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  • All sections
  • G - Physics
  • G01B - Measuring length, thickness or similar linear dimensionsmeasuring anglesmeasuring areasmeasuring irregularities of surfaces or contours
  • G01B 9/02015 - Interferometers characterised by the beam path configuration

Patent holdings for IPC class G01B 9/02015

Total number of patents in this class: 315

10-year publication summary

0
0
1
2
20
42
47
61
53
48
2016 2017 2018 2019 2020 2021 2022 2023 2024 2025

Principal owners for this class

Owner
All patents
This class
ASML Netherlands B.V.
7593
13
The General Hospital Corporation
4801
5
Carl Zeiss SMT GmbH
3091
5
ams International AG
439
5
KLA Corporation
1668
5
Occuity Limited
24
5
Centre National de La Recherche Scientifique
10706
4
Ecole Superieure de Physique et de Chimie Industrielles de La Ville de Paris
370
4
Heidelberg Engineering GmbH
63
4
Unity Semiconductor
64
4
Samsung Electronics Co., Ltd.
149198
3
California Institute of Technology
3999
3
Omron Corporation
7305
3
Tsinghua University
6023
3
Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences
30
3
IDOM, S.A.U, a legal entity
16
3
Mitutoyo Corporation
1247
3
Orbotech Ltd.
241
3
Precitec Optronik GmbH
77
3
Lessmüller Lasertechnik GmbH
11
3
Other owners 231

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