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2024
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Invention
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Probe head, probe card, test equipment, and electronic device tested by the test equipment.
A pr... |
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Invention
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Probe system, method for wafer test management system in a probe system, and non-transitory compu... |
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Invention
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Probe system and machine apparatus thereof.
A probe system and a machine apparatus thereof are p... |
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Invention
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Probe system for double side probing, method of operating the same and tested device.
A probe sy... |
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Invention
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Probe card and method for design probe card and measuring method and system for detecting device ... |
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Invention
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Probe system, probe card, probe head, and probe for testing electronic device under test integrat... |
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Invention
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Probe card, probe head, method for manufacturing the probe head, and electronic device under test... |
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Invention
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Vertical probe, probe head and method of making the vertical probe.
A vertical probe includes op... |
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Invention
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Multiport rf calibration using peer-terminated standards.
A new type of calibration standards is... |
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Invention
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Probe system for testing device under test integrated in semiconductor wafer, and probe card, pro... |
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Invention
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Method of determining probing parameters for probe system to test device under test, probe system... |
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Invention
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Contact probe and contacting member thereof, method of manufacturing contacting member, probe sys... |
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Invention
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Wafer probe station and method for establishing an evaluation model for calibration of a probe as... |
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Invention
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Quick coupling probe head.
The present invention provides a quick coupling probe card, utilized ... |
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Invention
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Method for adjusting the position of probing base and probing machine using the same.
A method f... |
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Invention
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Probe system for testing of devices under test integrated on a semiconductor wafer, and probe car... |
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Invention
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Membrane probe card, method of making the same and method of making tested semiconductor chip by ... |
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Invention
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Adhered multilayer die unit and probe head, probe seat, probe card and test system including the ... |
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Invention
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Stationary probe, movable probe, and probing device capable of adjusting the detecting position u... |
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Invention
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Circuit board for semiconductor testing and method of manufacturing the same.
A circuit board fo... |
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Invention
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Probe cards, dut side modules of the probe cards, testing methods and systems that include the pr... |
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Invention
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Circuit board detection device.
A circuit board detection device includes a base, a stage assemb... |
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Invention
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Positioning method and probe system for performing the same, method for operating probe system, a... |
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2023
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Invention
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Probe card and manufacturing method thereof.
A probe card and a manufacturing method of a probe ... |
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Invention
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Probe head and method of producing tested semiconductor die and vertical probe manufacturing meth... |
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Invention
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Probe head having spring probes.
A probe head includes upper, middle and lower dies having upper... |
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Invention
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Probe card, method for designing probe card, method for producing tested semiconductor device met... |
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Invention
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Test system and method for data verification for the same.
A test system and a method for data v... |
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Invention
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Motorized chuck stage controlling method. A motorized chuck stage controlling method adapted to a... |
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Invention
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Wafer inspection system and annular seat thereof. A wafer inspection system includes probe and su... |
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2022
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Invention
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Optical path correction subassembly, optical detection assembly, and optical detection system. An... |
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Invention
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Probe system and machine apparatus thereof. A probe system and a machine apparatus thereof are pr... |
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Invention
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Optical detection system and alignment method for a predetermined target object. An optical detec... |
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Invention
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Vertical probe head. A vertical probe head includes upper and lower die units having upper and lo... |
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Invention
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Probe card and wafer testing assembly thereof. A probe card and a wafer testing assembly thereof ... |
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Invention
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Probe installation circuit board and probe device for probe card.
A probe installation circuit b... |
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Invention
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Circuit board for semiconductor test. A circuit board for semiconductor test includes first and s... |
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Invention
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Trace embedded probe device. A trace embedded probe device includes a circuit board including an ... |
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Invention
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Wafer inspection system. A wafer inspection system includes a supporting device having electrical... |
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Invention
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Optical detection system and laser light providing module without using an optical fiber. An opti... |
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Invention
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Heat dissipatable die unit and probe seat using the same. A heat dissipatable die unit includes a... |
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2021
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Invention
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Probe head and die set having horizontally fine adjustable die and probe head adjusting method. A... |
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Invention
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Chip chuck for supporting light emitting chip under optical inspection and chip supporting device... |
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Invention
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Semiconductor inspecting method. The semiconductor inspecting method includes following steps. Fi... |
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Invention
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Semiconductor inspecting method for ensuring scrubbing length on pad. A semiconductor inspecting ... |
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Invention
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Probe card and manufacturing method thereof. A probe card and a manufacturing method of a probe c... |
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Invention
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Die plate assembly for probe head |
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Invention
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Probe for testing device under test |
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2020
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G/S
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Test pins for testing circuit boards; Probe cards for testing semiconductor wafer; Testing appara... |
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2018
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G/S
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Semiconductor wafer processing machines, namely, wafer loader probes for testing integrated circu... |
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2016
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G/S
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Microscopes, optical lenses, cameras |
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G/S
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[ Probes for testing integrated circuits; test pins for testing circuit boards; probes for testin... |
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2015
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G/S
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Semiconductor testing apparatus; testing apparatus for testing printed circuit boards; environmen... |
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2008
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G/S
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Probes for testing integrated circuits, probe cards for use in connection with inspection of semi... |
