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2024
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Invention
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Test system for performing high voltage tests. A test system (100) for testing a device under tes... |
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Invention
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Probe head for high voltage tests. It is herein disclosed a probe head (100) for testing a device... |
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Invention
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Test system for testing electronic devices integrated on a semiconductor wafer. A test system (10... |
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Invention
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Probe head provided with metallized guide holes. A probe head (100) for testing a device under te... |
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Invention
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Probe head provided with a plurality of metallizations. A probe head (100) having a plurality of ... |
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Invention
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Probe card with a guide provided with metallizations. A probe card (100) for testing a device und... |
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Invention
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Adjustable connector support. The present invention relates to an adjustable connector support (1... |
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Invention
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A probe head having high frequency performances. A probe head (100) for the testing of electronic... |
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Invention
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Probe head with an improved configuration. A probe head (100) for the testing of electronic devic... |
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Invention
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A probe head for the testing of electronic devices having contact probes with improved elastic pr... |
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Invention
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Probe head with contact probes having an improved configuration. A probe head (100) for the testi... |
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Invention
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Probe head with improved contact probes. A probe head (100) for the testing of electronic devices... |
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Invention
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Testing head having improved frequency properties. A testing head apt to verify the operation of ... |
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2023
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Invention
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Probe head comprising a guide with metallizations and method using it. A probe head (20) for test... |
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Invention
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Probe head with improved cooling system. A probe head (20) for testing a device under test, compr... |
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Invention
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Probe card for a testing apparatus of electronic devices. A probe card (20) configured to be moun... |
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Invention
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Probe head with air cooling system. It is herein described a probe head (20) for testing a device... |
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Invention
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Probe card for a testing apparatus of electronic devices with improved thermal management. A prob... |
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Invention
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Improved vertical probe head. A probe head (20) for testing devices under test (DUT) integrated o... |
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Invention
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Probe head for a testing apparatus of electronic devices. It is herein described a probe head (21... |
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Invention
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Testing head with improved frequency property.
A testing head comprises a plurality of contact p... |
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Invention
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Improved measurement system for the testing of high-frequency devices. A measurement system (20) ... |
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Invention
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Probe card for a testing apparatus of electronic devices and corresponding space transformer. A p... |
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Invention
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Probe card with improved temperature control. It is herein described a probe card (20) for the te... |
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2022
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Invention
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Contact probe for probe heads of electronic devices and corresponding probe head.
A contact prob... |
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Invention
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Contact probe for probe heads of electronic devices and corresponding probe head. It is herein de... |
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Invention
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Manufacturing method for manufacturing contact probes for probe heads of electronic devices and c... |
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Invention
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Vertical probe head.
A probe head adapted to verify the operation of a device to be tested integ... |
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Invention
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Probe head for electronic devices and corresponding probe card. A probe head for a test equipment... |
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2021
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Invention
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Contact probe for probe heads of electronic devices and corresponding probe head. It is herein di... |
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Invention
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Large probe card for testing electronic devices and related manufacturing method.
A method of ma... |
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Invention
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Large probe head for testing electronic devices and related manufacturing method.
A method for m... |
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Invention
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Large probe head for testing electronic devices and related manufacturing method. It is herein di... |
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Invention
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Large probe card for testing electronic devices and related manufacturing method. It is herein di... |
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Invention
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Contact probe for probe heads of electronic devices.
A contact probe is disclosed having a first... |
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Invention
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Contact probe for probe heads of electronic devices. It is herein described a contact probe (20) ... |
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Invention
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Flexible membrane adapted to carry high-frequency (rf) power signals and corresponding probe card... |
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Invention
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Probe head with an improved contact between contact probes and metallized guide holes.
A probe h... |
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Invention
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Improved contact element for a probe head for testing high-frequency electronic devices and relat... |
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Invention
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Probe head with an improved contact between contact probes and metallized guide holes. It is here... |
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Invention
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Probe head for testing electronic devices comprising integrated optical elements.
A probe head f... |
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Invention
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Contact probe for probe heads of electronic devices. A contact probe having a first end portion a... |
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Invention
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Contact probe for a probe head.
A contact probe for a probe head for test equipment of electroni... |
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2020
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Invention
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Testing head with an improved contact between contact probes and guide holes. A testing head for ... |
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Invention
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Probe head for reduced-pitch applications. A probe head for a testing apparatus integrated on a s... |
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Invention
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Contact probe for high-frequency applications with improved current capacity. A contact probe hav... |
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2019
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P/S
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Electronic control apparatus; Electronic communications equipment, apparatus for electronic appli... |
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2008
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P/S
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Electronic testing equipment; electronic communications
equipment, apparatus for electronic appl... |
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P/S
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Test probe electrical contacts and holders therefor, for probing integrated circuits, semiconduct... |
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2007
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P/S
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Electronic testing equipment; electronic communications equipment, apparatus for electronic appli... |
