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2026
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P/S
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Transmission electron microscopes |
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Invention
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Systems and methods for analyzing a sample using charged particle beams and active pixel control ... |
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Invention
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Critical dimension measurement in 3d with geometric models.
Methods include acquiring a series o... |
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P/S
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Providing laboratory research services in the field of electron microscopy, namely, grid reparati... |
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2025
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P/S
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Acoustical insulation barrier panels; architectural acoustic products, namely, sound absorbers an... |
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Invention
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Focused ion beam systems including multipole elements and deceleration elements. Charged particle... |
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Invention
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Focused ion beam systems including multipole elements and deceleration elements.
Charged particl... |
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Invention
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Systems and methods for electron microscopy imaging.
There is provided systems and methods for e... |
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P/S
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Site preparation and installation services for laboratory and research equipment, namely, prepari... |
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P/S
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Software as a service (SaaS) featuring software for operating, monitoring, and managing electron ... |
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Invention
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Grid box for electron microscope sample carriers.
A first grid box assembly for holding a plural... |
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Invention
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Techniques for patterning using a partially dispersed focused ion beam. Systems, components, meth... |
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Invention
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Techniques for localized hydrogen charging using hydrogen plasma focused ion beams. Systems, comp... |
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Invention
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Line-based end point detection.
Methods for preparing a sample for analysis by a charged particl... |
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Invention
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Method of sample preparation.
Techniques for preparing a powder sample for charged particle beam... |
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Invention
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Lamella hole trench fill method.
Trenches produced in ion beam or laser beam milling of lamella ... |
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Invention
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Dark correction for long term acquisition.
A charged particle beam (CPB) imaging apparatus inter... |
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Invention
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Lamella lift-out geometry based on sample plane orientation. Systems, methods, or techniques are ... |
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Invention
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Insulation gas for high voltage component of electron microscopes.
Provided herein is an electro... |
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Invention
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Foil lens correctors, charged particle microscope systems including the same, and associated meth... |
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Invention
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Thin layer thickness estimation using electron backscattering.
A method comprises determining pa... |
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Invention
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Functionalized sleeve for sample holder.
Methods and systems are provided for a system for suppo... |
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Invention
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Electron count and energy enhanced diffraction analysis.
Methods identify phase characteristics ... |
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Invention
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Controlling incidence angle of ion beam by sample biasing. An ion beam milling system includes a ... |
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Invention
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Charged particle lens.
A charged particle lens for focusing a beam of charged particles towards ... |
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Invention
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Techniques for electron energy loss spectroscopy at high energy losses with magnetic immersion ob... |
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Invention
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Chip navigation using virtual map including sample navigation based on hand-drawn or digitially g... |
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Invention
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Synthetic training data for endpointing models.
A computer-implemented method for generating syn... |
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P/S
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Downloadable software application to automate laboratory measurements |
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2024
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Invention
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Off-plane imaging mode for a laser phase plate.
Phase contrast images in a charged-particle beam... |
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Invention
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Battery state control during cross-section beam milling.
Sample shuttles are operable to electri... |
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P/S
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Scientific apparatus, namely, a Focused Ion Beam Scanning
Electron Microscope (FIB-SEM) for semi... |
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Invention
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Distributive imaging allowing sample relaxation.
CPB images are acquired with pulsed exposures o... |
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Invention
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Gradient-based milling for segmented endpointing during lamellae thinning.
Embodiments of the pr... |
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Invention
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Large language model resolution of scientific instrument workflow interruptions.
Systems/techniq... |
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Invention
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Class neighborhood graph generation for lamella milling.
Systems or techniques are provided for ... |
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Invention
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Methods of collecting a multidimensional data set and associated systems.
In an example, a metho... |
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Invention
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Modular optical bench assembly.
An optical bench assembly configured to be positioned in an opti... |
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Invention
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Dual charged particle and energy-dispersive spectroscopy imaging using a diamond membrane.
A dev... |
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Invention
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Methods of determining a deformation characteristic and associated systems.
In an example, a met... |
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Invention
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Techniques for electrical characterization of logical cells in integrated circuit testing systems... |
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Invention
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Precise automated control of lamella lift-out.
A method of preparing a sample for electron micro... |
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Invention
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Text-conditioned anomaly detection for charged-particle microscopy images.
Systems/techniques ar... |
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Invention
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Edge localization via intelligent insertion of image processing calipers.
Systems/techniques are... |
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Invention
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Automated chemical switching for material delayering.
Provided herein is a method for delayering... |
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Invention
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Acquiring and encoding electron microscope generated images.
A method including configuring a tr... |
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Invention
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Magnetic magnification control for electron microscopes.
Systems or techniques are provided for ... |
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Invention
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In-column particle filter.
Systems, components, and methods are described for protecting a charg... |
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Invention
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Controlling incidence angle of ion beam by sample biasing.
An ion beam milling system includes a... |
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Invention
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Grid handling load lock door for positional repeatability.
Embodiments described herein relate t... |
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Invention
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Teaching of charged-particle microscopy robotic grippers via beamsplitting.
Systems/techniques a... |
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Invention
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Vacuum simulation for charged-particle microscopy grid receptacles.
Systems/techniques are provi... |
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Invention
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Multimodal signal acquisition synchronized by universal clock.
Embodiments described herein rela... |
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Invention
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Split ring resonator ion beam source.
Embodiments of charged particle beam systems, components, ... |
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Invention
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Multiple input split ring resonator ion beam source.
Embodiments of charged particle beam system... |
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P/S
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Providing online non-downloadable workflow management
software. |
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P/S
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Downloadable workflow management software. |
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P/S
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Semiconductor testing apparatus, namely, a Focused Ion Beam Scanning Electron Microscope (FIB-SEM... |
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P/S
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Downloadable workflow management software |
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P/S
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Providing online non-downloadable workflow management software |
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P/S
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transmission electron microscope (TEM) |
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2023
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P/S
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Laboratory instrument, namely, a scanning electron microscope for material imaging and analysis |
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P/S
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Laboratory apparatus, namely, a carrier for samples in the
field of electron microscopy. |
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P/S
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Laboratory instrument, namely, an ion beam polisher. |
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P/S
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Laboratory instrument, namely, an ion beam polisher. |
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P/S
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Scanning transmission electron microscope for sample preparation and imaging analysis in the fiel... |
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2022
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P/S
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Laboratory apparatus, namely, a container for holding biological samples to be viewed on an elect... |
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P/S
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Laboratory instrument, namely, ion milling machines for preparing specimens for observation with ... |
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2021
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P/S
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cryo dual-beam electron microscope |
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P/S
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Laboratory apparatus, namely, an optical instrument for imaging inside an electron microscope |
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P/S
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Providing demonstration of products in the field of electron
microscopes. Providing facilities f... |
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2020
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P/S
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Providing demonstration of products in the field of electron microscopes Providing facilities for... |
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P/S
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Electron microscopes. |
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2019
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P/S
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Electron microscope |
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P/S
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Electron microscope. |
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P/S
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Laboratory instrument for processing samples for single
particle analysis and/or cryo-tomography... |
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P/S
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High brightness, submicron ion and electron beam columns
using field emission technology for sci... |
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P/S
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Laboratory instrument for processing samples for single particle analysis and/or cryo-tomography ... |
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2018
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P/S
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high brightness, submicron ion and electron beam columns using field emission technology, namely,... |
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2002
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P/S
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Equipment and micro-machining equipment for manufacture of semi-conductors, data storage componen... |
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2001
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P/S
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Scientific, nautical, surveying, electric, photographic, cinematographic, optical, weighing, meas... |
