- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensionsmeasuring anglesmeasuring areasmeasuring irregularities of surfaces or contours
- G01B 9/02002 - Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies
Patent holdings for IPC class G01B 9/02002
Total number of patents in this class: 56
10-year publication summary
|
1
|
1
|
1
|
0
|
7
|
12
|
10
|
11
|
7
|
2
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Seiko Epson Corporation | 20256 |
8 |
| ASML Netherlands B.V. | 7925 |
5 |
| The General Hospital Corporation | 4870 |
3 |
| Panasonic Intellectual Property Management Co., Ltd. | 33997 |
2 |
| ams International AG | 446 |
2 |
| Carl Zeiss Meditec AG | 1683 |
2 |
| Samsung Electronics Co., Ltd. | 157719 |
1 |
| Centre National de La Recherche Scientifique | 11023 |
1 |
| Applied Materials, Inc. | 20375 |
1 |
| Mitsubishi Electric Corporation | 48018 |
1 |
| Raytheon Company | 8448 |
1 |
| Tsinghua University | 6211 |
1 |
| Hamamatsu Photonics K.K. | 4681 |
1 |
| Duke University | 3183 |
1 |
| The Furukawa Electric Co., Ltd. | 3694 |
1 |
| ADIGE S.p.A. | 54 |
1 |
| Carl Zeiss Industrielle Messtechnik GmbH | 431 |
1 |
| Carnegie Mellon University | 1623 |
1 |
| Ecole Superieure de Physique et de Chimie Industrielles de La Ville de Paris | 391 |
1 |
| Harbin Institute of Technology | 492 |
1 |
| Other owners | 20 |