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2026
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P/S
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Recorded computer software for providing supervisory control and data acquisition (SCADA) of cryo... |
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P/S
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Probes for testing semiconductors; probes for testing
integrated circuits. |
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2025
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Invention
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Probe card with calibrated probe head capacitive distance monitor. In probe heads making a large ... |
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Invention
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Probe card with calibrated probe head capacitive distance monitor.
In probe heads making a large... |
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P/S
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Probes for testing semiconductors; Probes for testing integrated circuits |
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Invention
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Direct connectorization for high-frequency signals. Improved electrical connections to a probe he... |
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Invention
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Optoelectronic probe cards, optoelectronic testers, and related methods. Optoelectronic probe car... |
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Invention
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Probe supports, assemblies that include the probe supports, systems that include the probe assemb... |
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Invention
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Probe supports, probe assemblies that include the probe supports, probe systems that include the ... |
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Invention
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Optoelectronic probe cards, optoelectronic testers, and related methods.
Optoelectronic probe ca... |
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Invention
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Probes, probe blades, tools for probe blades, blade holders, and probe systems for electrically t... |
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Invention
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Optical detection structures, probe systems that include optical detection structures, and relate... |
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Invention
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Optical calibration structures for optical probes, optical probe systems that include the optical... |
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Invention
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Wafer-handling end effectors configured to selectively lift a wafer from an upper surface of the ... |
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Invention
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Measurement module adapters, and probe assemblies, systems and methods incorporating same. Measur... |
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Invention
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Measurement module adapters, probe assemblies that include the measurement module adapters, probe... |
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Invention
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Probe head having features to facilitate cooling with liquid-cooled heat exchanger. Improved heat... |
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Invention
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Probe head having features to facilitate cooling with liquid-cooled heat exchanger.
Improved hea... |
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Invention
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Vibration isolation layers, measurement systems that include the vibration isolation layers, and ... |
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Invention
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Wafer-handling end effectors configured to selectively engage a wafer via a pressure force and to... |
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Invention
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Lens arrays, fiber optic fixtures that include the lens arrays, probe systems that include the fi... |
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Invention
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Probe head having vertically embedded components in the printed circuit board.
Passive electrica... |
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Invention
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Flexural patterns in guide plate substrates.
Guide plates for vertical probe heads include flexu... |
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Invention
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Probe head having vertically embedded components in the printed circuit board. Passive electrical... |
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Invention
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Flexural patterns in guide plate substrates. Guide plates for vertical probe heads include flexur... |
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2024
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Invention
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Probe systems and methods of operating probe systems.
Probe systems and methods of operating pro... |
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P/S
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Testing and inspecting apparatus and instruments; probe stations for testing and inspection of se... |
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Invention
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Space transformers configured to be utilized in a probe system. Space transformers configured to ... |
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Invention
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Space transformers configured to be utilized in a probe system, probe systems that include the sp... |
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Invention
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Flexible, radio-frequency transitions and electronic systems that include the flexible, radio-fre... |
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Invention
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Roller tap down technique for probe arrays.
A roller mechanism with controlled height is used fo... |
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P/S
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Probe stations for testing and inspection of semiconductor wafers and semiconductors; testing app... |
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2023
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Invention
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Mems probes having decoupled electrical and mechanical design. MEMS probes are provided having de... |
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Invention
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Mems probes having decoupled electrical and mechanical design.
MEMS probes are provided having d... |
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Invention
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Methods of establishing contact between a probe tip of a probe system and a device under test. Me... |
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Invention
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Methods of establishing contact between a probe tip of a probe system and a device under test, pr... |
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Invention
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Remote control devices for probe systems, probe systems that include the remote control devices, ... |
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Invention
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Abbreviated loopback attenuation.
Improved performance for attenuated testing when probing a dev... |
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Invention
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Abbreviated loopback attenuation. Improved performance for attenuated testing when probing a devi... |
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Invention
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Single wire serial communication using pulse width modulation in a daisy chain architecture. Impr... |
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Invention
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Single wire serial communication using pulse width modulation in a daisy chain architecture.
Imp... |
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Invention
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Vertical probe array having sliding contacts in elastic guide plate. A probe array having decoupl... |
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2022
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Invention
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Thermal management techniques for high power integrated circuits operating in dry cryogenic envir... |
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Invention
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Probes that define retroreflectors, probe systems that include the probes, and methods of utilizi... |
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2017
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P/S
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Probe stations for testing and inspecting integrated circuits and semiconductor devices; probe he... |
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P/S
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probe stations for testing and inspecting integrated circuits and semiconductor devices; probe he... |
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2016
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P/S
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Computer software sold as a feature of probe systems for processing, testing, and inspecting semi... |
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P/S
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computer software sold as a feature of probe systems for processing, testing, and inspecting semi... |
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P/S
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Probes for testing integrated circuits, semiconductors, and RF power devices; probes for the meas... |
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2015
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P/S
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probes for testing integrated circuits, semiconductors, and RF power devices; probes for the meas... |
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P/S
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Probes for testing integrated circuits and semiconductors; probes for the measurement of elect... |
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2014
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P/S
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providing technical information about equipment used for the measurement, inspection, and testing... |
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P/S
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probes for testing integrated circuits and semiconductors; probes for the measurement of electron... |
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P/S
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providing a buy-back and trade-in program and online retail shop services, all featuring measurem... |
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2010
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P/S
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Probes, probe stations, sockets, and their components and accessories, for testing integrated cir... |
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P/S
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probes, probe stations, [ sockets, ] and their components and accessories, for testing integrated... |
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2002
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P/S
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Probes for on-wafer testing of integrated circuits |
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2001
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P/S
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probes for on-wafer testing of integrated circuits |
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2000
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P/S
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Probe cards used for testing integrated circuits |
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P/S
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probe station for testing of semiconductors |
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P/S
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probes, probe stations, and their components and accessories, for on-wafer testing of integrated ... |
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P/S
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[ Wiring substrates, space transformers, interposers, ] probe cards [ , and contact elements and ... |
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1999
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P/S
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ELECTRICAL PROBE FOR ON-WAFER TESTING OF INTEGRATED CIRCUITS |
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P/S
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Probe stations for testing of semi-conductor wafers, and probe station components and accessories... |
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P/S
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Probes, and their components and accessories, for on-wafer testing of integrated circuits. |
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P/S
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Electronic components, namely electronic interconnects, semiconductors, wiring substrates, space ... |
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1995
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P/S
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chuck assemblies for supporting probes for electrical testing |
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1993
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P/S
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self-contained temperature control and probe unit for testing semiconductors |
