- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensions; measuring angles; measuring areas; measuring irregularities of surfaces or contours
- G01B 9/02002 - Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies
Patent holdings for IPC class G01B 9/02002
Total number of patents in this class: 43
10-year publication summary
|
1
|
1
|
0
|
1
|
0
|
7
|
11
|
9
|
10
|
1
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Seiko Epson Corporation | 18989 |
6 |
| ASML Netherlands B.V. | 7171 |
5 |
| Panasonic Intellectual Property Management Co., Ltd. | 29733 |
2 |
| The General Hospital Corporation | 4650 |
2 |
| ams International AG | 420 |
2 |
| Beijing U-precision Tech Co., Ltd. | 60 |
2 |
| Applied Materials, Inc. | 17745 |
1 |
| Mitsubishi Electric Corporation | 44851 |
1 |
| Raytheon Company | 8444 |
1 |
| Tsinghua University | 5705 |
1 |
| Hamamatsu Photonics K.K. | 4304 |
1 |
| Duke University | 3011 |
1 |
| Nokia Technologies Oy | 16542 |
1 |
| ADIGE S.p.A. | 51 |
1 |
| Carl Zeiss Industrielle Messtechnik GmbH | 441 |
1 |
| Hifi Engineering Inc. | 133 |
1 |
| HRL Laboratories, LLC | 1583 |
1 |
| Medlumics S.L. | 77 |
1 |
| Mitsubishi Electric Research Laboratories, Inc. | 1040 |
1 |
| Mitutoyo Corporation | 1219 |
1 |
| Other owners | 10 |