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2024
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Invention
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Sequenced approach for determining wafer path quality.
Wafer quality is determined by modeling e... |
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Invention
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Use of layout analysis to enable efficient and effective random defect inspection using a vector-... |
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Invention
|
Systems, devices, and methods for performing a non-contact electrical measurement on a cell, non-... |
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Invention
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Systems, devices, and methods for aligning a particle beam and performing a non-contact electrica... |
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2023
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Invention
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Time-series segmentation and anomaly detection.
Detection of data anomalies resulting from maint... |
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Invention
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Time-series segmentation and anomaly detection. Detection of data anomalies resulting from mainte... |
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Invention
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Evaluating a surface microstructure. A method of evaluating the microstructure of a surface, such... |
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Invention
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Evaluating a surface microstructure.
A method of evaluating the microstructure of a surface, suc... |
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Invention
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Wafer bin map based root cause analysis. A template for assigning the most probable root causes f... |
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Invention
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Predicting equipment fail mode from process trace.
A predictive model for equipment fail modes. ... |
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G/S
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Downloadable and recorded computer software and hardware for
use in semiconductor design and man... |
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G/S
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Downloadable and recorded computer software and hardware for use in semiconductor design and manu... |
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2021
|
Invention
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Sequenced approach for determining wafer path quality. Wafer quality is determined by modeling eq... |
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Invention
|
Pattern-enhanced spatial correlation of test structures to die level responses. Enhancement of le... |
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Invention
|
Predicting equipment fail mode from process trace. A predictive model for equipment fail modes. A... |
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Invention
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Automatic window generation for process trace. Automatic definition of windows for trace analysis... |
|
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Invention
|
Rational decision-making tool for semiconductor processes. A robust predictive model. A plurality... |
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Invention
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Abnormal wafer image classification. A semiconductor image classifier. Convolution functions are ... |
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Invention
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Predicting die susceptible to early lifetime failure. Semiconductor yield is modeled at the die l... |
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2020
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Invention
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Machine learning variable selection and root cause discovery by cumulative prediction. A sequence... |
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Invention
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Die level product modeling without die level input data. A machine learning model for each die fo... |
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Invention
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Collaborative learning model for semiconductor applications. Classifying wafers using Collaborati... |
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Invention
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Anomalous equipment trace detection and classification. Scheme for detection and classification o... |
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Invention
|
Methods for performing a non-contact electrical measurement on a cell, chip, wafer, die, or logic... |
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Invention
|
Methods for aligning a particle beam and performing a non-contact electrical measurement on a cel... |
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Invention
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Maintenance scheduling for semiconductor manufacturing equipment. A maintenance tool for semicond... |
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2019
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Invention
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Ic with test structures and e-beam pads embedded within a contiguous standard cell area. An IC th... |
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2018
|
Invention
|
Ic with test structures embedded within a contiguous standard cell area. An IC includes a contigu... |
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G/S
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Computer software for testing communication interfaces on factory production equipment for compli... |
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G/S
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Computer software that monitors, controls, stores, and displays factory manufacturing data |
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Invention
|
Method and apparatus for direct testing and characterization of a three dimensional semiconductor... |
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Invention
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Method for processing a semiconductor wafer using non-contact electrical measurements indicative ... |
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2017
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Invention
|
Snap-to valid pattern system and method. Described is a method for implementing a snap to capabil... |
|
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G/S
|
Software for equipment control and data analytics of
semiconductor design and manufacturing proc... |
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G/S
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Software for managing equipment control and data analytics of semiconductor design and manufactur... |
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G/S
|
Computer software for use in providing automated
characterization and analysis of product chip a... |
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2016
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G/S
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Computer software for use in providing automated characterization and analysis of product chip an... |
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2015
|
G/S
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Software applications for the secure transport of production data and collaboration information f... |
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G/S
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Semiconductor capital equipment, namely, an electron beam inspection and metrology tool |
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2004
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G/S
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Computer software for improving yields amid performance and increasing efficiency, for use in the... |
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G/S
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Computer software for improving yields and performance and increasing efficiency, for use in the ... |
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G/S
|
computer software and hardware providing an automated electrical test system for use in semicondu... |
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G/S
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Custom manufacture for others of semiconductor test chips used in tests to improve yield and perf... |
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G/S
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Consulting, engineering, design and testing services for the manufacture of semiconductors and fo... |
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2002
|
G/S
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SEMICONDUCTOR TEST CHIPS |
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2001
|
G/S
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COMPUTER SOFTWARE FOR IMPROVING YIELDS AND INCREASING EFFICIENCY IN THE MANUFACTURE OF SEMICONDUC... |
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1999
|
G/S
|
FACTORY AUTOMATION SOFTWARE, NAMELY, SOFTWARE THAT COMMUNICATES WITH AND CONTROLS THE MOTION AND ... |
