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2026
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Invention
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Probe head for testing electronic devices comprising integrated optical elements.
A probe head f... |
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2025
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Invention
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Probe card for an apparatus for testing electronic devices with improved thermal control. A probe... |
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Invention
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Test system with temperature monitoring. A test system for testing a device under test integrated... |
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Invention
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Measurement system provided with means for measuring a distance from the semiconductor wafer. A m... |
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Invention
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Probe card comprising contact elements for high-frequency applications. A probe card for testing ... |
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Invention
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Probe head with high performance at high frequencies and in terms of electrical conductivity. A p... |
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Invention
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Probe card having a simplified structure. TEC163BWO - 23 - ABSTRACT A probe card for testing a de... |
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Invention
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Improved measuring system for electronic devices. It is herein described a measuring system (100)... |
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Invention
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Contact probe for probe heads of electronic devices and related probe head. It is herein describe... |
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Invention
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Testing head having improved frequency properties.
A testing head apt to verify the operation of... |
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Invention
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Probe head with improved heat dissipation capability. A probe head (100) for testing a device und... |
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Invention
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Measuring system for performing high-voltage tests and related apparatus. A measuring system (100... |
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2024
|
Invention
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Test system for performing high voltage tests. A test system (100) for testing a device under tes... |
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Invention
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Probe head for high voltage tests. It is herein disclosed a probe head (100) for testing a device... |
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Invention
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Test system for testing electronic devices integrated on a semiconductor wafer. A test system (10... |
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Invention
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Probe head provided with metallized guide holes. A probe head (100) for testing a device under te... |
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Invention
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Probe head provided with a plurality of metallizations. A probe head (100) having a plurality of ... |
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Invention
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Probe card with a guide provided with metallizations. A probe card (100) for testing a device und... |
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Invention
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Adjustable connector support. The present invention relates to an adjustable connector support (1... |
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Invention
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A probe head having high frequency performances. A probe head (100) for the testing of electronic... |
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Invention
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Probe head with an improved configuration. A probe head (100) for the testing of electronic devic... |
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Invention
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A probe head for the testing of electronic devices having contact probes with improved elastic pr... |
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Invention
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Probe head with contact probes having an improved configuration. A probe head (100) for the testi... |
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Invention
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Probe head with improved contact probes. A probe head (100) for the testing of electronic devices... |
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Invention
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Testing head having improved frequency properties. A testing head apt to verify the operation of ... |
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2023
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Invention
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Probe head comprising a guide with metallizations and method using it. A probe head (20) for test... |
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Invention
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Probe head with improved cooling system.
A probe head for testing a device under test integrated... |
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Invention
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Probe head with improved cooling system. A probe head (20) for testing a device under test, compr... |
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Invention
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Probe card for a testing apparatus of electronic devices.
A probe card configured to be mounted ... |
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Invention
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Probe card for a testing apparatus of electronic devices. A probe card (20) configured to be moun... |
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Invention
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Probe card for a testing apparatus of electronic devices with improved thermal management.
A pro... |
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Invention
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Probe head with air cooling system. It is herein described a probe head (20) for testing a device... |
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|
Invention
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Probe card for a testing apparatus of electronic devices with improved thermal management. A prob... |
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Invention
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Improved vertical probe head.
A probe head for testing devices under test integrated on a semico... |
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Invention
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Improved vertical probe head. A probe head (20) for testing devices under test (DUT) integrated o... |
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Invention
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Probe head for a testing apparatus of electronic devices.
It is herein described a probe head in... |
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Invention
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Probe head for a testing apparatus of electronic devices. It is herein described a probe head (21... |
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Invention
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Improved measurement system for the testing of high-frequency devices. A measurement system (20) ... |
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Invention
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Probe card for a testing apparatus of electronic devices and corresponding space transformer.
A ... |
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Invention
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Probe card with improved temperature control. It is herein described a probe card (20) for the te... |
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2022
|
Invention
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Contact probe for probe heads of electronic devices and corresponding probe head.
A contact prob... |
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2021
|
Invention
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Large probe card for testing electronic devices and related manufacturing method.
A method of ma... |
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Invention
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Large probe head for testing electronic devices and related manufacturing method. A method for ma... |
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Invention
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Contact probe for probe heads of electronic devices.
A contact probe is disclosed having a first... |
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Invention
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Flexible membrane adapted to carry high-frequency (rf) power signals and corresponding probe card... |
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|
Invention
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Probe head with an improved contact between contact probes and metallized guide holes.
A probe h... |
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Invention
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Contact element for a probe head for testing high-frequency electronic devices and relating probe... |
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2019
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P/S
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Electronic control apparatus; Electronic communications equipment, apparatus for electronic appli... |
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2008
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P/S
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Electronic testing equipment; electronic communications
equipment, apparatus for electronic appl... |
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P/S
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Test probe electrical contacts and holders therefor, for probing integrated circuits, semiconduct... |
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2007
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P/S
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Electronic testing equipment; electronic communications equipment, apparatus for electronic appli... |
