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2024
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Invention
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Test systems configured to test devices at different temperatures. An example test system include... |
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P/S
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Semiconductor testing apparatus; computer component testing
and calibrating equipment; computer ... |
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P/S
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Semiconductor testing apparatus; Computer component testing and calibrating equipment; computer h... |
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P/S
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Semiconductor testing apparatus; downloadable computer software development tools; downloadable a... |
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P/S
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Semiconductor testing apparatus; downloadable computer
software development tools; downloadable ... |
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Invention
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Identifying failures in device cores. An example system is for testing a device under test (DUT) ... |
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Invention
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Controlling storage of test data based on prior test program execution. An example system include... |
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Invention
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Cable assembly containing self-calibration data. An example cable assembly includes a coaxial cab... |
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2023
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Invention
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Determining a correlation between power disturbances and data errors in a test system. An example... |
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P/S
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Semiconductor testing apparatus; Computer component testing and calibrating equipment; Computer h... |
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Invention
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Generating a test program.
An example method includes the following operations: receiving inform... |
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Invention
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Test systems configured to test devices at different temperatures.
An example test system includ... |
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Invention
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Flattening a circuit board assembly using vacuum pressure. An example method of flattening a circ... |
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Invention
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Identifying failures in device cores.
An example system is for testing a device under test (DUT)... |
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Invention
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Controlling storage of test data based on prior test program execution.
An example system includ... |
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Invention
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Cable assembly containing self-calibration data.
An example cable assembly includes a coaxial ca... |
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Invention
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Test system that converts command syntaxes.
An example test system includes a test instrument co... |
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Invention
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Probe for a test system. An example probe for a test system includes a conductor to carry direct ... |
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2022
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Invention
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Determining a correlation between power disturbances and data erors in a test system.
An example... |
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Invention
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Managing memory in an electronic system. An example system includes first memory, second memory h... |
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Invention
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Predicting tests that a device will fail. Example techniques may be implemented as a method, a sy... |
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Invention
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Method for reduction of sic mosfet gate voltage glitches. Aspects of the present disclosure are d... |
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Invention
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Test socket having an automated lid. An example test socket for a test system includes a receptac... |
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Invention
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Flattening a circuit board assembly using vacuum pressure.
An example method of flattening a cir... |
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Invention
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Waveguide connector for making blind-mate electrical connections. An example waveguide connector ... |
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Invention
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Front-end module. An example front-end module includes a channel to connect to a device under tes... |
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Invention
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Communicating using contactless coupling. An example system includes a first circuit board having... |
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Invention
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Thermal plate having a fluid channel. An example apparatus is for contacting a device to change a... |
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Invention
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Resonant-coupled transmission line. An example printed circuit board (PCB) includes a substrate h... |
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Invention
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Test head manipulator configured to address uncontrolled test head rotation. An example test head... |
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2021
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Invention
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Interposer. An interposer for a test system includes coaxial cables, each of which is configured ... |
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Invention
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Automatic test equipement having fiber optic connections to remote servers. An example test syste... |
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Invention
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Vision system for an automated test system. An example test system includes test sites that inclu... |
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Invention
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Test site configuraton in an automated test system. An example test system includes a test socket... |
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Invention
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Predicting which tests will produce failing results for a set of devices under test based on patt... |
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P/S
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High-speed computer memory testing machines; semiconductor
testing machines; large scale integra... |
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Invention
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Waveguide connector for connecting first and second waveguides, where the connector includes a ma... |
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P/S
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High-speed computer memory testing machines; semiconductor testing machines; large scale integrat... |
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Invention
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Coaxial contact having an open-curve shape. An example contact head includes coaxial contacts con... |
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Invention
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Thermal plate having a fluid channel.
An example apparatus is for contacting a device to change ... |
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2020
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Invention
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Inductance control system. An example polarity inverter includes multiple contactors, each of whi... |
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Invention
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Test site configuration in an automated test system. An example test system includes a test socke... |
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Invention
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Modular automated test system. An example test system includes packs. The packs include test sock... |
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Invention
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Thermal control system for an automated test system. An example test system includes test sites f... |
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Invention
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Automated test system. An example test system includes test sites comprising test sockets for tes... |
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2019
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P/S
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Computer hardware for testing semiconductors, circuit boards and memory and logic devices; Downlo... |
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2009
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P/S
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Instruments and apparatus for handling semiconductor components and wafers during manufacture. El... |
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2008
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P/S
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Test equipment for electronic devices, namely, mass storage devices |
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2005
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P/S
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Testing apparatus for testing semiconductors |
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2002
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P/S
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automatic test equipment for electronic devices, namely semiconductor chips, printed circuit boar... |
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1978
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P/S
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Industrial automatic equipment for testing integrated circuits, printed circuit boards, and other... |
