Advantest Corporation

Japon


Commandez votre montre hebdomadaire Advantest Corporation
Quantité totale PI 1 700
Quantité totale incluant filiales 1 724 (+ 24 pour les filiales)
Rang # Quantité totale PI 802
Note d'activité PI 3,5/5.0    569
Rang # Activité PI 1 276
Activité incl filiales 3,2/5.0    571
Symbole boursier
ISIN JP3122400009
Capitalisation 1871706445700.0  (JPY)
Industrie Semiconductor Equipment & Materials
Secteur Technology
Classe Nice dominante Appareils et instruments scienti...

Brevets

Marques

896 14
0 2
776 10
2
 
Dernier brevet 2026 - Test method, manufacturing metho...
Premier brevet 1978 - Apparatus for keying in electron...
Dernière marque 2025 - SiConic
Première marque 1981 - ADVANTEST

Filiales

3 subsidiaries with IP (24 patents, 0 trademarks)

1 subsidiaries without IP

 S'inscrire grtuitement pour accéder à la liste des filiales

Industrie (Classification de Nice)

Derniers inventions, produits et services

2025 Invention Pattern-generating device. Provided is a pattern-generating device including: a timing-generatin...
Invention Microparticle measuring apparatus. The microparticle measuring apparatus is used in combination ...
Invention Test apparatus, test method, and program. Provided is a test apparatus including: a pattern gene...
Invention Test apparatus and test method. There is provided a test apparatus including a first power sourc...
Invention Test method, manufacturing method, and microdisplay. Provided is a test method for a wafer on whi...
Invention Microparticle measuring apparatus. A pore-based device has a first liquid chamber and a second l...
Invention Sub-terahertz wave output device. A sub-terahertz wave output device (1) comprises: an optical co...
Invention Electronic device and method of manufacturing electronic device. There is provided an electronic...
Invention Device, method, and program. Provided is a device comprising: an acquisition unit that acquires a...
Invention Device interface and method of adjusting the same. A device interface disposed between a test he...
Invention Bridge beam, semiconductor device handling apparatus, and semiconductor device testing apparatus....
Invention Optical comb light source and measuring apparatus. An optical comb light source outputs an optic...
Invention Test circuit, test apparatus and test method. Provided is a testing circuit including a voltage ...
Invention Testing circuit, testing apparatus, and testing method. Provided is a testing circuit including ...
Invention Device interface and method of testing using the same. A device interface disposed between a tes...
Invention Method and apparatus for analyzing lipoprotein in blood sample. A blood analysis apparatus 1 comp...
Invention Antenna device and an automated test equipment comprising an orthomode transducer. The invention...
Invention Pore chip case. A pore chip case houses a pore chip. A main body includes a chip housing space, ...
Invention Antenna device and an automated test equipment with a ridged blind mating waveguide flange. An a...
Invention Device and setting method. Provided is a device comprising: a substrate; a plurality of main heat...
Invention Semiconductor integrated circuit. A pin electronics IC is formed on a semiconductor chip. The pi...
Invention Layered structure and inductor. A layered structure includes a non-magnetic layer, an upper soft...
Invention Switch apparatus and testing apparatus. Provided is a switch apparatus which electrically connec...
Invention Temperature adjusting system, controller, device handling apparatus, tester, and device testing a...
Invention Amplifier circuit. Provided is an amplifier circuit including: a unit amplifier, wherein the uni...
Invention Electronic device and method of idetifying circuit board thereof. An electronic device and a met...
Invention Contactor and testing device. Provided is a contactor for energizing a plurality of vertical ligh...
Invention Condition determining apparatus, method, and recording medium. A condition determining apparatus...
Invention Da conversion apparatus. Provided is a DA conversion apparatus which generates an output signal ...
Invention Measurement device and measurement method. Provided is a measurement device comprising: a plate-s...
Invention Measurement device, measurement method, and device to be tested. Provided is a measurement device...
Invention Electromagnetic wave measuring apparatus, method, and recording medium. An electromagnetic wave ...
Invention Pore device. A pore device has a device main body and a sealing member. The device main body has...
Invention Pore device. A pore device can accommodate a pore chip. A body has the internal space partitione...
P/S Semiconductor testing machines; computer software for semiconductor testing machines.
P/S Semiconductor testing machines; downloadable computer software for semiconductor testing machines.
Invention Coaxial cable and device testing apparatus. A coaxial cable includes a tubular outer conductor, ...
2024 Invention Switch device. Provided is a switch device including a phase-change material switch and a first ...
Invention Integrated protocol analyzer configured within automated test equipment (ate) hardware with sideb...
Invention Synchronization techniques between single-site and multi-site dut test programs. A method of tes...
Invention Optoelectronic unit for use with an automatic test equipment system. An optoelectronic unit (6) f...
Invention Tester for an automatic test equipment system and method for controlling the same. Tester for an ...
Invention Probe assembly for calibrating rf power signals to a device pin. Various embodiments disclosed h...
Invention Device for equalising attenuation of a signal by a transmission line and system for testing elect...
Invention Automated test equipment, test arrangement and method for testing with individual sensing in a ga...
Invention Measurement device, measurement method, and measurement program. Provided is a measurement device...
Invention Power switch and method for operating a power switch using a switchable current source. A power s...
Invention A device under test socket structure with a pusher surrounded with an electromagnetic absorber an...
2022 Invention Biasing circuit. A biasing circuit includes a signal input terminal, a signal output terminal, a...
2021 P/S Downloadable and recorded computer software for controlling the operation of semiconductor testin...
P/S Computer software for controlling the operation of semiconductor testing machines.
2020 Invention Coaxial connector
P/S Semiconductor testing machines; system large scale integrated circuits testing machines; large sc...
P/S Semiconductor testing machines; system large scale integrated circuits testing machines; large s...
2018 P/S Wireless data loggers; temperature indicators; strain gauges; voltmeters; hygrometers; pressure g...
P/S Measuring or testing machines and instruments; computer software; wireless data loggers; tempera...
2016 P/S Photoacoustic microscope.
2013 P/S Rental of semiconductor testing machines and system and their parts and fitting; design, install...
P/S Rental of semiconductor testing machines and system and their parts and fitting; design, installa...
2012 P/S Machines to test semiconductors, machines to test system large scale integrated circuits, machine...
P/S Optical inspection apparatus for inspection and testing of semiconductor materials, namely, phot...
P/S Optical inspection apparatus for inspection and testing of semiconductor materials, namely, photo...
2010 P/S Computer software used for the operation and control of photomask inspection and testing machines...
P/S Computer software for photomask inspection or testing machines and systems; computer software; p...
2007 P/S Semiconductor testing machines, system large scale integrated circuits testing machines, large sc...
P/S Semiconductor manufacturing machines and systems. Semiconductor (including "system large scale in...
2006 P/S Scientific, photographic, measuring, checking (supervision) and teaching apparatus and instrument...
2005 P/S Measuring or testing machines and instruments; electric or magnetic meters and testers; telecomm...
P/S Scanning electron microscopes; electron beam lithography equipment; telecommunication switches; e...
2001 P/S [MEASURING APPARATUS AND INSTRUMENTS, NAMELY, DIGITAL MULTIMETERS EQUIPPED WITH DC VOLTAGES/CURRE...
2000 P/S Semiconductor manufacturing machines, integrated circuit manufacturing machines
P/S Semiconductor manufacturing machines Applied electrical and electronic machines and instruments, ...
1998 P/S Computer software used for data conversion, namely, for converting information developed in the d...
1985 P/S Memory test system (RAM, HMOS-RAM, ECL-RAM, ROM, semiconductor memory devices test), VLSI test sy...
1981 P/S Testing Machinery and Equipment Used for Electrical Components and Semiconductors-, namely, Large...