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2024
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Invention
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Probe systems and methods of operating probe systems.
Probe systems and methods of operating pro... |
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G/S
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Testing and inspecting apparatus and instruments; probe stations for testing and inspection of se... |
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Invention
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Probes, probe blades, tools for probe blades, blade holders, and probe systems for electrically t... |
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Invention
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Space transformers configured to be utilized in a probe system. Space transformers configured to ... |
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Invention
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Space transformers configured to be utilized in a probe system, probe systems that include the sp... |
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Invention
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Flexible, radio-frequency transitions and electronic systems that include the flexible, radio-fre... |
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Invention
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Roller tap down technique for probe arrays.
A roller mechanism with controlled height is used fo... |
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G/S
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Probe stations for testing and inspection of semiconductor wafers and semiconductors; testing app... |
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2023
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Invention
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Mems probes having decoupled electrical and mechanical design. MEMS probes are provided having de... |
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Invention
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Methods of establishing contact between a probe tip of a probe system and a device under test. Me... |
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Invention
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Methods of establishing contact between a probe tip of a probe system and a device under test, pr... |
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Invention
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Wafer-handling end effectors configured to selectively lift a wafer from an upper surface of the ... |
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Invention
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Remote control devices for probe systems, probe systems that include the remote control devices, ... |
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Invention
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Abbreviated loopback attenuation. Improved performance for attenuated testing when probing a devi... |
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Invention
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Single wire serial communication using pulse width modulation in a daisy chain architecture. Impr... |
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Invention
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Single wire serial communication using pulse width modulation in a daisy chain architecture.
Imp... |
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Invention
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Vertical probe array having sliding contacts in elastic guide plate. A probe array having decoupl... |
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Invention
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Vertical probe array having sliding contacts in elastic guide plate.
A probe array having decoup... |
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2022
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Invention
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Thermal management techniques for high power integrated circuits operating in dry cryogenic envir... |
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Invention
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Probes that define retroreflectors, probe systems that include the probes, and methods of utilizi... |
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Invention
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Method of centering probe head in mounting frame. A modular probe array for making temporary elec... |
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Invention
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Probe head including a guide plate with angled holes to determine probe flexure direction.
Verti... |
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2021
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Invention
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Probe systems configured to test a device under test and methods of operating the probe systems. ... |
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Invention
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Multi-conductor transmission line probe. Vertical transmission line probes having alternating cap... |
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Invention
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3d electrical integration using component carrier edge connections to a 2d contact array. 3D elec... |
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Invention
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Methods of producing augmented probe system images and associated probe systems. Methods of produ... |
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Invention
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Beamforming device testing. Improved electrical testing of N-port beamforming devices is provided... |
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2020
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Invention
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Double-sided probe systems with thermal control systems and related methods. Double-sided probe s... |
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Invention
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Customizable probe cards, probe systems including the same, and related methods. Customizable pro... |
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Invention
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Customizable probe cards, probe systems including the same, and related methods.
Customizable pr... |
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Invention
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Probe systems including imaging devices with objective lens isolators, and related methods. Probe... |
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Invention
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Probe systems and methods for testing a device under test. Probe systems and methods for testing ... |
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Invention
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Probe systems and methods for characterizing optical coupling between an optical probe of a probe... |
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Invention
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Probe systems for optically probing a device under test and methods of operating the probe system... |
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Invention
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Methods for maintaining gap spacing between an optical probe of a probe system and an optical dev... |
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Invention
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Calibration chucks for optical probe systems, optical probe systems including the calibration chu... |
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Invention
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Probe on carrier architecture for vertical probe arrays. A probe-on-carrier architecture is provi... |
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2017
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G/S
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Probe stations for testing and inspecting integrated circuits and semiconductor devices; probe he... |
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G/S
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probe stations for testing and inspecting integrated circuits and semiconductor devices; probe he... |
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2016
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G/S
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Computer software sold as a feature of probe systems for processing, testing, and inspecting semi... |
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G/S
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computer software sold as a feature of probe systems for processing, testing, and inspecting semi... |
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G/S
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Probes for testing integrated circuits, semiconductors, and RF power devices; probes for the meas... |
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2015
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G/S
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probes for testing integrated circuits, semiconductors, and RF power devices; probes for the meas... |
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G/S
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Probes for testing integrated circuits and semiconductors; probes for the measurement of elect... |
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2014
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G/S
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providing technical information about equipment used for the measurement, inspection, and testing... |
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G/S
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probes for testing integrated circuits and semiconductors; probes for the measurement of electron... |
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G/S
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providing a buy-back and trade-in program and online retail shop services, all featuring measurem... |
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2010
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G/S
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probes, probe stations, [ sockets, ] and their components and accessories, for testing integrated... |
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2002
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G/S
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Probes for on-wafer testing of integrated circuits |
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2001
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G/S
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probes for on-wafer testing of integrated circuits |
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2000
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G/S
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Probe cards used for testing integrated circuits |
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G/S
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probe station for testing of semiconductors |
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G/S
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probes, probe stations, and their components and accessories, for on-wafer testing of integrated ... |
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G/S
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[ Wiring substrates, space transformers, interposers, ] probe cards [ , and contact elements and ... |
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1999
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G/S
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ELECTRICAL PROBE FOR ON-WAFER TESTING OF INTEGRATED CIRCUITS |
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G/S
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Electronic components, namely electronic interconnects, semiconductors, wiring substrates, space ... |
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1995
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G/S
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chuck assemblies for supporting probes for electrical testing |
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1993
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G/S
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self-contained temperature control and probe unit for testing semiconductors |
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G/S
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positioner for probing microelectronic assemblies |
