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2024
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G/S
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Test fixtures in the nature of testing apparatus for testing printed integrated circuits, and str... |
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Invention
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Spring probe contact assembly.
A compliant probe contact assembly for a testing system for testi... |
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Invention
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Spring probe contact assembly. A compliant probe contact assembly for a testing system for testin... |
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2023
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Invention
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Spring pin tip |
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Invention
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Contact pin for integrated circuit testing |
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Invention
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Spring probe assembly for a kelvin testing system.
A spring probe assembly for a Kelvin testing ... |
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Invention
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Spring probe assembly for a kelvin testing system. A spring probe assembly for a Kelvin testing s... |
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2022
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Invention
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Housing with vertical backstop.
A contactor assembly for a testing system for testing integrated... |
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Invention
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Housing with vertical backstop. A contactor assembly for a testing system for testing integrated ... |
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G/S
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Engineering services related to test pins for testing circuit boards and integrated circuit chips... |
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G/S
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Engineering services related to test pins for testing
circuit boards and integrated circuit chip... |
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G/S
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Test fixtures in the nature of apparatus for testing integrated circuits, contact test pins for i... |
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G/S
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Test fixtures in the nature of apparatus for testing
integrated circuits, contact test pins for ... |
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G/S
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Engineering services related to testing on a probe array for testing integrated circuit chips; te... |
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Invention
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Contact assembly and kelvin testing system having contact assembly. A contact assembly for a Kelv... |
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Invention
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Contact assembly array and testing system having contact assembly array. A contact assembly for a... |
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Invention
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Test pin |
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Invention
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Compliant ground block and testing system having compliant ground block. A compliant ground block... |
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G/S
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Semiconductor testing apparatus; contacts for testing semiconductor devices; and apparatus for te... |
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G/S
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Probes for testing semiconductors; contacts for testing semiconductor devices; probes and test pi... |
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Invention
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Anti pinching contact |
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2021
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Invention
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Housing with anti-dislodge capability. A contactor assembly for a testing system is disclosed. Th... |
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Invention
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Contact |
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G/S
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test fixtures in the nature of apparatus for testing integrated circuits, contact test pins for i... |
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Invention
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Over the air (ota) chip testing system. A test apparatus for testing device under test (DUT) havi... |
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Invention
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Integrated circuit testing for integrated circuits with antennas. A testing system and method for... |
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G/S
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semiconductor testing apparatus; contactor housing and alignment plate used for testing semicondu... |
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Invention
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Compliant ground block and testing system for testing integrated circuits |
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2020
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G/S
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Probes for testing integrated circuits; test pins for testing printed circuit boards. |
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G/S
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Probes for testing integrated circuits; test pins for
testing printed circuit boards. |
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G/S
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semiconductor testing apparatus; contacts for testing semiconductor devices |
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Invention
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Integrated circuit contact test apparatus with and method of construction. A test socket for a de... |
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G/S
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semiconductor testing apparatus; contactor housing and alignment plate material used for testing ... |
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Invention
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Self flattening test socket with anti-bowing and elastomer retention. A high density thin walled ... |
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G/S
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Probes for testing integrated circuits; Test pins for testing printed circuit boards |
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|
Invention
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Integrated circuit contactor for testing ics and method of construction. The terminals of a devic... |
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|
Invention
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Waveguide integrated circuit testing. A structure and method for providing a housing which includ... |
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Invention
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High isolation contactor with test pin and housing for integrated circuit testing. A test socket ... |
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2019
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Invention
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Tip for integrated circuit test pin |
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Invention
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Waveguide integrated testing. A structure and method for providing a housing which includes a hig... |
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Invention
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Electrically conductive kelvin contacts for microcircuit tester.
Terminals (2, 502) of a device ... |
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2018
|
Invention
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Wafer level integrated circuit probe array and method of construction. A testing device for wafer... |
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|
Invention
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Electrically conductive pins microcircuit tester. The terminals of a device under test (DUT) are ... |
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Invention
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Testing apparatus and method for microcircuit testing with conical bias pad and conductive test p... |
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Invention
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Selectively geometric shaped contact pin for electronic component testing and method of fabricati... |
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Invention
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Constant pressure pin tip for testing integrated circuit chips. A structure and method of constru... |
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Invention
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High isolation housing for testing integrated circuits. a, 48, 47 of electrically conductive stri... |
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2017
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G/S
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Probe arrays and electrical contact pins for testing
integrated circuit chips; integrated circui... |
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Invention
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Manual test socket and method of adjustment. A test device for manually testing chips/ICs is disc... |
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2013
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G/S
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Probe arrays for testing integrated circuit chips Engineering services related to testing on a pr... |
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G/S
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integrated circuit electrical test sockets and components thereof |
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2012
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G/S
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Electrical test appraratus; test fixtures in the nature of apparatus for testing integrated circu... |
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2010
|
G/S
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Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, sig... |
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2009
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G/S
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test fixtures in the nature of apparatus for testing integrated circuits; contact test pins for i... |
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2006
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G/S
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EXPEDITED CATALOG AND ON-LINE ORDERING SERVICES FEATURING ELECTRONIC COMPONENTS |
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2002
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G/S
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Integrated circuit test sockets and components thereof. |
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G/S
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INTEGRATED CIRCUIT TEST SOCKETS AND COMPONENTS THEREOF |
