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2024
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Invention
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Conductive atomic microscope. Disclosed is a conductive atomic microscope in which the current fl... |
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Invention
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Sliding-type white light interferometer. Disclosed is a sliding-type white light interferometer c... |
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Invention
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Conductive atomic force microscope. Disclosed is a conductive atomic force microscope capable of ... |
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Invention
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White light interferometry using sinusoidal interpolation and sinusoidal interpolation method of ... |
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2023
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Invention
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Measuring method for measuring heat distribution of specific space using sthm probe, method and d... |
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2022
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G/S
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Scanning probe microscopes for semiconductor processing; scanning probe microscopes; magnetic mea... |
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2021
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Invention
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Apparatus and method for identifying target position in atomic force microscope.
Provided are an... |
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Invention
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Method and apparatus for identifying sample position in atomic force microscope. An apparatus and... |
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Invention
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Atomic force microscope equipped with optical measurement device and method of acquiring informat... |
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Invention
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Method for measuring, by measurement device, characteristics of surface of object to be measured,... |
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Invention
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Method for measuring characteristics of surface of object to be measured by means of measuring ap... |
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2020
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Invention
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Method for obtaining characteristics of surface to be measured, by using inclined tip, atomic for... |
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Invention
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Chip carrier exchanging device and atomic force microscopy apparatus having same. A chip carrier ... |
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2015
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Invention
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Head limiting movement range of laser spot and atomic force microscope having the same. Provided ... |
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Invention
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Measurement apparatus and method with adaptive scan rate. A measurement method in which a sensing... |
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2014
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Invention
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Image acquiring method and image acquiring apparatus using the same. An image acquiring method fo... |
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|
Invention
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Image acquiring method and image acquiring apparatus using same. The present invention relates to... |
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Invention
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Leveling apparatus and atomic force microscope including the same. The present invention relates ... |
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2010
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Invention
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Scanning probe microscope with drift compensation. A scanning probe microscope compensates for re... |
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Invention
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Scanning probe microscope capable of measuring samples having overhang structure.
A scanning pro... |
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Invention
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Scanning probe microscope capable of measuring samples having overhang structure. A scanning prob... |
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2009
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Invention
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Scanning probe microscope with automatic probe replacement function. An automatic probe exchange ... |
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2007
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Invention
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Scanning probe microscope with automatic probe replacement function. Provided is a scanning probe... |
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|
G/S
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instruments for carrying out microscale and nanoscale measurements and analyses, namely, scanning... |
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G/S
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Biological microscopes; Metallurgical microscopes; Microscopes; Microscopes and parts thereof; Pr... |
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2006
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Invention
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Scanning probe microscope capable of measuring samples having overhang structure. Provided is a s... |
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Invention
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Scanning probe microscope for measuring angle and method of measuring a sample using the same. Pr... |
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Invention
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Scanning capacitance microscope, method of driving the same, and recording medium storing program... |
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2005
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Invention
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Apparatus for and method of driving x-y scanner in scanning probe microscope.
Disclosed is an ap... |
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2004
|
Invention
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Scanning probe microscope with improved probe head mount. A mounting mechanism for the probe head... |
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2003
|
Invention
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Scanning probe microscope with improved probe tip mount. A mounting mechanism for the probe tip o... |
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2002
|
Invention
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Scanning probe microscope with improved scan accuracy, scan speed, and optical vision. A scanning... |
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1998
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Invention
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Method and apparatus for measuring mechanical and electrical characteristics of a surface using e... |
