Ohba, Yusuke

Japan

Create a watch for Ohba, Yusuke
Total IP 7
Total IP Rank # 233,123
IP Activity Score 0/5.0    0
IP Activity Rank # 1,790,449

Patents

Trademarks

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Last Patent 2020 - Atomic force microscope, atomic ...
First Patent 2014 - Scanning probe microscope and co...

Latest Inventions, Goods, Services

2019 Invention Atomic force microscope, atomic force microscopy, and controlling method of an atomic force micro...
2018 Invention Atomic force microscope and control method of the same. An atomic force microscope is to acquire ...
2017 Invention Atomic force microscope and control method of the same. An atomic force microscope acquires sampl...
2016 Invention Scanning probe microscope and control method thereof. A scanning probe microscope includes a cant...
2015 Invention Scanning mechanism and scanning probe microscope. A scanning mechanism includes a cantilever, an ...
Invention Scanning probe microscope. A scanning probe microscope to measure a sample set on a sample mount ...
2014 Invention Compound microscope. A compound microscope of an optical microscope and a scanning probe microsco...