a 2-core ferrule with the two polarization components adjacent to each other.

Classes IPC  ?

  • G01J 3/02 - Spectrométrie; Spectrophotométrie; Monochromateurs; Mesure de la couleur - Parties constitutives
  • G01J 3/18 - Production du spectre; Monochromateurs en utilisant des éléments diffractants, p.ex. réseaux
  • G02B 27/28 - Systèmes ou appareils optiques non prévus dans aucun des groupes , pour polariser

89.

Optical spectrum analyzer and pulse-modulated light measurement method

      
Numéro d'application 17650877
Numéro de brevet 11686617
Statut Délivré - en vigueur
Date de dépôt 2022-02-14
Date de la première publication 2022-09-29
Date d'octroi 2023-06-27
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Murakami, Taichi
  • Yamazaki, Tomohide

Abrégé

Provided are an optical spectrum analyzer and a pulse-modulated light measurement method capable of measuring pulse-modulated light even when a pulse-on time and a pulse period of the pulse-modulated light are unknown. Pulse-modulated light (DUT) is incident on a diffraction grating 3. A first light receiving unit 8 receives the 0th-order light of diffracted light diffracted by the diffraction grating 3. A second light receiving unit 7 receives diffracted light of an order other than the 0th-order light. A measurement timing signal generation unit 9 generates a sampling signal based on the 0th-order light received by the first light receiving unit. The spectrum of the diffracted light received by the second light receiving unit is measured based on the sampling signal generated by the measurement timing signal generation unit.

Classes IPC  ?

  • G01J 3/18 - Production du spectre; Monochromateurs en utilisant des éléments diffractants, p.ex. réseaux
  • G01M 11/00 - Test des appareils optiques; Test des structures ou des ouvrages par des méthodes optiques, non prévu ailleurs
  • G01J 3/02 - Spectrométrie; Spectrophotométrie; Monochromateurs; Mesure de la couleur - Parties constitutives

90.

Signal analysis device and signal analysis result display method

      
Numéro d'application 17560891
Numéro de brevet 12034492
Statut Délivré - en vigueur
Date de dépôt 2021-12-23
Date de la première publication 2022-09-22
Date d'octroi 2024-07-09
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Nitsuma, Yuki
  • Kamisawa, Takaaki

Abrégé

c that displays the analysis results of the plurality of analysis items side by side.

Classes IPC  ?

91.

Signal analysis device and signal analysis result display method

      
Numéro d'application 17565562
Numéro de brevet 12143841
Statut Délivré - en vigueur
Date de dépôt 2021-12-30
Date de la première publication 2022-09-22
Date d'octroi 2024-11-12
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Nitsuma, Yuki
  • Kamisawa, Takaaki

Abrégé

c that displays a distribution of the power of the signal data on a time axis and a frequency axis.

Classes IPC  ?

  • H04W 24/08 - Réalisation de tests en trafic réel
  • H04L 43/045 - Traitement des données de surveillance capturées, p.ex. pour la génération de fichiers journaux pour la visualisation graphique des données de surveillance

92.

DIFFERENTIAL AMPLIFIER WITH VARIABLE FREQUENCY CHARACTERISTICS

      
Numéro d'application JP2022007901
Numéro de publication 2022/186073
Statut Délivré - en vigueur
Date de dépôt 2022-02-25
Date de publication 2022-09-09
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Hirabayashi, Fumihito
  • Kawada, Yumi
  • Kamizono, Takashi

Abrégé

The present invention is provided with a baseband amplifier 100 having an input side differential line and an output side differential line, the baseband amplifier 100 being electrically connected between the two lines, and a peaking amplifier 200 electrically connected between the input side differential line and the output side differential line. The baseband amplifier includes a variable gain differential amplifier 101 able to vary the gain while maintaining a current from a constant current source of a differential circuit constant. An input differential signal is amplified according to a gain frequency characteristic determined by a first frequency characteristic of the baseband amplifier and a second frequency characteristic of the peaking amplifier on the basis of magnitudes and proportions of the gain of the baseband amplifier and the gain of the peaking amplifier, and a frequency characteristic of an output differential signal obtained by the input differential signal being multiplexed while propagating through the output side differential line can be varied by changing the magnitudes and proportions.

Classes IPC  ?

  • H03F 3/189 - Amplificateurs à haute fréquence, p.ex. amplificateurs radiofréquence
  • H03F 3/45 - Amplificateurs différentiels

93.

Error rate measuring apparatus and error distribution display method

      
Numéro d'application 17552608
Numéro de brevet 11714130
Statut Délivré - en vigueur
Date de dépôt 2021-12-16
Date de la première publication 2022-09-08
Date d'octroi 2023-08-01
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Onuma, Hiroyuki

Abrégé

An error rate measuring apparatus that measures whether or not an FEC operation of the device under test is possible based on a comparison result of the signal received from the device under test and a test signal includes an operation unit that sets a codeword length and an FEC symbol length of the FEC corresponding to a communication standard of the device under test, a data comparison unit that compares bit string data obtained by converting the signal received from the device under test with error data to detect an FEC symbol error of each FEC symbol length, a display unit that associates the bit string data of the FEC symbol length as one point with one unit region of a display region and performs color-coding display depending on presence or absence of occurrence of the FEC symbol error by each FEC symbol length.

Classes IPC  ?

  • G01R 31/3177 - Tests de fonctionnement logique, p.ex. au moyen d'analyseurs logiques
  • G01R 31/317 - Tests de circuits numériques
  • G06F 11/10 - Détection ou correction d'erreur par introduction de redondance dans la représentation des données, p.ex. en utilisant des codes de contrôle en ajoutant des chiffres binaires ou des symboles particuliers aux données exprimées suivant un code, p.ex. contrôle de parité, exclusion des 9 ou des 11
  • H04L 25/49 - Circuits d'émission; Circuits de réception à au moins trois niveaux d'amplitude

94.

Metal detection apparatus

      
Numéro d'application 17597058
Numéro de brevet 11762118
Statut Délivré - en vigueur
Date de dépôt 2020-05-19
Date de la première publication 2022-08-25
Date d'octroi 2023-09-19
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Taniguchi, Eiji
  • Nishimura, Chie
  • Hayakawa, Yuki

Abrégé

A metal detection apparatus that can accurately and automatically determine whether a metal passing through the inspection area is a magnetic or non-magnetic metal comprises a detection unit quadrature-detecting a differential detection signal of magnetic field fluctuation in the inspection area due to the passage of a workpiece, and a determination unit that determines the presence or absence of a mixed metal based on both fluctuation components after the detection. The determination unit compares sample signal phase data obtained beforehand from the detection signal of the magnetic field fluctuation in the inspection area due to the passage of various metal samples, with the signal phase data obtained from the detection signal of the magnetic field fluctuation in the inspection area due to the passage of the workpiece mixed with metal, and determines the type of metal passing through the inspection area based on the phase determination result.

Classes IPC  ?

  • G01V 3/10 - Prospection ou détection électrique ou magnétique; Mesure des caractéristiques du champ magnétique de la terre, p.ex. de la déclinaison ou de la déviation fonctionnant au moyen de champs magnétiques ou électriques produits ou modifiés par les objets ou les structures géologiques, ou par les dispositifs de détection en utilisant des cadres inducteurs
  • G01R 33/10 - Tracé par points de la répartition de champ
  • G01V 3/08 - Prospection ou détection électrique ou magnétique; Mesure des caractéristiques du champ magnétique de la terre, p.ex. de la déclinaison ou de la déviation fonctionnant au moyen de champs magnétiques ou électriques produits ou modifiés par les objets ou les structures géologiques, ou par les dispositifs de détection
  • G01V 3/38 - Traitement de données, p.ex. pour l'analyse, pour l'interprétation ou pour la correction
  • G01N 27/72 - Recherche ou analyse des matériaux par l'emploi de moyens électriques, électrochimiques ou magnétiques en recherchant des variables magnétiques

95.

Signal generation apparatus and attenuation amount correction method of signal generation apparatus

      
Numéro d'application 17544122
Numéro de brevet 11609264
Statut Délivré - en vigueur
Date de dépôt 2021-12-07
Date de la première publication 2022-08-18
Date d'octroi 2023-03-21
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Tomisaki, Koichiro
  • Macabasco, Jesse Paulo Valencia

Abrégé

There is provided an attenuation amount setting unit that sets, in a case where signals are simultaneously output from all output ports of a plurality of interface units at the same signal level, one of the plurality of interface units as the reference interface unit, and adds a difference between an attenuation amount of a second attenuator stored in a storage unit of the reference interface unit and an attenuation amount of another second attenuator stored in another storage unit of the other interface unit to an attenuation amount of each of a plurality of third attenuators of the other interface unit to correct the attenuation amount.

Classes IPC  ?

  • G01R 31/28 - Test de circuits électroniques, p.ex. à l'aide d'un traceur de signaux
  • G01R 31/319 - Matériel de test, c. à d. circuits de traitement de signaux de sortie

96.

Spread spectrum clock generator and spread spectrum clock generation method, pulse pattern generator and pulse pattern generation method, and error rate measuring device and error rate measuring method

      
Numéro d'application 17551874
Numéro de brevet 11588479
Statut Délivré - en vigueur
Date de dépôt 2021-12-15
Date de la première publication 2022-08-11
Date d'octroi 2023-02-21
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Iwai, Tatsuya

Abrégé

Provided are a spread spectrum clock generator and a spread spectrum clock generation method, a pulse pattern generator and a pulse pattern generation method, and an error rate measuring device and an error rate measuring method capable of improving usability when adjusting a waveform of a modulation signal during training. A setting screen 60 includes a 0-th frequency shift input unit 71 for arbitrarily setting a frequency shift of a waveform of a modulation signal in a plurality of time sections, a first frequency shift input unit 72, a second frequency shift input unit 73, a third frequency shift input unit 74, and a modulation selection unit 67 for switching a waveform pattern of the modulation signal from a first pattern to a second pattern.

Classes IPC  ?

  • G09G 3/20 - Dispositions ou circuits de commande présentant un intérêt uniquement pour l'affichage utilisant des moyens de visualisation autres que les tubes à rayons cathodiques pour la présentation d'un ensemble de plusieurs caractères, p.ex. d'une page, en composant l'ensemble par combinaison d'éléments individuels disposés en matrice
  • H03K 5/156 - Dispositions dans lesquelles un train d'impulsions est transformé en un train ayant une caractéristique désirée
  • G06F 1/04 - Génération ou distribution de signaux d'horloge ou de signaux dérivés directement de ceux-ci

97.

Temperature test apparatus and temperature test method

      
Numéro d'application 17533710
Numéro de brevet 11994550
Statut Délivré - en vigueur
Date de dépôt 2021-11-23
Date de la première publication 2022-08-11
Date d'octroi 2024-05-28
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Morita, Tomonori

Abrégé

The temperature test apparatus includes an OTA chamber 50 as an anechoic box, a heat insulating housing that is accommodated in the OTA chamber, a temperature control device that controls a temperature in the heat insulating housing, a ventilation block 210 that is made of metal and provided to block an opening 502 formed in the OTA chamber, and in which a plurality of through-holes 214 are formed, a first cover 220 that is provided on an outer side of the OTA chamber to cover the ventilation block, and form a first space 225 with the ventilation block, and is joined to a pipe for air from the temperature control device, and a second cover 250 that is provided on an inner side of the OTA chamber to cover the ventilation block, and form a second space 255 communicating with the heat insulating housing, together with the ventilation block.

Classes IPC  ?

  • G01R 31/10 - Localisation de défauts dans les câbles, les lignes de transmission ou les réseaux en augmentant la destruction à l'endroit du dérangement, p.ex. combustion au moyen d'un générateur d'impulsions appliquant un programme spécial
  • G01R 29/08 - Mesure des caractéristiques du champ électromagnétique
  • G01R 29/10 - Diagrammes de rayonnement d'antennes
  • G01R 31/28 - Test de circuits électroniques, p.ex. à l'aide d'un traceur de signaux

98.

Mobile terminal testing device and mobile terminal testing method

      
Numéro d'application 17544396
Numéro de brevet 11489600
Statut Délivré - en vigueur
Date de dépôt 2021-12-07
Date de la première publication 2022-08-11
Date d'octroi 2022-11-01
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Wu, Zhihui
  • Nakamura, Takumi

Abrégé

d performs a process of setting a next output level for the CC that has not reached the measurement end condition based on the total status, a control is performed to continue a reception sensitivity test until all CCs reach a measurement end condition.

Classes IPC  ?

  • H04B 17/29 - Tests de performance
  • H04B 17/17 - Détection de contre-performance ou d’exécution défectueuse, p.ex. déviations de réponse
  • H04B 17/00 - Surveillance; Tests

99.

TEST OBJECT AND DIAGNOSIS SYSTEM AND GOODS INSPECTION DEVICE USING SUCH OBJECT

      
Numéro d'application 17612069
Statut En instance
Date de dépôt 2020-05-18
Date de la première publication 2022-08-04
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Tamura, Junichi
  • Anzai, Hirotaka
  • Komiyama, Hitoshi

Abrégé

[Problem] [Problem] There is provided a goods inspection device making it possible to make a diagnosis easily for inspection function failure caused by dynamic behavior of goods attributed to a conveyance subsystem of an inspection line. [Problem] There is provided a goods inspection device making it possible to make a diagnosis easily for inspection function failure caused by dynamic behavior of goods attributed to a conveyance subsystem of an inspection line. [Solution] [Problem] There is provided a goods inspection device making it possible to make a diagnosis easily for inspection function failure caused by dynamic behavior of goods attributed to a conveyance subsystem of an inspection line. [Solution] The goods inspection device 1 that inspects goods being carried on an inspection line includes a diagnosis unit 25c that diagnoses a conveyance subsystem of the inspection line, based on data of acceleration and angular velocity obtained with respect to respective axial directions from a test object 2 when the test object 2 having a motion sensor 12 to detect acceleration and angular velocity with respect to respective directions of three-dimensional axes is carried.

Classes IPC  ?

  • B65G 43/00 - Dispositifs de commande, p.ex. de sécurité, d'alarme ou de correction des erreurs
  • G01P 13/00 - Indication ou enregistrement de l'existence ou de l'absence d'un mouvement; Indication ou enregistrement de la direction d'un mouvement
  • G01P 15/18 - Mesure de l'accélération; Mesure de la décélération; Mesure des chocs, c. à d. d'une variation brusque de l'accélération dans plusieurs dimensions
  • G01P 3/00 - Mesure de la vitesse linéaire ou angulaire; Mesure des différences de vitesses linéaires ou angulaires
  • H04W 4/38 - Services spécialement adaptés à des environnements, à des situations ou à des fins spécifiques pour la collecte d’informations de capteurs

100.

Signal generator and a method for controlling the signal generator

      
Numéro d'application 17457972
Numéro de brevet 11762016
Statut Délivré - en vigueur
Date de dépôt 2021-12-07
Date de la première publication 2022-07-28
Date d'octroi 2023-09-19
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Macabasco, Jesse Paulo Valencia
  • Tomisaki, Koichiro

Abrégé

f.

Classes IPC  ?

  • G01R 31/3185 - Reconfiguration pour les essais, p.ex. LSSD, découpage
  • G01R 31/319 - Matériel de test, c. à d. circuits de traitement de signaux de sortie
  • G06F 11/27 - Tests intégrés
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