- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensionsmeasuring anglesmeasuring areasmeasuring irregularities of surfaces or contours
- G01B 15/02 - Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
Patent holdings for IPC class G01B 15/02
Total number of patents in this class: 488
10-year publication summary
|
33
|
36
|
42
|
44
|
41
|
36
|
34
|
32
|
27
|
29
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Nova Measuring Instruments Inc. | 68 |
19 |
| PaneraTech, Inc. | 34 |
17 |
| FUJIFILM Corporation | 30514 |
11 |
| Yokogawa Electric Corporation | 1893 |
11 |
| Kabushiki Kaisha Toshiba, doing business as Toshiba Corporation | 6178 |
9 |
| Schlumberger Technology Corporation | 11818 |
8 |
| Pioneer Corporation | 3779 |
8 |
| KLA Corporation | 1849 |
8 |
| Applied Materials Israel, Ltd. | 676 |
7 |
| Rigaku Corporation | 497 |
7 |
| Hitachi High-Tech Corporation | 5846 |
7 |
| Samsung Electronics Co., Ltd. | 157719 |
6 |
| Honeywell International Inc. | 12778 |
6 |
| Commissariat à l'énergie atomique et aux energies alternatives | 11123 |
6 |
| Toshiba Infrastructure Systems & Solutions Corporation | 662 |
6 |
| Sharp Kabushiki Kaisha | 18523 |
6 |
| Topgolf Callaway Brands Corp. | 762 |
6 |
| Halliburton Energy Services, Inc. | 21338 |
5 |
| Hitachi High-Technologies Corporation | 1987 |
5 |
| Applied Materials, Inc. | 20375 |
5 |
| Other owners | 325 |