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2026
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Invention
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Test apparatus, test method, and computer program product.
Provided is a test apparatus, includi... |
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Invention
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Handling apparatus and testing system.
A handling apparatus handles a panel-shaped object compri... |
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Invention
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Variable attenuator, step attenuator, and test apparatus.
There is provided a variable attenuato... |
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Invention
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Control of an automated test equipment based on temperature.
Embodiments according to the disclo... |
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2025
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Invention
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Pattern-generating device.
Provided is a pattern-generating device including: a timing-generatin... |
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Invention
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Microparticle measuring apparatus.
The microparticle measuring apparatus is used in combination ... |
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Invention
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Test apparatus, test method, and program.
Provided is a test apparatus including: a pattern gene... |
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Invention
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Test apparatus and test method.
There is provided a test apparatus including a first power sourc... |
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Invention
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Test method, manufacturing method, and microdisplay. Provided is a test method for a wafer on whi... |
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Invention
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Microparticle measuring apparatus.
A pore-based device has a first liquid chamber and a second l... |
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Invention
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Thermal prediction and regulation during integrated circuit testing.
One embodiment of the prese... |
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Invention
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Parallel contactless testing of interposers and silicon bridges.
In various embodiments, a metho... |
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Invention
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Contactless testing of interposers and silicon bridges.
In various embodiments, a computer-imple... |
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Invention
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Sub-terahertz wave output device. A sub-terahertz wave output device (1) comprises: an optical co... |
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Invention
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Electronic device and method of manufacturing electronic device.
There is provided an electronic... |
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Invention
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Device, method, and program. Provided is a device comprising: an acquisition unit that acquires a... |
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Invention
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Device interface and method of adjusting the same.
A device interface disposed between a test he... |
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Invention
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Bridge beam, semiconductor device handling apparatus, and semiconductor device testing apparatus.... |
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Invention
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Optical comb light source and measuring apparatus.
An optical comb light source outputs an optic... |
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Invention
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Test circuit, test apparatus and test method.
Provided is a testing circuit including a voltage ... |
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Invention
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Interface apparatus.
An interface device is provided between a test head and a device under test... |
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Invention
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Testing circuit, testing apparatus, and testing method.
Provided is a testing circuit including ... |
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Invention
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Device interface and method of testing using the same.
A device interface disposed between a tes... |
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Invention
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Method and apparatus for analyzing lipoprotein in blood sample. A blood analysis apparatus 1 comp... |
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Invention
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Real-time throttling for testing of semiconductor devices.
In various embodiments, a method comp... |
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Invention
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Device and setting method. Provided is a device comprising: a substrate; a plurality of main heat... |
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Invention
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Layered structure and inductor.
A layered structure includes a non-magnetic layer, an upper soft... |
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Invention
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Switch apparatus and testing apparatus.
Provided is a switch apparatus which electrically connec... |
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Invention
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Temperature adjusting system, controller, device handling apparatus, tester, and device testing a... |
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Invention
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Amplifier circuit.
Provided is an amplifier circuit including: a unit amplifier, wherein the uni... |
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Invention
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Electronic device and method of idetifying circuit board thereof.
An electronic device and a met... |
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Invention
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Contactor and testing device. Provided is a contactor for energizing a plurality of vertical ligh... |
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Invention
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Condition determining apparatus, method, and recording medium.
A condition determining apparatus... |
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Invention
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Da conversion apparatus.
Provided is a DA conversion apparatus which generates an output signal ... |
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Invention
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Synchronized testing of light emitting diodes.
Test systems and methods are described. In one ex... |
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G/S
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Semiconductor testing machines; computer software for
semiconductor testing machines. |
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G/S
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Semiconductor testing machines; downloadable computer software for semiconductor testing machines. |
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Invention
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Device, test device, and method. Provided is a device comprising: an extraction unit that is prov... |
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Invention
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Electric signal output device. FSR1FSR2FSR1FSR2FSR2 are different values. |
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Invention
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Pogo cable, automated test equipment comprising a pogo cable and method of manufacturing a pogo c... |
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2024
|
Invention
|
Techniques for visualizing multiple time domain reflectometry waveforms.
Various embodiments inc... |
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Invention
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Deflection correction apparatus, semiconductor device handling apparatus, semiconductor device te... |
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Invention
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Testing device, testing method, and program. Provided is a test device comprising: a reception un... |
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Invention
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Testing device. A DUT 2 has N (where N ≥ 3) Z-coordinate detection device electrodes A1–A4 arrang... |
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Invention
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Method and system for obtaining a specification limit value for use as acceptance criterion in a ... |
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Invention
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Integrated protocol analyzer configured within automated test equipment (ate) hardware with sideb... |
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Invention
|
Optoelectronic unit for use with an automatic test equipment system. An optoelectronic unit (6) f... |
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Invention
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Write latency testing systems and methods. The testing system comprises a processor and a local m... |
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2023
|
Invention
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System and method for calibrating a device-under-test interface.
Techniques for calibrating a de... |
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2021
|
G/S
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Downloadable and recorded computer software for controlling the operation of semiconductor testin... |
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G/S
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Computer software for controlling the operation of
semiconductor testing machines. |
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2020
|
Invention
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Coaxial connector |
|
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G/S
|
Semiconductor testing machines; system large scale integrated circuits testing machines; large sc... |
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G/S
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Semiconductor testing machines; system large scale
integrated circuits testing machines; large s... |
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2018
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G/S
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Measuring or testing machines and instruments; computer
software; wireless data loggers; tempera... |
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2016
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G/S
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Photoacoustic microscope. |
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2013
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G/S
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Rental of semiconductor testing machines and system and
their parts and fitting; design, install... |
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G/S
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Rental of semiconductor testing machines and system and their parts and fitting; design, installa... |
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2012
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G/S
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Machines to test semiconductors, machines to test system large scale integrated circuits, machine... |
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G/S
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Optical inspection apparatus for inspection and testing of
semiconductor materials, namely, phot... |
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G/S
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Optical inspection apparatus for inspection and testing of semiconductor materials, namely, photo... |
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2010
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G/S
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Computer software used for the operation and control of photomask inspection and testing machines... |
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G/S
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Computer software for photomask inspection or testing
machines and systems; computer software; p... |
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2007
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G/S
|
Semiconductor testing machines, system large scale integrated circuits testing machines, large sc... |
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G/S
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Semiconductor manufacturing machines and systems. Semiconductor (including "system large scale in... |
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2006
|
G/S
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Scientific, photographic, measuring, checking (supervision) and teaching apparatus and instrument... |
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2005
|
G/S
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Measuring or testing machines and instruments; electric or
magnetic meters and testers; telecomm... |
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G/S
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Scanning electron microscopes; electron beam lithography equipment; telecommunication switches; e... |
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2001
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G/S
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[MEASURING APPARATUS AND INSTRUMENTS, NAMELY, DIGITAL MULTIMETERS EQUIPPED WITH DC VOLTAGES/CURRE... |
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2000
|
G/S
|
Semiconductor manufacturing machines, integrated circuit manufacturing machines |
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G/S
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Semiconductor manufacturing machines Applied electrical and electronic machines and instruments, ... |
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1998
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G/S
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Computer software used for data conversion, namely, for converting information developed in the d... |
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1985
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G/S
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Memory test system (RAM, HMOS-RAM, ECL-RAM, ROM, semiconductor memory devices test), VLSI test sy... |
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1981
|
G/S
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Testing Machinery and Equipment Used for Electrical Components and Semiconductors-, namely, Large... |
