|
2025
|
Invention
|
Techniques for reducing electromagnetic interference effects in charged particle microscopy.
Emb... |
|
|
Invention
|
Beam synchronization in microscopy. A method for mixed signal synchronization for a charged parti... |
|
|
Invention
|
Digital sample model for instrumental optimization. System and methods are disclosed for a scient... |
|
|
Invention
|
Temporal characterization of oscillator signals in charged particle microscopy.
A method for cha... |
|
|
Invention
|
Beam synchronization in microscopy.
A method for mixed signal synchronization for a charged part... |
|
|
Invention
|
Method for obtaining a tilt series of images of a sample at a plurality of tilt angles.
A method... |
|
|
Invention
|
Charged particle microscope having a charged particle detector.
A charged particle microscope th... |
|
|
Invention
|
Artificial intelligence enabled metrology.
Methods and systems for implementing artificial intel... |
|
|
Invention
|
Virtual interactive microscope experiment simulation platform. Embodiments herein relate to a pro... |
|
|
Invention
|
3d fiducial for precision 3d nand channel tilt/shift analysis.
Systems for and methods for gener... |
|
|
Invention
|
Sample tip.
A sample holder tip (hereinafter referred to as a sample tip) releasably holds a sam... |
|
|
Invention
|
Broad ion beam (bib) systems for more efficient processing of multiple samples.
Systems and meth... |
|
|
Invention
|
Data acquisition in charged particle microscopy.
Disclosed herein are charged particle microscop... |
|
|
Invention
|
Improved scanning electron microscope and method of using the same.
In accordance with the prese... |
|
|
P/S
|
Downloadable software application to automate laboratory measurements |
|
2024
|
Invention
|
Live-assisted image acquisition method and system with charged particle microscopy.
A method of ... |
|
|
P/S
|
Scientific apparatus, namely, a Focused Ion Beam Scanning
Electron Microscope (FIB-SEM) for semi... |
|
|
Invention
|
Scientific instrument with cryogenic sample stage. A scientific instrument, for example an electr... |
|
|
Invention
|
Tomography stage control.
A method and system for obtaining electron tomography data from a samp... |
|
|
Invention
|
K-distance tree metrology.
Systems or techniques are provided for image metrology. In various em... |
|
|
Invention
|
Beam alignment and synchronization in microscopy.
A method for aligning a pulsed laser beam in m... |
|
|
Invention
|
Beam alignment and synchronization in microscopy.
A method for flexible beam blanking in ultrafa... |
|
|
Invention
|
Spectral image analysis via integration-constrained fitting.
Systems or techniques are provided ... |
|
|
P/S
|
Providing online non-downloadable workflow management
software. |
|
|
P/S
|
Downloadable workflow management software. |
|
|
P/S
|
Semiconductor testing apparatus, namely, a Focused Ion Beam Scanning Electron Microscope (FIB-SEM... |
|
|
Invention
|
Electrode and filament coupled by adapter. Apparatus and methods are disclosed for a mechanically... |
|
|
Invention
|
Large language model assistance for charged-particle microscope operation.
Systems/techniques ar... |
|
|
Invention
|
Split-column acceleration tube for scanning electron microscope.
Embodiments of the present disc... |
|
|
Invention
|
Drift compensation for radiation-sensitive specimens.
In one example, a method performed via a c... |
|
|
Invention
|
Classifying microscopic components of physical samples.
Disclosed herein are systems for classif... |
|
|
Invention
|
Electrical and thermal connection cable for charged particle microscopes.
Systems, methods, and ... |
|
|
Invention
|
Sample support grid recognition.
Embodiments herein relate to a process for sample support recog... |
|
|
Invention
|
Hybrid background extraction in electron holography.
Embodiments herein relate to a process for ... |
|
|
Invention
|
Situ protective polymer via milling-excitation.
Systems or techniques are provided for facilitat... |
|
|
Invention
|
Automatic correction of energy dependent defocus in particle beam systems due to a configuration ... |
|
|
Invention
|
Sample preparation with non-uniform dose.
Variable dosage ion beam milling techniques for sample... |
|
|
Invention
|
Virtual interactive microscope experiment simulation platform.
Embodiments herein relate to a pr... |
|
|
Invention
|
Airless transfer and electrical testing of solid state batteries in scanning electron microscopes... |
|
|
Invention
|
Ion beam column ion species measurement.
A charged particle system including a plasma source con... |
|
|
Invention
|
Preparation of planar lamella from a multi-layer structure.
A method for preparing a planar lame... |
|
|
Invention
|
Tiled region adjacency graph computation via pixel-region adjacency graphs.
Systems or technique... |
|
|
Invention
|
Heating assembly for charged particle beam system.
Systems, devices, and techniques for heating ... |
|
|
Invention
|
Tool matching using digital twins.
In some embodiments, a tool-matching system includes a first ... |
|
|
Invention
|
Elemental identification based on phase analysis.
In some embodiments, a support apparatus for a... |
|
|
Invention
|
Method and system for quality control. A method for quality control is executable by an electroni... |
|
|
P/S
|
Downloadable workflow management software |
|
|
P/S
|
Providing online non-downloadable workflow management software |
|
|
P/S
|
transmission electron microscope (TEM) |
|
2023
|
Invention
|
Compositional mapping employing variable charged particle beam parameters for imaging and energy-... |
|
|
Invention
|
Mixed-gas species plasma source system.
An ion beam system including a plasma source tube defini... |
|
|
Invention
|
Systems and methods for analyzing a sample using charged particle beams and active pixel control ... |
|
|
Invention
|
Objective lenses, charged particle microscopes including the same, and associated methods.
Objec... |
|
|
Invention
|
Particle-induced x-ray emission using light and heavy particle beams.
A method of Particle-Induc... |
|
|
P/S
|
Laboratory instrument, namely, a scanning electron microscope for material imaging and analysis |
|
|
P/S
|
Laboratory apparatus, namely, a carrier for samples in the
field of electron microscopy. |
|
|
P/S
|
Laboratory instrument, namely, an ion beam polisher. |
|
|
P/S
|
Laboratory instrument, namely, an ion beam polisher. |
|
|
P/S
|
Scanning transmission electron microscope for sample preparation and imaging analysis in the fiel... |
|
2022
|
P/S
|
Laboratory apparatus, namely, a container for holding biological samples to be viewed on an elect... |
|
|
P/S
|
Laboratory instrument, namely, ion milling machines for preparing specimens for observation with ... |
|
2021
|
P/S
|
cryo dual-beam electron microscope |
|
|
P/S
|
Laboratory apparatus, namely, an optical instrument for imaging inside an electron microscope |
|
|
P/S
|
Providing demonstration of products in the field of electron
microscopes. Providing facilities f... |
|
2020
|
P/S
|
Providing demonstration of products in the field of electron microscopes Providing facilities for... |
|
|
P/S
|
Electron microscopes. |
|
2019
|
P/S
|
Electron microscope |
|
|
P/S
|
Electron microscope. |
|
|
P/S
|
Laboratory instrument for processing samples for single
particle analysis and/or cryo-tomography... |
|
|
P/S
|
High brightness, submicron ion and electron beam columns
using field emission technology for sci... |
|
|
P/S
|
Laboratory instrument for processing samples for single particle analysis and/or cryo-tomography ... |
|
2018
|
P/S
|
high brightness, submicron ion and electron beam columns using field emission technology, namely,... |
|
2002
|
P/S
|
Equipment and micro-machining equipment for manufacture of semi-conductors, data storage componen... |
|
2001
|
P/S
|
Scientific, nautical, surveying, electric, photographic, cinematographic, optical, weighing, meas... |
