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2025
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Invention
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Test board for burn-in test.
Proposed is a test board for a burn-in test. According to a specifi... |
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2024
|
Invention
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Electrical connector for supplying utility.
Proposed is an electrical connector for supplying a ... |
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Invention
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Automatic connector for supplying utility.
Proposed is an automatic coupler for supplying a util... |
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Invention
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Cartridge module and multi wafer burn-in test device utilizing same.
Proposed is a cartridge mod... |
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Invention
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Automatic coupler for supplying utilities. The present invention relates to an automatic coupler ... |
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Invention
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Electrical connector for utility supply. The present invention relates to an electric connector f... |
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Invention
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Cartridge module and multi-wafer test apparatus using same. The present invention relates to a ca... |
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Invention
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Probe card holder for inspecting wafer. The present invention relates to a probe card holder capa... |
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Invention
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Surface treatment method for perovskite thin film and solar cell manufactured by comprising same.... |
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Invention
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Probe card holder for wafer testing. Proposed is a probe card holder for wafer testing including ... |
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2021
|
Invention
|
Perovskite solar cell module and manufacturing method for same.
The present invention relates to... |
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Invention
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Perovskite solar cell module and manufacturing method for same. The present invention relates to ... |
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Invention
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Wide-bandgap perovskite light absorption layer. 33 (A is a monovalent organic cation; M is a diva... |
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2018
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Invention
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Apparatus and method for measuring round-trip time of test signal using programmable logic. An ap... |
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2017
|
Invention
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Sealed plasma melting furnace for treating low- and intermediate-level radioactive waste. The pre... |
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Invention
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Sealed plasma melting furnace for treating medium- and low-level radioactive waste. The present i... |
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2015
|
Invention
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Burn-in test system and method. A burn-in test system may include a burn-in test chamber, a heati... |
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Invention
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Test board unit and apparatus for testing a semiconductor chip including the same. A test board u... |
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2014
|
Invention
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Detection system for detecting fail block using logic block address and data buffer address in a ... |
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Invention
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Non-mounted storage test device based on fpga. A non-mounted storage test device based on FPGA in... |
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Invention
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Storage tester capable of individual control for a plurality of storage. Disclosed is a storage t... |
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Invention
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Device for calculating round-trip time of memory test using programmable logic.
A device for cal... |
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Invention
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Apparatus and method for correcting output signal of fpga-based memory test device. An apparatus ... |
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Invention
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System for simultaneously determining memory test result. A system for test plural memories simul... |
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Invention
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Apparatus and method for acquiring data of fast fail memory. An apparatus and method for acquirin... |
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2013
|
Invention
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Device under test tester using redriver. Disclosed is a device under test (DUT) tester using a re... |
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Invention
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Solid state drive tester. Disclosed is a solid state drive tester which reduces the size of the t... |
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Invention
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Solid state drive tester. Disclosed is a solid state drive tester which divides the functions of ... |
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Invention
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Storage interface apparatus for solid state drive tester. Disclosed is a storage interface appara... |
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Invention
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Failure detection apparatus for solid state drive tester. A failure detection apparatus for a sol... |
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|
Invention
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Error generating apparatus for solid state drive tester. Disclosed is an error generating apparat... |
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2012
|
Invention
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Lighting device for street lamp. Disclosed is a lighting device for a street lamp, of which a str... |
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2007
|
Invention
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Sequential semiconductor device tester. A sequential semiconductor device tester, and in particul... |
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Invention
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Method for calibrating semiconductor device tester. A method for calibrating a semiconductor devi... |
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Invention
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Apparatus and method for generating test pattern data for testing semiconductor device.
An appar... |
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Invention
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Tester for testing semiconductor device. A tester for testing a semiconductor device is disclosed... |
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Invention
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Tester for testing semiconductor device.
A tester for testing a semiconductor device is disclose... |
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2006
|
Invention
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Semiconductor test interface. The present invention relates to a semiconductor test interface for... |
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2005
|
Invention
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Memory application tester having vertically-mounted motherboard. Disclosed is a memory applicatio... |
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|
Invention
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Algorithm pattern generator for testing a memory device and memory tester using the same. Disclos... |
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|
Invention
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Semiconductor test apparatus for simultaneously testing plurality of semiconductor devices. Discl... |
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2002
|
Invention
|
Pc and ate integrated chip test equipment. The present invention relates to a test equipment of a... |
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2000
|
Invention
|
Apparatus for testing semiconductor memory. An apparatus for testing a semiconductor memory is di... |
