The invention relates to a method for the combined analysis of a sample with objects to be analyzed, in particular a sample with biological objects, in which measurement results for one or more of the objects to be analyzed in the sample are obtained by analyzing the one or more objects to be analyzed by an imaging method of measurement, probe-microscopic measurement results are obtained for the one or more objects to be analyzed by analyzing the one or more objects to be analyzed by a probe-microscopic method of measurement, and the measurement results and the probe-microscopic measurement results are assigned to one another, after optional prior intermediate processing. Furthermore, the invention relates to an apparatus for carrying out combined analysis of a sample with objects to be investigated, in particular a sample with biological objects.
G01Q 60/00 - Types particuliers de microscopie à sonde à balayage SPM [Scanning-Probe Microscopy] ou appareils à cet effetComposants essentiels de ceux-ci
G01Q 30/04 - Dispositifs d'affichage ou de traitement de données
G01Q 30/02 - Dispositifs d'analyse d’un type autre que la microscopie à sonde à balayage SPM, p. ex. microscope électronique à balayage SEM [Scanning Electron Microscope], spectromètre ou microscope optique
The invention relates to a measuring probe device for a probe microscope, in particular a scanning probe microscope, with a measuring probe holder and a measuring probe arranged on the measuring probe holder, which is set up for a probe microscopic investigation of a sample, wherein on the measuring probe holder, a measuring probe chamber is formed, which receives the measuring probe at least partially and is open on a side away from the measuring probe holder, and is configured to receive a liquid surrounding the measuring probe. The invention also relates to a measuring cell for receiving a liquid sample for a probe microscope, a scanning probe microscope with a measuring probe device and a scanning probe microscope with a measuring cell.
The present invention relates to a method for investigating a sample using scanning probe photon microscopy or optical force microscopy, and to an apparatus which is designed accordingly. The method or the apparatus provides for two optical traps which can be moved in a local region of the sample, wherein in at least one of the two traps a probe is held. The sample is scanned using the two traps and the measured data from the two traps are captured separately and evaluated by correlation. In particular interference signals resulting from an interaction between sample and light trap can be eliminated by the method.
H01S 1/00 - Masers, c.-à-d. dispositifs utilisant l’émission stimulée de rayonnement électromagnétique dans la gamme des micro-ondes
H01S 3/00 - Lasers, c.-à-d. dispositifs utilisant l'émission stimulée de rayonnement électromagnétique dans la gamme de l’infrarouge, du visible ou de l’ultraviolet
H05H 3/02 - Production d'un faisceau moléculaire ou atomique, p. ex. d'un faisceau résonnant
4.
Apparatus and method for examining a specimen by means of probe microscopy
The invention relates to an apparatus and a method for examining a specimen by means of probe microscopy, in particular scanning probe microscopy. The apparatus comprises a probe microscope device which has a specimen holder for holding a specimen to be examined, a measurement probe and a displacement unit which is configured to displace the specimen holder and the measurement probe relative to one another for an examination of the specimen by means of probe microscopy, and comprises a condenser illumination and also an optical system which is arranged downstream of the condenser illumination and is configured to project condenser light, which is emitted by the condenser illumination in a condenser light path, into the region of the specimen holder for optical microscopy of the specimen to be examined, while at least partially maintaining condenser light parameters with which the condenser light is emitted by the condenser illumination.
G01Q 60/06 - Microscopie optique à champ proche à balayage SNOM [Scanning Near-Field Optical Microscopy] combinée avec la microscopie à forces atomiques AFM [Atomic Force Microscopy]
G01Q 30/02 - Dispositifs d'analyse d’un type autre que la microscopie à sonde à balayage SPM, p. ex. microscope électronique à balayage SEM [Scanning Electron Microscope], spectromètre ou microscope optique
5.
Method for examining a test sample using a scanning probe microscope, measurement system and a measuring probe system
The invention relates to a method and to a device for examining a test sample using a scanning probe microscope. According to the method a first and a second measurement using a scanning probe microscope are carried out on the test sample using a measuring probe system in which a measuring probe and another measuring probe are formed on a common measuring probe receptacle. During the first measurement, in relation to the test sample, the measuring probe is held in a first measurement position and the other measuring probe is held in another non-measurement position, and the test sample is examined with the measuring probe using a scanning probe microscope. After the first measurement, by displacing in relation to the test sample, the measuring probe is displaced from the measurement position into a non-measurement position and the other measuring probe from the other non-measurement position into another measurement position. During the second measurement, in relation to the test sample, the measuring probe is held in the non-measurement position and the other measuring probe is held in the other measurement position, and the test sample is examined with the other measuring probe using a scanning probe microscope. The invention also relates to a measuring sensor system of a scanning probe microscope.
G01Q 10/00 - Dispositions pour le balayage ou le positionnement, c.-à-d. dispositions pour commander de manière active le mouvement ou la position de la sonde
6.
Method for examining a measurement object, and apparatus
The invention relates to a method for examining a measurement object (2, 12), in which the measurement object (2, 12) is examined by means of scanning probe microscopy using a measurement probe (10) of a scanning probe measurement device, and in which at least one subsection (1) of the measurement object (2, 12) is optically examined by an optical measurement system in an observation region associated with the optical measurement system, wherein a displacement of the at least one subsection (1) of the measurement object (2, 12) out of the observation region which is brought about by the examination by means of scanning probe microscopy is corrected in such a way that the at least one displaced subsection (1) of the measurement object (2, 12) is arranged back in the observation region by means of a readjustment device which processes data signals that characterize the displacement.
The invention relates to a method for the combined analysis of a sample with objects to be analysed, in particular a sample with biological objects, in which measurement results are recorded for one or more of the objects to be analysed in the sample by analysing the one or more objects to be analysed using an imaging measurement method, probe microscopy measurement results are recorded for the one or more objects to be analysed by analysing the one or more objects to be analysed using a probe microscopy measurement method, and the measurement results and the probe microscopy measurement results are assigned to one another following optional previous intermediate processing. Furthermore, the invention relates to an apparatus for carrying out a combined analysis of a sample with objects to be analysed, in particular a sample with biological objects.
G01Q 30/02 - Dispositifs d'analyse d’un type autre que la microscopie à sonde à balayage SPM, p. ex. microscope électronique à balayage SEM [Scanning Electron Microscope], spectromètre ou microscope optique
G01Q 30/04 - Dispositifs d'affichage ou de traitement de données
The invention relates to a measurement probe apparatus for a probe microscope, in particular a scanning probe microscope, having a measurement probe holder and a measurement probe which is arranged on the measurement probe holder and is designed for a probe-microscopic investigation of a sample, wherein, at the measurement probe holder, a measurement probe chamber is formed, which at least partly holds the measurement probe, is open at a face which is remote from the measurement probe holder, and is configured for holding the liquid surrounding the measurement probe. Furthermore, the invention relates to a measurement cell for holding a liquid sample for a probe microscope, a scanning probe microscope with a measurement probe apparatus and a scanning probe microscope with a measurement cell.
The invention relates to a method for operating a measurement system containing a scanning probe microscope, in particular an atomic force microscope, and to a measurement system for examining a measurement sample using a scanning probe microscope and for optically examining said sample. In the method, an optical image of a measurement section of a measurement sample to be examined, said image being recorded with the aid of an optical recording device, is displayed on a display apparatus, a choice of a position in the optical image is detected, and, for a scanning probe measurement, a measurement probe which is configured for the scanning probe measurement is moved, using a movement apparatus which moves the measurement probe and the measurement sample relative to one another, to a measurement position, which is assigned to the selected position in the optical image in accordance with coordinate transformation, by virtue of the movement apparatus being controlled in accordance with the coordinate transformation, wherein a previously determined assignment between a coordinate system of the optical image and a coordinate system of a space covered by movement positions of the measurement probe and the measurement sample is formed with the coordinate transformation, wherein the movement positions comprise the measurement position.
G01N 23/00 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou
10.
METHOD AND DEVICE FOR EXAMINING A SAMPLE WITH A PROBE MICROSCOPE
The invention relates to a method for examining a sample with a probe microscope, in particular for examining with a scanning probe microscope, to a method in which a sample is examined with a probe microscope by means of a multi-part measurement probe that consists of a probe element and a guide element that guides the probe element when examining with a probe microscope. Said method consists of the following steps: Noise measurement signals for the measurement probe are detected in a non-measurement configuration, in which the probe element is separated from the guide element; measurement signals for the measurement probe are detected in a measurement configuration in which the probe element is guided by the guide element and the measurement signals are evaluated such that the measurement signals are assigned at least partially to the noise measurement signals. The invention also relates to a device for examining a sample with a probe microscope.
G01Q 30/06 - Dispositifs d'affichage ou de traitement de données pour compensation d'erreurs
G01Q 60/00 - Types particuliers de microscopie à sonde à balayage SPM [Scanning-Probe Microscopy] ou appareils à cet effetComposants essentiels de ceux-ci
G21K 1/00 - Dispositions pour manipuler des particules ou des rayonnements ionisants, p. ex. pour focaliser ou pour modérer
11.
METHOD AND APPARATUS FOR CHARACTERIZING A SAMPLE WITH TWO OR MORE OPTICAL TRAPS
The present invention relates to a method for investigating a sample (5, 6) using scanning probe photon microscopy or optical force microscopy, and to an apparatus which is designed accordingly. The method or the apparatus provides for two optical traps (1, 2) which can be moved in a local region of the sample (5, 6), wherein in at least one of the two traps (1, 2) a probe (3, 4) is held. The sample (5, 6) is scanned using the two traps (1, 2) and the measured data from the two traps (1, 2) are captured separately and evaluated by correlation. In particular interference signals resulting from an interaction between sample and light trap can be eliminated by the method.
G01Q 30/06 - Dispositifs d'affichage ou de traitement de données pour compensation d'erreurs
G01Q 60/00 - Types particuliers de microscopie à sonde à balayage SPM [Scanning-Probe Microscopy] ou appareils à cet effetComposants essentiels de ceux-ci
G21K 1/00 - Dispositions pour manipuler des particules ou des rayonnements ionisants, p. ex. pour focaliser ou pour modérer
12.
METHOD FOR EXAMINING A TEST SAMPLE USING A SCANNING PROBE MICROSCOPE, MEASUREMENT SYSTEM AND A MEASURING SENSOR SYSTEM
The invention relates to a method and to a device for examining a test sample using a scanning probe microscope. According to the method, a first and a second measurement using a scanning probe microscope is carried out on the test sample using the measurement sensor system, in which a measurement sensor and another measurement sensor are embodied on a common measurement sensor receptacle. During the first measurement, in relation to the test sample, the measurement sensor is held in a first measurement position and the other measurement sensor is held in another non-measurement position, and the test sample is examined by a measurement sensor using a scanning probe microscope. After the first measurement, by displacing in relation to the test sample, the measurement sensor is displaced from the measurement position into a non-measurement position and the other measurement sensor is displaced from the other non-measurement position into another measurement position and during the second measurement, in relation to the test sample, the measurement sensor is held in the non-measurement position and the other measurement sensor is held in the other measurement position and the test sample is examined by the other measurement sensor using a scanning probe microscope. The invention also relates to a measuring sensor system of a scanning probe microscope.
The invention relates to an apparatus and to a method for examining a specimen with a probe microscope, in particular with a scanning probe microscope. The apparatus comprises a probe-microscope device having a specimen holder for holding a specimen to be examined, a measuring probe and a displacement unit which is configured for displacing the specimen holder and the measuring probe relative to one another for a probe-microscopy examination of the specimen, and a condenser illumination and an optical system which is arranged downstream of the condenser illumination and is configured for projecting condenser light, which is emitted into a condenser light path by the condenser illumination, into the region of the specimen holder for optical microscopy of the specimen to be examined, while maintaining, at least partially, condenser light parameters with which the condenser light is emitted by the condenser illumination.
G01Q 30/02 - Dispositifs d'analyse d’un type autre que la microscopie à sonde à balayage SPM, p. ex. microscope électronique à balayage SEM [Scanning Electron Microscope], spectromètre ou microscope optique
09 - Appareils et instruments scientifiques et électriques
40 - Traitement de matériaux; recyclage, purification de l'air et traitement de l'eau
42 - Services scientifiques, technologiques et industriels, recherche et conception
Produits et services
Analysis apparatus (not for medical purposes), material
testing instruments and machines, measuring apparatus,
measuring instruments, precision measuring apparatus,
microscopes, objectives (optics), optical apparatus and
instruments, apparatus and instruments for physics, computer
operating programs (recorded), computer software (recorded),
data processing apparatus. Material treatment. Technical measurement, scientific analysis, material
testing, physics research, scientific research, technical
research, design of programs for data processing.
09 - Appareils et instruments scientifiques et électriques
40 - Traitement de matériaux; recyclage, purification de l'air et traitement de l'eau
42 - Services scientifiques, technologiques et industriels, recherche et conception
Produits et services
Analysis apparatus in the nature of sample testing instruments, namely, precision laser measuring apparatus, microscopes, scanning probe microscopes, spectrometers; computer operating programs; computer software for use in data processing; and data processors [ Treatment of materials by laser beam and scanning probe microscopes ] [ Technical measurements of sample properties in the field of nanotechnology; scientific research; material testing; physics research, technical research in the field of nanotechnology; and design of computer programs for data processing ]
