Ohba, Yusuke

Japon

Commandez votre montre hebdomadaire Ohba, Yusuke
Quantité totale PI 7
Rang # Quantité totale PI 231 010
Note d'activité PI 0/5.0    0
Rang # Activité PI 1 772 099

Brevets

Marques

7 0
0 0
0 0
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Dernier brevet 2020 - Atomic force microscope, atomic ...
Premier brevet 2014 - Scanning probe microscope and co...

Derniers inventions, produits et services

2019 Invention Atomic force microscope, atomic force microscopy, and controlling method of an atomic force micro...
2018 Invention Atomic force microscope and control method of the same. An atomic force microscope is to acquire ...
2017 Invention Atomic force microscope and control method of the same. An atomic force microscope acquires sampl...
2016 Invention Scanning probe microscope and control method thereof. A scanning probe microscope includes a cant...
2015 Invention Scanning mechanism and scanning probe microscope. A scanning mechanism includes a cantilever, an ...
Invention Scanning probe microscope. A scanning probe microscope to measure a sample set on a sample mount ...
2014 Invention Compound microscope. A compound microscope of an optical microscope and a scanning probe microsco...