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2024
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Invention
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Probe system for testing device under test integrated in semiconductor wafer, and probe card, pro... |
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Invention
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Method for adjusting the position of probing base and probing machine using the same.
A method f... |
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Invention
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Probe system for testing of devices under test integrated on a semiconductor wafer, and probe car... |
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Invention
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Membrane probe card, method of making the same and method of making tested semiconductor chip by ... |
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Invention
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Adhered multilayer die unit and probe head, probe seat, probe card and test system including the ... |
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Invention
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Stationary probe, movable probe, and probing device capable of adjusting the detecting position u... |
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Invention
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Circuit board for semiconductor testing and method of manufacturing the same.
A circuit board fo... |
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Invention
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Probe cards, dut side modules of the probe cards, testing methods and systems that include the pr... |
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Invention
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Circuit board detection device.
A circuit board detection device includes a base, a stage assemb... |
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Invention
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Positioning method and probe system for performing the same, method for operating probe system, a... |
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2023
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Invention
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Probe card and manufacturing method thereof.
A probe card and a manufacturing method of a probe ... |
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Invention
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Probe head and method of producing tested semiconductor die and vertical probe manufacturing meth... |
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Invention
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Probe head having spring probes.
A probe head includes upper, middle and lower dies having upper... |
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Invention
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Probe card, method for designing probe card, method for producing tested semiconductor device met... |
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Invention
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Test system and method for data verification for the same.
A test system and a method for data v... |
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Invention
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Motorized chuck stage controlling method. A motorized chuck stage controlling method adapted to a... |
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Invention
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Wafer inspection system and annular seat thereof. A wafer inspection system includes probe and su... |
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2022
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Invention
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Optical path correction subassembly, optical detection assembly, and optical detection system. An... |
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Invention
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Probe system and machine apparatus thereof. A probe system and a machine apparatus thereof are pr... |
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Invention
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Optical detection system and alignment method for a predetermined target object. An optical detec... |
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Invention
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Vertical probe head. A vertical probe head includes upper and lower die units having upper and lo... |
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Invention
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Probe card and wafer testing assembly thereof. A probe card and a wafer testing assembly thereof ... |
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Invention
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Probe installation circuit board and probe device for probe card.
A probe installation circuit b... |
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Invention
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Circuit board for semiconductor test. A circuit board for semiconductor test includes first and s... |
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Invention
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Trace embedded probe device. A trace embedded probe device includes a circuit board including an ... |
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Invention
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Wafer inspection system. A wafer inspection system includes a supporting device having electrical... |
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Invention
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Optical detection system and laser light providing module without using an optical fiber. An opti... |
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Invention
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Heat dissipatable die unit and probe seat using the same. A heat dissipatable die unit includes a... |
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2021
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Invention
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Probe head and die set having horizontally fine adjustable die and probe head adjusting method. A... |
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Invention
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Chip chuck for supporting light emitting chip under optical inspection and chip supporting device... |
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Invention
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Semiconductor inspecting method. The semiconductor inspecting method includes following steps. Fi... |
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Invention
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Semiconductor inspecting method for ensuring scrubbing length on pad. A semiconductor inspecting ... |
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Invention
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Probe card and manufacturing method thereof. A probe card and a manufacturing method of a probe c... |
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Invention
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Probe module having microelectromechanical probe and method of manufacturing the same.
A probe m... |
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Invention
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Probe card. The present invention provides a probe card comprising a probe base, at least one imp... |
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Invention
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Probe assembly. A probe assembly, adapted to test high-speed signal transmission lines of printed... |
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Invention
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Macro and micro inspection apparatus and inspection method.
A macro and micro inspection apparat... |
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Invention
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Die plate assembly for probe head |
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Invention
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Probe for testing device under test |
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Invention
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Probe head with linear probe. A probe head includes upper and lower die units, and a linear probe... |
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Invention
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Probe card and probe module thereof. A probe card and a probe module thereof are provided. The pr... |
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2020
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Invention
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Image processing method for light emitting device. An image processing method includes the steps ... |
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Invention
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Light emitting element detecting method and equipment. A light emitting element detecting method ... |
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Invention
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Optical inspection system. An optical inspection system includes a brightness inspection module f... |
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Invention
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Probe station capable of maintaining position of probe tip upon temperature change. A probe stati... |
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G/S
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Test pins for testing circuit boards; Probe cards for testing semiconductor wafer; Testing appara... |
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Invention
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Method of aligning wafer.
A method of aligning a wafer includes defining a reference direction f... |
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Invention
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Method for compensating to distance between probe tip and device under test after temperature cha... |
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Invention
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Method of determining distance between probe and wafer held by wafer probe station.
A method of ... |
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Invention
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Wafer probe station. A wafer probe station includes a thermal chuck, a chuck stage, a platen, som... |
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2018
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G/S
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Semiconductor wafer processing machines, namely, wafer loader probes for testing integrated circu... |
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2016
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G/S
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Microscopes, optical lenses, cameras |
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G/S
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[ Probes for testing integrated circuits; test pins for testing circuit boards; probes for testin... |
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2015
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G/S
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Semiconductor testing apparatus; testing apparatus for testing printed circuit boards; environmen... |
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2008
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G/S
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Probes for testing integrated circuits, probe cards for use in connection with inspection of semi... |
