Abrégé

Methods and apparatus for obtaining extremely high sensitivity chemical composition maps with spatial resolution down to a few nanometers. In some embodiments these chemical composition maps are created using a combination of three techniques: (1) Illuminating the sample with IR radiation than is tuned to an absorption band in the sample; and (2) Optimizing a mechanical coupling efficiency that is tuned to a specific target material; (3) Optimizing a resonant detection that is tuned to a specific target material. With the combination of these steps it is possible to obtain (1) Chemical composition maps based on unique IR absorption; (2) spatial resolution that is enhanced by extremely short-range tip-sample interactions; and (3) resonant amplification tuned to a specific target material. In other embodiments it is possible to take advantage of any two of these steps and still achieve a substantial improvement in spatial resolution and/or sensitivity.

Classes IPC  ?

• G01Q 30/02 - Dispositifs d'analyse d’un type autre que la microscopie à sonde à balayage SPM, p. ex. microscope électronique à balayage SEM [Scanning Electron Microscope], spectromètre ou microscope optique
• G01Q 60/32 - Mode vibrant
• G01N 21/3563 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique en utilisant la lumière infrarouge pour l'analyse de solidesPréparation des échantillons à cet effet

Abrégé

An AFM 2 based technique has been demonstrated for performing highly localized IR spectroscopy 13 on a sample surface 3. Such a technique implemented in a commercially viable analytical instrument would be extremely useful. Various aspects of the experimental set-up have to be changed to create a commercial version. The invention addresses many of these issues thereby producing a version of the analytical technique that can be made generally available to the scientific community.

Classes IPC  ?

• G01Q 30/02 - Dispositifs d'analyse d’un type autre que la microscopie à sonde à balayage SPM, p. ex. microscope électronique à balayage SEM [Scanning Electron Microscope], spectromètre ou microscope optique
• G01Q 60/32 - Mode vibrant
• G01N 21/35 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique en utilisant la lumière infrarouge
• G01Q 60/38 - Sondes, leur fabrication ou leur instrumentation correspondante, p. ex. supports

Abrégé

A system and method for automatic analysis of temperature transition data over an area of a sample surface 8. The system relies on the use of a microf abricated probe, 4, which can be rapidly heated and cooled 22 and has a sharp tip 6 to provide high spatial resolution. The system also has fast x- y-z positioners, 18, 20, data collection 29, 30, and algorithms that allow automatic analysis of and visualization 32 of temperature transition data.

Classes IPC  ?

• G01Q 60/58 - Microscopie thermique à balayage SThM [Scanning Thermal Microscopy] ou appareils à cet effet, p. ex. sondes SThM
• G01Q 30/04 - Dispositifs d'affichage ou de traitement de données

Abrégé

An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Such a technique implemented in a commercially viable analytical instrument would be extremely useful. Various aspects of the experimental set-up have to be changed to create a commercial version. The invention addresses many of these issues thereby producing a version of the analytical technique that can be made generally available to the scientific community.

Classes IPC  ?

• G01J 3/30 - Mesure de l'intensité des raies spectrales directement sur le spectre lui-même