- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensionsmeasuring anglesmeasuring areasmeasuring irregularities of surfaces or contours
- G01B 15/02 - Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
Patent holdings for IPC class G01B 15/02
Total number of patents in this class: 456
10-year publication summary
|
31
|
33
|
36
|
42
|
44
|
41
|
35
|
30
|
30
|
10
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Nova Measuring Instruments Inc. | 70 |
17 |
| PaneraTech, Inc. | 32 |
15 |
| FUJIFILM Corporation | 29228 |
11 |
| Schlumberger Technology Corporation | 10627 |
8 |
| Pioneer Corporation | 4399 |
8 |
| Kabushiki Kaisha Toshiba, doing business as Toshiba Corporation | 6274 |
8 |
| KLA Corporation | 1512 |
8 |
| Applied Materials Israel, Ltd. | 601 |
7 |
| Commissariat à l'énergie atomique et aux energies alternatives | 10837 |
7 |
| Rigaku Corporation | 427 |
7 |
| Yokogawa Electric Corporation | 1718 |
7 |
| Samsung Electronics Co., Ltd. | 144143 |
6 |
| Honeywell International Inc. | 13564 |
6 |
| Toshiba Infrastructure Systems & Solutions Corporation | 1052 |
6 |
| Sharp Kabushiki Kaisha | 18799 |
6 |
| Hitachi High-Tech Corporation | 5241 |
6 |
| Halliburton Energy Services, Inc. | 20749 |
5 |
| Hitachi High-Technologies Corporation | 2004 |
5 |
| KLA-Tencor Corporation | 2546 |
5 |
| Tiama | 81 |
5 |
| Other owners | 303 |