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2023
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P/S
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Optics equipment, namely, ellipsometer-based apparatus for measuring thickness and optical proper... |
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2022
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P/S
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Equipment, devices and apparatus, for measuring fluctuations in light polarization, for use in me... |
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Invention
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Fast and accurate mueller matrix infrared ellipsometer. An ellipsometer, polarimeter and the like... |
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Invention
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Fast and accurate mueller matrix infrared spectroscopic ellipsometer. An ellipsometer, polarimete... |
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2021
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Invention
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Reflectometer, spectrophotometer, ellipsometer and polarimeter systems including a wavelength mod... |
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Invention
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Reflectometer, spectrophotometer, ellipsometer and polarimeter system with a super continuum lase... |
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2020
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Invention
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Beam focusing and reflective optics. A method of applying a reflective optics system that require... |
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Invention
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Snapshot ellipsometer. A snapshot ellipsometer or polarimeter which does not require temporally m... |
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Invention
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Reflectometer, spectrophotometer, ellipsometer or polarimeter system including sample imaging sys... |
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2019
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Invention
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Theta-theta sample positioning stage with application to sample mapping using a reflectometer, sp... |
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Invention
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Theta-theta sample positioning stage with application to sample mapping using reflectometer, spec... |
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Invention
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Method of determining refractive indices and surface properties of prism shaped material. Methodo... |
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Invention
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Ellipsometer or polarimeter system having at least one rotating element which is driven by a moto... |
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Invention
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Systems and methods for producing a more uniform intensity wavelength dispersed beam of electroma... |
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P/S
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IDENTIFIES EQUIPMENT, NAMELY, ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PR... |
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2018
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Invention
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Reflectometer, spectrophotometer, ellipsometer and polarimeter systems with a super continuum las... |
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Invention
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Methods and materials for metamaterials exhibiting form-induced birefringence. Materials comprisi... |
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Invention
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Beam focusing and reflecting optics with enhanced detector system. In ellipsometer and polarimete... |
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P/S
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Equipment, namely, ellipsometer based apparatus for measuring thickness and optical properties of... |
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Invention
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Method to analyze spectroscopic ellipsometry or intensity data of porous samples utilizing the an... |
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Invention
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Biased fast axis retarder system. A retarder that comprises at least two plates, each of which co... |
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2017
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Invention
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Integrated vacuum-ultraviolet, mid and near-ultraviolet, visible, near, mid and far infrared and ... |
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Invention
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Biased fast axis retarder system. A retarder system that comprises at least two plates, each of w... |
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Invention
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Method to analyze spectroscopic ellipsometry data of porous samples utilizing the anisotropic bru... |
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P/S
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EQUIPMENT, NAMELY, ELLIPSOMETER BASED APPARATUS FOR MEASURINGTHICKNESS, TEMPERATURE CAUSED EFFECT... |
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P/S
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ellipsometer based apparatus for measuring thickness and optical properties of semi conductor, di... |
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Invention
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Deviation angle self-compensating substantially achromatic retarder. A substantially achromatic m... |
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Invention
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Method of determining refractive index, extinction coefficient, and surface properties of prism s... |
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Invention
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Elliposometer system with polarization state generator and polarization state analyzer in environ... |
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P/S
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LABORATORY RESEARCH, NAMELY, INVESTIGATING SAMPLES WITH AND WITHOUT SURFACE LAYERS BY USING ELLIP... |
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2016
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Invention
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System and method for investigating change in optical properties of a porous effective substrate ... |
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Invention
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Beam focusing and beam collecting optics with wavelength dependent filter element adjustment of b... |
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Invention
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Reflectometer, spectrophometer, ellipsometer and polarimeter system with a super continuum laser-... |
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Invention
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Information maintenance, intensity attenuation, and angle/plane of incidence control in electroma... |
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Invention
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Combined use of oscillating means and ellipsometry to determine uncorrelated effective thickness ... |
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Invention
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Beam focusing and beam collecting optics. A method of calibrating a reflective focusing optics to... |
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Invention
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Method of characterizing a beam of electromagnetic radiation in ellipsometer and the like systems... |
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Invention
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Method to enhance sensitivity to surface normal optical functions of anisotropic films using atte... |
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2015
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Invention
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Enhanced detector operation made possible by application of a functional plurality of gratings an... |
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Invention
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Method of obtaining micrographs of transparent or semi-transparent specimens using anisotropic co... |
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Invention
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Birefringence imaging chromatography based on highly ordered 3d nanostructures. Ellipsometers and... |
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Invention
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Integrated mid-infrared, far infrared and terahertz optical hall effect (ohe) instrument, and met... |
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Invention
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System for determining average ellipsometric parameters for planar or non-planar shaped objects, ... |
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Invention
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Operation of an electromagnetic radiation focusing element.
and can demonstrate neutral density ... |
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Invention
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System for viewing samples that are undergoing ellipsometric investigation in real time. In the c... |
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Invention
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Beam focusing and beam collecting optics. A reflective optics system (RFO) that preferably requir... |
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2014
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Invention
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Reflective focusing optics. A reflective optics system that preferably requires the presence of b... |
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2013
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Invention
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Terahertz-infrared ellipsometer system, and method of use. A dual scanning and FTIR system for ap... |
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2012
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P/S
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ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR, DIS... |
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Invention
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In line ellipsometer system and method of use. A system for monitoring, in real time, relatively ... |
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2011
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P/S
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technical services performed in the field of design of ellipsometers, polarimeters and spectropho... |
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P/S
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equipment, namely, ellipsometer based apparatus for measuring thickness, temperature caused effec... |
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2010
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P/S
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Ellipsometers, polarimeters and reflectometers which utilize electromagnetic radiation for invest... |
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2007
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P/S
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MATERIALS TESTING AND ANALYZING FOR OTHERS, NAMELY, ELLIPSOMETRY SERVICES |
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P/S
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Materials testing and analyzing for others, namely, ellipsometry services |
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2006
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P/S
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EQUIPMENT, NAMELY, ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF... |
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2005
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P/S
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EQUIPMENT, NAMELY ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF ... |
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P/S
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IDENTIFY EQUIPMENT, NAMELY ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPE... |
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P/S
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Equipment, namely ellipsometer based apparatus for measuring thickness and optical properties of ... |
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2000
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P/S
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ELLIPSOMETERS, POLARIMETERS AND SPECTROPHOTOMETERS WHICH UTILIZE ELECTROMAGNETIC RADIATION TO INV... |
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1998
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P/S
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ELLIPSOMETERS, POLARIMETERS, AND REFLECTOMETERS WHICH UTILIZE ELECTROMAGNETIC RADIATION TO INVEST... |
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1997
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P/S
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ellipsometer, polarimeter and reflectometer which utilize polarized electromagnetic radiation to ... |
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P/S
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ellipsometers, polarimeters, and reflectometers which utilize electromagnetic radiation to invest... |
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1993
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P/S
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computer software for use in variable angle spectroscopic ellipsometers |
