|
2025
|
Invention
|
Measurement system provided with means for measuring a distance from the semiconductor wafer. A m... |
|
|
Invention
|
Probe card comprising contact elements for high-frequency applications. A probe card for testing ... |
|
|
Invention
|
Probe head with high performance at high frequencies and in terms of electrical conductivity. A p... |
|
|
Invention
|
Probe card having a simplified structure. TEC163BWO - 23 - ABSTRACT A probe card for testing a de... |
|
|
Invention
|
Improved measuring system for electronic devices. It is herein described a measuring system (100)... |
|
|
Invention
|
Contact probe for probe heads of electronic devices and related probe head. It is herein describe... |
|
|
Invention
|
Testing head having improved frequency properties.
A testing head apt to verify the operation of... |
|
|
Invention
|
Probe head with improved heat dissipation capability. A probe head (100) for testing a device und... |
|
|
Invention
|
Measuring system for performing high-voltage tests and related apparatus. A measuring system (100... |
|
2024
|
Invention
|
Test system for performing high voltage tests. A test system (100) for testing a device under tes... |
|
|
Invention
|
Probe head for high voltage tests. It is herein disclosed a probe head (100) for testing a device... |
|
|
Invention
|
Test system for testing electronic devices integrated on a semiconductor wafer. A test system (10... |
|
|
Invention
|
Probe head provided with metallized guide holes. A probe head (100) for testing a device under te... |
|
|
Invention
|
Probe head provided with a plurality of metallizations. A probe head (100) having a plurality of ... |
|
|
Invention
|
Probe card with a guide provided with metallizations. A probe card (100) for testing a device und... |
|
|
Invention
|
Adjustable connector support. The present invention relates to an adjustable connector support (1... |
|
|
Invention
|
A probe head having high frequency performances. A probe head (100) for the testing of electronic... |
|
|
Invention
|
Probe head with an improved configuration. A probe head (100) for the testing of electronic devic... |
|
|
Invention
|
A probe head for the testing of electronic devices having contact probes with improved elastic pr... |
|
|
Invention
|
Probe head with contact probes having an improved configuration. A probe head (100) for the testi... |
|
|
Invention
|
Probe head with improved contact probes. A probe head (100) for the testing of electronic devices... |
|
|
Invention
|
Testing head having improved frequency properties. A testing head apt to verify the operation of ... |
|
2023
|
Invention
|
Probe head comprising a guide with metallizations and method using it. A probe head (20) for test... |
|
|
Invention
|
Probe head with improved cooling system. A probe head (20) for testing a device under test, compr... |
|
|
Invention
|
Probe card for a testing apparatus of electronic devices. A probe card (20) configured to be moun... |
|
|
Invention
|
Probe head with air cooling system. It is herein described a probe head (20) for testing a device... |
|
|
Invention
|
Probe card for a testing apparatus of electronic devices with improved thermal management. A prob... |
|
|
Invention
|
Improved vertical probe head. A probe head (20) for testing devices under test (DUT) integrated o... |
|
|
Invention
|
Probe head for a testing apparatus of electronic devices. It is herein described a probe head (21... |
|
|
Invention
|
Testing head with improved frequency property.
A testing head comprises a plurality of contact p... |
|
|
Invention
|
Improved measurement system for the testing of high-frequency devices. A measurement system (20) ... |
|
|
Invention
|
Probe card for a testing apparatus of electronic devices and corresponding space transformer.
A ... |
|
|
Invention
|
Probe card for a testing apparatus of electronic devices and corresponding space transformer. A p... |
|
|
Invention
|
Probe card with improved temperature control. It is herein described a probe card (20) for the te... |
|
2022
|
Invention
|
Contact probe for probe heads of electronic devices and corresponding probe head.
A contact prob... |
|
|
Invention
|
Contact probe for probe heads of electronic devices and corresponding probe head. It is herein de... |
|
2021
|
Invention
|
Large probe card for testing electronic devices and related manufacturing method.
A method of ma... |
|
|
Invention
|
Large probe head for testing electronic devices and related manufacturing method. A method for ma... |
|
|
Invention
|
Contact probe for probe heads of electronic devices.
A contact probe is disclosed having a first... |
|
|
Invention
|
Flexible membrane adapted to carry high-frequency (rf) power signals and corresponding probe card... |
|
|
Invention
|
Probe head with an improved contact between contact probes and metallized guide holes.
A probe h... |
|
|
Invention
|
Contact element for a probe head for testing high-frequency electronic devices and relating probe... |
|
|
Invention
|
Probe head for testing electronic devices comprising integrated optical elements. A probe head fo... |
|
|
Invention
|
Contact probe for probe heads of electronic devices. A contact probe having a first end portion a... |
|
|
Invention
|
Contact probe for a probe head.
A contact probe for a probe head for test equipment of electroni... |
|
2020
|
Invention
|
Testing head with an improved contact between contact probes and guide holes. A testing head for ... |
|
|
Invention
|
Contact probe for high-frequency applications with improved current capacity. A contact probe hav... |
|
2019
|
G/S
|
Electronic control apparatus; Electronic communications equipment, apparatus for electronic appli... |
|
2008
|
G/S
|
Electronic testing equipment; electronic communications
equipment, apparatus for electronic appl... |
|
|
G/S
|
Test probe electrical contacts and holders therefor, for probing integrated circuits, semiconduct... |
|
2007
|
G/S
|
Electronic testing equipment; electronic communications equipment, apparatus for electronic appli... |
